Handheld thickness gauge

By designing a handheld thickness gauge, the upper and lower measuring arms clamp the wafer, and the digital dial indicator probe abuts against the clamping surface, solving the problem of low measurement efficiency in existing devices and realizing convenient and accurate wafer thickness measurement.

CN223636772UActive Publication Date: 2025-12-05GUANGZHOU SUMMIT CRYSTAL SEMICON CO LTD
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Patent Information

Application Number
CN202520029881.3
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-01-07
Publication Date
2025-12-05
Estimated Expiration
2035-01-07

AI Technical Summary

Technical Problem

Existing wafer thickness measurement devices are not convenient enough, resulting in low measurement efficiency.

Method used

A handheld thickness gauge was designed, which holds the wafer with an upper and lower measuring arm, and the detection rod of a digital micrometer abuts against the clamping surface, thus achieving convenient and accurate wafer thickness measurement.

Benefits of technology

It enables convenient and accurate measurement of wafer thickness, improves measurement efficiency, and meets the needs of product quality control and process adjustment.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides a handheld thickness gauge, and relates to the technical field of crystal processing, the handheld thickness gauge comprises an upper measuring arm and a lower measuring arm which are oppositely arranged, the opposite surfaces of the upper measuring arm and the lower measuring arm are respectively an upper clamping surface and a lower clamping surface which are parallel to each other, and the upper measuring arm and the lower measuring arm are connected through a telescopic piece and can move relatively. A digital display dial indicator is arranged on the upper measuring arm or the lower measuring arm, a detection rod of the digital display dial indicator abuts against the upper clamping face or the lower clamping face, during detection, the upper clamping face and the lower clamping face clamp a wafer, and in the process, the detection rod of the digital display dial indicator perpendicularly abuts against the clamping faces, that is, the digital display dial indicator detects the distance between the upper clamping face and the lower clamping face. With the movement of the measuring arm, the reading of the digital display dial indicator changes synchronously, and when the upper clamping surface and the lower clamping surface stably clamp the wafer, the reading of the digital display dial indicator is the thickness of the wafer, thereby realizing convenient and accurate wafer thickness measurement.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of crystal processing, and particularly relates to a handheld thickness gauge. BACKGROUND

[0002] The thickness of a wafer is one of the key indicators for measuring whether it meets the production standard. For example, in the manufacture of semiconductor wafers, accurate thickness can ensure the stability of the performance of the chip, because thickness deviation can affect the performance parameters such as the integration level and signal transmission speed of the electronic element. In the field of optical wafers, appropriate thickness is crucial for the imaging quality of optical elements (such as lenses), and thickness that does not meet the requirements can cause problems such as aberration and chromatic aberration.

[0003] During the grinding and polishing of wafers, it is usually necessary to stop the machine, take out the wafer from the equipment, and then take one or two wafers from a tray for testing. The weight of the wafer is measured, and then a conversion formula is used to obtain the thickness of the wafer to see whether it meets the processing requirements. The existing wafer thickness measurement device is not convenient enough, resulting in low measurement efficiency. CONTENT OF THE INVENTION

[0004] The embodiment of the present application provides a handheld thickness gauge. The wafer is clamped by the upper measuring arm and the lower measuring arm. The two ends of the wafer in the thickness direction are respectively attached to the upper clamping surface and the lower clamping surface. The detection rod of the digital dial micrometer abuts against the upper clamping surface or the lower clamping surface, so as to display the thickness of the wafer. The present application solves the problem that the existing wafer thickness measurement method is not convenient enough, resulting in low measurement efficiency.

[0005] The embodiment of the present application provides a handheld thickness gauge, which comprises:

[0006] The upper measuring arm and the lower measuring arm are oppositely arranged. The upper measuring arm is provided with an upper clamping surface facing the lower measuring arm. The lower measuring arm is provided with a lower clamping surface facing the upper measuring arm. The upper clamping surface is parallel to the lower clamping surface.

[0007] A telescopic member is arranged on the upper measuring arm or the lower measuring arm. The telescopic direction of the telescopic member is perpendicular to the upper clamping surface.

[0008] A digital dial micrometer is arranged on the upper measuring arm or the lower measuring arm. The digital dial micrometer comprises a body and a detection rod. The detection rod is inserted into the body. The extension direction of the detection rod is perpendicular to the upper clamping surface. The detection rod extends between the upper measuring arm and the lower measuring arm. The end of the detection rod abuts against the upper clamping surface or the lower clamping surface.

[0009] In a feasible implementation manner, the handheld thickness gauge further comprises a finger grip.

[0010] The finger grip is fixed to the upper measuring arm on the side opposite to the upper clamping surface;

[0011] Or, the finger grip is fixed to the lower measuring arm on the side opposite to the lower clamping surface.

[0012] In a feasible implementation, the finger grip comprises a grip body and a finger protective sleeve;

[0013] The grip body is fixed to the upper measuring arm or the lower measuring arm, and the finger protective sleeve is arranged on the outer wall of the grip body.

[0014] In a feasible implementation, the handheld thickness gauge further comprises a thumb buckle;

[0015] The thumb buckle is fixed to the lower measuring arm on the side opposite to the lower clamping surface;

[0016] Or, the thumb buckle is fixed to the upper measuring arm on the side opposite to the upper clamping surface.

[0017] In a feasible implementation, the thumb buckle comprises a buckle body and a connecting rod;

[0018] One end of the connecting rod is fixedly connected with the buckle body;

[0019] The upper measuring arm or the lower measuring arm is provided with a connecting hole, and the connecting rod is connected with the connecting hole.

[0020] In a feasible implementation, the thumb buckle comprises a thumb protective sleeve;

[0021] The thumb protective sleeve is arranged on the outer wall of the buckle body.

[0022] In a feasible implementation, the handheld thickness gauge further comprises a clamping assembly;

[0023] The upper measuring arm or the lower measuring arm is provided with a through slot, and the clamping assembly is fixedly arranged in the through slot, and the clamping assembly clamps the body of the digital dial micrometer.

[0024] In a feasible implementation, the clamping assembly comprises a fixed clamping plate, an adjusting clamping plate and an adjusting piece;

[0025] The fixed clamping plate is fixedly arranged on one side of the through slot;

[0026] The adjusting clamping plate is arranged opposite to the fixed clamping plate;

[0027] The adjusting piece is arranged on the other side of the through slot, one end of the adjusting piece is connected with the adjusting clamping plate, and the other end of the adjusting piece is connected with the inner wall of the through slot.

[0028] The fixed clamping plate and the adjusting clamping plate clamp the body of the digital dial micrometer.

[0029] In an available implementation, the adjusting member comprises;

[0030] An inner screw pipe, one end of which is connected with the inner wall of the through slot, and the other end extends to the side of the adjusting clamping plate;

[0031] An outer screw rod screw-connected with the inner screw pipe, the end of the outer screw rod is rotationally connected with the adjusting clamping plate.

[0032] In an available implementation, the hand-held thickness gauge further comprises a bracket;

[0033] The bracket is fixedly arranged on the inner wall of the through slot, the detection rod of the digital dial micrometer penetrates through the bracket, and the outer wall of the body of the digital dial micrometer is attached to the side opposite to the clamping surface of the bracket.

[0034] The hand-held thickness gauge provided by the embodiment of the present application is provided with an upper measuring arm and a lower measuring arm, the opposite surfaces of the upper measuring arm and the lower measuring arm are respectively an upper clamping surface and a lower clamping surface which are parallel to each other, the upper measuring arm and the lower measuring arm are connected through an extension member and can move relative to each other, a digital dial micrometer is arranged on the upper measuring arm or the lower measuring arm, the detection rod of the digital dial micrometer abuts against the upper clamping surface or the lower clamping surface, when detection is performed, the upper clamping surface and the lower clamping surface clamp a wafer, in this process, because the detection rod of the digital dial micrometer vertically abuts against the clamping surface, that is, the digital dial micrometer detects the distance between the upper clamping surface and the lower clamping surface, along with the movement of the measuring arm, the reading of the digital dial micrometer synchronously changes, when the upper clamping surface and the lower clamping surface stably clamp the wafer, the reading of the digital dial micrometer is the thickness of the wafer, thereby realizing convenient and accurate wafer thickness measurement. BRIEF DESCRIPTION OF DRAWINGS

[0035] Figure 1 is a structural schematic diagram of the hand-held thickness gauge provided by the present application;

[0036] Figure 2 is a sectional view of the hand-held thickness gauge;

[0037] Figure 3 is a structural schematic diagram of a thumb bracket;

[0038] Figure 4 is a structural schematic diagram of a clamping assembly;

[0039] Figure 5 is a schematic diagram of a limiting bracket and a connection structure thereof.

[0040] BRIEF DESCRIPTION OF DRAWINGS:

[0041] 10 - upper measuring arm; 20 - lower measuring arm; 30 - telescopic element; 40 - digital dial micrometer; 50 - finger grip; 60 - thumb buckle; 70 - clamping assembly; 80 - carriage;

[0042] 11 - upper clamping surface; 21 - lower clamping surface; 51 - grip body; 52 - finger guard; 61 - buckle body; 62 - connecting rod; 63 - thumb guard; 71 - fixed clamp plate; 72 - adjustable clamp plate; 73 - inner screw tube; 74 - outer screw rod. DETAILED DESCRIPTION

[0043] In order to make the technical personnel in the technical field better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor should be within the scope of protection of the present application.

[0044] The main purposes of wafer thickness measurement are as follows:

[0045] Firstly, to ensure product quality. The thickness of the wafer is one of the key indicators to measure whether it meets the production standards. For example, in semiconductor wafer manufacturing, accurate thickness can ensure the stability of chip performance, because thickness deviation may affect the integration level, signal transmission speed and other performance parameters of electronic components. In the field of optical wafer, appropriate thickness is crucial for the imaging quality of optical elements (such as lenses), and thickness that does not meet the requirements will cause problems such as aberration and chromatic aberration.

[0046] Secondly, for process control. During the wafer processing, measuring the thickness helps to monitor and adjust the production process. For example, through timely measurement of thickness, it can be judged whether the processing process is normal, and then the processing parameters can be optimized to improve production efficiency and reduce the rate of defective products.

[0047] Thirdly, to meet the assembly requirements. When the wafer is applied to various devices (such as integrated circuit boards, optical instruments, etc.), accurate thickness can ensure precise assembly with other components. If the thickness deviates, it may cause assembly difficulties or problems such as looseness, damage, etc. during use.

[0048] The existing wafer thickness measuring device has poor accuracy, is not convenient to use, and has low measuring efficiency. The hand-held thickness gauge provided by the application clamps the wafer by the upper measuring arm 10 and the lower measuring arm 20, the two ends of the wafer thickness direction are respectively attached to the upper clamping surface 11 and the lower clamping surface 21, and the detection rod of the digital dial gauge 40 abuts against the upper clamping surface 11 or the lower clamping surface 21. During detection, the upper clamping surface 11 and the lower clamping surface 21 clamp the wafer, and the digital dial gauge 40 synchronously displays the reading, so that the wafer thickness measurement is convenient and accurate.

[0049] The specific structure of the hand-held thickness gauge provided by the application is described in detail below with reference to the accompanying drawings.

[0050] Referring to Figures 1-5 The embodiment provided by the application is a hand-held thickness gauge, which comprises oppositely arranged upper measuring arms 10 and lower measuring arms 20. The upper measuring arms 10 and the lower measuring arms 20 can each be a cuboid structure with a length of 15 cm, a width of 3 cm, and a height of 2 cm. The upper measuring arms 10 and the lower measuring arms 20 can each be made of PFA material. The upper measuring arms 10 are provided with upper clamping surfaces 11 facing the lower measuring arms 20, and the lower measuring arms 20 are provided with lower clamping surfaces 21 facing the upper measuring arms 10. The upper clamping surfaces 11 and the lower clamping surfaces 21 are both flat surfaces and are parallel to each other.

[0051] The extension member 30 arranged on the upper measuring arm 10 or the lower measuring arm 20 can be a spring or an air cylinder. The extension direction of the extension member 30 is perpendicular to the upper clamping surface 11. One end of the extension direction of the extension member 30 is connected to the upper measuring arm 10, and the other end is connected to the lower measuring arm 20, so that the upper measuring arm 10 and the lower measuring arm 20 can only move up and down relative to each other. The upper clamping surface 11 and the lower clamping surface 21 can be attached to each other. The maximum distance between the upper clamping surface 11 and the lower clamping surface 21 is determined by the maximum extension length of the extension member 30.

[0052] The digital dial gauge 40 arranged on the upper measuring arm 10 or the lower measuring arm 20 comprises a body and a detection rod. The detection rod is inserted into the body. The digital dial gauge 40 is a conventional measuring device, and its specific structure and principle are not described here. The extension direction of the detection rod is perpendicular to the upper clamping surface 11. The detection rod extends between the upper measuring arm 10 and the lower measuring arm 20. The end of the detection rod abuts against the upper clamping surface 11 or the lower clamping surface 21.

[0053] In one embodiment, before detection, the upper clamping surface 11 and the lower clamping surface 21 are attached to each other, the extension member 30 is in a natural state or a stretched state, the digital dial gauge 40 is fixed to the upper measuring arm 10, and the detection rod of the digital dial gauge 40 abuts against the lower clamping surface 21. At this time, the reading of the digital dial gauge 40 is zero.

[0054] In detection, the upper measuring arm 10 and the lower measuring arm 20 are separated, the upper measuring arm 10 and the lower measuring arm 20 move up and down, and the reading of the digital dial gauge 40 changes synchronously. After the upper clamping surface 11 and the lower clamping surface 21 are separated, the wafer to be measured is placed on the lower clamping surface 21, the upper measuring arm 10 is released, the upper measuring arm 10 moves downward, the upper clamping surface 11 and the lower clamping surface 21 clamp the wafer to be measured, and the reading of the digital dial gauge 40 is stable. Thus, the thickness of the wafer to be measured can be obtained.

[0055] In an embodiment, before detection, the telescopic part 30 is in a compressed state, the upper clamping surface 11 and the lower clamping surface 21 are separated, the digital dial gauge 40 is fixed on the upper measuring arm 10, and the detection rod of the digital dial gauge 40 abuts against the lower clamping surface 21. At this time, the reading of the digital dial gauge 40 is the distance between the upper clamping surface 11 and the lower clamping surface 21.

[0056] In detection, the wafer to be measured is placed on the lower clamping surface 21, the upper measuring arm 10 and the lower measuring arm 20 are pressed, the upper measuring arm 10 and the lower measuring arm 20 move downward, the reading of the digital dial gauge 40 changes synchronously, the reading gradually decreases, until the upper clamping surface 11 and the lower clamping surface 21 clamp the wafer to be measured, and the reading of the digital dial gauge 40 is stable. Thus, the thickness of the wafer to be measured can be obtained.

[0057] Referring to Figure 2 In some embodiments, in order to facilitate the taking and use of the thickness gauge, the handheld thickness gauge further comprises a finger grip 50.

[0058] The finger grip 50 is fixed on the side of the upper measuring arm 10 opposite to the upper clamping surface 11.

[0059] Alternatively, the finger grip 50 is fixed on the side of the lower measuring arm 20 opposite to the lower clamping surface 21.

[0060] As shown in Figure 2 The finger grip 50 is fixed on the side of the lower measuring arm 20 opposite to the lower clamping surface 21, that is, on the lower surface of the lower measuring arm 20. In order to further facilitate the use, the digital dial gauge 40 and the finger grip 50 are staggered left and right, as shown in Figure 1 and Figure 2 The digital dial gauge 40 is located on the left side of the whole handheld thickness gauge, and the finger grip 50 is located on the right side of the whole handheld thickness gauge.

[0061] Specifically, the finger grip 50 comprises a grip main body 51 and a finger protection sleeve 52.

[0062] The grip main body 51 is in a U-shaped structure, the grip main body 51 is fixed on the upper measuring arm 10 or the lower measuring arm 20, the finger protection sleeve 52 can be made of rubber, and the finger protection sleeve 52 is arranged on the outer wall of the grip main body 51.

[0063] Referring to Figure 2 and Figure 3 In some embodiments, in order to facilitate one-handed operation, facilitate the separation of the upper measuring arm 10 and the lower measuring arm 20, the handheld thickness gauge further comprises a thumb buckle 60;

[0064] The thumb buckle 60 is fixedly arranged on the side of the lower measuring arm 20 opposite to the lower clamping surface 21;

[0065] Alternatively, the thumb buckle 60 is fixedly arranged on the side of the upper measuring arm 10 opposite to the upper clamping surface 11.

[0066] In Figure 2 , the finger grip 50 is fixedly arranged on the lower surface of the lower measuring arm 20, and the thumb buckle 60 is fixedly arranged on the upper surface of the lower measuring arm 20. When in use, the user's left or right thumb is inserted into the thumb buckle 60, and the remaining fingers are inserted into the finger grip 50, so that the upper measuring arm 10 and the lower measuring arm 20 can be separated or closed by one hand.

[0067] Specifically, the thumb buckle 60 comprises a buckle body 61 and a connecting rod 62;

[0068] One end of the connecting rod 62 is fixedly connected with the buckle body 61;

[0069] The upper measuring arm 10 or the lower measuring arm 20 is provided with a connecting hole, and the connecting rod 62 is connected with the connecting hole;

[0070] As shown in Figure 2 and Figure 3 , the buckle body 61 is in a U-shaped structure, and the connecting rod 62 can be an external screw rod. The top end of the external screw rod is fixedly connected with the buckle body 61. The upper surface of the upper measuring arm 10 is provided with a connecting hole, which can be an internal screw hole. The connecting rod 62 is screwed with the connecting hole, so that the thumb buckle 60 is fixed on the upper measuring arm 10;

[0071] Further, in order to facilitate the use of left and right hands, two connecting holes are provided, and the two connecting holes are mirror images relative to the center of the finger grip 50. When in use, the user can adjust the position of the thumb buckle 60 according to personal habits.

[0072] The thumb buckle 60 comprises a thumb protective sleeve 63;

[0073] The thumb protective sleeve 63 can be made of rubber material, and the thumb protective sleeve 63 is arranged on the outer wall of the buckle body 61.

[0074] Referring to Figure 4 and Figure 5 , Figure 5In some embodiments, the handheld thickness gauge further comprises a clamping assembly 70 clamping the body of the digital dial gauge 40, so that the digital dial gauge 40 is fixed on the upper measuring arm 10 or the lower measuring arm 20;

[0075] The upper measuring arm 10 or the lower measuring arm 20 is provided with a through slot, and the clamping assembly 70 is fixedly arranged in the through slot and clamps the body of the digital dial gauge 40;

[0076] As shown in Figure 4 , the upper measuring arm 10 is provided with a through slot, which can be a rectangular slot body, the through slot penetrates the upper measuring arm 10 from top to bottom, the clamping assembly 70 is fixedly arranged in the through slot, the clamping assembly 70 clamps the body A of the digital dial gauge 40, and the detection rod B of the digital dial gauge 40 extends out of the through slot and abuts against the lower clamping surface 21.

[0077] Specifically, as shown in Figure 4 , the clamping assembly 70 comprises;

[0078] A fixed clamping plate 71 fixedly arranged on one side of the through slot, the fixed clamping plate 71 can be fixedly arranged on the left side of the through slot, since the body of the digital dial gauge 40 can be regarded as a cylindrical body, the fixed clamping plate 71 is an arc-shaped clamping plate, which can be a 1 / 2 cylindrical body, and the width of the through slot matches the width of the arc-shaped clamping plate;

[0079] An adjusting clamping plate 72 arranged opposite to the fixed clamping plate 71, the adjusting clamping plate 72 has the same structure as the fixed clamping plate 71 and is arranged in mirror image;

[0080] An adjusting member arranged on the other side of the through slot, one end of the adjusting member is connected with the adjusting clamping plate 72, and the other end of the adjusting member is connected with the inner wall of the through slot;

[0081] The adjusting member can make the adjusting clamping plate 72 move horizontally in the through slot, close the distance between the adjusting clamping plate 72 and the fixed clamping plate 71, and make the fixed clamping plate 71 and the adjusting clamping plate 72 clamp the body of the digital dial gauge 40, so that the digital dial gauge 40 is fixed.

[0082] In some embodiments, the adjusting member comprises an inner screw pipe 73 and an outer screw rod 74;

[0083] The inner screw pipe 73 is a pipe body with internal threads on the inner wall, the inner screw pipe 73 is arranged horizontally, the right end of the inner screw pipe 73 is connected with the right inner wall of the through slot, and the left end extends to the side of the adjusting clamping plate 72;

[0084] The outer screw rod 74 is screwed with the inner screw pipe 73, the left end of the outer screw rod 74 is rotationally connected with the adjusting clamping plate 72, and the outer screw rod 74 is provided with an anti-skid rotating ring to facilitate the rotation of the outer screw rod 74;

[0085] The front and back ends of the adjusting clamping plate 72 are in sliding connection with the inner wall of the through slot, and the right outer wall of the adjusting clamping plate 72 is in rotating connection with the transversely extending outer screw 74, so that the adjusting clamping plate 72 can only move transversely left and right in the through slot;

[0086] When the outer screw 74 is rotated clockwise, the outer screw 74 drives the adjusting clamping plate 72 to move leftward, so that the fixed clamping plate 71 and the adjusting clamping plate 72 are conveniently attached to the left and right sides of the body of the digital dial gauge 40, the digital dial gauge 40 is clamped, and the digital dial gauge 40 is fixed; when the outer screw 74 is rotated counterclockwise, the outer screw 74 drives the adjusting clamping plate 72 to move rightward, thereby releasing the digital dial gauge 40.

[0087] Referring to Figure 4 and Figure 5 It is shown that, in some embodiments, the handheld thickness gauge further comprises a bracket 80;

[0088] The bracket 80 is fixedly arranged on the inner wall of the through slot, and the bracket 80 is horizontally arranged. The middle part of the bracket 80 is provided with a rectangular slot body, the width of the rectangular slot body is in clearance fit with the diameter of the detection rod of the digital dial gauge 40. After the digital dial gauge 40 is placed in the through slot, the detection rod of the digital dial gauge 40 penetrates through the bracket 80, and the outer wall of the body of the digital dial gauge 40 is attached to the side of the bracket 80 which is opposite to the clamping surface, and then is fixed by the clamping assembly 70, so as to conveniently determine the height position of the digital dial gauge 40 on the upper measuring arm 10.

[0089] The handheld thickness gauge provided by the present application is provided with the upper measuring arm 10 and the lower measuring arm 20 which are oppositely arranged. The opposite surfaces of the upper measuring arm 10 and the lower measuring arm 20 are respectively the parallel upper clamping surface 11 and the lower clamping surface 21. The upper measuring arm 10 and the lower measuring arm 20 are connected by the telescopic member 30 and can move relatively. The digital dial gauge 40 is arranged on the upper measuring arm 10 or the lower measuring arm 20. The detection rod of the digital dial gauge 40 abuts against the upper clamping surface 11 or the lower clamping surface 21. During detection, the upper clamping surface 11 and the lower clamping surface 21 clamp the wafer, and the digital dial gauge 40 synchronously displays the reading, so as to realize convenient and accurate wafer thickness measurement.

[0090] It is easy to understand that, on the basis of the several embodiments provided by the present application, the skilled in the art can combine, split, recombine, etc. the embodiments of the present application to obtain other embodiments, and these embodiments do not exceed the protection scope of the present application.

[0091] The above specific embodiments have further detailed the purposes, technical solutions and beneficial effects of the embodiments of the present application. It should be understood that the above is only the specific implementation of the embodiments of the present application, and is not used to limit the protection scope of the embodiments of the present application. Any modification, equivalent replacement, improvement, etc. made on the basis of the technical solutions of the embodiments of the present application shall be included in the protection scope of the embodiments of the present application.

Claims

1. A hand-held thickness gauge characterized by: The hand-held thickness gauge comprises: upper and lower measuring arms (10, 20) arranged oppositely, wherein the upper measuring arm (10) is provided with an upper clamping surface (11) facing the lower measuring arm (20), and the lower measuring arm (20) is provided with a lower clamping surface (21) facing the upper measuring arm (10), and the upper clamping surface (11) is parallel to the lower clamping surface (21); a telescopic member (30) arranged on the upper measuring arm (10) or the lower measuring arm (20), wherein the telescopic direction of the telescopic member (30) is perpendicular to the upper clamping surface (11); a digital dial micrometer (40) arranged on the upper measuring arm (10) or the lower measuring arm (20), wherein the digital dial micrometer (40) comprises a body and a detection rod, the detection rod is inserted into the body, the extension direction of the detection rod is perpendicular to the upper clamping surface (11), the detection rod extends between the upper measuring arm (10) and the lower measuring arm (20), and the end of the detection rod abuts against the upper clamping surface (11) or the lower clamping surface (21).

2. The hand-held thickness gauge according to claim 1, wherein: the hand-held thickness gauge further comprises a finger grip (50); the finger grip (50) is fixedly arranged on the side of the upper measuring arm (10) facing away from the upper clamping surface (11); or, the finger grip (50) is fixedly arranged on the side of the lower measuring arm (20) facing away from the lower clamping surface (21).

3. The hand-held thickness gauge according to claim 2, wherein: the finger grip (50) comprises a grip body (51) and a finger protection sleeve (52); the grip body (51) is fixedly arranged on the upper measuring arm (10) or the lower measuring arm (20), and the finger protection sleeve (52) is arranged on the outer wall of the grip body (51).

4. The hand-held thickness gauge according to claim 1, wherein: the hand-held thickness gauge further comprises a thumb buckle (60); the thumb buckle (60) is fixedly arranged on the side of the lower measuring arm (20) facing away from the lower clamping surface (21); or, the thumb buckle (60) is fixedly arranged on the side of the upper measuring arm (10) facing away from the upper clamping surface (11).

5. The hand-held thickness gauge according to claim 4, wherein: the thumb buckle (60) comprises a buckle body (61) and a connecting rod (62); one end of the connecting rod (62) is fixedly connected with the buckle body (61); the upper measuring arm (10) or the lower measuring arm (20) is provided with a connecting hole, and the connecting rod (62) is connected with the connecting hole.

6. The hand-held thickness gauge according to claim 5, wherein: the thumb buckle (60) comprises a thumb protection sleeve (63); the thumb protection sleeve (63) is arranged on the outer wall of the buckle body (61).

7. The hand-held thickness gauge according to claim 1, wherein: the hand-held thickness gauge further comprises a clamping assembly (70). The upper measuring arm (10) or the lower measuring arm (20) is provided with a through slot, and the clamping assembly (70) is fixedly arranged in the through slot, and the clamping assembly (70) clamps the body of the digital dial micrometer (40).

8. The handheld thickness gauge according to claim 7, characterized in that: The clamping assembly (70) comprises a fixed clamping plate (71), an adjusting clamping plate (72) and an adjusting member; The fixed clamping plate (71) is fixedly arranged on one side of the through slot; The adjusting clamping plate (72) is arranged opposite to the fixed clamping plate (71); The adjusting member is arranged on the other side of the through slot, one end of the adjusting member is connected with the adjusting clamping plate (72), and the other end of the adjusting member is connected with the inner wall of the through slot; The fixed clamping plate (71) and the adjusting clamping plate (72) clamp the body of the digital dial micrometer (40).

9. The handheld thickness gauge according to claim 8, characterized in that: The adjusting member comprises: An inner screw pipe (73), one end of the inner screw pipe (73) is connected with the inner wall of the through slot, and the other end extends to the side of the adjusting clamping plate (72); An outer screw rod (74) is screwed with the inner screw pipe (73), and the end of the outer screw rod (74) is rotatably connected with the adjusting clamping plate (72).

10. The handheld thickness gauge according to any one of claims 7-9, characterized in that: The handheld thickness gauge further comprises a bracket (80); The bracket (80) is fixedly arranged on the inner wall of the through slot, the detection rod of the digital dial micrometer (40) penetrates through the bracket (80), and the outer wall of the body of the digital dial micrometer (40) is attached to the side of the bracket (80) which is opposite to the clamping surface.