Testing device

Abstract

The utility model discloses a testing device, which comprises a testing plate, a preset adapter plate, a testing jig and a temperature control unit, the preset adapter plate is fixedly connected to one side of the testing plate, the testing jig is fixedly arranged on the preset adapter plate, an accommodating cavity is arranged in the testing jig, and the temperature control unit is arranged in the accommodating cavity. One side wall of the accommodating cavity is formed on one side, far away from the test plate, of the preset adapter plate, and the temperature control unit is arranged in the accommodating cavity; wherein the projection size of the test fixture on the test board is smaller than the projection size of the preset adapter board on the test board, the preset adapter board is also provided and connected with a plurality of test contacts, and the test contacts are arranged outside the accommodating cavity and are arranged at intervals with the test fixture. Through the structure, the influence of temperature regulation of the temperature control unit on the testing device and signal transmission can be reduced, and the stability of the testing device and the testing accuracy are improved.

Description

TECHNICAL FIELD

[0001] The utility model is applied to the technical field of device testing, and particularly to a testing device. BACKGROUND

[0002] Electronic devices generally need to be tested for corresponding functions after being manufactured, so as to facilitate detection of the performance of the devices.

[0003] Current device testing can only be performed at room temperature, and as the demand for various types of devices is increasing, the current technology does not meet the special testing requirements of some devices, for example, some devices need to work stably in an extreme temperature range, and therefore extreme temperature testing is required.

[0004] However, the current testing device cannot guarantee signal transmission without interference at an extreme temperature, and therefore can easily cause unstable and inaccurate testing. UTILITY MODEL CONTENTS

[0005] The utility model provides a testing device to solve the problem of unstable and inaccurate device testing at an extreme temperature.

[0006] To solve the above technical problem, the utility model provides a testing device, which comprises a test board, a preset adapter plate, a test fixture, and a temperature control unit, the preset adapter plate is fixedly connected to one side of the test board, the test fixture is fixedly installed on the preset adapter plate, the test fixture is provided with a containing cavity, one side cavity wall of the containing cavity is formed on the side of the preset adapter plate away from the test board, and the temperature control unit is arranged in the containing cavity; wherein the projected size of the test fixture on the test board is smaller than the projected size of the preset adapter plate on the test board, a plurality of test contacts are further arranged and connected on the preset adapter plate, and the test contacts are arranged outside the containing cavity and are arranged at intervals from the test fixture.

[0007] The test fixture comprises a cover plate and a fixed structural member, the fixed structural member is fixedly connected to the side of the preset adapter plate away from the test board, and the fixed structural member is provided with the containing cavity, the cover plate is movably arranged on the side of the fixed structural member away from the test board, and the temperature control unit is fixedly arranged on the side of the cover plate close to the test board.

[0008] The fixed structural member comprises a first fixed member and a second fixed member, the first fixed member is fixedly arranged on the side of the preset adapter plate away from the test board and on one side of the test board, so as to fix the preset adapter plate on the test board, the first fixed member is provided with a first hollow area, the second fixed member is fixedly connected to the side of the first fixed member away from the test board, the first fixed member is provided with a second hollow area, and the first hollow area and the second hollow area form the containing cavity.

[0009] The cover plate comprises a cover plate body and a buckle; one end of the cover plate body is movably connected with the fixing structure; a buckle is fixedly arranged on the other end of the cover plate body and used for being clamped and fixed with the fixing structure.

[0010] The cover plate body comprises a knob cover plate, a knob and a spring; one end of the knob cover plate is movably connected with the fixing structure; a buckle is fixedly arranged on the knob and used for being clamped and fixed with the fixing structure; the knob is arranged on the side of the knob cover plate away from the test plate; the spring is arranged between the knob and the knob cover plate and connected with the knob and the knob cover plate at opposite ends.

[0011] The cover plate body further comprises a heat insulation plate; the heat insulation plate is arranged on the side of the cover plate body close to the fixing structure; and the temperature control unit is fixedly arranged on the side of the heat insulation plate close to the test plate.

[0012] The temperature control unit comprises a temperature control mechanism, a connector and a controller; the temperature control mechanism is arranged in the accommodating cavity; the controller is arranged outside the accommodating cavity; and the connector is arranged through the test fixture to connect the temperature control mechanism and the controller.

[0013] The temperature control unit is fixedly provided with a heat conduction member on the side close to the test plate; when the measured object is placed in the accommodating cavity, the side of the heat conduction member away from the temperature control unit is in contact with the measured object.

[0014] The temperature control mechanism comprises a temperature control circuit board, a temperature control sheet and a temperature sensor; the temperature control circuit board is connected with the connector and the temperature control sheet; and the controller is further connected with the temperature sensor.

[0015] The temperature sensor comprises two; the two temperature sensors are arranged on two obliquely opposite corners of the temperature control circuit board.

[0016] The test device comprises a test plate, a preset adapter plate, a test fixture and a temperature control unit; the preset adapter plate is fixedly connected on one side of the test plate; the test fixture is fixedly installed on the preset adapter plate; the test fixture is provided with an accommodating cavity; one side of the accommodating cavity is formed by a side cavity wall of the side of the preset adapter plate away from the test plate; and the temperature control unit is arranged in the accommodating cavity. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 is a structural schematic view of an embodiment of the test device provided by the utility model.

[0018] Figure 2 is an explosion structural schematic view of another embodiment of the test device provided by the utility model.

[0019] Figure 3 is a structural schematic view of an embodiment of the temperature control mechanism. DETAILED DESCRIPTION

[0020] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.

[0021] It should be noted that if the embodiments of the utility model involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative positional relationship, movement condition, etc. between components in a certain specific posture (as shown in the drawings). If the specific posture changes, the directional indications will also change accordingly.

[0022] In addition, if the embodiments of the utility model involve descriptions of "first", "second", etc., the descriptions of "first", "second", etc. are only for description purposes, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features with "first", "second" can explicitly or implicitly include at least one of the features. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the fact that a person skilled in the art can realize it. When the combination of technical solutions contradicts each other or cannot be realized, it should be considered that the combination of technical solutions does not exist and is not within the scope of protection required by the utility model.

[0023] Please refer to Figure 1 , Figure 1 is a structural schematic view of an embodiment of the test device provided by the utility model.

[0024] The test device 100 of the embodiment comprises a test plate 110, a preset adapter plate 120, a test fixture 130 and a temperature control unit 140.

[0025] The test board 110 is a master control board with test functions, used to control the specific test process of the measured object. In a specific application scenario, the test board 110 includes a functional board 111 and a connecting board 112 connected and fixed to each other, the connecting board 112 is used to be connected and fixed with other components, and the functional board 111 is used to realize the test function and control the test process. In a specific application scenario, the test board 110 can also include an integral board, which has both the functions of testing and connecting. The specific structure of the test board 110 is not limited here.

[0026] The preset adapter board 120 is fixedly connected to one side of the test board 110, and in a specific application scenario, it can be fixedly connected to one side of the connecting board 112.

[0027] The test fixture 130 is fixedly installed on the preset adapter board 120, and the test fixture 130 is provided with a containing cavity 131, and the side of the preset adapter board 120 away from the test board 110 forms a side cavity wall of the containing cavity 131, that is, the containing cavity 131 is open on the side close to the preset adapter board 120, and the opening is fixedly covered by the preset adapter board 120.

[0028] The containing cavity 131 is used to place the measured object, which includes but is not limited to chips, transistors, resistors, capacitors, inductors, potentiometers, electron tubes, heat sinks, electromechanical elements, connectors, semiconductor discrete devices, electroacoustic devices, laser devices, electronic display devices, etc.

[0029] When the measured object is placed in the containing cavity 131, the measured object is in contact with and connected to the preset adapter board 120, so as to be connected to the test board 110 through the preset adapter board 120 for testing.

[0030] The temperature control unit 140 is arranged in the containing cavity 131, and is used to change the temperature in the containing cavity 131, so that the environmental temperature of the measured object is the target temperature required for testing, thereby performing the corresponding temperature test.

[0031] The preset adapter board 120 is also provided with and connected to a plurality of test contacts 121, and the test contacts 121 are arranged outside the containing cavity 131 and are spaced apart from the test fixture 130. At this time, the measured object is connected to the test board 110 through the preset adapter board 120, and is also connected to the test contacts 121 through the preset adapter board 120, so that when the measured object and the test board 110 interact with signals, the oscilloscope probe contacts the test contacts 121 to detect the signal interaction, and then the related test of the measured object is performed.

[0032] The projection size of the test fixture 130 on the test board 110 is smaller than the projection size of the preset adapter plate 120 on the test board 110, that is, the test fixture 130 only overlaps and fits with part of the preset adapter plate 120, but there is another part on the preset adapter plate 120 that does not overlap and fit with the preset adapter plate 120, and the non-overlapping part is used to set the test contact 121, so that when the probe of the oscilloscope detects the signal transmission between the measured object and the test board 110 by connecting the test contact 121, it is detected outside the accommodation cavity 131, and then is not interfered by the temperature control unit 140, improves the measurement accuracy, reduces the influence on the probe, and prolongs the service life of the probe.

[0033] The preset adapter plate 120 is arranged between the accommodation cavity 131 and the test board 110 to insulate heat, thereby reducing the influence of the temperature control unit 140 on the test board 110, and improving the functional stability of the test board 110.

[0034] The preset adapter plate 120 is arranged between the accommodation cavity 131 and the test board 110 to insulate heat, thereby reducing the influence of the temperature control unit 140 on the test board 110, and improving the functional stability of the test board 110.

[0035] The test of the embodiment includes but is not limited to SI test (hardware signal quality test) or PI test (power supply test).

[0036] Through the above structure, the test device includes a test board, a preset adapter plate, a test fixture and a temperature control unit, the preset adapter plate is fixedly connected to one side of the test board, the test fixture is fixedly installed on the preset adapter plate, the test fixture is provided with an accommodation cavity, one side wall of the accommodation cavity is formed on the side of the preset adapter plate away from the test board, and the temperature control unit is arranged in the accommodation cavity.

[0037] Please refer to Figure 2 , Figure 2 It is an explosion structure schematic diagram of another embodiment of the test device provided by the utility model.

[0038] The positions and connection relationships among the test plate 210, the preset adapter plate 220, the test fixture (not labeled in the figure), and the temperature control unit 250 of the test device 200 of this embodiment are the same as those of the foregoing embodiments, and will not be described again.

[0039] The test fixture of this embodiment includes a cover plate 275 and a fixing structure 230.

[0040] The fixing structure 230 is fixedly connected to the side of the preset adapter plate 220 away from the test plate 210, and the fixing structure 230 is provided with a receiving cavity 290. The fixing structure 230 is used to constitute the four side cavity walls of the receiving cavity 290, and is also used to fix the preset adapter plate 220 on the test plate 210.

[0041] The cover plate 275 is movably arranged on the side of the fixing structure 230 away from the test plate 210. The cover plate 275 and the fixing structure 230 are movably arranged, so that the cover plate 275 can be opened to expose the receiving cavity 290, thereby achieving the taking and placing of the measured object 280.

[0042] In a specific application scenario, the cover plate 275 and the fixing structure 230 can be hingedly connected through a threaded structure to achieve movable arrangement. In a specific application scenario, the cover plate 275 and the fixing structure 230 can be rotatably arranged through a cover turning shaft structure. In a specific application scenario, the cover plate 275 and the fixing structure 230 can also be detachably arranged. The movable arrangement between the cover plate 275 and the fixing structure 230 is not limited here.

[0043] The preset adapter plate 220, the cover plate 275, and the fixing structure 230 jointly constitute the six side cavity walls of the receiving cavity 290.

[0044] The temperature control unit 250 is fixedly arranged on the side of the cover plate 275 close to the test plate 210, that is, the temperature control unit 250 is built into the receiving cavity 290. When the measured object 280 is tested, the temperature control unit 250 controls the temperature in the receiving cavity 290 to adjust the environmental temperature of the measured object 280, so as to achieve the test of the target temperature. The test contacts outside the receiving cavity 290 and the test plate 210 are not affected by the temperature control.

[0045] In some embodiments, the fixing structure 230 includes a first fixing member 231 and a second fixing member 232.

[0046] The first fixing member 231 is fixedly arranged on the side of the preset adapter plate 220 away from the test plate 210 and the side of the test plate 210, so as to fix the preset adapter plate 220 on the test plate 210. The first fixing member 231 is formed with a first hollow area 291; the size of the first hollow area 291 matches the measured object 280.

[0047] In a specific application scenario, the first fixing member 231, the preset adapter plate 220, and the corresponding positions on the test plate 210 can be provided with mounting holes, and a mounting shaft is sequentially arranged through the mounting holes on the first fixing member 231, the mounting holes on the preset adapter plate 220, and the mounting holes corresponding to the test plate 210 to be fixed, so as to fix the preset adapter plate 220 on the test plate 210 through the first fixing member 231.

[0048] In a specific application scenario, the preset adapter plate 220 can be welded on the test plate 210, and the projected area of the first fixing member 231 on the test plate 210 can be greater than the projected area of the preset adapter plate 220 on the test plate 210. The part of the first fixing member 231 beyond the preset adapter plate 220 is also welded on the test plate 210, so as to fix the preset adapter plate 220 on the test plate 210 through the first fixing member 231.

[0049] The specific fixing mode of the first fixing member 231 is not limited here.

[0050] The second fixing member 232 is fixedly connected to the side of the first fixing member 231 away from the test plate 210, and the first fixing member 231 is formed with a second hollow area 292. The second fixing member 232 can be fixedly connected to the first fixing member 231 by welding, screwing, or clamping, and the specific fixing mode is not limited here.

[0051] The first hollow area 291 and the second hollow area 292 jointly form a receiving cavity 290.

[0052] In some embodiments, the cover plate 275 includes a cover plate body 270 and a buckle 271; one end of the cover plate body 270 is movably connected to the fixing structure 230; for details of the movable connection, please refer to the foregoing description.

[0053] The other end of the cover plate body 270 is fixedly provided with the buckle 271, and the buckle 271 is used for clamping and fixing with the fixing structure 230.

[0054] In a specific application scenario, one end of the buckle 271 is fixedly connected to the cover plate body 270, and the other end of the buckle 271 is used for clamping near the side of the second fixing member 232 close to the first fixing member 231, so as to realize the closure between the cover plate 275 and the fixing structure 230. The side of the second fixing member 232 close to the first fixing member 231 can be correspondingly provided with a protruding structure or a recessed structure to correspondingly match and clamp with the recessed structure or the protruding structure at the other end of the buckle 271.

[0055] In some embodiments, the cover plate body 270 includes a knob cover plate 272, a knob 274, and a spring 273.

[0056] One end of the knob cover plate 272 is movably connected with the fixed structure 230. The specific movable connection manner can refer to the foregoing description. The other end of the knob 274 is fixedly provided with a buckle 271, which is used for clamping and fixing with the fixed structure 230.

[0057] The knob 274 is arranged on the side of the knob cover plate 272 away from the test board 210, and the spring 273 is arranged between the knob 274 and the knob cover plate 272, and the opposite ends are respectively connected with the knob 274 and the knob cover plate 272.

[0058] When the buckle 271 is clamped and fixed with the second fixed part 232, the knob 274 can be pressed to compress the spring 273 to drive the buckle 271 to move towards the first fixed part 231, so as to generate a margin to release the clamping with the second fixed part 232, at this time, the buckle 271 is loosened, and the knob cover plate 272 can be opened. When the knob 274 is not pressed, the spring 273 is reset, and at this time, if the buckle 271 is clamped with the second fixed part 232, the clamping can be stable, and the closing of the knob cover plate 272 can be maintained.

[0059] In other embodiments, the cover plate body can also include a flat plate cover plate, and the buckle is rotatably arranged on the flat plate cover plate, so as to realize the opening and closing of the flat plate cover plate by manually rotating the clamping buckle and the second fixed part. The specific structure of the cover plate is not limited here.

[0060] In some embodiments, the cover plate body 270 further includes a heat insulation plate 260; the heat insulation plate 260 is arranged on the side of the cover plate body 270 close to the fixed structure 230, and the temperature control unit 250 is fixedly arranged on the side of the heat insulation plate 260 close to the test board 210.

[0061] The heat insulation plate 260 is used for heat preservation of the containing cavity 290, so as to improve the stability of the temperature in the containing cavity 290 and facilitate stable testing.

[0062] In some embodiments, the temperature control unit 250 includes a temperature control mechanism 252, a connector 251 and a controller 253; the temperature control mechanism 252 is arranged in the containing cavity 290 and is used for changing the temperature in the containing cavity 290, the controller 253 is arranged outside the containing cavity 290, and specifically can be fixedly arranged on any position of the test device 200 except the containing cavity 290, and is used for controlling the temperature control mechanism 252 to control the temperature, and the connector 251 is arranged through the test fixture to connect the temperature control mechanism 252 and the controller 253. The side surface of the second fixed part 232 can be provided with an opening (not labeled in the figure) to accommodate the connector 251 to pass through.

[0063] In a specific application scenario, the controller 253 can be connected with the connector 251 through a wired connection. The controller 253 can be powered by 12v or 5v, and then the wired connection line and the connector 251 can sequentially power the temperature control unit 250.

[0064] In some embodiments, the temperature control unit 250 is fixedly arranged with the heat conduction member 240 close to one side of the test board 210. When the measured object 280 is placed in the accommodation cavity 290, the side of the heat conduction member 240 away from the temperature control unit 250 is in contact with the measured object 280.

[0065] The heat conduction member 240 is used to accelerate the corresponding change of the environmental temperature of the measured object 280 in the accommodation cavity 290 based on the temperature change of the temperature control unit 250, so as to accelerate the test efficiency.

[0066] In a specific application scenario, the heat conduction member 240 includes a first heat conduction member 241 and a second heat conduction member 242 which are stacked and attached. The side of the second heat conduction member 242 away from the first heat conduction member 241 is fixed to the side of the temperature control unit 250 close to the test board 210, and the side of the first heat conduction member 241 away from the second heat conduction member 242 is used to contact the measured object 280.

[0067] In a specific application scenario, the size of the first heat conduction member 241 matches the size of the first hollow area 291, and the size of the second heat conduction member 242 matches the size of the second hollow area 292. The size of the first hollow area 291 matches the size of the measured object 280, so that the measured object 280 is uniformly tempered by the matched first heat conduction member 241, the temperature control effect of the measured object 280 is improved, and the test accuracy is improved.

[0068] The size of the second hollow area 292 is equal to or greater than the size of the first hollow area 291, so as to increase the volume of the second heat conduction member 242, accelerate the heat conduction effect of the heat conduction member 240, improve the temperature control efficiency and the uniform temperature control efficiency of the temperature control unit 250, and thus improve the test efficiency.

[0069] Please refer to Figure 3 , Figure 3 which is a structural schematic diagram of an embodiment of the temperature control mechanism.

[0070] The temperature control mechanism 252 includes a temperature control circuit board 2521, a temperature control sheet 2522, and a temperature sensor 2523. The temperature control circuit board 2521 is connected with the connector 251 and the temperature control sheet 2522, and the controller 253 is also connected with the temperature sensor 2523.

[0071] The controller 253 controls the temperature control sheet 2522 to adjust the temperature through the connector 251 and the temperature control circuit board 2521 in sequence. The temperature sensor 2523 returns the detected temperature to the controller 253 to detect whether the temperature in the accommodation cavity 290 meets the standard, so that the controller 253 controls the temperature control sheet 2522 to adjust the temperature and power consumption.

[0072] In a specific application scenario, the temperature sensor 2523 includes two; two temperature sensors 2523 are respectively attached to two diagonal opposite positions of the temperature control circuit board 2521. The temperature sampling accuracy of this application scenario is relatively ideal.

[0073] The test process can be: after power-on, first perform controller 253 initialization, then perform temperature sensor 2523 initialization, and then perform temperature sensor 2523 communication detection. The above processes are all function detection by the controller 253, and if an exception occurs, an error message is generated. After waiting for the preparation work to be completed, the controller 253 controls the temperature control sheet 2522 to adjust the temperature, and in the temperature adjustment process, the two temperature sensors 2523 compare the temperature values collected by themselves, and if the difference exceeds the difference threshold, at least part of the temperature sensor 2523 may be abnormal, so an error message is generated, and if the difference does not exceed the difference threshold, the temperature is compared with the set value, and if it does not reach the set value, the current is increased, and when it is close to the set value, the heating current is slowly reduced to meet the requirement of constant temperature. Finally, the test is completed, and the heating is turned off. The difference threshold can include but is not limited to 5 degrees Celsius, 8 degrees Celsius, 10 degrees Celsius, 12 degrees Celsius, or 15 degrees Celsius, etc.

[0074] Through the setting of the temperature control mechanism 252 including the temperature control circuit board 2521, the temperature control sheet 2522 and the temperature sensor 2523, the environmental temperature in the accommodation cavity 290 can be automatically adjusted according to the set value of the test requirement, so as to realize accurate temperature control of the measured object 280.

[0075] In a specific application scenario, the temperature sensor 2523 can include four; four temperature sensors 2523 are respectively attached to four diagonal positions of the temperature control circuit board 2521. The temperature sampling accuracy of this application scenario is relatively ideal.

[0076] The number and position of the temperature sensor 2523 are not limited here, and can be other numbers, such as 3, 5 or 6, etc. The position can be at the edge or in the middle.

[0077] Through the above structure, the testing device can only be performed on the measured object, without affecting the stability of the testing board as a whole and the stability of the oscilloscope probe, can reduce the required equipment and human resources in the testing process, can realize multiple tests under extreme temperature conditions, can better simulate the actual use environment of the measured object, improve the accuracy of the test, and improve the reliability of the product.

[0078] The above only describes the embodiments of the present application, and does not limit the patent range of the present application, and any equivalent structure or equivalent process transformation using the content of the present application specification and drawings, or direct or indirect application in other related technical fields, are also included in the patent protection range of the present application.

Claims

1. A test device, characterized by The test device comprises: a test plate; a preset adapter plate fixedly connected to one side of the test plate; a test fixture fixedly installed on the preset adapter plate, the test fixture being provided with a receiving cavity, and one side of the preset adapter plate away from the test plate forming a side cavity wall of the receiving cavity; a temperature control unit arranged in the receiving cavity; wherein the projection size of the test fixture on the test plate is smaller than the projection size of the preset adapter plate on the test plate, and a plurality of test contacts are further arranged and connected on the preset adapter plate, the test contacts being arranged outside the receiving cavity and spaced apart from the test fixture.

2. The test device of claim 1, wherein, The test fixture comprises a cover plate and a fixing structure; the fixing structure is fixedly connected to the side of the preset adapter plate away from the test plate, and the fixing structure is provided with the receiving cavity; the cover plate is movably arranged on the side of the fixing structure away from the test plate; the temperature control unit is fixedly arranged on the side of the cover plate close to the test plate.

3. The test device of claim 2, wherein, The fixing structure comprises a first fixing member and a second fixing member; the first fixing member is fixedly arranged on the side of the preset adapter plate away from the test plate and the side of the test plate, so as to fix the preset adapter plate on the test plate, and the first fixing member is formed with a first hollow region; the second fixing member is fixedly connected to the side of the first fixing member away from the test plate, and the first fixing member is formed with a second hollow region; the first hollow region and the second hollow region form the receiving cavity.

4. The test device of claim 2, wherein, The cover plate comprises a cover plate body and a buckle; one end of the cover plate body is movably connected to the fixing structure; the other end of the cover plate body is fixedly provided with the buckle, and the buckle is used for clamping and fixing with the fixing structure.

5. The test device of claim 4, wherein, The cover plate body comprises a knob cover plate, a knob and a spring; one end of the knob cover plate is movably connected to the fixing structure; the knob is fixedly provided with the buckle, and the buckle is used for clamping and fixing with the fixing structure; the knob is arranged on the side of the knob cover plate away from the test plate, the spring is arranged between the knob and the knob cover plate, and the opposite ends are respectively connected to the knob and the knob cover plate.

6. The test device of claim 4, wherein, The cover plate body further comprises a heat insulation plate; the heat insulation plate is arranged on the side of the cover plate body close to the fixing structure, and the temperature control unit is fixedly arranged on the side of the heat insulation plate close to the test plate.

7. The test device according to any one of claims 1-6, wherein the temperature control unit comprises a temperature control mechanism, a connector and a controller; the temperature control mechanism is arranged in the receiving cavity, the controller is arranged outside the receiving cavity, and the connector is arranged through the test fixture to connect the temperature control mechanism and the controller.

8. The test device according to claim 7, wherein a heat conduction member is fixedly arranged on the side of the temperature control unit close to the test plate. When the measured object is placed in the accommodating cavity, the side of the heat-conducting member away from the temperature control unit is in contact with the measured object.

9. The testing device of claim 7, wherein, The temperature control mechanism comprises a temperature control circuit board, a temperature control sheet and a temperature sensor, the temperature control circuit board is connected with the connector and the temperature control sheet respectively, and the controller is further connected with the temperature sensor.

10. The test device of claim 9, wherein, The temperature sensor comprises two; The two temperature sensors are respectively arranged at two obliquely opposite corners of the temperature control circuit board.

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