Sapphire wafer chamfer inspection device
By designing a combination of rotating plates and moving columns, the problem of inconvenient continuous inspection in sapphire wafer chamfering inspection devices was solved, achieving efficient chamfering inspection and space utilization.
Patent Information
- Application Number
- CN202422694373.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-06
- Publication Date
- 2025-10-31
- Estimated Expiration
- 2034-11-06
AI Technical Summary
Existing sapphire wafer chamfering inspection equipment is not suitable for continuous inspection, resulting in low inspection efficiency and high labor intensity.
A chamfering inspection device for sapphire wafers was designed. By using a combination of a rotating plate and a moving column, chamfering inspection at different angles can be achieved. After the inspection is completed, the rotating plate can be stored to reduce the space occupied by the device.
It improves the efficiency of sapphire wafer chamfering inspection, reduces the labor intensity of personnel, and expands the application range of the inspection equipment.
Smart Images
Figure CN223500325U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of sapphire wafer chamfering inspection technology, specifically to a sapphire wafer chamfering inspection device. Background Technology
[0002] For LED chip manufacturing, sapphire substrate material has become the preferred material due to cost and process feasibility. It is made from high-purity aluminum oxide particles and transformed into LED products. To ensure the use of LED products, after the LED product production is completed, the chamfer of the sapphire wafer needs to be inspected. In current practice, the chamfer of the sapphire wafer is usually inspected manually. During the inspection process, personnel need to continuously move the chamfering tool to make contact with the chamfer of the sapphire wafer to inspect the chamfer.
[0003] Existing sapphire wafer chamfering inspection devices have the problem that they are not convenient for continuous chamfering inspection of sapphire wafers, resulting in low inspection efficiency. In addition, they require constant adjustment of the chamfering device, which leads to high labor intensity for personnel. Based on this, the present invention designs a sapphire wafer chamfering inspection device to solve the above problems. Utility Model Content
[0004] The purpose of this invention is to provide a sapphire wafer chamfering inspection device to solve the problems mentioned in the background art.
[0005] To achieve the above objectives, this utility model provides the following technical solution: a sapphire wafer chamfering inspection device, comprising a storage tube, a rotating shaft rotatably connected to one end of the storage tube, a rotating plate mounted on one end of the rotating shaft by screws, a pointer on one end of the rotating plate, a scale line on one end of the storage tube near the outer side of the rotating plate, a fixing nut threadedly connected to the outer side of one end of the rotating shaft, and a rotating plate fixedly sleeved on the outer side of the rotating shaft;
[0006] One end of the storage tube is fitted with a fixed tube by screws. A movable plate is slidably connected inside the fixed tube. A movable column is slidably connected to the top of the movable plate. A placement groove is opened on one end face of the bottom of the rotating plate.
[0007] Preferably, both ends of the storage tube are fitted with placement plates by screws for placing sapphire wafers.
[0008] Preferably, the movable column and the movable plate are fixedly connected by a fixing screw, which is used to connect the movable column and the movable plate.
[0009] Preferably, the top end of the fixed cylinder is internally connected to a compression screw for fixing the moving plate.
[0010] Preferably, the rotating plate is disposed inside the storage tube, and the storage tube has a storage groove at the position corresponding to the rotating plate.
[0011] Preferably, the end face of the fixing nut is in contact with the end face of the storage cylinder.
[0012] Preferably, the pointer and the scale lines correspond to each other, making it easier for people to observe the angle.
[0013] Preferably, the longitudinal section of the fixed cylinder and the moving plate is arc-shaped, and the end face of the extrusion screw is in contact with the end face of the moving plate.
[0014] Preferably, one end of the movable column is located inside the placement groove, and the inner diameter of the placement groove is 5mm larger than the outer diameter of the movable column.
[0015] Compared with the prior art, the beneficial effects of this utility model are: it can realize the angle adjustment of the rotating plate and the moving column, so that there is a certain angle between the rotating plate and the bottom plate of the storage tube. Then, the sapphire wafer is placed between the rotating plate and the storage tube to realize the chamfer inspection of the sapphire wafer. Moreover, by adjusting the position of the rotating plate and the moving column, the chamfer inspection of different angles can be realized, thus expanding the applicable range of the inspection device.
[0016] After inspection, the rotating plate can be stored inside the storage cylinder, thereby reducing the space occupied by the inspection device. The rotating plate can be limited by the moving column, which facilitates continuous chamfer inspection of sapphire wafers and improves the chamfer inspection efficiency of sapphire wafers. Attached Figure Description
[0017] To more clearly illustrate the technical solutions of the embodiments of this utility model, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0018] Figure 1 This is a schematic diagram of the structure of this utility model;
[0019] Figure 2 This is a schematic diagram of the rotating shaft mounting structure of this utility model;
[0020] Figure 3 This utility model Figure 2 Enlarged structural diagram of region A in the middle;
[0021] Figure 4 This is a schematic diagram of the rotating plate mounting structure of this utility model.
[0022] Figure 5 This utility model Figure 4Enlarged structural diagram of region B in the middle;
[0023] Figure 6 This is a schematic diagram of the movable column installation structure of this utility model.
[0024] The attached diagram lists the components represented by each number as follows:
[0025] 1. Storage tube; 2. Placement plate; 3. Rotating shaft; 4. Rotating plate; 5. Scale line; 6. Pointer; 7. Fixing nut; 8. Rotating plate; 9. Fixing tube; 10. Moving plate; 11. Extrusion screw; 12. Moving column; 13. Fixing screw; 14. Placement slot. Detailed Implementation
[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.
[0027] Please see Figure 1-6 This utility model provides a technical solution: a sapphire wafer chamfering inspection device, including a storage tube 1, with placement plates 2 installed at both ends of the storage tube 1 by screws, a rotating shaft 3 rotatably connected inside one end of the storage tube 1, and a rotating plate 4 installed at one end of the rotating shaft 3 by screws, with a pointer 6 at one end of the rotating plate 4, the pointer 6 corresponding to the scale line 5, facilitating personnel to observe the angle, and thus facilitating the fixing of the rotating plate 8 at different angles, with a scale line 5 on the outer side of one end of the storage tube 1 near the rotating plate 4, and a fixing nut 7 threadedly connected to the outer side of one end of the rotating shaft 3, the end face of the fixing nut 7 contacting the end face of the storage tube 1, facilitating the fixing of the rotating shaft 3, and a rotating plate 8 fixedly sleeved on the outer side of the rotating shaft 3, the rotating plate 8 being disposed inside the storage tube 1, with a storage groove on the storage tube 1 corresponding to the position of the rotating plate 8, facilitating the storage of the rotating plate 8 after the inspection is completed;
[0028] One end of the storage cylinder 1 is fitted with a fixed cylinder 9 by screws. A movable plate 10 is slidably connected inside the fixed cylinder 9. The longitudinal section of the fixed cylinder 9 and the movable plate 10 is arc-shaped. The end face of the extrusion screw 11 is in contact with the end face of the movable plate 10, which facilitates the fixing of the movable plate 10 and allows the movable plate 10 to rotate when the rotating plate 8 rotates. The top end of the fixed cylinder 9 is threadedly connected to the extrusion screw 11. A movable column 12 is slidably connected to the top end of the movable plate 10. The movable column 12 and the movable plate 10 are fixedly connected by a fixed screw 13. A placement groove 14 is opened on one end face of the bottom of the rotating plate 8. One end of the movable column 12 is located inside the placement groove 14. The inner diameter of the placement groove 14 is 5mm larger than the outer diameter of the movable column 12, which facilitates the movement of the movable column 12 into the placement groove 14.
[0029] The operator rotates the rotating plate 8 and observes the position of the pointer 6 to rotate it to a suitable angle. Then, the operator drives the moving plate 10 to move inside the fixed cylinder 9. Next, the operator drives the moving column 12 to move it into the placement slot 14, limiting the rotation plate 8. The moving column 12 is then connected to the moving plate 10 via the fixing screw 13. Finally, the operator moves the sapphire wafer to a position between the storage cylinder 1 and the rotating plate 8, ensuring the bottom surface of the sapphire wafer is properly positioned. When the rotating plate 8 contacts the top surface of the storage cylinder 1, if one end face of the rotating plate 8 contacts the end face of the sapphire wafer, the chamfering inspection of the sapphire wafer is qualified. If the end face of the sapphire wafer does not contact one end face of the rotating plate 8, the chamfering inspection of the sapphire wafer is unqualified. This achieves the chamfering inspection of the sapphire wafer. After the inspection is completed, the rotating plate 8 can be stored inside the storage cylinder 1, thereby reducing the space occupied by the inspection device. Furthermore, by adjusting the position of the rotating plate 8 and the moving column 12, chamfering inspections at different angles can be achieved, expanding the applicability of the inspection device.
[0030] In the description of this specification, references to terms such as "an embodiment," "example," "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0031] The preferred embodiments of this utility model disclosed above are merely illustrative of the present utility model. These preferred embodiments do not exhaustively describe all details, nor do they limit the utility model to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of this utility model, thereby enabling those skilled in the art to better understand and utilize it. This utility model is limited only by the claims and their full scope and equivalents.
Claims
1. A sapphire wafer chamfering inspection device, comprising a storage tube (1), characterized in that: The storage tube (1) is rotatably connected to a rotating shaft (3) at one end. A rotating plate (4) is installed at one end of the rotating shaft (3). A pointer (6) is provided at one end of the rotating plate (4). A scale line (5) is provided on the outer side of one end of the storage tube (1) near the rotating plate (4). A fixing nut (7) is threadedly connected to the outer side of one end of the rotating shaft (3). A rotating plate (8) is fixedly sleeved on the outer side of the rotating shaft (3). The storage tube (1) is equipped with a fixed tube (9) at one end. A movable plate (10) is slidably connected inside the fixed tube (9). A movable column (12) is slidably connected to the top of the movable plate (10). A placement groove (14) is opened on one end face of the bottom of the rotating plate (8).
2. The sapphire wafer chamfering inspection device according to claim 1, characterized in that: The storage tube (1) is equipped with placement plates (2) at both ends for placing sapphire wafers.
3. The sapphire wafer chamfering inspection device according to claim 1, characterized in that: The movable column (12) and the movable plate (10) are fixedly connected by a fixing screw (13) for connecting the movable column (12) and the movable plate (10).
4. The sapphire wafer chamfering inspection device according to claim 1, characterized in that: The top of the fixed cylinder (9) is connected to a compression screw (11) by a thread, which is used to fix the moving plate (10).
5. The sapphire wafer chamfering inspection device according to claim 1, characterized in that: The rotating plate (8) is disposed inside the storage tube (1), and the storage tube (1) has a storage groove at the position corresponding to the rotating plate (8).
6. The sapphire wafer chamfering inspection device according to claim 1, characterized in that: The end face of the fixing nut (7) is in contact with the end face of the storage tube (1).
7. The sapphire wafer chamfering inspection device according to claim 1, characterized in that: The pointer (6) corresponds to the scale line (5), which facilitates the observation angle by personnel.
8. The sapphire wafer chamfering inspection device according to claim 4, characterized in that: The longitudinal section of the fixed cylinder (9) and the moving plate (10) is arc-shaped, and the end face of the extrusion screw (11) is in contact with the end face of the moving plate (10).
9. The sapphire wafer chamfering inspection device according to claim 1, characterized in that: One end of the movable column (12) is located inside the placement groove (14), and the inner diameter of the placement groove (14) is 5 mm larger than the outer diameter of the movable column (12).