Bidirectional buck-boost test device and bidirectional buck-boost conversion system
By using a high-voltage power supply and a parallel group of test ports in the bidirectional buck-boost converter test device, the problems of low testing efficiency and high cost in the prior art are solved, and efficient testing of multiple converters is realized.
Patent Information
- Application Number
- CN202423176553.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-20
- Publication Date
- 2026-01-09
- Estimated Expiration
- 2034-12-20
AI Technical Summary
Existing testing equipment for bidirectional buck-boost converters requires two high-voltage sources, resulting in low testing efficiency and high cost, and making it impossible to test multiple converters simultaneously.
A high-voltage power supply and at least two parallel test port groups are used to test the converter, simplifying the circuit structure and enabling simultaneous testing of multiple converters.
It improves testing efficiency, reduces testing costs, simplifies circuit structure, and enables simultaneous testing of multiple converters.
Smart Images
Figure CN223784405U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of power electronics, in particular to a bidirectional boost-buck testing device and a bidirectional boost-buck conversion system. BACKGROUND
[0002] At present, the testing device of the bidirectional boost-buck converter mainly tests through the mode of setting a high-voltage source on the output side and the input side of the converter, wherein one of the two high-voltage sources provides energy to the converter, and the other receives energy to complete the test of the converter. However, such a testing device needs two high-voltage sources and can only realize the test of one converter, resulting in low test efficiency and high circuit structure cost. CONTENT OF THE UTILITY MODEL
[0003] Therefore, the purpose of the present application is to provide a bidirectional boost-buck testing device and a bidirectional boost-buck conversion system, which can simplify the circuit structure of the testing device and improve the test efficiency by setting one high-voltage power supply and at least two parallel test port groups for testing the converter.
[0004] In a first aspect, the present application provides a bidirectional boost-buck testing device, comprising: an upper computer, a high-voltage power supply, a sampling circuit and at least two test port groups, wherein each test port group is connected in parallel; the output end of the upper computer is connected with each power tube of a target bidirectional boost-buck converter, for outputting a driving signal to control the conduction and turn-off of each power tube; each test port group comprises an input positive and negative bus port for connecting the input side of the target bidirectional boost-buck converter and an output positive and negative bus port for connecting the output side of the target bidirectional boost-buck converter, the input positive and negative bus ports in each test port group are connected in parallel, and the output positive and negative bus ports in each test port group are connected in parallel; the high-voltage power supply is connected in parallel to the input positive and negative bus ports in each test port group; the sampling circuit is connected with the upper computer and arranged on each power tube of the target bidirectional boost-buck converter, for collecting the parameters of each power tube during testing.
[0005] In a feasible implementation, the bidirectional boost-buck testing device further comprises: a circuit board for carrying the upper computer, the high-voltage power supply, the sampling circuit and the at least two test port groups; the input positive and negative bus ports and the output positive and negative bus ports in each test port group are symmetrically arranged on the circuit board, and the input positive and negative bus ports and the output positive and negative bus ports are connected in parallel through electronic circuits.
[0006] In an implementation, the at least two test port groups are 2N test port groups, each two of the test port groups are connected in parallel to form a test loop, and input positive and negative bus lines of each test loop are connected to the high-voltage power supply.
[0007] In an implementation, the at least two test port groups are 2N-1 test port groups, one test port in 2N-1 test port groups and 2N-2 test port groups are connected to form a test loop, and input positive and negative bus lines of each test loop are connected to the high-voltage power supply.
[0008] In an implementation, the bidirectional buck-boost testing device further comprises a connection structure for connecting input positive and negative bus ports in each test port group or output positive and negative bus ports in each test port group in parallel.
[0009] In an implementation, the connection structure is any one of a jumper wire harness and a switch circuit.
[0010] In an implementation, the sampling circuit comprises a current sampling circuit and a voltage sampling circuit connected to the host computer; the current sampling circuit is connected to an inductor in the target bidirectional buck-boost converter to collect real-time current values on the inductor; and the voltage sampling circuit is connected in parallel to the input positive and negative bus ports and the output positive and negative bus ports to collect input voltages and output voltages of each target bidirectional buck-boost converter.
[0011] In a second aspect, the embodiments of the present application provide a bidirectional buck-boost conversion system, comprising the bidirectional buck-boost testing device and at least two bidirectional buck-boost converters as described above; input sides of each bidirectional buck-boost converter are connected in parallel to the input positive and negative bus ports, and output sides of the bidirectional buck-boost converters are connected in parallel to the output positive and negative bus ports; and the sampling circuit is arranged on each power tube of the bidirectional buck-boost converter.
[0012] In an implementation, at least one bidirectional buck-boost converter in the at least two bidirectional buck-boost converters has a different working mode from other bidirectional buck-boost converters; each two bidirectional buck-boost converters with different working modes form a test loop, and bidirectional buck-boost converters in the same test loop have the same performance parameters.
[0013] In an implementation, the working mode comprises any one of a buck mode and a boost mode.
[0014] The bidirectional step-up and step-down test device and the bidirectional step-up and step-down conversion system, the device comprises: a host computer, a high-voltage power supply, a sampling circuit and at least two test port groups, wherein each test port group is connected in parallel; the output end of the host computer is connected with each power tube of the target bidirectional step-up and step-down converter, for outputting a driving signal to control the conduction and turn-off of each power tube; the test port group comprises an input positive and negative bus port for connecting the input side of the target bidirectional step-up and step-down converter and an output positive and negative bus port for connecting the output side, the input positive and negative bus ports in each test port group are connected in parallel, and the output positive and negative bus ports in each test port group are connected in parallel; the high-voltage power supply is connected in parallel with the input positive and negative bus ports in each test port group; the sampling circuit is connected with the host computer and arranged on each power tube of the target bidirectional step-up and step-down converter, for collecting parameters of each power tube during testing. The test device provided in the application only sets one high-voltage power supply and at least two test port groups to test the converter, and the test port groups are in parallel relationship, and the high-voltage power supply is reused, so that the test device has simple circuit structure, can simultaneously realize the test of multiple converters, greatly improves the test efficiency, and reduces the test cost.
[0015] Other features and advantages of the present application will be set forth in the following description, and in part will become apparent to those skilled in the art from the description, or can be learned by practice of the present application. The objects and other advantages of the present application will be realized and attained by the structure particularly pointed out in the description and claims, and the appended drawings.
[0016] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the following preferred embodiments are specifically described below, and the accompanying drawings are described in detail as follows. BRIEF DESCRIPTION OF DRAWINGS
[0017] In order to more clearly illustrate the specific embodiments of the present application or the technical solutions in the prior art, the following will briefly introduce the drawings needed to be used in the specific embodiments or the prior art description. Obviously, the drawings described below are some embodiments of the present application, and those skilled in the art can also obtain other drawings according to these drawings without creating any creative labor.
[0018] Figure 1 An embodiment schematic diagram of the bidirectional step-up and step-down test device provided by the present application;
[0019] Figure 2 A third embodiment schematic diagram of the bidirectional step-up and step-down test device provided by the present application;
[0020] Figure 3 A fourth embodiment schematic diagram of the bidirectional step-up and step-down test device provided by the present application;
[0021] Figure 4 This is a schematic diagram of an embodiment of the bidirectional buck-boost converter system provided in this application.
[0022] Figure 5 A circuit schematic diagram of two bidirectional buck-boost converters is provided for an embodiment of this application;
[0023] Figure 6 An equivalent circuit diagram with two bidirectional buck-boost converters is provided for the embodiments of this application;
[0024] Figure 7 A circuit schematic diagram of three bidirectional buck-boost converters is provided for an embodiment of this application;
[0025] Figure 8 The circuit diagram provided for the embodiments of this application includes four bidirectional buck-boost converters. Detailed Implementation
[0026] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0027] like Figure 1 The image shows one embodiment of the bidirectional step-up / step-down testing device provided in this application. The device includes: a host computer 110, a high-voltage power supply 120, at least two test port groups 130, and a sampling circuit 140. The host computer 110 and the high-voltage power supply 120... 、 At least two test port groups 130 and the sampling circuit 140 are connected to the target bidirectional buck-boost converter (i.e., the part within the dashed box in the figure). Specifically, the high-voltage power supply 120 is connected in parallel to the input side of the converter, and the host computer 110 is connected to the control terminals of each power transistor in the converter. The host computer 110 is used to output drive signals to control the turn-off and turn-on of each power transistor.
[0028] It should be noted that the test port group 130 is used to connect the input and output ports of the target bidirectional buck-boost converter. During the test, the high-voltage power supply 120 provides energy to the target bidirectional buck-boost converter to enable subsequent test operations.
[0029] In the embodiment, the test port group 130 comprises input positive and negative bus ports 131 for connecting the input side of the target bidirectional step-up / down converter and output positive and negative bus ports 132 for connecting the output side of the target bidirectional step-up / down converter, the input positive and negative bus ports 131 in each test port group 130 are connected in parallel with each other, and the output positive and negative bus ports 132 in each test port group 130 are connected in parallel with each other; the high-voltage power supply 120 is connected in parallel with the input positive and negative bus ports 131 in each test port group 130; the sampling circuit 140 is connected with the host computer 110 and is arranged on each power tube of the target bidirectional step-up / down converter for collecting parameters of each power tube during testing.
[0030] It should be noted that the input positive and negative bus ports 131 and the output positive and negative bus ports 132 are determined according to the working mode of the target bidirectional step-up / down converter. Generally, the target bidirectional step-up / down converter mainly works in a boost mode (BOOST mode), in which the side with the inductor is the input side, and the side of the bridge arm of the power tube is the output side. If the target bidirectional step-up / down converter works in a buck mode (BUCK mode), the input side and the output side are arranged reversely. In the embodiment, the input side and the output side refer to the input side and the output side in the BOOST mode, that is, the input positive and negative bus ports 131 are connected with the inductor and the power tube in the target bidirectional step-up / down converter, and the output positive and negative bus ports 132 are connected with the two power tubes in the target bidirectional step-up / down converter.
[0031] In the embodiment, the number of test port groups 130 can be an even multiple or an odd multiple. When the number of test port groups 130 is an even multiple, the test port groups are arranged in a two-by-two combination, and the test port groups can also be arranged in a one-to-many manner.
[0032] It can be understood that the test device further comprises a circuit board 150 for carrying the host computer 110, the high-voltage power supply 120, the at least two test port groups 130, and the sampling circuit 140, wherein the input positive and negative bus ports 131 and the output positive and negative bus ports 132 in each test port group 130 are symmetrically arranged on the circuit board 150, and the input positive and negative bus ports 131 and the output positive and negative bus ports 132 are connected in parallel through electronic circuits (such as the double-headed arrow lines in the figure).
[0033] It should be noted that the symmetry here should be understood as the symmetry of the setting direction, and can also be the symmetry of the quantity and distribution position. Two areas A and B are provided on the circuit board 150, and the area A and the area B are arranged in parallel near the left and right ends of the circuit board 150. The input positive and negative bus port 131 is provided in the area A, and the output positive and negative bus port 132 is provided in the area B. The input positive and negative bus port 131 and the output positive and negative bus port 132 can be realized in the form of a terminal post, and then all the input positive and negative bus ports 131 are connected in parallel and all the output positive and negative bus ports 132 are connected in parallel through the electronic circuit from the back of the circuit board 150.
[0034] In another possible implementation, the symmetry of the test port group 130 can also be used as an object, as shown in Figure 2 Each two test port groups 130 are arranged as a test group, and the layout from left to right is input positive and negative bus port 131→output positive and negative bus port 132→output positive and negative bus port 132→input positive and negative bus port 131. The high-voltage power supply 120 is connected in parallel with the input positive and negative bus port 131 on the left or the right. For Figure 2 The arrangement mode in the above is mainly the layout mode preferably adopted when the at least two test port groups are 2N test port groups, that is, each two test port groups are connected in parallel to form a test loop, and the input positive and negative bus of each test loop is connected with the high-voltage power supply.
[0035] Further, when each two test port groups 130 are arranged as a test group, the layout mode of sharing one test port group 130 by multiple test groups can also be used, as shown in Figure 3 2N-1 test port groups 130 in the 2N test port groups 130 are arranged from top to bottom, and the last one is arranged in the left area of the 2N-1 test port groups 130. The output positive and negative bus port 132 of the 2N-1 test port groups 130 is connected in parallel with the output positive and negative bus port 132 of the test port group 130 in the left area. Such an arrangement mode is actually a multi-input single-output structure layout.
[0036] Further, for an odd number of test port groups 130, the arrangement mode is the same as that in Figure 3 That is, one test port in the 2N-1 test port groups and 2N-2 test port groups respectively form a test loop, and the input positive and negative bus of each test loop is connected with the high-voltage power supply.
[0037] In another possible implementation, in order to facilitate the testing device to install the target bidirectional buck-boost converter, the testing device further comprises a connection structure for realizing parallel connection of the input positive and negative bus port in each of the testing port groups or the output positive and negative bus port in each of the testing port groups, wherein the connection structure is one of a jumper wire harness and a switch circuit.
[0038] In another possible implementation, the sampling circuit 140 can be implemented by various sensors, preferably voltage and current sensors, that is, the sampling circuit 140 comprises a current sampling circuit and a voltage sampling circuit connected to the host computer; the current sampling circuit is connected to an inductor in the target bidirectional buck-boost converter, for collecting real-time current values on the inductor; and the voltage sampling circuit is connected in parallel to the input positive and negative bus port 131 and the output positive and negative bus port 132, for collecting input voltages and output voltages of each target bidirectional buck-boost converter.
[0039] The bidirectional buck-boost testing device provided in the application comprises a host computer, a high-voltage power supply, at least two testing port groups and a sampling circuit. The testing device is used for testing the converter by using one high-voltage power supply and at least two testing port groups, and the testing port groups are in parallel connection. The high-voltage power supply is reused. The testing device has a simple circuit structure and can simultaneously test multiple converters, thereby greatly improving the testing efficiency and reducing the testing cost.
[0040] As shown in Figure 4 FIG. 1 is a structural schematic diagram of a bidirectional buck-boost conversion system provided in an embodiment of the application. The system comprises a bidirectional buck-boost testing device and at least two bidirectional buck-boost converters 300; input sides of the bidirectional buck-boost converters 300 are connected in parallel to the input positive and negative bus port 131, and output sides of the bidirectional buck-boost converters 300 are connected in parallel to the output positive and negative bus port 132; and the sampling circuit 140 is arranged on each power tube of the bidirectional buck-boost converter 300.
[0041] It should be noted that the sampling circuit 140 can be implemented by using a current sensor, a voltage sensor, an ammeter, a voltmeter or the like. One sampling circuit is arranged for each power tube and inductor, or one sampling circuit is arranged on the bus on the output side.
[0042] In the embodiment, the at least two bidirectional buck-boost converters form a test loop with each other, and the working modes of the two bidirectional buck-boost converters in each test loop should be different from each other. One is in BUCK mode, and the other is in BOOST mode. In order to ensure the accuracy of the test and improve the efficiency, the performance parameters of the bidirectional buck-boost converters in the same test loop are selected to be the same.
[0043] Based on the above system circuit structure, the specific setting mode can include the following three, which are respectively set as two bidirectional buck-boost converters, three bidirectional buck-boost converters and four bidirectional buck-boost converters.
[0044] As shown in Figure 5 and 6 , it is the circuit principle diagram of the system of setting two bidirectional buck-boost converters. In the figure, bidirectional buck-boost converter 1 and bidirectional buck-boost converter 2 are respectively set, high-voltage power supply DC3, wherein the two bidirectional buck-boost converters each have two power tubes, an inductor and two capacitors, two power tubes in series form a bridge arm, and the inductor is connected at the midpoint of the bridge arm, and a capacitor is connected in parallel between the inductor and one of the power tubes as an input capacitor, and another capacitor is connected in parallel at both ends of the bridge arm as an output capacitor.
[0045] As shown in Figure 5 , DC3 is the high-voltage power supply shared by the two bidirectional buck-boost converters; Uin is the given voltage of the high-voltage power supply; L2 is the inductor on the bidirectional buck-boost converter 1; CIN2 is the input capacitor on the bidirectional buck-boost converter 1; Q3, Q4 are SIC power tubes on the bidirectional buck-boost converter 1; Cout2 is the output capacitor on the bidirectional buck-boost converter 1; L3 is the inductor on the bidirectional buck-boost converter 2; CIN3 is the input capacitor on the bidirectional buck-boost converter 2; Q5, Q6 are SIC power tubes on the bidirectional buck-boost converter 2; Cout3 is the output capacitor on the bidirectional buck-boost converter 2; Uout is the output voltage of the two bidirectional buck-boost converters; The bidirectional buck-boost converter 1 and the bidirectional buck-boost converter 2 are arranged side by side, wherein L2 and L3 are connected together at one end connected with the input capacitor, and the high-voltage power supply DC3 is connected together at one end connected with the input capacitor, to realize the parallel connection of the input side of the two bidirectional buck-boost converters, and the drain of Q3 and Q5 is connected together, so as to realize the parallel connection of the output side.
[0046] In addition to the longitudinal parallel arrangement in Figure 5 , it can also be transverse parallel, as shown in Figure 6 , the transverse parallel, that is, the input side and the output side of the two bidirectional buck-boost converters are symmetrically arranged, that is, the output side is close to the setting, and the input side is far away from the setting.
[0047] Based on this, during testing, the two bidirectional buck-boost converters are controlled by the upper computer to work in different modes, for example, the bidirectional buck-boost converter 1 works in BOOST mode, and the bidirectional buck-boost converter 2 works in BUCK mode:
[0048] The working principle of the bidirectional step-up / down converter 1 is that the host computer starts Q4 to conduct, the induced electromotive force U1 of the inductor L2 is left positive and right negative, the inductor L2 stores energy, and the voltage across the output capacitor Cout2 is 0V; when Q4 is disconnected, the current in the inductor L2 decreases, the induced electromotive force is left negative and right positive, at this time, the voltage across the output capacitor Cout2 is Uin+U1, thereby achieving the purpose of step-up; the working principle of the bidirectional step-up / down converter 2 is that the host computer starts Q5 to conduct, the induced electromotive force U2 of the inductor L3 is left positive and right negative, the inductor L3 stores energy, and the voltage across the input capacitor CIN3 is Uin+U1-U2; since the voltages across CIN2 and CIN3 are the voltage Uin set by the high-voltage source, the values of U1 and U2 in the topology are equal; when Q5 is disconnected, Q6 enters the freewheeling state, the current in the inductor L3 decreases, the induced electromotive force is left negative and right positive, at this time, the inductor L3, Q6 and CIN3 form a freewheeling circuit, and the voltage across the inductor is equal to the voltage across CIN3, that is, the voltage Uin of the high-voltage source; at this time, the sampling circuit samples the values of the inductors L2 and L3, Uin and Uout to determine whether the two bidirectional step-up / down converters are normal.
[0049] Conversely, if the bidirectional step-up / down converter 1 works in BUCK mode and the bidirectional step-up / down converter 2 works in BOOST mode: the working principle of the bidirectional step-up / down converter 2 is that the host computer starts Q6 to conduct, the induced electromotive force U2 of the inductor L3 is left negative and right positive, the inductor L3 stores energy, and the voltage across the output capacitor Cout3 is 0V; when Q6 is disconnected, the current in the inductor L3 decreases, the induced electromotive force is left positive and right negative, at this time, the voltage across the output capacitor Cout3 is Uin+U2, thereby achieving the purpose of step-up; the working principle of the bidirectional step-up / down converter 1 is that the host computer starts Q3 to conduct, the induced electromotive force U2 of the inductor L2 is left negative and right positive, the inductor L2 stores energy, and the voltage across the input capacitor CIN3 is Uin+U2-U1; since the voltages across CIN2 and CIN3 are the voltage Uin set by the high-voltage source, the values of U1 and U2 in the topology are equal; when Q3 is disconnected, Q4 enters the freewheeling state, the current in the inductor L2 decreases, the induced electromotive force is left positive and right negative, at this time, the inductor L2, Q4 and CIN2 form a freewheeling circuit, and the voltage across the inductor is equal to the voltage across CIN2, that is, the voltage Uin of the high-voltage source; at this time, the sampling circuit samples the values of the inductors L2 and L3, Uin and Uout to determine whether the two bidirectional step-up / down converters are normal.
[0050] When three bidirectional step-up / down converters are set, the bidirectional step-up / down converters 1 and 3 form a test loop, and the bidirectional step-up / down converters 2 and 3 form a test loop, as shown in Figure 7As shown, bidirectional buck-boost converters 1 and 2 are arranged in a longitudinal direction, bidirectional buck-boost converters 1 and 3 are arranged in a transverse direction, and bidirectional buck-boost converters 2 and 3 are arranged in a transverse direction. Bidirectional buck-boost converters 1, 2 and 3 are all converters with the same performance. During testing, the host computer controls bidirectional buck-boost converters 1 and 2 to work in the same working mode, and bidirectional buck-boost converter 3 works in another working mode. For example, bidirectional buck-boost converters 1 and 2 work in the BOOST mode, and bidirectional buck-boost converter 3 works in the BUCK mode.
[0051] Similarly, when four bidirectional buck-boost converters are arranged, the four bidirectional buck-boost converters can be combined in two groups, for example, Figure 8 As shown, bidirectional buck-boost converters 1 and 2 form a test loop, bidirectional buck-boost converters 3 and 4 form another test loop, and both test loops are arranged in the manner of Figure 6 In addition, bidirectional buck-boost converters 1-4 can also be arranged in the manner of Figure 7 Specifically, bidirectional buck-boost converters 1-3 are arranged in a longitudinal direction, and bidirectional buck-boost converter 4 is arranged in a transverse direction with bidirectional buck-boost converter 1.
[0052] In summary, the inputs of multiple identical bidirectional buck-boost converters are connected in parallel, and the outputs are also connected in parallel. Such an arrangement only needs to provide one high-voltage power supply. When at least one bidirectional buck-boost converter works in the BOOST mode, the other bidirectional buck-boost converters that form a loop with the bidirectional buck-boost converter working in the BOOST mode work in the BUCK mode. Such a test cycle ensures that both working modes of each bidirectional buck-boost converter can be tested. This test scheme only needs one high-voltage power supply and does not require the high-voltage source to have a large power. In addition, this test scheme can simultaneously test multiple bidirectional buck-boost converters at a time, greatly saving test time and resources, and can bring considerable economic efficiency.
[0053] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process of the system and device described above can refer to the corresponding process in the foregoing method embodiments, which will not be described here.
[0054] In addition, in the description of the embodiments of the present application, unless otherwise explicitly specified and limited, the terms "mounting", "connection" and "connection" should be understood in a broad sense, for example, it can be fixed connection, or detachable connection, or integral connection; it can be mechanical connection, or electrical connection; it can be direct connection, or indirect connection through an intermediate medium, or internal communication of two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.
[0055] In the description of the present application, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" and the like indicate the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", "third" are only for the purpose of description, and cannot be understood as indicating or implying relative importance.
[0056] Finally, it should be noted that the above embodiments are only specific embodiments of the present application, used to illustrate the technical solutions of the present application, and are not limiting. The protection scope of the present application is not limited thereto. Although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can modify or easily think of changes to the technical solutions recorded in the foregoing embodiments, or make equivalent replacements to some technical features thereof, within the technical scope disclosed by the present application. Such modifications, changes or replacements do not cause the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.
Claims
1. A bidirectional boost / buck voltage testing device, characterized in that, include: The system includes a host computer, a high-voltage power supply, a sampling circuit, and at least two test port groups, wherein each of the test port groups is connected in parallel. The output terminal of the host computer is connected to each power transistor of the target bidirectional buck-boost converter, and is used to output drive signals to control the conduction and cutoff of each power transistor; The test port group includes input positive and negative bus ports for connecting the input side and the output positive and negative bus ports of the target bidirectional buck-boost converter. The input positive and negative bus ports in each test port group are connected in parallel with each other, and the output positive and negative bus ports in each test port group are connected in parallel with each other. The high-voltage power supply is connected in parallel to the input positive and negative bus ports in each of the test port groups; The sampling circuit is connected to the host computer and is located on each power transistor of the target bidirectional buck-boost converter to collect the parameters of each power transistor during testing.
2. The bidirectional boost / buck testing device according to claim 1, characterized in that, Also includes: A circuit board for carrying the host computer, the high-voltage power supply, the sampling circuit, and the at least two test port groups; The input positive and negative bus ports and output positive and negative bus ports in each of the test port groups are symmetrically arranged on the circuit board, and the input positive and negative bus ports and the output positive and negative bus ports are connected in parallel through electronic circuits.
3. The bidirectional boost / buck testing device according to claim 1, characterized in that, The at least two test port groups are 2N test port groups, and every two test port groups are connected in parallel to form a test circuit, and the positive and negative input buses of each test circuit are connected to the high-voltage power supply.
4. The bidirectional boost / buck testing device according to claim 1, characterized in that, The at least two test port groups are 2N-1 test port groups. One test port in the 2N-1 test port groups and the 2N-2 test port groups respectively form a test circuit, and the positive and negative input buses of each test circuit are connected to the high-voltage power supply.
5. The bidirectional boost / buck testing device according to any one of claims 1-4, characterized in that, Also includes: This is a connection structure used to implement the parallel connection of the input positive and negative bus ports or the output positive and negative bus ports in each of the test port groups.
6. The bidirectional boost / buck testing device according to claim 5, characterized in that, The connection structure can be either a jumper harness or a switching circuit.
7. The bidirectional boost / buck testing device according to claim 1, characterized in that, The sampling circuit includes a current sampling circuit and a voltage sampling circuit connected to the host computer; The current sampling circuit is connected to the inductor in the target bidirectional buck-boost converter and is used to collect the real-time current value on the inductor. The voltage sampling circuit is connected in parallel to the input positive and negative bus ports and the output positive and negative bus ports, and is used to collect the input voltage and output voltage of each of the target bidirectional buck-boost converters.
8. A bidirectional buck-boost converter system, characterized in that, include: The bidirectional buck-boost test device as described in any one of claims 1-6 and at least two bidirectional buck-boost converters; the input side of each bidirectional buck-boost converter is connected in parallel with the input positive and negative bus ports, and the output side of each bidirectional buck-boost converter is connected in parallel with the output positive and negative bus ports; the sampling circuit is disposed on each power transistor of the bidirectional buck-boost converter.
9. The bidirectional buck-boost converter system according to claim 8, characterized in that, At least one of the at least two bidirectional buck-boost converters has an operating mode that is different from the operating modes of the other bidirectional buck-boost converters; Each test loop consists of two bidirectional buck-boost converters with different operating modes, and the performance parameters of the bidirectional buck-boost converters in the same test loop are the same.
10. The bidirectional buck-boost converter system according to claim 9, characterized in that, The operating mode includes either buck mode or boost mode.