Device for detecting transmission characteristics of conductor

Abstract

The utility model discloses a conductor transmission characteristic detection device. The detection device comprises a main body test structure and a vector network analyzer. The main body test structure comprises a first outer conductor, a first insulating layer and a first placement area, and the first placement area is used for accommodating a to-be-tested conductor; the first outer conductor surrounds the first insulating layer, the first insulating layer surrounds the first placement area, and the first outer conductor, the first insulating layer and the first placement area are coaxially arranged; the first end of the vector network analyzer is connected with the first end of the main body test structure, and the second end of the vector network analyzer is connected with the second end of the main body test structure, so as to detect the transmission characteristics of the conductor to be tested. By adopting the technical scheme, the transmission characteristics of the conductor to be detected can be quickly detected, the detection accuracy is improved, the detection of the transmission characteristics of the conductor to be detected is preposed, the development cost is reduced, and the production efficiency and the product quality are improved.

Description

Technical Field

[0001] This utility model relates to the field of data detection technology, and in particular to a device for detecting the transmission characteristics of a conductor. Background Technology

[0002] The application of information technology in fields such as smart healthcare, autonomous driving, and cloud-based office work has placed higher demands on information transmission technology. According to communication principles, high-frequency communication has become the inevitable choice for high-speed communication. However, under high-frequency conditions, the energy loss caused by the inherent properties of materials significantly affects signal transmission speed and quality. In the 100GHz range, conductor loss is the main factor causing material loss. Therefore, the production of high-speed data cables inevitably requires the use of higher-performance conductor materials. For example, high-speed cables used in data centers employ signal frequencies reaching 50GHz or even 112GHz. Transmission under ultra-high frequency conditions places extremely stringent requirements on conductor performance; even slight deviations in the structural performance of the conductor material will result in substandard transmission line products.

[0003] Currently, the product qualification rate of high-frequency signal lines in the 50-110GHz band is less than 70%, resulting in extremely high product development costs. Furthermore, product performance can only be tested after the conductor material is processed into transmission line devices, which significantly prolongs the product development process and increases development costs. Utility Model Content

[0004] This invention provides a device for detecting the transmission characteristics of a conductor, which can quickly and directly test the transmission performance of a conductor, improving the detection efficiency and reliability of the conductor's transmission characteristics.

[0005] According to a first aspect of the present invention, a device for detecting the transmission characteristics of a conductor is provided, the device comprising: a main test structure and a vector network analyzer;

[0006] The main test structure includes a first outer conductor, a first insulating layer, and a first placement area, wherein the first placement area is used to accommodate the conductor to be tested.

[0007] The first outer conductor surrounds the first insulating layer, the first insulating layer surrounds the first placement area, and the first outer conductor, the first insulating layer, and the first placement area are coaxially arranged.

[0008] The first end of the vector network analyzer is connected to the first end of the main test structure, and the second end of the vector network analyzer is connected to the second end of the main test structure, for detecting the transmission characteristics of the conductor under test.

[0009] Optionally, the testing device further includes: a first external connector and a second external connector, wherein the first external connector and the second external connector are located on opposite sides of the main test structure;

[0010] The first end of the first external connector is connected to the first end of the main test structure, and the second end of the first external connector is connected to the first end of the vector network analyzer.

[0011] The first end of the second external connector is connected to the second end of the main test structure, and the second end of the second external connector is connected to the second end of the vector network analyzer.

[0012] Optionally, the axis of the first external connector, the axis of the second external connector, and the axis of the main test structure are coaxial;

[0013] The first external connector includes a second outer conductor, a second insulating layer, and a second placement area, wherein the second placement area is used to accommodate the conductor to be tested;

[0014] The second outer conductor surrounds the second insulating layer, the second insulating layer surrounds the second placement area, and the second outer conductor, the second insulating layer, and the second placement area are coaxially arranged.

[0015] The second external connector includes a third outer conductor, a third insulating layer, and a third placement area, wherein the third placement area is used to accommodate the conductor under test;

[0016] The third outer conductor surrounds the third insulating layer, the third insulating layer surrounds the third placement area, and the third outer conductor, the third insulating layer, and the third placement area are coaxially arranged.

[0017] Optionally, the main test structure, the first external connector, and the second external connector are all cylindrical structures;

[0018] The cross-sectional diameter of the first external connector is larger than the cross-sectional diameter of the main test structure, and the cross-sectional diameter of the second external connector is larger than the cross-sectional diameter of the main test structure.

[0019] Optionally, the thickness of the second insulating layer is greater than the thickness of the first insulating layer, and the dielectric constant of the second insulating layer is greater than the dielectric constant of the first insulating layer;

[0020] The thickness of the third insulating layer is greater than the thickness of the first insulating layer, and the dielectric constant of the third insulating layer is greater than the dielectric constant of the first insulating layer.

[0021] Optionally, the detection device further includes: a stress module;

[0022] The first end of the stress module is connected to the first end of the conductor under test, and the second end of the stress module is connected to the second end of the conductor under test, for keeping the conductor under test in a straight state under tension.

[0023] Optionally, the stress module applies a preset tensile force to the conductor under test;

[0024] The preset tensile force is 50% to 80% of the yield strength of the conductor under test.

[0025] Optionally, the surface roughness of the first outer conductor is less than 0.3 μm.

[0026] Optionally, the thickness of the first outer conductor is 0.5 mm to 0.8 mm.

[0027] Optionally, the loss coefficient of the first insulating layer is less than 0.001.

[0028] The conductor transmission characteristic detection device provided in this embodiment consists of a main test structure and a vector network analyzer. The main test structure is configured with a first outer conductor, a first insulating layer, and a first placement area arranged coaxially from the outside to the inside. When the conductor under test is placed in the first placement area, a coaxial transmission line structure is simulated. The main test structure is then connected to the vector network analyzer to detect the transmission characteristics of the conductor under test, ensuring the accuracy and reliability of the detection. Furthermore, by pre-positioning the detection of the conductor's transmission characteristics, the device can quickly and directly test the conductor's transmission performance. Defective materials can be identified during the conductor production stage, avoiding overall scrapping or rework due to conductor transmission characteristic problems after the transmission line is manufactured. This greatly shortens the development cycle of high-speed transmission lines, reduces development costs, and improves production efficiency and product quality.

[0029] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this utility model, nor is it intended to limit the scope of this utility model. Other features of this utility model will become readily apparent from the following description. Attached Figure Description

[0030] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0031] Figure 1 This is a schematic diagram of the structure of a conductor transmission characteristic detection device provided in an embodiment of the present invention;

[0032] Figure 2 This is a schematic diagram of the main testing structure provided in an embodiment of the present utility model;

[0033] Figure 3 This is a schematic diagram of another main testing structure provided in this embodiment of the utility model;

[0034] Figure 4 yes Figure 3 A schematic diagram of a cross-section along section line AA';

[0035] Figure 5 yes Figure 3 A schematic diagram of a cross-section along section line BB';

[0036] Figure 6 yes Figure 3 A schematic diagram of a cross-section along the central section line CC';

[0037] Figure 7 This is a partial structural schematic diagram of a conductor transmission characteristic detection device provided in an embodiment of the present invention. Detailed Implementation

[0038] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0039] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this utility model are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the utility model described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0040] It should be understood that the various forms of the process shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this utility model can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this utility model can be achieved, and this is not limited herein.

[0041] In today's era of rapid technological advancement, information plays a crucial role in many key areas such as smart healthcare, autonomous driving, and cloud-based office work. In smart healthcare, massive amounts of medical data need to be transmitted in real time, such as high-definition medical images and remote surgical instructions. The high-speed and accurate transmission of this data is irreplaceable for diagnosing illnesses and implementing precise treatments. In autonomous driving scenarios, vehicles need to receive and process large amounts of road condition information, satellite positioning data, and vehicle status information in a very short time to ensure driving safety and timely intelligent decision-making. Cloud-based office work relies heavily on efficient information transmission. The frequent interaction of large amounts of office documents and video conferencing data between users in different geographical locations places stringent requirements on the speed and stability of information transmission.

[0042] However, as frequencies climb to higher levels, especially into the 100GHz range, the energy loss caused by the inherent properties of the materials becomes prominent, becoming a key bottleneck restricting signal transmission speed and quality. In this frequency band, conductor loss dominates the total transmission loss, making the conductor's superior high-frequency transmission characteristics the primary reference standard for evaluating the transmission quality of a high-frequency transmission line. Currently, high-frequency signal lines face severe challenges; the product qualification rate is less than 70%, and the current product performance testing process has significant drawbacks. Product transmission performance can only be tested after the conductor material has been processed into a transmission line device. This means that complex manufacturing processes must be completed before product performance evaluation, directly leading to a significant increase in product development costs. If a product is found to be substandard, the resources invested in previous processing stages are wasted, requiring a readjustment of the conductor material selection and a re-enactment of the entire processing and testing process. This not only significantly prolongs the overall product development process, but also causes development costs to snowball, placing a heavy burden on enterprises and, to some extent, limiting the rapid promotion and application of high-speed communication technology in these key areas.

[0043] To solve the above problems, Figure 1 This is a schematic diagram of the structure of a conductor transmission characteristic detection device provided in an embodiment of the present invention; Figure 2 This is a schematic diagram of a main testing structure provided in an embodiment of this utility model. For example... Figure 1and Figure 2 As shown, the conductor transmission characteristic detection device provided in this embodiment of the present invention includes: a main test structure 1 and a vector network analyzer 2; the main test structure 1 includes a first outer conductor 11, a first insulating layer 12 and a first placement area 13, the first placement area 13 being used to accommodate the conductor to be tested; the first outer conductor 11 surrounds the first insulating layer 12, the first insulating layer 12 surrounds the first placement area 13, and the first outer conductor 11, the first insulating layer 12 and the first placement area 13 are coaxially arranged; the first end of the vector network analyzer 2 is connected to the first end of the main test structure 1, and the second end of the vector network analyzer 2 is connected to the second end of the main test structure 1, for detecting the transmission characteristics of the conductor to be tested.

[0044] Among them, the Vector Network Analyzer (VNA) is an electromagnetic wave energy testing device that can be used to measure the characteristics of electrical networks. It is widely used in the fields of radio frequency (RF) and microwave. It can measure the transmission characteristics (such as S-parameters) of devices such as conductors, transmission lines, antennas, and filters, and provide amplitude and phase information.

[0045] Specifically, the conductor transmission characteristic testing device includes a main test structure 1 and a vector network analyzer 2. The main test structure 1 is the core part of the testing device, used to simulate the structure of an actual transmission line and provide a test environment for the conductor under test. The vector network analyzer 2 is an instrument used to measure the transmission characteristics of the conductor under test. It is connected to the main test structure 1 and evaluates the transmission performance of the conductor by measuring the scattering parameters (S-parameters). The main test structure 1 includes a first outer conductor 11, a first insulating layer 12, and a first placement area 13 arranged coaxially from the outside to the inside. The first outer conductor 11 surrounds the first insulating layer 12. As the outermost part, it is usually made of conductive material and can simulate the shielding layer of an actual transmission line, shielding external electromagnetic interference and forming a transmission path for the electromagnetic field. It confines the electromagnetic field to propagate within the first insulating layer 12, preventing signal energy from radiating outward and ensuring that all signal energy is transmitted through the conductor under test, thereby improving the accuracy of the conductor transmission performance test results. The first insulating layer 12 is located between the first outer conductor 11 and the first placement area 13, surrounding the first placement area 13, isolating the first outer conductor 11 and the conductor under test, preventing direct contact between the first outer conductor 11 and the conductor under test from causing a short circuit. Through the dielectric properties and thickness of its own material, combined with the actual attenuation characteristics of the simulated transmission line of the first outer conductor 11, the impedance of the simulated coaxial transmission line structure is made to match the impedance of the vector network analyzer, which can achieve maximum power transmission and reduce signal reflection design, thereby improving the detection accuracy of the transmission characteristics of the conductor under test. The first placement area 13 can be a hollow region located inside the first insulating layer 12, used to accommodate the conductor under test. Its size and shape match the conductor under test, and it is coaxially arranged with the first outer conductor 11 and the first insulating layer 12 to ensure that the conductor under test can be accurately placed and coaxially aligned with the first outer conductor 11 and the first insulating layer 12. This simulates the actual working environment of the conductor under test being made into a coaxial transmission line, ensuring that the test results are consistent with actual applications. In addition, the coaxial structure can provide a uniform electromagnetic field distribution, reduce the loss caused by reflection and distortion during signal transmission, and further improve the accuracy of the detection of the transmission characteristics of the conductor under test.

[0046] The first end of the vector network analyzer 2 can be an output end, connected to the first end of the main test structure 1, used to inject a test signal into the conductor under test (DUT). The second end can be an input end, connected to the second end of the main test structure 1, used to receive the signal transmitted through the DUT. The detection process for the DUT is as follows: the vector network analyzer 2 sends a test signal to the first end of the main test structure 1 through its output end. The test signal is transmitted through the DUT to the second end of the main test structure 1. The input end of the vector network analyzer 2 obtains the real-time signal from the second end of the main test structure 1, compares the real-time signal with the test signal, analyzes the difference between the sent and received signals, and calculates the transmission characteristics of the DUT. For example, the transmission loss of the test signal in the DUT can be evaluated using the S21 parameter (forward propagation coefficient) of the vector network analyzer 2, and the transmission characteristics of the DUT can be characterized by the transmission loss of the DUT during the transmission of the test signal.

[0047] The conductor transmission characteristic detection device provided in this embodiment consists of a main test structure and a vector network analyzer. The main test structure is configured with a first outer conductor, a first insulating layer, and a first placement area arranged coaxially from the outside to the inside. When the conductor under test is placed in the first placement area, a coaxial transmission line structure is simulated. The main test structure is then connected to the vector network analyzer to detect the transmission characteristics of the conductor under test, ensuring the accuracy and reliability of the detection. Furthermore, by pre-positioning the detection of the conductor's transmission characteristics, the device can quickly and directly test the conductor's transmission performance. Defective materials can be identified during the conductor production stage, avoiding overall scrapping or rework due to conductor transmission characteristic problems after the transmission line is manufactured. This greatly shortens the development cycle of high-speed transmission lines, reduces development costs, and improves production efficiency and product quality.

[0048] Figure 3 This is a schematic diagram of another main testing structure provided in this embodiment of the utility model, for reference. Figure 3 The testing device also includes: a first external connector 3 and a second external connector 4, the first external connector 3 and the second external connector 4 being located on opposite sides of the main test structure 1; the first end of the first external connector 3 is connected to the first end of the main test structure 1, and the second end of the first external connector 3 is connected to the first end of the vector network analyzer 2; the first end of the second external connector 4 is connected to the second end of the main test structure 1, and the second end of the second external connector 4 is connected to the second end of the vector network analyzer 2.

[0049] Specifically, the first external connector 3 and the second external connector 4 are located on opposite sides of the main test structure 1, serving as a connection medium between the main test structure 1 and the vector network analyzer 2. This provides a more robust mechanical connection, ensuring a tighter physical connection between the main test structure 1 and the vector network analyzer 2, reducing measurement errors caused by loose connections. The first external connector 3 is located between the first end of the main test structure 1 and the first end of the vector network analyzer 2. The first end of the first external connector 3 connects to the first end of the main test structure 1, used to stably transmit the test signal emitted from the first end of the vector network analyzer 2 to the main test structure 1. The second end of the first external connector 3 connects to the first end of the vector network analyzer 2, used to stably transmit the real-time signal after transmission through the conductor under test to the vector network analyzer 2. This helps maintain the consistency of the signal transmission path, avoiding signal loss or abnormal reflection due to connection fluctuations or offsets, thereby improving the accuracy of the test results for the transmission characteristics of the conductor under test.

[0050] For example, the first external connector 3 and the second external connector 4 can be SMA, N-type or BNC interfaces, and can be fixed to the two opposite sides of the main test structure 1 by coaxial interface or welding. This embodiment does not make specific limitations on this.

[0051] This embodiment of the invention provides a more robust mechanical connection by setting a first external connector and a second external connector on opposite sides of the main test structure. The first and second external connectors serve as the connection medium between the main test structure and the vector network analyzer, ensuring a tighter physical connection between the main test structure and the vector network analyzer. This reduces measurement errors caused by loose connections and improves the accuracy of the test results for the transmission characteristics of the conductor under test.

[0052] Optionally, the axes of the first external connector 3, the second external connector 4, and the main test structure 1 are coaxially arranged; the first external connector 3 includes a second outer conductor 31, a second insulating layer 32, and a second placement area 33, the second placement area 33 being used to accommodate the conductor under test; the second outer conductor 31 surrounds the second insulating layer 32, the second insulating layer 32 surrounds the second placement area 33, and the second outer conductor 31, the second insulating layer 32, and the second placement area 33 are coaxially arranged; the second external connector 4 includes a third outer conductor 41, a third insulating layer 42, and a third placement area 43, the third placement area 43 being used to accommodate the conductor under test; the third outer conductor 41 surrounds the third insulating layer 42, the third insulating layer 42 surrounds the third placement area 43, and the third outer conductor 41, the third insulating layer 42, and the third placement area 43 are coaxially arranged.

[0053] For details, please refer to [link / reference]. Figure 3The first external connector 3 serves as the connection between the first end of the main test structure 1 and the first end of the vector network analyzer 2. To ensure the consistency of signal transmission, the first external connector 3 also has a second outer conductor 31, a second insulating layer 32, and a second placement area 33 arranged coaxially from the outside to the inside. The opening size of the second placement area 33 can be the same as that of the first placement area 13 to ensure the consistency of the placement of the conductor under test in the first placement area 13 and the second placement area 33. Along the first direction X, the overall length of the second placement area 33 and the overall length of the first placement area 13 can be set to be the same or different according to the actual situation. This embodiment does not make specific limitations on this.

[0054] Furthermore, the second outer conductor 31 is arranged around the second insulating layer 32, serving as the outermost part of the first external connector 3. Typically made of conductive material, it simulates the shielding layer of an actual transmission line, shielding against external electromagnetic interference and forming a transmission path for the electromagnetic field. This confines the electromagnetic field within the second insulating layer 32, preventing signal energy from radiating outwards. This ensures that all test signal energy emitted from the first end of the vector network analyzer 2 is transmitted to the first end of the main test structure 1 through the conductor under test within the first external connector 3, improving the accuracy of the conductor transmission performance test results. The second insulating layer 32 is located between the second outer conductor 31 and the second placement area 33, surrounding the second placement area 33. It isolates the second outer conductor 31 from the conductor under test, preventing direct contact and short circuits. Through its own dielectric properties and thickness, combined with the second outer conductor 31 simulating the actual attenuation characteristics of a transmission line, the impedance of the simulated coaxial transmission line structure matches the impedance of the vector network analyzer. This achieves maximum power transmission and reduces signal reflection, improving the accuracy of the transmission characteristics test of the conductor under test. The second placement area 33 can be a hollow region located inside the second insulating layer 32, used to accommodate the conductor under test. Its opening size and shape match the conductor under test, and it is coaxially arranged with the second outer conductor 31 and the second insulating layer 32 to ensure that the conductor under test can be accurately placed and coaxially aligned with the second outer conductor 31 and the second insulating layer 32. This simulates the actual working environment of the conductor under test being made into a coaxial transmission line, ensuring that the test results are consistent with actual applications. In addition, the coaxial structure can provide a uniform electromagnetic field distribution, reduce the loss caused by reflection and distortion during signal transmission, and further improve the detection accuracy of the transmission characteristics of the conductor under test.

[0055] Continue to refer to Figure 3The second external connector 4 serves as the connection between the second end of the main test structure 1 and the second end of the vector network analyzer 2. To ensure the consistency of signal transmission, the second external connector 4 also has a third outer conductor 41, a third insulating layer 42, and a third placement area 43 arranged coaxially from the outside to the inside. The opening size of the third placement area 43 can be the same as that of the first placement area 13 to ensure the consistency of the placement of the conductor under test in the first placement area 13 and the third placement area 43. Along the first direction X, the overall length of the third placement area 43 and the overall length of the first placement area 13 can be set to be the same or different according to actual conditions; this embodiment does not specifically limit this.

[0056] Furthermore, the third outer conductor 41 is arranged around the third insulating layer 42, serving as the outermost part of the second external connector 4. Typically made of conductive material, it simulates the shielding layer of an actual transmission line, shielding against external electromagnetic interference and forming a transmission path for the electromagnetic field. This confines the electromagnetic field within the third insulating layer 42, preventing signal energy from radiating outwards. This ensures that all real-time signal energy transmitted through the conductor under test within the main test structure 1 is transmitted to the second end of the vector network analyzer 2 via the conductor under test within the second external connector 4, improving the accuracy of the conductor transmission performance test results. The third insulating layer 42 is located between the third outer conductor 41 and the third placement area 43, surrounding the third placement area 43. It isolates the third outer conductor 41 and the conductor under test, preventing direct contact and short circuits. Through its own dielectric properties and thickness, combined with the simulated attenuation characteristics of the transmission line by the third outer conductor 41, the impedance of the simulated coaxial transmission line structure matches the impedance of the vector network analyzer. This allows for maximum power transmission and reduced signal reflection, improving the accuracy of the transmission characteristics test of the conductor under test. The third placement area 43 can be a hollow region located inside the third insulating layer 42, used to accommodate the conductor under test. Its opening size and shape match the conductor under test, and it is coaxially arranged with the third outer conductor 41 and the third insulating layer 42 to ensure that the conductor under test can be accurately placed and coaxially aligned with the third outer conductor 41 and the third insulating layer 42. This simulates the actual working environment of the conductor under test being made into a coaxial transmission line, ensuring that the test results are consistent with actual applications. In addition, the coaxial structure can provide a uniform electromagnetic field distribution, reduce the loss caused by reflection and distortion during signal transmission, and further improve the accuracy of the detection of the transmission characteristics of the conductor under test.

[0057] It should be noted that continued reference is necessary. Figure 3 The axes of the first external connector 3, the second external connector 4, and the main test structure 1 are set together, which can be understood as the first external connector 3, the second external connector 4, and the main test structure 1 sharing a common axis along the first direction X.

[0058] Optional, Figure 4 yes Figure 3 A schematic diagram of a cross-section along section line AA'; Figure 5 yes Figure 3 A schematic diagram of a cross-section along section line BB'; Figure 6 yes Figure 3 A schematic diagram of a cross-section along section line CC'. The main test structure 1, the first external connector 3, and the second external connector 4 are all cylindrical structures; the cross-sectional diameter D2 of the first external connector 3 is larger than the cross-sectional diameter D1 of the main test structure 1, and the cross-sectional diameter D3 of the second external connector 4 is larger than the cross-sectional diameter of the main test structure 1.

[0059] For details, please refer to Figures 3-6 The main test structure 1, the first external connector 3, and the second external connector 4 are all cylindrical structures. This simulates the structure of an actual transmission line when the conductor under test is placed in the first placement area 13, the second placement area 23, and the third placement area 33, providing a test environment for the conductor under test. Specifically, the cross-sectional diameter D2 of the first external connector 3 is larger than the cross-sectional diameter D1 of the main test structure 1, and the cross-sectional diameter D3 of the second external connector 4 is larger than the cross-sectional diameter of the main test structure 1. Adjusting the internal structure of the first external connector 3 (such as the thickness of the second insulation layer 32 and the inner diameter of the second outer conductor 31) ensures the continuity of the impedance of the entire detection device. This reduces signal reflection at the connection point, reduces signal loss, and improves signal integrity and the accuracy of conductor transmission characteristics. Simultaneously, the cross-sectional diameters D2 and D3 of both the first and second external connectors are larger than those of the main test structure 1, providing stronger mechanical support when the main test structure 1 and the vector network analyzer 2 are connected, ensuring that the connection point is not easily deformed or damaged.

[0060] It should be noted that the cross-sectional diameter D2 of the first external connector 3 and the cross-sectional diameter D3 of the second external connector 4 can be the same or different. This embodiment does not make specific limitations on this, provided that the cross-sectional diameter D2 of the first external connector 3 and the cross-sectional diameter D3 of the second external connector 4 are both greater than the cross-sectional diameter D1 of the main test structure 1.

[0061] For example, in order to facilitate the connection between the main test structure 1 and the vector network analyzer 2, without limiting the cross-sectional diameter D1 of the main test structure 1, the port connection compatibility with the vector network analyzer 2 can be met by using the first external connector 3 and the second external connector 4. The cross-sectional diameter D2 of the first external connector 3 and the cross-sectional diameter D3 of the second external connector 4 are both set to 5.84 mm, thereby realizing the connection between the two opposite ends of the main test structure 1 and the standardized interface of the vector network analyzer 2.

[0062] Optionally, the thickness of the second insulating layer 32 is greater than the thickness of the first insulating layer 12, and the dielectric constant of the second insulating layer 32 is greater than the dielectric constant of the first insulating layer 12; the thickness of the third insulating layer 42 is greater than the thickness of the first insulating layer 12, and the dielectric constant of the third insulating layer 42 is greater than the dielectric constant of the first insulating layer 12.

[0063] Wherein, according to the formula Where Z0 is the impedance of the main test structure 1 simulating an actual transmission line, a is the radius of the conductor under test, b is the inner radius of the outer conductor, and ε r Given the dielectric constant of the insulating layer, it can be seen that the impedance Z0 of the coaxial transmission line is related to the dielectric constant ε of the insulating layer. r It is inversely proportional to the inner radius b of the outer conductor.

[0064] Specifically, given that the cross-sectional diameter D2 of the first external connector 3 is larger than the cross-sectional diameter D1 of the main test structure 1, a thicker second insulating layer 32 can be provided to ensure that the opening size of the second placement area 33 is the same as the opening size of the first placement area 13. This allows the conductor under test to be placed stably within the first placement area 13 and the second placement area 33, and the transmission path of the conductor under test will not be altered by the first external connector 3, thus affecting the accuracy of the detection of the transmission characteristics of the conductor under test. Simultaneously, since the inner radius of the second outer conductor 31 is larger than the inner radius of the first outer conductor 11, the transmission line impedance at the first external connector 3 increases. To maintain the impedance of the simulated actual transmission line at the first external connector 3 being the same as that of the simulated actual transmission line in the main test structure 1, an insulating material with a higher dielectric constant needs to be selected to reduce the impedance at the first external connector 3, thus matching the impedance set at the main test structure 1 and improving the accuracy and reliability of the detection of the transmission characteristics of the conductor under test.

[0065] Furthermore, given that the cross-sectional diameter D3 of the second external connector 4 is larger than the cross-sectional diameter D1 of the main test structure 1, a thicker third insulating layer 42 can be used to ensure that the opening size of the third placement area 43 is the same as the opening size of the first placement area 13. This allows the conductor under test to be placed stably within the first placement area 13 and the third placement area 43, and the transmission path of the conductor under test will not be altered by the second external connector 4, thus affecting the accuracy of the transmission characteristic detection. Simultaneously, since the inner radius of the third outer conductor 41 is larger than the inner radius of the first outer conductor 11, the transmission line impedance at the second external connector 4 increases. To maintain the impedance of the simulated actual transmission line at the second external connector 4 being the same as that of the simulated actual transmission line in the main test structure 1, an insulating material with a higher dielectric constant needs to be selected to reduce the impedance at the second external connector 4, matching the impedance set at the main test structure 1, thereby improving the accuracy and reliability of the transmission characteristic detection of the conductor under test.

[0066] It should be noted that the thickness of the second insulating layer 32 and the thickness of the third insulating layer 42 may be the same or different depending on the actual situation; the dielectric constant of the second insulating layer 32 and the dielectric constant of the third insulating layer 42 may be the same or different depending on the actual situation, and this embodiment does not make specific limitations in this regard.

[0067] For example, the first insulating layer 12 may be polytetrafluoroethylene propylene with a dielectric constant of 2.1 F / m, and the second insulating layer 32 and the third insulating layer 42 may be epoxy resin with a dielectric constant of 4.5 F / m.

[0068] Figure 7 This is a partial structural schematic diagram of a conductor transmission characteristic detection device provided in an embodiment of the present invention, with reference to... Figure 7 The testing device also includes: a stress module 5; the first end of the stress module 5 is connected to the first end of the conductor to be tested, and the second end of the stress module 5 is connected to the second end of the conductor to be tested, for keeping the conductor under tension in a straight state.

[0069] Specifically, in the actual testing of the conductor under test, the condition of the conductor wires also affects the accuracy of its performance measurement, especially the tensile state of the wires. The conductor under test may have some degree of bending in its natural state, and this bending affects transmission performance. When the wire is bent, its effective length increases. According to transmission line theory, the transmission speed of a signal on a transmission line is related to the length and distributed parameters of the transmission line. Therefore, bending of the wires causes changes in distributed capacitance and inductance, thereby altering the signal transmission speed and phase. Furthermore, severely bent wires may also increase the inhomogeneity of the internal structure. For example, the wire density may change at the bend, affecting its local resistance and capacitance characteristics. This results in different reflection and attenuation characteristics at the bend compared to the straight section, affecting the accuracy of the conductor's transmission performance measurement. Based on the above problems, the conductor transmission characteristic detection device provided in this utility model embodiment further includes: a stress module 5, the first end of the stress module 5 is connected to the first end of the conductor to be tested, and the second end is connected to the second end of the conductor to be tested. The stress module 5 applies a certain tensile force to the conductor to be tested, so that the tensile state of the conductor to be tested is kept in a straight state, thereby improving the accuracy of the transmission performance of the conductor to be tested.

[0070] This utility model embodiment provides a certain tension to the conductor under test by setting a stress module connected to the two opposite sides of the conductor under test, so that the conductor under test is kept in a straight state, improving the accuracy of the transmission performance of the conductor under test and avoiding detection errors caused by the conductor under test bending itself.

[0071] Optionally, stress module 5 applies a preset tensile force to the conductor under test; the preset tensile force is 50% to 80% of the yield strength of the conductor under test.

[0072] Specifically, yield strength is a key mechanical property of a material, referring to the minimum stress value at which a material begins to undergo significant plastic deformation (i.e., the material begins to "yield") under external force. For conductor materials, when subjected to an external force greater than or equal to their yield strength, the conductor will undergo permanent deformation, and its internal structure will also change accordingly. Therefore, the preset tensile force applied to the conductor by stress module 5 is set to 50%–80% of the conductor's yield strength. This ensures that the conductor receives sufficient stress to maintain its straightness and accurately detect its transmission characteristics, while also avoiding irreversible deformation that could affect the test results.

[0073] Optionally, the surface roughness of the first outer conductor 11 is less than 0.3 μm.

[0074] Surface roughness refers to the unevenness of a machined surface, characterized by small gaps and minute peaks and valleys.

[0075] Specifically, in order to further reduce the signal transmission loss caused by the first outer conductor 11 during the test, the surface smoothness of the first outer conductor 11 should be carefully controlled during the processing. The surface roughness of the first outer conductor 11 can be set to <0.3μm. During the transmission of high-frequency signals, such a relatively smooth surface helps to reduce the uneven distribution of electric and magnetic fields. However, if the surface roughness is too large, it will cause the electric and magnetic fields to be distorted at the depressions and protrusions, thereby affecting the signal transmission characteristics.

[0076] Optionally, the thickness of the first outer conductor 11 is 0.5 mm to 0.8 mm.

[0077] Specifically, the first outer conductor 11 can be made of stainless steel, and the thickness of the first outer conductor 11 is set to 0.5mm to 0.8mm. When subjected to external pressure, tension or torsional force, the thickness of 0.5mm to 0.8mm can provide sufficient rigidity, reduce the deformation of the internal conductor under test under stress, help maintain the structural integrity of the conductor under test, and ensure that it will not easily bend, dent or deform in complex testing environments, thereby ensuring the stability and reliability of the entire transmission structure and improving the detection accuracy of the transmission characteristics of the conductor under test.

[0078] Optionally, the loss coefficient of the first insulating layer 12 is less than 0.001.

[0079] Specifically, during signal transmission, the loss coefficient of the insulation layer directly affects the degree of signal attenuation. When the loss coefficient of the first insulation layer 12 is less than 0.001, it means that the absorption and loss of the signal by the first insulation layer 12 is minimal, effectively reducing the impact of dielectric loss on the detection of the transmission characteristics of the conductor under test. This allows the proportion of loss caused by the conductor material itself in the total loss to be highlighted as much as possible during actual testing, thereby improving the accuracy and reliability of the detection of the transmission characteristics of the conductor under test.

[0080] The specific embodiments described above do not constitute a limitation on the scope of protection of this utility model. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this utility model should be included within the scope of protection of this utility model.

Claims

1. A device for detecting the transmission characteristics of a conductor, characterized in that, The detection device includes: a main test structure and a vector network analyzer; The main test structure includes a first outer conductor, a first insulating layer, and a first placement area, wherein the first placement area is used to accommodate the conductor to be tested. The first outer conductor surrounds the first insulating layer, the first insulating layer surrounds the first placement area, and the first outer conductor, the first insulating layer, and the first placement area are coaxially arranged. The first end of the vector network analyzer is connected to the first end of the main test structure, and the second end of the vector network analyzer is connected to the second end of the main test structure, for detecting the transmission characteristics of the conductor under test.

2. The device for detecting the conductor transmission characteristics according to claim 1, characterized in that, The testing device further includes: a first external connector and a second external connector, wherein the first external connector and the second external connector are located on opposite sides of the main test structure; The first end of the first external connector is connected to the first end of the main test structure, and the second end of the first external connector is connected to the first end of the vector network analyzer. The first end of the second external connector is connected to the second end of the main test structure, and the second end of the second external connector is connected to the second end of the vector network analyzer.

3. The device for detecting the conductor transmission characteristics according to claim 2, characterized in that, The axis of the first external connector, the axis of the second external connector, and the axis of the main test structure are coaxially arranged. The first external connector includes a second outer conductor, a second insulating layer, and a second placement area, wherein the second placement area is used to accommodate the conductor to be tested; The second outer conductor surrounds the second insulating layer, the second insulating layer surrounds the second placement area, and the second outer conductor, the second insulating layer, and the second placement area are coaxially arranged. The second external connector includes a third outer conductor, a third insulating layer, and a third placement area, wherein the third placement area is used to accommodate the conductor under test; The third outer conductor surrounds the third insulating layer, the third insulating layer surrounds the third placement area, and the third outer conductor, the third insulating layer, and the third placement area are coaxially arranged.

4. The device for detecting the conductor transmission characteristics according to claim 3, characterized in that, The main test structure, the first external connector, and the second external connector are all cylindrical structures; The cross-sectional diameter of the first external connector is larger than the cross-sectional diameter of the main test structure, and the cross-sectional diameter of the second external connector is larger than the cross-sectional diameter of the main test structure.

5. The device for detecting the conductor transmission characteristics according to claim 4, characterized in that, The thickness of the second insulating layer is greater than the thickness of the first insulating layer, and the dielectric constant of the second insulating layer is greater than the dielectric constant of the first insulating layer; The thickness of the third insulating layer is greater than the thickness of the first insulating layer, and the dielectric constant of the third insulating layer is greater than the dielectric constant of the first insulating layer.

6. The device for detecting the conductor transmission characteristics according to claim 1, characterized in that, The detection device further includes: a stress module; The first end of the stress module is connected to the first end of the conductor under test, and the second end of the stress module is connected to the second end of the conductor under test, for keeping the conductor under test in a straight state under tension.

7. The device for detecting the conductor transmission characteristics according to claim 6, characterized in that, The stress module applies a preset tensile force to the conductor under test; The preset tensile force is 50% to 80% of the yield strength of the conductor under test.

8. The device for detecting the conductor transmission characteristics according to claim 1, characterized in that, The surface roughness of the first outer conductor is less than 0.3 μm.

9. The device for detecting the conductor transmission characteristics according to claim 1, characterized in that, The thickness of the first outer conductor is 0.5 mm to 0.8 mm.

10. The device for detecting the transmission characteristics of a conductor according to claim 1, characterized in that, The loss coefficient of the first insulating layer is less than 0.001.

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