Detection equipment for photovoltaic cell

Abstract

The application relates to a photovoltaic cell detection device, the detection device comprises a first elastic member, a first installation carrier and a conductive contact member used for contacting a photovoltaic cell grid line, and the conductive contact member is elastically connected with the first installation carrier through the first elastic member. In the detection process, the first installation carrier and the photovoltaic cell piece need to be close to each other, so that the conductive contact piece and the grid line of the photovoltaic cell piece extrude each other, and the conductive contact piece and the grid line of the photovoltaic cell piece are in reliable contact. The conductive contact piece is elastically connected with the first mounting carrier through the first elastic piece, and the first elastic piece can play a good buffering role, so that the instantaneous pressure intensity peak value and the time-average pressure intensity borne by the photovoltaic cell piece when the photovoltaic cell piece is extruded are relatively small; therefore, the possibility of structural damage phenomena (such as deformation, cracking and fragmentation) of the photovoltaic cell piece when the photovoltaic cell piece is extruded is reduced.

Description

Technical Field

[0001] This application relates to the field of photovoltaic cell testing technology, and in particular to a testing device for photovoltaic cells. Background Technology

[0002] In related technologies, photovoltaic (PV) cell testing equipment includes conductive contacts and a transparent plate. The conductive contacts are used to press the PV cell onto the transparent plate and to make electrical contact with the grid lines of the PV cell. When light passes through the transparent plate and shines on the PV cell, photoelectric conversion occurs, and the grid lines can conduct current outward through the conductive contacts. The testing equipment can detect this current to assess the performance of the PV cell. However, the testing equipment in these technologies is prone to causing structural damage to the PV cell during the testing process. Utility Model Content

[0003] In view of this, this application provides a testing device for photovoltaic cells, which can reduce the possibility of structural damage to photovoltaic cells during the testing process.

[0004] This application provides a testing device for photovoltaic cells. The testing device includes a first elastic element, a first mounting carrier, and a conductive contact for contacting the grid lines of the photovoltaic cell. The conductive contact is elastically connected to the first mounting carrier through the first elastic element.

[0005] During the testing process, the first mounting carrier and the photovoltaic cell need to be brought close together so that the conductive contact and the grid lines of the photovoltaic cell are pressed against each other, ensuring reliable contact. Since the conductive contact is elastically connected to the first mounting carrier through a first elastic element, the first elastic element provides good cushioning, resulting in relatively small instantaneous peak and average hourly pressures on the photovoltaic cell under pressure. This reduces the likelihood of structural damage (such as deformation, cracking, or fragmentation) to the photovoltaic cell under pressure.

[0006] Optionally, the conductive contact is also slidably connected to the first mounting carrier.

[0007] Optionally, the first mounting carrier is provided with a first sliding hole, and the outer wall of the conductive contact is slidably engaged with the inner wall of the first sliding hole.

[0008] Optionally, at least a portion of the structure of the first elastic element is located within the first sliding hole, and the inner wall of the first sliding hole is connected to the first elastic element.

[0009] Optionally, the conductive contact is provided with a first receiving cavity, at least a portion of the structure of the first elastic member is located within the first receiving cavity, and the inner wall of the first receiving cavity is connected to the first elastic member.

[0010] Optionally, the conductive contact includes a conductive contact end for contacting the gate line, the conductive contact end having a set diameter D1, satisfying 0.1mm≤D1≤0.3mm.

[0011] Optionally, the first elastic element includes at least one of a coil spring and a sheet spring.

[0012] Optionally, the first mounting carrier is provided with negative pressure adsorption holes for negative pressure adsorption of photovoltaic cells.

[0013] Optionally, the testing equipment also includes a pressure-bearing component, which includes a pressing member, a second elastic member, and a second mounting carrier. The pressing member is elastically connected to the second mounting carrier through the second elastic member, and the pressing member is used to press the photovoltaic cell onto the conductive contact.

[0014] Optionally, the second mounting carrier includes an elongated structure, and the pressing element is elastically connected to the elongated structure via a second elastic element.

[0015] It should be understood that the above general description and the following detailed description are merely exemplary and do not limit this application. Attached Figure Description

[0016] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a side view of a back-contact photovoltaic cell in one specific embodiment.

[0018] Figure 2 This is a bottom view of a back-contact photovoltaic cell in a specific embodiment.

[0019] Figure 3 A side view of a back-contact photovoltaic cell and the testing equipment provided in this application in one embodiment;

[0020] Figure 4 for Figure 3 A schematic diagram of the cross-sectional structure along the central direction AA;

[0021] Figure 5 for Figure 3 A schematic diagram of the cross-sectional structure along the central direction BB;

[0022] Figure 6 A top view of the first mounting carrier and conductive contact in one specific embodiment;

[0023] Figure 7 This is a partial cross-sectional view of the assembly structure of the conductive contact, the first elastic element, and the first mounting carrier in a specific embodiment.

[0024] Figure 8 This is a cross-sectional assembly structure diagram of a first conductive element, a first elastic element, and a first mounting carrier in a specific embodiment, wherein the first mounting carrier is provided with a negative pressure adsorption hole and an air intake channel;

[0025] Figure 9 A side view of a back-contact photovoltaic cell and the testing equipment provided in this application in another embodiment;

[0026] Figure 10 A cross-sectional assembly structure diagram of the pressing component, the second elastic component, and the second mounting carrier;

[0027] Figure 11 This is a partial cross-sectional view of the assembly structure of the pressing component, the second elastic component, and the second mounting carrier.

[0028] Figure 12 A top view of the elongated structure included in the second mounting carrier;

[0029] Figure 13 This is a side view of the assembly structure of the pressing component and the second mounting carrier in another embodiment.

[0030] Figure label:

[0031] 10- Photovoltaic cells;

[0032] 101 - Light-receiving surface;

[0033] 102 - Backlight side;

[0034] 103 - Negative grid line;

[0035] 104 - Positive grid line;

[0036] 1-Conductive contact;

[0037] 11-First receiving cavity;

[0038] 12-Conductive contact terminal;

[0039] 2-First elastic element;

[0040] 3-First mounting carrier;

[0041] 31 - First sliding hole;

[0042] 32-Negative pressure adsorption pores;

[0043] 33 - Inspiratory tract;

[0044] 4a - Load-bearing component;

[0045] 4-Pressing element;

[0046] 41-Second receiving cavity;

[0047] 42 - Pressing end;

[0048] 5-Second elastic element;

[0049] 6-Second mounting carrier;

[0050] 61 - Long strip structure;

[0051] 62 - Second sliding hole. Detailed Implementation

[0052] To better understand the technical solution of this application, the embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0053] It should be understood that the described embodiments are merely some, not all, of the embodiments in this application. All other embodiments obtained by those skilled in the art based on the embodiments in this application without inventive effort are within the scope of protection of this application.

[0054] The terminology used in the embodiments of this application is for the purpose of describing particular embodiments only and is not intended to be limiting of this application. The singular forms “a,” “the,” and “the” used in the embodiments of this application and the appended claims are also intended to include the plural forms unless the context clearly indicates otherwise.

[0055] It should be understood that the term "and / or" used in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0056] Please refer to Figure 1 As shown, the photovoltaic cell 10 may include a light-receiving surface 101 and a back-lighting surface 102. In actual use, the light-receiving surface 101 is the side that is directly exposed to sunlight, and the back-lighting surface 102 is the side that is turned away from sunlight. Figure 1 The direction H in the center can represent the thickness direction of the photovoltaic cell 10 (the direction from the light-receiving surface to the back-lighting surface).

[0057] Please refer to Figures 1-2As shown, the photovoltaic cell 10 can be a back contact photovoltaic cell, that is, the negative grid line 103 and the positive grid line 104 included in the photovoltaic cell 10 are both disposed on the back surface 102.

[0058] Alternatively, please refer to Figures 1-2 As shown, the photovoltaic cell 10 can be an interdigitated back contact solar cell, that is, multiple negative grid lines 103 and multiple positive grid lines 104 can be alternately and spaced on the back surface 102 along a set direction, wherein the set direction is perpendicular to the direction H.

[0059] Generally, after photovoltaic cells are manufactured, testing equipment is needed to check whether the photovoltaic cells can output voltage and current to external circuits well through the grid lines under sunlight.

[0060] This application provides some embodiments of testing equipment for photovoltaic cells; please refer to them. Figure 3 As shown, the testing device includes a conductive contact 1, a first elastic element (not shown in the figure), and a first mounting carrier 3. The conductive contact 1 is used to contact the grid lines of the photovoltaic cell 10, and the conductive contact 1 is elastically connected to the first mounting carrier 3 through the first elastic element.

[0061] Please refer to Figure 3 As shown, during the testing process, the first mounting carrier 3 and the photovoltaic cell 10 need to be brought close to each other so that the conductive contact 1 and the grid lines of the photovoltaic cell 10 are pressed against each other, ensuring reliable contact between the conductive contact 1 and the grid lines of the photovoltaic cell 10. Since the conductive contact 1 is elastically connected to the first mounting carrier 3 through a first elastic element (not shown in the figure), the first elastic element provides good buffering, resulting in relatively small instantaneous peak pressure and average pressure experienced by the photovoltaic cell 10 under pressure. This reduces the likelihood of structural damage (e.g., deformation, cracking, fragmentation) to the photovoltaic cell 10 under pressure.

[0062] It should be noted that the instantaneous peak pressure refers to the maximum pressure exerted by the conductive contact on the photovoltaic cell during the initial time period of being squeezed by the conductive contact. The initial time period can be less than or equal to the time period during which the first elastic element undergoes elastic deformation. The time-averaged pressure refers to the average pressure exerted by the conductive contact on the photovoltaic cell during all time periods of being squeezed by the conductive contact. All time periods can include the time period during which the first elastic element undergoes elastic deformation and the time period during which the first elastic element remains stationary after elastic deformation.

[0063] Please refer to Figure 4As shown, the testing equipment may include multiple conductive contacts 1 for contacting the negative grid lines 103 of the photovoltaic cell. Please refer to... Figure 5 As shown, the testing equipment may also include multiple conductive contacts 1 for contacting the positive grid lines 104 of the photovoltaic cell.

[0064] Please refer to Figure 6 As shown, multiple conductive contacts 1 for contacting the negative electrode grid lines are arranged in an array on the first mounting carrier 3, and multiple conductive contacts 1 for contacting the positive electrode grid lines are also arranged in an array on the first mounting carrier 3. It should be noted that within the photovoltaic cell, the negative electrode grid lines can be used to collect electrons from the N-type semiconductor, where the doping impurities include Group 5 elements, such as phosphorus. Within the photovoltaic cell, the positive electrode grid lines are used to collect holes from the P-type semiconductor, where the doping impurities include Group 3 elements, such as boron. Therefore, please refer to... Figure 6 As shown, the conductive contact 1 arranged along the dashed line N array can represent the conductive contact 1 used for contacting the negative gate line, and the conductive contact 1 arranged along the dashed line P array can represent the conductive contact 1 used for contacting the positive gate line.

[0065] Additionally, please refer to Figures 4-5 As shown, the testing equipment may further include a carrier 4a, which is used to contact the light-receiving surface 101 of the photovoltaic cell. During the testing process, the photovoltaic cell can be placed on the conductive contact 1, keeping the carrier 4a relatively stationary. Then, the first mounting carrier 3 is driven to move towards the carrier 4a, thereby causing the first mounting carrier 3 to press the photovoltaic cell against the carrier 4a through the first elastic member and the conductive contact 1. In other embodiments, the photovoltaic cell can also be placed on the conductive contact 1, keeping the first mounting carrier 3 relatively stationary, and then the carrier 4a can be driven to move towards the first mounting carrier 3, thereby causing the first mounting carrier 3 to press the photovoltaic cell against the carrier 4a through the first elastic member and the conductive contact 1. In other embodiments, the photovoltaic cell can also be placed on the carrier 4a, and the first mounting carrier 3 can be driven to move towards the carrier 4a, thereby causing the first mounting carrier 3 to press the photovoltaic cell against the carrier 4a through the first elastic member and the conductive contact 1. In other embodiments, the photovoltaic cell can be placed on the support member 4a and moved towards the first mounting carrier 3 via the support member 4a, thereby causing the first mounting carrier 3 to press the photovoltaic cell against the support member 4a through the first elastic member and the conductive contact member 1. In any of the above detection methods, the light-receiving surface 101 of the photovoltaic cell must face the support member 4a, the backlighting surface 102 of the photovoltaic cell must face the first mounting carrier 3, and the grid lines of the photovoltaic cell must be aligned with the conductive contact member 1.

[0066] It should be noted that the testing equipment may also include a frame (not shown in the figure) and a drive structure. The frame may be fixedly connected to the carrier, or the frame may be connected to the first mounting carrier via the drive structure; alternatively, the frame may be fixedly connected to the first mounting carrier, and the frame may be connected to the carrier via the drive structure.

[0067] In addition, please refer to Figures 4-5 As shown, during the testing process, the first mounting carrier 3, the photovoltaic cell, and the support member 4a can be distributed along the height direction. For example, the first mounting carrier 3 is located below the photovoltaic cell, and correspondingly, the conductive contact 1 and the first elastic member are also located below the photovoltaic cell, while the support member 4a can be located above the photovoltaic cell. In other embodiments (not shown in the figure), the first mounting carrier can also be located above the photovoltaic cell, and correspondingly, the conductive contact 1 and the first elastic member are also located above the photovoltaic cell, while the support member can be located below the photovoltaic cell.

[0068] It should be noted that the support should meet at least one of the following requirements so that the main part of the light-receiving surface of the photovoltaic cell can be illuminated by light. For example, the material of the support can be transparent (transparency greater than 95%), and the ratio of the area of ​​the structure in the support that can block the photovoltaic cell to the area of ​​the light-receiving surface of the photovoltaic cell is less than 0.1.

[0069] Furthermore, the detection device includes a detection circuit that can be electrically connected to the grid lines of the photovoltaic cell via conductive contacts. The detection circuit is used to detect whether the photovoltaic cell can output current and voltage well through the grid lines under illumination.

[0070] Alternatively, please refer to Figure 7 As shown, the conductive contact 1 is also slidably connected to the first mounting carrier 3, so that the conductive contact 1 can move relative to the first mounting carrier 3 in a set direction, such as along the height direction (parallel to direction Y), during the process of contacting the grid lines of the photovoltaic cell. This allows the conductive contact 1 to be accurately aligned with the grid lines of the photovoltaic cell during movement, facilitating a reliable electrical connection between the conductive contact 1 and the grid lines of the photovoltaic cell. Therefore, the detection reliability of the detection equipment in some embodiments of this application is high.

[0071] Alternatively, please refer to Figure 7 As shown, the first mounting carrier 3 is provided with a first sliding hole 31, and the outer wall of the conductive contact 1 slides in conjunction with the inner wall of the first sliding hole 31. Alternatively, at least a portion of the structure of the conductive contact 1 can be located within the first sliding hole 31, and at least a portion of the structure of the conductive contact 1 can be retracted into or extend out of the first sliding hole 31. This embodiment's structural configuration satisfies the need for the conductive contact 1 to slide relative to the first mounting carrier 3 in a predetermined direction.

[0072] In other embodiments (not shown in the figures), the conductive contact may be provided with a sliding hole, and the first mounting carrier may include a sliding rod, at least a portion of which may be located within the sliding hole, with the sliding rod slidingly engaged with the sliding hole.

[0073] In other embodiments (not shown in the figures), the first mounting carrier may be provided with a groove, and the outer wall of the conductive contact may slide in conjunction with the inner wall of the groove.

[0074] The following content mainly describes the process using the example of "the outer wall of the conductive contact slidingly engaging with the inner wall of the first sliding hole located on the first mounting carrier".

[0075] Alternatively, please refer to Figure 7 As shown, at least a portion of the structure of the first elastic member 2 is located within the first sliding hole 31, and the inner wall of the first sliding hole 31 is connected to the first elastic member 2. With this configuration, the connection structure between the conductive contact 1, the first elastic member 2, and the first mounting carrier 3 has a high degree of structural compactness. Given a relatively small spacing between two adjacent grid lines, the high degree of structural compactness reduces the likelihood of the conductive contact 1 and the first elastic member 2 corresponding to the negative grid line accidentally touching an adjacent positive grid line. Similarly, the high degree of structural compactness also reduces the likelihood of the conductive contact 1 and the first elastic member 2 corresponding to the positive grid line accidentally touching an adjacent negative grid line. Therefore, the detection reliability of the detection device in some embodiments of this application is high.

[0076] Alternatively, please refer to Figure 7 As shown, the conductive contact 1 is provided with a first receiving cavity 11, and at least a portion of the structure of the first elastic member 2 is located within the first receiving cavity 11. The inner wall of the first receiving cavity 11 is connected to the first elastic member 2. With this configuration, the connection structure between the conductive contact 1, the first elastic member 2, and the first mounting carrier 3 has a high degree of structural compactness. Given a relatively small spacing between two adjacent grid lines, the high degree of structural compactness reduces the likelihood of the conductive contact 1 and the first elastic member 2 corresponding to the negative grid line accidentally touching an adjacent positive grid line. Similarly, the high degree of structural compactness also reduces the likelihood of the conductive contact 1 and the first elastic member 2 corresponding to the positive grid line accidentally touching an adjacent negative grid line. Therefore, the detection reliability of the detection device in some embodiments of this application is high.

[0077] It should be noted that the spacing between two adjacent grid lines of the photovoltaic cell to be tested can be in the range of 0.4mm to 0.6mm.

[0078] It should be noted that the minimum distance between any conductive contact used to detect the negative grid line and any conductive contact used to detect the positive grid line is greater than the shortest distance between two adjacent grid lines.

[0079] Alternatively, please refer to Figure 7 As shown, the conductive contact 1 includes a conductive contact end 12 for contacting the grid lines. The conductive contact end 12 has a set diameter D1, satisfying 0.1mm ≤ D1 ≤ 0.3mm. If the diameter D1 is less than 0.1mm, the area of ​​the conductive contact end 12 is too small. When the conductive contact end 12 and the photovoltaic cell are pressed against each other, the pressure between the conductive contact end 12 and the photovoltaic cell is likely to be too large, and the structure of the photovoltaic cell is easily damaged. If the diameter D1 is greater than 0.3mm, the area of ​​the conductive contact end 12 is too large. The conductive contact end 12 may simultaneously contact two grid lines with opposite polarities, resulting in low reliability of the detection equipment. Therefore, it is preferable that the diameter D1 of the conductive contact end 12 is within the range of 0.1mm ≤ D1 ≤ 0.3mm.

[0080] The surface of the conductive contact end 12 that is used to contact the gate line is a circular surface.

[0081] In other embodiments (not shown in the figures), the surface of the conductive contact terminal used for contacting the gate line can also be an elliptical surface or a rectangular surface.

[0082] In addition, the material of the conductive contact 12 may include at least one of the following metals that have good electrical conductivity: gold, silver, and copper.

[0083] It should be noted that, in some embodiments of this application, at least two spaced conductive contacts in the detection device can be used to electrically connect to the same grid line in order to detect the conductivity of at least two different parts of the same grid line.

[0084] Alternatively, please refer to Figure 7 As shown, the first elastic element 2 includes a helical spring, which can provide good cushioning. If a portion of the helical spring's structure is located within the first receiving cavity 11 described above, the helical diameter of the helical spring needs to be in the range of 0.05mm to 0.2mm, meaning the helical spring is a miniature spring. Specifically, the helical diameter can be 0.05mm, 0.06mm, 0.07mm, 0.08mm, 0.09mm, 0.1mm, 0.11mm, 0.12mm, 0.13mm, 0.14mm, 0.15mm, 0.16mm, 0.17mm, 0.18mm, 0.19mm, or 0.2mm.

[0085] In other embodiments (not shown in the figures), the helical spring may be sleeved on and connected to the outer wall of the conductive contact.

[0086] In other embodiments (not shown in the figures), the first elastic element includes a spring sheet, which can also provide good cushioning. The spring sheet can be a metal spring sheet, a plastic spring sheet, or a rubber spring sheet.

[0087] The following content of this article mainly uses the first elastic element, including the coil spring, as an example.

[0088] Optionally, if the first elastic element is conductive, the detection circuit can also be electrically connected to the conductive contact through the first elastic element, that is, the first elastic element is used as the conductive medium between the detection circuit and the conductive contact. In this configuration, since the first elastic element is connected to both the conductive contact and the first mounting carrier, and the conductive contact is a movable object relative to the first mounting carrier, if the detection circuit is electrically connected to the conductive contact through other wires, the connection structure in the wires connected to the conductive contact will also move with the conductive contact. During multiple detection processes, the connection structure between the wires and the conductive contact will be frequently subjected to stress, and the connection structure between the wires and the conductive contact is prone to fatigue wear, which can easily lead to breakage of the connection structure between the wires and the conductive contact. In other words, the reliability of the electrical connection between the wires and the conductive contact is relatively low. If a first elastic element with conductivity is used to electrically connect with a conductive contact, even if the connection between the first elastic element and the conductive contact is not a fixed connection, when the conductive contact is subjected to the pressure of the photovoltaic cell, the conductive contact will compress the first elastic element. At this time, the conductive contact and the first elastic element can be reliably electrically connected, and the contact connection between the conductive contact and the first elastic element is not easily reduced due to fatigue wear, thus reducing the reliability of the electrical connection between the first elastic element and the conductive contact.

[0089] Alternatively, please refer to Figure 8 As shown, the first mounting carrier 3 is provided with a negative pressure adsorption hole 32. When the negative pressure adsorption hole 32 is in a negative pressure state, the negative pressure adsorption hole 32 can adsorb the photovoltaic cell (not shown in the figure) under negative pressure, so that the grid line of the photovoltaic cell is not easy to move arbitrarily relative to the conductive contact 1, thereby making the grid line of the photovoltaic cell reliably contact the conductive contact 1.

[0090] Please refer to Figure 8 As shown, the first mounting carrier 3 can be provided with multiple negative pressure adsorption holes 32, and the first mounting carrier 3 can also be provided with an air intake channel 33. The air intake channel 33 can be connected to the multiple negative pressure adsorption holes 32, and the air intake channel 33 is used to connect with an external negative pressure generator (not shown in the figure).

[0091] In other embodiments (not shown in the figures), the first mounting carrier may include an elastic suction cup that can press the photovoltaic cell against the elastic suction cup to expel the gas located between the photovoltaic cell and the elastic suction cup, so that the photovoltaic cell is in a negative pressure state between the photovoltaic cell and the elastic suction cup, thereby allowing the photovoltaic cell to be adsorbed and fixed by the elastic suction cup.

[0092] Optionally, the testing equipment also includes a pressure-bearing component, which can serve as a replacement structure for the load-bearing element described above. The pressure-bearing component includes, for example: Figure 9 The pressing element 4, the second elastic element (not shown in the figure), and as shown... Figure 9 The second mounting carrier 6 shown has a pressing member 4 that is elastically connected to the second mounting carrier 6 via a second elastic member. The pressing member 4 is used to press the grid lines of the photovoltaic cell 10 onto the conductive contact member 1.

[0093] Please refer to Figure 9 As shown, when the photovoltaic cell 10 is pressed against the pressing member 4 by the conductive contact member 1, the second elastic member is compressed and elastically deformed, and the pressing member 4 moves towards the second mounting carrier 6. The second elastic member provides good buffering, ensuring that the instantaneous peak pressure and average pressure experienced by the photovoltaic cell 10 under compression are relatively small, thereby reducing the likelihood of structural damage (e.g., deformation, cracking, fragmentation) to the photovoltaic cell 10 under compression.

[0094] It should be noted that the instantaneous peak pressure refers to the maximum pressure exerted on the photovoltaic cell by the pressing component during the initial time period of the pressing process. The initial time period can be less than or equal to the time period during which the second elastic component undergoes compression deformation. The time-averaged pressure refers to the average pressure exerted on the photovoltaic cell by the pressing component during all time periods of the pressing process. All time periods can include the time period during which the second elastic component undergoes compression deformation and the time period during which the second elastic component remains stationary after compression deformation.

[0095] Please refer to Figure 10 As shown, the same second mounting carrier 6 can be elastically connected to multiple pressing elements 4 through multiple second elastic elements 5.

[0096] Please refer to Figure 11 As shown, the second elastic element 5 is fitted onto the structure of the pressing element 4 and the structure of the second mounting carrier 6. The second elastic element 5 can be a miniature helical spring. A portion of the second elastic element 5 can be located within the second sliding hole 62 of the second mounting carrier 6, and another portion of the second elastic element 5 can be located within the second receiving cavity 41 of the pressing element 4.

[0097] In other embodiments (not shown in the figures), the second elastic element may also be a spring sheet, such as a metal spring sheet, a plastic spring sheet, or a rubber spring sheet.

[0098] Please refer to Figure 11 As shown, at least a portion of the structure of the pressing member 4 can be located within the second sliding hole 62 of the second mounting carrier 6, and the outer wall of the pressing member 4 can slide in cooperation with the inner wall of the second sliding hole 62 of the second mounting carrier 6.

[0099] In other embodiments (not shown in the figures), a partial structure of the second mounting carrier may be located within the sliding hole of the pressing member, and the outer wall of the partial structure of the second mounting carrier and the inner wall of the sliding hole of the pressing member are in sliding fit.

[0100] Please refer to Figure 11 As shown, the pressing end 42 of the pressing member 4 can have a set diameter D2, satisfying 1mm≤D2≤3mm. Specifically, the diameter D2 can be 1mm, 1.5mm, 2mm, 2.5mm, or 3mm. Under this setting, when the pressing end 42 contacts the light-receiving surface of the photovoltaic cell, the area of ​​the portion of the light-receiving surface of the photovoltaic cell that is blocked by the pressing end 42 is relatively small, and the main part of the light-receiving surface of the photovoltaic cell can receive light.

[0101] The material of the pressing end 42 can include plastic, such as polycarbonate (PC), polyoxymethylene (POM), polypropylene (PP), or terpolymers (acrylonitrile (A), butadiene (B), styrene (S)). This arrangement prevents the pressing end 42 from scratching the light-receiving surface of the photovoltaic cell.

[0102] Alternatively, please refer to Figure 12 As shown, the second mounting carrier 6 includes a long strip structure 61, and the pressing member is elastically connected to the long strip structure 61 through a second elastic member. Generally, photovoltaic cells are rectangular structures, and the area of ​​the photovoltaic cell's light-receiving surface blocked by the long strip structure 61 is relatively small, allowing the main part of the photovoltaic cell's light-receiving surface to receive sunlight.

[0103] In other embodiments, please refer to Figure 13 As shown, the second mounting carrier 6 can be connected to a pressing member 4 via at least two second elastic members (not shown in the figure). The pressing member 4 can include an elongated pressing structure 43, which can be used to press the light-receiving surface of the photovoltaic cell. The width dimension (dimension along the Z direction) of the pressing structure 43 can be in the range of 1mm to 2mm, specifically 1mm, 1.5mm or 2mm.

[0104] Optionally, the material of the pressing element 4 can be a transparent material (transparency greater than 95%).

[0105] The testing equipment described above is mainly used to test back-contact photovoltaic cells. In other embodiments, the testing equipment can also be used to test photovoltaic cells with grid lines on both the light-receiving and back-light-receiving surfaces, such as heterojunction with intrinsic thin-layer solar cells (HIT), passivated emitter rear solar cells (PERC), tunnel oxide passivated contact solar cells (TOPCon), or perovskite solar cells (PSC). Correspondingly, the conductive contacts and first elastic elements in the testing equipment are not only disposed on the first mounting carrier, but also on the aforementioned carrier or the second mounting carrier. In other words, during the testing process, a portion of the conductive contacts and first elastic elements in the testing equipment are located below the back-light-receiving surface of the photovoltaic cell, and another portion are located above the light-receiving surface of the photovoltaic cell. The conductive contact located below the backlight surface of the photovoltaic cell is used for electrical connection with the negative grid line of the photovoltaic cell, and the conductive contact located above the light-receiving surface of the photovoltaic cell is used for electrical connection with the positive grid line of the photovoltaic cell. Alternatively, the conductive contact located below the backlight surface of the photovoltaic cell is used for electrical connection with the positive grid line of the photovoltaic cell, and the conductive contact located above the light-receiving surface of the photovoltaic cell is used for electrical connection with the negative grid line of the photovoltaic cell.

[0106] Before testing photovoltaic cells using the testing equipment in some embodiments of this application, a robotic arm can be used to grasp the photovoltaic cells and accurately place them in the set position of the testing equipment so that the conductive contacts of the testing equipment can accurately contact the grid lines of the photovoltaic cells to be electrically connected.

[0107] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A testing device for photovoltaic cells, characterized in that, The testing equipment includes a first elastic element, a first mounting carrier, and a conductive contact for contacting the grid lines of a photovoltaic cell. The conductive contact is elastically connected to the first mounting carrier through the first elastic element.

2. The testing equipment for photovoltaic cells according to claim 1, characterized in that, The conductive contact is also slidably connected to the first mounting carrier.

3. The testing equipment for photovoltaic cells according to claim 2, characterized in that, The first mounting carrier is provided with a first sliding hole, and the outer wall of the conductive contact is slidably engaged with the inner wall of the first sliding hole.

4. The testing equipment for photovoltaic cells according to claim 3, characterized in that, At least a portion of the structure of the first elastic element is located within the first sliding hole, and the inner wall of the first sliding hole is connected to the first elastic element.

5. The testing equipment for photovoltaic cells according to claim 1, characterized in that, The conductive contact is provided with a first receiving cavity, at least a portion of the structure of the first elastic member is located within the first receiving cavity, and the inner wall of the first receiving cavity is connected to the first elastic member.

6. The testing equipment for photovoltaic cells according to any one of claims 1 to 5, characterized in that, The conductive contact includes a conductive contact end for contacting the gate line, the conductive contact end having a set diameter D1, satisfying 0.1mm≤D1≤0.3mm.

7. The testing equipment for photovoltaic cells according to any one of claims 1 to 5, characterized in that, The first elastic element includes at least one of a helical spring and a spring sheet.

8. The testing equipment for photovoltaic cells according to any one of claims 1 to 5, characterized in that, The first mounting carrier is provided with negative pressure adsorption holes for negative pressure adsorption of the photovoltaic cells.

9. The testing equipment for photovoltaic cells according to any one of claims 1 to 5, characterized in that, The testing equipment also includes a pressure-bearing component, which includes a pressing element, a second elastic element, and a second mounting carrier. The pressing element is elastically connected to the second mounting carrier through the second elastic element, and the pressing element is used to press the photovoltaic cell onto the conductive contact.

10. The testing equipment for photovoltaic cells according to claim 9, characterized in that, The second mounting carrier includes an elongated structure, and the pressing member is elastically connected to the elongated structure through the second elastic member.

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