Electrical test frame
By using a modularly designed electrical test fixture, the spacing between the support seats can be adjusted using threaded rods and spring mechanisms, and the force of the probes can be adjusted using electric push rods. This solves the problems of cumbersome test plate replacement and probe damage, and achieves more efficient and stable electrical testing.
Patent Information
- Application Number
- CN202423146218.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-19
- Publication Date
- 2025-12-19
- Estimated Expiration
- 2034-12-19
AI Technical Summary
Existing electrical test fixtures are cumbersome to change test plates and are prone to damage to probes or component pins, affecting testing efficiency and result accuracy.
The modularly designed electrical test fixture allows for adjustment of the support spacing via threaded rods and connecting blocks, and adjustment of probe force via electric push rods and spring mechanisms, enabling rapid adaptation to different DUTs and protecting components.
It improves testing efficiency, avoids damage to probes and component pins, and ensures the accuracy and stability of test results.
Smart Images
Figure CN223692407U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to detection equipment technical field especially relates to a kind of electrical test rack. BACKGROUND
[0002] Electrical test is the process of evaluating the overall electrical characteristics of the system or component to be measured, to determine whether it meets the expected standard, involves the measurement of a variety of electrical parameters, according to the predetermined test procedure and steps, the corresponding electrical signal or excitation is applied to the measured sample, while using test equipment to collect and record the response data of the measured sample.
[0003] Electrical test rack is the device for testing the electrical performance of electronic components and circuit boards, including physical frame, corresponding connectors and probes, interface circuit, control and measurement system. During the test process, it is necessary to observe the display and alarm information of the test equipment to ensure the normal progress of the test process, and to arrange, analyze and process the collected test data, compare the test results with the design requirements or standard specifications, and judge whether the measured sample is qualified.
[0004] The test disc in the electrical test rack is the key part connecting the measured device (DUT, Device Under Test) and the test instrument. Each DUT has different pin layout, spacing and interface requirements, which requires re-design or adjustment of the test disc every time the DUT is replaced. Therefore, when detecting the measured component, the specification adjustment of the test disc is relatively cumbersome, and it is usually necessary to replace the corresponding test disc according to the circuit board of different sizes, which greatly reduces the detection efficiency, and it is not convenient to control the force when the probe abuts against the measured component during the test process, which may cause damage to the probe end or component pin, resulting in data deviation during subsequent measurement and affecting the test result. In view of this, the present application proposes a modular design of electrical test rack, which can quickly combine different DUTs. SUMMARY
[0005] The utility model aims at solving the problem that it is relatively cumbersome to replace the test disc matched with the measured component, and the probe or component pin is easily damaged during the test process, and proposes an electrical test rack.
[0006] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme:
[0007] An electrical test rack, comprising a base, one side of the base is provided with an operation panel, the upper end of the base is provided with a test slot, and two assembly seats are arranged in the test slot, the side wall of one of the assembly seats is fixedly connected with the inner wall of the test slot, the bottom of the other assembly seat is connected with an adjusting mechanism, support seats are arranged on the two assembly seats respectively, the support seat comprises a sleeve, a first spring is arranged in the sleeve, the top of the first spring is connected with a support rod, the support rod is slidably connected with the sleeve, the top of the support rod is fixedly connected with a supporting plate, clamping mechanisms are connected with the support seats respectively, and handles are arranged on the top of the clamping mechanisms on the same side.
[0008] The upper surface of the base is fixedly connected with a support, the top side wall of the support is provided with an electric push rod through a mounting seat, the telescopic end of the electric push rod is connected with a probe seat, and the lower surface of the probe seat is provided with a plurality of probes for testing.
[0009] As a further preferred aspect of the technical solution, the adjusting mechanism comprises a threaded rod, a connecting rod is fixedly connected to the threaded rod, and one end of the connecting rod extending out of the base is fixedly connected with a knob;
[0010] A nut is threadedly connected to the threaded rod, and the top of the nut is fixedly connected with a connecting block.
[0011] As a further preferred aspect of the technical solution, the bottom of the test slot is provided with a storage groove, the threaded rod is arranged in the storage groove, and the threaded rod is rotatably connected with the inner wall of the storage groove;
[0012] The connecting block is arranged in the storage groove, and the width of the connecting block is equal to the width of the storage groove, and the top of the connecting block is fixedly connected with the bottom of the assembly seat.
[0013] As a further preferred aspect of the technical solution, a sliding groove is formed in each of the two assembly seats, and a sliding block is slidably arranged in the sliding groove, and the top of the sliding block is fixedly connected with the bottom of the sleeve.
[0014] As a further preferred aspect of the technical solution, the clamping mechanism comprises an extension plate, a movable rod is arranged through the extension plate, a second spring is arranged around the movable rod, a baffle is fixedly connected to the bottom of the movable rod, and a pressing plate is fixedly connected to the top of the movable rod.
[0015] As a further preferred aspect of the technical solution, a clamping groove is formed in one side of the top of the sleeve, the extension plate is fixedly connected with the side wall of the support rod, and the position of the extension plate corresponds to the position of the clamping groove;
[0016] The side of the movable rod close to the support rod is provided with an abutting portion;
[0017] The bottom of the second spring is connected with the upper surface of the baffle, and the top of the second spring is connected with the lower surface of the extension plate.
[0018] The pressing plate extends above the supporting plate, and the pressing plate is coaxially arranged at the center of the supporting plate.
[0019] As a further preferred embodiment of the present application, the handle comprises a fixed block arranged on the top of the pressing plate, a positioning rod is slidably arranged through the fixed block, and a pull rod is fixedly connected to the positioning rod.
[0020] The present application has the following advantages:
[0021] 1. The threaded rod, the nut and the adapter seat are arranged, the knob is twisted to finally drive the supporting seat on one side to move, the distance between the two supporting plates is flexibly adjusted, the measured element of different specifications and sizes is applicable, the pressing plate arranged above is matched, the measured element can be conveniently fixed, and the test efficiency is improved.
[0022] 2. The sleeve, the first spring and the supporting rod are arranged, when the upper electric push rod drives the probe base to move downward as a whole, the probe end is in contact with the measured element pin, continuously moves downward, finally drives the second spring in the sleeve to contract, drives the supporting plate and the measured element to move downward synchronously, the force applied by the probe to the element can be adjusted, and the probe or the element is prevented from being damaged due to excessive pressure transmitted by the electric push rod. DRAWINGS
[0023] In order to more clearly illustrate the technical scheme in the embodiments of the present application or the prior art, the drawings needed to be used in the following embodiment or prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.
[0024] Figure 1 A front view structural schematic diagram of an electrical test rack is provided for the present application.
[0025] Figure 2 A structural schematic diagram of a base of an electrical test rack is provided for the present application.
[0026] Figure 3 A structural schematic diagram of an adjusting mechanism of an electrical test rack is provided for the present application.
[0027] Figure 4 A structural schematic diagram of a supporting seat of an electrical test rack is provided for the present application.
[0028] Figure 5 This is a schematic diagram showing the positional structure of the support base, clamping mechanism, and handle of an electrical testing fixture proposed in this utility model.
[0029] Figure 6 This is a schematic diagram of the support base and clamping mechanism of an electrical test fixture proposed in this utility model.
[0030] In the diagram: 1. Base; 11. Control panel; 12. Test slot; 13. Storage slot; 2. Assembly seat; 21. Slide groove; 22. Slider; 3. Adjustment mechanism; 31. Threaded rod; 32. Connecting rod; 33. Knob; 34. Nut; 35. Connecting block; 4. Support seat; 41. Sleeve; 411. Slot; 42. First spring; 43. Support rod; 44. Support plate; 5. Clamping mechanism; 51. Extension plate; 52. Movable rod; 521. Abutment part; 53. Second spring; 54. Baffle; 55. Pressure plate; 6. Handle; 61. Fixing block; 62. Positioning rod; 63. Pull rod; 7. Bracket; 8. Electric push rod; 9. Probe seat. Detailed Implementation
[0031] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0032] This utility model provides a technical solution: such as Figure 1 and Figure 2 As shown, an electrical test fixture includes a base 1, an operation panel 11 on one side of the base 1, a test slot 12 at the upper end of the base 1, and two mounting seats 2 inside the test slot 12. The side wall of one mounting seat 2 is fixedly connected to the inner wall of the test slot 12, and the bottom of the other mounting seat 2 is connected to an adjustment mechanism 3.
[0033] like Figure 3 As shown, the adjustment mechanism 3 includes a threaded rod 31, a connecting rod 32 fixedly connected to the threaded rod 31, and a knob 33 fixedly connected to one end of the connecting rod 32 extending outside the base 1. A nut 34 is threadedly connected to the threaded rod 31, and a connecting block 35 is fixedly connected to the top of the nut 34. A storage groove 13 is provided at the bottom of the test groove 12. The threaded rod 31 is set in the storage groove 13 and is rotatably connected to the inner wall of the storage groove 13. The connecting block 35 is set in the storage groove 13, and the width of the connecting block 35 is equal to the width of the storage groove 13. The top of the connecting block 35 is fixedly connected to the bottom of the mounting base 2.
[0034] When the knob 33 is twisted to drive the threaded rod 31 to rotate, the side wall of the abutment block 35 arranged above the nut 34 is in contact with the inner wall of the storage groove 13, which can limit the rotation of the nut 34, so that the nut 34 moves along the direction in which the threaded rod 31 is arranged, and the lower surface of the support seat 4 is in contact with the bottom inner wall of the test groove 12, which can improve the stability of the support seat 4 when moving.
[0035] As shown in Figure 4 , the two assembly seats 2 are respectively provided with support seats 4, the support seat 4 comprises a sleeve 41, the inside of the sleeve 41 is provided with a first spring 42, the top of the first spring 42 is connected with a support rod 43, and the support rod 43 is in sliding penetration connection with the sleeve 41, the top of the support rod 43 is fixedly connected with a supporting plate 44, the two assembly seats 2 are respectively provided with sliding grooves 21, and the sliding grooves 21 are slidably provided with sliding blocks 22, and the top of the sliding block 22 is fixedly connected with the bottom of the sleeve 41.
[0036] When this part works, the probe is in contact with the measured element, which can drive multiple supporting plates 44 to move downward at the same time, and the first spring 42 is contracted at this time, which can adjust the force applied by the contact point of the probe and the element, so as to avoid damage to the probe or the element caused by excessive pressure transmitted by the electric push rod 8.
[0037] As shown in Figure 5 , the multiple support seats 4 are respectively connected with clamping mechanisms 5, the clamping mechanism 5 comprises an extension plate 51, the extension plate 51 is provided with a movable rod 52 in penetration, the movable rod 52 is sleeved with a second spring 53, the bottom of the movable rod 52 is fixedly connected with a baffle 54, and the top of the movable rod 52 is fixedly connected with a pressing plate 55.
[0038] Further, as shown in Figure 4 , the top side of the sleeve 41 is provided with a clamping groove 411, the extension plate 51 is fixedly connected with the side wall of the support rod 43, and the position of the extension plate 51 corresponds to the position of the clamping groove 411. When the probe drives the element to move downward, the extension plate 51 is correspondingly arranged above the clamping groove 411, that is, even if the element continuously moves downward to make the first spring 42 contract to the limit, the extension plate 51 will enter the clamping groove 411, which will not hinder the movement of the element, and ensures that the element remains horizontal during the detection process.
[0039] Specifically, the side of the movable rod 52 close to the support rod 43 is provided with an abutting portion 521, the bottom of the second spring 53 is connected with the upper surface of the baffle 54, the top of the second spring 53 is connected with the lower surface of the extension plate 51, the pressing plate 55 extends above the supporting plate 44, and the pressing plate 55 is coaxially arranged with the center of the supporting plate 44. When the measured element is placed above the supporting plate 44, the side wall of the element is in contact with the abutting portion 521 on the movable rod 52, and the vertical surface of the abutting portion 521 is in contact with the edge of the element, which can play a positioning role to quickly complete the clamping of the element.
[0040] In addition, the top of the same side clamping mechanism 5 is jointly provided with a handle 6, the handle 6 comprises a fixed block 61 arranged at the top of the pressing plate 55, a positioning rod 62 is slidably penetrated through the fixed block 61, and a pull rod 63 is fixedly connected to the positioning rod 62, as shown. Figure 1 As shown, the upper surface of the base 1 is fixedly connected with a support 7, the top side wall of the support 7 is provided with an electric push rod 8 through a mounting seat, the telescopic end of the electric push rod 8 is connected with a probe seat 9, and the lower surface of the probe seat 9 is provided with a plurality of probes for testing; further, a magnet and a magnetic material are respectively arranged at the connecting position of the probe and the probe seat 9, or both of them are provided with magnets; the probe is adsorbed on the probe seat 9 by magnetic force, the connection mode is simple and convenient, the position and angle of the probe can be adjusted without complex operation, and the position and angle of the probe can be adjusted.
[0041] The utility model provides a kind of electrical test frame, specific working principle is as follows: according to the size of the specification and size of the measured element, knob 33 is twisted and is rotated by connecting rod 32 Threaded rod 31 is driven, under the action of the article groove 13, the side wall of the adapter block 35 is contacted with the inner wall of the article groove 13, so as to limit the rotation of the nut 34, finally make the nut 34 along the direction of threaded rod 31 Setting moves, the nut 34 will be with the upper support seat 4 Synchronous movement, the spacing between the two support seats 4 is adjusted, and the position of different support seats 4 on the assembly seat 2 is adjusted, so that the edge position of the measured element on the upper supporting plate 44 of different position support seat 4 corresponds, the positioning rod 62 connected with the pull rod 63 is pulled upwards, and the positioning rod 62 will drive the fixed block 61 on both sides to move upwards synchronously, finally make the lower pressing plate 55 move upwards, after the measured element is placed on the upper supporting plate 44, the pull rod 63 is loosened under the elastic force of the second spring 53, the movable rod 52 is pushed to move downwards, so that the lower surface of the pressing plate 55 is contacted with the measured element, the fixing of the measured element is completed, the element is prevented from moving in the subsequent test process, the electric push rod 8 is started to operate, and the telescopic end of the electric push rod 8 will drive the probe seat 9 to move downwards, finally make the magnetic probe below the probe seat 9 contact with the pin of the measured element, and the element is tested.
[0042] Each embodiment in the specification is described in a related manner, and the same and similar parts between each embodiment can be referred to each other, and each embodiment focuses on the difference from other embodiments.
[0043] The above only describes preferred embodiments of the utility model, and is not used to limit the protection scope of the utility model. Any modification, equivalent replacement, improvement, etc. within the spirit and principle of the utility model are included in the protection scope of the utility model.
Claims
1. An electrical test rack comprising a base (1), characterized in that, One side of the base (1) is provided with an operation panel (11), the upper end of the base (1) is provided with a test slot (12), and two assembly seats (2) are arranged in the test slot (12), one side wall of one of the assembly seats (2) is fixedly connected with the inner wall of the test slot (12), the bottom of the other assembly seat (2) is connected with an adjusting mechanism (3), two support seats (4) are arranged on the two assembly seats (2) respectively, the support seat (4) comprises a sleeve (41), a first spring (42) is arranged in the sleeve (41), the top of the first spring (42) is connected with a supporting rod (43), the supporting rod (43) is slidably connected with the sleeve (41), the top of the supporting rod (43) is fixedly connected with a supporting plate (44), a plurality of clamping mechanisms (5) are connected with the supporting rods (43) respectively, and the top of the clamping mechanisms (5) on the same side is jointly provided with a handle (6). The upper surface of the base (1) is fixedly connected with a support (7), the top side wall of the support (7) is provided with an electric push rod (8) through a mounting seat, the telescopic end of the electric push rod (8) is connected with a probe seat (9), and the lower surface of the probe seat (9) is provided with a plurality of probes for testing.
2. The electrical test rack of claim 1, wherein, The adjusting mechanism (3) comprises a threaded rod (31), a connecting rod (32) is fixedly connected to the threaded rod (31), and one end of the connecting rod (32) extending out of the base (1) is fixedly connected with a knob (33). A nut (34) is threadedly connected to the threaded rod (31), and the top of the nut (34) is fixedly connected with a connecting block (35).
3. The electrical test rack of claim 2, wherein, The bottom of the test slot (12) is provided with a storage groove (13), the threaded rod (31) is arranged in the storage groove (13), and the threaded rod (31) is rotatably connected with the inner wall of the storage groove (13). The connecting block (35) is arranged in the storage groove (13), and the width of the connecting block (35) is equal to the width of the storage groove (13), and the top of the connecting block (35) is fixedly connected with the bottom of the assembly seat (2).
4. The electrical test rack of claim 1, wherein, Two sliding grooves (21) are arranged on the two assembly seats (2) respectively, and a sliding block (22) is slidably arranged in the sliding groove (21), and the top of the sliding block (22) is fixedly connected with the bottom of the sleeve (41).
5. The electrical test rack of claim 1, wherein, The clamping mechanism (5) comprises an extension plate (51), an activity rod (52) is arranged in the extension plate (51), a second spring (53) is arranged on the activity rod (52), the bottom of the activity rod (52) is fixedly connected with a baffle (54), and the top of the activity rod (52) is fixedly connected with a pressing plate (55).
6. The electrical test rack of claim 5, wherein, The top side of the sleeve (41) is provided with a clamping groove (411), the extension plate (51) is fixedly connected with the side wall of the supporting rod (43), and the position of the extension plate (51) corresponds to the position of the clamping groove (411). The side of the activity rod (52) close to the supporting rod (43) is provided with an abutting portion (521). The bottom of the second spring (53) is connected with the upper surface of the baffle (54), and the top of the second spring (53) is connected with the lower surface of the extension plate (51). The pressing plate (55) extends above the supporting plate (44), and the pressing plate (55) is coaxially arranged at the center of the supporting plate (44).
7. The electrical test rack of claim 5, wherein, The handle (6) comprises a fixed block (61) arranged at the top of the pressing plate (55), a positioning rod (62) is slidably arranged through the fixed block (61), and a pull rod (63) is fixedly connected to the positioning rod (62).