Chip positioning test socket

By designing a chip positioning test socket with clamping and lifting components, the problems of pin damage and laborious operation during chip removal were solved, thereby improving yield and production efficiency.

CN223897483UActive Publication Date: 2026-02-10CHUANGRUI AVIATION EQUIP TECH (HUAIAN) CO LTD
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Patent Information

Application Number
CN202423213857.X
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-12-25
Publication Date
2026-02-10
Estimated Expiration
2034-12-25

AI Technical Summary

Technical Problem

Existing chip test sockets are prone to damaging pins when removing chips, making the operation laborious and inefficient, which affects yield and production schedule.

Method used

Design a chip positioning test socket, which employs a clamping component and a lifting component. The clamping component achieves stable chip clamping through clamping blocks and guide rods, while the lifting component achieves automatic chip ejection through pressure plates and pressure pillars.

Benefits of technology

This achieves protection of chip pins, improves yield and operational efficiency, and ensures the stability and convenience of the chip during the testing process.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a chip positioning test socket, which comprises a socket main body and a test cavity arranged on the socket main body, a pressing plate used for bearing a chip main body is arranged in the test cavity, and the pressing plate can be driven by a jacking assembly to move up and down in the test cavity; adjusting cavities are formed in the two sides of the testing cavity, a clamping assembly is arranged in each adjusting cavity, and the clamping assemblies cooperate with each other to clamp the two sides of the chip. The beneficial effects of the utility model are mainly embodied in that the socket is exquisite in design and reasonable in layout, the chip main body can be automatically ejected out after the test of the chip main body is completed, the condition that pins are damaged due to manual plugging is avoided, and the yield is improved to the greatest extent. In addition, the socket is simple and convenient to operate, stable and reliable, and the working efficiency is greatly improved.
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Description

Technical Field

[0001] This utility model relates to the field of socket technology, and more specifically, to a chip positioning test socket. Background Technology

[0002] Testing is a crucial part of chip manufacturing. Chips need to undergo functional and performance tests in various test sockets to ensure they meet quality requirements.

[0003] For example, patent announcement number CN214585854U discloses a test socket for chips, including a chip guide plate, test probes, a socket body, and a base. The base is mounted on one side of the socket body, and limit feet are provided at each of the four corners of the base. A test slot is provided inside the socket body, and test probes are evenly fixed along the edges of the test slot. The chip guide plate is mounted on the side of the socket body away from the base. However, this socket presents several inconveniences in chip removal. It requires manual removal of the chip, which can easily damage the chip pins, especially for chips with small and densely packed pins. Even slight improper handling can cause pins to bend or break, reducing the chip yield. Furthermore, manual chip removal is laborious and inefficient due to the lack of effective auxiliary devices. In large-scale chip testing production lines, this can severely impact testing progress, presenting significant limitations. Utility Model Content

[0004] The purpose of this invention is to overcome the shortcomings of the existing technology and provide a chip positioning test socket.

[0005] The objective of this utility model is achieved through the following technical solution:

[0006] A chip positioning test socket includes a socket body and a test cavity formed thereon. The test cavity has a built-in pressure plate for supporting the chip body. The pressure plate can move up and down in the test cavity under the drive of a lifting component. Adjustment cavities are formed on both sides of the test cavity. Each adjustment cavity has a built-in clamping component. The clamping components cooperate with each other to clamp the two sides of the chip body.

[0007] Preferably, the clamping assembly includes at least a guide rod installed in the adjustment cavity, a clamping spring sleeved on the guide rod, and the other end of the clamping spring being connected to a clamping block slidably installed on the end side of the guide rod.

[0008] Preferably, a sliding cavity is formed inside the clamping block, and a strip is fixed to one end of the guide rod that is close to the clamping block. The strip is adapted to the sliding cavity and is at least partially placed inside the sliding cavity.

[0009] Preferably, the end face of the clamping block that contacts the chip body is wavy, including a mirror-symmetrical arc surface.

[0010] Preferably, the lifting assembly includes at least a lifting cavity formed on the socket body, a circular hole between the lifting cavity and the test cavity, a pressure column adapted to the circular hole is placed inside the circular hole, one end of the pressure column is fixedly connected to the pressure plate, and the other end is fixedly connected to the connecting plate disposed in the lifting cavity, the connecting plate being arranged parallel to the pressure plate.

[0011] Preferably, a set of return springs is also fixed on the upper surface of the connecting plate, and the other end of the return springs is fixed to the inner wall of the lifting cavity.

[0012] Preferably, a limiting component is provided on one side of the connecting plate. The limiting component includes at least a fixing frame fixedly mounted on the socket body. A pull plate is slidably mounted inside the fixing frame. The connecting plate is at least partially placed on the pull plate. A protrusion is provided on the end side of the pull plate, and the protrusion can abut against the fixing frame.

[0013] Preferably, the pull plate is further provided with a push spring, one end of which is fixedly connected to the protrusion and the other end is fixedly connected to the fixing frame.

[0014] Preferably, the socket body has a data interface for data transmission on the side away from the lifting cavity.

[0015] The beneficial effects of this utility model are mainly reflected in:

[0016] 1. With its ingenious design and rational layout, this socket automatically ejects the chip body after testing, eliminating pin damage caused by manual insertion and removal, and maximizing the yield rate. Furthermore, the socket is simple and convenient to operate, stable and reliable, greatly improving work efficiency.

[0017] 2. The floating clamping block allows the clamping block to hold the chip body on both sides during testing in the test chamber, thus ensuring the stability of the chip body during testing. At the same time, since the clamping block is floating, it can avoid excessive clamping force on the chip body, which could lead to excessive squeezing and damage to the chip body, thereby improving the yield rate.

[0018] 3. The pressure plate can be moved upwards by the pressure column via the drive connecting plate, thereby ejecting the chip body. This operation is simple, convenient, stable, and reliable. The reset spring ensures that the connecting plate resets promptly after operation, facilitating the next operation and greatly improving work efficiency. Attached Figure Description

[0019] The technical solution of this utility model will be further described below with reference to the accompanying drawings:

[0020] Figure 1 : A front view schematic diagram of a preferred embodiment of this utility model;

[0021] Figure 2 : Another perspective view of the preferred embodiment of this utility model;

[0022] Figure 3 : A cross-sectional view of a preferred embodiment of the present invention;

[0023] Figure 4 : Figure 3 A frontal view diagram;

[0024] Figure 5 : A structural diagram of the lifting assembly in a preferred embodiment of this utility model. Detailed Implementation

[0025] The present invention will now be described in detail with reference to the specific embodiments shown in the accompanying drawings. However, these embodiments are not limited to the present invention, and any structural, methodological, or functional modifications made by those skilled in the art based on these embodiments are included within the protection scope of the present invention.

[0026] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0027] The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0028] like Figures 1 to 5As shown, this utility model discloses a chip positioning test socket, including a socket body 1 and a test cavity 12 formed thereon. Adjustment cavities 13 are formed on both sides of the test cavity 12, and each adjustment cavity 13 contains a clamping assembly 3. The clamping assemblies 3 cooperate to clamp the two sides of the chip body 5. In this preferred embodiment, the clamping assembly 3 includes at least a guide rod 31 installed in the adjustment cavity 13. A clamping spring 32 is sleeved on the guide rod 31, and the other end of the clamping spring 32 is connected to a clamping block 34 slidably installed on the end side of the guide rod 31. The floating arrangement of the clamping block 34 allows the clamping block 34 to clamp the two sides of the chip body 5 during testing in the test cavity 12, thereby ensuring the stability of the chip body 5 during testing. Simultaneously, because the clamping block 34 is floating, it avoids excessive clamping force on the chip body, preventing excessive compression and damage, and improving the yield rate.

[0029] A sliding cavity is formed within the clamping block 34. A strip 33 is fixed to the end of the guide rod 31 that is close to the clamping block 34. The strip 33 is adapted to the sliding cavity and is at least partially placed within the sliding cavity. The end face of the clamping block 34 that contacts the chip body 5 is wavy, including mirror-symmetrically arranged arc surfaces. The arc surfaces can guide and position the chip body, preventing displacement and improving testing accuracy.

[0030] The test chamber 12 contains a pressure plate 21 for supporting the chip body 5. The pressure plate 21 can move up and down within the test chamber 12 under the drive of the lifting assembly 2. The lifting assembly 2 includes at least a lifting cavity 14 formed on the socket body 1. A circular hole is provided between the lifting cavity 14 and the test chamber 12. A pressure post 22 adapted to the circular hole is placed inside the circular hole. One end of the pressure post 22 is fixedly connected to the pressure plate 21, and the other end is fixedly connected to a connecting plate 23 disposed in the lifting cavity 14. The connecting plate 23 is arranged parallel to the pressure plate 21. In this preferred embodiment, by driving the connecting plate 23, the pressure plate 21 can be driven upward by the pressure post 22, thereby pushing out the chip body 5. This operation is simple, convenient, stable, and reliable.

[0031] Furthermore, a set of return springs 24 are fixedly installed on the upper surface of the connecting plate 23, with the other end of the return springs 24 fixedly connected to the inner wall of the lifting cavity 14. The arrangement of the return springs 24 ensures that the connecting plate 23 is reset in time after the work is completed, facilitating the next operation and greatly improving work efficiency.

[0032] A limiting component 4 is provided on one side of the connecting plate 23. The limiting component 4 includes at least a fixing frame 41 fixedly mounted on the socket body 1. A pull plate 42 is slidably disposed within the fixing frame 41. The connecting plate 23 is at least partially placed on the pull plate 42. A protrusion is provided on one end of the pull plate 42, and the protrusion can abut against the fixing frame 41. A push spring 43 is also provided on the pull plate 42. One end of the push spring 43 is fixedly connected to the protrusion, and the other end is fixedly connected to the fixing frame 41.

[0033] In this embodiment, when the chip body 5 is installed and tested with the socket body 1, the chip body 5 is first pressed down at the position corresponding to the pressure plate 21, so that the pressure plate 21 contacts the upper arc surface of the clamping block 34. As the chip body 5 is continuously pressed down, the clamping block 34 slides along the guide of the fixing strip 33 and the guide rod 31. At this time, the clamping spring 32 is compressed. When the pressure plate 21 moves to the middle part of the clamping block 34, the connecting plate 23 moves down along the inner wall of the lifting cavity 14. At this time, the pull plate 42 is pulled along the fixing frame 41, and the push spring 43 is stretched. When one end of the connecting plate 23 moves to the bottom of the pull plate 42, the pull plate 42 is released, and the push spring 43 rebounds. At this time, the position of the connecting plate 23 is defined, and the chip body 5 is located between the two clamping blocks 34, realizing the effect of fitting the clamping block 34 with the side of the chip body 5, thereby achieving a stable setting of the position of the chip body 5, and then conducting the test.

[0034] After the test is completed, pull one end of the pull plate 42. Under the stretching and rebound action of the reset spring 24, the chip body 5 is lifted to a higher height, which in turn compresses the clamping block 34 and the clamping spring 32. Thus, the clamping force of the clamping component 3 on both sides of the chip body 5 is canceled. Then, in combination with the pressure plate 21 and the pressure column 22, the chip body 5 is lifted out of the test cavity 12, so as to remove the chip body 5.

[0035] In this preferred embodiment, a data interface 11 for data transmission is provided on the side of the socket body 1 away from the lifting cavity 14. The data interface 11 can be a conventionally used connector. The above is a preferred embodiment of this utility model. The data interface 11 can also be provided at other positions on the plug-in body 1, all of which fall within the protection scope of this utility model and will not be described in detail here.

[0036] It should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This way of describing the specification is only for clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

[0037] The detailed descriptions listed above are merely specific descriptions of feasible implementations of this utility model, and are not intended to limit the scope of protection of this utility model. All equivalent implementations or modifications made without departing from the spirit of this utility model should be included within the scope of protection of this utility model.

Claims

1. A chip positioning test socket, comprising a socket body (1) and a test cavity (12) formed thereon, characterized in that: The test cavity (12) has a built-in pressure plate (21) for supporting the chip body (5). The pressure plate (21) can move up and down in the test cavity (12) under the drive of the lifting component (2). The test cavity (12) has adjustment cavities (13) on both sides. Each adjustment cavity (13) has a built-in clamping component (3). The clamping components (3) cooperate with each other to clamp the two sides of the chip body (5).

2. The chip positioning test socket according to claim 1, characterized in that: The clamping assembly (3) includes at least a guide rod (31) installed in the adjustment cavity (13), a clamping spring (32) is sleeved on the guide rod (31), and the other end of the clamping spring (32) is connected to a clamping block (34) slidably installed on the end side of the guide rod (31).

3. The chip positioning test socket according to claim 2, characterized in that: A sliding cavity is provided inside the clamping block (34). A strip plate (33) is fixed to one end of the guide rod (31) that is close to the clamping block (34). The strip plate (33) is adapted to the sliding cavity and is at least partially placed inside the sliding cavity.

4. The chip positioning test socket according to claim 2, characterized in that: The end face of the clamp (34) that contacts the chip body (5) is wavy, including an arc surface that is mirror-symmetrically arranged.

5. The chip positioning test socket according to claim 1, characterized in that: The lifting assembly (2) includes at least a lifting cavity (14) opened on the socket body (1). A circular hole is provided between the lifting cavity (14) and the test cavity (12). A pressure column (22) adapted to it is built into the circular hole. One end of the pressure column (22) is fixedly connected to the pressure plate (21), and the other end is fixedly connected to the connecting plate (23) provided in the lifting cavity (14). The connecting plate (23) is arranged parallel to the pressure plate (21).

6. The chip positioning test socket according to claim 5, characterized in that: A set of reset springs (24) is also fixed on the upper surface of the connecting plate (23), and the other end of the reset springs (24) is fixed to the inner wall of the lifting cavity (14).

7. The chip positioning test socket according to claim 6, characterized in that: The connecting plate (23) has a limiting component (4) on one side. The limiting component (4) includes at least a fixing frame (41) fixedly mounted on the socket body (1). A pull plate (42) is slidably mounted inside the fixing frame (41). The connecting plate (23) is at least partially placed on the pull plate (42). The end side of the pull plate (42) has a protrusion that can abut against the fixing frame (41).

8. The chip positioning test socket according to claim 7, characterized in that: The pull plate (42) is also provided with a push spring (43), one end of which is fixedly connected to the protrusion and the other end is fixedly connected to the fixing frame (41).

9. The chip positioning test socket according to claim 5, characterized in that: The socket body (1) has a data interface for data transmission on the side away from the lifting cavity (14).

Citation Information

Patent Citations

  • Test socket for chip

    CN214585854U