Auxiliary installation tool for transmission electron microscope sample

Abstract

The utility model discloses a transmission electron microscope sample auxiliary installation tool which comprises a base, a first adjusting mechanism arranged on the base, a sample placing platform arranged on the first adjusting mechanism, a sample clamp arranged on the sample placing platform and a second adjusting mechanism arranged on the sample placing platform. One end of the first adjusting mechanism is fixedly installed on the base, the sample placing platform is connected with the first adjusting mechanism, the sample clamp is installed in a groove in the sample placing platform, and the second adjusting mechanism is connected with the sample placing platform and acts on the sample clamp. The utility model has the beneficial effects that the sample clamping is convenient, the damage to the sample is avoided, the use effect is good, and the application range is wide.

Description

Technical Field

[0001] This utility model relates to the field of transmission beam electron backscatter diffraction sample processing technology, and in particular to an auxiliary mounting tool for transmission electron microscope samples. Background Technology

[0002] Currently, transmission electron Kikuchi diffraction (TKD) analysis in scanning electron microscopy (SEM) is used for ultrathin crystal samples. It uses the interaction between an electron beam and the sample to generate transmission electron Kikuchi diffraction. By collecting these signals, crystallographic information can be analyzed, achieving high-resolution crystallographic information. It has wide applications in materials research, semiconductor testing, failure analysis, etc. Sample clamps are required for TKD analysis. However, since TKD samples (Φ3*0.1mm) are generally very small and thin, and some samples are very brittle, the current sample mounting method is to open the clamp opening, use tweezers to hold the sample deep into the opening, and then tighten it. During this process, due to the small size of the sample and the limited space, it is easy to cause sample deformation and damage, making the sample unusable for testing.

[0003] In view of the above, it is necessary to improve the existing mounting fixtures to meet the current needs of sample analysis. Utility Model Content

[0004] To achieve the above objectives, the technical solution of this utility model is a transmission electron microscope sample auxiliary mounting tool, comprising a base, a first adjustment mechanism disposed on the base, a sample placement platform disposed on the first adjustment mechanism, a sample clip disposed on the sample placement platform, and a second adjustment mechanism disposed on the sample placement platform. One end of the first adjustment mechanism is fixedly mounted on the base, the sample placement platform is connected to the first adjustment mechanism, the sample clip is mounted in a groove on the sample placement platform, and the second adjustment mechanism is connected to the sample placement platform and acts on the sample clip.

[0005] As a further supplement to this technical solution, the base is provided with rubber pads around its lower perimeter, and the upper end of the rubber pads is fixedly installed under the base.

[0006] As a further supplement to this technical solution, the first adjustment mechanism includes a first hinge, a first screw disposed on the front and rear sides of the first hinge, and a second screw disposed on the front and rear sides above the first hinge. The first hinge is fixedly installed on the base by the first screw, and the first hinge is connected to the sample placement platform by the second screw.

[0007] As a further supplement to this technical solution, the second adjustment mechanism includes a second hinge and third screws disposed on the front and rear sides of the second hinge. The second hinge is fixedly installed on the sample placement platform by the third screws, and the second hinge is disposed above the sample clamp.

[0008] As a further addition to this technical solution, the sample placement platform is set with an inclined plane corresponding to the position of the sample clip.

[0009] As a further supplement to this technical solution, an elastic mechanism is provided in the groove of the sample placement platform and below the sample clamp, and the elastic mechanism is set to protrude from the inclined surface of the sample placement platform.

[0010] As a further supplement to this technical solution, the elastic mechanism includes a mounting screw and a spring disposed on the mounting screw. The mounting screw is fixedly installed on the sample placement platform, and the spring abuts against the bottom of the sample clamp.

[0011] As a further supplement to this technical solution, the second hinge, sample clip, sample placement platform, and first hinge are provided with mounting holes, and a fixing mechanism is provided in the mounting holes. The fixing mechanism includes an adjusting rod and a nut set on the adjusting rod. The adjusting rod is set in the mounting hole and passes through the second hinge, sample clip, sample placement platform, and first hinge in sequence and is fixed by the nut.

[0012] A further supplement to this technical solution includes a pry bar, which has a protrusion for lifting the copper sheet on the sample holder.

[0013] As a further addition to this technical solution, the cross-section of the protrusion is trapezoidal.

[0014] Its advantages include convenient sample clamping, avoiding damage to the sample, excellent performance, and wide applicability. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the overall structure of this utility model from a first angle;

[0016] Figure 2 This is a schematic diagram of the overall structure of this utility model from a second angle;

[0017] Figure 3 This is a schematic diagram of the overall structure of this utility model from a third angle;

[0018] Figure 4 This is a partial structural schematic diagram of the present invention;

[0019] Figure 5 This is a schematic diagram of the elastic mechanism in this utility model;

[0020] Figure 6 This is a schematic diagram of the pry bar structure in this utility model;

[0021] In the diagram, 1 is the base; 2 is the first adjustment mechanism; 21 is the first hinge; 22 is the first screw; 23 is the second screw; 3 is the sample placement platform; 4 is the sample clamp; 5 is the second adjustment mechanism; 51 is the second hinge; 52 is the third screw; 6 is the rubber pad; 7 is the elastic mechanism; 71 is the mounting screw; 72 is the spring; 8 is the fixing mechanism; 81 is the adjusting rod; 82 is the nut; and 9 is the pry bar. Detailed Implementation

[0022] To facilitate a clearer understanding of this technical solution for those skilled in the art, the following will be described in conjunction with the appendix. Figure 1 -6. A detailed description of the technical solution of this utility model:

[0023] A transmission electron microscope (TEM) sample mounting tool includes a base 1, a first adjustment mechanism 2 mounted on the base 1, a sample placement platform 3 mounted on the first adjustment mechanism 2, a sample clamp 4 mounted on the sample placement platform 3, and a second adjustment mechanism 5 mounted on the sample placement platform 3. One end of the first adjustment mechanism 2 is fixedly mounted on the base 1. The sample placement platform 3 is connected to the first adjustment mechanism 2. The sample clamp 4 is mounted in a groove on the sample placement platform 3, and the size and contour of the groove match the sample clamp 4. The second adjustment mechanism 5 is connected to the sample placement platform 3 and acts on the sample clamp 4. The first adjustment mechanism 2 can adjust the placement angle of the sample placement platform 3, and the second adjustment mechanism 5 can control the clamping or loosening of the sample clamp 4. The sample clamp 4 is used to hold the product.

[0024] The base 1 has rubber pads 6 around its lower perimeter. The upper end of the rubber pads 6 is fixedly installed under the base 1 to prevent slippage and fix the base.

[0025] The structure of the first adjustment mechanism 2 will be described in detail below. The first adjustment mechanism 2 includes a first hinge 21, a first screw 22 disposed on the front and rear sides of the first hinge 21, and a second screw 23 disposed on the front and rear sides above the first hinge 21. The first hinge 21 is fixedly installed on the base 1 by the first screw 22, and the first hinge 21 is connected to the sample placement platform 3 by the second screw 23. This facilitates the adjustment of the placement angle of the sample placement platform 3, thereby facilitating the installation of the first hinge 21 with the base 1 and the sample placement platform 3.

[0026] The structure of the second adjustment mechanism 5 will be described in detail below. The second adjustment mechanism 5 includes a second hinge 51 and third screws 52 disposed on the front and rear sides of the second hinge 51. The second hinge 51 is fixedly installed on the sample placement platform 3 by the third screws 52. The second hinge 51 is disposed above the sample clip 4. The sample placement platform 3 is set at the position corresponding to the sample clip 4 in an inclined plane. The second hinge 51 can limit the position of the sample clip 4.

[0027] The sample placement platform 3 has an elastic mechanism 7 located in the groove below the sample clip 4. The elastic mechanism 7 protrudes from the inclined surface of the sample placement platform 3. Specifically, the elastic mechanism 7 includes a mounting screw 71 and a spring 72 mounted on the mounting screw 71. The mounting screw 71 is fixedly mounted on the sample placement platform 3, and the spring 72 abuts against the bottom of the sample clip 4, which can provide support and buffer for the sample clip 4.

[0028] After installation, in order to fix the device, the second hinge 51, sample clip 4, sample placement platform 3, and first hinge 21 are provided with mounting holes. The mounting holes are provided with fixing mechanisms 8, which include adjusting rod 81 and nuts 82 set on adjusting rod 81. The adjusting rod 81 is set in the mounting hole and passes through the second hinge 51, sample clip 4, sample placement platform 3, and first hinge 21 in sequence and is fixed by nuts 82. When the first adjusting mechanism 2 rotates, it is convenient to manually install nuts 82 for fixing.

[0029] In order to facilitate the opening of the copper sheet of the sample holder 4 for placing the product, this tooling is also equipped with a pry bar 9. The pry bar 9 has a protrusion for lifting the copper sheet on the sample holder 4. Specifically, the cross section of the protrusion is trapezoidal.

[0030] The overall working principle of this utility model will be explained in the following system: During operation, the pry bar 9 is inserted into the groove of the sample holder 4 and extends inward. When the protrusion on it is below the copper sheet, the front end of the copper sheet opens. Then, the sample is placed on the sample placement platform 3. The sample is gently moved or the sample placement platform 3 is slightly raised to a suitable angle. Then, the sample placement platform 3 is gently tapped so that the sample falls into the open clamping surface under vibration. Then, the pry bar 9 is pulled out, the copper sheet falls down and clamps the sample. Then, the adjusting rod 81 is released, the second hinge 51 is lifted, and the sample holder 4 can be removed.

[0031] The above technical solution only embodies the preferred technical solution of this utility model. Any changes that may be made by those skilled in the art to certain parts of it embody the principle of this utility model and fall within the protection scope of this utility model.

Claims

1. A transmission electron microscope sample auxiliary mounting tool, characterized by, The utility model provides a sample placing platform, including base (1), first adjusting mechanism (2) of setting on base (1), sample placing platform (3) of setting on first adjusting mechanism (2), sample clamp (4) of setting on sample placing platform (3), second adjusting mechanism (5) of setting on sample placing platform (3), one end of first adjusting mechanism (2) is fixedly installed on base (1), sample placing platform (3) is connected with first adjusting mechanism (2), sample clamp (4) is installed in recess of sample placing platform (3), second adjusting mechanism (5) is connected with sample placing platform (3) and its action is on sample clamp (4), The recess of sample placing platform (3) is provided with an elastic mechanism (7) below the sample clamp (4), and the elastic mechanism (7) is provided on the inclined surface of the sample placing platform (3). The elastic mechanism (7) comprises a mounting screw (71) and a spring (72) arranged on the mounting screw (71), the mounting screw (71) is fixedly installed on the sample placing platform (3), and the spring (72) abuts against the sample clamp (4) below. The lever (9) is provided with a protrusion for lifting the copper sheet on the sample clamp (4). The protrusion is in the shape of a trapezoid.

2. A transmission electron microscopy sample auxiliary mounting tool according to claim 1, wherein, The bottom of the base (1) is provided with a rubber pad (6) around, and the upper end of the rubber pad (6) is fixedly installed below the base (1).

3. A transmission electron microscope sample auxiliary mounting tool according to claim 2, wherein, The first adjusting mechanism (2) comprises a first hinge (21), first screws (22) arranged on the front and back sides of the first hinge (21), and second screws (23) arranged on the front and back sides above the first hinge (21), the first hinge (21) is fixedly installed on the base (1) through the first screws (22), and the first hinge (21) is connected with the sample placing platform (3) through the second screws (23).

4. A transmission electron microscope sample auxiliary mounting tool according to claim 3, wherein, The second adjusting mechanism (5) comprises a second hinge (51) and third screws (52) arranged on the front and back sides of the second hinge (51), the second hinge (51) is fixedly installed on the sample placing platform (3) through the third screws (52), and the second hinge (51) is arranged above the sample clamp (4).

5. A transmission electron microscope sample auxiliary mounting tool according to claim 4, wherein, The sample placing platform (3) is provided with an inclined surface corresponding to the position of the sample clamp (4).

6. A transmission electron microscope sample auxiliary mounting tool according to claim 4, wherein, The second hinge (51), the sample clamp (4), the sample placing platform (3), and the first hinge (21) are provided with mounting holes, the mounting holes are provided with fixing mechanisms (8), the fixing mechanisms (8) comprise adjusting rods (81) and nuts (82) arranged on the adjusting rods (81), the adjusting rods (81) are arranged in the mounting holes and sequentially pass through the second hinge (51), the sample clamp (4), the sample placing platform (3), and the first hinge (21) and are fixed through the nuts (82).

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