Signal generation device and test system

Abstract

The utility model relates to a signal generation device and a test system, and the signal generation device comprises a plurality of signal generation channels; each signal generation channel is provided with a channel output end; the channel output end is used for being directly or indirectly connected with a target object, and the target object comprises a tested piece and / or an auxiliary device for testing; the signal generation channel is configured to be capable of switching among a plurality of states; wherein the plurality of states comprise at least two of the following states; the voltage analog quantity output state is used for outputting a voltage analog quantity signal through the channel output end; the current analog quantity output state is used for outputting a voltage analog quantity signal through the channel output end; the voltage digital quantity output state is used for outputting a voltage analog quantity signal through the channel output end; and the current digital quantity output state is used for outputting the voltage analog quantity signal through the channel output end.

Description

Technical Field

[0001] This application relates to the field of testing, and more particularly to a signal generation device and a testing system. Background Technology

[0002] In the testing field, especially in HIL (Hardware-in-the-Loop) testing and RCP (Rapid Prototyping) testing, I / O boards are often required. I / O boards are equipped with various signal generation channels. The host can generate the information that needs to be sent. After the information passes through the signal generation channels, it generates the corresponding simulation test signals, which are then transmitted to the target object (such as the device under test, actuator, test bench, etc.).

[0003] In existing I / O boards, signal generation channels come in different types, such as digital signal generation channels and analog signal generation channels. Each channel has its own channel output terminal. Therefore, if an analog signal needs to be output, an analog signal generation channel and its channel output terminal are required. If a digital signal needs to be output, a digital signal generation channel and its channel output terminal are required. It can be seen that in the existing technology, the function of a single signal generation channel is limited. Summary of the Invention

[0004] Therefore, it is necessary to provide a signal generation device and testing system to address the aforementioned technical problems.

[0005] In a first aspect, this application provides a signal generation apparatus, characterized in that it includes: a plurality of signal generation channels;

[0006] Each of the signal generation channels has a channel output terminal; the channel output terminal is used to directly or indirectly connect to a target object, the target object including: a device under test and / or an auxiliary device for testing;

[0007] The signal generation channel is configured to switch between multiple states; wherein the multiple states include at least two of the following:

[0008] The voltage analog output status used to output a voltage analog signal through the channel output terminal;

[0009] Current analog output status used to output voltage analog signals through the channel output terminal;

[0010] Voltage digital output status used to output analog voltage signals through the channel output terminal;

[0011] The current digital output status is used to output the analog voltage signal through the output terminal of the channel.

[0012] Optionally, the signal generation channel includes a voltage output circuit, which operates at least when the signal generation channel is in the voltage analog output state, so as to output the voltage analog signal through the channel output terminal;

[0013] The voltage output circuit includes: a first DAC module, a first resistor, a first operational amplifier, and a second resistor;

[0014] The output of the first DAC module is connected to the first input of the first operational amplifier via the first resistor; the second resistor is connected between the second input of the first operational amplifier and the output of the first operational amplifier, and the output of the first operational amplifier is directly or indirectly connected to the channel output.

[0015] Optionally, the signal generation channel includes a current output circuit, a first switching module, and a second switching module.

[0016] The current output circuit can operate at least when the signal generation channel is in the current analog output state, so as to output the current analog signal through the channel output terminal;

[0017] The first DAC module, the first resistor, and the first operational amplifier are multiplexed in the current output circuit to serve as a multiplexed DAC module, multiplexed operational amplifier, and multiplexed resistor;

[0018] The current output circuit also includes: a capacitor, a detection feedback line, a first transistor, a second transistor, and a detection resistor;

[0019] The capacitor is connected between the second input terminal and the output terminal of the multiplexed operational amplifier;

[0020] The first switching module is used to: connect the capacitor between the second input terminal and the output terminal of the multiplexed operational amplifier and disconnect the second resistor between the second input terminal and the output terminal of the multiplexed operational amplifier when the current output circuit is working; and connect the second resistor between the second input terminal and the output terminal of the multiplexed operational amplifier and disconnect the capacitor between the second input terminal and the output terminal of the multiplexed operational amplifier when the voltage output circuit is working.

[0021] The output terminal of the multiplexed operational amplifier is also connected to the control terminals of the first transistor and the second transistor. The first terminal of the first transistor is connected to the power supply, the second terminal of the first transistor is connected to the first terminal of the second transistor, and the second terminal of the second transistor is grounded. The first terminal of the detection resistor is connected to the second terminal of the first transistor, and the second terminal of the detection resistor is directly or indirectly connected to the channel output terminal. The detection feedback line is used to detect the voltage of the detection resistor and, when the detection feedback line is connected to the second input terminal of the multiplexed operational amplifier, feeds back the detection result to the second input terminal of the multiplexed operational amplifier.

[0022] The second switch module is used to control whether the detection feedback line is connected to the second input terminal of the multiplexed operational amplifier.

[0023] Optionally, the signal generation channel includes a current output circuit, which includes: a second DAC module, a third resistor, a second operational amplifier, a capacitor, a detection feedback line, a first transistor, a second transistor, and a detection resistor; the current output circuit can operate at least when the signal generation channel is in the current analog output state, so as to output the current analog signal through the channel output terminal;

[0024] The output of the second DAC module is connected to the first input of the second operational amplifier via the third resistor; the capacitor is connected between the second input and output of the second operational amplifier; the output of the second operational amplifier is also connected to the first transistor and the control electrode of the second transistor; the first terminal of the first transistor is connected to the power supply; the second terminal of the first transistor is connected to the first terminal of the second transistor; the second terminal of the second transistor is grounded; the first terminal of the detection resistor is connected to the second terminal of the first transistor; the second terminal of the detection resistor is directly or indirectly connected to the channel output; the detection feedback line is used to detect the voltage of the detection resistor and feed it back to the second terminal of the second operational amplifier.

[0025] Optionally, the signal generation channel includes a digital output circuit; the digital output circuit can operate at least when the signal generation channel is in the current digital output state or the voltage digital output state, so as to output the corresponding digital signal through the channel output terminal. The digital output circuit includes: a driver, an upper transistor and a lower transistor, the output terminal of the driver is connected to the control electrode of the upper transistor and the lower transistor, the first terminal of the upper transistor is used to connect to a voltage source and / or a current source; the second terminal of the upper transistor is connected to the first terminal of the lower transistor, the second terminal of the lower transistor is grounded, and the second terminal of the upper transistor is also directly or indirectly connected to the channel output terminal.

[0026] Optionally, the signal generation channel includes a voltage output circuit, which operates at least when the signal generation channel is in the voltage analog output state, so as to output the voltage analog signal through the channel output terminal;

[0027] The signal generation channel includes a current output circuit, which can operate at least when the signal generation channel is in the current analog output state, so as to output the current analog signal through the channel output terminal.

[0028] When the signal generation channel is in the voltage digital output state, the voltage output circuit is used as the voltage source; when the signal generation channel is in the current digital output state, the current output circuit is used as the current source.

[0029] Secondly, a testing system is provided, including a host and a signal generation device as described in the first aspect; the signal generation channel is connected between the host and a target object to transmit and send information between the host and the target object; the sent information is information sent by the host to the target object.

[0030] Optionally, the testing system further includes: a selective connection device and a universal connection part; at least a portion of the first interface on the first side of the selective connection device is connected to the corresponding signal generation channel, and the second interface on the second side of the selective connection device is connected to the universal connection part, the universal connection part being used to connect to the target object, and the selective connection device being able to selectively realize the connection between the first interface and the second interface.

[0031] Optionally, the testing system further includes a bus interaction channel; the bus interaction channel connects the corresponding first interface to the host to transmit information based on the bus protocol between the host and the target object.

[0032] Optionally, the testing system further includes a signal acquisition channel; the signal acquisition channel is connected to the corresponding first interface and the host to transmit reporting information between the host and the target object, the reporting information being the information reported by the target object to the host.

[0033] In the aforementioned signal generation device and testing system, a single signal generation channel in the signal generation device has two states: analog output state and digital output state. Therefore, a single channel can be used to realize the functions of digital output and analog output, thus enriching the functions of a single signal generation channel. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a schematic diagram of one application scenario of this application;

[0036] Figure 2 This is a schematic diagram of the structure of a signal generation device in one embodiment of this application. Figure 1 ;

[0037] Figure 3 This is a schematic diagram of the structure of a signal generation device in one embodiment of this application. Figure 2 ;

[0038] Figure 4 This is a schematic diagram of the structure of a signal generation device in one embodiment of this application. Figure 3 ;

[0039] Figure 5 This is a circuit diagram of a voltage output circuit in one embodiment of this application;

[0040] Figure 6 This is a circuit diagram of the current output circuit in one embodiment of this application;

[0041] Figure 7 This is a circuit diagram of a digital output circuit in one embodiment of this application;

[0042] Figure 8 This is a circuit diagram of the control module and the signal generation channel in one embodiment of this application;

[0043] Figure 9 This is a schematic diagram of the construction of a test system in one embodiment of this application. Figure 1 ;

[0044] Figure 10 This is a schematic diagram of the construction of a test system in one embodiment of this application. Figure 2 . Detailed Implementation

[0045] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings, which illustrate embodiments of the present application. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this application will be thorough and complete.

[0046] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0047] It is understood that the terms “first,” “second,” etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.

[0048] It should be noted that when one element is considered to be "connected" to another element, it can be directly connected to the other element or connected to the other element through an intermediary element. Furthermore, in the following embodiments, "connection" should be understood as "electrical connection," "communication connection," etc., if there is transmission of electrical signals or data between the connected objects.

[0049] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising,” “including,” or “having,” etc., specify the presence of the stated feature, whole, step, operation, component, part, or combination thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof.

[0050] The application scenarios of the embodiments of this application can be, for example, Figure 1 As shown in the diagram, a signal generation device is positioned between the target object and the host computer. This device can feed back information from the host computer to the target object in the required signal format, thereby enabling information transfer between the host and the target object. A test system including the signal generation device can include both the illustrated signal generation device and the host computer. Communication between the signal generation device and the host computer is possible. Furthermore, the signal generation device can be connected to one target object or multiple target objects.

[0051] The target object can be any object or combination of objects that needs to receive information during the test, and the object usually refers to a hardware object.

[0052] In one example, the target object can be a device under test (DUT), specifically the hardware under test, such as a controller during the development and / or verification phases. This controller could be suitable for application in vehicles after development, such as a vehicle-mounted domain controller, or a controller for low-altitude aircraft or drones. In a further example, the DUT can refer to the hardware-in-the-loop (HIL) test device, and the host computer can include a real-time computer (RTPC) used in HIL testing, which can also be understood as an industrial control computer (ICC), typically configured with an embedded operating system. In other further examples, even if the target object is the DUT, the host computer can be a host computer running a desktop operating system (e.g., Windows), which interacts with the DUT via a signal generation device to achieve simulation testing. In yet another example, the host computer can also include both an ICC and a host computer.

[0053] In another example, the target object can be the actuator during rapid prototyping (RCP) testing. The host computer can be an industrial control computer used for RCP testing, which is usually equipped with an embedded operating system. The software under test (e.g., algorithm, model, etc.) can be located on the industrial control computer. The industrial control computer needs to control the actuator to test the functionality of the software. Thus, the actuator can be understood as an auxiliary device used for testing (testing the software under test).

[0054] In one example, the target object can also be an auxiliary device used for testing that provides corresponding auxiliary functions to the industrial control computer in the testing process (such as HIL testing, RCP testing, etc.). For example, it can be a test bench, simulation device, simulation bench, etc., used to simulate corresponding sensors and structural functions.

[0055] Therefore, the host computer can include an industrial control computer configured with an embedded operating system, a host computer configured with a desktop operating system, or both an industrial control computer and a host computer. The target object includes at least one of the following: a device under test (DUT), or an auxiliary device for testing (e.g., testing the DUT).

[0056] The industrial control computer and host computer mentioned here can be any circuit, circuit board, or device equipped with a processor. For example, an industrial control computer or host computer can refer to one or more circuit boards containing a processor. Furthermore, an industrial control computer or host computer can include not only the circuit board containing the processor but also mechanical structures such as a casing. The processor refers to a processor that can run an operating system.

[0057] In one example, taking HIL testing, the industrial control computer runs the test and needs to interact with the user through a host computer. The user can then monitor and / or influence the test run by the industrial control computer through the host computer. The influence can include pre-test influence, such as configuring the test environment and test cases, or during the test.

[0058] Furthermore, the testing system can have one or more industrial control computers and one or more host computers. The testing system can be at least one of the following: a HIL testing system, an RCP testing system, a simulation testing system, or a back-injection testing system.

[0059] In the embodiments of this application, please refer to Figure 2 A signal generating device, comprising:

[0060] Multiple signal generation channels;

[0061] Each of the signal generation channels has a channel output terminal; the channel output terminal is used to directly or indirectly connect to a target object, the target object including: a device under test and / or an auxiliary device for testing;

[0062] The signal generation channel is configured to switch between multiple states; wherein the multiple states include at least two of the following:

[0063] The voltage analog output status used to output a voltage analog signal through the channel output terminal;

[0064] Current analog output status used to output voltage analog signals through the channel output terminal;

[0065] Voltage digital output status used to output analog voltage signals through the channel output terminal;

[0066] The current digital output status is used to output the analog voltage signal through the output terminal of the channel.

[0067] Furthermore, the signal generating device may also include a control module, which is capable of communicating with the host computer and is also connected to the signal generating channel.

[0068] Since the signal generation device is connected between the host and the target object, the control module can at least be used to obtain information to be sent from the host or descriptive information describing the information to be sent, and to feed back a simulation test signal representing the information to be sent to the target object through the signal generation channel. The simulation test signal includes the analog signal and / or the digital signal, which can be used to represent (or can be understood as being used to transmit) the information to be sent.

[0069] It is evident that a single signal generation channel in the signal generation device possesses at least two of the multiple states. Consequently, a single channel can be used to realize the output function of the corresponding signals under these at least two states, thus enriching the functionality of the single signal generation channel.

[0070] The control module can be implemented using any circuit module with data processing capabilities. In one example, it can be executed using one or more FPGA circuits. In other examples, the FPGA circuit can be replaced with or supplemented with other processor circuits. The control module may also include other peripheral devices. Furthermore, since a single signal generation channel in the prior art can also generate digital and analog signals based on the output signal of the control module, the logic of how the control module outputs signals based on the information to be sent or its description information, thereby causing the signal generation channel to output digital or analog signals, can be understood by referring to the processing procedures in the prior art or improved processing procedures. Regardless of the method used to implement the control module, it does not depart from the scope of the embodiments of this application. The following description of specific embodiments in this specification mainly elaborates on the implementation method of the signal generation channel.

[0071] In some embodiments, please refer to Figure 3 The signal generation channel includes a voltage output circuit.

[0072] A voltage output circuit can be used at least to generate an analog voltage signal in response to the output signal of a control module (which can also be understood as in response to the control of the control module). Correspondingly, the information described by the output signal of the control module can be matched with the magnitude of the analog voltage. For example, the control module can use digital signals to describe the voltage of the analog voltage signal or the voltage range it is in. Furthermore, any circuit suitable for controlling the magnitude of the output voltage can be used as a voltage output circuit (which can also be described as an analog voltage generation circuit).

[0073] A current output circuit can be used at least to generate an analog current signal in response to the output signal of the control module (which can also be understood as in response to the control of the control module). Correspondingly, the information described by the output signal of the control module can be matched with the magnitude of the analog current. For example, the control module can use digital signals to describe the magnitude of the current or the voltage range of the analog current signal. Furthermore, any circuit suitable for controlling the magnitude of the output voltage can be used as a current output circuit (which can also be described as a voltage analog quantity generation circuit).

[0074] In some examples, the signal generation channel may have both voltage output circuit and current output circuit, or only one of them.

[0075] The voltage output circuit (e.g., the first DAC module DAC1, the first resistor R1, the first operational amplifier OP1, and the second resistor R2) can operate at least when the signal generation channel is in the voltage analog output state, so as to output the voltage analog signal through the channel output terminal; furthermore, in some examples, the voltage output circuit only operates when the signal generation channel is in the voltage analog output state, and does not operate in other states; in other examples, the voltage output circuit also operates in other partial or all states, for example, it can also operate when the signal generation channel is in the voltage digital output state.

[0076] Figure 5 In the example shown, the voltage output circuit may include: a first DAC module DAC1, a first resistor R1, a first operational amplifier OP1, and a second resistor R2, which can form a closed loop for voltage feedback control.

[0077] The output terminal of the first DAC module DAC1 is connected to the first input terminal of the first operational amplifier OP1 via the first resistor R1; the second resistor R2 is connected between the second input terminal of the first operational amplifier OP1 and the output terminal of the first operational amplifier OP1, and the output terminal of the first operational amplifier OP1 is directly or indirectly connected to the channel output terminal.

[0078] The first DAC module can be any device or combination of devices capable of digital-to-analog conversion, such as one or more digital-to-analog converters.

[0079] The current output circuit can operate at least when the signal generation channel is in the analog current output state, so as to output the analog current signal through the channel output terminal; the current output circuit can also operate at least when the signal generation channel is in the analog voltage output state, so as to output the analog current signal through the channel output terminal; furthermore, in some examples, the current output circuit only operates when the signal generation channel is in the analog current output state, and does not operate in other states; in other examples, the current output circuit also operates in some or all other states, for example, it can also operate when the signal generation channel is in the digital current output state.

[0080] There are various implementation schemes for current output circuits. Two examples are given below. In some examples, the current output circuit and the voltage output circuit reuse some components. In other examples, the current output circuit and the voltage output circuit do not reuse components.

[0081] If the device is not reused, then see [link to relevant documentation]. Figure 6 and combined Figure 3 , Figure 4The signal generation channel includes a current output circuit, which includes: a second DAC module DAC2, a third resistor R3, a second operational amplifier OP2, a capacitor C1, a detection feedback line, a first transistor T1, a second transistor T2, and a detection resistor R5.

[0082] The output of the second DAC module DAC2 is connected to the first input of the second operational amplifier OP2 via the third resistor R3. The capacitor C1 is connected between the second input and output of the second operational amplifier OP2. The output of the second operational amplifier OP2 is also connected to the control terminals (e.g., base or gate) of the first transistor T1 and the second transistor T2. The first terminal of the first transistor T1 is connected to the power supply, and the second terminal of the first transistor T1 is connected to the first terminal of the second transistor T2. The second terminal of the second transistor T2 is grounded. The first terminal of the detection resistor R5 is connected to the second terminal of the first transistor T1, or alternatively, to the first terminal of the second transistor T2, or between the first transistor T1 and the second transistor T2. The second terminal of the detection resistor R5 is directly or indirectly connected to the channel output. The detection feedback circuit is used to detect the voltage across the detection resistor and feed it back to the second terminal of the second operational amplifier. The voltage across the detection resistor R5 reflects the magnitude of the current flowing through it, and thus the magnitude of the current output through the channel output. The voltage at the output of the second operational amplifier OP2 can control the transistor, thereby changing the magnitude of the current output through the transistor. Furthermore, due to the feedback from the detection feedback circuit, the voltage at the output of operational amplifier OP2 will change according to the detection result of the current of the detection resistor R5, thereby achieving the purpose of current feedback control.

[0083] Furthermore, the detection feedback circuit may include a third operational amplifier OP3 and a fourth resistor R4. The two input terminals of the third operational amplifier OP3 are respectively connected to the two ends of the detection resistor R5, and the output terminal of the third operational amplifier OP3 is connected to the second input terminal of the second operational amplifier OP2 via the fourth resistor R4. This allows the voltage signal representing the current magnitude to be fed back to the input terminal of the second operational amplifier OP2, thereby achieving feedback control. In addition, direct connections or other devices may be used between the third operational amplifier OP3 and the fourth resistor R4, between the fourth resistor R4 and the second operational amplifier OP2, and between the third operational amplifier OP3 and the detection resistor R5. This example of a detection feedback circuit can be used in schemes where voltage and current output circuits share components, or in schemes where voltage and current output circuits do not share components.

[0084] The second DAC module DAC2 can be any device or combination of devices capable of digital-to-analog conversion, such as one or more digital-to-analog converters.

[0085] If the device is reused, then see [reference needed]. Figure 8 and combined Figure 5 The signal generation channel further includes a first switch module K1 and a second switch module K2. Figure 5 The first DAC module DAC1, the first resistor R1, and the first operational amplifier OP1 are multiplexed in the current output circuit to form a multiplexed DAC module DAC_M, a multiplexed operational amplifier OP_M, and a multiplexed resistor R_M;

[0086] The current output circuit further includes: capacitor C1, detection feedback line, first transistor T1, second transistor T2, and detection resistor R5; the current output circuit can operate at least when the signal generation channel is in the current analog output state, so as to output the current analog signal through the channel output terminal;

[0087] The capacitor C1 is connected between the second input terminal and the output terminal of the multiplexed operational amplifier OP_M;

[0088] The first switch module K1 is used to: connect the capacitor C1 between the second input terminal and the output terminal of the multiplexed operational amplifier OP_M when the current output circuit is working, and disconnect the second resistor R2 between the second input terminal and the output terminal of the multiplexed operational amplifier OP_M, thereby achieving... Figure 6 The circuit structure shown; when the voltage output circuit is working, the second resistor R2 is connected between the second input terminal and the output terminal of the multiplexed operational amplifier OP_M, and the capacitor C1 is disconnected between the second input terminal and the output terminal of the multiplexed operational amplifier OP_M, thereby achieving... Figure 5 The circuit structure shown;

[0089] The output terminal of the multiplexed operational amplifier OP_M is also connected to the control terminals (e.g., base or gate) of the first transistor T1 and the second transistor T2. The first terminal of the first transistor T1 is connected to the power supply, the second terminal of the first transistor T1 is connected to the first terminal of the second transistor T2, and the second terminal of the second transistor T2 is grounded. The first terminal of the detection resistor R5 is connected to the second terminal of the first transistor R1, and the second terminal of the detection resistor R5 is directly or indirectly connected to the channel output terminal. The detection feedback line is used to detect the voltage of the detection resistor and, when the detection feedback line is connected to the second input terminal of the multiplexed operational amplifier, feeds back the detection result to the second input terminal of the multiplexed operational amplifier.

[0090] The detection feedback circuit may include, for example, a third operational amplifier OP3 and a fourth resistor R4. The two input terminals of the third operational amplifier OP3 are respectively connected to the two ends of the detection resistor R5, and the output terminal of the third operational amplifier OP3 is connected to the second input terminal of the second operational amplifier OP2 via the fourth resistor R4. This allows the voltage signal representing the current magnitude to be fed back to the input terminal of the second operational amplifier OP2, thereby achieving feedback control. Furthermore, direct connections or other components may be used between the third operational amplifier OP3 and the fourth resistor R4, between the fourth resistor R4 and the second operational amplifier OP2, and between the third operational amplifier OP3 and the detection resistor R5.

[0091] The second switch module K2 is used to control whether the detection feedback line is connected to the second input terminal of the multiplexed operational amplifier. The second switch module K2 can be connected to the detection feedback line to control the on / off state of the detection feedback line, for example, it can be connected between resistor R3 and operational amplifier OP_M. In a scheme not shown, it can also be connected to other positions on the detection feedback line.

[0092] The first switch module can be implemented using one switch or multiple switches, and the second switch module can be implemented using one switch or multiple switches.

[0093] In some embodiments, please refer to Figure 3 , Figure 4 The signal generation channel includes a digital output circuit. The digital output circuit operates at least when the signal generation channel is in either the current digital output state or the voltage digital output state, to output a corresponding digital signal through the channel output terminal. Specifically, if in the current digital output state, the digital signal output through the channel output terminal is a current digital signal; if in the voltage digital output state, the digital signal output through the channel output terminal is a voltage digital signal.

[0094] Please refer to the following: Figure 7 The digital output circuit may include: a driver, an upper transistor T3 and a lower transistor T4. The output terminal of the driver is connected to the control electrode (e.g., gate or base) of the upper transistor T3 and the lower transistor T4. The first terminal of the upper transistor T3 is used to connect to a voltage source and / or a current source. The second terminal of the upper transistor T3 is connected to the first terminal of the lower transistor T4. The second terminal of the lower transistor T4 is grounded. The second terminal of the upper transistor T3 is also directly or indirectly connected to the channel output terminal.

[0095] In one example, the first terminal of the upper transistor T3 can be connected to one or more voltage sources to power the signal generation channel when it outputs a digital voltage signal. In another example, the first terminal of the upper transistor T3 can be connected to one or more current sources to power the signal generation channel when it outputs a digital current signal. In yet another example, the first terminal of the upper transistor T3 can be connected to both a voltage source and a current source via a switching module, allowing for selective connection of either a voltage source or a current source.

[0096] In some examples, when the signal generation channel is in the voltage digital output state, the voltage output circuit is used as the voltage source, for example, as one of the voltage sources; when the signal generation channel is in the current digital output state, the current output circuit is used as the current source, for example, as one of the current sources.

[0097] As can be seen, this fully realizes the reuse of circuit components, effectively reduces the number of devices, and makes efficient use of the space on the circuit board, which helps to reduce the size of the circuit board of the signal generation device. In particular, it can avoid or reduce the overhead of providing a separate, more complex voltage and current source for the digital signal generation circuit.

[0098] Furthermore, in existing testing systems, signal generation channels generally only consider digital voltage and analog voltage. In the specific example of this application, both digital current and analog current signal generation are taken into account, which broadens the function of the signal generation channel and facilitates a wider range of simulation testing possibilities.

[0099] also, Figure 8 In the example shown, during the output of analog current and analog voltage signals, i.e., when in the analog voltage output state and analog current output state, the controlled signal can be output to the channel output terminal via the upper transistor T3 as an analog signal. At this time, the upper transistor T3 can be on. In other examples, the output can also bypass the upper transistor T3. For example, at least one of other switching modules, resistors, or fault simulation modules can be provided between the sensing resistor R5 and the channel output terminal. If a switching module is provided, the output can be achieved without passing through the upper transistor T3 by turning it on. The upper transistor T3 can be off. Furthermore, the lower transistor T4 can be off. The on / off state of the upper transistor T3 and the lower transistor T4 can be controlled by a driver, or normally open or normally closed transistors can be selected during the selection process.

[0100] In other examples, even if the voltage output circuit (i.e., the voltage analog quantity generation circuit) is an independent circuit and is not reused or integrated with the current output circuit (i.e., the current analog quantity generation circuit), at least one of other switching modules, resistors, fault simulation modules, etc., may be provided between the voltage output circuit (i.e., the voltage analog quantity generation circuit), the current output circuit (i.e., the current analog quantity generation circuit) and the channel output terminal.

[0101] In the testing system provided in the embodiments of this application, such as Figure 9 As shown, a signal generating device is included, which can be positioned between a host and a target object to transmit and send information between the host and the target object; the sent information is information sent by the host to the target object. The number of signal generating devices can be one or more; the number of target objects can also be one or more. Various descriptions and examples of the signal generating device, host, and target objects can be understood by referring to the relevant descriptions in the instruction manual.

[0102] Since the signal generation channel of this application has at least two states, the same signal generation channel can be reused for different test tasks, thereby utilizing a limited number of signal generation channels to meet diverse signal requirements.

[0103] Specifically, when executing the first test task, at least one of the plurality of signal generation channels is in a first state, used to send first information to be sent from the host to the first target object corresponding to the first test task through a first type of signal;

[0104] When performing the second test task, the target signal generation channel is in a second state, which is used to send the second information to be sent from the host to the second target object corresponding to the first test task through the second type of signal;

[0105] The first state and the second state are different states among the plurality of states.

[0106] Furthermore, the first state can be any one of the following: digital voltage output state, digital current output state, analog voltage output state, analog current output state; but it is not limited to these. The second state can be any one of the following: digital voltage output state, digital current output state, analog voltage output state, analog current output state; but it is not limited to these.

[0107] In the above scheme, the same signal generation channel can be in different states when performing different tests, which helps to fully meet the diverse channel type requirements and changes in requirements.

[0108] Because the state of the signal generation channels is changeable, it's not necessary to wait for one test task to complete before starting the wiring for another. During the execution of one test task, as long as there are remaining signal generation channels, the wiring for the target object of another test task can be completed with the remaining signal generation channels. This simplifies the testing operation and improves processing efficiency. Furthermore, if the number of signal generation channels is sufficient—for example, enough to meet the needs of N sets of target objects for N test tasks (N greater than or equal to 2)—the wiring for the signal generation channels of N test tasks with each target object can be completed simultaneously, facilitating centralized wiring for multiple test tasks.

[0109] In some embodiments, please refer to Figure 10 The testing system further includes a selective connection device. At least a portion of the first interface on the first side of the selective connection device is connected to a corresponding signal generation channel, and the second interface on the second side of the selective connection device is connected to the universal connection part, which is used to connect to a target object. The selective connection device can selectively achieve connectivity between the first interface and the second interface, and thus selectively achieve connectivity between the universal connection part and the signal generation channel.

[0110] The universal connector is used to connect the signal output line of the target object. The universal connector may, for example... Figure 10 The connecting parts P1, P2, and P3 shown can be external connection lines of the selectively connected device, interfaces on the panel of the test system cabinet, or interfaces and terminals on connectors used to mate with the target object. Any medium that can achieve direct or indirect connection to the target object's lines can be considered a connecting part and can be used as a general-purpose connecting part.

[0111] In one embodiment, the selective connection device is connected to the signal generation channel and the signal acquisition channel; the selective connection device is also directly or indirectly connected to the target object through a universal connection part; specifically, the signal acquisition channel is connected to the corresponding first interface and the host to transmit reporting information between the host and the target object, the reporting information being the information reported by the target object to the host.

[0112] The general-purpose connection unit is specifically used for: connecting the signal output line of the third target object to be tested in the third test task when performing the third test task; and connecting the signal input line of the fourth target object to be tested in the fourth test task when performing the fourth test task; in other words, the general-purpose connection unit can connect the signal output line and the signal input line respectively when performing different test tasks.

[0113] Correspondingly, the selective connection device is used to: connect the general connection unit to the signal acquisition channel when performing the third test task, so that the information to be reported sent by the third target object can be transmitted to the host through the signal acquisition channel; and connect the general connection unit to the signal generation channel when performing the fourth test task, so that the information to be sent by the host can be transmitted to the fourth target object through the signal generation channel.

[0114] It is evident that even if the same universal connector is used to connect the signal output line and the signal input line respectively during different tests, the selective switching device can still meet the signal transmission requirements of each test by selectively switching on the corresponding channels.

[0115] In contrast, existing technologies typically distinguish between different connection points in the external interfaces of testing systems, such as DI (Digital Input), DO (Digital Output), AI (Analog Input), and AO (Analog Output). These different connection points correspond to different channels within the testing system. For example, the DI connection point internally connects to the digital signal acquisition channels of each signal acquisition channel and externally connects to the digital signal output lines of the target object. The DO connection point internally connects to the digital signal output channels of each signal generation channel and externally connects to the digital signal input lines of the target object. The AI ​​connection point internally connects to the analog signal acquisition channels of each signal acquisition channel and externally connects to the analog signal output lines of the target object. The AO connection point internally connects to the analog signal output channels of each signal generation channel and externally connects to the analog signal input lines of the target object. If digital and analog signals are further categorized into digital and analog voltage and current signals, the number of such connection point and channel classifications becomes even greater. Wiring requires distinguishing between different connection points to connect the target object's lines, making the operation complex and prone to errors.

[0116] In the above-described solution of this application, a single universal connector can simultaneously handle digital / analog signal input and output functions, making full and effective use of connector resources. It also facilitates wiring and provides a high degree of flexibility in wiring. Specifically, the lines of the target object can be arbitrarily connected to any universal connector; only the selective connection device needs to be configured to ensure that the universal connector can be connected to the corresponding channel (signal generation channel or signal acquisition channel).

[0117] In some embodiments, please refer to Figure 10The test system further includes a bus interaction channel; the selective connection device is connected between the general connection part, the signal generation channel, and the bus interaction channel; specifically, the bus interaction channel connects the corresponding first interface to the host to transmit information based on the bus protocol between the host and the target object.

[0118] The general connection unit is used to: connect the bus interaction line of the fifth target object to be tested in the fifth test task when performing the fifth test task, and connect the signal input unit of the sixth target object to be tested in the sixth test task when performing the sixth test task;

[0119] The selective connection device is used to connect the general connection unit to the bus interaction channel when performing the fifth test task, so that the host can communicate with the fifth target object using the bus interaction channel. When performing the sixth test task, the general connection unit is connected to the signal generation channel, so that the information to be sent by the host can be transmitted to the sixth target object through the signal generation channel.

[0120] It is evident that even if the same universal connector is used to connect the signal output line and the bus interaction line respectively during different tests, the selective connection device can still meet the communication requirements of each test by selectively connecting the corresponding channels.

[0121] In contrast, in existing technologies, the external interfaces of testing systems typically distinguish between DI (digital input), DO (digital output), AI (analog input), and AO (analog output) connection points, and also include bus interaction connection points, such as those for CAN bus, LIN bus, Flexray bus, and DSI bus. These bus interaction lines are used to connect the target object to the corresponding bus. When wiring, it is necessary to distinguish between different connection points and connect the target object's lines, which is more complicated and prone to errors.

[0122] In the above-described solution of this application, a single universal connector can simultaneously perform digital / analog signal output and bus interaction functions, making full and effective use of connector resources. It also facilitates wiring and provides a high degree of flexibility in wiring. Specifically, the lines of the target object can be arbitrarily connected to any universal connector; only the selective connection device needs to be configured to ensure that the universal connector can be connected to the corresponding channel (signal generation channel or signal acquisition channel).

[0123] Since a bus is an interactive communication method and signal generation is a one-way communication method, the connection parts are generally not shared. However, the above-mentioned solution of this application creatively conceives of the sharing of the interactive communication medium and the one-way communication medium, and ensures that the signal transmission requirements can be met no matter how the wiring is done through a selective connection device. For example, a certain bus interactive line can be connected to a matching bus channel.

[0124] The selective connection device is configured to selectively connect the first connection part and the second connection part, so that the corresponding channels and lines are connected.

[0125] The first connection part can be understood as a medium used to connect corresponding channels (such as signal generation channel, signal acquisition channel, bus channel), and different first connection parts connect to different channels; the second connection part can be understood as a medium used to connect corresponding general connection parts, and different second connection parts connect to different general connection parts, or: the second connection part can also be a general connection part.

[0126] The selective connection freedom of the selective connection device includes at least two scenarios. In one scenario, all first connecting parts can selectively connect to all second connecting parts, that is, each first connecting part can selectively connect to any second connecting part. In the other scenario, selective connection can be achieved within a certain range. For example, if the total number of first connecting parts is M1 and the total number of second connecting parts is N2, M1 can be equal to or different from M2. Then, for the N1 first connecting parts in M1, they can selectively connect to the N2 second connecting parts in M2, where N1 < M1 and N2 < M2. That is, only the N1 first connecting parts and the N2 second connecting parts can achieve free selective connection, and they cannot connect to other second connecting parts other than the N2 second connecting parts.

[0127] Furthermore, the selective connection device can also be understood as any device whose circuitry can freely connect the first connection part and the second connection part. For example, it can be implemented using a switch matrix, relay matrix, or FPGA. The selective connection device may include one circuit board or a combination of multiple circuit boards containing this circuitry. The selective connection device can be configured to connect the first connection part and the second connection part under the control of an industrial control computer or a host computer. It can also be automatically or manually controlled by other devices (such as a host computer or server connected to the test system). This control process can be implemented by the host computer or bypass the host computer and directly control the selective connection device through other interfaces of the test system.

[0128] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0129] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A signal generation device, characterized in that, include: Multiple signal generation channels; Each of the aforementioned signal generation channels has a channel output terminal; The channel output terminal is used to directly or indirectly connect to the target object, which includes: the device under test and / or auxiliary devices for testing; The signal generation channel is configured to switch between multiple states; wherein the multiple states include at least two of the following: The voltage analog output status used to output a voltage analog signal through the channel output terminal; Current analog output status used to output voltage analog signals through the channel output terminal; Voltage digital output status used to output analog voltage signals through the channel output terminal; The current digital output status is used to output the analog voltage signal through the output terminal of the channel.

2. The signal generation device according to claim 1, characterized in that, The signal generation channel includes a voltage output circuit, which can operate at least when the signal generation channel is in the voltage analog output state, so as to output the voltage analog signal through the channel output terminal; The voltage output circuit includes: a first DAC module, a first resistor, a first operational amplifier, and a second resistor; The output of the first DAC module is connected to the first input of the first operational amplifier via the first resistor; the second resistor is connected between the second input of the first operational amplifier and the output of the first operational amplifier, and the output of the first operational amplifier is directly or indirectly connected to the channel output.

3. The signal generation device according to claim 2, characterized in that, The signal generation channel includes a current output circuit, a first switch module, and a second switch module. The current output circuit can operate at least when the signal generation channel is in the current analog output state, so as to output the current analog signal through the channel output terminal; The first DAC module, the first resistor, and the first operational amplifier are multiplexed in the current output circuit to serve as a multiplexed DAC module, multiplexed operational amplifier, and multiplexed resistor; The current output circuit also includes: a capacitor, a detection feedback line, a first transistor, a second transistor, and a detection resistor; The capacitor is connected between the second input terminal and the output terminal of the multiplexed operational amplifier; The first switching module is used to: connect the capacitor between the second input terminal and the output terminal of the multiplexed operational amplifier and disconnect the second resistor between the second input terminal and the output terminal of the multiplexed operational amplifier when the current output circuit is working; and connect the second resistor between the second input terminal and the output terminal of the multiplexed operational amplifier and disconnect the capacitor between the second input terminal and the output terminal of the multiplexed operational amplifier when the voltage output circuit is working. The output terminal of the multiplexed operational amplifier is also connected to the control terminals of the first transistor and the second transistor. The first terminal of the first transistor is connected to the power supply, the second terminal of the first transistor is connected to the first terminal of the second transistor, and the second terminal of the second transistor is grounded. The first terminal of the detection resistor is connected to the second terminal of the first transistor, and the second terminal of the detection resistor is directly or indirectly connected to the channel output terminal. The detection feedback line is used to detect the voltage of the detection resistor and, when the detection feedback line is connected to the second input terminal of the multiplexed operational amplifier, feeds back the detection result to the second input terminal of the multiplexed operational amplifier. The second switch module is used to control whether the detection feedback line is connected to the second input terminal of the multiplexed operational amplifier.

4. The signal generation device according to claim 1, characterized in that, The signal generation channel includes a current output circuit, which comprises: a second DAC module, a third resistor, a second operational amplifier, a capacitor, a detection feedback line, a first transistor, a second transistor, and a detection resistor; the current output circuit can operate at least when the signal generation channel is in the current analog output state, so as to output the current analog signal through the channel output terminal; The output of the second DAC module is connected to the first input of the second operational amplifier via the third resistor; the capacitor is connected between the second input and output of the second operational amplifier; the output of the second operational amplifier is also connected to the first transistor and the control electrode of the second transistor; the first terminal of the first transistor is connected to the power supply; the second terminal of the first transistor is connected to the first terminal of the second transistor; the second terminal of the second transistor is grounded; the first terminal of the detection resistor is connected to the second terminal of the first transistor; the second terminal of the detection resistor is directly or indirectly connected to the channel output; the detection feedback line is used to detect the voltage of the detection resistor and feed it back to the second terminal of the second operational amplifier.

5. The signal generation device according to claim 1, characterized in that, The signal generation channel includes a digital output circuit; the digital output circuit can operate at least when the signal generation channel is in the current digital output state or the voltage digital output state, so as to output the corresponding digital signal through the channel output terminal. The digital output circuit includes: a driver, an upper transistor and a lower transistor. The output terminal of the driver is connected to the control electrode of the upper transistor and the lower transistor. The first terminal of the upper transistor is used to connect to a voltage source and / or a current source. The second terminal of the upper transistor is connected to the first terminal of the lower transistor. The second terminal of the lower transistor is grounded. The second terminal of the upper transistor is also directly or indirectly connected to the channel output terminal.

6. The signal generation apparatus according to claim 5, characterized in that, The signal generation channel includes a voltage output circuit, which can operate at least when the signal generation channel is in the voltage analog output state, so as to output the voltage analog signal through the channel output terminal; The signal generation channel includes a current output circuit, which can operate at least when the signal generation channel is in the current analog output state, so as to output the current analog signal through the channel output terminal. When the signal generation channel is in the voltage digital output state, the voltage output circuit is used as the voltage source; when the signal generation channel is in the current digital output state, the current output circuit is used as the current source.

7. A testing system, characterized in that, It includes a host and the signal generation device according to any one of claims 1 to 5; the signal generation channel is connected between the host and the target object to transmit and send information between the host and the target object; The information sent is information sent by the host to the target object.

8. The testing system according to claim 7, characterized in that, Also includes: A selective connection device and a universal connection part; at least a portion of the first interface on the first side of the selective connection device is connected to a corresponding signal generation channel, and the second interface on the second side of the selective connection device is connected to the universal connection part, the universal connection part being used to connect a target object, and the selective connection device being able to selectively realize the connection between the first interface and the second interface.

9. The testing system according to claim 8, characterized in that, It also includes a bus interaction channel; the bus interaction channel connects the corresponding first interface to the host to transmit information based on the bus protocol between the host and the target object.

10. The testing system according to claim 8, characterized in that, It also includes a signal acquisition channel; the signal acquisition channel is connected to the corresponding first interface and the host to transmit reporting information between the host and the target object, the reporting information being the information reported by the target object to the host.

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