Device for automatically timing corrosion time of alloy in non-conductive solution

Abstract

The utility model discloses a device for automatically timing corrosion time of an alloy in a non-conductive solution. The device comprises a 3V3 power supply, a pull-up resistor I, a photoresistor, a corrosive liquid, a material to be tested, a glass container, a light emitting diode, an MCU (Microprogrammed Control Unit) controller, a pull-up resistor II, a switch, a resistor and a power supply, the photoresistor, the corrosive liquid and the to-be-detected material are sequentially arranged in the glass container from top to bottom, and the light-emitting diode is arranged under the glass container; the 3V3 power supply, the pull-up resistor I and the photoresistor are sequentially connected in series, and the joint of the pull-up resistor I and the photoresistor is connected with the MCU controller; the pull-up resistor II, the switch and the resistor are sequentially connected in series, and the interface of the pull-up resistor II and the switch is connected with the MCU controller. According to the utility model, the photoresistor is not in direct contact with the alloy, so that the surface gradient of the alloy is not influenced, the defect that the corrosion time can only be measured in an electrolyte solution at present is overcome, and the efficiency and progress of an automatic timing experiment for the corrosion time of the alloy in a non-conductive solution are improved.

Description

Technical Field

[0001] This utility model belongs to the field of timing equipment technology, specifically relating to a device for automatically timing the corrosion time of alloys in non-conductive solutions. Background Technology

[0002] The current traditional method for detecting the corrosion time of alloys requires someone to be present at the site and observe the corrosion every half hour. This method creates difficulties for experiments, seriously delays the experimental progress, increases the difficulty of developing new materials, and prevents research results from being industrialized as soon as possible.

[0003] Patent CN219935627U discloses a device for automatically timing the corrosion time of alloys. It accurately obtains the corrosion time by automatically stopping the timing when the circuit is connected. However, this device requires a wire to be in contact with the sample to achieve automatic recording of the corrosion time, which affects the tilt of the sample surface and the area of ​​contact with the corrosion solution, thus affecting the accuracy of the corrosion time. Furthermore, current devices for automatically timing alloy corrosion can only be used with solutions where the corrosion medium is an electrolyte; in non-conductive solutions, it is impossible to form a closed circuit to automatically record the corrosion time. Utility Model Content

[0004] To address the shortcomings of the existing technology, this invention proposes an automatic timer for measuring the corrosion time of alloys in non-conductive solutions.

[0005] To achieve the above objectives, the technical solution adopted by this utility model is as follows: an automatic timing device for alloy corrosion time in a non-conductive solution, comprising a 3V3 power supply 1, a pull-up resistor I 2, a photoresistor 3, a corrosion solution 4, the material to be tested 5, a glass container 6, a light-emitting diode 7, an MCU controller 8, a pull-up resistor II 9, a switch 10, a resistor 11, a 3V3 power supply 1, and a power supply 12; the 3V3 power supply 1 is connected to the pull-up resistor I 2, the pull-up resistor I 2 is connected in series with the photoresistor 3, and the connection point between the pull-up resistor I 2 and the photoresistor 3 is connected to the MCU controller 6. The MCU controller 8 is connected; inside the glass container 6, from top to bottom, a photoresistor 3, an etching solution 4, and the material to be tested 5 are installed sequentially. The photoresistor 3 does not contact the etching solution 4, while the etching solution 4 and the material to be tested 5 are in contact; the power supply 12 is connected to the MCU controller 8 and the light-emitting diode 7 respectively; the light-emitting diode 7 is placed directly below the glass container 6; the pull-up resistor II 9, the switch 10, and the resistor 11 are connected in series in the order of pull-up resistor II 9, switch 10, and resistor 11. The pull-up resistor II 9 is connected to the 3V3 power supply 1, and the interface between the pull-up resistor II 9 and the switch 10 is connected to the MCU controller 8.

[0006] In a preferred embodiment of this utility model, the MCU controller 8 includes IO1, IO2 and a timer, with IO1 and IO2 respectively connected to the timer.

[0007] In a preferred embodiment of this utility model, the interface between the pull-up resistor II9 and the switch 10 is connected to IO1 inside the MCU controller 8; the connection between the pull-up resistor I2 and the photoresistor 3 is connected to IO2 inside the MCU controller 8.

[0008] In a preferred embodiment of this utility model, the photoresistor 3 is connected to ground, and the resistor 11 is connected to ground.

[0009] In a preferred embodiment of this utility model, the test material 5 is fixed to the bottom of the glass container 6, and the size of the test material 5 is the same as the cross-section of the glass container 6, so as to block the light emitted by the light-emitting diode 7 from the photoresistor 3.

[0010] In a preferred embodiment of this utility model, the resistance of the pull-up resistor I2 is set to R0, the resistance of the photoresistor 3 is R1 when there is no light, and R2 when there is light, with the resistance of R1 being greater than R0 and the resistance of R2 being less than R0.

[0011] In a preferred embodiment of this utility model, the pull-up resistor II9 is ​​set to R3, and the resistor I1 is set to R4, where R4 is less than R3.

[0012] Compared with the prior art, the beneficial effects of this utility model are as follows: This utility model installs the photoresistor in the mounting groove at the top of the glass container. The resistor does not need to be in direct contact with the alloy sample, so it will not lift the sample and affect the surface tilt. It also makes up for the current shortcomings of only being able to measure corrosion time in electrolyte solutions. This greatly improves the efficiency and progress of automatic timing experiments for alloy corrosion time in non-conductive solutions, and provides technical support for actual production and research and development. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of a device for automatically timing the corrosion time of an alloy in a non-conductive solution.

[0014] Figure labeling: 1-3V3 power supply, 2-pull-up resistor, 3-photoresistor, 4-etching solution, 5-material under test, 6-glass container, 7-light-emitting diode, 8-MCU controller, 9-pull-up resistor, 10-switch, 11-resistor, 12-power supply. Detailed Implementation

[0015] To better illustrate the purpose, technical solution, and advantages of this utility model, the following will provide a further description of the utility model in conjunction with specific embodiments.

[0016] Example 1

[0017] like Figure 1As shown, an automatic timing device for measuring the corrosion time of an alloy in a non-conductive solution includes a 3V3 power supply 1, a pull-up resistor I 2, a photoresistor 3, a corrosion solution 4, the material to be tested 5, a glass container 6, a light-emitting diode 7, an MCU controller 8, a pull-up resistor II 9, a switch 10, a resistor 11, a 3V3 power supply 1, and a power supply 12.

[0018] The 3V3 power supply 1 is connected to the pull-up resistor I2, which is connected in series with the photoresistor 3, and the photoresistor 3 is grounded.

[0019] The MCU controller 8 internally includes IO1, IO2, and a timer. IO1 and IO2 are connected to the timer. The connection point between pull-up resistor I2 and photoresistor 3 is connected to IO2 within the MCU controller 8. The interface between pull-up resistor II9 and switch 10 is connected to the MCU controller 8. Pull-up resistor II9, switch 10, and resistor 11 are connected in series in the following order: pull-up resistor II9, switch 10, and resistor 11. Pull-up resistor II9 is ​​connected to the 3V3 power supply 1, and resistor 11 is connected to ground.

[0020] Inside the glass container 6, from top to bottom, are installed a photoresistor 3, an etching solution 4, and a test material 5. The photoresistor 3 does not contact the etching solution 4, while the etching solution 4 and the test material 5 are in contact.

[0021] Power supply 12 is connected to MCU controller 8 and LED 7 respectively; LED 7 is placed directly below glass container 6.

[0022] The pull-up resistor I2 is set to R0. When the light from the LED 7 does not shine on the photoresistor 3, its resistance is R1; when it is illuminated, its resistance is R2. The resistance of R1 is greater than R0, and the resistance of R2 is less than R0. The pull-up resistor II9 is ​​set to R3, and the resistance of resistor I1 is set to R4. R4 is less than R3.

[0023] Example 2

[0024] The automatic timing device for alloy corrosion time in non-conductive solution described in Example 1 is used to automatically time the alloy corrosion time, including the following steps:

[0025] (1) Turn on switch 10.

[0026] (2) The etching solution 4 and the test material 5 are installed in the glass container 6 in the order of photoresistor 3, etching solution 4 and test material 5 from top to bottom. The photoresistor 3 does not contact the etching solution 4, and the etching solution 4 and test material 5 are in contact.

[0027] (3) When the switch 10 is turned on, since the resistance R4 of resistor 11 is less than the resistance R3 of pull-up resistor II9, a falling edge is generated at the IO1 port of MCU controller 8. After the MCU controller 8 detects the falling edge, it starts the timer to start counting and records the start time as t0.

[0028] (4) Since the material under test 5 is not completely corroded by the corrosive liquid 4, the light emitted by the light-emitting diode 7 cannot reach the photoresistor 3. At this time, the resistance R1 of the photoresistor 3 is greater than the resistance R0 of the pull-up resistor I2. Therefore, the IO2 port of the MCU controller 8 is always at a high level.

[0029] (5) As the corrosion time of the test material 5 increases, the corrosive liquid 4 corrodes the test material 5 through. The photoresistor 3 receives the light from the light-emitting diode 7, and the resistance of the photoresistor 3 changes to R2, which is less than the resistance R0 of the pull-up resistor II2. Then a falling edge is generated at the IO2 port of the MCU controller 8. After the MCU controller 8 detects the falling edge, it lowers the timer to stop counting and records the start time as t1. Then the time for the corrosive liquid 4 to corrode the test material 5 is t = t0 - t1.

[0030] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model and are not intended to limit the scope of protection of this utility model. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this utility model without departing from the essence and scope of the technical solutions of this utility model.

Claims

1. A device for automatically timing the corrosion time of an alloy in a non-conductive solution, characterized in that, The system includes a 3V3 power supply, pull-up resistor I, a photoresistor, an etching solution, a material under test (DUT), a glass container, an LED, an MCU controller, pull-up resistor II, a switch, a resistor, a 3V3 power supply, and a power source. The 3V3 power supply is connected to pull-up resistor I, which is connected in series with the photoresistor. The connection between pull-up resistor I and the photoresistor is connected to the MCU controller. Inside the glass container, the photoresistor, etching solution, and DUT are installed sequentially from top to bottom. The photoresistor does not contact the etching solution, while the etching solution contacts the DUT. The power supply is connected to the MCU controller and the LED. The LED is positioned directly below the glass container. Pull-up resistor II, the switch, and the resistor are connected in series. Pull-up resistor II is connected to the 3V3 power supply, and the interface between pull-up resistor II and the switch is connected to the MCU controller.

2. The device for automatically timing the corrosion time of alloys in a non-conductive solution as described in claim 1, characterized in that, The MCU controller includes IO1, IO2 and a timer, with IO1 and IO2 connected to the timer respectively.

3. The device for automatically timing the corrosion time of alloys in a non-conductive solution as described in claim 2, characterized in that, The interface between the pull-up resistor II and the switch is connected to IO1 inside the MCU controller; the connection between the pull-up resistor I and the photoresistor is connected to IO2 inside the MCU controller.

4. The device for automatically timing the corrosion time of alloys in a non-conductive solution as described in claim 1, characterized in that, The photoresistor is connected to ground, and the resistor is connected to ground.

5. The device for automatically timing the corrosion time of alloys in a non-conductive solution as described in claim 1, characterized in that, The pull-up resistor I is set to R0, the photoresistor has a resistance of R1 when there is no light and a resistance of R2 when there is light, the resistance of R1 is greater than R0, and the resistance of R2 is less than R0.

6. The device for automatically timing the corrosion time of alloys in a non-conductive solution as described in claim 1, characterized in that, The pull-up resistor II is set to R3, and the resistor is set to R4, where R4 is less than R3.

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