Current testing device and testing system

Abstract

The utility model discloses a current testing device and a testing system. The current testing device comprises a testing unit, a data acquisition unit, at least two resistor units with different resistance values and at least two connecting units, the test unit comprises a test board, and an acquisition interface, a plurality of test interfaces and a plurality of resistor interfaces which are electrically connected with the test board; the acquisition interface is electrically connected with the data acquisition unit, the test interface is electrically connected with a first end of the connection unit, and the resistor interface is electrically connected with the resistor unit in a pluggable manner; the second end of the connecting unit is used for being electrically connected with a module to be tested; and the data acquisition unit is used for acquiring voltage at two ends of the resistor unit electrically connected with the resistor interface. The utility model provides a current testing device and a testing system, which can improve the efficiency, the accuracy and the reliability of current testing.

Description

Technical Field

[0001] This utility model relates to the field of circuit testing technology, and in particular to a current testing device and testing system. Background Technology

[0002] Integrated circuit testing systems typically include multiple test modules. Current testing is usually performed on each module to determine its proper functioning. Different test modules require different test currents. Improving testing efficiency necessitates simultaneous testing across multiple channels. However, existing current testing devices suffer from the following drawbacks:

[0003] (1) Only one test module can be tested at a time, which is inefficient and takes a long time to test.

[0004] (2) A large number of repetitive operations can also affect the accuracy of measurement data;

[0005] (3) The testing process is uncertain and cannot be standardized. Utility Model Content

[0006] This invention provides a current testing device and system that can improve the efficiency, accuracy and reliability of current testing.

[0007] According to one aspect of the present invention, a current testing device is provided, comprising: a testing unit, a data acquisition unit, at least two resistor units with different resistance values, and at least two connection units.

[0008] The test unit includes a test board, a data acquisition interface, multiple test interfaces, and multiple resistance interfaces electrically connected to the test board.

[0009] The acquisition interface is electrically connected to the data acquisition unit, the test interface is electrically connected to the first end of the connection unit, and the resistor interface is pluggably electrically connected to the resistor unit.

[0010] The second end of the connection unit is used for electrical connection with the module under test;

[0011] The data acquisition unit is used to acquire the voltage across the resistor unit that is electrically connected to the resistor interface.

[0012] Optionally, the resistor unit includes a positive current terminal, a negative current terminal, a positive voltage feedback terminal, and a negative voltage feedback terminal;

[0013] Each of the resistor interfaces includes a first current terminal, a second current terminal, a first voltage terminal, and a second voltage terminal;

[0014] Both the first current terminal and the second current terminal are electrically connected to the test interface through the test board, and both the first voltage terminal and the second voltage terminal are electrically connected to the acquisition interface through the test board.

[0015] When the resistor interface is electrically connected to the resistor unit, the positive current terminal is electrically connected to the first current terminal, the negative current terminal is electrically connected to the second current terminal, the positive voltage feedback terminal is electrically connected to the first voltage terminal, and the negative voltage feedback terminal is electrically connected to the second voltage terminal.

[0016] Optionally, the connection unit includes a cable;

[0017] The cable includes an insulation layer, a shielding layer, and a signal transmission line.

[0018] Optionally, the current testing device provided in this embodiment also includes a storage unit;

[0019] The storage unit is electrically connected to the data acquisition unit, and the storage unit is used to store the voltage across the resistor unit that is electrically connected to the resistor interface, which is acquired by the data acquisition unit.

[0020] Optionally, the data acquisition unit is also used to store the voltage across the acquired resistor unit.

[0021] Optionally, the resistance value of each resistor unit is in the range of 1mΩ to 1MΩ.

[0022] Optionally, the resistor unit is a non-inductive resistor.

[0023] Optionally, the acquisition interface is located on the first side of the test board;

[0024] Each of the test interfaces is located on the second side of the test board, wherein the first side and the second side are arranged opposite to each other;

[0025] Multiple resistor interfaces are located on the first surface of the test board and are arranged in an array.

[0026] Optionally, all the test interfaces described are the same;

[0027] The ports at the first end of each of the aforementioned connection units are identical;

[0028] The second end of the connection unit is adapted to the interface of the module under test to which it is electrically connected.

[0029] According to another aspect of the present invention, a testing system is provided, which includes the current testing device and integrated circuit testing system provided in any embodiment of the present invention;

[0030] The integrated circuit testing system includes multiple modules under test.

[0031] This invention provides a current testing device, comprising a testing unit, a data acquisition unit, at least two resistor units with different resistance values, and at least two connection units. The testing unit includes a test board, a data acquisition interface electrically connected to the test board, multiple test interfaces, and multiple resistor interfaces. The first end of each connection unit is electrically connected to a test interface, and the second end is used to electrically connect to the module under test (DUT). The resistor interfaces are pluggable and detachable from the resistor units, allowing for replacement of resistor units as needed. The data acquisition unit can acquire the voltage across the resistor units electrically connected to the resistor interfaces, and determine the current of the DUT based on the acquired voltage and the resistance value of the resistor units. This embodiment uses multiple resistor units and multiple connection units, enabling simultaneous current testing of multiple DUT modules, improving testing efficiency and the utilization rate of the current testing device, and ensuring the consistency and accuracy of test data. The inclusion of at least two resistor units with different resistance values ​​allows for simultaneous current testing of different DUT modules, improving the compatibility of the current testing device. In this embodiment, the data acquisition unit is used to acquire voltage, thus eliminating the need to install numerous ammeters to test the current of the module under test. A single data acquisition unit can simultaneously complete the current testing of multiple modules under test. In summary, the current testing device provided in this embodiment can improve the efficiency, accuracy, and reliability of current testing.

[0032] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this utility model, nor is it intended to limit the scope of this utility model. Other features of this utility model will become readily apparent from the following description. Attached Figure Description

[0033] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 This is a schematic diagram of the structure of a current testing device according to an embodiment of the present utility model;

[0035] Figure 2 This is a schematic diagram of the structure of a resistor unit according to an embodiment of the present utility model;

[0036] Figure 3 This is a schematic diagram of the structure of a testing system provided according to an embodiment of the present utility model. Detailed Implementation

[0037] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0038] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this utility model are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the utility model described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0039] Figure 1 This is a schematic diagram of a current testing device according to an embodiment of the present invention, with reference to... Figure 1 The current testing device provided in this embodiment includes: a testing unit 110, a data acquisition unit 120, at least two resistor units 130 with different resistance values, and at least two connection units 140; the testing unit 110 includes a test board 111 and an acquisition interface 112, multiple test interfaces 113, and multiple resistor interfaces 114 electrically connected to the test board 111; the acquisition interface 112 is electrically connected to the data acquisition unit 120, the test interface 113 is electrically connected to the first end of the connection unit 140, and the resistor interface 114 is pluggably electrically connected to the resistor unit 130; the second end of the connection unit 140 is used to electrically connect to the module under test; the data acquisition unit 120 is used to acquire the voltage across the resistor unit 130 electrically connected to the resistor interface 114.

[0040] Specifically, the module under test (DUT) can be a test module in an integrated circuit test system. The connection unit 140 can be a cable, used to electrically connect the DUT to the test unit 110. The number of connection units 140 can be determined based on the number of DUTs; for example, the number of connection units 140 can be equal to the number of DUTs.

[0041] The number of test interfaces 113 can be equal to the number of connection units 140. One test interface 113 can be electrically connected to only one connection unit 140. The test interface 113 is detachably electrically connected to the first end of the connection unit 140, which facilitates timely replacement of the connection unit 140 if it is damaged. The data acquisition unit 120 can also be detachably electrically connected to the acquisition interface 112. The data acquisition unit 120 includes a multi-channel voltage acquisition unit. When using the data acquisition unit 120, the function can be adjusted to DC voltage (DCV) for multi-channel voltage data acquisition. When multiple resistor units 130 are simultaneously electrically connected to the resistor interface 114, the multi-channel voltage acquisition unit can simultaneously acquire the voltage across the resistor units 130, thereby enabling simultaneous testing of the current of multiple modules under test.

[0042] The resistor unit 130 can be a custom resistor. The resistor unit 130 is compatible with the resistor interface 114 and can be plugged into and electrically connected to the resistor interface 114. Therefore, when performing current testing on the module under test, the appropriate resistor unit 130 can be replaced according to the current range that the module under test can withstand.

[0043] The test board 111 contains multiple wires. Each resistor interface 114 has a corresponding test interface 113. Each resistor interface 114 is electrically connected to its corresponding test interface 113 via wires within the test board 111. Each resistor interface 114 is also electrically connected to the acquisition interface 112 via wires within the test board 111. When the first end of the connection unit 140 is electrically connected to the test interface 113, and the second end of the connection unit 140 is electrically connected to the module under test, the current in the module under test flows through the connection unit 140, the test interface 113, the wires within the test board 111, and the resistor interface 114 into the resistor unit 130. After passing through the resistor unit 130, the current returns to the module under test. During this process, the data acquisition unit 120 acquires the voltage across the resistor unit 130. The current of the module under test can be determined by the voltage acquired by the data acquisition unit 120 and the resistance value of the resistor unit 130. After the current of the module under test is measured, the determined current can be compared with the accuracy specifications of the module under test to determine whether the module under test can work properly. If it cannot work properly, the module under test can be calibrated.

[0044] This embodiment includes at least two resistor units 130 with different resistance values, so that before testing the current of the module under test, a suitable resistor unit 130 can be selected according to the current magnitude that the module under test is adapted to and installed on the test board 111 for testing.

[0045] In this embodiment, multiple connection units 140 can be electrically connected to multiple modules under test, and multiple resistor units 130 are set in the resistor interface 114 on the test board 111, so that the current of multiple modules under test can be tested simultaneously.

[0046] It should be noted that, Figure 1 The resistor unit 130 is plugged into the resistor interface 114 and is electrically connected to the resistor interface 114.

[0047] This embodiment provides a current testing device, which includes a testing unit, a data acquisition unit, at least two resistor units with different resistance values, and at least two connection units. The testing unit includes a test board, an acquisition interface electrically connected to the test board, multiple test interfaces, and multiple resistor interfaces. The first end of each connection unit is electrically connected to a test interface, and the second end is used to electrically connect to the module under test (DUT). The resistor interfaces are pluggable and pluggable to the resistor units, allowing the resistor units to be replaced according to actual needs. The data acquisition unit can acquire the voltage across the resistor units electrically connected to the resistor interfaces, and can determine the current of the DUT based on the voltage acquired by the data acquisition unit and the resistance value of the resistor units. This embodiment uses multiple resistor units and multiple connection units, enabling simultaneous current testing of multiple DUT modules, improving testing efficiency and the utilization rate of the current testing device, and ensuring the consistency and accuracy of test data. The inclusion of at least two resistor units with different resistance values ​​in the current testing device allows for simultaneous current testing of different DUT modules, improving the compatibility of the current testing device. In this embodiment, the data acquisition unit is used to acquire voltage, thus eliminating the need to install numerous ammeters to test the current of the module under test. A single data acquisition unit can simultaneously complete the current testing of multiple modules under test. In summary, the current testing device provided in this embodiment can improve the efficiency, accuracy, and reliability of current testing.

[0048] Optional, Figure 2 This is a schematic diagram of a resistor unit according to an embodiment of the present invention, with reference to... Figure 1 and Figure 2 The resistor unit 130 includes a current positive terminal 131, a current negative terminal 132, a voltage feedback positive terminal 133, and a voltage feedback negative terminal 134. Each resistor interface 114 includes a first current terminal, a second current terminal, a first voltage terminal, and a second voltage terminal. The first current terminal and the second current terminal are both electrically connected to the test interface 113 through the test board 111, and the first voltage terminal and the second voltage terminal are both electrically connected to the acquisition interface 112 through the test board 111. When the resistor interface 114 is electrically connected to the resistor unit 130, the current positive terminal 131 is electrically connected to the first current terminal, the current negative terminal 132 is electrically connected to the second current terminal, the voltage feedback positive terminal 133 is electrically connected to the first voltage terminal, and the voltage feedback negative terminal 134 is electrically connected to the second voltage terminal.

[0049] Specifically, the first current terminal and the second current terminal of each resistor interface 114 are electrically connected to the corresponding test interface 113 through the test board 111, and the first voltage terminal and the second voltage terminal of each resistor interface 114 are electrically connected to the acquisition interface 112 through the test board 111.

[0050] In this embodiment, the resistor unit 130 can be electrically connected to the resistor interface 114 using a four-wire connection. The four-wire connection can reduce the current test error of the module under test and further improve the accuracy of the current test.

[0051] Optionally, the connection unit includes a cable; the cable includes an insulation layer, a shielding layer, and a signal transmission line.

[0052] Specifically, a shielding layer can wrap around a signal transmission line, and an insulation layer can wrap around a shielding layer. The main function of the shielding layer in a cable is to reduce the influence of external electromagnetic fields on the line and prevent the line from radiating electromagnetic energy. The shielding layer is usually composed of a metal mesh braid, typically made of red copper or tin-plated copper, and needs to be grounded. External interference signals can be guided to the ground through the shielding layer, thereby reducing their impact on the line. Furthermore, the shielding layer can prevent the line from radiating electromagnetic energy, further protecting the stability of the circuit. Adding a shielding layer to a cable can significantly improve the quality and efficiency of signal transmission.

[0053] Optionally, the current testing unit provided in this embodiment further includes a storage unit; the storage unit is electrically connected to the data acquisition unit, and the storage unit is used to store the voltage across the resistor unit that is electrically connected to the resistor interface, which is acquired by the data acquisition unit.

[0054] Specifically, an additional storage unit is set up to store the voltage collected by the data acquisition unit, which reduces the storage space required for the data acquisition unit itself. This storage unit allows for convenient viewing and calculation of the test current of the module under test from the host computer.

[0055] Optionally, the data acquisition unit is also used to store the voltage across the acquired resistor unit.

[0056] Specifically, the data acquisition unit includes a storage sub-unit. The voltage acquired by the data acquisition unit can be stored in the storage sub-unit within the data acquisition unit, which makes it convenient to view the voltage acquired by the data acquisition unit later.

[0057] Optionally, the resistance value of each resistor unit can range from 1mΩ to 1MΩ.

[0058] Specifically, the current testing device includes multiple resistor units, and the resistance values ​​of each resistor unit may be different. For example, the current testing device may include at least resistor units with resistance values ​​of 1mΩ, 1Ω, 1kΩ and 1MΩ.

[0059] In this embodiment, the resistance value of each resistor unit is set to a range of 1mΩ to 1MΩ, which allows for current testing of the module under test (DUT) within different current ranges. The current testing device provided in this embodiment can perform current testing on both high-current (0.1A to 50A) and low-current (100nA to 100mA) DUTs in integrated circuit testing systems. For example, inserting a 1mΩ resistor unit can test ampere-level high currents (10A, 20A, or 50A), while inserting a 1MΩ resistor unit can test μA-level currents (1μA, 5μA, or 10μA).

[0060] Optionally, the resistor unit is a non-inductive resistor.

[0061] Specifically, the resistor unit in this embodiment can be a 0.05-level high-precision non-inductive resistor.

[0062] The main advantages of non-inductive resistors include the following:

[0063] Low inductance: The inductance of a non-inductive resistor is very small, usually below a few microhenries. This makes it perform well in high-frequency circuits and avoids the effects of inductance on circuit performance, such as signal distortion, poor frequency response, and energy loss.

[0064] Excellent frequency response characteristics: Due to the low inductance of the non-inductive resistor, it exhibits excellent frequency response characteristics, making it suitable for AC and DC circuits as well as medium and high frequency circuits. This ensures stable performance across various frequencies, meeting the needs of different circuits.

[0065] Linear I-V characteristic: Non-inductive resistors exhibit linear I-V characteristics, stable electrical performance, high voltage resistance, and good insulation properties. This allows them to maintain stable performance in various circuits and is not easily affected by voltage and current variations.

[0066] High overload capacity: Non-inductive resistors are particularly suitable for circuits with intermittent power supply and pulsed high current. They can maintain stable operation under overload conditions and are not easily damaged.

[0067] Excellent temperature characteristics: Non-inductive resistors have excellent temperature characteristics, a wide applicable temperature range, and can maintain stable performance under different ambient temperatures.

[0068] High mechanical strength: Non-inductive resistors have high mechanical strength and can withstand cold and thermal shocks, making them suitable for various working environments.

[0069] In summary, this embodiment sets the resistor unit to a non-inductive resistor, which can further improve the accuracy of current testing.

[0070] Optional, continue to refer to Figure 1The acquisition interface 112 is located on the first side of the test board 111; each test interface 113 is located on the second side of the test board 111, wherein the first side and the second side are arranged opposite to each other; multiple resistor interfaces 114 are all located on the first surface of the test board 111 and are arranged in an array.

[0071] Specifically, the acquisition interface 112 and each test interface 113 are respectively located on the first and second sides of the test board 111. This facilitates the electrical connection between the acquisition interface 112 and the data acquisition unit 120, and also facilitates the electrical connection between the test interface 113 and the connection unit 140. It also saves space on the first surface of the test board 111, allowing more resistor interfaces 114 to be installed on the first surface. The first surface of the test board 111 is adjacent to both the first and second sides.

[0072] Optional, continue to refer to Figure 1 All test interfaces 113 are identical; the ports at the first end of each connection unit 140 are identical; and the second end of each connection unit 140 is adapted to the interface of the module under test to which it is electrically connected.

[0073] Specifically, "all test interfaces 113 are identical" means that all test interfaces 113 have the same model, size, and function. "All ports at the first end of all connection units 140 are identical" means that the ports at the first end of all connection units 140 have the same model, size, and function. By setting all test interfaces 113 and all ports at the first end of connection units 140 to be identical, when performing current testing on the module under test, the first end of any connection unit 140 can be electrically connected to any test interface 113 without needing to distinguish the type of test interface 113 connected to the connection unit 140, saving current testing time and improving current testing efficiency. The second end of the connection unit 140 can include multiple interfaces of different specifications, thus allowing one connection unit 140 to adapt to different modules under test.

[0074] Figure 3 This is a schematic diagram of a testing system according to an embodiment of the present invention, with reference to... Figure 3 The testing system provided in this embodiment includes the current testing device 100 and the integrated circuit testing system 200 provided in any embodiment of this utility model; the integrated circuit testing system 200 includes a plurality of modules under test 210.

[0075] Specifically, the current testing device 100 is used to test the current of each module under test 210.

[0076] The testing system provided in this embodiment has the beneficial effects of any of the current testing devices described in the embodiments of this utility model, which will not be repeated here.

[0077] It should be understood that the various forms of the process shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this utility model can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this utility model can be achieved, and this is not limited herein.

[0078] The specific embodiments described above do not constitute a limitation on the scope of protection of this utility model. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this utility model should be included within the scope of protection of this utility model.

Claims

1. A current testing device, characterized in that, include: The test unit, the data acquisition unit, at least two resistor units with different resistance values, and at least two connection units; The test unit includes a test board, a data acquisition interface, multiple test interfaces, and multiple resistance interfaces electrically connected to the test board. The acquisition interface is electrically connected to the data acquisition unit, the test interface is electrically connected to the first end of the connection unit, and the resistor interface is pluggably electrically connected to the resistor unit. The second end of the connection unit is used for electrical connection with the module under test; The data acquisition unit is used to acquire the voltage across the resistor unit that is electrically connected to the resistor interface.

2. The current testing device according to claim 1, characterized in that, The resistor unit includes a current positive terminal, a current negative terminal, a voltage feedback positive terminal, and a voltage feedback negative terminal; Each of the resistor interfaces includes a first current terminal, a second current terminal, a first voltage terminal, and a second voltage terminal; Both the first current terminal and the second current terminal are electrically connected to the test interface through the test board, and both the first voltage terminal and the second voltage terminal are electrically connected to the acquisition interface through the test board. When the resistor interface is electrically connected to the resistor unit, the positive current terminal is electrically connected to the first current terminal, the negative current terminal is electrically connected to the second current terminal, the positive voltage feedback terminal is electrically connected to the first voltage terminal, and the negative voltage feedback terminal is electrically connected to the second voltage terminal.

3. The current testing device according to claim 1, characterized in that, The connection unit includes a cable; The cable includes an insulation layer, a shielding layer, and a signal transmission line.

4. The current testing device according to claim 1, characterized in that, It also includes storage units; The storage unit is electrically connected to the data acquisition unit, and the storage unit is used to store the voltage across the resistor unit that is electrically connected to the resistor interface, which is acquired by the data acquisition unit.

5. The current testing device according to claim 1, characterized in that, The data acquisition unit is also used to store the voltage across the acquired resistor unit.

6. The current testing device according to claim 1, characterized in that, The resistance value of each resistor unit ranges from 1mΩ to 1MΩ.

7. The current testing device according to claim 1, characterized in that, The resistor unit is a non-inductive resistor.

8. The current testing device according to claim 1, characterized in that, The acquisition interface is located on the first side of the test board; Each of the test interfaces is located on the second side of the test board, wherein the first side and the second side are arranged opposite to each other; Multiple resistor interfaces are located on the first surface of the test board and are arranged in an array.

9. The current testing device according to claim 1, characterized in that, All the test interfaces described are the same; The ports at the first end of each of the aforementioned connection units are identical; The second end of the connection unit is adapted to the interface of the module under test to which it is electrically connected.

10. A testing system, characterized in that, Includes the current testing device and integrated circuit testing system as described in any one of claims 1-9; The integrated circuit testing system includes multiple modules under test.

Images