Test probe floating structure of full-automatic first workpiece detector
By using a floating structure consisting of a limit block, a floating spring, and a Z-axis plate, the deformation problem of the probe holder caused by large-size PCB boards and component errors is solved, enabling probe height adjustment and limit sensing, thus preventing equipment damage and product crushing.
Patent Information
- Application Number
- CN202422852764.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-22
- Publication Date
- 2025-11-07
- Estimated Expiration
- 2034-11-22
AI Technical Summary
Existing test probes cannot meet the requirements of the comprehensive dimensional variation range caused by the height error of large-size PCB boards and components, resulting in deformation and damage of the probe holder.
A floating structure including a limit block, a floating spring, and a Z-axis plate was designed. The probe height can be adjusted by the floating spring and the adjusting block, and a limit sensor is equipped to prevent over-limit and control the lifting of the Z-axis.
This technology enables the probe height adjustment and floating force to be uniform, preventing equipment damage and product crushing, and improving the adaptability and reliability of the equipment.
Smart Images
Figure CN223526413U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to full -automatic first piece detector technical field, concretely relates to a kind of test probe floating structure of full -automatic first piece detector. BACKGROUND
[0002] The test probe of current existing equipment is fixedly installed in Z-axis direction, and each probe can float slightly (2-3mm) by the deformation of support, but according to the working condition of probe, if the customer has a larger size PCB for testing, the center area will produce larger falling bending deformation due to gravity because the PCB can only be fixed around the edge of the board, the maximum deformation is greater than 3mm, and the height error of the tested component itself is also 3-4mm, the height direction size variation range that equipment needs to be compatible needs to be greater than 6-7mm, and it is best to have a floating range of 8-10mm to reserve some safety size, the existing probe cannot meet the floating amount of this large size, or the Z-axis floating deformation of long time high frequency, which is easy to cause the deformation and damage of probe support, and a kind of test probe floating structure of full -automatic first piece detector is needed to solve the above problems. SUMMARY
[0003] The utility model aims at overcoming the insufficient of above background art, provide a kind of test probe floating structure of full -automatic first piece detector.
[0004] It includes setting on the whole board of the full -automatic first piece detector and installing the floating structure on the whole board, the floating structure includes a limit block and the z-axis plate being arranged below the limit block, the limit block and the z-axis plate are equipped with floating spring, and the one side of the z-axis plate is equipped with probe body.
[0005] Further, the number of the floating structure is at least two, and the two floating structures are spaced apart on the whole board.
[0006] Further, the limit block and the z-axis plate are provided with a limiting hole at one end of the floating spring, and the two ends of the floating spring are arranged in the limiting hole of the limit block and the z-axis plate respectively.
[0007] Further, the whole board is provided with two y-axis plates on one side of the floating structure, the two y-axis plates are connected with the two floating structures respectively, and one side of the y-axis plate is connected with the limit block.
[0008] Further, the y-axis plate is provided with a guide rail at the position of the z-axis plate on one side, and the z-axis plate slides on the guide rail.
[0009] Further, an adjusting block is arranged between the limiting block and one side of the z-axis plate, the adjusting block is in an overturned L-shaped structure, the vertical arm of the adjusting block is connected with the z-axis plate through a bolt, and the horizontal arm of the adjusting block is attached to the top of the limiting block.
[0010] Further, an adjusting screw is threadedly connected to the top of the horizontal arm of the adjusting block, and the bottom of the adjusting screw abuts against the top of the limiting block.
[0011] Further, a limiting sensor is mounted on one side of the y-axis plate, and a sensing sheet is mounted on one side of the z-axis plate, and one end of the sensing sheet is movably arranged in one end of the limiting sensor.
[0012] Further, the limiting sensor is in a concave-shaped structure, and one end of the sensing sheet is movably arranged in the concave portion of the limiting sensor.
[0013] Further, the whole floating structure of the test probe is connected through a bolt.
[0014] Compared with the prior art, the advantages of the utility model are as follows: through the floating structure, the adjusting block and the adjusting screw arranged on the floating structure, the height of the floating structure is adjusted, the floating force of the floating structure is adjusted, the height of the two probe bodies is unified, the height of the probe body can be adjusted according to the height error of the product, the probe body is convenient for testing the product, the limiting sensor is increased, if the product exceeds the floating stroke of the probe body, the limiting sensor will feed back a signal to the running software, the z-axis plate of the Z-axis is immediately lifted to a safety point, and the probe body of the equipment or the customer product is prevented from being damaged. BRIEF DESCRIPTION OF DRAWINGS
[0015] Figure 1 It is the whole three-dimensional structure schematic diagram in the utility model.
[0016] Figure 2 It is the whole front view structure schematic diagram in the utility model.
[0017] Figure 3 It is the whole side view structure schematic diagram in the utility model.
[0018] Figure 4 It is the whole bottom view structure schematic diagram in the utility model.
[0019] In the drawing:
[0020] 1, whole plate;
[0021] 2, y-axis plate;
[0022] 3, limiting block;
[0023] 4, floating spring;
[0024] 5. Z-axis plate;
[0025] 6. Probe body;
[0026] 7. Guide slide rail;
[0027] 8. Adjusting block;
[0028] 9. Adjusting screw;
[0029] 10. Limiting sensor;
[0030] 11. Sensing sheet. DETAILED DESCRIPTION
[0031] Reference will now be made in detail to the present embodiments of the present application, examples of which are illustrated in the accompanying drawings. While the present application will be described in conjunction with the embodiments, it will be understood that the present application is not limited to the embodiments. Rather, the present application is intended to cover alternatives, modifications and equivalents, which can be included within the spirit and scope of the present application as defined by the appended claims. It will be noted that the steps described herein can be implemented by any of the functional blocks or functional arrangements, and any of the functional blocks or functional arrangements can be implemented as physical entities or logical entities, or a combination of both.
[0032] In order for those skilled in the art to better understand the present application, the present application will be further described in detail below in conjunction with the drawings and specific embodiments.
[0033] Note: the examples to be introduced next are only specific examples, and are not intended to limit the embodiments of the present application to the specific steps, values, conditions, data, sequences, etc. Those skilled in the art can use the concept of the present application to construct more embodiments not mentioned in the present specification by reading the present specification.
[0034] At present, the test probe of the existing equipment is fixedly installed in the Z-axis direction, and each probe can float by a small amount (2-3 mm) by deformation of the support. However, according to the working conditions of the probe, if the customer has a large-size PCB to be tested, since the PCB can only be fixed around the four edges, the central region will produce a large falling bending deformation due to gravity, and the maximum deformation is greater than 3 mm. Moreover, the tested components themselves also have a height error of 3-4 mm. In combination with the above size errors, the equipment needs to be compatible with the height direction size variation range of more than 6-7 mm, and it is best to have a floating range of 8-10 mm with some safety size reserved. The existing probe cannot meet the floating amount of such a large size, or the Z-axis floating deformation for a long time and at a high frequency, which is easy to cause deformation and damage of the probe support. Therefore, a test probe floating structure of a full-automatic first-piece detector is needed to solve the above problems.
[0035] In order to solve the above problems of the full-automatic first piece detector, the utility model provides a kind of test probe floating structure of full-automatic first piece detector.
[0036] Please refer to Figure 1 And Figure 2 , including the whole board 1 set on full-automatic first piece detector and the floating structure installed on the whole board 1, floating structure includes limit block 3 and the z-axis plate 5 set below limit block 3, limit block 3 and z-axis plate 5 are equipped with floating spring 4, one side of z-axis plate 5 is equipped with probe body 6, the quantity of floating structure is at least provided with two, two floating structures are set apart on the whole board 1.
[0037] As Figure 1 And Figure 2 Shown, the whole board 1 is installed on full-automatic first piece detector, and floating structure is all installed on one side of the whole board 1, and the floating structure set on the whole board 1 is at least two, and one left and right is set on one side of the whole board 1, and there is spacing between two floating structures.
[0038] Specifically, floating structure is mainly composed of limit block 3, floating spring 4 and z-axis plate 5, limit block 3 and z-axis plate 5 are correspondingly set up, and z-axis plate 5 is below limit block 3, on the same perpendicular line, and the quantity of floating spring 4 is at least also provided with two, the top and bottom of floating spring 4 are respectively against limit block 3 and z-axis plate 5, and are connected limit block 3 and z-axis plate 5, make the probe body 6 on z-axis plate 5 float up and down through floating spring 4, remove the fatigue damage that traditional relies on its own elastic force to float, will not easily appear.
[0039] Please refer to Figure 1 Limit block 3 and z-axis plate 5 are set up limit hole to one end of floating spring 4, and the two ends of floating spring 4 are set in the limit hole inside limit block 3 and z-axis plate 5 respectively.
[0040] As Figure 1 Shown, limit block 3 and z-axis plate 5 are set up limit hole to one end of floating spring 4, and make the top and bottom of floating spring 4 respectively inserted in the limit hole inside limit block 3 and z-axis plate 5, make spring in the process of stretching and contracting, prevent the distortion condition, make floating spring 4 stretch and contract more stably, facilitate z-axis plate 5 to drive probe body 6 to float up and down.
[0041] Please refer to Figure 1 、 Figure 2 And Figure 3 , the whole board 1 is equipped with two y-axis plates 2 on one side of floating structure, two y-axis plates 2 are connected with two floating structures respectively, one side of y-axis plate 2 is connected with limit block 3.
[0042] As Figure 1 ,Figure 2 And Figure 3 As shown in
[0043] Please refer to Figures 1-4 , the side of the y-axis plate 2 is located at the position of the z-axis plate 5 and is provided with a guide slide rail 7, and the z-axis plate 5 slides on the guide slide rail 7.
[0044] As shown in Figures 1-4 , the guide slide rail 7 provided on the y-axis plate 2 is designed vertically along the z-axis, so that the z-axis plate 5 installed on the guide slide rail 7 can move up and down, thereby enabling the probe body 6 to float up and down.
[0045] Please refer to Figure 1 , Figure 2 and Figure 3 , the adjusting block 8 is provided between the limiting block 3 and the side of the z-axis plate 5, the adjusting block 8 is in an inverted L-shaped structure, the vertical arm of the adjusting block 8 is connected with the z-axis plate 5 through a bolt, the horizontal arm of the adjusting block 8 is attached to the top of the limiting block 3, and the top of the horizontal arm of the adjusting block 8 is threadedly connected with an adjusting screw 9, and the bottom of the adjusting screw 9 abuts against the top of the limiting block 3.
[0046] As shown in Figure 1 , Figure 2 and Figure 3 , the adjusting block 8 is in an inverted L-shaped structure, so that the horizontal arm of the adjusting block 8 is placed on the limiting block 3, and the vertical arm of the adjusting block 8 is connected with the z-axis plate 5 through a bolt, so that the z-axis plate 5 can also move up and down during the up-and-down movement of the adjusting block 8, thereby achieving the effects of height adjustment and floating force adjustment of the probe body 6.
[0047] The effect of height adjustment is achieved by adjusting the screw 9, and when the adjusting screw 9 moves up and down, it abuts against the limiting block 3, and the bottom of the adjusting screw 9 is also connected with the limiting block 3 through a bearing, so that the adjusting screw 9 rotates clockwise or counterclockwise when the limiting block 3 is fixedly connected, thereby adjusting the z-axis plate 5 to move up and down.
[0048] Please refer to Figure 1 , Figure 2 and Figure 3 , the limiting sensor 10 is installed on one side of the y-axis plate 2, and the sensing sheet 11 is installed on one side of the z-axis plate 5, one end of the sensing sheet 11 is movably arranged in one end of the limiting sensor 10, the limiting sensor 10 is in a concave shape, and one end of the sensing sheet 11 is movably arranged in the concave portion of the limiting sensor 10.
[0049] As shown in Figure 1 , Figure 2 and Figure 3As shown, the probe body 6 on each side is designed as a separately floating mechanism, and a limit sensor 10 is added, which will feed back a signal to the running software if the customer product is out of tolerance and exceeds the floating stroke of the probe, so that the Z-axis is immediately lifted to a safety point to prevent damage to the equipment probe or crushing of the customer product. The sensor senses the safety range of the probe floating and the over-limit alarm, and the sensing sheet 11 is bolted on the z-axis plate 5, that is, the sensing sheet 11 can be adjusted to be installed at different heights on the z-axis plate 5, so that the floating limit of the equipment alarm can be adjusted.
[0050] Please refer to Figures 1-4 , the test probe floating structure is bolted.
[0051] As Figures 1-4 shown, screw holes are formed in the overall structure, and the overall structure can be bolted to achieve a detachable effect.
[0052] When the utility model is used, the probe body 6 is floated up and down on the floating spring 4 connected by the z-axis plate 5, which is convenient for testing products of different thicknesses, and the height of the z-axis plate 5 can be adjusted by rotating the adjusting screw 9, that is, the height and floating force of the probe body 6 can be adjusted.
[0053] In the description of the utility model, it should be explained that the orientation or position relationship indicated by the terms "up", "down" and the like is the orientation or position relationship shown in the drawings, which is only for the convenience of describing the utility model and simplifying the description, and does not indicate or imply that the indicated device or element must have a specific orientation, structure and operation, therefore it cannot be understood as a limitation on the utility model. Unless otherwise specified and limited, the terms "mounting", "connection" and "connection" should be understood broadly, for example, it can be fixed connection, or detachable connection, or integrated connection, it can be mechanical connection, or electrical connection, it can be directly connected, or indirectly connected through an intermediate medium, or the communication between two elements. For ordinary skilled in the art, the specific meaning of the above terms in the utility model can be understood according to the specific circumstances.
[0054] It should be noted that, in the present application, relational terms such as "first" and "second", and the like, are used solely to distinguish one from another entity or action, without necessarily requiring or implying any actual relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can also include other elements not expressly listed or inherent to such process, method, article, or apparatus. An element proceeded by "comprises... a" does not, without more constraints, exclude the existence of additional identical elements in the process, method, article, or apparatus that comprises the element.
[0055] The above description is merely that of the specific embodiments of the present application, and enables those skilled in the art to understand or implement the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein can be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims
1. A test probe floating structure of a full-automatic first piece detector, comprising a whole plate (1) arranged on the full-automatic first piece detector and a floating structure installed on the whole plate (1), characterized in that, The floating structure comprises a limiting block (3) and a z-axis plate (5) arranged below the limiting block (3), a floating spring (4) is arranged between the limiting block (3) and the z-axis plate (5), and a probe body (6) is mounted on one side of the z-axis plate (5).
2. The test probe floating structure of the full-automatic first piece detector according to claim 1, wherein, The number of the floating structures is at least two, and the two floating structures are arranged at intervals on the whole plate (1).
3. The floating structure of test probe of the full-automatic first piece detector according to claim 1, wherein, The limiting block (3) and the z-axis plate (5) are provided with limiting holes at one end of the floating spring (4), and the two ends of the floating spring (4) are arranged in the limiting holes of the limiting block (3) and the z-axis plate (5) respectively.
4. The floating structure of test probe of the full-automatic first piece detector according to claim 1, wherein, Two y-axis plates (2) are arranged on one side of the whole plate (1) and connected with the two floating structures respectively, and one side of the y-axis plate (2) is connected with the limiting block (3).
5. The test probe floating structure of the full-automatic first piece detector according to claim 4, wherein, A guide slide rail (7) is mounted on the position of the z-axis plate (5) on one side of the y-axis plate (2), and the z-axis plate (5) slides on the guide slide rail (7).
6. The floating structure of test probe of the full-automatic first piece detector according to claim 1, wherein, An adjusting block (8) is arranged between one side of the limiting block (3) and the z-axis plate (5), the adjusting block (8) is in an inverted L-shaped structure, the vertical arm of the adjusting block (8) is connected with the z-axis plate (5) through a bolt, and the horizontal arm of the adjusting block (8) is attached to the top of the limiting block (3).
7. The floating structure of test probe of the full-automatic first piece detector according to claim 6, wherein, An adjusting screw (9) is threadedly connected to the top of the horizontal arm of the adjusting block (8), and the bottom of the adjusting screw (9) abuts against the top of the limiting block (3).
8. The test probe floating structure of the full-automatic first piece detector according to claim 4, wherein, A limiting inductor (10) is mounted on one side of the y-axis plate (2), an inductive sheet (11) is mounted on one side of the z-axis plate (5), and one end of the inductive sheet (11) is movable to one end of the limiting inductor (10).
9. The test probe floating structure of the full-automatic first piece detector according to claim 8, wherein, The limiting inductor (10) is in a concave-shaped structure, and one end of the inductive sheet (11) is movable to the concave part of the limiting inductor (10).
10. The test probe floating structure of the full-automatic first-piece detector according to any one of claims 1 to 9, characterized in that, The whole test probe floating structure is bolted.