Memory chip test fixture
By designing a memory chip test fixture with clamping and adjustment components, the problem of insufficient single clamping capacity in existing technologies has been solved. This enables simultaneous clamping and flexible adjustment of multiple chips, improving testing efficiency and stability, and expanding the application scope.
Patent Information
- Application Number
- CN202423185127.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-23
- Publication Date
- 2025-12-30
- Estimated Expiration
- 2034-12-23
AI Technical Summary
Existing memory chip test fixtures have a limited capacity for clamping chips at a time, resulting in low testing efficiency and difficulty in clamping chips of different sizes simultaneously, which affects the performance.
A memory chip test fixture was designed, which includes a clamping component and an adjustment component. The clamping component clamps the chip by driving a sliding plate with a cylinder and a circular block, while the adjustment component enables flexible adjustment of the chip through a threaded rod and a clamping plate, ensuring the stable clamping of multiple chips.
It enables simultaneous clamping of multiple chips, improving testing efficiency and stability, enhancing the versatility of the fixture, making it suitable for chips of different specifications, and improving testing accuracy and stability.
Smart Images

Figure CN223742531U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip testing technology, specifically a memory chip testing fixture. Background Technology
[0002] Chip testing, specifically system-on-a-chip (SoC) testing in the early design stages, is based on deep submicron technology. Therefore, testing SoC devices requires entirely new methods. Since each functional component has its own testing requirements, design engineers must make test plans in the early design stages.
[0003] Patent publication number "CN212060331U" discloses "A memory chip testing fixture, belonging to the field of memory chip technology, which includes a base plate. A pushing device is fixedly connected to the upper surface of the base plate. The upper surface of the pushing device overlaps with the lower surface of the PCB circuit board. A stepper motor is fixedly connected to the upper surface of the base plate, and a support plate is fixedly connected to the output shaft of the stepper motor." This memory chip testing fixture, through the cooperation of the stepper motor, electric push rod, pressure plate, slide rod, and first spring, makes the fixing of memory chips simpler and more convenient, saving time and effort. Furthermore, while fixing the chip, the fixture can stretch the pins to improve their levelness, ensuring better testing of the memory chip. Simultaneously, while testing one memory chip, the operator can continue to position another, further saving considerable time and facilitating the operator's work.
[0004] In the aforementioned patent, the existing test fixture has a limited clamping capacity per clamping, resulting in low testing efficiency during actual use. This affects work efficiency, and clamping multiple chips of different sizes simultaneously is cumbersome, thus affecting the effectiveness of use.
[0005] To address these issues, this invention provides a memory chip testing fixture. Utility Model Content
[0006] To address the shortcomings of existing technologies, this utility model provides a memory chip test fixture, which solves the problem that the existing test fixtures have limited single clamping capacity, resulting in low testing efficiency in actual use and thus affecting work efficiency.
[0007] To achieve the above objectives, this utility model provides the following technical solution: a memory chip testing fixture, comprising a base plate, a support rod fixedly mounted on the top of the base plate, a top plate fixedly mounted on the top of the support rod, a clamping assembly fixedly mounted on the top of the base plate, and an adjustment component provided on one side of the clamping assembly; the clamping assembly comprises a cylinder and a circular block, the cylinder fixedly mounted on the top of the base plate, the circular block being fixedly connected to the output end of the cylinder, a U-shaped frame one fixedly connected to the side wall of the circular block, a connecting rod hinged to the inner side wall of the U-shaped frame one, a U-shaped frame two hinged to the top of the connecting rod, a sliding plate fixedly mounted on the top of the U-shaped frame two, a sliding groove two provided on the top of the top plate, the sliding plate being slidably connected to the sliding groove two, a moving block fixedly mounted on the top of the sliding plate, and a clamping block fixedly mounted on the top of the top plate.
[0008] Furthermore, the adjustment assembly includes a threaded rod, a clamping plate, and a stabilizing rod. The threaded rod is threadedly connected to one side of the moving block, the clamping plate is connected to one end of the threaded rod via a bearing, and the stabilizing rod is fixedly installed on one side of the clamping plate. The stabilizing rod is slidably connected to the moving block.
[0009] Using the above technical solution, clamping can be performed based on the chip itself.
[0010] Furthermore, the adjustment assembly also includes a limiting block, which is fixedly connected to the side wall of the stabilizer bar.
[0011] The above technical solution can achieve a good limiting effect.
[0012] Furthermore, the adjustment assembly also includes a knob, which is fixedly connected to one end of the threaded rod.
[0013] The above technical solution allows for convenient rotation of the threaded rod using a knob.
[0014] Furthermore, the adjustment assembly also includes an anti-slip pad, which is disposed on one side of the clamping plate.
[0015] The above technical solution can achieve an anti-slip effect, resulting in a better clamping effect.
[0016] Furthermore, a chip body is provided on the top of the base plate, and the chip body is located on one side of the clamping block.
[0017] The above technical solution can be used to clamp the chip body, and the clamping is simple and convenient.
[0018] Furthermore, anti-slip pads are provided around the clamping block, and the anti-slip pads are bonded to the clamping block.
[0019] The above technical solution can achieve a good anti-slip effect.
[0020] Beneficial effects
[0021] This invention provides a memory chip testing fixture. Compared with the prior art, it has the following advantages:
[0022] 1. This memory chip testing fixture, through its designed clamping components, can simultaneously clamp multiple chips, making clamping simple and convenient, thus improving efficiency, reducing wasted time, effectively ensuring the performance, enhancing the user experience, and facilitating widespread adoption.
[0023] 2. This memory chip test fixture, through its adjustable components, can be adjusted according to the actual size of the chip, resulting in better chip fixation and overall versatility. This enhances the user experience and ensures a more stable chip fixation, significantly improving test accuracy and stability. Furthermore, it greatly enhances the fixture's versatility, making it widely applicable to chips of different specifications and effectively expanding its application range. Attached Figure Description
[0024] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.
[0025] Figure 1 This is a schematic diagram of the overall structure of this utility model;
[0026] Figure 2 This is a utility model Figure 1 Enlarged view of the structure at point A in the middle;
[0027] Figure 3 This is a side view of the overall structure of this utility model;
[0028] Figure 4 This is a utility model Figure 3 Enlarged view of the structure at point B.
[0029] In the diagram: 1. Base plate; 2. Support rod; 3. Top plate; 4. Clamping assembly; 41. Cylinder; 42. Circular block; 43. U-shaped frame one; 44. Connecting rod; 45. U-shaped frame two; 46. Slide groove two; 47. Slide plate; 48. Moving block; 5. Adjustment assembly; 51. Threaded rod; 52. Clamping plate; 53. Stabilizing rod; 54. Limiting block; 55. Knob; 56. Anti-slip pad one; 6. Clamping block; 7. Anti-slip pad two; 8. Chip body. Detailed Implementation
[0030] It should be noted that in the description of the embodiments of this application, the terms "front," "rear," "left," "right," "up," "down," etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. The terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication between two elements. For those skilled in the art, the specific meaning of the above terms in this application can be understood according to the specific circumstances.
[0031] The present application will be further described in detail below with reference to the accompanying drawings and embodiments.
[0032] Reference Figures 1 to 4 This application provides a memory chip test fixture, including a base plate 1, a support rod 2 fixedly mounted on the top of the base plate 1, a top plate 3 fixedly mounted on the top of the support rod 2, a clamping assembly 4 fixedly mounted on the top of the base plate 1, and an adjustment assembly 5 provided on one side of the clamping assembly 4; the clamping assembly 4 includes a cylinder 41 and a circular block 42, the cylinder 41 is fixedly mounted on the top of the base plate 1, the circular block 42 is fixedly connected to the output end of the cylinder 41, and the side wall of the circular block 42 is fixedly connected to... There is a U-shaped frame 43, with a connecting rod 44 hinged to the inner wall of the U-shaped frame 43. A U-shaped frame 45 is hinged to the top of the connecting rod 44. A sliding plate 47 is fixedly installed on the top of the U-shaped frame 45. A sliding groove 46 is opened on the top of the top plate 3. The sliding plate 47 and the sliding groove 46 are slidably connected. A moving block 48 is fixedly installed on the top of the sliding plate 47. A clamping block 6 is fixedly installed on the top of the top plate 3. Anti-slip pads 7 are provided around the clamping block 6. The anti-slip pads 7 are bonded to the clamping block 6.
[0033] In this embodiment, the cylinder 41 is then activated to drive the circular block 42 to move, so that the circular block 42 can drive the slide plate 47 to slide inside the slide groove 46 through the connecting rod 44, thereby allowing the moving block 48 to drive the adjusting component 5 to clamp the chip body 8, and can clamp four chip bodies 8 at the same time, so that the test effect will be better.
[0034] Reference Figures 1 to 4 In one aspect of this embodiment, the adjustment assembly 5 includes a threaded rod 51, a clamping plate 52, and a stabilizing rod 53. The threaded rod 51 is threadedly connected to one side of the moving block 48. The clamping plate 52 is connected to one end of the threaded rod 51 via a bearing. The stabilizing rod 53 is fixedly installed on one side of the clamping plate 52 and is slidably connected to the moving block 48. The adjustment assembly 5 also includes a limiting block 54, which is fixedly connected to the side wall of the stabilizing rod 53. The adjustment assembly 5 also includes a knob 55, which is fixedly connected to one end of the threaded rod 51. The adjustment assembly 5 also includes an anti-slip pad 56, which is disposed on one side of the clamping plate 52. A chip body 8 is disposed on the top of the base plate 1, and the chip body 8 is located on one side of the clamping block 6.
[0035] In this embodiment, firstly, rotating the knob 55 can drive the threaded rod 51 to rotate, so that the threaded rod 51 can drive the clamping plate 52 to slide on one side of the moving block 48 through the stabilizing rod 53, so that the clamping plate 52 can be adjusted according to the size of the chip, so that even when the four chip bodies 8 are of different sizes, there is a good clamping effect. Then, the chip body 8 is placed on the top of the top plate 3.
[0036] Working principle: First, turning the knob 55 will drive the threaded rod 51 to rotate, so that the threaded rod 51 can drive the clamping plate 52 to slide on one side of the moving block 48 through the stabilizing rod 53. This allows the clamping plate 52 to be adjusted according to the size of the chip, so that even when the four chip bodies 8 are of different sizes, there is a good clamping effect. Then, the chip body 8 is placed on the top of the top plate 3.
[0037] Then, starting the cylinder 41 can drive the circular block 42 to move, so that the circular block 42 can drive the slide plate 47 to slide inside the slide groove 46 through the connecting rod 44, so that the moving block 48 can drive the adjustment component 5 to clamp the chip body 8, and can clamp four chip bodies 8 at the same time, so that the test effect will be better.
[0038] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.
[0039] Although embodiments of this application have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A memory chip test fixture comprising a backplane (1), characterized in that: The top of the bottom plate (1) is fixedly installed with a supporting rod (2), the top of the supporting rod (2) is fixedly installed with a top plate (3), the top of the bottom plate (1) is fixedly installed with a clamping assembly (4), one side of the clamping assembly (4) is provided with an adjusting assembly (5). The clamping assembly (4) comprises a gas cylinder (41) and a circular block (42), the gas cylinder (41) is fixedly installed on the top of the bottom plate (1), the circular block (42) is fixedly connected with the output end of the gas cylinder (41), the side wall of the circular block (42) is fixedly connected with a U-shaped frame one (43), the inner side wall of the U-shaped frame one (43) is hinged with a connecting rod (44), the top of the connecting rod (44) is hinged with a U-shaped frame two (45), the top of the U-shaped frame two (45) is fixedly installed with a sliding plate (47), the top of the top plate (3) is provided with a sliding groove two (46), the sliding plate (47) and the sliding groove two (46) are slidably connected, the top of the sliding plate (47) is fixedly installed with a moving block (48), the top of the top plate (3) is fixedly installed with a clamping block (6).
2. The memory chip test fixture of claim 1, wherein: The adjusting assembly (5) comprises a threaded rod (51), a clamping plate (52) and a stabilizing rod (53), the threaded rod (51) is connected on one side of the moving block (48) through threads, the clamping plate (52) is connected on one end of the threaded rod (51) through bearings, the stabilizing rod (53) is fixedly installed on one side of the clamping plate (52), and the stabilizing rod (53) and the moving block (48) are slidably connected.
3. A memory chip test fixture according to claim 2, wherein: The adjusting assembly (5) further comprises a limiting block (54), and the limiting block (54) is fixedly connected on the side wall of the stabilizing rod (53).
4. The memory chip test fixture of claim 2, wherein: The adjusting assembly (5) further comprises a knob (55), and the knob (55) is fixedly connected on one end of the threaded rod (51).
5. The memory chip test fixture of claim 2, wherein: The adjusting assembly (5) further comprises a first anti-skid pad (56), and the first anti-skid pad (56) is arranged on one side of the clamping plate (52).
6. The memory chip test fixture of claim 1, wherein: The top of the bottom plate (1) is provided with a chip body (8), and the chip body (8) is located on one side of the clamping block (6).
7. The memory chip test fixture of claim 1, wherein: The clamping block (6) is provided with a second anti-skid pad (7) around, and the second anti-skid pad (7) is bonded with the clamping block (6).
Citation Information
Patent Citations
Storage chip test fixture
CN212060331U