Atomic force microscope measuring mechanism

Abstract

The utility model provides an atomic force microscope measuring mechanism. The atomic force microscope measuring mechanism comprises a bottom plate, a clamping mechanism, a laser module mechanism, a four-quadrant module mechanism and a probe mechanism, the clamping mechanism, the laser module mechanism and the four-quadrant module mechanism are all arranged on the bottom plate, the probe mechanism is detachably arranged on the clamping mechanism, the laser module mechanism is located on one side of the probe mechanism, and the four-quadrant module mechanism is located on the other side of the probe mechanism. When the atomic force microscope measuring mechanism is used, through cooperative installation of the clamping mechanism, the laser module mechanism, the four-quadrant module mechanism and the probe mechanism, rapid adjustment can be carried out, the overall use process is convenient, and the overall experiment efficiency can be well ensured.

Description

TECHNICAL FIELD

[0001] The utility model relates to atomic force microscope technical field especially relates to a kind of atomic force microscope measuring mechanism. BACKGROUND

[0002] Atomic Force Microscope (AFM), a kind of analytical instrument that can be used to study the surface structure of solid material including insulator. Atomic Force Microscope uses micro-cantilever to feel and amplify the action force between the tip probe on cantilever and the atom of measured sample, so as to achieve the purpose of detection, with atomic resolution, so that Atomic Force Microscope is widely used in nanometer material, biomedical and other frontier science and technology fields with its nanometer level ultra-high detection accuracy.

[0003] The measuring structure of the currently common Atomic Force Microscope cannot be adjusted quickly, which leads to inconvenient overall use process and affects experimental efficiency. UTILITY MODEL CONTENT

[0004] To solve the above problems, the utility model adopts the following technical scheme: a kind of Atomic Force Microscope measuring mechanism, comprising: bottom plate, clamping mechanism, laser module mechanism, four-quadrant module mechanism and probe mechanism;

[0005] The clamping mechanism, the laser module mechanism and the four-quadrant module mechanism are all arranged on the bottom plate, the probe mechanism is detachably arranged on the clamping mechanism, the laser module mechanism is located on one side of the probe mechanism, and the four-quadrant module mechanism is located on the other side of the probe mechanism.

[0006] Further, the clamping mechanism includes a clamp seat, a clamping frame and a clamping screw, the clamp seat is arranged on the bottom plate, the clamping screw is movably arranged on the clamping frame, and the clamping screw is used to drive the clamping frame.

[0007] Further, two clamping pins are arranged on the clamping frame, and the two clamping pins are used to fix the probe mechanism.

[0008] Further, the laser module mechanism includes a first fixed frame, a first movable platform, a second movable platform, a first adjusting screw, a second adjusting screw, a laser mounting frame, a reflection assembly and a laser, the first fixed frame is arranged on the bottom plate, the first adjusting screw is movably connected to the first movable platform after partially penetrating through the first fixed frame, the second adjusting screw is movably connected to the second movable platform after partially penetrating through the first movable platform, the laser mounting frame is arranged on the second movable platform, the laser and the reflection assembly are both arranged on the laser mounting frame, and the laser and the reflection assembly are correspondingly arranged.

[0009] Further, the reflection assembly comprises a mirror seat and a mirror body, the mirror seat is arranged on the laser mounting frame, the mirror body is arranged on the mirror seat, and the mirror body faces the laser.

[0010] Further, the four-quadrant module mechanism comprises a second fixing frame, a third movable platform, a fourth movable platform, a third adjusting screw, a fourth adjusting screw, a four-quadrant mounting frame, a four-quadrant control plate and a four-quadrant body, the second fixing frame is arranged on the bottom plate, the third adjusting screw is partially movably arranged through the second fixing frame and connected with the third movable platform, the fourth adjusting screw is partially movably arranged through the third movable platform and connected with the fourth movable platform, the four-quadrant mounting frame is arranged on the fourth movable platform, the four-quadrant control plate is arranged on the four-quadrant mounting frame, and the four-quadrant body is arranged on the four-quadrant control plate.

[0011] Further, the probe mechanism comprises a probe body and a probe support, the clamping frame is connected with the probe support through two clamping pins, a plunger is arranged on the probe support, one end of the plunger away from the probe support is connected with a leaf spring, and the probe body is arranged on the leaf spring.

[0012] The atomic force microscope measuring mechanism has the advantages that: the atomic force microscope measuring mechanism is used, the clamping mechanism, the laser module mechanism, the four-quadrant module mechanism and the probe mechanism are cooperatively arranged, the atomic force microscope measuring mechanism can be quickly adjusted, the whole use process is convenient, and the experimental efficiency can be ensured. BRIEF DESCRIPTION OF DRAWINGS

[0013] The embodiments in the drawings are further used to illustrate the present application, but the embodiments in the drawings do not constitute any limitation on the present application.

[0014] Fig. 1 FIG. 1 is a direction view of an atomic force microscope measuring mechanism according to an embodiment of the present application;

[0015] Fig. 2 FIG. 2 is another direction view of an atomic force microscope measuring mechanism according to an embodiment of the present application. DETAILED DESCRIPTION

[0016] The technical scheme of the present application will be further described below with reference to the drawings of the embodiments of the present application. The present application is not limited to the following specific embodiments. It should be noted that the embodiments in the present application and the features in the embodiments can be combined with each other without conflict.

[0017] As Figs. 1-2As shown, an atomic force microscope measuring mechanism comprises a base plate 100, a clamping mechanism, a laser module mechanism, a four-quadrant module mechanism and a probe mechanism; the clamping mechanism, the laser module mechanism and the four-quadrant module mechanism are all arranged on the base plate 100, the probe mechanism is detachably arranged on the clamping mechanism, the laser module mechanism is located on one side of the probe mechanism, and the four-quadrant module mechanism is located on the other side of the probe mechanism.

[0018] Specifically, the clamping mechanism includes a clamp seat 210, a clamping frame 220 and a clamping screw 230, the clamp seat 210 is arranged on the bottom plate 100, the clamping screw 230 is movably arranged on the clamping frame 220, and the clamping screw 230 is used to drive the clamping frame 220. Two clamping pins 221 are arranged on the clamping frame 220, and the two clamping pins 221 are used to fix the probe mechanism. The laser module mechanism includes a first fixed frame 310, a first movable platform 320, a second movable platform 330, a first adjusting screw 340, a second adjusting screw 350, a laser mounting frame 360, a reflecting assembly and a laser 380, the first fixed frame 310 is arranged on the bottom plate 100, the first adjusting screw 340 is partially movably arranged through the first fixed frame 310 and connected with the first movable platform 320, the second adjusting screw 350 is partially movably arranged through the first movable platform 320 and connected with the second movable platform 330, the laser mounting frame 360 is arranged on the second movable platform 330, the laser 380 and the reflecting assembly are arranged on the laser mounting frame 360, and the laser 380 is arranged corresponding to the reflecting assembly. The reflecting assembly includes a reflecting mirror seat 371 and a reflecting mirror 372 body, the reflecting mirror seat 371 is arranged on the laser mounting frame 360, the reflecting mirror 372 body is arranged on the reflecting mirror seat 371, and the reflecting mirror 372 body faces the laser 380. The four-quadrant module mechanism includes a second fixed frame 410, a third movable platform 420, a fourth movable platform 430, a third adjusting screw 440, a fourth adjusting screw 450, a four-quadrant mounting frame 460, a four-quadrant control panel 470 and a four-quadrant body, the second fixed frame 410 is arranged on the bottom plate 100, the third adjusting screw 440 is partially movably arranged through the second fixed frame 410 and connected with the third movable platform 420, the fourth adjusting screw 450 is partially movably arranged through the third movable platform 420 and connected with the fourth movable platform 430, the four-quadrant mounting frame 460 is arranged on the fourth movable platform 430, the four-quadrant control panel 470 is arranged on the four-quadrant mounting frame 460, and the four-quadrant body is arranged on the four-quadrant control panel 470. The probe mechanism includes a probe body and a probe support 500, the clamping frame 220 is connected with the probe support 500 through the two clamping pins 221, a plunger 510 is arranged on the probe support 500, one end of the plunger 510 away from the probe support 500 is connected with a leaf spring, and the probe body is arranged on the leaf spring.

[0019] That is, using this atomic force microscope measuring mechanism, an external sample placing table needs to be matched and then used.

[0020] In use, the probe support 500 is inverted on an external desktop, that is, the tip of the leaf spring on the probe support 500 is upward, and then the probe support 500 is pressed downward with force, so that the plunger 510 lifts the leaf spring, the probe body is clamped by forceps from both sides in parallel, the tip of the probe body is outward, the probe body is placed below the leaf spring, the plunger 510 is released, and the leaf spring clamps the probe body;

[0021] Then the probe support 500 with the probe body is placed on the measuring table, the probe support 500 is clamped by the clamping mechanism, the laser 380 is started, the laser module and the four-quadrant module are adjusted, so that the laser is incident on the tip of the probe body and then is refracted to the sensor of the four-quadrant body. Since the external sample placing table must be matched, the external sample placing table is controlled by the computer to move to the position where the sample is close to the probe body, and then the probe body automatically scans the surface of the sample.

[0022] By the cooperation and installation among the clamping mechanism, the laser module mechanism, the four-quadrant module mechanism and the probe mechanism, the atomic force microscope measuring mechanism can be quickly adjusted, the whole use process is convenient, and the experimental efficiency can be well ensured.

[0023] In conclusion, the above-mentioned embodiments are not the limiting embodiments of the present application, and any modification or equivalent deformation based on the essential content of the present application is within the technical scope of the present application.

Claims

1. A measuring mechanism for an atomic force microscope, characterized in that, The utility model relates to a four-quadrant laser probe device, which comprises a base plate, a clamping mechanism, a laser module mechanism, a four-quadrant module mechanism and a probe mechanism. The clamping mechanism, the laser module mechanism and the four-quadrant module mechanism are arranged on the base plate, and the probe mechanism is detachably arranged on the clamping mechanism. The clamping mechanism comprises a clamp seat, a clamping frame and a clamping screw.

2. The atomic force microscope measuring mechanism according to claim 1, characterized in that: The clamping frame is provided with two clamping pins for fixing the probe mechanism.

3. The atomic force microscope measuring mechanism according to claim 2, wherein: The laser module mechanism comprises a first fixed frame, a first movable platform, a second movable platform, a first adjusting screw, a second adjusting screw, a laser mounting frame, a reflecting assembly and a laser.

4. The atomic force microscope measuring mechanism according to claim 3, characterized in that: The reflecting assembly comprises a reflecting mirror seat and a reflecting mirror body.

5. The atomic force microscope measuring mechanism according to claim 4, characterized in that: The four-quadrant module mechanism comprises a second fixed frame, a third movable platform, a fourth movable platform, a third adjusting screw, a fourth adjusting screw, a four-quadrant mounting frame, a four-quadrant control panel and a four-quadrant body.

6. The atomic force microscope measuring mechanism according to claim 5, wherein: The probe mechanism comprises a probe body and a probe support.

7. The atomic force microscope measuring mechanism according to claim 6, characterized in that: The clamping frame is connected to the probe support through the two clamping pins. The probe support is provided with a plunger. The plunger is connected to a leaf spring at an end away from the probe support. The probe body is arranged on the leaf spring.

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