Testing device and system based on lamp panel driving module

Abstract

The embodiment of the utility model provides a test device and system based on a lamp panel driving module, and belongs to the technical field of integrated circuits. According to the method, each voltage detection module is electrically connected with one lamp panel driving module, a function detection module is electrically connected with the voltage detection module, the voltage detection module can detect the voltage of the lamp panel driving module to obtain a voltage detection signal, and the function detection state of each lamp panel driving module is determined according to the voltage detection signal. Wherein the function detection state comprises a function abnormal state and a function normal state. Therefore, according to the testing device and system based on the lamp panel driving module, the function detection state of the lamp panel driving module can be judged by detecting the voltage of the lamp panel driving module, automatic testing of the lamp panel driving module is achieved, and meanwhile the testing efficiency and accuracy of the lamp panel driving module are improved.

Description

Technical Field

[0001] This application relates to the field of integrated circuit technology, and in particular to a test device and system based on a lamp board driver module. Background Art

[0002] Currently, in industrial production, network cameras (IPCs) often require external light boards for ambient lighting during nighttime video recording. The function of controlling this lighting is typically implemented by the IPC's light board driver module. However, existing light board driver module testing mainly relies on manual observation. This involves connecting the driver module to a test light board and visually observing whether the lights on the test board are turning on and off correctly to determine if the driver module is functioning properly. This method has significant limitations. When the lights on the test board exhibit slight flickering, these subtle changes are difficult for the human eye to detect. Furthermore, when the driver module needs to connect to test lights with specific spectra, it is difficult to observe the status of these test lights visually. This results in low testing efficiency for existing light board driver modules, especially during large-scale IPC production. Manually testing the light board driver modules of each IPC device individually severely impacts production efficiency. Therefore, improving the testing efficiency and accuracy of light board driver modules and achieving automated testing has become an urgent technical requirement. Summary of the Invention

[0003] The main objective of this application is to propose a testing device and system based on a lamp board driver module, which aims to improve the testing efficiency and accuracy of the lamp board driver module.

[0004] To achieve the above objectives, this application provides a testing device based on a lamp board driver module, which includes at least one voltage detection module and a function detection module.

[0005] Each of the voltage detection modules is electrically connected to one of the lamp board driving modules, and is used to detect the voltage of the lamp board driving module to obtain a voltage detection signal;

[0006] The function detection module is electrically connected to the voltage detection module and is used to determine the function detection state of each lamp board driver module based on the voltage detection signal. The function detection state includes a function abnormal state and a function normal state. If the number of times the voltage detection signal is a low-level signal is equal to the number of detections, the lamp board driver module is in a function normal state. If the number of times the voltage detection signal is a high-level signal is greater than a preset number, the lamp board driver module is in a function abnormal state.

[0007] In some embodiments, the voltage detection module includes:

[0008] A signal input submodule is electrically connected to the lamp board driver module and is used to input the operating voltage signal of the lamp board driver module.

[0009] A voltage comparison submodule, electrically connected to the signal input submodule, is used to compare the operating voltage signal with a preset reference voltage signal to obtain a voltage comparison signal;

[0010] A signal conversion submodule, electrically connected to the voltage comparison submodule, is used to convert the voltage comparison signal into the voltage detection signal.

[0011] In some embodiments, the voltage comparison signal includes: a first comparison signal and a second comparison signal; the voltage comparison submodule includes:

[0012] A first voltage comparison unit, the input terminal of which is electrically connected to the signal input submodule, is used to output the first comparison signal according to the operating voltage signal;

[0013] The second voltage comparison unit, whose input terminal is electrically connected to the signal input submodule, is used to output the second comparison signal according to the operating voltage signal.

[0014] In some embodiments, the first voltage comparison unit includes: a first comparator, a first resistor, a second resistor, and a fifth resistor;

[0015] The non-inverting input of the first comparator is electrically connected between the first resistor and the second resistor. The other end of the first resistor is connected to the power supply, and the other end of the second resistor is grounded. The inverting input of the first comparator is electrically connected to the lamp board driver module, and the output of the first comparator is electrically connected to the signal conversion submodule.

[0016] The fifth resistor is electrically connected between the output of the first comparator and the power supply.

[0017] In some embodiments, the second voltage comparison unit includes: a second comparator, a third resistor, a fourth resistor, and a sixth resistor;

[0018] The non-inverting input of the second comparator is electrically connected to the lamp board driver module, the output of the second comparator is electrically connected to the signal conversion submodule, the inverting input of the second comparator is electrically connected between the third resistor and the fourth resistor, the other end of the third resistor is connected to the power supply, and the other end of the fourth resistor is grounded.

[0019] The sixth resistor is electrically connected between the output of the second comparator and the power supply.

[0020] In some embodiments, the signal conversion submodule includes: a MOSFET and a seventh resistor;

[0021] The gate of the MOS transistor is electrically connected to the output terminal of the second comparator and the output terminal of the first comparator. The source of the MOS transistor is grounded. The drain of the MOS transistor is electrically connected to the seventh resistor. The other end of the seventh resistor is connected to the power supply. The drain of the MOS transistor and the seventh resistor are electrically connected to the functional detection module.

[0022] In some embodiments, the signal input submodule includes: a first light-emitting diode, an eighth resistor, and a second light-emitting diode;

[0023] The positive terminal of the first light-emitting diode is electrically connected to the lamp board driver module, the negative terminal of the first light-emitting diode is electrically connected to one end of the eighth resistor, the other end of the eighth resistor is connected to the positive terminal of the second light-emitting diode, and the negative terminal of the second light-emitting diode is electrically connected to the lamp board driver module.

[0024] The negative input terminal of the first comparator and the positive input terminal of the second comparator are electrically connected between the first light-emitting diode and the eighth resistor.

[0025] In some embodiments, the function detection module includes:

[0026] At least one standard signal acquisition submodule, each of the standard signal acquisition submodules being electrically connected to one of the signal conversion submodules, wherein the standard signal acquisition submodule is used to acquire at least one of the voltage detection signals according to preset frequency information;

[0027] A timer, electrically connected to the at least one standard signal acquisition submodule, is used to control the test duration for each of the standard signal acquisition submodules to acquire at least one of the voltage detection signals according to a pre-acquired test instruction;

[0028] The first judgment submodule is electrically connected to the standard signal acquisition submodule and is used to output low-level counting information and high-level counting information according to the voltage detection signal.

[0029] The second judgment submodule has its input terminal electrically connected to the output terminal of the first judgment submodule. It is used to compare the low-level count information, the high-level count information, and the preset number of times to obtain functional status information.

[0030] In some embodiments, the first determination submodule includes:

[0031] A level judgment unit, the input of which is electrically connected to the output of the standard signal acquisition submodule, is used to judge the level of each voltage detection signal and generate level judgment information;

[0032] A counter, the input of which is electrically connected to the output of the standard signal acquisition submodule and the output of the level judgment unit, is used to count based on at least one voltage detection signal acquired by each of the standard signal acquisition submodules and the level judgment information; wherein, if the level judgment information indicates that the voltage detection signal is a high-level signal, then high-level counting is performed to obtain high-level counting information; if the level judgment information indicates that the voltage detection signal is a low-level signal, then low-level counting is performed to obtain low-level counting information.

[0033] To achieve the above objectives, a second aspect of this application provides a testing system based on a lamp board driver module. The system includes the testing apparatus and control device described in the second aspect of this application, wherein the control device includes:

[0034] The test instruction sending module is used to send test instructions to the test device to control the test device to test the lamp board driver module and obtain the functional detection status of the lamp board driver module.

[0035] A status information acquisition module, which is communicatively connected to the testing device, is used to acquire the functional status information;

[0036] An error notification module is used to provide an error notification for the lamp board driver module when the function detection status is in an abnormal state.

[0037] The testing apparatus and system based on lamp board driver modules proposed in this application electrically connect each voltage detection module to a lamp board driver module and connects a function detection module to the voltage detection module. The voltage detection module detects the voltage of the lamp board driver module to obtain a voltage detection signal, and determines the function detection state of each lamp board driver module based on the voltage detection signal. The function detection state includes a function abnormal state and a function normal state. If the number of times the voltage detection signal is low equals the number of detections, the lamp board driver module is in a function normal state; if the number of times the voltage detection signal is high exceeds a preset number, the lamp board driver module is in a function abnormal state. Therefore, the testing apparatus and system based on lamp board driver modules proposed in this application can determine the function detection state of the lamp board driver module by detecting its voltage, achieving automated testing of the lamp board driver module and improving the testing efficiency and accuracy. Attached Figure Description

[0038] Figure 1 This is a schematic diagram of the structure of the test device based on the lamp board driver module provided in the embodiments of this application;

[0039] Figure 2 This is a schematic diagram of the voltage detection module;

[0040] Figure 3 This is a schematic diagram of the voltage comparator submodule;

[0041] Figure 4 This is a schematic diagram of the circuit structure of the test device based on the lamp board driver module provided in the embodiments of this application;

[0042] Figure 5 This is a structural diagram of the functional testing module;

[0043] Figure 6 This is a structural diagram of the first judgment submodule;

[0044] Figure 7 This is a schematic diagram of the structure of the test system based on the lamp board driver module provided in the embodiments of this application;

[0045] Figure 8 This is a schematic diagram of the control device. DETAILED DESCRIPTION

[0046] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0047] It should be noted that although functional modules are divided in the system diagram and the logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the system or the order in the flowchart. The terms "first," "second," etc., in the specification, claims, and the aforementioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0048] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application pertains. The terms used herein are for the purpose of describing the embodiments of this application only and are not intended to limit this application.

[0049] In modern industrial production, network cameras (IPCs) play a crucial role in nighttime surveillance, typically relying on external light boards to provide necessary ambient lighting. The light board driver module, as a key component controlling the supplementary lighting, directly impacts the IPC's nighttime imaging performance. However, current testing methods for light board driver modules largely depend on manual inspection. This involves connecting the driver module to a test light board and visually observing whether the LEDs on the board light up or turn off as expected to assess its functionality. This method has significant limitations, especially when LEDs flicker slightly, as these subtle anomalies are often difficult for the human eye to detect. Furthermore, for test lights requiring specific spectra, the naked eye can hardly accurately determine their operational status. These limitations not only restrict testing accuracy but also significantly reduce production efficiency during large-scale IPC equipment production by relying on manual inspection of each light board driver module.

[0050] Based on this, embodiments of this application provide a testing device and system based on a lamp board driver module, aiming to improve the testing efficiency and accuracy of the lamp board driver module.

[0051] This application provides a testing device and system based on a lamp board driver module, which will be described in detail through the following embodiments. First, a testing device based on a lamp board driver module is described in this application.

[0052] Figure 1This is an optional structural schematic diagram of a test device based on a lamp board driver module provided in this application embodiment. The test device 1000 provided in this application embodiment includes: at least one voltage detection module 1100 and a function detection module 1200. Furthermore, the various components within the test device 1000 can share a single power supply, the output voltage of which can be 3.3V. Each voltage detection module 1100 is electrically connected to a lamp board driver module 3000, used to detect the voltage level of the lamp board driver module 3000 in real time, and generate a voltage detection signal based on the voltage level of the lamp board driver module 3000. Subsequently, the voltage detection signal is transmitted by the voltage detection module 1100 to the function detection module 1200, which analyzes these voltage detection signals to determine whether the lamp board driver module 3000 is working properly. Specifically, for each lamp board driver module 3000, the function detection module 1200 classifies the voltage detection signals transmitted by the lamp board driver module 3000 over a period of time, and counts the voltage detection signals according to each classification. The categories of voltage detection signals include: low-level signals and high-level signals. After the counting is completed, low-level count information is obtained based on the number of times the voltage detection signal is low, and high-level count information is obtained based on the number of times the voltage detection signal is high. The low-level count information is compared with a preset number of low-level signals to obtain low-level comparison information, and the high-level count information is compared with a preset number of high-level signals to obtain high-level comparison information. Functional state is determined based on the low-level and high-level comparison information to obtain functional state information. Therefore, the testing device based on the lamp board driver module shown in this embodiment can automate the testing of the driving function of the lamp board driver module 3000, improve the accuracy of driving function testing, reduce the manual requirements during quality inspection of the lamp board driver module 3000, thereby reducing costs and improving production efficiency.

[0053] In some embodiments, when multiple voltage detection modules 1100 are electrically connected to the function detection module 1200, the function detection module 1200 can receive voltage detection signals from each voltage detection module 1100 and classify and count the voltage detection signals from each voltage detection module 1100 to obtain low-level count information and high-level count information corresponding to each lamp board driver module 3000. Then, it compares the low-level count information of each voltage detection module 1100 with a preset number of low-level signals to obtain low-level comparison information corresponding to each lamp board driver module 3000, and compares the high-level count information of each voltage detection module 1100 with a preset number of high-level signals to obtain high-level comparison information corresponding to each lamp board driver module 3000. Finally, it performs a function state judgment based on the low-level comparison information and high-level comparison information corresponding to each lamp board driver module 3000 to obtain the function state information of each lamp board driver module 3000. Therefore, the test device based on the lamp board driver module shown in the embodiments of this application can save the time of performing functional tests on multiple lamp board driver modules 3000 one by one by classifying and counting the voltage detection signals of multiple voltage detection modules 1100 at the same time.

[0054] In some embodiments, only low-level signals can be counted to obtain low-level count information, and the low-level count information can be compared with a preset number of low-level signals to obtain low-level comparison information. Finally, the functional status is determined based only on the low-level comparison information to obtain the functional status information of the lamp board driver module 3000.

[0055] In some embodiments, only the high-level signals can be counted to obtain high-level count information, and the high-level count information can be compared with a preset number of high-level signals to obtain high-level comparison information. Finally, the functional status is determined based only on the high-level comparison information to obtain the functional status information of the lamp board driver module 3000.

[0056] In some embodiments, the functional detection state includes a functional abnormal state and a functional normal state. If the number of times the voltage detection signal is a high-level signal is greater than or equal to a preset number of high-level signals, the lamp board driver module 3000 is in a functional normal state; if the number of times the voltage detection signal is a low-level signal is greater than a preset number of low-level signals, the lamp board driver module 3000 is in a functional abnormal state. For example, when the number of times the voltage detection signal is a high-level signal equals the detection count, and the voltage detection signal is a low-level signal (zero), the functional state information indicates that the lamp board driver module 3000 is in a functional normal state.

[0057] like Figure 2As shown, in some embodiments, the voltage detection module 1100 includes: a signal input submodule 1110, a voltage comparison submodule 1120, and a signal conversion submodule 1130. The signal input submodule 1110 is electrically connected to the lamp board driver module 3000 and is used to input the operating voltage signal of the lamp board driver module 3000. The voltage comparison submodule 1120 is electrically connected to the signal input submodule 1110 and is used to compare the received operating voltage signal with a preset reference voltage signal. The reference voltage signal is set according to the expected operating voltage of the lamp board driver module 3000 and is used to determine whether the voltage of the lamp board driver module 3000 is within the normal range. The voltage comparison submodule 1120 generates a voltage comparison signal by comparing the expected operating voltage setting and the operating voltage signal, wherein the voltage comparison signal reflects the relationship between the voltage of the lamp board driver module 3000 and the preset reference voltage. The signal conversion submodule 1130 is electrically connected to the voltage comparison submodule 1120 and is used to convert the voltage comparison signal into a voltage detection signal, which is the basis for the judgment made by the function detection module 1200. The signal conversion submodule 1130 may include logic circuits or other types of circuitry for converting the voltage comparison signal into an easily analyzable format, such as a digital signal, thereby enabling the function detection module 1200 to accurately identify the functional state of the lamp board driver module 3000. Therefore, the lamp board driver module-based testing device illustrated in this embodiment can achieve rapid and accurate detection of the voltage signal of the lamp board driver module 3000. Furthermore, through its modular design, the testing device 1000 can flexibly adapt to different types of lamp board driver modules 3000 and can be easily integrated into an automated testing system.

[0058] like Figure 3As shown, in some embodiments, the voltage comparison signal includes: a first comparison signal and a second comparison signal; the voltage comparison submodule 1120 includes: a first voltage comparison unit 1121 and a second voltage comparison unit 1122. The input terminal of the first voltage comparison unit 1121 is electrically connected to the signal input submodule 1110, and is used to output the first comparison signal according to the operating voltage signal. The input terminal of the second voltage comparison unit 1122 is electrically connected to the signal input submodule 1110, and is used to output the second comparison signal according to the operating voltage signal. By judging the operating voltage signal and the expected maximum voltage by the first voltage comparison unit 1121, and by judging the operating voltage signal and the expected minimum voltage by the second voltage comparison unit 1122, it can be determined whether the driving function of the lamp board driver module 3000 is within the normal range. The expected maximum voltage represents the maximum voltage at which the driving function of the lamp board driver module 3000 is within the normal range, and the expected minimum voltage represents the minimum voltage at which the driving function of the lamp board driver module 3000 is within the normal range. If the operating voltage signal is higher than the expected maximum voltage, the first comparison signal indicates an abnormal driving function of the lamp board driver module 3000, and in this case, the first comparison signal can be a low-level signal. If the operating voltage signal is lower than the expected maximum voltage, the first comparison signal indicates a normal driving function of the lamp board driver module 3000, and in this case, the first comparison signal can be a high-level signal. If the operating voltage signal is lower than the expected minimum voltage, the first comparison signal indicates an abnormal driving function of the lamp board driver module 3000, and in this case, the first comparison signal can be a low-level signal. If the operating voltage signal is higher than the expected minimum voltage, the first comparison signal indicates a normal driving function of the lamp board driver module 3000, and in this case, the first comparison signal can be a high-level signal.

[0059] like Figure 4 As shown, in some embodiments, the first voltage comparison unit 1121 includes: a first comparator U1, a first resistor R1, a second resistor R2, and a fifth resistor R5. The non-inverting input terminal Vin+ of the first comparator U1 is electrically connected between the first resistor R1 and the second resistor R2. The other end of the first resistor R1 is connected to a power supply, and the other end of the second resistor R2 is grounded. The inverting input terminal Vin- of the first comparator U1 is electrically connected to the lamp board driver module 3000, and the output terminal Vout of the first comparator U1 is electrically connected to the signal conversion submodule 1130. The fifth resistor R5 is electrically connected between the output terminal Vout of the first comparator U1 and the power supply. The power supply voltage can be divided by the first resistor R1 and the second resistor R2, so that the voltage between the first resistor R1 and the second resistor R2 is the expected maximum voltage. Furthermore, the first comparator U1 also includes a positive voltage power supply terminal +Vs and a negative voltage power supply terminal -Vs. The positive voltage power supply terminal +Vs of the first comparator U1 is electrically connected to the power supply, and the negative voltage power supply terminal -Vs is grounded.

[0060] In some embodiments, the second voltage comparison unit 1122 includes a second comparator U2, a third resistor R3, a fourth resistor R4, and a sixth resistor R6. The non-inverting input terminal Vin+ of the second comparator U2 is electrically connected to the lamp board driver module 3000, the output terminal Vout of the second comparator U2 is electrically connected to the signal conversion submodule 1130, and the inverting input terminal Vin- of the second comparator U2 is electrically connected between the third resistor R3 and the fourth resistor R4. The other end of the third resistor R3 is connected to the power supply, and the other end of the fourth resistor R4 is grounded. The sixth resistor R6 is electrically connected between the output terminal Vout of the second comparator U2 and the power supply. The power supply voltage can be divided by the third resistor R3 and the fourth resistor R4, so that the voltage between the third resistor R3 and the fourth resistor R4 is the expected minimum voltage. Furthermore, the second comparator U2 also includes a positive voltage power supply terminal +Vs and a negative voltage power supply terminal -Vs. The positive voltage power supply terminal +Vs of the second comparator U2 is electrically connected to the power supply, and the negative voltage power supply terminal -Vs is grounded.

[0061] In some embodiments, the signal conversion submodule 1130 includes a MOSFET Q1 and a seventh resistor R7. The gate G of the MOSFET Q1 is electrically connected to the output terminal of the second comparator U2 and the output terminal of the first comparator U1. The source S of the MOSFET Q1 is grounded. The drain D of the MOSFET Q1 is electrically connected to the seventh resistor R7. The other end of the seventh resistor R7 is connected to a power supply. The drain D of the MOSFET Q1 and the seventh resistor R7 are electrically connected to the function detection module 1200.

[0062] In some embodiments, when both the first comparison signal and the first comparison signal are low-level signals, the signal conversion submodule 1130 converts the low-level signal to a high-level signal, and when both the first comparison signal and the first comparison signal are high-level signals, the signal conversion submodule 1130 converts the high-level signal to a low-level signal, so as to generate a clear and easily identifiable voltage detection signal, which facilitates the subsequent processing of the voltage detection signal by the function detection module 1200.

[0063] In some embodiments, the signal input submodule 1110 includes: a first light-emitting diode (LED1), an eighth resistor R8, and a second light-emitting diode (LED2). The positive terminal of the first LED1 is electrically connected to the lamp board driver module 3000, the negative terminal of the first LED1 is electrically connected to one end of the eighth resistor R8, the other end of the eighth resistor R8 is connected to the positive terminal of the second LED2, and the negative terminal of the second LED2 is electrically connected to the lamp board driver module 3000. The negative input terminal of the first comparator U1 and the positive input terminal of the second comparator U2 are electrically connected between the first LED1 and the eighth resistor R8.

[0064] like Figure 5As shown, in some embodiments, the functional detection module 1200 includes: at least one standard signal acquisition submodule 1210, a timer 1220, a first judgment submodule 1230, and a second judgment submodule 1240. Specifically, each standard signal acquisition submodule 1210 is configured as an interface, and each standard signal acquisition submodule 1210 is electrically connected to a signal conversion submodule 1130. The standard signal acquisition submodule 1210 is used to acquire at least one voltage detection signal according to preset frequency information. The preset frequency information refers to the signal acquisition frequency preset according to the operating characteristics and test requirements of the lamp board driver module 3000. The timer 1220 is electrically connected to at least one standard signal acquisition submodule 1210 and is used to control the test duration for each standard signal acquisition submodule 1210 to acquire at least one voltage detection signal according to a pre-acquired test instruction. The input terminal of the first judgment submodule 1230 is electrically connected to the standard signal acquisition submodule 1210 and is used to output low-level count information and high-level count information according to the voltage detection signal. The input terminal of the second judgment submodule 1240 is electrically connected to the output terminal of the first judgment submodule 1230. It is used to compare low-level count information, high-level count information, and a preset number of times to obtain functional status information. The specific preset number of times can be set according to the actual needs of those skilled in the art, and this application does not impose any limitations. Therefore, the test device based on the lamp board driver module shown in this embodiment of the application, by setting at least one standard signal acquisition submodule 1210, a timer 1220, a first judgment submodule 1230, and a second judgment submodule 1240, can realize automated signal acquisition, timing control, level counting, and status judgment. This allows the function detection module 1200 to automatically and accurately evaluate the voltage status of the lamp board driver module 3000 and determine whether its function is normal. By simultaneously detecting the standard signals acquired by multiple standard signal acquisition submodules 1210, the function detection module 1200 improves the efficiency and accuracy of the testing process, reduces interference from human factors, and ensures the reliability of the test results.

[0065] like Figure 6As shown, in some embodiments, the first judgment submodule 1230 includes a level judgment unit 1231 and a counter 1232. The input terminal of the level judgment unit 1231 is electrically connected to the output terminal of the standard signal acquisition submodule 1210, and is used to perform level judgment on each voltage detection signal to generate level judgment information. The level judgment information indicates whether the voltage detection signal is high or low. The input terminal of the counter 1232 is electrically connected to both the output terminal of the standard signal acquisition submodule 1210 and the output terminal of the level judgment unit 1231, and is used to count based on at least one voltage detection signal acquired by each standard signal acquisition submodule 1210 and the level judgment information. Specifically, the counter 1232 counts based on the level state of the voltage detection signal represented by the level judgment information. If the level judgment information shows that the voltage detection signal is high, the counter 1232 will perform high-level counting, record the number of times the high-level signal occurs, and generate high-level count information. Conversely, if the level judgment information shows that the voltage detection signal is low, the counter 1232 will perform low-level counting, record the number of times the low-level signal occurs, and generate low-level count information.

[0066] like Figure 7 and Figure 8As shown in the figure, this application embodiment provides a testing system based on a lamp board driver module. The testing system includes a testing device 1000 and a control device 2000. The control device 2000 includes a test command sending module 2100, a status information acquisition module 2200, and an exception prompting module 2300. The test command sending module 2100 is used to send test commands to the testing device 1000 to control the testing device 1000 to test the lamp board driver module 3000 and obtain the functional detection status of the lamp board driver module 3000. The test commands include the start and end of the test and specific test parameters to ensure that the testing device 1000 can accurately perform functional testing on the lamp board driver module 3000 according to a predetermined procedure. The status information acquisition module is communicatively connected to the testing device 1000 and is used to acquire functional status information. After acquiring the functional status information, the exception prompting module 2300 can provide an exception prompt for the lamp board driver module 3000 whose functional detection status is abnormal, based on the functional status information. Anomaly alerts can be implemented through audible and visual alarms, system log recording, or sending notifications to the operator's terminal device to ensure that relevant personnel can promptly understand the test results and take appropriate measures. This application does not impose specific limitations. Therefore, the test system based on the lamp board driver module shown in this application embodiment can achieve efficient and accurate testing of the lamp board driver module 3000 through an automated testing process, improving the efficiency and accuracy of functional testing of the lamp board driver module 3000 and reducing interference from human factors. Simultaneously, the anomaly alert module 2300, through an anomaly alert mechanism, enables the test system based on the lamp board driver module to promptly detect lamp board driver modules 3000 with abnormal driving functions and promptly remind personnel to handle the abnormal lamp board driver module 3000, thereby ensuring the product quality and production efficiency of the IPC equipment. The testing apparatus and system based on lamp board driver modules proposed in this application electrically connect each voltage detection module to a lamp board driver module and connects a function detection module to the voltage detection module. The voltage detection module detects the voltage of the lamp board driver module to obtain a voltage detection signal, and determines the function detection state of each lamp board driver module based on the voltage detection signal. The function detection state includes a function abnormal state and a function normal state. If the number of times the voltage detection signal is low equals the number of detections, the lamp board driver module is in a function normal state; if the number of times the voltage detection signal is high exceeds a preset number, the lamp board driver module is in a function abnormal state. Therefore, the testing apparatus and system based on lamp board driver modules proposed in this application can determine the function detection state of the lamp board driver module by detecting its voltage, achieving automated testing of the lamp board driver module and improving the testing efficiency and accuracy.

[0067] The embodiments described in this application are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of technology and the emergence of new application scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems.

[0068] Those skilled in the art will understand that the technical solutions shown in the figures do not constitute a limitation on the embodiments of this application, and may include more or fewer steps than shown, or combine certain steps, or different steps.

[0069] The system embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0070] Those skilled in the art will understand that the functional modules / units in the systems and devices disclosed above can be implemented as software, firmware, hardware, and appropriate combinations thereof.

[0071] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0072] It should be understood that in this application, "at least one" means one or more, and "more" means two or more.

[0073] In the several embodiments provided in this application, it should be understood that the disclosed systems and apparatuses can be implemented in other ways. For example, the system embodiments described above are merely illustrative; for instance, the division of the units described above is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between systems or units may be electrical, mechanical, or other forms.

[0074] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0075] In addition, the functional units in the various embodiments of the present application may be integrated into a single processing unit, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0076] The preferred embodiments of the present application have been described above with reference to the accompanying drawings, but this does not limit the scope of the claims of the present application. Any modifications, equivalent substitutions, and improvements made by those skilled in the art without departing from the scope and substance of the embodiments of the present application shall be within the scope of the claims of the present application.

Claims

1. A testing device based on a lamp board driver module, characterized in that, The device includes at least one voltage detection module and a function detection module; Each of the voltage detection modules is electrically connected to one of the lamp board driving modules, and is used to detect the voltage of the lamp board driving module to obtain a voltage detection signal; The function detection module is electrically connected to the voltage detection module and is used to determine the function detection state of each lamp board driver module based on the voltage detection signal. The function detection state includes a function abnormal state and a function normal state. If the number of times the voltage detection signal is a low-level signal is equal to the number of detections, the lamp board driver module is in a function normal state. If the number of times the voltage detection signal is a high-level signal is greater than a preset number, the lamp board driver module is in a function abnormal state.

2. The testing apparatus according to claim 1, characterized in that, The voltage detection module includes: A signal input submodule is electrically connected to the lamp board driver module and is used to input the operating voltage signal of the lamp board driver module. A voltage comparison submodule, electrically connected to the signal input submodule, is used to compare the operating voltage signal with a preset reference voltage signal to obtain a voltage comparison signal; A signal conversion submodule, electrically connected to the voltage comparison submodule, is used to convert the voltage comparison signal into the voltage detection signal.

3. The testing apparatus according to claim 2, characterized in that, The voltage comparison signal includes: a first comparison signal and a second comparison signal; the voltage comparison submodule includes: A first voltage comparison unit, the input terminal of which is electrically connected to the signal input submodule, is used to output the first comparison signal according to the operating voltage signal; The second voltage comparison unit, whose input terminal is electrically connected to the signal input submodule, is used to output the second comparison signal according to the operating voltage signal.

4. The testing apparatus according to claim 3, characterized in that, The first voltage comparison unit includes: a first comparator, a first resistor, a second resistor, and a fifth resistor; The non-inverting input of the first comparator is electrically connected between the first resistor and the second resistor. The other end of the first resistor is connected to the power supply, and the other end of the second resistor is grounded. The inverting input of the first comparator is electrically connected to the lamp board driver module, and the output of the first comparator is electrically connected to the signal conversion submodule. The fifth resistor is electrically connected between the output of the first comparator and the power supply.

5. The testing apparatus according to claim 4, characterized in that, The second voltage comparison unit includes: a second comparator, a third resistor, a fourth resistor, and a sixth resistor; The non-inverting input of the second comparator is electrically connected to the lamp board driver module, the output of the second comparator is electrically connected to the signal conversion submodule, the inverting input of the second comparator is electrically connected between the third resistor and the fourth resistor, the other end of the third resistor is connected to the power supply, and the other end of the fourth resistor is grounded. The sixth resistor is electrically connected between the output of the second comparator and the power supply.

6. The testing apparatus according to claim 5, characterized in that, The signal conversion submodule includes: a MOSFET and a seventh resistor; The gate of the MOS transistor is electrically connected to the output terminal of the second comparator and the output terminal of the first comparator. The source of the MOS transistor is grounded. The drain of the MOS transistor is electrically connected to the seventh resistor. The other end of the seventh resistor is connected to the power supply. The drain of the MOS transistor and the seventh resistor are electrically connected to the functional detection module.

7. The testing apparatus according to claim 5, characterized in that, The signal input submodule includes: a first light-emitting diode, an eighth resistor, and a second light-emitting diode; The positive terminal of the first light-emitting diode is electrically connected to the lamp board driver module, the negative terminal of the first light-emitting diode is electrically connected to one end of the eighth resistor, the other end of the eighth resistor is connected to the positive terminal of the second light-emitting diode, and the negative terminal of the second light-emitting diode is electrically connected to the lamp board driver module. The negative input terminal of the first comparator and the positive input terminal of the second comparator are electrically connected between the first light-emitting diode and the eighth resistor.

8. The testing apparatus according to claim 7, characterized in that, The functional detection module includes: At least one standard signal acquisition submodule, each of the standard signal acquisition submodules being electrically connected to one of the signal conversion submodules, wherein the standard signal acquisition submodule is used to acquire at least one of the voltage detection signals according to preset frequency information; A timer, electrically connected to the at least one standard signal acquisition submodule, is used to control the test duration for each of the standard signal acquisition submodules to acquire at least one of the voltage detection signals according to a pre-acquired test instruction; The first judgment submodule is electrically connected to the standard signal acquisition submodule and is used to output low-level counting information and high-level counting information according to the voltage detection signal. The second judgment submodule has its input terminal electrically connected to the output terminal of the first judgment submodule. It is used to compare the low-level count information, the high-level count information, and the preset number of times to obtain functional status information.

9. The testing apparatus according to claim 8, characterized in that, The first judgment submodule includes: A level judgment unit, the input of which is electrically connected to the output of the standard signal acquisition submodule, is used to judge the level of each voltage detection signal and generate level judgment information; A counter, the input of which is electrically connected to the output of the standard signal acquisition submodule and the output of the level judgment unit, is used to count based on at least one voltage detection signal acquired by each of the standard signal acquisition submodules and the level judgment information; wherein, if the level judgment information indicates that the voltage detection signal is a high-level signal, then high-level counting is performed to obtain high-level counting information; if the level judgment information indicates that the voltage detection signal is a low-level signal, then low-level counting is performed to obtain low-level counting information.

10. A test system based on a lamp board driver module, characterized in that, Including the testing apparatus and control apparatus as described in claim 8 or 9, wherein the control apparatus includes: The test instruction sending module is used to send test instructions to the test device to control the test device to test the lamp board driver module and obtain the functional detection status of the lamp board driver module. A status information acquisition module, which is communicatively connected to the testing device, is used to acquire the functional status information; An error notification module is used to provide an error notification for the lamp board driver module when the function detection status is in an abnormal state.

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