Seed crystal dislocation piece detecting and placing device
By designing a seed crystal dislocation piece detection and placement device, and utilizing a combination of a dislocation piece placement disk and a test piece for the seed crystal end, efficient and low-cost detection of seed crystal dislocation pieces is achieved. This solves the problems of low detection efficiency and high cost in existing technologies, and improves the accuracy and precision of detection.
Patent Information
- Application Number
- CN202423072735.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-11
- Publication Date
- 2025-11-25
- Estimated Expiration
- 2034-12-11
AI Technical Summary
The existing seed crystal dislocation detection process is inefficient and costly, making it difficult to meet the demand for high-efficiency detection.
A seed crystal dislocation detection and placement device is designed, including a dislocation placement disk and a test piece for the crystal lead end. Through the design of the receiving groove and the circular hole, the precise positioning and detection of the seed crystal dislocation is achieved, eliminating the operation step of the circular piece.
It improved the efficiency of the testing process, reduced testing costs, and enhanced the accuracy and precision of the testing.
Smart Images
Figure CN223597642U_ABST
Abstract
Description
Technical Field
[0001] This disclosure relates to the field of crystal growth, and more specifically to a seed crystal dislocation detection and placement device. Background Technology
[0002] The dislocation density at the seed crystal's lead end affects the dislocation density of the pulled single crystal. Therefore, it is necessary to select a seed crystal with a dislocation density that is appropriate for the required number of dislocations in the single crystal.
[0003] like Figure 1 As shown, when the seed crystal is processed into a 15mm×15mm×12mm strip, a 15mm×15mm×2mm dislocation piece is cut from the seed crystal's leading end. The dislocation piece needs to be further processed into a Φ10mm round piece for testing.
[0004] Since the Φ10mm circular piece produced by reprocessing is part of the dislocation piece, this method of reprocessing to meet the dislocation detection requirements is not only inefficient but also costly. Utility Model Content
[0005] In view of the problems existing in the background art, one object of this disclosure is to provide a seed crystal dislocation detection and placement device, which can not only improve the efficiency of detection operations but also reduce the detection cost.
[0006] Therefore, a seed dislocation piece detection and placement device is provided, which includes a dislocation piece placement disk and a seed end testing piece; the dislocation piece placement disk is provided with a receiving groove, the shape of which is complementary to the outer periphery of the fabricated seed dislocation piece, and the receiving groove is used to receive the fabricated seed dislocation piece; the seed end testing piece is provided with a through circular hole that can be aligned with the receiving groove, the diameter of which corresponds to the diameter of the seed end testing piece, and the seed end testing piece is used to be placed on the dislocation piece placement disk so that the circular hole is aligned with the receiving groove and exposes the corresponding area of the fabricated seed dislocation piece in the receiving groove for dislocation detection.
[0007] The beneficial effects of this disclosure are as follows: In the seed dislocation piece detection and placement device according to this disclosure, the seed dislocation piece corresponds to the dislocation piece in the prior art. Only the seed dislocation piece needs to be made, and the test area can be defined by the circular hole of the test piece at the lead end, so that dislocation detection can be performed. This eliminates the operation of the circular piece in the prior art, which not only improves the efficiency of the detection operation but also reduces the detection cost. Attached Figure Description
[0008] Figure 1 This is a schematic diagram of the fabrication process of a dislocation patch for testing the seed crystal's lead end.
[0009] Figure 2is an exploded view of a seed dislocation sheet detection placement device according to the present disclosure.
[0010] Figure 3 is a view of a seed dislocation sheet placed into a dislocation sheet placement disk in a seed dislocation sheet detection placement device.
[0011] Figure 4 is a view of a seed dislocation sheet placed into a dislocation sheet placement disk in a seed dislocation sheet detection placement device. Figure 3
[0012] In the drawings, reference numerals: 1 dislocation sheet placement disk 2 seed dislocation sheet detection placement device 11 housing groove 12 recess 13 inner side wall 14 accommodation space 21 through hole 22 recessed portion 100 seed dislocation sheet detection placement device 200 seed dislocation sheet
[0013] 100 seed dislocation sheet detection placement device 2 seed dislocation sheet detection placement device 11 housing groove 12 recess 13 inner side wall 14 accommodation space 21 through hole 22 recessed portion 100 seed dislocation sheet detection placement device 200 seed dislocation sheet
[0014] 1 dislocation sheet placement disk 21 through hole 2 seed dislocation sheet detection placement device 11 housing groove 12 recess 13 inner side wall 14 accommodation space 21 through hole 22 recessed portion 100 seed dislocation sheet detection placement device 200 seed dislocation sheet
[0015] 11 housing groove 12 recess 13 inner side wall 14 accommodation space 21 through hole 22 recessed portion 100 seed dislocation sheet detection placement device 200 seed dislocation sheet
[0016] 11 housing groove 12 recess 13 inner side wall 14 accommodation space 21 through hole 22 recessed portion 100 seed dislocation sheet detection placement device 200 seed dislocation sheet
[0017] 11 housing groove 12 recess 13 inner side wall 14 accommodation space 21 through hole 22 recessed portion 100 seed dislocation sheet detection placement device 200 seed dislocation sheet
[0018] 11 housing groove 12 recess 13 inner side wall 14 accommodation space 21 through hole 22 recessed portion 100 seed dislocation sheet detection placement device 200 seed dislocation sheet
[0019] 200 seed dislocation sheetDETAILED DESCRIPTION
[0020] The accompanying drawings illustrate embodiments of the present disclosure and, as such, should be considered part of this disclosure, it being understood that the disclosed embodiments are merely examples of implementations of the present disclosure and that the present disclosure can be implemented in various forms, therefore, the specific details disclosed herein should not be interpreted as limiting, but merely as a basis for teaching one of ordinary skill in the art to variously implement the present disclosure.
[0021] Referring to Figures 2 to 4 , the seed dislocation sheet detection placement device 100 includes a dislocation sheet placement disk 1 and a seed dislocation sheet detection placement device 2. The dislocation sheet placement disk 1 is provided with a housing groove 11, the shape of the housing groove 11 is set to be complementary to the outer periphery of the manufactured seed dislocation sheet 200, and the housing groove 11 is used to house the manufactured seed dislocation sheet 200. The seed dislocation sheet detection placement device 2 is provided with a through hole 21 that can be aligned with the housing groove 11, the diameter of the through hole 21 corresponds to the diameter of the seed dislocation sheet detection, and the seed dislocation sheet detection placement device 2 is used to be placed in the dislocation sheet placement disk 1 so that the corresponding area of the through hole 21 in the housing groove 11 and the manufactured seed dislocation sheet 200 exposed in the housing groove 11 is aligned for dislocation detection.
[0022] In the seed dislocation wafer detection placement device 100 according to the present disclosure, the seed dislocation wafer 200 corresponds to the dislocation wafer in the background art. Only the seed dislocation wafer 200 needs to be made, and the test area can be defined by the circular hole 21 of the seed dislocation wafer 200, so that the dislocation detection can be performed. Thus, the operation of the wafer in the background art is cancelled, which not only improves the operation efficiency of the detection but also reduces the cost of the detection.
[0023] In an example, the depth of the accommodation groove 11 is the same as the thickness of the seed dislocation wafer 200, so that the seed dislocation wafer 200 can be closely attached to the seed dislocation wafer 200, and the stability of the test area is improved.
[0024] In an example, the projection of the accommodation groove 11 in the up-down direction D1 is a square consistent with the square seed dislocation wafer 200. In this way, the square seed dislocation wafer 200 can be closely fixed, and the square seed dislocation wafer 200 can be more accurately positioned, thereby improving the accuracy and precision of the test.
[0025] In an example, the projection of the accommodation groove 11 of the dislocation wafer placement disc 1 in the up-down direction D1 is a square of 15 mm x 15 mm; the depth of the accommodation groove 11 of the dislocation wafer placement disc 1 is 2 mm; the diameter of the circular hole 21 of the seed dislocation wafer 200 is 10 mm; and the thickness of the seed dislocation wafer 200 is 1 mm.
[0026] In order to facilitate the taking and placing of the seed dislocation wafer 200, with reference to Figures 2 to 4 In an example, the dislocation wafer placement disc 1 is further provided with two grooves 12 extending outward in opposite directions on the opposite sides of the accommodation groove 11 in the left-right direction D2 or the front-rear direction D3 and communicating with the accommodation groove 11, and the two grooves 12 are used by the operator to place the seed dislocation wafer 200 into the accommodation groove 11 or take the seed dislocation wafer 200 out of the accommodation groove 11. Further, the two grooves 12 are symmetrically distributed with respect to the accommodation groove 11.
[0027] In order to improve the convenience and accuracy of placing the seed dislocation wafer 200 into the dislocation wafer placement disc 1, as shown in Figure 4 In an example, the dislocation wafer placement disc 1 is provided with four sloping inner side walls 13, which enclose a containing space 14, and the bottom edges of the four inner side walls 13 enclose a shape consistent with the outer peripheral contour of the seed dislocation wafer 200. When operating, the seed dislocation wafer 200 can be guided to fall and accurately fall into the area enclosed by the bottom edges of the four inner side walls 13 only by placing the seed dislocation wafer 200 into the dislocation wafer placement disc 1 along the four sloping inner side walls 13,
[0028] In order to facilitate the taking and placing of the seed dislocation wafer 200, with reference to Figure 2 and Figure 4In an example, the seed end test sheet 2 has two recesses 22 extending outward in opposite directions on opposite sides in the left-right direction D2 or the front-rear direction D3, and the two recesses 22 are used by an operator to place the seed end test sheet 2 into the accommodation space 14 of the dislocation sheet placement tray 1 or to take the seed end test sheet 2 out of the accommodation space 14 of the dislocation sheet placement tray 1. Further, the two recesses 22 are symmetrically distributed on the seed end test sheet 2.
[0029] In order to improve the detection efficiency, as shown in the drawings, the accommodation grooves 11 and the round holes 21 are consistent in number; the accommodation grooves 11 are arranged in a two-dimensional array; and the round holes 21 are arranged in a two-dimensional array. Figures 2 to 4
[0030] A number of exemplary embodiments are described above with the understanding that the herein disclosed various features can be combined together to form a number of additional combinations not shown for the sake of brevity, unless otherwise specified.
Claims
1. A seed dislocation sheet detection placement device, characterized in that, the seed dislocation sheet detection placement device (100) comprises a dislocation sheet placement disc (1) and a seed end test sheet (2); the dislocation sheet placement disc (1) is provided with a receiving groove (11), the shape of the receiving groove (11) is complementary to the outer periphery of the prepared seed dislocation sheet (200), and the receiving groove (11) is used for accommodating the prepared seed dislocation sheet (200); the seed end test sheet (2) is provided with a through circular hole (21) that can be centered with the receiving groove (11), the diameter of the circular hole (21) corresponds to the diameter of the seed end test, and the seed end test sheet (2) is used for placing on the dislocation sheet placement disc (1) to make the circular hole (21) centered with the receiving groove (11) and expose the corresponding area of the prepared seed dislocation sheet (200) in the receiving groove (11) to perform dislocation detection. 2.The seed dislocation sheet detection placement device according to claim 1, characterized in that, the depth of the receiving groove (11) is the same as the thickness of the seed dislocation sheet (200). 3.The seed dislocation sheet detection placement device according to claim 1, characterized in that, the projection of the receiving groove (11) in the up-down direction (D1) is a square shape consistent with the square seed dislocation sheet (200). 4.The seed dislocation sheet detection placement device according to claim 3, characterized in that, the projection of the receiving groove (11) of the dislocation sheet placement disc (1) in the up-down direction (D1) is a square of 15mm×15mm; the depth of the receiving groove (11) of the dislocation sheet placement disc (1) is 2mm; the diameter of the circular hole (21) of the seed end test sheet (2) is 10mm; the thickness of the seed end test sheet (2) is 1mm. 5.The seed dislocation sheet detection placement device according to claim 1, characterized in that, the dislocation sheet placement disc (1) is further provided with two grooves (12) extending outward in opposite directions on the left and right sides (D2) or the front and back sides (D3) of the receiving groove (11) and communicating with the receiving groove (11), and the two grooves (12) are used for the operator to place the seed dislocation sheet (200) into the receiving groove (11) or take the seed dislocation sheet (200) out of the receiving groove (11). 6.The seed dislocation sheet detection placement device according to claim 5, characterized in that, the two grooves (12) are symmetrically distributed relative to the receiving groove (11). 7.The seed dislocation sheet detection placement device according to claim 3, characterized in that, the dislocation sheet placement disc (1) is provided with four sloping inner side walls (13) that enclose a containing space (14), and the bottom edges of the four inner side walls (13) enclose a shape consistent with the outer periphery contour of the seed end test sheet (2). 8.The seed dislocation sheet detection placement device according to claim 6, characterized in that, The seed end test wafer (2) has two recesses (22) extending outward in opposite directions on opposite sides in the left-right direction (D2) or the front-rear direction (D3), and the two recesses (22) are used for an operator to place or remove the seed end test wafer (2) into or from the accommodation space (14) of the dislocation wafer placement tray (1).
9. The seed dislocation wafer detection and placement device according to claim 8, characterized in that, The two recesses (22) are symmetrically distributed on the seed end test wafer (2).
10. The seed dislocation wafer detection and placement device according to any one of claims 1-9, characterized in that, The accommodation grooves (11) and the round holes (21) are consistent in number; The accommodation grooves (11) are arranged in a two-dimensional array; The round holes (21) are arranged in a two-dimensional array.