Automatic dotting test system
The automated dot-matrix testing system automatically detects the DI, DO, AI, and AO signals of industrial control cabinets, solving the problem of low efficiency caused by multiple operators and enabling one person to complete the test, saving costs and improving accuracy.
Patent Information
- Application Number
- CN202422923624.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-28
- Publication Date
- 2025-12-05
- Estimated Expiration
- 2034-11-28
AI Technical Summary
The current industrial control cabinet factory testing requires multiple operators, which is inefficient and susceptible to human error, resulting in high labor and time costs.
Design an automatic dot-marking test system, including a test bench, a control host and a signal generator, capable of automatically testing DI, DO, AI and AO signals, achieving automated detection through a programmable logic controller and a signal analysis unit, and automatically generating reports.
This allows one person to complete the test, saving manpower and time, reducing the risk of human error, and improving testing efficiency and accuracy.
Smart Images
Figure CN223637622U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to automatic dotting test system, especially for the automatic dotting test system of factory detection of industrial control cabinet. BACKGROUND
[0002] Industrial control cabinet needs to be qualified before delivery, including digital signal input output (DI, DO) test, analog signal input output (AI, AO) test.
[0003] The existing factory qualified detection is generally detected manually, and usually needs more than two operators to cooperate and operate, and the test procedure is limited by manual operation efficiency, consumes manpower cost and also consumes more time cost. And, the operators need to manually record various test results of the control cabinet after testing, and the process of testing or recording is inevitably affected by human error rate.
[0004] Therefore, a factory detection scheme with low manpower demand and high efficiency is the current technical problem to be solved in the field of industrial control cabinet production. UTILITY MODEL CONTENT
[0005] The utility model discloses a kind of automatic dotting test systems for factory detection of industrial control cabinet, DI, DO, AI, AO signal in industrial control cabinet can be automatically tested, only one person can operate to point measure, save manpower and time, and automatically generate the status report of control cabinet. It includes a test table and a control host, the test table is connected with the control host by data line, the control host has input output device;The test table further includes test signal generator, IO interface and test signal line, the test signal generator is connected with the control host by the data line, to accept the control signal from the control host.
[0006] Preferably, the test signal generator is programmable logic controller, the control signal interface of the programmable logic controller is connected with the control host by data line, the programmable logic controller is electrically connected with the IO interface, and is configured to can receive and send preset digital test signal and analog test signal.
[0007] Preferably, the IO interface of the test table is quick connector, the first end of the test signal line is matched with the quick connector, and the second end is provided with plug-in structure matched with the signal interface of the industrial control cabinet to be tested.
[0008] Preferably, the test bench further comprises a signal analysis unit, which comprises a reference index storage unit and a test index storage unit, the reference index storage unit is configured to store the parameters of the test signals sent by the test signal generator, and the test index storage unit is configured to store the parameters of the feedback signals received from the industrial control cabinet to be tested, and the signal analysis unit is configured to compare the parameters stored in the test index storage unit with the parameters stored in the reference index storage unit.
[0009] Preferably, the test signal generator is configured to send a digital pulse signal, the reference index storage unit stores the number of times of sending the digital pulse signal, and the test index storage unit stores the digital pulse count result received from the industrial control cabinet to be tested.
[0010] Preferably, the test signal generator is configured to send an analog signal, the reference index storage unit stores the current amplitude parameter of the analog signal, and the test index storage unit stores the current signal amplitude parameter received from the industrial control cabinet to be tested. The signal analysis unit further comprises an analog-to-digital converter configured to convert the current signal received from the industrial control cabinet to be tested into a digital signal current signal amplitude parameter. BRIEF DESCRIPTION OF DRAWINGS
[0011] Figure 1 is a schematic structural diagram of an automatic dotting test system module according to an embodiment of the present application;
[0012] Figure 2 is a schematic structural diagram of an automatic dotting test system module according to an embodiment of the present application; Figure 1 is a schematic diagram of a signal analysis unit module in the embodiment.
[0013] REFERENCE NUMERALS
[0014] 10 control host
[0015] 11 input and output device
[0016] 12 data line
[0017] 20 test bench
[0018] 21 test signal generator
[0019] 211 control signal interface
[0020] 22 IO interface
[0021] 23 signal analysis unit
[0022] 231 reference index storage unit
[0023] 232 test index storage unit
[0024] 233 analog-digital converter
[0025] 24 test signal line
[0026] 241 first end
[0027] 242 second end DETAILED DESCRIPTION
[0028] The specific embodiments of the utility model are described below in combination with the drawings.
[0029] Figure 1 An automatic dot test system is shown, which comprises a test table 20 and a control host 10, the test table 20 and the control host 10 are connected through a data line 12, the data line 12 in the embodiment is a data cable, and in fact, according to the needs of the application scene, it can also be connected through a wireless communication line. The control host 10 can be a computer, a tablet computer or a similar computing device, which has an input and output device 11, such as a keyboard, a liquid crystal screen and a touch display screen, etc., for the operator to input corresponding operation instructions or run specific tool software.
[0030] The test table 20 comprises a box body, a test signal generator 21 arranged in the box body, an IO interface 22 arranged on the wall of the box body, and a test signal line 24 connected between the IO interface 22 and the industrial control cabinet to be tested. The test signal generator 21 is connected with the control host 10 through the data line 12, and the signal sent by the control host 10 can be received by the test signal generator 21 through the data line 12. The test signal generator 21 in the embodiment is a programmable logic controller, which comprises a control signal interface 211 connected with the control host 10, and the signal sent by the control host 10 is directly received by the control signal interface 211; the output signal port of the programmable logic controller is electrically connected with the IO interface 22 (the connection line is not shown in the figure), and the test signal line 24 is connected between the IO interface 22 and the industrial control cabinet to be tested. Figure 1The test signal generator 21 can send preset digital test signals or analog test signals to the IO interface 22 according to the instructions of the control host 10, and the preset digital test signals or analog test signals are sent to the industrial control cabinet to be tested through the test signal line 24. In the embodiment, the IO interface 22 adopts a quick connector, and the first end 241 of the test signal line 24 is also a quick connector structure matched therewith, so that the plug-in connection can be conveniently performed. The second end 242 of the test signal line 24 is a plug structure matched with the signal interface of the industrial control cabinet to be tested, and can also be a quick connector structure or other matched plug structure according to the signal interface of the industrial control cabinet to be tested.
[0031] The automatic dot test system of the embodiment further comprises a signal analysis unit 23 which is also arranged in the box and is electrically connected with the test signal generator 21 and the IO interface 22, and is used for comparing the signal sent by the test signal generator 21 with the feedback signal of the industrial control cabinet to be tested, so as to determine whether the receiving and transmitting functions of the industrial control cabinet to be tested for digital and analog signals are normal according to the comparison result.
[0032] Figure 2 The module structure of the signal analysis unit 23 is shown, which comprises a reference index storage unit 231 and a test index storage unit 232, and further comprises an analog-digital converter 233, wherein the parameters of the test signal received by the signal analysis unit 23 from the test signal generator 21 are stored in the reference index storage unit 231, and the parameters of the feedback signal received by the signal analysis unit 23 from the industrial control cabinet to be tested are stored in the test index storage unit 232.
[0033] When the test signal generator 21 generates a digital pulse signal under the instruction control of the control host 10, the number of times of sending the digital pulse signal is stored in the reference index storage unit 231, and the industrial control cabinet to be tested counts the received digital pulse signal and feeds back the final technical result to the signal analysis unit 23 and stores the result in the test index storage unit 232. The signal analysis unit 23 compares the number of times stored in the reference index storage unit 231 with the number of times stored in the test index storage unit 232, and if the two data are consistent, it can be determined that the receiving and transmitting functions of the industrial control cabinet to be tested for digital signals are perfect.
[0034] When the test signal generator 21 generates an analog signal under the instruction control of the control host 10, the reference index storage unit 231 stores the current amplitude parameter of the analog signal, the industrial control cabinet under test records the received current signal amplitude parameter after receiving the analog signal, and feeds back the recorded result to the signal analysis unit 23, the analog-digital converter 233 performs analog-digital conversion on the feedback signal, converts it into a digitized parameter, and stores it in the test index storage unit 232. The signal analysis unit 23 compares the parameters stored in the reference index storage unit 231 and the parameters in the test index storage unit 232, and if the two data are consistent, it can be judged that the analog signal transceiving function of the industrial control cabinet under test is perfect.
[0035] The signal analysis unit 23 feeds back the detection result to the control host 10 through the data line 12 after completing the data comparison, and the output device of the control host 10 can intuitively display the result to the operator. At the same time, the control host 10 can also summarize several detection results to form a detection report file.
[0036] When the industrial control cabinet is detected, only the second end 242 of the test signal line 24 needs to be plugged with the industrial control cabinet under test to realize electrical connection, and then the project instruction to be detected is input through the keyboard or touch screen of the control host 10, so that the automatic dotting test system can help the operator to complete the detection. Moreover, the operator does not need to copy the detection result after completing each detection, but can only operate the detection report file through the control host 10 when the detection result needs to be consulted.
[0037] Although the content of the utility model has been described in detail through the above preferred embodiments, it should be recognized that the above description should not be considered as a limitation of the utility model. After reading the above content, various modifications and substitutions of the utility model will be obvious to those skilled in the art. Therefore, the protection scope of the utility model should be limited by the attached claims. Moreover, any figure mark in the claims should not be considered as a limitation of the involved claims. The word "comprising" does not exclude other claims or devices or steps not listed in the specification; the words "first", "second", etc. are only used to represent the name, and do not represent any specific order. In this text, "parallel", "vertical", etc. are not strictly limited in the mathematical and / or geometric sense, but also include the errors allowed by those skilled in the art in manufacturing or use, etc.
Claims
1. An automatic dotting test system for factory testing of industrial control cabinets, characterized in that, The test bench (20) is connected with the control host (10) through a data line (12), The control host (10) has an input / output device (11); The test bench (20) further comprises a test signal generator (21), an IO interface (22) and a test signal line (24), the test signal generator (21) is connected with the control host (10) through the data line (12) to receive control signals from the control host (10).
2. The automatic dotting test system of claim 1, wherein, The test signal generator (21) is a programmable logic controller, the control signal interface (211) of the programmable logic controller is connected with the control host (10) through the data line (12), and the programmable logic controller is electrically connected with the IO interface (22) and is configured to transmit and receive preset digital test signals and analog test signals.
3. The automatic dotting test system of claim 2, wherein, The IO interface (22) of the test bench (20) is a quick connector, and the first end (241) of the test signal line (24) is matched with the quick connector.
4. The automatic dotting test system of claim 3, wherein, The second end (242) of the test signal line (24) is provided with a plug structure matched with the signal interface of the industrial control cabinet to be tested.
5. The automatic dotting test system of claim 4, wherein, The test bench (20) further comprises a signal analysis unit (23), the signal analysis unit (23) further comprises a reference index storage unit (231) and a test index storage unit (232), the reference index storage unit (231) is used to save parameters of test signals sent by the test signal generator (21), and the test index storage unit (232) is used to save parameters of feedback signals received from the industrial control cabinet to be tested, and the signal analysis unit (23) is configured to compare the saved parameters in the test index storage unit (232) with the saved parameters in the reference index storage unit (231).
6. The automatic dotting test system of claim 5, wherein, The test signal generator (21) is configured to send a digital pulse signal, the reference index storage unit (231) saves the number of times of sending the digital pulse signal, and the test index storage unit (232) saves a digital pulse count result received from the industrial control cabinet to be tested.
7. The automatic dotting test system of claim 5, wherein, The test signal generator (21) is configured to send an analog signal, the reference index storage unit (231) saves a current amplitude parameter of the analog signal, and the test index storage unit (232) saves a current signal amplitude parameter received from the industrial control cabinet to be tested.
8. The automatic dotting test system of claim 7, wherein, The signal analysis unit (23) further comprises an analog-to-digital converter (233) configured to convert a current signal of a digital signal received from the industrial control cabinet to be tested into a current signal amplitude parameter.