Chip testing and detecting device

Abstract

The utility model discloses a chip testing and detecting device, which comprises a testing body, a clamping seat, a pressing plate, a mounting frame and a guide assembly, the top end of the testing body is provided with a round hole, the clamping seat is arranged at the bottom end of the testing body, the top end of the clamping seat is provided with a vacuum adsorption hole, the pressing plate is arranged at the top end of the testing body, and the top end of the pressing plate is provided with an exposure hole. The mounting frame is arranged outside the pressing plate, and the guide assembly is arranged at the top end of the clamping base. According to the utility model, by utilizing the design of the guide assembly, the mounting frame and the pressing plate, chips are placed at the top end of the test body during use, and the pressing plate is adsorbed through the vacuum adsorption holes of the clamping seat, so that the pressing plate clamps and fixes a plurality of chips at the top end of the test body; therefore, the corresponding number of holes do not need to be formed in the test body or the card seat, and when the number of the chips changes, only the pressing plate with the corresponding number of exposed holes needs to be replaced.

Description

TECHNICAL FIELD

[0001] The utility model relates to chip test field, especially relates to chip test and detection device. BACKGROUND

[0002] When carrying out chip test, for example, when testing SiC bare chip, need to utilize chip test fixture to fix the bare chip to be tested, then utilize test machine to test it, and the common clamping device is the card seat type suction device, that is, the vacuum suction hole is arranged on the card seat, when needing to carry out chip test, the bare chip to be tested is placed in the position of the vacuum suction hole, the bare chip to be tested is adsorbed on the card seat by utilizing the negative pressure generated by the card seat, to realize the fixation of the bare chip to be tested.

[0003] The utility model discloses a kind of chip test assembly and chip test equipment, the present application provides a kind of chip test assembly and chip test equipment, chip test assembly includes chuck;First vacuum suction hole for providing negative pressure is arranged on chuck;Test main body, test main body is set to hollow structure, and the bottom surface of test main body is provided with first aperture, the top surface of test main body is provided with a plurality of interval second apertures, first aperture and each second aperture are communicated hollow structure, and the number of second aperture is greater than the number of first aperture;When being in test state, the bottom surface of test main body is placed on chuck, and the first aperture of test main body is directly opposite the first vacuum suction hole of chuck, and each second aperture of test main body is used to place a chip to be tested.The present application provides a kind of chip test assembly and chip test equipment has improved the effect of chip test efficiency.

[0004] Multiple apertures realize the fixing effect of multiple chips, but when the number of chips increases, the corresponding number of holes needs to be re-opened, so that the use of card seat or test main body is not convenient enough. UTILITY MODEL CONTENTS

[0005] The utility model discloses chip test and detection device to solve the problem in the background art.

[0006] To achieve the above object, the utility model provides the following technical scheme: chip test and detection device, including:

[0007] Test main body, the top of test main body is provided with round hole;

[0008] Chucking plate, the bottom of test main body is provided with chucking plate, and the top of chucking plate is provided with vacuum suction hole;

[0009] Pressing plate, the top of test main body is provided with pressing plate, and the top of pressing plate is provided with exposure hole for partially exposing chip;

[0010] The mounting frame is disposed outside the pressing plate and is used for mounting the pressing plate;

[0011] A guide assembly is disposed at the top of the card holder and is used to guide the movement of the mounting frame.

[0012] Preferably, the guiding component includes:

[0013] The first guide post, the bottom end of which is fixedly connected to the top end of the card holder;

[0014] The second guide post has its bottom end fixedly connected to the top end of the card holder, and a limiting component for limiting the falling of the mounting frame is provided in the middle of the second guide post.

[0015] Preferably, the limiting component includes:

[0016] The limiting block has a cavity inside the second guide post for mounting the limiting block, and the inner wall of the cavity has a socket, through which the limiting block is inserted and connected.

[0017] A baffle, one end of which is fixedly connected to one side of the limiting block;

[0018] An elastic block is disposed on the other side of the baffle.

[0019] Preferably, the vertical cross-section of the limiting block is a right triangle, the baffle and the elastic block are both disposed in the cavity, and the top of the mounting frame is provided with a first circular groove for inserting the first guide post or the second guide post.

[0020] Preferably, the top of the mounting frame is provided with a second circular groove, the pressing plate is sleeved inside the second circular groove, the inside of the mounting frame is provided with a fixing component for mounting the pressing plate and the mounting frame, and the bottom of the mounting frame is provided with a pushing component.

[0021] Preferably, the fastener includes:

[0022] The mounting bolts are installed, and the outer wall of the mounting frame has a circular slot. The mounting bolts are inserted into the circular slot. The outer wall of the pressing plate has a threaded groove. The mounting bolts are threaded into the threaded groove.

[0023] Preferably, the actuating component includes:

[0024] A spring, the top end of which is fixedly connected to the bottom end of the mounting frame;

[0025] A damping block, the top end of which is fixedly connected to the bottom end of the mounting frame, and the damping block is sleeved inside the spring;

[0026] A push plate is disposed at the bottom end of the spring and the damping block.

[0027] The technical effects and advantages of this utility model are as follows:

[0028] This utility model utilizes the design of a guide component, mounting frame, and pressing plate. During use, the chip is placed on the top of the test body, and the pressing plate is attracted by the vacuum adsorption holes of the card holder, so that the pressing plate clamps and fixes multiple chips on the top of the test body. Therefore, it is not necessary to open a corresponding number of holes in the test body or card holder. When the number of chips changes, it is only necessary to replace the pressing plate with the corresponding number of exposed holes. Attached Figure Description

[0029] Figure 1 This is a schematic diagram of the overall three-dimensional structure of this utility model.

[0030] Figure 2 This is a three-dimensional structural diagram of the pressing plate and mounting frame of this utility model.

[0031] Figure 3 This utility model Figure 2 A schematic diagram of the enlarged structure of A in the middle.

[0032] Figure 4 This is a three-dimensional structural diagram of the mounting frame of this utility model.

[0033] Figure 5 This is a three-dimensional structural diagram of the card holder and guide assembly of this utility model.

[0034] Figure 6 This is a schematic diagram of the cross-sectional structure of the second guide post of this utility model.

[0035] In the diagram: 1. Test body; 2. Card holder; 3. First guide post; 4. Second guide post; 5. Mounting frame; 6. Pressing plate; 7. Mounting bolt; 8. Pushing assembly; 81. Spring; 82. Damping block; 83. Push plate; 9. Limiting component; 91. Limiting block; 92. Baffle; 93. Elastic block. Detailed Implementation

[0036] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0037] In the first embodiment, the present invention provides as follows: Figures 1-6 The chip testing and inspection apparatus shown includes:

[0038] Test body 1, with a round hole at the top;

[0039] Card holder 2 is located at the bottom of the test body 1, and a vacuum adsorption hole is provided at the top of the card holder 2;

[0040] Press plate 6 is located at the top of test body 1, and the top of press plate 6 has an exposure hole for partially exposing the chip.

[0041] Mounting frame 5 is set outside the pressing plate 6 and is used for mounting the pressing plate 6.

[0042] A guide assembly is located at the top of the card holder 2 and is used to guide the movement of the mounting frame 5.

[0043] The guiding components include:

[0044] The bottom end of the first guide post 3 is fixedly connected to the top end of the card holder 2;

[0045] The second guide post 4 has its bottom end fixedly connected to the top end of the card holder 2, and a limiting component 9 for limiting the fall of the mounting frame 5 is provided in the middle of the second guide post 4.

[0046] Limiting component 9 includes:

[0047] The limiting block 91 and the second guide post 4 have a cavity inside for mounting the limiting block 91. The inner wall of the cavity has a socket, and the limiting block 91 is inserted into the socket.

[0048] One end of the baffle 92 and the limiting block 91 are fixedly connected to one side of the baffle 92;

[0049] Elastic block 93 is located on the other side of baffle 92.

[0050] The vertical cross-section of the limiting block 91 is a right triangle. The baffle 92 and the elastic block 93 are both set in the cavity. The top of the mounting frame 5 is provided with a first circular groove for inserting the first guide post 3 or the second guide post 4.

[0051] Furthermore, the working principle of the test body 1 and the card holder 2 is the same as that of the chuck and test body in announcement number CN219245715U. The first guide post 3 and the second guide post 4 are cylindrical rods of the same size. Two first guide posts 3 are provided, and the two first guide posts 3 and the second guide post 4 are distributed in an isosceles triangle position at the top of the test body 1. The bottom ends of the first guide posts 3 and the second guide posts 4 are welded and fixed to the top of the test body 1. The outer walls of the two first guide posts 3 and the second guide posts 4 are in contact with the outer wall of the card holder 2, thereby positioning the card holder 2 so that the position of the vacuum adsorption hole of the test body 1 corresponds to the position of the circular hole, and the middle part of the pressing plate 6 corresponds to the position of the vacuum adsorption hole. Thus, during the test, the pressing plate 6 is adsorbed through the vacuum adsorption hole and the circular hole, and the chip between the test body 1 and the pressing plate 6 is squeezed and fixed. The test is performed at the top of the test body 1. The function of the limiting component 9 is to prevent the mounting frame 5 and the pressing plate 6 from approaching the test body 1 after chip testing or chip placement, thereby facilitating chip removal or placement. The inclined surface of the limiting block 91 faces the test body 1. The contact part of the limiting block 91 with the baffle 92 is welded, and the contact part of the baffle 92 with the elastic block 93 is bonded. Both the baffle 92 and the elastic block 93 are set in the cavity. The elastic block 93 is always in a compressed state in the cavity. When the mounting frame 5 moves away from the test body 1, the inner wall of the first circular groove will squeeze the inclined surface of the limiting block 91, so that the limiting block 91 cannot restrict the movement of the mounting frame 5. When the mounting frame 5 moves closer to the test body 1, without pressing the limiting block 91, the right-angled edge of the limiting block 91 will contact the bottom end of the mounting frame 5, restricting the movement of the mounting frame 5.

[0052] In the second embodiment, the present invention provides as follows: Figures 1-6 The chip testing and inspection apparatus shown includes:

[0053] Test body 1, with a round hole at the top;

[0054] Card holder 2 is located at the bottom of the test body 1, and a vacuum adsorption hole is provided at the top of the card holder 2;

[0055] Press plate 6 is located at the top of test body 1, and the top of press plate 6 has an exposure hole for partially exposing the chip.

[0056] Mounting frame 5 is set outside the pressing plate 6 and is used for mounting the pressing plate 6.

[0057] A guide assembly is located at the top of the card holder 2 and is used to guide the movement of the mounting frame 5.

[0058] The top of the mounting frame 5 is provided with a second circular groove, and the pressing plate 6 is fitted into the inside of the second circular groove. The inside of the mounting frame 5 is provided with a fastener for mounting the pressing plate 6 and the mounting frame 5. The bottom of the mounting frame 5 is provided with a pushing component 8.

[0059] The fasteners include:

[0060] The mounting bolt 7 is installed. The outer wall of the mounting frame 5 has a circular slot. The mounting bolt 7 is inserted into the circular slot. The outer wall of the pressing plate 6 has a threaded groove. The mounting bolt 7 is threaded into the threaded groove.

[0061] Driven component 8 includes:

[0062] Spring 81, the top end of spring 81 is fixedly connected to the bottom end of mounting frame 5;

[0063] Damping block 82, the top end of damping block 82 is fixedly connected to the bottom end of mounting frame 5, and damping block 82 is sleeved inside spring 81;

[0064] Push plate 83 is located at the bottom of spring 81 and damping block 82.

[0065] Furthermore, the size of the second circular slot is adapted to the size of the pressing plate 6. The circular slot has a smooth inner wall, and the threads on the inner wall of the threaded groove mesh with the threads on the outer wall of the mounting bolt 7. By inserting the mounting bolt 7 into the circular slot and connecting it with the threaded groove, the mounting frame 5 and the pressing plate 6 are fixedly installed. Three mounting bolts 7 are arranged in a ring at equal intervals. The number of threaded grooves and circular slots corresponds to the number of mounting bolts 7. By removing the mounting bolts 7, the corresponding pressing plate 6 can be replaced to accommodate changes in the chip and the replacement of the pressing plate with the corresponding number of exposed holes. The pressure plate 6 is sufficient. Three sets of push components 8 are set at equal intervals at the bottom of the mounting frame 5. The tops of the springs 81 and damping blocks 82 are welded to the bottom of the mounting frame 5, and the bottoms of the springs 81 and damping blocks 82 are welded to the top of the push plate 83. When the pressure plate 6 is attracted, it will squeeze the springs 81 and damping blocks 82. When the test is completed, the restoring force of the springs 81 and damping blocks 82 will push the mounting frame 5 to move away from the test body 1. The mounting frame 5 drives the pressure plate 6, thereby passively separating it from the chip without squeezing it, which facilitates the removal of the chip.

[0066] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A chip testing and inspection device, characterized in that, include: The test body (1) has a circular hole at its top end; Card holder (2), the card holder (2) is set at the bottom end of the test body (1), and the top end of the card holder (2) is provided with a vacuum adsorption hole; Press plate (6), the press plate (6) is disposed at the top of the test body (1), and the top of the press plate (6) is provided with an exposure hole for partially exposing the chip; Mounting frame (5), which is disposed outside the pressing plate (6), is used for mounting the pressing plate (6); A guide component is disposed at the top of the card holder (2) and is used to guide the movement of the mounting frame (5).

2. The chip testing and inspection apparatus according to claim 1, characterized in that, The guiding component includes: The first guide post (3) is fixedly connected at its bottom end to the top end of the card holder (2); The second guide post (4) has its bottom end fixedly connected to the top end of the card holder (2), and a limiting component (9) for limiting the fall of the mounting frame (5) is provided in the middle of the second guide post (4).

3. The chip testing and inspection apparatus according to claim 2, characterized in that, The limiting component (9) includes: The limiting block (91) has a cavity inside the second guide post (4) for mounting the limiting block (91), and the inner wall of the cavity has an insertion hole, and the limiting block (91) is inserted into the insertion hole. Baffle (92), one end of the limiting block (91) is fixedly connected to one side of the baffle (92); An elastic block (93) is disposed on the other side of the baffle (92).

4. The chip testing and inspection apparatus according to claim 3, characterized in that, The vertical cross section of the limiting block (91) is a right triangle. The baffle (92) and the elastic block (93) are both set in the cavity. The top of the mounting frame (5) is provided with a first circular groove for inserting the first guide post (3) or the second guide post (4).

5. The chip testing and inspection apparatus according to claim 1, characterized in that, The top of the mounting frame (5) is provided with a second circular groove, the pressing plate (6) is sleeved inside the second circular groove, the inside of the mounting frame (5) is provided with a fixing member for mounting the pressing plate (6) and the mounting frame (5), and the bottom of the mounting frame (5) is provided with a pushing component (8).

6. The chip testing and inspection apparatus according to claim 5, characterized in that, The fastener includes: The mounting bolt (7) is provided with a circular slot on the outer wall of the mounting frame (5), and the mounting bolt (7) is inserted into the circular slot. The pressing plate (6) is provided with a threaded groove on the outer wall, and the mounting bolt (7) is threaded into the threaded groove.

7. The chip testing and inspection apparatus according to claim 5, characterized in that, The actuating component (8) includes: Spring (81), the top end of which is fixedly connected to the bottom end of the mounting frame (5); Damping block (82), the top end of which is fixedly connected to the bottom end of the mounting frame (5), and the damping block (82) is sleeved inside the spring (81); A push plate (83) is disposed at the bottom end of the spring (81) and the damping block (82).

Images