Connecting circuit board, touch panel and display module

Abstract

The utility model discloses a connecting circuit board, a touch panel and a display module. The connection circuit board is used for connecting the tested assembly and the test assembly; the connection circuit board comprises a flexible carrier, a connection structure group arranged on the flexible carrier, and at least one first alignment test structure group, and is used for being electrically connected with a second alignment test structure group on a tested assembly in an alignment manner. The first alignment test structure group comprises a first alignment test structure, a second alignment test structure, a third alignment test structure and a fourth alignment test structure; the first alignment test structure and the second alignment test structure are arranged along a second direction, and the third alignment test structure and the fourth alignment test structure are arranged along the second direction; the first alignment test structure, the third alignment test structure and the connection structure group are arranged along a first direction; the second alignment test structure, the fourth alignment test structure and the connection structure group are arranged along the first direction. According to the utility model, whether the connection circuit board and the touch panel are accurately aligned or not can be judged.

Description

TECHNICAL FIELD

[0001] The utility model relates to test technical field especially relates to a kind of connecting circuit board, touch panel and display module. BACKGROUND

[0002] Before being assembled into display module, touch panel needs to utilize connecting circuit board and test assembly to carry out false voltage test, to test the performance of touch panel.

[0003] When carrying out false voltage test to touch panel, connecting circuit board needs to be aligned (that is, accurate alignment) with touch panel to realize electrical connection. However, in the related art, whether connecting circuit board and touch panel are aligned cannot be confirmed, so when the test result of touch panel is problematic, whether the problem is caused by the alignment problem of connecting circuit board and touch panel cannot be confirmed. SUMMARY

[0004] The utility model provides a kind of connecting circuit board, touch panel and display module, to be able to judge whether connecting circuit board and touch panel are accurately aligned.

[0005] According to an aspect of the utility model, a kind of connecting circuit board is provided, and the connecting circuit board is used to connect measured component and test assembly;The connecting circuit board includes flexible carrier, connecting structure group and at least one first alignment test structure group set on the flexible carrier;The connecting structure group includes multiple connecting structures arranged along the first direction, extends along the second direction, and the connecting structure is used to be electrically connected with the measured component;The first alignment test structure group is used to be electrically connected with the second alignment test structure group on the measured component alignment;

[0006] The first alignment test structure group includes first alignment test structure, second alignment test structure, third alignment test structure and fourth alignment test structure;The first alignment test structure and the second alignment test structure are arranged along the second direction, and the third alignment test structure and the fourth alignment test structure are arranged along the second direction;The first alignment test structure, the third alignment test structure and the connecting structure group are arranged along the first direction;The second alignment test structure, the fourth alignment test structure and the connecting structure group are arranged along the first direction.

[0007] Optionally, the connecting circuit board further includes multiple test assembly connecting portions set on the flexible carrier, and the test assembly connecting portion is used to be electrically connected with the test assembly;

[0008] The plurality of test component connecting portions include a first test connecting portion electrically connected with the first alignment test structure, a second test connecting portion electrically connected with the second alignment test structure, a third test connecting portion electrically connected with the third alignment test structure, and a fourth test connecting portion electrically connected with the fourth alignment test structure.

[0009] Optionally, along the first direction, the first alignment test structure, the second alignment test structure, the third alignment test structure, the fourth alignment test structure, and the connecting structure have the same size.

[0010] Along the first direction, the distance between the first alignment test structure and the third alignment test structure is the same as the distance between two adjacent connecting structures.

[0011] Along the first direction, the distance between the second alignment test structure and the fourth alignment test structure is the same as the distance between two adjacent connecting structures.

[0012] Optionally, the connecting circuit board includes two first alignment test structure groups, and along the first direction, the two first alignment test structure groups are arranged on two sides of the connecting structure group.

[0013] Optionally, the plurality of test component connecting portions further include a plurality of fifth test connecting portions; along the first direction, the first test connecting portion and the second test connecting portion are located on one side of the plurality of fifth test connecting portions; and the third test connecting portion and the fourth test connecting portion are located on the other side of the plurality of fifth test connecting portions.

[0014] Optionally, the first alignment test structure, the second alignment test structure, the third alignment test structure, and the fourth alignment test structure are all solder pads.

[0015] According to another aspect of the present application, a touch panel is provided, which includes a touch substrate and a plurality of touch electrodes arranged on the touch substrate.

[0016] The touch panel further includes a plurality of touch connecting portions arranged on the touch substrate and electrically connected with the plurality of touch electrodes; the plurality of touch connecting portions are arranged along a first direction and extend along a second direction; the touch panel further includes at least one second alignment test structure group arranged on the touch substrate and corresponding to at least one first alignment test structure group on the connecting circuit board; the second alignment test structure group is used for aligning and electrically connecting with the first alignment test structure group.

[0017] The second alignment test structure group comprises a fifth alignment test structure, a sixth alignment test structure, a seventh alignment test structure and an eighth alignment test structure; the fifth alignment test structure is electrically connected with the sixth alignment test structure and arranged along the second direction; the seventh alignment test structure is electrically connected with the eighth alignment test structure and arranged along the second direction; the fifth alignment test structure, the seventh alignment test structure and the touch connection part are arranged along the first direction; the sixth alignment test structure, the eighth alignment test structure and the touch connection part are arranged along the first direction.

[0018] Optionally, along the first direction, the fifth alignment test structure, the sixth alignment test structure, the seventh alignment test structure, the eighth alignment test structure and the touch connection part have the same size;

[0019] Along the first direction, the distance between the fifth alignment test structure and the seventh alignment test structure is the same as the distance between two adjacent touch connection parts;

[0020] Along the first direction, the distance between the sixth alignment test structure and the eighth alignment test structure is the same as the distance between two adjacent touch connection parts.

[0021] Optionally, the touch panel comprises two second alignment test structure groups, and along the first direction, the two second alignment test structure groups are arranged on two sides of the plurality of touch connection parts.

[0022] According to another aspect of the present application, a display module is provided, which comprises the touch panel as described above.

[0023] The technical scheme of the embodiment of the utility model discloses a connecting circuit board including flexible carrier, set up on the flexible carrier's connecting structure group and at least one first alignment test structure group, the connecting structure group includes along the first direction arrangement, along the second direction extension's multiple connecting structures, and the connecting structure is used to with the measured component electricity connects, and the first alignment test structure group is used to with the second alignment test structure group on the measured component alignment electricity connects, and the first alignment test structure group includes the first alignment test structure, the second alignment test structure, the third alignment test structure and the fourth alignment test structure, and the first alignment test structure and the second alignment test structure along the second direction arrangement, and the third alignment test structure and the fourth alignment test structure along the second direction arrangement, and the first alignment test structure, the third alignment test structure and the connecting structure group along the first direction arrangement, and the second alignment test structure, the fourth alignment test structure and the connecting structure group along the first direction arrangement, the first alignment test structure group of this embodiment not only can be used to according to each alignment test structure between electrical connection relation test connecting circuit board and the measured component whether alignment, can also be used for when connecting circuit board and the measured component misalignment, confirm the type of misalignment, and then can make the user targeted adjustment, improve test efficiency.

[0024] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the utility model, nor is it used to limit the scope of the utility model. Other features of the utility model will become apparent through the following description. BRIEF DESCRIPTION OF DRAWINGS

[0025] In order to more clearly illustrate the technical scheme in the embodiments of the utility model, the drawings needed to be used in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the utility model, and other drawings can also be obtained according to these drawings without creative labor for those skilled in the art.

[0026] Figure 1 A structural schematic diagram of a connecting circuit board provided by the embodiment of the utility model is shown in the figure.

[0027] Figure 2 A structural schematic diagram of a touch panel provided by the embodiment of the utility model is shown in the figure.

[0028] Figure 3 A structural schematic diagram of a test assembly provided by the embodiment of the utility model is shown in the figure.

[0029] Figure 4 A structural schematic diagram of a connecting circuit board and a measured component provided by the embodiment of the utility model is shown in the figure.

[0030] Figure 5 A structural schematic diagram of a connecting circuit board and a measured component provided by the embodiment of the utility model is shown in the figure. Figure 4A1-A2 direction;

[0031] Figure 6 A structure schematic view of a combination of a circuit board and a measured component provided by the embodiment of the present application;

[0032] Figure 7 A structure schematic view of a combination of a circuit board and a measured component provided by the embodiment of the present application; Figure 6 A1-A2 direction;

[0033] Figure 8 A structure schematic view of a combination of a circuit board and a measured component provided by the embodiment of the present application;

[0034] Figure 9 A structure schematic view of a combination of a circuit board and a measured component provided by the embodiment of the present application; Figure 8 A3-A4 direction. DETAILED DESCRIPTION

[0035] In order to make the personnel in the technical field better understand the present application scheme, the technical scheme in the embodiment of the present application will be described clearly and completely below by combining the drawings in the embodiment of the present application. Obviously, the described embodiment is only a part of the embodiment of the present application, not all. Based on the embodiment in the present application, all other embodiments obtained by the ordinary skilled in the art without creative labor should belong to the scope of protection of the present application.

[0036] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above drawings are used to distinguish similar objects, and do not have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device including a series of steps or units does not have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0037] Figure 1 A structure schematic view of a combination of a circuit board provided by the embodiment of the present application, Figure 2 A structure schematic view of a combination of a circuit board provided by the embodiment of the present application, Figure 3 A structure schematic view of a combination of a circuit board provided by the embodiment of the present application, Figures 1 to 3The connecting circuit board is used for connecting the measured component and the test component; the connecting circuit board comprises a flexible carrier 11, a connecting structure group 12 arranged on the flexible carrier 11, and at least one first alignment test structure group 13; the connecting structure group 12 comprises a plurality of connecting structures 121 arranged along a first direction X and extending along a second direction Y, the connecting structures 121 are used for electrical connection with the measured component, and the first alignment test structure group 13 is used for electrical connection with a second alignment test structure group on the measured component; the first alignment test structure group 13 comprises a first alignment test structure T1_a, a second alignment test structure T2_a, a third alignment test structure T3_a, and a fourth alignment test structure T4_a; the first alignment test structure T1_a and the second alignment test structure T2_a are arranged along the second direction Y, and the third alignment test structure T3_a and the fourth alignment test structure T4_a are arranged along the second direction Y; the first alignment test structure T1_a, the third alignment test structure T3_a, and the connecting structure group 12 are arranged along the first direction X; and the second alignment test structure T2_a, the fourth alignment test structure T4_a, and the connecting structure group 12 are arranged along the first direction X.

[0038] Specifically, the connecting circuit board can be used for electrical connection between the measured component and the test component, so as to perform a false pressure test on the measured component. For example, the measured component is a touch panel, and the test component can test the touch performance of the touch panel after being electrically connected to the touch panel through the connecting circuit board. The touch performance of the touch panel can be tested by testing the resistance and capacitance of the touch panel. During the test, the connecting circuit board needs to be electrically connected to the touch panel, for example, the connecting structures 121 on the connecting circuit board can be electrically connected to the touch connection part 221 on the touch panel through ACF (Anisotropic Conductive Film, anisotropic conductive film) glue. After the test is completed, the connecting circuit board is separated from the touch panel. If the test result of the touch panel is qualified, the touch panel can be used for subsequent processes, such as being assembled into a display module. If the test result of the touch panel is unqualified, the touch panel cannot be used for subsequent processes.

[0039] When the touch panel is electrically connected to the connecting circuit board, the connecting structures 121 on the connecting circuit board and the touch connection part 221 on the touch panel can be misaligned due to the precision deviation of the false pressure mechanism, the fixed displacement of the connecting circuit board, and foreign matters, thereby causing inaccurate test results and misjudgment of the test result of the touch panel. In the related art, since it is impossible to confirm whether the touch panel and the connecting circuit board are accurately aligned, it is also impossible to confirm whether the test result of the touch panel is unqualified due to inaccurate alignment.

[0040] In the embodiment, at least one first alignment test structure group 13 is arranged on the connection circuit board, and the corresponding at least one second alignment test structure group 23 is arranged on the touch panel. The relative position relationship between the first alignment test structure group 13 and the connection structure group 12 on the connection circuit board is consistent with the relative position relationship between the second alignment test structure group 23 and the plurality of touch connection portions in the measured assembly. That is, when the plurality of connection structures on the connection circuit board and the plurality of touch connection portions on the touch panel are aligned one by one, the first test structure group 13 and the corresponding second alignment test structure group 23 are also aligned. When the plurality of connection structures on the connection circuit board and the plurality of touch connection portions on the touch panel are not aligned, the first test structure group 13 and the corresponding second alignment test structure group 23 are also not aligned.

[0041] By arranging the first alignment test structure group 13 on the connection circuit board, whether the first alignment test structure group 13 and the second alignment test structure group 23 are aligned can be determined by the electrical connection relationship between the test structures in the first alignment test structure group 13, and then whether the connection structure 121 and the touch connection portion 221 are accurately aligned one by one can be determined, that is, whether the connection circuit board and the measured assembly are aligned can be determined. When the first alignment test structure group 13 and the second alignment test structure group 23 are aligned, the electrical connection relationship between the detected first alignment test structure T1_a, the second alignment test structure T2_a, the third alignment test structure T3_a and the fourth alignment test structure T4_a should be the electrical connection relationship of the corresponding alignment test structure in the second alignment test structure group 23. Thus, when the measured assembly is tested under false pressure, whether the connection circuit board and the measured assembly are aligned can be determined by detecting the electrical connection relationship between the test structures in the first alignment test structure group 13. The specific test method includes: if the electrical connection relationship between the first alignment test structure T1_a, the second alignment test structure T2_a, the third alignment test structure T3_a and the fourth alignment test structure T4_a is the electrical connection relationship of the corresponding alignment test structure 13 in the second alignment test structure group 23, it indicates that it has been aligned; and if the electrical connection relationship between the first alignment test structure T1_a, the second alignment test structure T2_a, the third alignment test structure T3_a and the fourth alignment test structure T4_a is different from the electrical connection relationship of the corresponding alignment test structure in the second alignment test structure group 23, it indicates that it is not aligned.

[0042] In addition, the first alignment test structure group 13 includes a first alignment test structure T1_a, a second alignment test structure T2_a, a third alignment test structure T3_a, and a fourth alignment test structure T4_a, and the first alignment test structure T1_a and the second alignment test structure T2_a are arranged along the second direction Y, the first alignment test structure T1_a and the third alignment test structure T3_a are arranged along the first direction X; the second alignment test structure T2_a and the fourth alignment test structure T4_a are arranged along the first direction X; and the third alignment test structure T3_a and the fourth alignment test structure T4_a are arranged along the second direction Y. In this way, not only can it be detected whether the connection circuit board and the measured component are aligned, but also the relative offset relationship between the connection circuit board and the touch panel when the connection circuit board and the measured component are not aligned can be further detected. For example, if it is detected that the first alignment test structure T1_a and the third alignment test structure T3_a are electrically connected, or that the second alignment test structure T2_a and the fourth alignment test structure T4_a are electrically connected, it indicates that the first alignment test structure T1_a and the third alignment test structure T3_a are short-circuited through the alignment test structures in the second alignment test structure group 23; or the second alignment test structure T2_a and the fourth alignment test structure T4_a are short-circuited through the alignment test structures in the second alignment test structure group 23; at this time, it indicates that the connection circuit board and the measured component are offset in the first direction X and are not aligned, and the type of misalignment is, for example, short-circuit overkill. For example, two alignment test structures in the second alignment test structure group 23 corresponding to the first test structure T1_a and the second alignment test structure T2_a are electrically connected, and two alignment test structures in the second alignment test structure group 23 corresponding to the third alignment test structure T3_a and the fourth alignment test structure T4_a are electrically connected; when it is detected that the first alignment test structure T1_a and the second alignment test structure T2_a are insulated, or that the third alignment test structure T3_a and the fourth alignment test structure T4_a are insulated, it indicates that the first alignment test structure T1_a and the second alignment test structure T2_a are not connected to the alignment test structures in the second alignment test structure group 23; or the third alignment test structure T3_a and the fourth alignment test structure T4_a are not connected to the alignment test structures in the second alignment test structure group 23; at this time, it indicates that the type of misalignment between the connection circuit board and the measured component is open-circuit overkill. Thus, the connection circuit board can also be used to test the type of misalignment between the measured component.

[0043] The technical scheme of the embodiment comprises a connecting circuit board, which comprises a flexible carrier, a connecting structure group arranged on the flexible carrier, and at least one first alignment test structure group; the connecting structure group comprises a plurality of connecting structures arranged along a first direction and extended along a second direction, and the connecting structures are used for electrical connection with a component under test; the first alignment test structure group is used for alignment electrical connection with a second alignment test structure group on the component under test; the first alignment test structure group comprises a first alignment test structure, a second alignment test structure, a third alignment test structure, and a fourth alignment test structure; the first alignment test structure and the second alignment test structure are arranged along the second direction, and the third alignment test structure and the fourth alignment test structure are arranged along the second direction; the first alignment test structure, the third alignment test structure, and the connecting structure group are arranged along the first direction; and the second alignment test structure, the fourth alignment test structure, and the connecting structure group are arranged along the first direction. The first alignment test structure group of the embodiment can not only be used for testing whether the connecting circuit board and the component under test are aligned according to electrical connection relationships between the alignment test structures, but also can be used for confirming a type of misalignment when the connecting circuit board and the component under test are misaligned, so that the user can make targeted adjustment, and the test efficiency is improved.

[0044] Optionally, with reference back to Figure 1 The connecting circuit board further comprises a plurality of test component connecting portions 14 arranged on the flexible carrier 11, and the test component connecting portions 14 are used for electrical connection with the test component; the test component connecting portions 14 comprise a first test connecting portion T1_b electrically connected with the first alignment test structure T1_a, a second test connecting portion T2_b electrically connected with the second alignment test structure T2_a, a third test connecting portion T3_b electrically connected with the third alignment test structure T3_a, and a fourth test connecting portion T4_b electrically connected with the fourth alignment test structure T4_a.

[0045] Specifically, the plurality of test component connecting portions 14 are used for electrical connection with the test component. As shown in FIG. 1, the test component connecting portions 14 are arranged on the flexible carrier 11. Figure 3As shown, the test assembly includes a plurality of test portions 15 corresponding to the plurality of test assembly connecting portions 14. The test portions 15 and the test assembly connecting portions 14 are electrically connected, and thus the test portions 15 and the touch electrodes in the touch panel are electrically connected to test the touch electrodes. It should be noted that the test portions 15 and the test assembly connecting portions 14 are electrically connected through the module process, rather than through the false pressure mechanism, so that the probability of misalignment between the test portions 15 and the test assembly connecting portions 14 is small. In this embodiment, by providing the first test connecting portion T1_b, the second test connecting portion T2_b, the third test connecting portion T3_b, and the fourth test connecting portion T4_b, the electrical connection state between the respective alignment test structures in the first alignment test structure group 13 can be directly detected by the test assembly, and thus the test efficiency can be further improved. Of course, in other embodiments, the alignment test structures in the first alignment test structure group 13 can also be connected to other test circuits to detect the electrical connection relationship between the alignment test structures in the first alignment test structure group 13.

[0046] Optionally, continuing to refer to Figure 1 and Figure 2 , along the first direction X, the sizes of the first alignment test structure T1_a, the second alignment test structure T2_a, the third alignment test structure T3_a, and the fourth alignment test structure T4_a are the same as the size of the connecting structure 121; along the first direction X, the distance between the first alignment test structure T1_a and the third alignment test structure T3_a is the same as the distance between the adjacent two connecting structures 121; along the first direction X, the distance between the second alignment test structure T2_a and the fourth alignment test structure T4_a is the same as the distance between the adjacent two connecting structures 121.

[0047] Specifically, in this embodiment, the distance between any two adjacent connecting structures 121 is equal, for example, d. Then the distance between the first alignment test structure T1_a and the third alignment test structure T3_a is d, and the distance between the second alignment test structure T2_a and the fourth alignment test structure T4_a is d. Moreover, the size of the alignment test structure along the first direction X is the same as the size of the connecting structure 121. In this way, the offset between the first alignment test structure group and the second alignment test structure group along the first direction X is the same as the offset between the connecting structure 121 and the corresponding touch connecting portion 221 along the first direction X. The electrical connection relationship of the alignment test structures in the first alignment test structure group 13 can more accurately reflect the type of misalignment between the connecting circuit board and the measured assembly.

[0048] Optionally, in some embodiments, the first alignment test structure T1_a, the second alignment test structure T2_a, the third alignment test structure T3_a, and the fourth alignment test structure T4_a are all square.

[0049] Optionally, with reference back to Figure 1 , the connecting circuit board comprises two first alignment test structure groups 13, which are arranged on two sides of the connecting structure group 12 along the first direction X.

[0050] Specifically, in the embodiment, two first alignment test structure groups 13 are arranged, which can realize test redundancy, that is, when one first alignment test structure group 13 fails, the other can still perform detection, thereby further improving the accuracy of detection.

[0051] Optionally, the two first alignment test structure groups 13 are symmetrical about a center line extending along the second direction. That is to say, if in one of the first alignment test structure groups, the first alignment test structure T1_a is located on the side of the third alignment test structure T3_a away from the connecting structure group 12; then in the other first alignment test structure group 13, the first alignment test structure T1_a is also located on the side of the third alignment test structure T3_a away from the connecting structure group 12.

[0052] Optionally, with reference back to Figure 1 , the plurality of test component connecting portions 14 further comprise a plurality of fifth test connecting portions 141; along the first direction X, the first test connecting portion T1_b and the second test connecting portion T2_b are located on one side of the plurality of fifth test connecting portions 141; the third test connecting portion T3_b and the fourth test connecting portion T4_b are located on the other side of the plurality of fifth test connecting portions 141. In this way, the total length of the connecting line between the two first alignment test structures T1_a and the first test connecting portion T1_b, the total length of the connecting line between the two second alignment test structures T2_a and the second test connecting portion T2_b, the total length of the connecting line between the two third alignment test structures T1_c and the third test connecting portion T3_b, and the total length of the connecting line between the two fourth alignment test structures T4_a and the fourth test connecting portion T4_b in the two first alignment test structure groups 13 are more easily set to be the same, thereby further improving the accuracy of detection of the electrical connection relationship of the first alignment test structure in the first alignment test structure group.

[0053] Optionally, the first alignment test structure T1_a, the second alignment test structure T2_a, the third alignment test structure T3_a, and the fourth alignment test structure T4_a are all pads. For example, metal pads.

[0054] Optionally, both the connection structure 121 and the test component connection portion 14 are solder pads. The first alignment test structure T1_a and the first test connection portion T1_b are electrically connected via wires disposed within the flexible carrier; the second alignment test structure T2_a and the second test connection portion T2_b are electrically connected via wires disposed within the flexible carrier; the third alignment test structure T3_a and the third test connection portion T3_b are electrically connected via wires disposed within the flexible carrier; the fourth alignment test structure T4_a and the fourth test connection portion T4_b are electrically connected via wires disposed within the flexible carrier; and the connection structure 121 and the fifth test connection portion 141 are electrically connected via wires disposed within the flexible carrier.

[0055] Based on the same inventive concept, this utility model also provides a touch panel, such as... Figure 2 As shown. The touch panel includes a touch substrate 21 and a plurality of touch electrodes (not shown) disposed on the touch substrate 21. The touch panel also includes a plurality of touch connection portions 221 disposed on the touch substrate 21 and electrically connected to the plurality of touch electrodes; the plurality of touch connection portions 221 are arranged along a first direction X and extend along a second direction Y; the touch panel also includes at least one second alignment test structure group 23 disposed on the touch substrate 21 and corresponding one-to-one with at least one first alignment test structure group 13 on the connecting circuit board; the second alignment test structure group 23 is used for alignment and electrical connection with the first alignment test structure group 13;

[0056] The second alignment test structure group 23 includes a fifth alignment test structure T1_c, a sixth alignment test structure T2_c, a seventh alignment test structure T3_c, and an eighth alignment test structure T4_c; the fifth alignment test structure T1_c and the sixth alignment test structure T2_c are electrically connected and arranged along the second direction Y; the seventh alignment test structure T3_c and the eighth alignment test structure T4_c are electrically connected and arranged along the second direction Y; the fifth alignment test structure T1_c and the seventh alignment test structure T3_c are arranged along the first direction X; the sixth alignment test structure T2_c and the eighth alignment test structure T4_c are arranged along the first direction X.

[0057] Specifically, the touch panel can be tested using the connection circuit board provided in any embodiment of this utility model. The touch panel may include a display area AA and a non-display area NAA arranged along the second direction Y, with touch electrodes disposed in the display area AA. A second alignment test structure group 23 and a plurality of touch connection parts 221 are disposed in the non-display area NAA. The plurality of touch connection parts 221 may be configured as a touch connection part group 22. The touch connection part group 22 may be bonded to a corresponding bonding part on the display panel. During the sham pressure test of the touch panel, the touch connection parts 221 are electrically connected to the connection structure 121 on the connection circuit board.

[0058] In the first alignment test structure group of the connecting circuit board, any two alignment test structures are insulated. In the touch panel, the fifth alignment test structure T1_c is insulated from the seventh alignment test structure T3_c, and the fifth alignment test structure T1_c is insulated from the eighth alignment test structure T4_c; the sixth alignment test structure T2_c is insulated from the seventh alignment test structure T3_c, and the sixth alignment test structure T2_c is insulated from the eighth alignment test structure T4_c. By such arrangement, not only the alignment of the connecting circuit board and the measured component (i.e. the touch panel) can be detected, but also the relative offset relationship between the connecting circuit board and the touch panel when the connecting circuit board and the touch panel are misaligned can be further detected. For example, if the first test connecting part T1_b and the third test connecting part T3_b are electrically connected, i.e. the first alignment test structure T1_a and the third alignment test structure T3_a are electrically connected, or the second test connecting part T2_b and the fourth test connecting part T4_b are electrically connected, i.e. the second alignment test structure T2_a and the fourth alignment test structure T4_a are electrically connected, through the test component, it is indicated that the first alignment test structure T1_a and the third alignment test structure T3_a are short-circuited through the alignment test structures in the second alignment test structure group 23; or the second alignment test structure T2_a and the fourth alignment test structure T4_a are short-circuited through the alignment test structures in the second alignment test structure group 23; at this time, it is indicated that the connecting circuit board and the measured component are misaligned in the first direction X and the misalignment type is short-circuit overkill. When the first test connecting part T1_b and the second test connecting part T2_b are insulated, i.e. the first alignment test structure T1_a and the second alignment test structure T2_a are insulated, or the third test connecting part T3_b and the fourth test connecting part T4_b are insulated, i.e. the third alignment test structure T3_a and the fourth alignment test structure T4_a are insulated, through the test component, it is indicated that the first alignment test structure T1_a and the second alignment test structure T2_a are not connected to the alignment test structures in the second alignment test structure group 23; or the third alignment test structure T3_a and the fourth alignment test structure T4_a are not connected to the alignment test structures in the second alignment test structure group 23; at this time, it is indicated that the misalignment type of the connecting circuit board and the measured component is open-circuit overkill. Thus, the connecting circuit board can also be used to test the type of misalignment between the measured component.

[0059] The technical scheme of the embodiment adopts the touch panel including a touch substrate and a plurality of touch electrodes arranged on the touch substrate; the touch panel further includes a plurality of touch connection parts arranged on the touch substrate and electrically connected with the plurality of touch electrodes in a one-to-one correspondence; the plurality of touch connection parts are arranged along a first direction and extend along a second direction; the touch panel further includes at least one second alignment test structure group arranged on the touch substrate and corresponding to at least one first alignment test structure group on the connection circuit board in a one-to-one correspondence; the second alignment test structure group is used for electrically connecting with the first alignment test structure group in alignment; the second alignment test structure group includes a fifth alignment test structure, a sixth alignment test structure, a seventh alignment test structure and an eighth alignment test structure; the fifth alignment test structure is electrically connected with the sixth alignment test structure and arranged along the second direction; the seventh alignment test structure is electrically connected with the eighth alignment test structure and arranged along the second direction; the fifth alignment test structure, the seventh alignment test structure and the touch connection part are arranged along the first direction; the sixth alignment test structure, the eighth alignment test structure and the touch connection part are arranged along the first direction. When the touch panel of the embodiment is tested by false pressure, by cooperating with the connection circuit board, it can not only be used for testing whether the connection circuit board and the measured component are aligned according to the electrical connection relationship between each alignment test structure on the connection circuit board, but also can be used for confirming the type of misalignment when the connection circuit board and the touch panel are misaligned, so that the user can make targeted adjustment, and the test efficiency is improved.

[0060] Optionally, with reference back to Figure 2 , along the first direction X, the sizes of the fifth alignment test structure T1_c, the sixth alignment test structure T2_c, the seventh alignment test structure T3_c, the eighth alignment test structure T4_c and the touch connection part 221 are the same; along the first direction X, the distance between the fifth alignment test structure T1_c and the seventh alignment test structure T3_c is the same as the distance between the adjacent two touch connection parts 221; along the first direction X, the distance between the sixth alignment test structure T2_c and the eighth alignment test structure T4_c is the same as the distance between the adjacent two touch connection parts 221.

[0061] Specifically, in the embodiment, the distance between any two adjacent touch connection portions 221 is equal, for example, set as d. Then the distance between the fifth alignment test structure T1_c and the seventh alignment test structure T3_c is d, and the distance between the sixth alignment test structure T2_c and the eighth alignment test structure T4_c is d. Moreover, the size of the alignment test structure along the first direction X is the same as the size of the touch connection portion 221. In this way, the offset between the first alignment test structure group and the second alignment test structure group along the first direction X is the same as the offset between the connection circuit board and the corresponding touch connection portion 221 along the first direction X. The electrical connection relationship of the alignment test structures in the first alignment test structure group 13 can more accurately reflect the type of misalignment between the connection circuit board and the measured component.

[0062] Optionally, as shown in Figure 2 , the touch panel includes two second alignment test structure groups 23, which are arranged on both sides of the plurality of touch connection portions (i.e., the touch connection portion group 22) along the first direction.

[0063] Specifically, in the embodiment, the second alignment test structure group 23 is arranged to cooperate with the two first alignment test structure groups 13 on the connection circuit board, so that the test redundancy can be realized. That is, when one of the first alignment test structure groups 13 fails, the other can still perform detection, thereby further improving the accuracy of detection.

[0064] Optionally, the fifth alignment test structure T1_c, the sixth alignment test structure T2_c, the seventh alignment test structure T3_c, and the eighth alignment test structure T4_c are all pads, for example, metal pads. The touch connection portion 221 can also be a metal pad.

[0065] Exemplarily, Figure 4 a structure schematic diagram of a combination of a connection circuit board and a measured component provided by the embodiment of the utility model, Figure 5 for Figure 4 a cross-sectional view along the A1A2 direction, referring to Figure 4 and Figure 5 When it is detected that the first alignment test structure T1_a and the second alignment test structure T2_a are electrically connected, and the third alignment test structure T1_a and the fourth alignment test structure T4_a are electrically connected, it indicates that the first alignment test structure T1_a and the fifth alignment test structure T1_c are electrically connected, the second alignment test structure T2_a and the sixth alignment test structure T2_c are electrically connected, the third alignment test structure T3_a and the seventh alignment test structure T3_c are electrically connected, and the fourth alignment test structure T4_c and the eighth alignment test structure T4_c are electrically connected, that is, it indicates that the connection circuit board and the touch panel are accurately aligned, and the alignment effect is as shown in Figure 4 and Figure 5 .

[0066] Exemplarily, Figure 6 A structure schematic diagram of a combination of a connecting circuit board and a measured component provided by the utility model, Figure 7 To Figure 6 A cross-sectional view along A1A2 direction, refer to Figure 6 And Figure 7 When the first test connecting portion T1_b and the third test connecting portion T3_b are electrically connected, that is, the first alignment test structure T1_a and the third alignment test structure T3_a are electrically connected, or the second test connecting portion T2_b and the fourth test connecting portion T4_b are electrically connected, that is, the second alignment test structure T2_a and the fourth alignment test structure T4_a are electrically connected, through the test component, it is indicated that the first alignment test structure T1_a and the third alignment test structure T3_a are short-circuited through the alignment test structure in the second alignment test structure group 23, or the second alignment test structure T2_a and the fourth alignment test structure T4_a are short-circuited through the alignment test structure in the second alignment test structure group 23, that is, the misalignment type of the connecting circuit board and the touch panel is short-circuit overkill, and the alignment effect is as shown in Figure 6 And Figure 7 .

[0067] Exemplarily, Figure 8 A structure schematic diagram of a combination of a connecting circuit board and a measured component provided by the utility model, Figure 9 To Figure 8 A cross-sectional view along A3A4 direction, refer to Figure 8 And Figure 9 When the first test connecting portion T1_b and the second test connecting portion T2_b are insulated, that is, the first alignment test structure T1_a and the second alignment test structure T2_a are insulated, or the third test connecting portion T3_b and the fourth test connecting portion T4_b are insulated, that is, the third alignment test structure T3_a and the fourth alignment test structure T4_a are insulated, through the test component, it is indicated that the first alignment test structure T1_a and the second alignment test structure T2_a are not connected to the alignment test structure in the second alignment test structure group 23, or the third alignment test structure T3_a and the fourth alignment test structure T4_a are not connected to the alignment test structure in the second alignment test structure group 23, at this time, it is indicated that the misalignment type of the connecting circuit board and the measured component is open-circuit overkill, and the alignment effect is as shown in Figure 8 And Figure 9 .

[0068] The utility model also provides a kind of display module, display module includes display panel and the touch panel provided by any embodiment of the utility model.The touch panel is bound with display panel.The display module provided by the embodiment of the utility model includes the touch panel provided by the embodiment of the utility model, thus also has the same beneficial effect, which will not be repeated here.

[0069] It should be understood that the steps can be reordered, added, or deleted using the various forms of the flow shown above. For example, the steps described in the utility model can be executed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions of the utility model can be achieved, which are not limited herein.

[0070] The above specific embodiments do not constitute a limitation on the scope of protection of the utility model. Those skilled in the art should understand that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the utility model shall be included in the scope of protection of the utility model.

Claims

1. A connecting circuit board, characterized by, The connection circuit board is used for connecting a measured component and a test component; the connection circuit board comprises a flexible carrier, a connection structure group and at least one first alignment test structure group arranged on the flexible carrier; the connection structure group comprises a plurality of connection structures arranged along a first direction and extending along a second direction, and the connection structures are used for electrically connecting with the measured component; the first alignment test structure group is used for electrically connecting with a second alignment test structure group on the measured component in alignment; The first alignment test structure group comprises a first alignment test structure, a second alignment test structure, a third alignment test structure and a fourth alignment test structure; the first alignment test structure and the second alignment test structure are arranged along the second direction, and the third alignment test structure and the fourth alignment test structure are arranged along the second direction; the first alignment test structure, the third alignment test structure and the connection structure group are arranged along the first direction; the second alignment test structure, the fourth alignment test structure and the connection structure group are arranged along the first direction.

2. The connection circuit board according to claim 1, wherein The connection circuit board further comprises a plurality of test component connecting portions arranged on the flexible carrier, and the test component connecting portions are used for electrically connecting with the test component; The plurality of test component connecting portions comprise a first test connecting portion electrically connected with the first alignment test structure, a second test connecting portion electrically connected with the second alignment test structure, a third test connecting portion electrically connected with the third alignment test structure and a fourth test connecting portion electrically connected with the fourth alignment test structure.

3. The connection circuit board according to claim 2, wherein The plurality of test component connecting portions further comprise a plurality of fifth test connecting portions; along the first direction, the first test connecting portion and the second test connecting portion are located on one side of the plurality of fifth test connecting portions; and the third test connecting portion and the fourth test connecting portion are located on the other side of the plurality of fifth test connecting portions.

4. The connection circuit board according to claim 1, wherein Along the first direction, the first alignment test structure, the second alignment test structure, the third alignment test structure, the fourth alignment test structure and the connection structure have the same size; Along the first direction, the distance between the first alignment test structure and the third alignment test structure is the same as the distance between adjacent two connection structures; Along the first direction, the distance between the second alignment test structure and the fourth alignment test structure is the same as the distance between adjacent two connection structures.

5. The connection circuit board according to claim 1, wherein The connection circuit board comprises two first alignment test structure groups, and along the first direction, the two first alignment test structure groups are arranged on two sides of the connection structure group.

6. The connection circuit board according to claim 1, wherein The first alignment test structure, the second alignment test structure, the third alignment test structure and the fourth alignment test structure are all solder pads.

7. A touch panel, characterized by comprising: The touch panel comprises a touch substrate and a plurality of touch electrodes arranged on the touch substrate; The touch panel further comprises a plurality of touch connection portions arranged on the touch substrate and electrically connected with the plurality of touch electrodes; the plurality of touch connection portions are arranged along a first direction and extend along a second direction; the touch panel further comprises at least one second alignment test structure group arranged on the touch substrate and corresponding to at least one first alignment test structure group on the connection circuit board as claimed in any one of claims 1-6; the second alignment test structure group is used for aligning and electrically connecting with the first alignment test structure group; The second alignment test structure group comprises a fifth alignment test structure, a sixth alignment test structure, a seventh alignment test structure and an eighth alignment test structure; the fifth alignment test structure is electrically connected with the sixth alignment test structure and arranged along the second direction; the seventh alignment test structure is electrically connected with the eighth alignment test structure and arranged along the second direction; the fifth alignment test structure, the seventh alignment test structure and the touch connection portion are arranged along the first direction; the sixth alignment test structure, the eighth alignment test structure and the touch connection portion are arranged along the first direction.

8. The touch panel according to claim 7, wherein Along the first direction, the fifth alignment test structure, the sixth alignment test structure, the seventh alignment test structure, the eighth alignment test structure and the touch connection portion have the same size; Along the first direction, the distance between the fifth alignment test structure and the seventh alignment test structure is the same as the distance between two adjacent touch connection portions; Along the first direction, the distance between the sixth alignment test structure and the eighth alignment test structure is the same as the distance between two adjacent touch connection portions.

9. The touch panel according to claim 7, wherein The touch panel comprises two second alignment test structure groups, and along the first direction, the two second alignment test structure groups are arranged on two sides of the plurality of touch connection portions.

10. A display module, characterized by The display module comprises the touch panel as claimed in any one of claims 7-9.

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