Automatic testing machine for micro-resistor and insulation resistor

Abstract

The utility model relates to the technical field of resistance measurement, and discloses an automatic testing machine for micro resistance and insulation resistance, which comprises a workbench, an index plate, a transfer mechanism, a micro resistance testing mechanism and an insulation resistance testing mechanism, the index plate is arranged on the workbench, and a positioning jig used for placing and positioning conductive glass is arranged on the index plate; the transfer mechanism is arranged on the workbench and is used for transferring the conductive glass to be tested to the positioning jig; the at least one micro-resistance testing mechanism and the at least one insulation resistance testing mechanism are arranged on the workbench and are annularly distributed on the outer side of the index plate at intervals, the micro-resistance testing mechanism is used for detecting the micro resistance of the conductive glass, and the insulation resistance testing mechanism is used for detecting the insulation resistance of the conductive glass. The automatic testing machine for the micro resistance and the insulation resistance can solve the problem of how to automatically and continuously test the micro resistance and the insulation resistance of the conductive glass.

Description

Technical Field

[0001] This utility model relates to the field of resistance measurement technology, specifically to an automatic testing machine for micro-resistance and insulation resistance. Background Technology

[0002] Conductive glass is a special glass material with low resistance and high conductivity, and has been widely used in electronic devices such as touch screens, solar panels, and displays in recent years. These applications place extremely high demands on the resistive characteristics of conductive glass, especially its low resistance and insulation resistance. Low resistance determines the conductivity efficiency of conductive glass in electronic devices, while insulation resistance is directly related to its ability to prevent leakage. These two parameters together determine the reliability and stability of conductive glass in electronic devices. Therefore, accurate testing of its resistance characteristics is crucial to ensure that the quality of conductive glass meets standards.

[0003] However, most resistance measuring instruments currently on the market can only perform a single type of resistance measurement, namely either micro-resistance measurement or insulation resistance measurement. In practice, testers need to first load the conductive glass onto the mass production line of the micro-resistance measuring instrument or insulation resistance measuring instrument for testing. After completion, the conductive glass is then manually transferred to another instrument for a second round of testing. This testing method requires multiple transfers and repositionings of the conductive glass, which is not only cumbersome and inefficient but also highly susceptible to human error, affecting the accuracy of the test results.

[0004] Therefore, given the limitations of traditional resistance measuring instruments, it is particularly important to develop an automated testing machine that integrates the functions of measuring minute resistance and insulation resistance and is suitable for batch testing of conductive glass. Utility Model Content

[0005] (a) Technical problems to be solved

[0006] This invention provides an automatic testing machine for micro-resistance and insulation resistance, which can at least solve the technical problem of how to automatically and continuously test the micro-resistance and insulation resistance of conductive glass.

[0007] (II) Technical Solution

[0008] To solve the above-mentioned technical problems, this utility model provides the following technical solution: an automatic testing machine for micro resistance and insulation resistance, comprising:

[0009] Workbench;

[0010] The indexing plate is located on the workbench and is equipped with a positioning fixture for placing and positioning conductive glass. The indexing plate is used to transport conductive glass.

[0011] The transfer mechanism, located on the workbench, is used to transfer the conductive glass to be tested onto the positioning fixture;

[0012] At least one micro-resistance testing mechanism and one insulation resistance testing mechanism are provided on the workbench and are distributed in a ring-like pattern on the outside of the indexing plate. The micro-resistance testing mechanism is used to detect the minute resistance of the conductive glass, and the insulation resistance testing mechanism is used to detect the insulation resistance of the conductive glass.

[0013] Furthermore, both the aforementioned micro-resistance testing mechanism and insulation resistance testing mechanism include:

[0014] The upper and lower probes are located on the upper and lower sides of the indexing plate, respectively, and are positioned opposite each other. Both the upper and lower probes are used for electrical connection with the micro resistance tester or insulation resistance tester.

[0015] The probe drive assembly is located on the worktable and is connected to the upper and lower probes for transmission. It is used to drive the upper and lower probes to move towards or away from each other, so that the upper and lower probes respectively come into contact with the two sides of the conductive glass, or move the upper and lower probes away from the two sides of the conductive glass.

[0016] Furthermore, both the aforementioned upper and lower probes include at least two sets of probes, with the probe positions of the upper and lower probes corresponding one-to-one.

[0017] The positioning fixture is provided with positioning grooves for accommodating and positioning conductive glass. The bottom of the positioning groove is provided with clearance holes for the probe of the lower probe to pass through. The number of positioning grooves on the positioning fixture is the same as the number of probe groups.

[0018] Furthermore, the aforementioned automatic testing machine for micro resistance and insulation resistance also includes a first visual positioning mechanism. The first visual positioning mechanism is located on the worktable and is distributed in a ring-shaped interval with the micro resistance testing mechanism and the insulation resistance testing mechanism on the outside of the indexing plate. The first visual positioning mechanism is located upstream of the micro resistance testing mechanism and the insulation resistance testing mechanism and is used to detect whether the conductive glass to be tested is located on the positioning fixture.

[0019] Further configuration: the aforementioned positioning fixtures are provided in a number of at least three, with each positioning fixture arranged in a ring at equal intervals on the indexing plate; when one positioning fixture is positioned opposite the first visual positioning mechanism, the remaining positioning fixtures are positioned opposite the micro resistance testing mechanism and the insulation resistance testing mechanism respectively.

[0020] Further configuration: the aforementioned workbench is equipped with a test storage bin, a tested storage bin, and a defective product carrier plate. The transfer mechanism is used to transfer the conductive glass to be tested from the test storage bin to the positioning fixture corresponding to the first vision positioning mechanism, and to transfer the tested conductive glass to the tested storage bin or the defective product carrier plate.

[0021] Furthermore, the aforementioned automatic testing machine for micro-resistance and insulation resistance also includes a second vision positioning mechanism. The second vision positioning mechanism is located between the storage bin to be tested and the first vision positioning mechanism, and is used to detect whether the transfer mechanism has picked up the conductive glass and the position of the picked-up conductive glass.

[0022] Furthermore, the aforementioned automated testing machine for microresistance and insulation resistance also includes:

[0023] The material trays are stacked in the storage bins to be tested and the storage bins that have been tested, and the material trays are provided with at least two material slots for accommodating and positioning the conductive glass.

[0024] Two palletizing mechanisms are set on the workbench and are respectively positioned opposite the storage bin to be tested and the storage bin that has been tested. The palletizing mechanism is used to drive the pallet in the storage bin to be tested or the storage bin that has been tested to move up and down so that the uppermost pallet in the storage bin to be tested or the storage bin that has been tested can be moved to the bin opening.

[0025] Furthermore, both the storage bins to be tested and the storage bins that have already been tested are equipped with position sensors at their openings. These position sensors are used to detect whether the material tray has moved to the opening of the bin.

[0026] (III) Beneficial Effects

[0027] Compared with the prior art, the automatic testing machine for micro resistance and insulation resistance provided by this utility model has the following advantages:

[0028] The automatic micro-resistance and insulation resistance testing machine provided by this utility model operates as follows: First, the transfer mechanism places the conductive glass to be tested onto the positioning fixture. Then, the indexing plate drives the positioning fixture to rotate and transport the conductive glass, so that the conductive glass to be tested is sequentially positioned relative to the micro-resistance testing mechanism and the insulation resistance testing mechanism. Finally, the micro-resistance testing mechanism and the insulation resistance testing mechanism sequentially detect the micro-resistance and insulation resistance of the conductive glass. It can be seen that this automatic micro-resistance and insulation resistance testing machine integrates the functions of measuring micro-resistance and insulation resistance into one unit. Combined with the transfer mechanism and the indexing plate, it can replace manual labor, automatically transferring the conductive glass to the micro-resistance testing mechanism and the insulation resistance testing mechanism for testing. This enables automatic and continuous testing of the micro-resistance and insulation resistance of the conductive glass, greatly improving testing efficiency. Furthermore, it eliminates the need for repositioning the conductive glass, reducing errors and improving the accuracy of test results. It is suitable for batch testing of conductive glass. Attached Figure Description

[0029] Figure 1 This is a perspective view of the automatic testing machine for micro-resistance and insulation resistance in the embodiment;

[0030] Figure 2This is a schematic diagram of the indexing plate, micro-resistance testing mechanism, and insulation resistance testing mechanism in the embodiment.

[0031] Figure 3 This is a partial structural cross-sectional view of the indexing plate and microresistance testing mechanism in the embodiment;

[0032] Figure 4 This is a schematic diagram of the transfer mechanism, tray, and stacking mechanism in the embodiment.

[0033] Icon labels:

[0034] 1. Workbench; 11. Instrument rack; 12. Storage bin to be tested; 121. Bin opening; 122. Position sensor; 13. Storage bin already tested; 14. Defective product carrier plate; 141. Defective product trough;

[0035] 2. Indexing plate; 21. Positioning fixture; 211. Positioning groove; 212. Clearance hole;

[0036] 3. Transfer agency;

[0037] 4. Micro-resistance testing mechanism; 41. Upper probe; 411. Probe; 42. Lower probe; 43. Probe driving assembly; 431. Upper probe driver; 432. Lower probe driver; 44. Micro-resistance tester;

[0038] 5. Insulation resistance testing mechanism; 51. Insulation resistance tester;

[0039] 6. First visual positioning mechanism; 7. Second visual positioning mechanism;

[0040] 81. Material tray; 811. Material trough; 82. Palletizing mechanism;

[0041] 9. Conductive glass. Detailed Implementation

[0042] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0043] This invention provides an automatic testing machine for micro-resistance and insulation resistance, addressing the problem of how to automatically and continuously test the micro-resistance and insulation resistance of conductive glass 9.

[0044] See Figure 1 As shown, Figure 1The image shows a perspective view of an automatic testing machine for micro-resistance and insulation resistance in the embodiment. The automatic testing machine for micro-resistance and insulation resistance includes a worktable 1, an indexing plate 2, a transfer mechanism 3, at least one micro-resistance testing mechanism 4, and at least one insulation resistance testing mechanism 5.

[0045] The indexing plate 2 is installed on the workbench 1. The indexing plate 2 is equipped with a positioning fixture 21 for placing and positioning the conductive glass 9 by means of welding or screwing. The indexing plate 2 is used to transport the conductive glass 9.

[0046] The transfer mechanism 3 is installed on the workbench 1 and is used to transfer the conductive glass 9 to be tested onto the positioning fixture 21.

[0047] Both the micro-resistance testing mechanism 4 and the insulation resistance testing mechanism 5 are mounted on the workbench 1. At least one micro-resistance testing mechanism 4 and at least one insulation resistance testing mechanism 5 are distributed in a ring-shaped interval on the outside of the indexing plate 2. The micro-resistance testing mechanism 4 is used to detect the minute resistance of the conductive glass 9, and the insulation resistance testing mechanism 5 is used to detect the insulation resistance of the conductive glass 9.

[0048] When using the automatic microresistance and insulation resistance testing machine described above, firstly, the transfer mechanism 3 places the conductive glass 9 to be tested onto the positioning fixture 21. Then, the indexing plate 2 drives the positioning fixture 21 to rotate and transport the conductive glass 9 to be tested, so that the conductive glass 9 is positioned opposite the microresistance testing mechanism 4 or the insulation resistance testing mechanism 5. Alternatively, the transfer mechanism 3 directly places the conductive glass 9 to be tested onto the positioning fixture 21, which is positioned opposite the microresistance testing mechanism 4 or the insulation resistance testing mechanism 5. Next, the microresistance testing mechanism 4 or the insulation resistance testing mechanism 5 detects the minute resistance or insulation resistance of the conductive glass 9. After the detection, the indexing plate 2 drives the positioning fixture 21 to rotate and continue transporting the conductive glass 9, so that the conductive glass 9 is sequentially positioned opposite the remaining microresistance testing mechanisms 4 and / or insulation resistance testing mechanisms 5, to sequentially perform the next minute resistance and / or insulation resistance detection. As can be seen, this automatic micro-resistance and insulation resistance testing machine integrates micro-resistance and insulation resistance measurement functions through the micro-resistance testing mechanism 4 and the insulation resistance testing mechanism 5. Combined with the transfer mechanism 3 and the indexing plate 2, it can replace manual labor and automatically transfer the conductive glass 9 to the micro-resistance testing mechanism 4 and the insulation resistance testing mechanism 5 for testing. This enables automatic and continuous testing of the micro-resistance and insulation resistance of the conductive glass 9, greatly improving testing efficiency. Furthermore, it eliminates the need to reposition the conductive glass 9, reducing errors and improving the accuracy of test results. It is suitable for batch testing of conductive glass 9.

[0049] The aforementioned transfer mechanism 3 can utilize existing equipment combining a robotic arm and a vacuum suction cup. The number of the aforementioned micro-resistance testing mechanism 4 and insulation resistance testing mechanism 5 can be designed according to customer requirements, enabling at least one round of micro-resistance and insulation resistance testing.

[0050] See Figure 2 and Figure 3 As shown, Figure 2 This is a schematic diagram of the structure of the indexing plate, the micro-resistance testing mechanism, and the insulation resistance testing mechanism in the embodiment. Figure 3 This is a partial structural cross-sectional view of the indexing plate and micro-resistance testing mechanism in one embodiment. In one implementation of the micro-resistance testing mechanism 4 and the insulation resistance testing mechanism 5, both the micro-resistance testing mechanism 4 and the insulation resistance testing mechanism 5 include an upper probe 41, a lower probe 42, and a probe driving assembly 43. The upper probe 41 and the lower probe 42 are located on the upper and lower sides of the indexing plate 2, respectively, and are positioned opposite each other. Both the upper probe 41 and the lower probe 42 are used for electrical connection with the micro-resistance tester 44 or the insulation resistance tester 51. The probe driving assembly 43 is mounted on the worktable 1 and is drively connected to the upper probe 41 and the lower probe 42. The probe driving assembly 43 is used to drive the upper probe 41 and the lower probe 42 to move towards or away from each other, so that the upper probe 41 and the lower probe 42 respectively abut against the two sides of the conductive glass 9, or to move the upper probe 41 and the lower probe 42 away from the two sides of the conductive glass 9. Thus, when testing the minute resistance or insulation resistance of the conductive glass 9, firstly, the indexing plate 2 drives the positioning fixture 21 to rotate so that it is opposite to the position of the micro-resistance testing mechanism 4 or the insulation resistance testing mechanism 5; then, the probe driving assembly 43 drives the upper probe 41 and the lower probe 42 to move towards each other, so that the upper probe 41 and the lower probe 42 respectively come into contact with the upper and lower surfaces of the conductive glass 9, and the minute resistance or insulation resistance of the conductive glass 9 can be tested by the micro-resistance tester 44 or the insulation resistance tester 51; after the test, the probe driving assembly 43 drives the upper probe 41 and the lower probe 42 to move away from the two surfaces of the conductive glass 9 and return to their original positions, so as to avoid interference with the upper or lower probe 42 when the indexing plate 2 drives the positioning fixture 21 to rotate.

[0051] See Figure 1 As shown, based on the above embodiment, an instrument placement rack 11 is provided on the workbench 1 by means of screws or welding. The instrument placement rack 11 is located above the indexing plate 2 and is used to place the micro resistance tester 44 and the insulation resistance tester 51. In this way, the micro resistance tester 44 and the insulation resistance tester 51 are placed above other mechanisms and away from the electrical control center by the instrument placement rack 11, which can reduce interference to the micro resistance tester 44 and the insulation resistance tester 51 and improve accuracy.

[0052] See Figure 2 and Figure 3 As shown, in one embodiment of the probe driving assembly 43, the probe driving assembly 43 includes an upper probe driving component 431 and a lower probe driving component 432, both of which are mounted on the worktable 1 by means of screwing or welding. The output end of the upper probe driving component 431 is connected to the upper probe 41 by means of screwing or welding, and the upper probe driving component 431 is used to drive the upper probe 41 to move up and down. The output end of the lower probe driving component 432 is connected to the lower probe 42 by means of screwing or welding, and the lower probe driving component 432 is used to drive the lower probe 42 to move up and down. In this way, the upper probe driving component 431 and the lower probe driving component 432 cooperate to drive the upper probe 41 and the lower probe 42 to move towards or away from each other.

[0053] Both the upper probe drive 431 and the lower probe drive 432 mentioned above can use existing linear displacement drive mechanisms such as telescopic cylinders or telescopic poles.

[0054] In addition to the above-described embodiments, the probe drive assembly 43 can also use a bidirectional screw linear module.

[0055] See Figure 3 As shown, in one embodiment of the upper probe 41 and the lower probe 42, both the upper probe 41 and the lower probe 42 include at least two sets of probes 411, and the positions of the probes 411 of the upper probe 41 and the lower probe 42 correspond one-to-one. The positioning fixture 21 has positioning grooves 211 for accommodating and positioning the conductive glass 9. The bottom of the positioning grooves 211 has clearance holes 212 for the probes 411 of the lower probe 42 to pass through and abut against the lower surface of the conductive glass 9. The number of positioning grooves 211 on the positioning fixture 21 is the same as the number of sets of probes 411. Thus, the same micro-resistance testing mechanism 4 and insulation resistance testing mechanism 5 can simultaneously test at least two conductive glasses 9, greatly improving testing efficiency. In this embodiment, one set has four probes 411, and the four probes 411 are arranged in a cross shape.

[0056] See Figure 1As shown, based on any of the above embodiments, the automatic testing machine for microresistance and insulation resistance further includes a first visual positioning mechanism 6. The first visual positioning mechanism 6 is mounted on the worktable 1. The first visual positioning mechanism 6, at least one microresistance testing mechanism 4, and at least one insulation resistance testing mechanism 5 are arranged in a ring around the outer side of the indexing plate 2. The first visual positioning mechanism 6 is located upstream of the microresistance testing mechanism 4 and the insulation resistance testing mechanism 5, and is used to detect whether the conductive glass 9 to be tested is located on the positioning fixture 21. Thus, the first visual positioning mechanism 6, the microresistance testing mechanism 4, and the insulation resistance testing mechanism 5 can simultaneously test the conductive glass 9 on their respective positioning fixtures 21 without interference, further improving testing efficiency. In this embodiment, there is one microresistance testing mechanism 4, two insulation resistance testing mechanisms 5, and four positioning fixtures 21. The indexing plate 2 can use an existing four-station divider.

[0057] The aforementioned first visual positioning mechanism 6 can use an existing CCD camera to visually position the workpiece.

[0058] See Figure 1 and Figure 4 As shown, Figure 4 The diagram illustrates the structure of the transfer mechanism, tray, and stacking mechanism in this embodiment. Based on any of the above embodiments, the workbench 1 is equipped with a test storage bin 12, a tested storage bin 13, and a defective product carrier plate 14. The transfer mechanism 3 is used to transfer the conductive glass 9 to be tested from the test storage bin 12 to the positioning fixture 21 corresponding to the first visual positioning mechanism 6, and to transfer the tested conductive glass 9 to the tested storage bin 13 or the defective product carrier plate 14. Thus, this automatic micro-resistance and insulation resistance testing machine, through a single transfer mechanism 3, can automatically feed the conductive glass 9 and classify and unload the tested conductive glass 9 according to the detection results of the micro-resistance tester 44 and the insulation resistance tester 51, significantly reducing equipment costs.

[0059] The aforementioned defective product carrier plate 14 has at least two defective product slots 141 for accommodating unqualified conductive glass 9.

[0060] See Figure 1As shown, based on the above embodiment, the automatic testing machine for micro-resistance and insulation resistance also includes a second visual positioning mechanism 7. The second visual positioning mechanism 7 is installed between the test storage bin 12 and the first visual positioning mechanism 6, and is used to detect whether the transfer mechanism 3 has picked up the conductive glass 9, and the position of the picked-up conductive glass 9. Thus, when the transfer mechanism 3 loads the conductive glass 9, it first picks up the test conductive glass 9 from the test storage bin 12, then moves the test conductive glass 9 to the second visual positioning mechanism 7. After the second visual positioning mechanism 7 detects and confirms the position of the picked-up conductive glass 9, it is placed on the positioning fixture 21 corresponding to the first visual positioning mechanism 6. This facilitates the transfer mechanism 3 in accurately placing the picked-up conductive glass 9 at the first visual positioning mechanism 6.

[0061] The aforementioned second visual positioning mechanism 7 can use an existing CCD camera to visually position the workpiece.

[0062] See Figure 1 and Figure 4As shown, based on the above embodiment, the automatic testing machine for microresistance and insulation resistance also includes a material tray 81 and two stacking mechanisms 82. The material trays 81 are stacked in the test storage bin 12 and the tested storage bin 13, respectively. The material trays 81 have at least two slots 811 for accommodating and positioning the conductive glass 9. The two stacking mechanisms 82 are mounted on the worktable 1 by means of screwing or welding, and are respectively positioned opposite to the test storage bin 12 and the tested storage bin 13. The stacking mechanisms 82 are used to drive the material trays 81 in the test storage bin 12 or the tested storage bin 13 to move up and down, so that the uppermost material tray 81 in the test storage bin 12 or the tested storage bin 13 moves to the bin opening 121. Thus, before the transfer mechanism 3 loads the conductive glass 9 to be tested, the stacking mechanism 82 corresponding to the storage bin 12 drives the tray 81 inside the storage bin 12 to rise as a whole, so that the uppermost tray 81 moves to the opening 121 of the storage bin 12. Then, the transfer mechanism 3 picks up the conductive glass 9 to be tested from the uppermost tray 81 and transfers it to the positioning fixture 21 corresponding to the first vision positioning mechanism 6. Before the transfer mechanism 3 unloads the tested conductive glass 9, the stacking mechanism 13 corresponding to the tested storage bin 13... Mechanism 82 drives the trays 81 in the tested storage bin 13 to rise as a whole, so that the uppermost tray 81 moves to the opening 121 of the tested storage bin 13. Then, based on the test results of the micro resistance tester 44 and the insulation resistance tester 51, the transfer mechanism 3 picks up the qualified conductive glass 9 on the indexing plate 2 and transfers it to the uppermost tray 81 of the tested storage bin 13, or the transfer mechanism 3 picks up the unqualified conductive glass 9 on the indexing plate 2 and transfers it to the defective product carrier plate 14. It can be seen that this automatic micro resistance and insulation resistance testing machine can stack and store a large number of conductive glass 9 to be tested and tested conductive glass 9 through the stacked trays 81, which is convenient for the staff to handle at one time; and the stacking mechanism 82 can move the trays 81 to the opening 121 in a unified manner, and the openings 121 of the tested storage bin 12 and the tested storage bin 13 can be at the same height, which can facilitate the transfer mechanism 3 to pick up and put out materials.

[0063] The palletizing mechanism 82 described above can use existing linear displacement drive mechanisms such as ball screw linear modules or linear motor linear modules.

[0064] See Figure 4As shown, based on the above embodiment, both the opening 121 of the storage bin 12 to be tested and the storage bin 13 to be tested are equipped with positioning sensors 122. The positioning sensors 122 are used to detect whether the material tray 81 has moved to the opening 121. Thus, when the palletizing mechanism 82 moves the material tray 81 to the opening 121, the positioning sensor 122 will send a signal. Then, the transfer mechanism 3 will transfer the conductive glass 9, effectively ensuring that the transfer mechanism 3 can grab the conductive glass 9 in the storage bin 12 to be tested, avoiding the occurrence of missed material grabbing. It also ensures that the transfer mechanism 3 can safely place the qualified conductive glass 9 in the storage bin 13 to be tested without it falling and being damaged.

[0065] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. An automatic micro- and insulation resistance tester, characterized in that, The automatic testing machine comprises a workbench, a protractor arranged on the workbench, a positioning jig arranged on the protractor for placing and positioning conductive glass, and the protractor is used for conveying the conductive glass, a transfer mechanism arranged on the workbench and used for transferring the conductive glass to be tested to the positioning jig, at least one micro-resistance testing mechanism and insulation resistance testing mechanism arranged on the workbench and spaced apart in a ring shape outside the protractor, the micro-resistance testing mechanism is used for detecting the micro-resistance of the conductive glass, and the insulation resistance testing mechanism is used for detecting the insulation resistance of the conductive glass. The micro-resistance testing mechanism and the insulation resistance testing mechanism each comprise an upper probe and a lower probe arranged on the upper and lower sides of the protractor respectively and opposite to each other, the upper probe and the lower probe are each used for electrically connecting with a micro-resistance tester or an insulation resistance tester, a probe driving assembly arranged on the workbench and in transmission connection with the upper probe and the lower probe, and used for driving the upper probe and the lower probe to move towards or away from each other so that the upper probe and the lower probe are respectively in abutment with two surfaces of the conductive glass or the upper probe and the lower probe are away from the two surfaces of the conductive glass. The upper probe and the lower probe each comprise at least two groups of probes, and the positions of the probes of the upper probe and the lower probe are one-to-one corresponding. The positioning jig is provided with a positioning groove for accommodating and positioning the conductive glass, and the groove bottom of the positioning groove is provided with a clearance hole for the probe of the lower probe to penetrate, and the number of the positioning grooves on the positioning jig is the same as the number of the groups of probes. The automatic testing machine further comprises a first visual positioning mechanism arranged on the workbench and spaced apart in a ring shape outside the protractor with the micro-resistance testing mechanism and the insulation resistance testing mechanism, the first visual positioning mechanism is located upstream of the micro-resistance testing mechanism and the insulation resistance testing mechanism and is used for detecting whether the conductive glass to be tested is located on the positioning jig.

2. The automatic micro- and insulation resistance tester according to claim 1, characterized in that The number of the positioning jigs is at least three, and each of the positioning jigs is arranged on the protractor in a ring shape and at equal intervals; when one of the positioning jigs is opposite to the first visual positioning mechanism, the remaining positioning jigs are respectively opposite to the micro-resistance testing mechanism and the insulation resistance testing mechanism one by one. The workbench is provided with a to-be-tested storage bin, a tested storage bin and a defective product carrier plate, and the transfer mechanism is used for transferring the conductive glass to be tested in the to-be-tested storage bin to the positioning jig corresponding to the first visual positioning mechanism and transferring the tested conductive glass to the tested storage bin or the defective product carrier plate. The automatic testing machine further comprises a second visual positioning mechanism arranged between the to-be-tested storage bin and the first visual positioning mechanism and used for detecting whether the conductive glass is grabbed by the transfer mechanism and the position of the grabbed conductive glass.

3. The automatic micro- and insulation resistance tester according to claim 2, characterized in that The automatic testing machine further comprises ​ 4. The automatic micro- and insulation resistance tester according to any one of claims 1 to 3, characterized in that ​ 5. The automatic micro- and insulation resistance tester according to claim 4, characterized in that ​ 6. The automatic micro- and insulation resistance tester according to claim 4, characterized in that ​ 7. The automatic micro- and insulation resistance tester according to claim 6, characterized in that ​ 8. The automatic micro- and insulation resistance tester according to claim 6, characterized in that ​ A tray is arranged in the to-be-tested storage bin and the tested storage bin respectively, and at least two grooves for accommodating and positioning the conductive glass are arranged on the tray. Two stacking mechanisms are arranged on the workbench and are opposite to the to-be-tested storage bin and the tested storage bin respectively. The stacking mechanism is used to drive the tray in the to-be-tested storage bin or the tested storage bin to move up and down, so that the uppermost tray in the to-be-tested storage bin or the tested storage bin moves to the bin opening.

9. The automatic micro- and insulation resistance tester according to claim 8, characterized in that The bin opening of the to-be-tested storage bin and the tested storage bin is provided with a to-position sensor, which is used to detect whether the tray moves to the bin opening.

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