Test board for integrated circuit

The design of the detachable fixture base adapts to integrated circuits of different sizes, solving the problem of poor fixture base versatility and achieving cost reduction and improved testing quality.

CN223650683UActive Publication Date: 2025-12-09GUANGDONG FOXIN TECH CO LTD
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Patent Information

Application Number
CN202423127389.4
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-12-18
Publication Date
2025-12-09
Estimated Expiration
2034-12-18

AI Technical Summary

Technical Problem

Existing test board fixtures for integrated circuits have poor versatility, resulting in high development costs and long development cycles.

Method used

A detachable fixture is designed, including a frame, an integrated circuit tray, lateral and longitudinal positioning components, and a probe holder. The fixture can be adjusted by moving and positioning components to accommodate integrated circuits of different sizes, ensuring that the integrated circuits are fixed in position during testing.

Benefits of technology

This reduces the development cost of the fixture and improves the ease of operation and quality of testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a test board for an integrated circuit, which comprises a test board body, a jig seat is detachably arranged on the test board body, the jig seat comprises a frame, an integrated circuit supporting plate is fixedly arranged in the frame, two transverse positioning assemblies are symmetrically arranged on the supporting plate, and the two transverse positioning assemblies are fixedly arranged on the frame. The device further comprises two longitudinal positioning assemblies which are symmetrically arranged, the longitudinal positioning assemblies are fixedly installed on the cross arms, a moving assembly used for driving the two cross arms to be close to or away from each other is installed in the frame, probe seats are detachably installed on the cross arms, and probes are fixedly installed on the probe seats. The test board for the integrated circuit has the advantages that the cost can be reduced, the jig seat can be adjusted according to the size of the integrated circuit, and the operation is simple.
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Description

Technical Field

[0001] This utility model relates to the field of circuit testing technology, and in particular to a test board for integrated circuits. Background Technology

[0002] An integrated circuit is a miniature structure that integrates a certain number of commonly used electronic components, such as resistors, capacitors, transistors, and the interconnections between these components, into a single package. This miniature structure has the required circuit function and is a circuit with a specific function that is integrated together using semiconductor technology.

[0003] Currently, test boards used for integrated circuits have fixtures for positioning the integrated circuits. These fixtures can only be designed to mimic the shape of the integrated circuits, resulting in poor versatility, high development costs, and long development cycles, which in turn increases the cost of the integrated circuit test boards. Summary of the Invention

[0004] In view of the shortcomings of the prior art, the technical problem to be solved by this patent application is how to provide a test board for integrated circuits that can reduce costs, has a fixture base that can be adjusted according to the size of integrated circuits, and is easy to operate.

[0005] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0006] A test board for integrated circuits includes a test board body, a fixture base detachably mounted on the test board body, the fixture base including a frame, an integrated circuit tray fixedly mounted within the frame, two symmetrically mounted lateral positioning components on the tray, and two symmetrically arranged longitudinal positioning components fixedly mounted on a horizontal arm, the longitudinal positioning components being fixedly mounted on a horizontal arm, a moving component for moving the two horizontal arms closer to or further apart being mounted within the frame, a probe holder detachably mounted on the horizontal arm, and a probe fixedly mounted on the probe holder.

[0007] In this design, the test board body and probe holders are tailored for integrated circuits. The lower ends of the probes on the probe holders contact the test contacts on the test board body, while the upper ends of the probes on the probe holders contact the pins of the integrated circuit. The fixture base is equipped with an integrated circuit support plate to support the integrated circuit. Before testing, the positions of the horizontal and vertical positioning components are adjusted to form a positioning area for positioning the integrated circuit. The integrated circuit is placed on the integrated circuit support plate in the positioning area, and the pins contact the probes. Then, a pressure head on the test stage applies downward pressure to the integrated circuit, ensuring its position remains fixed during testing and guaranteeing testing quality. The test board body is placed on the test stage.

[0008] Two internal thread seats are fixedly installed on both sides of the frame. The test plate body is provided with a clearance hole through the internal thread hole of the internal thread seat. The screw passes through the clearance hole and is connected to the internal thread seat.

[0009] The lateral positioning component includes a clamping plate with a slot for sliding engagement with an integrated circuit tray. A fixing plate is fixedly mounted on the clamping plate, located above the integrated circuit tray. A movable plate is positioned below the integrated circuit tray, directly opposite the fixing plate. A nut is fixed to the lower end of the movable plate. Through holes are provided in the internal threaded holes of both the fixing plate and the movable plate, directly opposite the nut. A sliding groove is provided on the integrated circuit tray. Bolts pass through the through holes and sliding grooves on the fixing plate and the through holes on the movable plate and are connected to the nut.

[0010] The longitudinal positioning component includes a positioning plate and a vertical plate fixedly mounted on the cross arm. The positioning plate is fixedly mounted with two guide rods. The vertical plate has a through hole that slides with the guide rods. The positioning plate is connected to a screw rod via a bearing. The vertical plate has a threaded hole that is threadedly connected to the screw rod. An end block is fixed to the end of the screw rod away from the positioning plate.

[0011] The movable component includes a guide rod and a bidirectional lead screw. The threads on the bidirectional lead screw rotate in opposite directions from the middle to both ends. Both ends of the guide rod are fixedly installed in the frame. The lead screw is connected to the frame through bearings, and one end of the lead screw passes through the frame and is fixed with a handle. One end of the cross arm has a sliding hole that slides with the guide rod, and the other end of the cross arm is fixed with a nut block that can be threadedly connected to the bidirectional lead screw. The two cross arms respectively cooperate with the two ends of the bidirectional lead screw.

[0012] The probe holder has a locking block fixed to its outer end, and the cross arm has a locking slot for engaging with the locking block. The locking block and the cross arm are provided with threaded holes facing each other, and the locking block and the cross arm are connected by bolts.

[0013] In summary, this test board for integrated circuits has the advantages of reducing costs, allowing the fixture to be adjusted according to the size of the integrated circuit, and being easy to operate. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the structure of a test board for integrated circuits according to the present invention.

[0015] Figure 2 for Figure 1 A diagram showing the test board itself removed.

[0016] Figure 3 for Figure 2 A diagram showing another location.

[0017] Figure 4This is a schematic diagram of the lateral positioning component.

[0018] Figure 5 This is a schematic diagram of the longitudinal positioning assembly, the cross arm, and the probe holder. Detailed Implementation

[0019] The present invention will now be described in further detail with reference to the accompanying drawings. In the description of the present invention, it should be understood that directional terms such as "upper," "lower," "top," and "bottom" indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings. These terms are used only for the convenience of describing the present invention and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as limiting the scope of protection of the present invention. The directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0020] like Figure 1-5 As shown, a test board for integrated circuits includes a test board body 1, a fixture base 2 detachably mounted on the test board body, the fixture base including a frame 3, an integrated circuit tray 4 fixedly mounted within the frame, two symmetrically mounted transverse positioning components on the tray, and two symmetrically arranged longitudinal positioning components, the longitudinal positioning components being fixedly mounted on a transverse arm 5, a moving component for moving the two transverse arms closer to or further away from each other being mounted within the frame, a probe holder 6 detachably mounted on the transverse arm, and a probe being fixedly mounted on the probe holder.

[0021] In this way, the test board body and probe holder are designed for integrated circuits. The lower end of the probe on the probe holder contacts the test contact on the test board body, and the upper end of the probe on the probe holder contacts the pins of the integrated circuit. The fixture base is equipped with an integrated circuit support plate to support the integrated circuit 7. Before testing, the positions of the horizontal and vertical positioning components are adjusted to form a positioning area for positioning the integrated circuit. The integrated circuit is placed on the integrated circuit support plate in the positioning area, and the pins contact the probes. Then, the pressure head on the test stage applies downward pressure to the integrated circuit, so that the position of the integrated circuit is fixed during the test and will not move, ensuring the test quality. The test board body is placed on the test stage.

[0022] During implementation, two internal thread seats 8 are fixedly installed on both sides of the frame. The test plate body has a clearance hole through the internal thread hole of the internal thread seat, and the screw passes through the clearance hole and connects to the internal thread seat. This facilitates the installation of the frame.

[0023] In implementation, the lateral positioning component includes a clamping plate 9, which has a slot for sliding engagement with the integrated circuit tray. A fixing plate 10 is fixedly installed on the clamping plate, which is located above the integrated circuit tray. A movable plate 11 is provided below the integrated circuit tray, directly opposite the fixing plate. A nut 12 is fixed at the lower end of the movable plate. Through holes are provided in the internal threaded holes of the fixing plate and the movable plate opposite the nut. A sliding groove 13 is provided on the integrated circuit tray. A bolt 14 passes through the through holes and sliding groove on the fixing plate and the through holes on the movable plate and is connected to the nut.

[0024] The bayonet design allows the card plate to be locked onto the outside of the integrated circuit tray and slide on the outside of the integrated circuit tray. When it slides into place, the bolt passes through the through hole and groove on the fixed plate and the through hole on the movable plate and connects with the nut, so that the movable plate abuts and presses against the integrated circuit tray, fixing the position of the card plate. The surfaces of the two card plates facing each other are the positioning surfaces used for positioning the integrated circuit.

[0025] In implementation, the longitudinal positioning assembly includes a positioning plate 15 and a vertical plate 16 fixedly mounted on the cross arm. Two guide rods 17 are fixedly mounted on the vertical plate. The vertical plate has guide holes that slide with the guide rods. A screw 18 is connected to the positioning plate via a bearing. The vertical plate has threaded holes that connect with the screw via threads. An end block 19 is fixed to the end of the screw away from the positioning plate. Rotating the end block drives the screw to rotate, and under the guidance of the guide rods, the positioning plate can move. The surfaces of the two positioning plates facing each other are positioning surfaces used for positioning integrated circuits.

[0026] By setting up horizontal and vertical positioning components, a rectangular positioning area is formed to locate the four directions of the integrated circuit, thereby improving the reliability of the test results.

[0027] In implementation, the moving assembly includes a guide rod 20 and a bidirectional lead screw 21. The threads on the bidirectional lead screw rotate in opposite directions from the middle to both ends. Both ends of the guide rod are fixedly installed within a frame. The lead screw is connected to the frame via bearings, and one end of the lead screw passes through the frame and is fixed with a handle 22. One end of the cross arm has a sliding hole that slides with the guide rod, and the other end of the cross arm is fixed with a nut block that can be threadedly connected to the bidirectional lead screw. The two cross arms respectively engage with the two ends of the bidirectional lead screw. Rotating the handle drives the bidirectional lead screw to rotate, which is guided by the guide rod, causing the two cross arms to move closer or further apart, facilitating quick adjustment of the distance between the two cross arms, and thus adjusting the distance between the two longitudinal positioning components.

[0028] In practice, a locking block 23 is fixed to the outer end of the probe holder, and a locking slot is provided on the cross arm to engage with the locking block. Threaded holes are provided opposite to the locking block and the cross arm, and the locking block and the cross arm are connected by bolts. This facilitates the replacement of the probe holder.

[0029] Finally, it should be noted that those skilled in the art can make various modifications and variations to this utility model without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims and their equivalents, this utility model also intends to include these modifications and variations.

Claims

1. A test board for integrated circuits, comprising a test board body (1), characterized in that, A fixture base (2) is detachably mounted on the test board body. The fixture base includes a frame (3). An integrated circuit tray (4) is fixedly mounted inside the frame. Two lateral positioning components are symmetrically mounted on the tray. It also includes two symmetrically arranged longitudinal positioning components. The longitudinal positioning components are fixedly mounted on the cross arm (5). A moving component for moving the two cross arms closer to or further away from each other is installed inside the frame. A probe holder (6) is detachably mounted on the cross arm. A probe is fixedly mounted on the probe holder.

2. A test board for integrated circuits according to claim 1, characterized in that, Two internal thread seats (8) are fixedly installed on both sides of the frame. The test plate body is provided with a relief hole through the internal thread hole of the internal thread seat. The screw passes through the relief hole and is connected to the internal thread seat.

3. A test board for integrated circuits according to claim 2, characterized in that, The lateral positioning component includes a clamping plate (9), which has a slot that slides with the integrated circuit tray. A fixing plate (10) is fixedly installed on the clamping plate. The fixing plate is located above the integrated circuit tray. A movable plate (11) is provided below the integrated circuit tray and directly opposite the fixing plate. A nut (12) is fixed at the lower end of the movable plate. Both the fixing plate and the movable plate have through holes in their internal threaded holes opposite the nut. A sliding groove (13) is provided on the integrated circuit tray. A bolt (14) passes through the through hole and the sliding groove on the fixing plate and the through hole on the movable plate and is connected to the nut.

4. A test board for integrated circuits according to claim 3, characterized in that, The longitudinal positioning assembly includes a positioning plate (15) and a vertical plate (16) fixedly mounted on the cross arm. The vertical plate is fixedly mounted with two guide rods (17). The vertical plate is provided with a guide hole that slides with the guide rod. The positioning plate is connected to a screw (18) through a bearing. The vertical plate is provided with a threaded hole that is threadedly connected to the screw. An end block (19) is fixed at the end of the screw away from the positioning plate.

5. A test board for integrated circuits according to claim 4, characterized in that, The moving component includes a guide rod (20) and a bidirectional lead screw (21). The threads on the bidirectional lead screw are reversed from the middle to both ends. Both ends of the guide rod are fixedly installed in the frame. The lead screw is connected to the frame through a bearing, and one end of the lead screw passes through the frame and is fixed with a handle (22). One end of the cross arm is provided with a sliding hole that slides with the guide rod. The other end of the cross arm is fixed with a nut block that can be threadedly connected with the bidirectional lead screw. The two cross arms respectively cooperate with the two ends of the bidirectional lead screw.

6. A test board for integrated circuits according to claim 5, characterized in that, The probe holder has a locking block (23) fixed at its outer end. The cross arm has a locking slot for engaging with the locking block. The locking block and the cross arm have threaded holes facing each other. The locking block and the cross arm are connected by bolts.