Pretreatment device for argon ion polishing sample

Abstract

The utility model relates to a pretreatment device for an argon ion polishing sample. Relates to the technical field of ion beam polishing. The device specifically comprises a base, a sample fixing table arranged on the base, a stand column extending on the base in the vertical direction, a connecting assembly extending on the stand column in the horizontal direction, and a cutting assembly arranged on the connecting assembly in the vertical direction. The sample fixing table is used for fixing an argon ion polishing sample, the connecting assembly is used for driving the cutting assembly to ascend and descend, and the cutting assembly can rotate in the vertical direction and is used for adjusting the cutting angle of the argon ion polishing sample on the sample fixing table. The cutting assembly is driven by the connecting assembly to ascend and descend in the vertical direction, and the cutting assembly rotates in the vertical direction, so that the pre-cutting angle and stress uniformity of the ion polishing sample by the cutting assembly can be ensured, the pretreatment quality of the ion polishing sample is ensured, and the section treatment effect of the argon ion polishing instrument is further ensured.

Description

Technical Field

[0001] This utility model relates to the field of ion beam polishing technology, and in particular to a pretreatment device for argon ion polishing samples. Background Technology

[0002] With the continuous growth of energy consumption and increasingly stringent environmental requirements, improving cell performance has become a crucial goal in the energy storage field. The performance of core components such as electrodes and separators directly affects indicators such as cell capacity, cycle life, charge / discharge rate, and safety. Therefore, pretreatment equipment such as argon ion polishing machines is introduced to pre-treat the cross-sections of electrodes and separators to accurately reflect their internal morphological characteristics, thereby optimizing the manufacturing process and positioning of electrodes and separators.

[0003] Argon ion polishing instruments refine the cross-section of argon ion polished samples. However, when the flatness of the sample's cross-section is poor, the polishing effect of the instrument is limited. Therefore, before polishing, the sample is usually pre-cut to ensure the flatness of the cross-section is within a suitable range. The pre-treatment of the sample significantly impacts the polishing effect. However, in practice, the angle and uniformity of force during pre-cutting can easily lead to problems such as powder shedding, delamination, and wavy cuts from oblique cuts, thus affecting the overall surface treatment effect. Utility Model Content

[0004] The purpose of this invention is to address the shortcomings of the prior art by providing a pretreatment device for argon ion polishing samples. This device ensures the uniformity of the angle and force during the pre-cutting of the argon ion polishing samples, thereby guaranteeing the pretreatment quality of the argon ion polishing samples and ultimately ensuring the effectiveness of the cross-section treatment of the argon ion polishing instrument.

[0005] This utility model proposes a pretreatment device for argon ion polished samples, including a base, a sample fixing stage disposed on the base, a column extending vertically on the base, a connecting assembly extending horizontally on the column, and a cutting assembly disposed vertically on the connecting assembly; the sample fixing stage is used to fix the argon ion polished sample, the connecting assembly is used to drive the cutting assembly to move up and down, and the cutting assembly can rotate around the vertical direction to adjust the cutting angle of the argon ion polished sample on the sample fixing stage.

[0006] Furthermore, the column is provided with a sliding groove along the axial direction, the connecting assembly includes a slider that is slidably connected to the sliding groove, a driving member that drives the slider to move in the sliding groove, and a crossbeam with one end fixedly connected to the slider and the other end extending in the horizontal direction, and the cutting assembly is provided on the crossbeam in the vertical direction.

[0007] Furthermore, the driving component includes a lead screw seat disposed in the slide groove, a lead screw rotatably connected to the lead screw seat, and a lead screw motor disposed on one side of the lead screw seat. The lead screw motor is connected to the lead screw and is used to drive the lead screw to rotate. The slider is provided with a first threaded hole, and the lead screw passes through the first threaded hole.

[0008] Furthermore, the slide includes a first groove and a second groove arranged sequentially from the inside to the outside on one side of the column. The second groove connects the first groove to the outside. The cross-sectional area of ​​the first groove is larger than that of the second groove. The slider is slidably connected to the first groove. One end of the crossbeam is fixedly connected to the slider through the second groove.

[0009] Furthermore, the cutting assembly includes a cutter holder disposed on the crossbeam, a cutter drive member disposed on the cutter holder, and a cutter extending vertically downward on the cutter drive member. The cutter drive member is used to drive the cutter to rotate about the vertical direction, and the cutter is used to cut the argon ion polished sample.

[0010] Furthermore, the cutter holder includes a slide block slidably connected to the crossbeam, and a connecting seat connecting the cutter drive member to the slide block. The slide block moves along the axis of the crossbeam to drive the connecting seat, the cutter drive member, and the cutter to move in the horizontal direction.

[0011] Furthermore, the crossbeam is a rectangular beam, and the slide block has a through hole along the axial direction. The through hole is a rectangular hole that matches the outer contour of the rectangular beam, and the rectangular beam is inserted into the through hole.

[0012] Furthermore, the slide is provided with a second threaded hole, which communicates with the through hole, and the cutter seat also includes a bolt screwed into the second threaded hole.

[0013] Furthermore, a scale is provided on the crossbeam along the axial direction, and the scale is used to mark the axial position of the slide on the crossbeam.

[0014] Furthermore, the cutter drive is a DD motor located at the bottom of the cutter holder, and the DD motor drives the cutter to rotate in the vertical direction to adjust the angle of the cutter.

[0015] The argon ion polishing sample pretreatment device proposed in this utility model has the following beneficial effects:

[0016] (1) The column of this device extends vertically upward on the base, the connecting component extends horizontally on the column, and the cutting component is set vertically on the connecting component. Therefore, when the connecting component moves vertically on the column and drives the cutting component to move synchronously, it can ensure that the cutting component cuts the argon ion polishing sample along the direction perpendicular to the sample fixing stage, thereby ensuring the uniformity of the force on the pre-cut argon ion polishing sample and ensuring the pre-treatment quality of the argon ion polishing sample.

[0017] (2) The cutting component 5 of this device can rotate in the vertical direction. When there is an angular deviation between the argon ion polishing sample and the sample fixing stage 2, the cutting component 5 is first rotated in the vertical direction to adjust the angle of the cutting component 5, thereby adjusting the cutting angle of the cutting component 5 on the argon ion polishing sample on the sample fixing stage 2, so as to ensure the pre-cutting angle of the argon ion polishing sample and ensure the pre-treatment quality of the argon ion polishing sample.

[0018] (3) The column of this device is provided with a sliding groove along the axial direction. The slider is driven by the drive component to move along the sliding groove, which drives the cutting component to rise and fall in the vertical direction. The cutting component cuts the argon ion polishing sample located on the sample fixing stage along the direction perpendicular to the sample fixing stage, thereby ensuring the uniformity of the force of the argon ion polishing sample pre-cutting, ensuring the pre-treatment quality of the argon ion polishing sample, and thus ensuring the effect of the argon ion polishing instrument cross-section treatment.

[0019] (4) The slide of this device includes a first groove and a second groove. The first groove and the second groove are arranged sequentially from the inside to the outside on the side of the column near the sample fixing stage. The cross-sectional area of ​​the first groove is larger than that of the second groove. The step structure formed by the first groove and the second groove can limit the slider, making the stability of the slider driven by the drive component in the first groove stronger.

[0020] (5) The cutting assembly of this device includes a cutter holder, a cutter drive and a cutter. The cutter holder is set on the crossbeam, the cutter drive is set on the cutter holder, and the cutter extends vertically downward on the cutter drive. The cutter is driven to rotate around the vertical direction by the cutter drive to adjust the angle of the cutter. Thus, when the connecting assembly drives the cutting assembly to move up and down in the vertical direction, the cutting angle of the cutter on the argon ion polished sample is adjusted, thereby ensuring the pretreatment quality of the argon ion polished sample.

[0021] (6) The cutter holder of this device includes a slide and a connecting seat. The slide is slidably connected to the crossbeam. The connecting seat is set on the slide. The cutter extends vertically downward on the connecting seat. The slide moves axially on the crossbeam, which can drive the connecting seat, the cutter drive and the cutter to move synchronously in the horizontal direction. Thus, the position of the cutter in the horizontal direction can be adjusted according to the flatness of the cross section to be treated by argon ion polishing.

[0022] (7) A scale is provided on the crossbeam of this device along the axial direction. When the slide moves along the crossbeam along the axial direction, the scale can mark the axial position of the slide on the crossbeam, thereby realizing the precise adjustment of the position of the cutter in the horizontal direction. This can ensure that the flatness of the cross section of the argon ion polished sample after pretreatment is within a suitable range, and can also reduce the waste of argon ion polished samples and reduce production costs. Attached Figure Description

[0023] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the present invention and, together with the description, serve to explain the principles of the present invention. In these drawings, similar reference numerals are used to denote similar elements.

[0024] Figure 1 This is a schematic diagram of the structure of a pretreatment device for argon ion polishing samples according to an embodiment of the present invention;

[0025] Figure 2 This is a schematic diagram of the structure of a pretreatment device for argon ion polishing samples according to an embodiment of the present invention, showing the column mounted on a base.

[0026] Figure 3 This is a schematic diagram of the connection assembly of a pretreatment device for argon ion polishing samples according to an embodiment of the present invention.

[0027] Figure 4 This is a schematic diagram of the cutting component of an argon ion polishing sample pretreatment device according to an embodiment of the present invention.

[0028] In the diagram: 1. Base; 2. Sample fixing stage; 3. Column; 31. Slide groove; 311. First groove; 312. Second groove; 4. Connecting assembly; 41. Slider; 42. Crossbeam; 421. Scale; 43. Lead screw seat; 44. Lead screw; 45. Lead screw motor; 5. Cutting assembly; 51. Slide; 511. Through hole; 512. Second threaded hole; 52. Connecting seat; 53. Cutter drive; 54. Cutter; 55. Bolt. Detailed Implementation

[0029] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without creative effort are within the scope of protection of this utility model.

[0030] See also Figures 1-4 An embodiment of the present invention provides a pretreatment device for argon ion polishing samples, comprising a base 1, a sample fixing stage 2 disposed on the base 1, a column 3 extending vertically on the base 1, a connecting component 4 extending horizontally on the column 3, and a cutting component 5 disposed vertically on the connecting component 4; the sample fixing stage 2 is used to fix the argon ion polishing sample, the connecting component 4 is used to drive the cutting component to move up and down, and the cutting component 5 can rotate around the vertical direction to adjust the cutting angle of the argon ion polishing sample on the sample fixing stage 2.

[0031] In this application, the pretreatment device includes a base 1, a sample fixing stage 2, a column 3, a connecting assembly 4, and a cutting assembly 5. The sample fixing stage 2 is mounted on the base 1, and the column 3 extends vertically upward on the base 1. The connecting assembly 4 extends horizontally on the column 3, and the cutting assembly 5 is mounted on the connecting assembly 4, thereby connecting the cutting assembly 5 and the column 3 and mounting the cutting assembly 5 above the sample fixing stage 2.

[0032] When pre-treating argon ion polishing samples, the argon ion polishing sample to be treated is first placed on the sample fixing stage 2. Then, the cutting component 5 is driven to move up and down in the vertical direction through the connecting component 4, so that the cutting component 5 cuts the argon ion polishing sample on the sample fixing stage 2 from top to bottom, thereby ensuring that the flatness of the cross-section of the argon ion polishing sample to be treated is within a suitable range, which facilitates the subsequent fine polishing treatment of the cross-section of the argon ion polishing sample by the argon ion polishing instrument.

[0033] In this application, the column 3 extends vertically upward on the base 1, the connecting component 4 extends horizontally on the column 3, and the cutting component 5 is set vertically on the connecting component 4. Therefore, by driving the cutting component 5 to move up and down in the vertical direction through the connecting component 4, it can be ensured that the cutting component 5 always cuts the argon ion polishing sample located on the sample fixing stage 2 along a direction perpendicular to the sample fixing stage 2, thereby ensuring the uniformity of the force during the pre-cutting of the argon ion polishing sample.

[0034] In actual implementation, the argon-ion polished sample placed on the sample fixing stage 2 may have an angular deviation from the sample fixing stage 2. Therefore, in this application, the cutting component 5 can rotate in the vertical direction. When there is an angular deviation between the argon-ion polished sample and the sample fixing stage 2, the cutting component 5 is first rotated in the vertical direction to adjust the angle of the cutting component 5, thereby adjusting the cutting angle of the cutting component 5 on the argon-ion polished sample on the sample fixing stage 2.

[0035] Then, the cutting component 5 is driven to move up and down in the vertical direction through the connecting component 4, so that the cutting component 5 cuts the argon ion polishing sample on the sample fixing stage 2 from top to bottom. This ensures the uniformity of the angle and force of the pre-cutting of the argon ion polishing sample, guarantees the pre-treatment quality of the argon ion polishing sample, and thus ensures the effect of the cross-section treatment of the argon ion polishing instrument.

[0036] In this embodiment, a sliding groove 31 is provided on the column 3 along the axial direction. Since the column 3 extends vertically upward on the base 1, the sliding groove 31 is provided on the column 3 in the vertical direction. The connecting assembly 4 includes a slider 41, a driving member, and a crossbeam 42. The slider 41 is slidably connected to the sliding groove 31, the driving member is connected to the slider 41, one end of the crossbeam 42 is fixedly connected to the slider 41, and the other end extends horizontally away from the slider 41.

[0037] The cutting assembly 5 is set vertically on the crossbeam 42. Therefore, the slider 41 is driven to move along the slide groove 31 by the driving component, which in turn drives the crossbeam 42 to move vertically. The crossbeam 42 then drives the cutting assembly 5 to rise and fall vertically, so that the cutting assembly 5 always cuts the argon ion polishing sample located on the sample fixing stage 2 in a direction perpendicular to the sample fixing stage 2. This ensures the uniformity of the force during the pre-cutting of the argon ion polishing sample, guarantees the pre-treatment quality of the argon ion polishing sample, and thus ensures the effect of the cross-section treatment of the argon ion polishing instrument.

[0038] Specifically, in this embodiment, the driving component includes a lead screw seat 43 fixedly disposed in the slide groove 31, a lead screw 44 rotatably connected to the lead screw seat 43, and a lead screw motor 45 disposed on one side of the lead screw seat 43 and connected to the lead screw 44. A first internal threaded hole is provided in the slider 41, and the lead screw 44 passes through the first threaded hole through the slider 41. Thus, when the lead screw motor 45 drives the lead screw 44 to rotate, the external thread on the lead screw 44 engages with the first threaded hole in the slider 41, and the slide groove 31 guides the slider 41, driving the slider 41 to move back and forth linearly along the slide groove 31.

[0039] In this embodiment, the slide groove 31 includes a first groove 311 and a second groove 312. The first groove 311 and the second groove 312 are arranged sequentially from the inside to the outside on the side of the column 3 near the sample fixing stage 2. That is, on the side of the column 3 near the sample fixing stage 2, the first groove 311 is located inside the column 3, and the second groove 312 is located outside the first groove 311. The slider 41 slides with the first groove 311. Since one end of the second groove 312 is connected to the first groove 311 and the other end is connected to the outside, the first groove 311 is connected to the outside through the second groove 312. Therefore, one end of the crossbeam 42 can be fixedly connected to the slider 41 after passing through the second groove 312.

[0040] Furthermore, since the cross-sectional area of ​​the first groove 311 is larger than that of the second groove 312, when the slider 41 slides into the first groove 311, the stepped structure formed by the first groove 311 and the second groove 312 can limit the slider 41, making the stability of the slider 41 driven by the drive component in the first groove 311 stronger, thereby improving the stability of the cutting assembly 5 in the vertical direction and ensuring the uniformity of force during the pre-cutting of the argon ion polished sample.

[0041] In this embodiment, the cutting assembly 5 includes a cutter holder, a cutter drive 53, and a cutter 54. The cutter holder is disposed on the crossbeam 42, the cutter drive 53 is disposed on the cutter holder, and the cutter 54 extends vertically downward on the cutter drive 53. The cutter holder connects the cutter drive 53 and the crossbeam 42, and the cutter 54 is mounted above the sample fixing stage 2.

[0042] When the argon-ion polished sample placed on the sample fixing stage 2 has an angular deviation from the sample fixing stage 2, the cutter drive component 53 drives the cutter 54 to rotate in the vertical direction according to the angle of the argon-ion polished sample, thereby adjusting the angle of the cutter 54. Thus, when the connecting component 4 drives the cutting component 5 to move up and down in the vertical direction, the cutting angle of the cutter 54 on the argon-ion polished sample is adjusted, thereby ensuring the pretreatment quality of the argon-ion polished sample.

[0043] Specifically, in this embodiment, the cutter drive 53 is a DD motor, which is located at the bottom of the cutter holder. The cutter 54 is connected to the DD motor and extends vertically downward, thereby driving the cutter 54 to rotate through the DD motor and controlling the rotation angle of the cutter 54 to adjust the angle of the cutter 54.

[0044] Because the cross-section of the argon ion polished sample is uneven, the edge of the cross-section is wavy and cannot be used as a reference for adjusting the angle of the cutter 54. However, the side of the argon ion polished sample opposite the cross-section is flat. Therefore, in practice, the edge of the side of the argon ion polished sample opposite the cross-section can be used as a reference for adjusting the angle of the cutter 54. That is, the cutter 54 is rotated by a DD motor until it is parallel to the edge of that side of the argon ion polished sample, thus allowing the cutter 54 to move vertically downwards. This ensures the pre-treatment quality of the argon ion polished sample during cutting, thereby guaranteeing the effectiveness of the cross-section treatment by the argon ion polisher.

[0045] In actual production, the flatness of the cross-section of the argon ion polished sample varies greatly. Therefore, when pre-treating the argon ion polished sample, it is necessary to adjust the cutting position of the argon ion polished sample according to the flatness of the cross-section to ensure that the flatness of the cross-section of the argon ion polished sample after pre-treatment is within a suitable range.

[0046] Therefore, in this embodiment, the cutter holder includes a slide 51 and a connecting seat 52. The slide 51 is slidably connected to the crossbeam 42, the connecting seat 52 is disposed on the slide 51, and the cutter drive 53 is disposed at the bottom of the connecting seat 52, thereby connecting the cutter drive 53 and the cutter 54 to the slide 51 through the connecting seat 52.

[0047] Since the crossbeam 42 extends horizontally and the slide block 51 is slidably connected to the crossbeam 42, the slide block 51 moves axially on the crossbeam 42, which drives the connecting seat 52, the cutter drive 53, and the cutter 54 to move synchronously in the horizontal direction. This allows the position of the cutter 54 in the horizontal direction to be adjusted according to the flatness of the cross-section of the argon ion polishing sample. When the cutter 54 moves vertically downward, it can cut different positions of the argon ion polishing sample, thereby ensuring that the flatness of the cross-section of the argon ion polishing sample after pretreatment is within a suitable range, thus ensuring the effect of the cross-section treatment of the argon ion polishing instrument.

[0048] In this embodiment, the slide 51 has a through hole 511 along the axial direction. The crossbeam 42 is inserted into the through hole 511, allowing the slide 51 to move axially on the crossbeam 42. The crossbeam 42 is set as a rectangular beam, and the through hole 511 is a rectangular hole that matches the outer contour of the rectangular beam. Thus, when the rectangular beam and the rectangular hole are inserted, the slide 51 can move axially on the crossbeam 42, and the cooperation between the rectangular beam and the rectangular hole limits the slide 51, preventing it from rotating around the crossbeam 42. This ensures that the cutter 54 cuts the argon ion polished sample in a direction perpendicular to the argon ion polished sample, while also ensuring the stability of the cutter 54 in cutting the argon ion polished sample.

[0049] It is foreseeable that in this embodiment, the crossbeam 42 is not limited to a rectangular beam, and the through hole 511 provided in the slide 51 is not limited to a rectangular hole. It is only necessary to restrict the movement of the slide 51 on the crossbeam 42 except for axial movement by the cooperation between the crossbeam 42 and the through hole 511 when the crossbeam 42 is inserted into the through hole 511. For example, the crossbeam 42 can be a trapezoidal beam, and the through hole 511 provided in the slide 51 can be a trapezoidal hole that matches the outer contour of the trapezoidal beam; the crossbeam 42 can also be a triangular beam, and the through hole 511 provided in the slide 51 can be a triangular hole that matches the outer contour of the triangular beam.

[0050] In this embodiment, the slide 51 is provided with a second threaded hole 512, which communicates with the through hole 511. The cutter holder also includes a bolt 55, one end of which is screwed into the second threaded hole 512. Since the crossbeam 42 is inserted into and passes through the through hole 511, the slide 51 moves axially on the crossbeam 42 to adjust the horizontal position of the cutter 54. Then, the bolt 55 is screwed into the second threaded hole 512 until the end of the bolt 55 abuts against the crossbeam 42, thereby fixing the position of the slide 51 on the crossbeam 42 and thus fixing the horizontal position of the cutter 54, further improving the stability of the cutter 54 in cutting argon ion polished samples.

[0051] When it is necessary to adjust the horizontal position of the cutter 54, simply screw the bolt 55 outward in the second threaded hole 512 so that the end of the bolt 55 is away from the crossbeam 42. This will prevent the bolt 55 from fixing the slide 51 to the crossbeam 42. At this time, the slide 51 can move axially on the crossbeam 42, which can drive the connecting seat 52, the cutter drive 53 and the cutter 54 to move synchronously in the horizontal direction, making the use of this device simpler, more convenient and easier to implement.

[0052] In this application, adjusting the horizontal position of the cutter 54 is to ensure that the flatness of the cross-section of the pretreated argon-ion polished sample is within a suitable range. If the horizontal position of the cutter 54 is too far back, the volume of the argon-ion polished sample cut off by the cutter 54 will be too large, resulting in waste of the argon-ion polished sample.

[0053] Therefore, in this embodiment, a scale 421 is provided on the crossbeam 42 along the axial direction. When the slide 51 moves along the axial direction on the crossbeam 42, driving the connecting seat 52 and the cutter 54 to move synchronously in the horizontal direction, the scale 421 can mark the axial position of the slide 51 on the crossbeam 42, thereby realizing the precise adjustment of the horizontal position of the cutter 54. This can ensure that the flatness of the cross-section of the argon ion polished sample after pretreatment is within a suitable range, and can also reduce the waste of argon ion polished samples and reduce production costs.

[0054] The above-described contents can be implemented individually or in combination in various ways, and all such variations are within the protection scope of this utility model.

[0055] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

[0056] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A pretreatment device for argon ion polishing samples, characterized in that: The sample includes a base (1), a sample fixing stage (2) disposed on the base (1), a column (3) extending vertically on the base (1), a connecting component (4) extending horizontally on the column (3), and a cutting component (5) disposed vertically on the connecting component (4); the sample fixing stage (2) is used to fix the argon ion polished sample, the connecting component (4) is used to drive the cutting component (5) to move up and down, and the cutting component (5) can rotate around the vertical direction to adjust the cutting angle of the argon ion polished sample on the sample fixing stage (2).

2. The pretreatment apparatus for argon ion polishing samples as described in claim 1, characterized in that: The column (3) is provided with a sliding groove (31) along the axial direction. The connecting assembly (4) includes a slider (41) that is slidably connected to the sliding groove (31), a driving member that drives the slider (41) to move in the sliding groove (31), and a crossbeam (42) that is fixedly connected to the slider (41) at one end and extends horizontally at the other end. The cutting assembly (5) is provided on the crossbeam (42) along the vertical direction.

3. The pretreatment apparatus for argon ion polishing samples as described in claim 2, characterized in that: The driving component includes a lead screw seat (43) disposed in the slide groove (31), a lead screw (44) rotatably connected to the lead screw seat (43), and a lead screw motor (45) disposed on one side of the lead screw seat (43). The lead screw motor (45) is connected to the lead screw (44) and is used to drive the lead screw (44) to rotate. The slider (41) is provided with a first threaded hole, and the lead screw (44) passes through the first threaded hole.

4. The pretreatment apparatus for argon ion polishing samples as described in claim 2, characterized in that: The slide (31) includes a first groove (311) and a second groove (312) arranged sequentially from the inside to the outside on one side of the column (3). The second groove (312) connects the first groove (311) to the outside. The cross-sectional area of ​​the first groove (311) is larger than that of the second groove (312). The slider (41) is slidably connected to the first groove (311). One end of the crossbeam (42) is fixedly connected to the slider (41) through the second groove (312).

5. The pretreatment apparatus for argon ion polishing samples as described in claim 2, characterized in that: The cutting assembly (5) includes a cutter seat on the crossbeam (42), a cutter drive (53) on the cutter seat, and a cutter (54) extending vertically downward on the cutter drive (53). The cutter drive (53) is used to drive the cutter (54) to rotate in the vertical direction, and the cutter (54) is used to cut the argon ion polished sample.

6. The pretreatment apparatus for argon ion polishing samples as described in claim 5, characterized in that: The cutter holder includes a slide (51) slidably connected to the crossbeam (42), and a connecting seat (52) connecting the cutter drive (53) to the slide (51). The slide (51) moves along the axis of the crossbeam (42) to drive the connecting seat (52), the cutter drive (53) and the cutter (54) to move in the horizontal direction.

7. The pretreatment apparatus for argon ion polishing samples as described in claim 6, characterized in that: The crossbeam (42) is a rectangular beam, and the slide (51) is provided with a through hole (511) along the axial direction. The through hole (511) is a rectangular hole that matches the outer contour of the rectangular beam, and the rectangular beam is inserted into the through hole (511).

8. The pretreatment apparatus for argon ion polishing samples as described in claim 7, characterized in that: The slide (51) is provided with a second threaded hole (512), which communicates with the through hole (511). The cutter seat also includes a bolt (55) that is screwed into the second threaded hole (512).

9. The pretreatment apparatus for argon ion polishing samples as described in claim 6, characterized in that: A scale (421) is provided on the crossbeam (42) along the axial direction. The scale (421) is used to mark the axial position of the slide (51) on the crossbeam (42).

10. The pretreatment apparatus for argon ion polishing samples as described in claim 5, characterized in that: The cutter drive (53) is a DD motor located at the bottom of the cutter holder. The DD motor drives the cutter (54) to rotate in the vertical direction to adjust the angle of the cutter (54).

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