High-speed multi-line scanning material measuring device

Abstract

The utility model provides a high-speed multi-line type scanning material measuring device, which comprises a signal module, a reflection assembly and a driving mechanism, and is characterized in that the signal module is at least used for generating a transmitting wave beam and receiving an incident wave beam; the reflection assembly is arranged to be a plurality of reflection plates distributed according to a preset angle, the reflection plates and the signal module are arranged at a preset interval, and the reflection plates reflect the emission wave beams generated by the signal module to form emergent wave beams; the reflecting surfaces of the plurality of reflecting plates and the transmitting beam of the signal module form a plurality of first angles, and the reflecting surfaces of the plurality of reflecting plates and the emergent beam form a plurality of second angles; and the driving mechanism is used for driving the reflection assembly to rotate so as to realize material level measurement of the surface profile of the material. According to the invention, the signal module and the reflection assembly designed in a windmill-like structure are arranged, so that all the emergent beams reflected by the reflection assembly can be emitted to the surface of the material, and the three-dimensional measurement of the surface of the material is realized in combination with the displacement mechanism.

Description

Technical Field

[0001] This disclosure relates to the field of material scanning technology, and specifically to a high-speed multi-line scanning material measuring device. Background Technology

[0002] For 2D scanning radar, in order to obtain the level information of the target material, the scanning radar is usually installed on a horizontal motion mechanism or a pitch motion mechanism to achieve two-dimensional scanning in the horizontal or pitch direction. However, two-dimensional scanning has the disadvantage of a small scanning range. Furthermore, the communication cables and power cables connecting the main control board of the scanning radar to the high frequency will move relative to each other during the movement, resulting in low reliability and reduced service life of the radar product.

[0003] To address this, existing solutions employ a rotating reflector to alter the beam path, causing the emitted beam to reflect onto the material surface. This avoids relative movement of communication and power cables connecting the main control board and the high-frequency board, resulting in high radar product reliability and a longer lifespan. However, this scanning method suffers from a small scanning range and also exhibits the technical problem of invalid scanning areas. Specifically, as the reflector rotates, part of the emitted beam is emitted onto the material surface, while another part is emitted onto the container instead of the material surface. The portion of the emitted beam emitting onto the container is considered an invalid scan.

[0004] Therefore, there is an urgent need in the field for a material measuring device that can solve the above-mentioned technical problems. Summary of the Invention

[0005] This disclosure provides a high-speed multi-line scanning material measuring device, which solves the technical problem that existing 2D scanning radars not only have a small scanning range, but also cause invalid scanning by setting a rotating reflector to change the beam path, resulting in part of the emitted beam being emitted onto the material surface and part being emitted onto the container.

[0006] This disclosure provides a high-speed multi-line scanning material measuring device, comprising:

[0007] The signal module is at least used to generate a transmitted beam and receive an incident beam;

[0008] A reflective assembly is configured as a plurality of reflective plates distributed at a preset angle. The plurality of reflective plates are set at a predetermined distance from the signal module and reflect the transmitted beam generated by the signal module to form an emitted beam. The reflective surfaces of the plurality of reflective plates form a plurality of first angles with the transmitted beam and a plurality of second angles with the emitted beam.

[0009] A driving mechanism is provided to drive the reflective component to rotate. During the rotation, the emitted beams corresponding to multiple second angles are emitted to the material surface and form at least one scanning trajectory to achieve level measurement of the material surface profile.

[0010] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein a plurality of reflective plates share a rotating axis and the reflective surfaces of the plurality of reflective plates are located in different two-dimensional planes, the driving mechanism is fixedly connected to the rotating axis, and the driving mechanism drives the rotating axis to rotate to drive the plurality of reflective plates to rotate synchronously.

[0011] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein a plurality of the reflective plates in the reflective assembly are circumferentially distributed, and the reflective surfaces of the plurality of reflective plates are initially installed at a preset tilt angle relative to the direction of the emitted beam, such that the emitted beam after being reflected by the reflective surface of each reflective plate during rotation is emitted onto the surface of the material.

[0012] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein a plurality of reflective plates in the reflective assembly are circumferentially distributed, and the reflective surfaces of the plurality of reflective plates are continuously distributed along the circumferential direction at preset interval angles.

[0013] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided in which the reflective surfaces of any two adjacent reflectors are spaced at the same or different angles.

[0014] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein a plurality of the reflective plates in the reflective assembly are circumferentially distributed, and the plurality of the reflective plates are symmetrically or asymmetrically distributed.

[0015] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein a plurality of reflective plates in the reflective assembly are circumferentially distributed, and the reflective surfaces of the plurality of reflective plates are discontinuously distributed along the circumferential direction, wherein a beam non-reflection region exists between the reflective surfaces of any two adjacent reflective plates, and the emitted beam is not reflected and does not form an outgoing beam within the beam non-reflection region.

[0016] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device exists in which the areas of the non-reflective beam regions between any two adjacent reflector surfaces are equal or unequal.

[0017] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device, during the process of the driving mechanism driving the reflective assembly to rotate, the reflective surfaces of a plurality of reflective plates in the reflective assembly form a plurality of first angles with the emitted beam of the signal module and a plurality of second angles with the emitted beam, which may be the same as or different from those formed by the reflective surfaces. This causes the reflected emitted beam to reach the same or different measurement points on the material surface to form at least one scanning trajectory. After passing the measurement point, the beam is reflected to form a reflected beam. The reflected beam is received by the reflective plates and reflected by the reflective plates to form an incident beam. The incident beam is provided to the signal module to form a measurement signal, thereby realizing the level measurement of the material surface profile.

[0018] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein the rotation direction of the driving mechanism is a single-direction continuous counterclockwise or clockwise rotation, or a reciprocating rotation within a certain angle range of clockwise and counterclockwise, or a rotation in a preset manner.

[0019] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein the reflective surface of the reflector is at least one of a plane, a curved surface, a refractive surface, and a parabolic surface; and the curved surface is at least one of a fan-shaped, parabolic, and pyramidal type.

[0020] A high-speed multi-line scanning material measuring device according to at least one embodiment of the present disclosure further includes a waveguide structure fixed to the signal module for guiding the transmitted beam to the reflective component; and guiding the incident beam reflected back by the reflective component to the signal module.

[0021] A high-speed multi-line scanning material measuring device according to at least one embodiment of the present disclosure further includes a displacement mechanism, which adjusts the first angle between the reflective surface of each reflector in the reflective assembly and the emitted beam to switch between different multiple two-dimensional scanning surfaces, thereby realizing the measurement of the material surface in multiple two-dimensional scanning surfaces, and finally realizing the three-dimensional measurement of the material surface profile based on the measurement information of multiple multi-line scanning surfaces.

[0022] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein the displacement mechanism controls the material measuring system to move in a direction forming a predetermined angle with the two-dimensional scanning surface, so as to realize the measurement of the material surface in multiple two-dimensional scanning surfaces.

[0023] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein the predetermined included angle is 90°.

[0024] This disclosure provides a high-speed multi-line scanning material measurement device, including a signal module, a reflective component, and a driving mechanism. The signal module is used to generate a transmitted beam and receive an incident beam. The reflective component consists of multiple reflective plates distributed at preset angles, spaced at predetermined distances from the signal module, and reflecting the transmitted beam generated by the signal module to form an emitted beam. The reflective surfaces of the multiple reflective plates form multiple first angles with the transmitted beam of the signal module and multiple second angles with the emitted beam. The driving mechanism drives the reflective component to rotate, thereby achieving level measurement of the material surface profile. By using a signal module and a windmill-like reflective component, this disclosure ensures that the emitted beam, after being reflected by the reflective component, is entirely emitted onto the material surface. Combined with the displacement mechanism, this achieves high-precision three-dimensional measurement of the material surface profile. Attached Figure Description

[0025] The accompanying drawings are provided to further illustrate the present disclosure and form part of the specification. They are used together with the following detailed description to explain the present disclosure, but do not constitute a limitation thereof. In the drawings:

[0026] Figure 1 This is a three-dimensional structural schematic diagram of a high-speed multi-line scanning material measuring device according to an embodiment of the present disclosure;

[0027] Figure 2 yes Figure 1 A front view of a high-speed multi-line scanning material measuring device according to an embodiment of the present disclosure;

[0028] Figure 3 yes Figure 1 3D structural diagram of the reflective component Figure 1 ;

[0029] Figure 4 yes Figure 1 3D structural diagram of the reflective component Figure 2 ;

[0030] Figure 5 yes Figure 1 The main view of the reflection component in the image;

[0031] Figure 6 This is a schematic diagram of the structure of a reflective component according to an embodiment of the present disclosure. Figure 3 ;

[0032] Figure 7 This is a schematic diagram of the structure of a reflective component according to an embodiment of the present disclosure. Figure 4 ;

[0033] Figure 8This is a schematic diagram of the structure of a reflective component according to an embodiment of the present disclosure. Figure 5 .

[0034] Summary of attached image labels:

[0035] 1. Signal module; 2. Reflection assembly; 21. Reflector;

[0036] 22. Rotating shaft; 3. Drive mechanism; 4. Housing. Detailed Implementation

[0037] The specific embodiments of this disclosure will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit this disclosure.

[0038] Figure 1 and 2 A high-speed multi-line scanning material measuring device according to an embodiment of the present disclosure is shown. For example... Figure 1 and 2 As shown, the high-speed multi-line scanning material measuring device disclosed herein includes a signal module 1, a reflective component 2, and a drive mechanism 3.

[0039] In this disclosure, the beam emitted by the signal module 1 (which may be the processed beam emitted by the transmitting antenna module of the signal module 1) is the transmitting beam. The transmitting beam is reflected by the reflecting component 2 to form the outgoing beam. The beam formed by the outgoing beam after being emitted to the material and reflected by the surface of the material is the reflected beam. Then, the reflected beam is reflected to the plurality of reflecting plates 21 in the reflecting component 2. The beam generated by the reflection of the plurality of reflecting plates 21 in the reflecting component 2 is the incident beam, and the incident beam is received by the receiving antenna module of the signal module 1.

[0040] The signal module 1 is at least used to generate a transmitted beam and receive an incident beam. The signal module 1 can be a microwave module or a laser module. For example, when it is a microwave module, the transmitted beam formed by the microwave module can be a narrow beam, and the beam angle of this narrow beam can be controlled to ≤3°. Specifically, the microwave module may include a microwave antenna, and this microwave antenna can transmit a microwave beam. The microwave beam can be focused into a narrow beam by a horn antenna or a lens antenna in the microwave module.

[0041] The signal module 1 can be controlled to generate transmit beams of different types and / or frequencies. For example, the frequency range of the transmit beam can be 60–300 GHz. The transmit beam can be a linearly polarized beam or a circularly polarized beam in a single direction; or it can be a hybrid beam composed of multiple linearly polarized beams and circularly polarized beams; or it can be a switchable linearly polarized beam and a circularly polarized beam. When the signal module 1 is a microwave module, the microwave antenna in the microwave module can be an antenna array, thereby enabling switching between multiple polarization modes or simultaneously transmitting microwave beams of multiple polarizations. These polarized microwave beams can be linearly polarized beams and circularly polarized beams, wherein the linearly polarized beams can be horizontally polarized beams and / or vertically polarized beams. In this disclosure, preferably, a hybrid beam composed of multiple linearly polarized beams and circularly polarized beams or a switchable linearly polarized beam and a circularly polarized beam can be used. This allows the material surface to be scanned by microwave beams of different polarization forms, thereby obtaining reflective beams with different reflectivity in a single measurement. This approach offers a significantly improved ability to analyze material surfaces compared to existing technologies.

[0042] The reflective component 2 in this disclosure is configured as a plurality of reflective plates 21 distributed at preset angles. The plurality of reflective plates 21 are spaced at predetermined distances from the signal module 1 and reflect the emitted beam generated by the signal module 1 to form an emitted beam. The reflective surfaces of the plurality of reflective plates 21 form a plurality of first angles with the emitted beam of the signal module 1 and a plurality of second angles with the emitted beam. The reflective surface of each reflective plate 21 is at least one of a plane, a curved surface, a refracting surface, or a parabolic surface; the curved surface is at least one of a fan-shaped, parabolic, or pyramidal type. The driving mechanism 3 drives the reflective component 2 to rotate, and the emitted beams corresponding to the plurality of second angles are emitted onto the material surface during rotation, forming at least one scanning trajectory to achieve level measurement of the material surface contour.

[0043] A high-speed multi-line scanning material measuring device according to at least one embodiment of the present disclosure, such as Figure 3-5 As shown, the reflective component 2 can be designed with a windmill-like structure. The multiple reflective plates 21 in the reflective component 2 share a rotating shaft 22, and the reflective surfaces of the multiple reflective plates 21 are located on different two-dimensional planes. The output shaft of the driving mechanism 3 is fixedly connected to the rotating shaft 22. The driving mechanism 3 drives the multiple reflective plates 21 to rotate synchronously by driving the rotating shaft 22 to rotate.

[0044] Specifically, the plurality of reflective plates 21 in the reflective assembly 2 can be distributed circumferentially or coaxially, and the reflecting surfaces of the plurality of reflective plates 21 can be continuously or discontinuously distributed along the circumferential direction. Furthermore, when initially installed, the plurality of reflective plates 21 in the reflective assembly 2 are set at a preset tilt angle relative to the direction of the emitted beam, so that during rotation, all or almost all of the emitted beam reflected by the reflecting surface of each reflective plate 21 is emitted onto the material surface. The following provides a detailed description of both continuous and discontinuous distribution of the plurality of reflective plates 21.

[0045] (i) The case of multiple reflectors being distributed in a continuous manner

[0046] The reflective assembly 2 comprises a plurality of reflective plates 21 continuously distributed along a circumference or coaxially. Specifically, the reflective surfaces of the plurality of reflective plates 21 are continuously distributed along the circumference at predetermined intervals. Preferably, the interval angle between the reflective surfaces of any two adjacent reflective plates 21 is the same; in other words, the included angle formed by the planes of any two adjacent reflective plates 21 distributed along the circumference is the same. Of course, the included angle formed by the planes of any two adjacent reflective plates 21 may also be different, or the interval angle between the planes of any two adjacent reflective plates 21 may be partially the same or partially different.

[0047] Furthermore, the reflective surfaces of the plurality of reflective plates 21 in the reflective assembly 2 are distributed along the circumferential direction or coaxially, wherein the plurality of reflective plates 21 may be symmetrically or asymmetrically distributed circumferentially or coaxially.

[0048] like Figure 6 As shown, Figure 6 The diagram shows that the reflective assembly 2 has eight continuously and symmetrically distributed reflective plates 21; as shown... Figure 7 As shown, Figure 7 The image shows that the reflective assembly 2 has five consecutive and asymmetrically distributed reflective plates 21. Figure 6 and Figure 7 For illustrative purposes only, the number of reflectors 21 in the reflective assembly 2 can be specifically set according to requirements, as long as it can ensure that all or almost all of the emitted beam formed after being reflected by the reflective surface of the reflector 21 is emitted to the material surface during the rotation process.

[0049] Specifically, during the initial installation of the signal module 1 and the reflector 2, the emitted beam from the signal module 1 can be positioned directly opposite the reflective surface of one of the reflector plates 21 in the reflector 1. At this point, the first angle formed between the reflector plate 21 and the emitted beam, and the second angle formed with the emitted beam, are both within the range of (0° to 90°), preferably both the first and second angles are 45 degrees. 0° and 90 degrees are extreme cases; in these two cases, the emitted beam will not be emitted onto the material surface.

[0050] (ii) The case where multiple reflectors are not distributed discontinuously

[0051] In this case, the plurality of reflective plates 21 in the reflective assembly 2 are distributed discontinuously in a circular or coaxial manner, and the reflective surfaces of the plurality of reflective plates 21 are distributed discontinuously along the circumferential direction. There is a beam non-reflection region between the reflective surfaces of any two adjacent reflective plates 21. Within the beam non-reflection region, the emitted beam is not reflected and does not form an outgoing beam.

[0052] like Figure 3-5 As shown in Figure 8, the reflective component 2 is provided with four reflective plates 21. There is one beam non-reflection region between every two adjacent reflective plates 21, and the four beam non-reflection regions are symmetrically arranged and have the same area. It should be noted that the area of ​​the beam non-reflection region between adjacent reflective plates 21 can be the same or different, and can be arranged symmetrically or asymmetrically. The specific arrangement can be determined according to actual needs and is not specifically limited here.

[0053] As the driving mechanism 3 rotates, there may be a situation where a transmitting beam is simultaneously emitted onto two of the reflectors 21. However, the planes on which the two reflectors 21 are located have a certain angle. In order to obtain a stable and clear beam signal, the reflective surfaces of the multiple reflectors 21 are discontinuously distributed along the circumferential direction. This results in a beam non-reflection region between the reflective surfaces of the multiple reflectors 21. No reflection or outgoing beam is formed in the beam non-reflection region.

[0054] It should be noted that in the above-mentioned discontinuous distribution of multiple reflectors 21, the area of ​​the non-reflective region between the reflective surfaces of any two adjacent reflectors 21 may be equal or unequal.

[0055] In the above embodiment, the reflective component 2 is configured as a windmill-like structure. The driving mechanism 3 drives the reflective component 2 to rotate circumferentially, and the plurality of reflective plates 21 in the reflective component 2 will rotate synchronously. Since the reflective surfaces of the plurality of reflective plates 21 are located on different two-dimensional planes, the reflective surfaces of the plurality of reflective plates 21 form a plurality of first angles with the transmitted beam of the signal module 1 and a plurality of second angles with the emitted beam.

[0056] If any two adjacent reflective surfaces of the plurality of reflective plates 21 have the same angular interval in their two-dimensional planes, then the plurality of first angles and plurality of second angles formed by the reflective surfaces of the plurality of reflective plates 21 during rotation are the same, that is, the material surface is scanned repeatedly, that is, the plurality of scanning trajectories formed by the emitted beams of the plurality of second angles on the material surface coincide, thereby achieving high-precision scanning. At this time, the driving mechanism 3 drives the rotating shaft 22 to rotate at a certain speed, thereby driving the plurality of reflective plates 21 to rotate synchronously, and after a certain time at a certain speed, the two-dimensional plane of the reflective surface of the latter reflective plate 21 coincides with the two-dimensional plane of the former reflective plate 21 before rotation. At this time, multi-line scanning can be achieved by setting multiple sets of signal modules 1 and reflective components 2, that is, multiple signal modules 1 and reflective components 2 are set in equal numbers, thereby achieving high-precision multi-line scanning, and three-dimensional scanning can be achieved by combining the driving mechanism or displacement mechanism, thereby greatly improving the scanning range. Alternatively, the drive mechanism 3 can be controlled to rotate at different speeds, while the multiple reflectors 21 still rotate synchronously. However, after a certain period of time, the two-dimensional plane of the reflective surface of the subsequent reflector 21 at different speeds does not coincide with or has a certain angle to the two-dimensional plane of the preceding reflector 21 before rotation. At this time, the reflective component 1 will drive the multiple reflectors 21 to rotate synchronously under the drive mechanism 3. The outgoing beams reflected by the multiple reflectors 21 will be emitted to different measurement points on the material surface, that is, different scanning trajectories will be formed on the material surface to achieve three-dimensional scanning of the material surface, and the scanning range will be greatly improved.

[0057] If any two adjacent reflective surfaces of the plurality of reflective plates 21 have different angular intervals in the two-dimensional plane, or partially have different angular intervals (or partially have the same angular interval), then the plurality of first angles formed by the reflective surfaces of the plurality of reflective plates 21 and the emitted beam of the signal module 1, and the plurality of second angles formed by the emitted beam, are all different or partially different during rotation, thus achieving multi-line scanning of the material surface. It should be noted that when the angular intervals of the two-dimensional planes where the reflective surfaces of any two reflective plates 21 are all different, the number of lines in the multi-line scan is the same as the number of reflective plates 21; when the angular intervals of the two-dimensional planes where the reflective surfaces of any two reflective plates 21 are partially different, the number of lines in the multi-line scan is the number of different angular intervals plus 1.

[0058] When the two-dimensional plane angle intervals of the reflective surfaces of any two reflective plates 21 are different, during the process of the driving mechanism 3 driving the reflective assembly 2 to rotate, the multiple first angles formed by the reflective surfaces of the multiple reflective plates 21 in the reflective assembly 2 with the transmitted beam of the signal module 1 and the multiple second angles formed with the emitted beam are constantly changing. This causes the reflected emitted beam to reach different measurement points on the material surface to form at least one scanning trajectory. After passing the measurement point, it is reflected to form a reflected beam. The reflected beam is received by the reflective plate 21 and reflected by the reflective plate 21 to form an incident beam. The incident beam is provided to the signal module 1 to form a measurement signal, thereby realizing the measurement of different measurement points.

[0059] In existing methods, the planar reflector 2 rotates under the drive of the driving mechanism 3. The emitted beam is reflected after reaching the reflector 2, forming an outgoing beam. As the reflector 2 rotates, the outgoing beam is emitted onto the material surface and the container containing the material. If the reflector 2 performs circular motion, only a portion of the outgoing beam will reach the material surface; most will reach non-material surface locations such as the container wall or top. Cases where the beam does not reach the material surface are considered invalid scans. However, in this disclosure, the windmill-like structure of the reflector 2, driven by the driving mechanism 3, allows the emitted beam to be completely emitted onto the material surface after being reflected by multiple reflectors 21 within the reflector 2.

[0060] Furthermore, if the reflective surfaces of any two adjacent reflectors 21 have the same angular interval in their two-dimensional planes, then it is only necessary to satisfy that the first angle formed by the emitted beam of the signal module 1 and the reflective surface of a certain initially rotated reflector 21 is set within a preset angle range. Within this preset angle range, all or almost all of the emitted beam can be emitted onto the material surface. As the reflective assembly 2 rotates, the multiple reflectors 21 emit the emitted beam, after reflection, onto the material surface.

[0061] Alternatively, if the two-dimensional planes on which the reflective surfaces of any two adjacent reflector plates 21 are located have different or partially different angular intervals, then the first angle formed by the transmitted beam of the signal module 1 and at least half of the reflective surfaces of the plurality of reflector plates 21 must be set within a certain range, that is, the emitted beam is emitted onto the surface of the material. Then, as the reflector assembly 2 rotates, the emitted beams after reflection by the plurality of reflector plates 21 will also be emitted onto the surface of the material.

[0062] According to at least one embodiment of the present disclosure, a high-speed multi-line scanning material measuring device is provided, wherein the rotation direction of the driving mechanism 3 is a single-direction counterclockwise or clockwise continuous rotation, or a reciprocating rotation within a certain angle range of clockwise and counterclockwise, or a rotation in a preset manner.

[0063] In the above specific embodiments, the driving mechanism 3 can be in the form of a motor or the like. The reflective component 2 can be mounted on the output shaft of the motor by a fixing device. The driving mechanism 3 drives the reflective component 2 to rotate by rotating the output shaft. For example, the direction of electric rotation of the reflective component 2 driven by the motor can be a single direction of continuous counterclockwise or clockwise rotation, or a reciprocating rotation within a certain angle range of clockwise and counterclockwise, or rotation according to a preset method, etc.

[0064] The rotational speed of the motor can be adjusted, thereby correspondingly adjusting the rotational speed of the reflective component 2. Controlling the motor's rotational speed allows for control of the rotational speed of the reflective component 2. Since the rotational speed of the reflective component 2 is adjustable, faster material measurement can be achieved in certain situations. Furthermore, the angle / position information of the reflective component 2 can also be detected. This measurement can be achieved by detecting the rotational angle of the output shaft; for example, the angle / position information of the reflective component 2 at different times can be obtained through calculation. The angle / position information can be measured using a rotary encoder mounted on the output shaft or using a position sensor, such as an angular displacement sensor.

[0065] The reflector component 2 can be directly or indirectly connected to the output shaft of the motor via a fixing device, but it should be understood that other connection methods are also possible. For example, the output shaft can be connected to the reflector component 2 via a connecting mechanism with a spherical component, such as a universal joint. The rotation of the output shaft drives the rotation of the reflector component 2, thereby changing the emission direction of the emitted beam. Ultimately, the rotation of the reflector component 2 causes each emitted beam to form a rotating beam, thus creating multiple scanning surfaces. In this disclosure, the signal module 1 emits a transmission beam at preset fixed time intervals or time intervals that vary according to a preset pattern. For example, the transmission beam is emitted at the first moment, reaching the reflector 21 and forming a first angle at the first moment. The transmission beam is reflected by the reflector 21 to form an outgoing beam, forming a second angle with the reflector 21 at the first moment. It reaches the material surface to form a measurement point, and after being reflected by the material surface, it forms a reflected beam. Then, the reflected beam reaches the reflector 21 and is reflected again to form an incident beam, which is received by the signal module 1. During the process of each measurement point from the transmission beam to the incident beam, the driving mechanism 3 drives the reflector component 2 to rotate at a preset fixed speed or a regularly varying speed. Then, at the second moment, the above steps are repeated... In this way, after the reflector component 2 rotates one revolution or a certain angle, measurement signals of multiple material surface measurement points can be obtained. Based on the measurement signals of each measurement point and the corresponding angle / position information of the reflector 21, multiple two-dimensional curves of the material surface contour are constructed, that is, a three-dimensional scan of the material surface is formed.

[0066] It should be noted that the reflective component 2, designed with a windmill-like structure in this disclosure, allows the first angle and the second angle at different times to be the same or different. Preferably, the first angle and the second angle change continuously at different times, thereby enabling multi-line scanning of the material surface. Alternatively, by adjusting the driving mechanism 3 to drive the reflective component 2 to rotate according to a preset logic, various scanning methods such as high-precision 2D repeating scanning, multi-line scanning, or three-dimensional scanning can also be achieved.

[0067] A high-speed multi-line scanning material measuring device according to at least one embodiment of the present disclosure may further include a waveguide structure fixed to the signal module 1 for guiding the transmitted beam toward the reflector 21 in the reflector assembly 2 and guiding the incident beam reflected back by the reflector 21 to the signal module 1.

[0068] In real-world scenarios, the shape of materials is usually not uniformly distributed, so it is necessary to accurately measure the three-dimensional shape of the materials.

[0069] Therefore, the material measurement system of this disclosure may further include a displacement mechanism for moving or oscillating the aforementioned reflective component 2. The direction of movement or oscillation of the reflective component 2 may form a predetermined angle with the two-dimensional scanning surface, thereby enabling the system to move to the next set of two-dimensional scanning surfaces after scanning a set of two-dimensional scanning surfaces, repeating this process to obtain multiple sets of two-dimensional scanning surfaces. By detecting the movement information bits of the displacement mechanism, such as movement speed and direction, the position information corresponding to each two-dimensional scanning surface can be obtained. Finally, by fusing the measurement information of multiple sets of two-dimensional scanning surfaces, the complete three-dimensional morphological information of the material can be obtained. Preferably, in this disclosure, the predetermined angle can be 90°, that is, the movement direction of the reflective component 2 is perpendicular to the two-dimensional scanning surface.

[0070] The signal module 1, reflector 2, and drive mechanism 3 can be considered as a surface scanning device. In this disclosure, the displacement mechanism enables the surface scanning device to move. The displacement mechanism can be in the form of a motor, a push rod, a guide rail, or various other forms. As an example, when the two-dimensional scanning surface is perpendicular to the paper surface, the direction in which the surface scanning device is moved can be the direction of the paper surface. When the two-dimensional scanning surface is in the direction of the paper surface, the direction in which the surface scanning device is moved can be perpendicular to the paper surface. As described in any of the above claims, the high-speed multi-line scanning material measuring device switches between different two-dimensional scanning surfaces by means of the displacement mechanism and / or adjusting the first angle between each reflector 21 and the emitted beam, thereby realizing the measurement of the material surface in multiple two-dimensional scanning surfaces, and finally realizing the complete three-dimensional measurement of the material surface contour based on the measurement information of multiple scanning surfaces.

[0071] According to a further embodiment of this disclosure, the material measurement system may further include a housing 4, wherein the signal module 1, the reflector 2, and the drive mechanism 3 may be disposed inside the housing 4 and fixed relative to the housing 4. The housing 4 has a wave-transparent area to facilitate beam transmission and reception. The displacement mechanism may be disposed outside the housing 4, and the surface scanning device may be moved by pushing the entire housing 4. For example, the housing 4 may be moved by connecting various types of displacement mechanisms, such as motors, push rods, and guide rails, to the outer surface of the housing 4. Alternatively, the displacement mechanism may be disposed relative to the reflector 2 and the drive mechanism 3 respectively. For example, the reflector 2 may be moved by various types of displacement mechanisms, such as motors, push rods, and guide rails, and the drive mechanism 3 may be moved by the same displacement mechanisms, thus also achieving the movement of the surface scanning device.

[0072] During the 3D scanning process, the surface scanning device can be moved to a first position, and the reflective component 2 rotates to complete the detection of the first 2D scanning surface (the specific process can be referred to the previous description). Then, the surface scanning device is moved to a second position, and the reflective component 2 rotates to complete the detection of the second 2D scanning surface, and so on, until all positions are reached to complete the measurement of all 2D scanning surfaces. Afterwards, the measurement results of all 2D scanning surfaces can be combined, and by combining the moving speed and direction of the surface scanning device with the displacement mechanism, the corresponding position information of each 2D scanning surface can be obtained to obtain complete 3D measurement information of the material surface contour.

[0073] The preferred embodiments of this disclosure have been described in detail above with reference to the accompanying drawings. However, this disclosure is not limited to the specific details of the above embodiments. Within the scope of the technical concept of this disclosure, various simple modifications can be made to the technical solutions of this disclosure, and these simple modifications all fall within the protection scope of this disclosure.

[0074] It should also be noted that the various specific technical features described in the above specific embodiments can be combined in any suitable manner without contradiction. In order to avoid unnecessary repetition, this disclosure will not describe the various possible combinations separately.

[0075] Furthermore, various different embodiments of this disclosure can be combined in any way, as long as they do not violate the spirit of this disclosure, they should also be regarded as the content disclosed in this disclosure.

Claims

1. A high-speed multi-line scanning material measuring device, characterized in that, include: The signal module is at least used to generate a transmitted beam and receive an incident beam; The reflective component is configured as a plurality of reflective plates distributed at a preset angle, the plurality of reflective plates being set at a predetermined distance from the signal module, and reflecting the transmitted beam generated by the signal module to form an output beam; The reflective surfaces of the plurality of reflectors form a plurality of first angles with the emitted beam and a plurality of second angles with the emitted beam; A driving mechanism is provided to drive the reflective component to rotate. During the rotation, the emitted beams corresponding to multiple second angles are emitted to the material surface and form at least one scanning trajectory to achieve level measurement of the material surface profile.

2. The high-speed multi-line scanning material measuring device according to claim 1, characterized in that, Multiple reflectors share a common rotation axis, and the reflective surfaces of the multiple reflectors are located on different two-dimensional planes. The driving mechanism is fixedly connected to the rotation axis, and the driving mechanism drives the rotation axis to rotate so as to drive the multiple reflectors to rotate synchronously.

3. The high-speed multi-line scanning material measuring device according to claim 2, characterized in that, The multiple reflectors in the reflective assembly are arranged in a circular pattern, and the reflective surfaces of the multiple reflectors are initially installed at a preset tilt angle relative to the direction of the emitted beam, so that the emitted beam after being reflected by the reflective surface of each reflector is emitted onto the surface of the material during rotation.

4. The high-speed multi-line scanning material measuring device according to claim 3, characterized in that, The multiple reflective plates in the reflective assembly are arranged in a circular pattern, and the reflective surfaces of the multiple reflective plates are continuously distributed along the circumferential direction at preset intervals.

5. The high-speed multi-line scanning material measuring device according to claim 4, characterized in that, The angle between the reflective surfaces of any two adjacent reflectors may be the same or different.

6. The high-speed multi-line scanning material measuring device according to claim 2, characterized in that, The multiple reflective plates in the reflective assembly are arranged in a circular pattern, and the multiple reflective plates are arranged symmetrically or asymmetrically.

7. The high-speed multi-line scanning material measuring device according to claim 2, characterized in that, The multiple reflectors in the reflective assembly are arranged in a circular pattern, and the reflective surfaces of the multiple reflectors are not continuously distributed along the circumferential direction. There is a beam non-reflection region between the reflective surfaces of any two adjacent reflectors, and the emitted beam is not reflected and does not form an outgoing beam within the beam non-reflection region.

8. The high-speed multi-line scanning material measuring device according to any one of claims 1-7, characterized in that, During the rotation of the reflective assembly driven by the driving mechanism, the reflective surfaces of the multiple reflective plates in the reflective assembly form multiple first angles with the transmitted beam of the signal module and multiple second angles with the emitted beam, or they may be different. This causes the reflected emitted beam to reach the same or different measurement points on the material surface to form at least one scanning trajectory. After passing the measurement point, it is reflected to form a reflected beam. The reflected beam is received by the reflective plate and reflected by the reflective plate to form an incident beam. The incident beam is provided to the signal module to form a measurement signal, thereby realizing the level measurement of the material surface profile.

9. The high-speed multi-line scanning material measuring device according to claim 8, characterized in that, The reflective surface of the reflector is at least one of a plane, a curved surface, or a refracting surface; the curved surface is at least one of a fan-shaped, parabolic, or pyramidal shape.

10. The high-speed multi-line scanning material measuring device according to claim 8, characterized in that, It also includes a displacement mechanism, which adjusts the first angle between the reflective surface of each reflector in the reflective assembly and the emitted beam to switch between different multiple two-dimensional scanning surfaces, thereby enabling the measurement of the material surface in multiple two-dimensional scanning surfaces, and finally realizing the three-dimensional measurement of the material surface profile based on the measurement information of multiple two-dimensional scanning surfaces.

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