Small-space low-impedance self-made elastic sheet probe electrical performance testing mechanism
By designing a self-made spring probe electrical performance testing mechanism, the problems of metal sheet deformation and narrow space contact caused by standard probes were solved, achieving low impedance contact and improved equipment compatibility.
Patent Information
- Application Number
- CN202520058840.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-10
- Publication Date
- 2026-01-13
- Estimated Expiration
- 2035-01-10
AI Technical Summary
When testing metal conductive sheets, the standard probes in existing products can cause deformation of the metal sheets and cannot make effective contact in confined spaces, affecting subsequent processes and equipment compatibility.
A small-space, low-impedance self-made spring probe electrical performance testing mechanism was designed, including a frame, a pressing cylinder, an upper electrode conduction mechanism, a motor-driven turntable, a self-made spring probe testing mechanism, and a lower electrode elastic mechanism. The self-made elastic probe contacts the side of the product, avoiding deformation and reducing contact impedance.
It achieves stable contact in confined spaces, reduces contact resistance, improves testing efficiency and equipment compatibility, and ensures the pass rate of simultaneous testing of multiple product groups.
Smart Images
Figure CN223796569U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of performance testing mechanisms, and in particular to a small-space, low-impedance self-made spring probe electrical performance testing mechanism. Background Technology
[0002] When performing performance testing on metal conductive sheets, a self-made spring probe electrical performance testing mechanism with small space and low impedance is required.
[0003] Existing products have soft metal conductive sheets. When a standard probe (with a spring force of 1-2N) contacts the conductive sheet from the bottom, the metal sheet will bend uncertainly in the left and right directions, affecting the functionality of the product in the next process. Existing products also have small spaces on both sides of the metal conductive sheet. Other components on both sides of the metal conductive sheet block the probe, and the distance on one side is only 10.32mm, making it impossible to select a suitable standard probe to contact the metal conductive sheet from both sides. To solve the above problems, this application proposes a self-made spring probe electrical performance testing mechanism with small space and low impedance. Utility Model Content
[0004] The purpose of this invention is to address the shortcomings of existing technologies by proposing a small-space, low-impedance self-made spring probe electrical performance testing mechanism. This structure is applied to parallel electrical performance testing equipment for multiple low-impedance products of the same type, thereby increasing equipment capacity. By replacing different upper and lower electrodes, probe mechanisms, and product carriers, the compatibility of the equipment with different products is improved.
[0005] To achieve the above objectives, the present invention adopts the following technical solution:
[0006] A self-made spring probe electrical performance testing mechanism for small space and low impedance includes a frame, a pressing cylinder fixedly connected to the frame, an upper electrode conduction mechanism fixedly connected to the output end of the pressing cylinder, a motor on one side of the frame, a turntable body fixedly connected to the output shaft end of the motor, four turntable product carriers fixedly connected to the turntable body, multiple pairs of lower electrode elastic mechanisms installed on the frame, a product placed on the top of each pair of lower electrode elastic mechanisms, and multiple pairs of lifting cylinders fixedly connected to the frame, with a self-made spring probe testing mechanism fixedly connected to the top of each lifting cylinder.
[0007] Preferably, multiple probes are fixedly connected to the bottom of the upper electrode conduction mechanism.
[0008] Preferably, the turntable product carrier has six through holes, and the probe is disposed through the through holes.
[0009] Preferably, the self-made spring probe testing mechanism includes a gripper, a self-made PCBA, and a self-made elastic probe. The gripper is fixedly connected to the output end of the lifting cylinder. The self-made PCBA is disposed on the side wall of the gripper and fixedly connected thereto. The self-made elastic probe is disposed on the gripper and fixedly connected thereto.
[0010] Preferably, the lower electrode elastic mechanism includes a base, a telescopic rod, a spring, and a support platform. The base is fixedly connected to the frame, the bottom of the telescopic rod is fixedly connected to the base, the support platform is fixedly connected to the top of the telescopic rod, the spring is sleeved on the outer wall of the output end of the telescopic rod, and the two ends of the spring are fixedly connected to the telescopic rod and the support platform, respectively.
[0011] Preferably, the product is placed on top of the support platform.
[0012] Compared with the prior art, the advantages of this utility model are as follows:
[0013] 1. This utility model avoids the problem of deformation of the standard probe when it comes into contact with the metal conductive piece of the product during the testing process.
[0014] 2. This utility model ensures full contact with the side of the conductive metal sheet of the product while reducing contact resistance (impedance < 0.5 milliohms), thus guaranteeing the first-pass rate of multiple products being tested simultaneously.
[0015] 3. This utility model is small in size and can completely replace the standard probe for repeated movement in a small space.
[0016] In summary, this structure is applied to parallel electrical performance testing equipment for multiple low-impedance products of the same type, thereby increasing the equipment's capacity. By replacing different upper and lower electrodes, probe mechanisms, and product carriers, the compatibility of the equipment with different products is improved. Attached Figure Description
[0017] Figure 1 This is a schematic diagram of the structure of a self-made small-space, low-impedance spring probe electrical performance testing mechanism proposed in this utility model;
[0018] Figure 2 This is a schematic diagram of the structure of a small-space, low-impedance self-made spring probe electrical performance testing mechanism proposed in this utility model, excluding the turntable body.
[0019] Figure 3 This is a schematic diagram of the self-made spring probe testing mechanism in the small-space, low-impedance self-made spring probe electrical performance testing mechanism proposed in this utility model;
[0020] Figure 4 This is a schematic diagram of the lower electrode elastic mechanism in a self-made small-space, low-impedance spring probe electrical performance testing mechanism proposed in this utility model.
[0021] In the diagram: 1. Pressing cylinder, 2. Upper electrode conduction mechanism, 3. Turntable product carrier, 4. Self-made spring probe testing mechanism, 4-1. Pneumatic gripper, 4-2. Self-made PCBA, 4-3. Self-made elastic probe, 5. Lower electrode elastic mechanism, 5-1. Base, 5-2. Telescopic rod, 5-3. Spring, 5-4. Support platform, 6. Lifting cylinder, 7. Frame, 8. Motor, 9. Turntable body, 10. Probe, 11. Through hole. Detailed Implementation
[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.
[0023] Reference Figures 1-4 A self-made small-space, low-impedance spring probe electrical performance testing mechanism includes a frame 7, a pressing cylinder 1 fixedly connected to the frame 7, an upper electrode conduction mechanism 2 fixedly connected to the output end of the pressing cylinder 1, and multiple probes 10 fixedly connected to the bottom of the upper electrode conduction mechanism 2.
[0024] A motor 8 is provided on one side of the frame 7. The output shaft of the motor 8 is fixedly connected to the turntable body 9. The motor 8 can drive the turntable body 9 to rotate. Four turntable product carriers 3 are fixedly connected to the turntable body 9. Six through holes 11 are provided on the turntable product carriers 3. The probe 10 is set through the through holes 11.
[0025] Multiple pairs of lower electrode elastic mechanisms 5 are installed on the frame 7. Each lower electrode elastic mechanism 5 includes a base 5-1, a telescopic rod 5-2, a spring 5-3, and a support platform 5-4. The base 5-1 is fixedly connected to the frame 7. The bottom of the telescopic rod 5-2 is fixedly connected to the base 5-1. The support platform 5-4 is fixedly connected to the top of the telescopic rod 5-2. The spring 5-3 is sleeved on the outer wall of the output end of the telescopic rod 5-2. Both ends of the spring 5-3 are fixedly connected to the telescopic rod 5-2 and the support platform 5-4, respectively. The product is placed on top of the support platform 5-4. Products are placed on the top of the lower electrode elastic mechanism 5. Multiple pairs of lifting cylinders 6 are fixedly connected to the frame 7. A self-made spring probe testing mechanism 4 is fixedly connected to the top of each lifting cylinder 6. The self-made spring probe testing mechanism 4 includes a gripper 4-1, a self-made PCBA 4-2, and a self-made elastic probe 4-3. The gripper 4-1 is fixedly connected to the output end of the lifting cylinder 6. The self-made PCBA 4-2 is set on the side wall of the gripper 4-1 and fixedly connected to it. The self-made elastic probe 4-3 is set on the gripper 4-1 and fixedly connected to it.
[0026] The working principle of this utility model is as follows:
[0027] 1. The turntable product carrier 3 is in place;
[0028] 2. The lower cylinder 1 carries the upper electrode conducting mechanism 2 through the product. The lower cylinder 1 provides stable pressure to press the upper electrode conducting mechanism 2 onto the lower electrode elastic mechanism 5 to form a circuit.
[0029] 3. The lifting cylinder 6 drives the self-made spring probe testing mechanism 4 upward, and the gripper 4-1 closes the self-made elastic probe 4-3 (probe elastic force 6.76N) to fully contact the side of the conductive metal sheet of the product to provide power and signal detection to the product.
Claims
1. A small space low impedance self-made bullet probe electrical performance test mechanism, comprising a frame (7), characterized in that, The frame (7) is fixedly connected with a lower pressing cylinder (1), the output end of the lower pressing cylinder (1) is fixedly connected with an upper electrode conducting mechanism (2), one side of the frame (7) is provided with a motor (8), the output shaft end of the motor (8) is fixedly connected with a turntable body (9), the turntable body (9) is fixedly connected with four turntable product carriers (3), a plurality of pairs of lower electrode elastic mechanisms (5) are installed on the frame (7), the top of each pair of lower electrode elastic mechanisms (5) is placed with a product, a plurality of pairs of jacking cylinders (6) are fixedly connected on the frame (7), the top of each jacking cylinder (6) is fixedly connected with a self-made elastic sheet probe testing mechanism (4).
2. The small space low impedance self-made bullet probe electrical performance test mechanism according to claim 1, characterized in that, The bottom of the upper electrode conducting mechanism (2) is fixedly connected with a plurality of probes (10).
3. The small space low impedance self-made bullet probe electrical performance test mechanism according to claim 2, characterized in that, Six through holes (11) are provided through the turntable product carrier (3), and the probes (10) are arranged through the through holes (11).
4. The small space low impedance self-made bullet probe electrical performance test mechanism according to claim 1, characterized in that, The self-made elastic sheet probe testing mechanism (4) comprises a gas claw (4-1), a self-made PCBA (4-2) and a self-made elastic probe (4-3), the gas claw (4-1) is fixedly connected with the output end of the jacking cylinder (6), the self-made PCBA (4-2) is arranged on the side wall of the gas claw (4-1) and fixedly connected therewith, and the self-made elastic probe (4-3) is arranged on the gas claw (4-1) and fixedly connected therewith.
5. The small space low impedance self-made bullet probe electrical performance test mechanism according to claim 1, characterized in that, The lower electrode elastic mechanism (5) comprises a base (5-1), a telescopic rod (5-2), a spring (5-3) and a support table (5-4), the base (5-1) is fixedly connected with the frame (7), the bottom of the telescopic rod (5-2) is fixedly connected with the base (5-1), the support table (5-4) is fixedly connected with the top of the telescopic rod (5-2), the spring (5-3) is sleeved on the outer wall of the output end of the telescopic rod (5-2), and the two ends of the spring (5-3) are fixedly connected with the telescopic rod (5-2) and the support table (5-4) respectively.
6. The small space low impedance self-made bullet probe electrical performance test mechanism according to claim 1, characterized in that, The product is placed on the top of the support table (5-4).