Testing device for field effect transistor geminate transistors

Abstract

The utility model relates to the technical field of field effect transistor testing, in particular to a testing device for pair transistors of a field effect transistor. The transistor geminate transistor testing device comprises a transistor geminate transistor testing device body, the side wall of the transistor geminate transistor testing device body is provided with a first heat dissipation hole, the surface of the transistor geminate transistor testing device body is electrically connected with three jacks, and the side wall of the transistor geminate transistor testing device body is provided with a dustproof device. The dustproof device comprises two retention blocks, the two retention blocks are fixedly connected with the side wall of the transistor geminate transistor testing device body, the sides, close to each other, of the two retention blocks are fixedly connected with rotating rods, the arc surfaces of the rotating rods are rotationally connected with dustproof covers, the lower surfaces of the dustproof covers are fixedly connected with clamping hooks, and the clamping hooks are fixedly connected with the clamping hooks. Limiting holes are formed in the surface of the transistor geminate transistor testing device body, and the problem that dust is accumulated on a heat dissipation device in the transistor geminate transistor testing device body, and the heat dissipation effect of the heat dissipation device is affected is solved.

Description

Technical Field

[0001] This utility model relates to the field of field-effect transistor testing technology, and in particular to a testing device for a pair of field-effect transistors. Background Technology

[0002] Let me explain in detail what the main body is made of. These components must first ensure that the main body can operate normally and smoothly. For example, a crusher is composed of a casing, motor, conveyor belt, crushing rollers, and protective cover.

[0003] Chinese patent application CN202321569959.8 discloses a field-effect transistor (FET) pair testing device, including a test platform. A controller is mounted on one end of the upper surface of the test platform, and a through hole is formed on the upper surface of the test platform. A liftable support plate is installed within the through hole. A placement plate and a test assembly are mounted on the upper surface of the support plate. The placement plate has a placement slot for accommodating transistors, and two opposing abutments are provided on opposite sides of the placement slot. The abutments can be moved closer together or further apart by a movable component. This invention, by setting a liftable support plate, allows the placement plate and test assembly to be mounted on the support plate. When the device is not in use, the support plate can be lowered, causing the placement plate and test assembly to retract into the receiving cavity for storage. This effectively reduces the occurrence of damage from impacts to the placement plate and test assembly, extending their service life. Furthermore, the distance between the two opposing abutments can be quickly adjusted by moving the abutments using the movable component.

[0004] Regarding the above-mentioned and existing related technologies, the inventors believe that the following defects often exist: dust accumulation on the heat dissipation device inside the transistor pair test device body is avoided as much as possible, which affects its heat dissipation effect. Therefore, in order to solve the above problems, a test device for field-effect transistor pairs is proposed. Utility Model Content

[0005] The purpose of this invention is to address the shortcomings of existing transistor pair testing devices, where dust easily enters the heat dissipation device inside the device body through the first heat dissipation hole during long-term use, affecting its heat dissipation effect. Therefore, this invention proposes a field-effect transistor pair testing device.

[0006] To achieve the above objectives, the present invention adopts the following technical solution: a first heat dissipation hole is provided on the side wall of the transistor pair testing device body; three sockets are electrically connected to the surface of the transistor pair testing device body; a dustproof device is provided on the side wall of the transistor pair testing device body; the dustproof device includes two retaining blocks, which are fixedly connected to the side wall of the transistor pair testing device body; a rotating rod is fixedly connected to the side of the two retaining blocks that are close to each other; a dustproof cover is rotatably connected to the arc surface of the rotating rod; a hook is fixedly connected to the lower surface of the dustproof cover; a limiting hole is provided on the surface of the transistor pair testing device body; the hook is slidably connected to the limiting hole; and a sealing gasket is fixedly connected to the lower surface of the dustproof cover, which is in contact with the side wall of the transistor pair testing device body.

[0007] The effect achieved by the above components is as follows: by setting up a dustproof device, the heat dissipation holes and the heat dissipation device inside the transistor pair test device body are protected from dust. During long-term use, the dustproof device blocks most of the dust from entering the transistor pair test device body without affecting heat dissipation, thus avoiding the accumulation of dust on the heat dissipation device inside the transistor pair test device body and affecting its heat dissipation effect, thereby improving the practicality of the device.

[0008] Preferably, the arc surface of the rotating rod is fitted with two torsion springs, and the two ends of the torsion springs are respectively fixedly connected to the retaining block and the dust cover.

[0009] The effect achieved by the above components is that, by setting a torsion spring, the dust cover can be automatically opened when the first slide bar releases the limit of the hook, thus improving the convenience of the device.

[0010] Preferably, a first spring is fixedly connected to the inner surface of the hook, and the hook is made of an elastic material.

[0011] The effect achieved by the above components is as follows: by setting a spring, when the hook slides into the limiting hole and is squeezed, it plays a buffering role, avoiding the hook from breaking during long-term back-and-forth squeezing, and improving the service life of the device.

[0012] Preferably, an L-shaped plate is fixedly connected to the side wall of the transistor pair testing device body, a first slide rod is slidably connected inside the L-shaped plate, a round block is fixedly connected to one end of the first slide rod, a second spring is sleeved on the arc surface of the first slide rod, the two ends of the second spring are fixedly connected to the L-shaped plate and the round block respectively, and one end of the first slide rod abuts against a hook.

[0013] The effect achieved by the above components is that by setting the first slide bar and the second spring, the restricted hook inside the limiting hole can be easily squeezed, thus improving the convenience of the device.

[0014] Preferably, the surface of the transistor pair testing device body is provided with a clamping device, the clamping device including two fixing plates, both of which are fixedly connected to the surface of the transistor pair testing device body, the fixing plates are threaded with bolts, one end of the bolts is rotatably connected to a clamping plate, and the clamping plate is slidably connected to the arc surface of the socket.

[0015] The effect achieved by the above components is as follows: by setting up a clamping device, the wires are clamped when inserted into the socket, which prevents the wires from falling off when the transistor pair test device is accidentally subjected to external force during operation, thus affecting the normal operation of the transistor pair test device and improving the stability of the device.

[0016] Preferably, a second slide rod is slidably connected inside the fixed plate, one end of the second slide rod is fixedly connected to a slide cap, and the end of the second slide rod away from the slide cap is fixedly connected to the clamping plate.

[0017] The effect achieved by the above components is that when the bolt rotates and drives the clamping plate to move toward the socket, the second sliding rod is used to fix the rotating clamping plate in place, thus preventing the clamping plate from rotating when the bolt rotates and drives it toward the socket, and improving the stability of the device.

[0018] Preferably, a protective pad is fixedly connected to the side of the clamp away from the bolt, and the protective pad is made of rubber.

[0019] The effect achieved by the above components is as follows: by setting up protective pads, the plug wires are protected during clamping, avoiding damage to the plug wires caused by the clamping plates squeezing them during long-term clamping, and thus extending the service life of the device.

[0020] In summary, the beneficial effects of this utility model are as follows:

[0021] 1. In this utility model, by setting a dustproof device, the heat dissipation holes and the heat dissipation device inside the transistor pair test device body are protected from dust. During long-term use, the dustproof device blocks most of the dust from entering the transistor pair test device body without affecting heat dissipation, thus avoiding the accumulation of dust on the heat dissipation device inside the transistor pair test device body and affecting its heat dissipation effect, thereby improving the practicality of the device.

[0022] 2. In this utility model, by setting a clamping device, the wire is clamped when inserted into the socket, which avoids the situation where the wire is accidentally dislodged when the transistor pair test device body is working, thus affecting the normal operation of the transistor pair test device body and improving the stability of the device. Attached Figure Description

[0023] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0024] Figure 2 This is a side view of the present invention;

[0025] Figure 3 This is a top view of the present invention;

[0026] Figure 4 In this utility model Figure 1 Enlarged view of point A;

[0027] Figure 5 In this utility model Figure 2 Enlarged view of point B;

[0028] Figure 6 In this utility model Figure 3 Enlarged view of point C;

[0029] Figure 7 In this utility model Figure 1 Enlarged diagram of point D.

[0030] Legend: 1. Transistor pair test device body; 2. Socket; 3. Heat dissipation hole; 4. Dustproof device; 401. Fixing block; 402. Rotating rod; 403. Dust cover; 404. Torsion spring; 405. Hook; 406. First spring; 407. Limiting hole; 408. L-shaped plate; 409. Second spring; 410. First sliding rod; 411. Sealing gasket; 5. Clamping device; 51. Fixing plate; 52. Bolt; 53. Sliding cap; 54. Second sliding rod; 55. Clamping plate; 56. Protective pad. Detailed Implementation

[0031] Reference Figure 1 , Figure 2 and Figure 3As shown, this utility model provides a technical solution: a test device for field-effect transistor pairs, including a transistor pair test device body 1 with a first heat dissipation hole 3 on its side wall, three sockets 2 electrically connected to the surface of the transistor pair test device body 1, and a dustproof device 4 on the side wall of the transistor pair test device body 1. By setting the dustproof device 4, the heat dissipation hole 3 and the heat dissipation device inside the transistor pair test device body 1 are protected from dust. During long-term use, the dustproof device 4 blocks most of the dust from entering the transistor pair test device body 1 without affecting heat dissipation, thus avoiding the accumulation of dust on the heat dissipation device inside the transistor pair test device body 1 and affecting its heat dissipation effect, thereby improving the practicality of the device. The surface of the transistor pair test device body is provided with a clamping device 5, which clamps the wire when it is inserted into the socket 2, preventing the wire from falling off when the transistor pair test device body 1 is accidentally subjected to external force during operation, thus affecting the normal operation of the transistor pair test device body 1 and improving the stability of the device.

[0032] The specific setup and function of its dustproof device 4 and clamping device 5 will be explained below.

[0033] Reference Figure 4 , Figure 5 and Figure 6As shown, in this embodiment: the dustproof device 4 includes two retaining blocks 401, which are fixedly connected to the side wall of the transistor pair testing device body 1. A rotating rod 402 is fixedly connected to the side of the two retaining blocks 401 that is close to each other. A dustproof cover 403 is rotatably connected to the arc surface of the rotating rod 402. A hook 405 is fixedly connected to the lower surface of the dustproof cover 403. A limiting hole 407 is opened on the surface of the transistor pair testing device body 1. The hook 405 is slidably connected to the limiting hole 407. A sealing gasket 411 is fixedly connected to the lower surface of the dustproof cover 403. The sealing gasket 411 fits against the side wall of the transistor pair testing device body 1. Two torsion springs 404 are sleeved on the arc surface of the rotating rod 402. The two ends of the torsion springs 404 are fixedly connected to the retaining block 401 and the dustproof cover 403, respectively. By setting the torsion springs 404, the dustproof cover 403 can be automatically opened when the first sliding rod 410 releases the limiting position of the hook 405. This improves the convenience of the device. A first spring 406 is fixedly connected to the inner surface of the hook 405. The hook 405 is made of elastic material. By setting the spring, when the hook 405 slides into the limiting hole 407 and is squeezed, it plays a buffering role, avoiding the breakage of the hook 405 during long-term back-and-forth squeezing, thus improving the service life of the device. An L-shaped plate 408 is fixedly connected to the side wall of the transistor pair test device body 1. A first slide rod 410 is slidably connected inside the L-shaped plate 408. A round block is fixedly connected to one end of the first slide rod 410. A second spring 409 is sleeved on the arc surface of the first slide rod 410. The two ends of the second spring 409 are fixedly connected to the L-shaped plate 408 and the round block, respectively. One end of the first slide rod 410 abuts against the hook 405. By setting the first slide rod 410 and the second spring 409, the effect of conveniently squeezing the hook 405 in the limiting hole 407 is achieved, thus improving the convenience of the device.

[0034] Reference Figure 7As shown, specifically, the clamping device 5 includes two fixing plates 51, both of which are fixedly connected to the surface of the transistor pair testing device body 1. Bolts 52 are threaded through the fixing plates 51, and one end of the bolts 52 is rotatably connected to a clamping plate 55. The clamping plate 55 is slidably connected to the arc surface of the socket 2. A second sliding rod 54 is slidably connected inside the fixing plates 51. One end of the second sliding rod 54 is fixedly connected to a sliding cap 53, and the end of the second sliding rod 54 away from the sliding cap 53 is fixedly connected to the clamping plate 55. When the bolts 52 rotate, causing the clamping plate 55 to move towards the socket 2, the second sliding rod 54 is used to move the clamping plate 55 towards the socket 2. The sliding rod 54 effectively secures the rotating clamp 55, preventing it from rotating when the bolt 52 rotates and moves the clamp 55 toward the socket 2. This improves the stability of the device. A protective pad 56, made of rubber, is fixedly connected to the side of the clamp 55 away from the bolt 52. By setting the protective pad 56, the wires of the socket 2 are protected during clamping, preventing the clamp 55 from squeezing the wires of the socket 2 and causing damage during long-term clamping. This extends the service life of the device.

[0035] Working principle: When dust protection is required for the first heat dissipation hole 3 of the transistor pair testing device body 1, the dust cover 403 is pushed by hand. The dust cover 403 rotates on the arc surface of the rotating rod 402, causing the torsion spring 404 to be in a stretched state. The dust cover 403 causes the hook 405 to slide into the limiting hole 407, and the first spring 406 is compressed. When the hook 405 slides into the limiting hole 407 and is compressed, the first spring 406 plays a buffering role. When the hook 405 slides to the bottom of the limiting hole 407, one side of the hook 405... The side of the hook 405 abuts against the inner surface of the limiting hole 407, thus restricting the hook 405 within the limiting hole 407. One side of the hook 405 abuts against one end of the first slide rod 410. When it is necessary to open the dust cover 403, press the first slide rod 410, causing the first slide rod 410 to slide and compress the second spring 409 within the L-shaped plate 408. At the same time, the first slide rod 410 pushes the hook 405, releasing the limitation of the limiting hole 407 on the hook 405. Under the force of the torsion spring 404, the hook 405 automatically slides out of the limiting hole 407, and the dust cover 403 automatically opens.

[0036] When it is necessary to clamp the wire inserted into the socket 2, rotate the bolts 52 on both sides of the socket 2. The bolts 52 push the clamping plate 55 forward to move the clamping plate 55 to the appropriate position. At the same time, the second sliding rod 54 moves forward under the action of the clamping plate 55. The second sliding rod 54 achieves the effect of fixing the rotating clamping plate 55, avoiding the situation where the clamping plate 55 rotates when the bolts 52 rotate and drive the clamping plate 55 to move towards the socket 2.

[0037] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

Claims

1. A testing apparatus for field-effect transistor pairs, comprising a transistor pair testing apparatus body (1), characterized in that: The transistor pair testing device body (1) has a first heat dissipation hole (3) on its side wall. The surface of the transistor pair testing device body (1) is electrically connected to three sockets (2). The side wall of the transistor pair testing device body (1) is provided with a dustproof device (4). The dustproof device (4) includes two retaining blocks (401). The two retaining blocks (401) are fixedly connected to the side wall of the transistor pair testing device body (1). The two retaining blocks (401) are fixedly connected to each other on their closest sides. A rotating rod (402) is rotatably connected to a dust cover (403) on its arc surface. A hook (405) is fixedly connected to the lower surface of the dust cover (403). A limiting hole (407) is opened on the surface of the transistor pair test device body (1). The hook (405) is slidably connected to the limiting hole (407). A sealing gasket (411) is fixedly connected to the lower surface of the dust cover (403). The sealing gasket (411) is in contact with the side wall of the transistor pair test device body (1).

2. The testing apparatus for a pair of field-effect transistors according to claim 1, characterized in that: The rotating rod (402) has two torsion springs (404) on its arc surface. The two ends of the torsion springs (404) are fixedly connected to the retaining block (401) and the dust cover (403) respectively.

3. The testing apparatus for a pair of field-effect transistors according to claim 1, characterized in that: The inner surface of the hook (405) is fixedly connected to a first spring (406), and the hook (405) is made of an elastic material.

4. The testing apparatus for a pair of field-effect transistors according to claim 1, characterized in that: An L-shaped plate (408) is fixedly connected to the side wall of the transistor pair test device body (1). A first slide rod (410) is slidably connected inside the L-shaped plate (408). A round block is fixedly connected to one end of the first slide rod (410). A second spring (409) is sleeved on the arc surface of the first slide rod (410). The two ends of the second spring (409) are fixedly connected to the L-shaped plate (408) and the round block, respectively. One end of the first slide rod (410) abuts against a hook (405).

5. The testing apparatus for a pair of field-effect transistors according to claim 1, characterized in that: The surface of the transistor pair test device body is provided with a clamping device (5). The clamping device (5) includes two fixing plates (51). Both fixing plates (51) are fixedly connected to the surface of the transistor pair test device body (1). A bolt (52) is threaded through the fixing plate (51). One end of the bolt (52) is rotatably connected to a clamping plate (55). The clamping plate (55) is slidably connected to the arc surface of the socket (2).

6. The testing apparatus for a pair of field-effect transistors according to claim 5, characterized in that: A second slide rod (54) is slidably connected inside the fixed plate (51). One end of the second slide rod (54) is fixedly connected to a slide cap (53), and the end of the second slide rod (54) away from the slide cap (53) is fixedly connected to the clamping plate (55).

7. The testing apparatus for a pair of field-effect transistors according to claim 5, characterized in that: A protective pad (56) is fixedly connected to the side of the clamp (55) away from the bolt (52), and the protective pad (56) is made of rubber.

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