Special mounting device for test probe of solar cell classification detection equipment

Abstract

The utility model provides a special mounting device for test probes of solar cell classification detection equipment, which belongs to the technical field of solar cell manufacture and comprises a fixed plate, a movable plate and two connecting shafts, first semicircular holes are arranged along the length direction of the fixed plate, and the positions and the number of the first semicircular holes are in one-to-one correspondence with the positions and the number of the probes to be detached; second semicircular holes which are in one-to-one correspondence with the to-be-disassembled probes in position and number are formed in the length direction of the movable plate; the two connecting shafts are arranged at the two ends of the movable plate, the movable plate and the fixed plate are connected together, the second semicircular holes and the first semicircular holes are in one-to-one butt joint to form closed circular holes, and the hole diameter of the closed circular holes is larger than the diameter of the probe telescopic rod and smaller than the diameter of the probe tube. When the device is used, all probes on a single probe row can be inserted into the probe sleeves at the same time through one-time operation, so that the working efficiency is high; and when the probe is pressed, the probe vertically moves downwards, the direction is fixed, and the probe and the probe sleeve are not easy to damage.

Description

Technical Field

[0001] This utility model belongs to the field of solar cell manufacturing technology, specifically relating to a special mounting device for test probes in a solar cell classification and testing equipment. Background Technology

[0002] The test probes in solar cell sorting and testing equipment have a limited lifespan and need to be replaced after reaching this period. When installing the probes, they are pressed into the probe sleeve by external force. Typically, needle-nose pliers or other clamps are used to hold the upper end of the probe telescopic rod or probe tube, applying force towards the solid probe array to insert the probe tube into the probe sleeve. This installation method is not only slow but also prone to deforming the probe telescopic rod or probe tube, and can damage the probe sleeve, ultimately rendering the probe and probe array unusable.

[0003] Currently, a single probe array has 60-80 probes installed, which is a large number. Installing the probes one by one is extremely inefficient. Utility Model Content

[0004] This utility model provides a dedicated installation device for test probes in a solar cell classification and testing equipment, aiming to solve the problem that current probe installation is time-consuming and labor-intensive, and easily leads to the scrapping of probes and probe racks.

[0005] To achieve the above objectives, the technical solution adopted by this utility model is as follows: A dedicated mounting device for test probes in a solar cell classification and testing equipment is provided, comprising: a fixed plate, a movable plate, and two connecting shafts. A first semi-circular hole is provided along the length of the fixed plate, corresponding one-to-one with the position and number of probes to be disassembled; a second semi-circular hole is provided along the length of the movable plate, corresponding one-to-one with the position and number of probes to be disassembled; the two connecting shafts are located at both ends of the movable plate, and the movable plate and the fixed plate are connected together by fasteners provided on the connecting shafts, such that the second semi-circular holes align with the first semi-circular holes to form closed circular holes. The diameter of the closed circular holes is larger than the diameter of the probe telescopic rod but smaller than the diameter of the probe tube.

[0006] In one possible implementation, the fixed plate has two first internal threaded holes symmetrically arranged on its side along its length, and the two connecting shafts are respectively screwed into the two first internal threaded holes; the movable plate has two through holes symmetrically arranged on its side along its length, the connecting shafts pass through the through holes, and the movable plate is fixed together with the fixed plate using fasteners.

[0007] In one possible implementation, the thickness of the fixed plate is the same as the thickness of the movable plate, and the thickness of the fixed plate is less than the distance between the probe head and the probe tube.

[0008] In one possible implementation, the thickness of the fixing plate is 1 / 2 to 2 / 3 of the distance between the probe head and the probe tube.

[0009] In one possible implementation, the closed circular hole is clearance-fitted with the probe telescopic rod.

[0010] In one possible implementation, both the fixed plate and the movable plate are rectangular plates, and the two rearward corners of both the fixed plate and the movable plate are rounded.

[0011] In one possible implementation, both the fixed plate and the movable plate are metal plates.

[0012] In one possible implementation, both the fixed plate and the movable plate are copper or aluminum alloy components.

[0013] The special installation device for test probes in the solar cell classification and testing equipment provided by this utility model has the following advantages compared with the prior art: When installing probes using this device, first, place the fixed plate vertically so that the first semicircular hole is horizontal and facing upwards. Then, place a probe in each of the first semicircular holes and support the probe telescopic rod at the position of the first semicircular hole. Next, align the through holes at both ends of the movable plate with the connecting shaft on the fixed plate, and make the second semicircular hole on the movable plate correspond one-to-one with the first semicircular hole on the fixed plate. Then, push the movable plate along the connecting shaft to advance the fixed plate until the movable plate and the fixed plate are aligned, and the second semicircular hole and the first semicircular hole are closed. Then, use fasteners to lock the movable plate and the fixed plate. At this time, all the probes to be installed are clamped between the movable plate and the fixed plate. Then, hold the fixed plate and the movable plate with both hands so that the clamped probes correspond one-to-one with the probe sleeves on the probe fixed row. Apply force to move the fixed plate and the movable plate closer to the probe sleeves, so that the probe tubes are inserted into the corresponding probe sleeves. The installation of all probes on a single probe row can be completed at one time.

[0014] This device has a simple structure, low manufacturing cost, and is very convenient and quick to use. With this device, all probes on a single probe array can be inserted into the probe sleeve at the same time in one operation. The operation is simple and the work efficiency is high. Moreover, when the probe is pressed, the probe moves vertically downward with a fixed direction, which makes it less likely to damage the probe and the probe sleeve. Attached Figure Description

[0015] Figure 1 A schematic diagram of the main structure of the dedicated mounting device for the test probe of the solar cell classification and testing equipment provided in this embodiment of the utility model;

[0016] Figure 2 for Figure 1 A top view of the dedicated mounting device for the test probes of the provided solar cell classification and testing equipment;

[0017] Figure 3 A schematic diagram illustrating the usage process of the dedicated mounting device for the test probes of the solar cell classification and testing equipment provided in this embodiment of the utility model;

[0018] Figure 4 A schematic diagram of the probe structure provided in an embodiment of this utility model;

[0019] Explanation of reference numerals in the attached figures:

[0020] 1. Fixed plate; 101. First semicircular hole; 2. Connecting shaft; 3. Movable plate; 301. Second semicircular hole; 4. Fastener; 5. Closed circular hole; 6. Probe; 601. Probe head; 602. Probe telescopic rod; 603. Probe tube; 7. Probe row; 701. Probe fixing row; 702. Probe sleeve. Detailed Implementation

[0021] To make the technical problems, technical solutions, and beneficial effects of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present utility model and are not intended to limit the present utility model.

[0022] Please refer to the following: Figures 1 to 4 The present invention describes a dedicated mounting device for test probes in a solar cell classification and testing equipment. The dedicated mounting device for test probes in the solar cell classification and testing equipment includes: a fixed plate 1, a movable plate 3, and two connecting shafts 2. A first semi-circular hole 101, corresponding one-to-one with the position and number of probes 6 to be disassembled, is provided along the length of the fixed plate 1; a second semi-circular hole 301, corresponding one-to-one with the position and number of probes 6 to be disassembled, is provided along the length of the movable plate 3. The two connecting shafts 2 are located at both ends of the movable plate 3. The movable plate 3 and the fixed plate 1 are connected together by fasteners 4 provided on the connecting shafts 2, and the second semi-circular holes 301 and the first semi-circular holes 101 are aligned to form closed circular holes 5. The diameter D3 of the closed circular hole 5 is larger than the diameter D2 of the probe telescopic rod 602 and smaller than the diameter D4 of the probe tube 603.

[0023] The special mounting device for test probes of the solar cell classification and testing equipment provided by this utility model has the following advantages compared with the prior art: When using this device to install the probe 6, first place the fixing plate 1 vertically so that the first semicircular hole 101 is horizontally upward. Then, place a probe 6 in each of the first semicircular holes 101 and support the probe telescopic rod 602 at the position of the first semicircular hole 101. Then, align the through holes at both ends of the movable plate 3 with the connecting shaft 2 on the fixing plate 1, and make the second semicircular hole 301 on the movable plate 3 correspond one-to-one with the first semicircular hole 101 on the fixing plate 1. Then, push the movable plate 3 along the connecting shaft 2 towards the fixing plate 1 until the movable plate 3 and the fixing plate 1 are connected, and the second semicircular hole 301 and the first semicircular hole 101 are closed. Then, use the fastener 4 to lock the movable plate 3 and the fixing plate 1 together, so that the fixing plate 1 and the movable plate 3 are connected as one unit. At this point, the probes 6 to be installed are clamped between the movable plate 3 and the fixed plate 1. Then, hold the fixed plate 1 and the movable plate 3 with both hands so that the clamped probes 6 correspond one-to-one with the probe sleeves 702 on the probe fixed row 701. Apply downward force F with both hands at the same time to make the fixed plate 1 and the movable plate 3 move closer to the probe sleeves 702. The fixed plate 1 and the movable plate 3 simultaneously abut against the upper end face of the probe tube 603, so that the probe tube 603 is inserted vertically into the corresponding probe sleeve 702. The probes 6 can then be inserted into the probe sleeves 702, and the installation of all probes 6 on a single probe row 7 can be completed in one go.

[0024] This device has a simple structure, low manufacturing cost, and is very convenient and quick to use. With this device, all probes 6 on a single probe row 7 can be inserted into the probe sleeve 702 at the same time in one operation. The operation is simple and the work efficiency is high. Moreover, when the probe 6 is pressed, the probe 6 moves vertically downward with a fixed direction, which makes it less likely to damage the probe 6 and the probe sleeve 702.

[0025] To further explain, the direction of the force F applied by both hands is perpendicular to the length direction of the connecting shaft 2, and the large plane formed after the movable plate 3 and the fixed plate 1 are connected is also perpendicular to the probe telescopic rod 602.

[0026] See Figure 4 As shown, the probe 6 consists of a probe head 601, a probe telescopic rod 602, and a probe tube 603. The probe head 601 is cylindrical, the probe telescopic rod 602 is a long, round rod, and the probe tube 603 is a hollow cylindrical tube containing a spring. The probe head 601 is fixedly connected to the probe telescopic rod 602, and the probe telescopic rod 602 is slidably connected to the probe tube 603. The axes of the probe head 601, the probe telescopic rod 602, and the probe tube 603 are aligned. The probe array 7 consists of a probe sleeve 702 and a probe fixing array 701; when the probe 6 is inserted into the probe sleeve 702, an electrical connection is formed.

[0027] In some embodiments, see Figures 1 to 3The fixed plate 1 has two first internal threaded holes (not shown in the figure) symmetrically arranged on its side along its length. Two connecting shafts 2 are screwed into the two first internal threaded holes respectively. The movable plate 3 has two through holes (not shown in the figure) symmetrically arranged on its side along its length. The connecting shafts 2 pass through the through holes, and the movable plate 3 is fixed to the fixed plate 1 using fasteners 4. The fixed plate 1 and the movable plate 3 have the same external dimensions and the same length. The connecting shafts 2 are screwed onto the fixed plate 1, making assembly simple and convenient. The through holes of the movable plate 3 are clearance-fitted with the connecting shafts 2, facilitating the movement of the movable plate 3.

[0028] In the above embodiment, the connecting shaft 2 is a double-ended stud, with one end screwed onto the fixed plate 1. A nut, threaded onto the other end of the double-ended stud, is used as the fastener to lock the movable plate 3 to the fixed plate 1. When the probe is installed onto the probe array, to disassemble the movable plate 3, the nut is unscrewed from the double-ended stud, allowing the movable plate 3 to be pushed off the connecting shaft 2, separating it from the fixed plate 1. For normal storage, the movable plate 3 can be fitted onto the connecting shaft 2, with the nut screwed onto the connecting shaft 2, maintaining the connection between the movable plate 3 and the fixed plate 1. This prevents parts from scattering, avoiding the risk of parts being missing and rendering the device unusable during use, and also facilitates the removal and placement of the installation device.

[0029] Optionally, the connecting shaft 2 is riveted, welded, or glued to the fixing hole on the fixing plate 1 to fix the connecting shaft 2 to the fixing plate 1; the fastener 4 includes a short sleeve and a locking screw. The short sleeve is slidably fitted on the connecting shaft 2. When the movable plate 3 moves along the connecting shaft 2 towards the fixing plate 1 and abuts against the fixing plate 1, the short sleeve is fitted on the connecting shaft 2 and abuts against the movable plate 3. Then the locking screw is tightened until the locking screw presses against the connecting shaft 2, which can also lock the movable plate 3 and the fixing plate 1 together.

[0030] Optionally, the fastener 4 includes a short sleeve and a locking screw. The short sleeve is fixed to the side of the movable plate 3, and the connecting shaft 2 is fixed to the side of the fixed plate 1. The fastener moves along the connecting shaft 2 towards the fixed plate along with the movable plate. After abutting against the fixed plate 1, the locking screw is tightened until it presses against the connecting shaft 2, thus locking the movable plate 3 and the fixed plate 1 together. When the probe is installed on the probe array, to remove the movable plate 3, the locking screw is loosened, and the movable plate 3 can be pushed off the connecting shaft 2, separating the movable plate 3 from the fixed plate 1. During normal storage, the movable plate 3 can be fitted onto the connecting shaft 2, with the locking screw pressing against the connecting shaft 2, maintaining the connection between the movable plate and the fixed plate. This prevents parts from scattering and avoids the risk of parts being missing and rendering the device unusable during use. It also facilitates the removal and placement of the installation device.

[0031] In some embodiments, see Figure 1 and Figure 4The thickness of the fixed plate 1 is the same as the thickness of the movable plate 3. The thickness of the fixed plate 1 is less than the distance between the probe head 601 and the probe tube 603, so that the fixed plate 1 and the movable plate 3 can be set between the probe head 601 and the probe tube 603.

[0032] In some embodiments, see Figure 1 and Figure 4 The thickness H of the fixed plate 1 is 1 / 2 to 2 / 3 of the distance L between the probe head 601 and the probe tube 603, so as to maintain a certain thickness of the fixed plate 1 and the movable plate 3, which can maintain a certain strength, thereby ensuring that the sleeve tube is pressed down at the same time and the probe 6 is inserted into the probe sleeve 702.

[0033] In some embodiments, the closed circular hole 5 is clearance-fitted with the probe telescopic rod 602 to avoid damage to the probe telescopic rod 602.

[0034] In some embodiments, see Figures 1 to 3 Both the fixed plate 1 and the movable plate 3 are rectangular plates, and the two rearward corners of the fixed plate 1 and the movable plate 3 are rounded to avoid scratching the operators.

[0035] In some embodiments, both the fixed plate 1 and the movable plate 3 are metal plates to maintain a certain strength so that the probe 6 can be inserted into the probe sleeve 702 at the same time.

[0036] In some embodiments, both the fixed plate 1 and the movable plate 3 are copper or aluminum alloy components. Aluminum alloy is lightweight and has a certain rigidity; when the copper component abuts against the upper surface of the probe sleeve 702, the softness of copper reduces damage to the probe sleeve 702.

[0037] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0038] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A dedicated mounting device for test probes in a solar cell classification and testing equipment, characterized in that, include: The fixing plate (1) has first semi-circular holes (101) along its length that correspond one-to-one with the position and number of the probes (6) to be disassembled; The movable plate (3) has second semicircular holes (301) along its length that correspond one-to-one with the positions and number of the probes (6) to be disassembled; and Two connecting shafts (2) are set at both ends of the movable plate (3). The movable plate (3) and the fixed plate (1) are connected together by fasteners (4) set on the connecting shafts (2), and the second semicircular hole (301) and the first semicircular hole (101) are aligned one by one to form a closed circular hole (5). The diameter of the closed circular hole (5) is larger than the diameter of the probe telescopic rod (602) and smaller than the diameter of the probe tube (603).

2. The dedicated mounting device for test probes in the solar cell classification and testing equipment as described in claim 1, characterized in that, The fixed plate (1) has two first internal threaded holes symmetrically arranged on its side along its length, and the two connecting shafts (2) are respectively screwed into the two first internal threaded holes; the movable plate (3) has two through holes symmetrically arranged on its side along its length, the connecting shaft (2) passes through the through holes, and the movable plate (3) is fixed together with the fixed plate (1) by the fastener (4).

3. The dedicated mounting device for test probes in the solar cell classification and testing equipment as described in claim 1, characterized in that, The thickness of the fixed plate (1) is the same as the thickness of the movable plate (3), and the thickness of the fixed plate (1) is less than the distance between the probe head (601) and the probe tube (603).

4. The dedicated mounting device for test probes in the solar cell classification and testing equipment as described in claim 3, characterized in that, The thickness of the fixing plate (1) is 1 / 2 to 2 / 3 of the distance between the probe head (601) and the probe tube (603).

5. The dedicated mounting device for test probes in the solar cell classification and testing equipment as described in claim 1, characterized in that, The closed circular hole (5) is clearance-fitted with the probe telescopic rod (602).

6. The dedicated mounting device for test probes in the solar cell classification and testing equipment as described in claim 1, characterized in that, Both the fixed plate (1) and the movable plate (3) are rectangular plates, and the two rearward corners of the fixed plate (1) and the movable plate (3) are rounded.

7. The dedicated mounting device for test probes in the solar cell classification and testing equipment as described in claim 1, characterized in that, Both the fixed plate (1) and the movable plate (3) are metal plates.

8. The dedicated mounting device for test probes in the solar cell classification and testing equipment as described in claim 7, characterized in that, Both the fixed plate (1) and the movable plate (3) are copper or aluminum alloy components.

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