Mechanical arm for chip testing

Abstract

The utility model discloses a mechanical arm for chip testing, which comprises a bottom plate, a stand column and a guide rail connecting plate, the guide rail connecting plate is rotatably connected with a first section arm, the first section arm is rotatably connected with a second section arm, the second section arm is rotatably connected with a third section arm, the third section arm is rotatably connected with an index plate, and the index plate is connected with a testing head fixing arm. The two side arms of the testing head fixing arm are each rotationally connected with a testing head fixing plate, the two side walls of each testing head fixing arm are each provided with a first adjusting hole, and a first locking handle is inserted into each first adjusting hole. The mechanical arm has the beneficial effects that the mechanical arm can realize height, front-back, left-right and any angle adjustment of the test head of the chip tester in a specific range, is convenient for the test head to test chips at different positions and angles, is wider in application range, and can meet the manual test requirements of the chips; the mechanical arm is low in manufacturing cost and beneficial to use and development of small and medium-sized enterprises.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically to a robotic arm for chip testing. Background Technology

[0002] With the rapid development of technology, the chip industry is growing at an increasingly rapid pace. Miniaturization and multifunctionality of chips are the development trends of the modern chip industry. Testing during chip manufacturing is a crucial part of the entire chip processing process. Chip testing requires testing equipment. During testing, the chip must be placed between the chip testing head and the testing platform of the equipment. A robotic arm drives the testing head to move and test the chip. Existing robotic arms are mostly intelligent robotic arms, which are expensive and not conducive to the development of small and medium-sized enterprises. Some manual testing arms also exist, but their simple structure only allows horizontal or vertical movement within a limited space, and they cannot perform chip testing at specific angles. For example, a manually adjustable robotic arm for chip testing disclosed in patent publication number CN115194818A discloses that the test head can be moved horizontally by manually adjusting the rotation of three segmented arms. Although it can drive the test head to rotate at a certain angle, it cannot perform chip testing at certain special angles, such as left-right or forward-backward tilting angles. Therefore, research on robotic arms for chip testing heads remains a key research focus in chip testing. Utility Model Content

[0003] The purpose of this invention is to provide a robotic arm for chip testing to solve the problems mentioned in the background art.

[0004] To achieve the above objectives, this utility model provides the following technical solution: a robotic arm for chip testing, comprising a base plate, a column on the base plate, a guide rail connecting plate connected to the column, a first arm section rotatably connected to the guide rail connecting plate, a second arm section rotatably connected to the first arm section, a third arm section rotatably connected to the second arm section, an indexing plate rotatably connected to the third arm section, a test head fixing arm connected to the indexing plate, the test head fixing arm being U-shaped, with a test head fixing plate rotatably connected to the ends of its two side arms furthest from the third arm section, a first adjustment hole being provided on each of the two side walls of the test head fixing arm, the first adjustment hole being semi-circular, a first locking handle being inserted into each of the two first adjustment holes, and the two first locking handles being screwed to the two test head fixing plates respectively.

[0005] In a further preferred embodiment, a rotating shaft is inserted into the third arm, the rotating shaft is inserted into the center of the indexing plate and fixedly connected to the indexing plate, and a second locking handle is provided on the third arm for locking the rotating shaft. The rotating shaft is used for the rotation of the indexing plate, and when the second locking handle is rotated, the rotating shaft can be fixed, ultimately fixing the indexing plate.

[0006] Further preferably, the third arm is equipped with a positioning component for positioning and fixing the indexing plate, thereby positioning and fixing the connected test head. The positioning component includes a fixing block and a positioning pin. The fixing block is fixed to the third arm, and the positioning pin is rotatably mounted on the fixing block. The indexing plate has multiple positioning holes arranged in a circle, and the positioning pin is configured to cooperate with the positioning holes. By rotating the positioning pin, it is inserted into the positioning hole on the indexing plate, thereby fixing the indexing plate and ultimately fixing the test head fixing arm and the connected test head.

[0007] Further preferably, a connecting shaft is connected between the guide rail connecting plate and the first arm segment, the first arm segment and the second arm segment, and the second arm segment and the third arm segment. A first locking element is provided at the end of the first arm segment near the second arm segment and at the end of the second arm segment near the third arm segment. The guide rail connecting plate is provided with a connecting seat that connects to the connecting shaft. The connecting shaft is used for the relative connection and rotation of the first arm segment, the second arm segment, and the third arm segment. The first locking element can lock the connecting shaft, fixing the second arm segment and the third arm segment in place.

[0008] Further preferably, the first locking component includes a first locking block and a third locking handle. The first locking block is sleeved on the end of the corresponding connecting shaft, and the third locking handle is screwed onto the first locking block. The first locking component is used to fix the connecting shaft. By rotating the third locking handle, the through hole of the connecting shaft on the first locking block can be squeezed, deformed, and reoriented, thereby locking the connecting shaft with the first locking block and fixing the connecting shaft in place, thus achieving the positioning of the second and third arm segments after rotation.

[0009] Further preferably, there are two connecting seats, each located at one end of a corresponding connecting shaft. One of the connecting seats has a joint adjustment and positioning disc on the side corresponding to the first arm segment. The joint adjustment and positioning disc has a semi-circular second adjustment hole, into which a fourth locking handle is inserted. The fourth locking handle is screwed to the first arm segment. The joint adjustment and positioning disc is used for positioning the first arm segment after rotation. After rotating the first arm segment, rotating the fourth locking handle locks the joint adjustment and positioning disc, the first arm segment, and the fourth locking handle together, thereby locking the joint adjustment and positioning disc relative to the first arm segment and achieving the positioning of the first arm segment after rotation.

[0010] In a further preferred embodiment, the column is equipped with two vertically arranged body guide rods, and a slider connects the guide rail connecting plate to the body guide rods. The column also has two vertically driven rubber chains, which are connected to the guide rail connecting plate and a drive motor. The body guide rods are used for connecting and adjusting the height of the guide rail connecting plate, and the drive motor drives the rubber chains to move up and down, thus raising and lowering the guide rail connecting plate along the body guide rods, thereby achieving height adjustment of the guide rail connecting plate.

[0011] Preferably, the slider is connected to a second locking member, which includes a second locking block fixed to the slider. The second locking block is sleeved on the machine body guide rod, and a fifth locking handle is screwed onto the second locking block. The second locking member is used to fix the slider relative to the machine body guide rod. By rotating the fifth locking handle, the diameter of the hole in the machine body guide rod on the second locking block can be deformed, thereby locking the machine body guide rod and fixing the second locking block to the machine body guide rod, thus fixing the slider and guide rail connecting plate relative to the machine body guide rod.

[0012] Further preferably, the test head fixing plate is provided with several positioning rods for the installation and positioning of the test head of the chip tester.

[0013] Further preferably, the side of the column is provided with a connecting rod arranged vertically. The connecting rod is a smooth rod, on which a monitor stand and a keyboard stand are rotatably connected. The monitor stand and keyboard stand are used for mounting a computer monitor and a computer keyboard, respectively. The monitor stand and keyboard stand can be adjusted vertically along the connecting rod and rotated circumferentially along the connecting rod to realize the height and position adjustment of the monitor and computer keyboard, which is convenient for operation. The base plate is provided with a chassis base for mounting a computer chassis. The bottom of the base plate is provided with casters and feet. The casters facilitate the movement of the robotic arm, and the feet are used to fix the position of the robotic arm after movement.

[0014] Beneficial effects: The robotic arm for chip testing of this utility model achieves position adjustment of the indexing plate through the relative rotation of the first, second, and third arm segments. Furthermore, the rotation of the indexing plate to a set angle can be adjusted via a rotating shaft and a positioning component (i.e., a second locking handle), thereby adjusting the rotation angle of the connected test head fixing arm and ultimately allowing for left and right rotation adjustment of the connected test head to meet the needs of chip testing at different angles. The design of the test head fixing plate, the first adjustment hole, and the first locking handle enables the connected test head to rotate forward and backward, achieving chip testing at different forward and backward testing angles. The rotating shaft and test head fixing plate further enhance this functionality. The design, featuring a guide rod, rubber chain, and drive motor, facilitates height adjustment of the test head connected to the robotic arm. This robotic arm enables height, forward / backward, left / right, and arbitrary angle adjustment of the chip tester's test head within a specific range, including left / right and forward / backward rotation. This allows for testing chips at different positions and angles, broadening its applicability and meeting manual chip testing needs. The ingenious structural design of this manual robotic arm makes it simple and convenient to operate, capable of testing a small number of chips at a low cost. Furthermore, the low manufacturing cost of this robotic arm makes it beneficial for the use and development of small and medium-sized enterprises. Attached Figure Description

[0015] Figure 1 This is an isometric structural diagram of the robotic arm for chip testing disclosed in the embodiments of this utility model;

[0016] Figure 2 This is a front view schematic diagram of the robotic arm for chip testing disclosed in an embodiment of the present utility model;

[0017] Figure 3 This is a schematic diagram showing the interconnection of the first segment arm, the second segment arm, the third segment arm, and the test head fixing arm as disclosed in the embodiment of this utility model.

[0018] Figure 4 This is a schematic diagram of the mating structure between the first arm and the connecting seat as disclosed in the embodiment of this utility model;

[0019] Figure 5 This is a schematic diagram of the cooperation structure between the second arm, the third arm, and the test head fixing arm as disclosed in the embodiment of this utility model.

[0020] Figure 6 This is a schematic diagram of the structure of the first locking member disclosed in the embodiment of this utility model.

[0021] Reference numerals: 1-Base plate, 2-Column, 3-Guide rail connecting plate, 4-First arm section, 5-Second arm section, 6-Third arm section, 7-Indexing plate, 701-Positioning hole, 8-Test head fixing arm, 801-First adjustment hole, 9-Test head fixing plate, 901-Positioning rod, 10-First locking handle, 11-Rotating shaft, 12-Positioning assembly, 1201-Fixing block, 1202-Positioning pin, 13-Second locking handle, 14-Connecting shaft, 15-First locking Components: 1501-First locking block, 1502-Third locking handle, 16-Connecting seat, 17-Joint adjustment positioning plate, 1701-Second adjustment hole, 18-Fourth locking handle, 19-Body guide rod, 20-Slider, 21-Rubber chain, 22-Second locking component, 2201-Second locking block, 2202-Fifth locking handle, 23-Connecting rod, 24-Monitor base, 25-Keyboard base, 26-Chassis base, 27-Universal caster, 28-Foot. Detailed Implementation

[0022] The following are specific embodiments of the present invention, which are described in conjunction with the accompanying drawings. However, the present invention is not limited to these embodiments.

[0023] like Figure 1-6As shown, a robotic arm for chip testing is used to connect to the test head of a chip tester, drive the test head to move, and realize manual operation of the test head to test the chip. The robotic arm includes a base plate 1, a column 2 on the base plate 1, a guide rail connecting plate 3 connected to the column 2, and a first arm segment 4, a second arm segment 5, and a third arm segment 6 rotatably connected to the guide rail connecting plate 3. The third arm segment 6 is rotatably connected to an indexing plate 7. The base plate 1 and column 2 support the guide rail connecting plate 3, the first arm 4, the second arm 5, and the third arm 6. The lifting and lowering of the guide rail connecting plate 3 drives the lifting and lowering of the first arm 4, the second arm 5, and the third arm 6, achieving height adjustment. The first arm 4, the second arm 5, and the third arm 6 are rotatably connected to each other, facilitating adjustment of the position of the indexing plate 7 connected to the third arm 6 on the corresponding horizontal plane. This allows the plate to move forward and backward, left and right, or rotate within the corresponding horizontal plane, enabling the test head of the chip tester connected to the indexing plate 7 to be moved to any position, ensuring accurate chip testing within the corresponding range and guaranteeing chip yield. Furthermore, the indexing plate 7 can rotate left and right, allowing the test head to be rotated to any angle to meet the requirements of different chip testing angles. The indexing plate 7 is connected to a test head fixing arm 8, which is U-shaped. Each of its two side arms, at the end furthest from the third arm 6, is rotatably connected to a test head fixing plate 9. Each of the two side walls of the test head fixing arm 8 has a first adjustment hole 801, which is semi-circular. A first locking handle 10 is inserted into each of the two first adjustment holes 801, and the two first locking handles 10 are screwed to the two test head fixing plates 9 respectively. The test head fixing arm 8 is used for mounting the test head fixing plate 9. The U-shaped design of the test head fixing arm 8 facilitates the installation of the test head between the two side arms. The first adjustment holes 801 on the test head fixing arm 9 are used for adjusting the forward and backward rotation of the test head fixing plate 9, and the first locking handles 10 secure the rotated test head fixing plate 9, thus completing the forward and backward rotation adjustment of the test head to meet the requirements of different chip testing angles. Furthermore, since the rotation axis of the test head fixing plate 9 is at a certain angle to the rotation axis of the indexing plate 7, the test head can rotate left and right and back and forth within a certain range. This means it has a wide range of rotation, can meet a wider range of test angles, and is more widely applicable. At the same time, it is convenient, simple, and flexible to operate.

[0024] In one embodiment of this application, a rotating shaft 11 is inserted into the third arm 6, and the rotating shaft 11 is inserted into the center of the indexing plate 7 and fixedly connected to the indexing plate 7. A second locking handle 13 is provided on the third arm 6 for locking the rotating shaft 11. That is, the rotating shaft 11 enables the indexing plate 7 to rotate left and right, and the second locking handle 13 can fix the rotating shaft 11 to prevent the rotating shaft 11 from rotating due to gravity or other factors. This allows the indexing plate 7 to be fixed after being rotated to a certain angle, thereby fixing the test head of the chip tester after it has been rotated to a certain angle, so that the test head is at a specific angle to meet the requirements of a specific test angle.

[0025] In another embodiment of this application, a positioning component 12 is provided on the third arm 6 for fixing the indexing plate after rotation. The positioning component 12 includes a fixing block 1201 and a positioning pin 1202. The fixing block 1201 is fixed to the third arm 6, and the positioning pin 1202 is rotatably mounted on the fixing block 1201. The indexing plate 7 has multiple positioning holes 701 arranged in a circular pattern, and the positioning pin 1202 is configured to cooperate with the positioning holes 701. By rotating the positioning pin 1202, the positioning pin 1202 can be inserted into the positioning hole 701, fixing the indexing plate 7 and preventing it from rotating. Since the positioning holes 701 are fixed on the indexing plate 7, positioning can only be performed on the indexing plate 7 when it rotates at a specific angle. In this embodiment, the positioning holes 701 are evenly arranged along the circumferential direction. The number of positioning holes 701 can be 4, 6, 8, or other quantities to meet the requirement of the indexing plate 7 rotating at a specific angle, thereby enabling the connected test head to test the chip at a specific angle.

[0026] In the next embodiment of this application, a connecting shaft 14 is connected between the guide rail connecting plate 3 and the first segment arm 4, the first segment arm 4 and the second segment arm 5, and the second segment arm 5 and the third segment arm 6. A first locking element 15 is provided at the end of the first segment arm 4 near the second segment arm 5 and at the end of the second segment arm 5 near the third segment arm 6. The guide rail connecting plate 3 is provided with a connecting seat 16 connected to the connecting shaft 14. The connecting shaft 14 facilitates the connection and relative rotation between the guide rail connecting plate 3 and the first segment arm 4, the first segment arm 4 and the second segment arm 5, and the second segment arm 5 and the third segment arm 6. The first locking element 15 is used to fix the connecting shaft 14, preventing it from continuing to rotate, thus achieving the positioning and fixing of the rotated second segment arm 5 and third segment arm 6. This, in turn, achieves the fixing of the connected indexing plate 7 and the test head after position adjustment, satisfying the position adjustment of the test head within a certain horizontal range. The connecting seat 16 facilitates the connection between the first segment arm 4 and the guide rail connecting plate 3.

[0027] Based on the above scheme, the first locking member 15 includes a first locking block 1501 and a third locking handle 1502. The first locking block 1501 is sleeved on the end of the corresponding connecting shaft 14, and the third locking handle 1502 is screwed onto the first locking block 1501. The first locking block 1501 has a hole for the connecting shaft 14 to pass through. The third locking handle 1502 is screwed onto the first locking block 1501. By rotating the first locking block 1501, the diameter of the hole on the first locking block 1501 can be deformed and reduced, thus locking the connecting shaft 14 and fixing it to prevent rotation, thereby achieving the locking function.

[0028] Based on the above scheme, there are two connecting seats 16, located at the upper and lower ends of the corresponding connecting shafts 14. One of the two connecting seats 16 has a joint adjustment positioning plate 17 on the side corresponding to the first segment arm 4. The joint adjustment positioning plate 17 has a semi-circular arc-shaped second adjustment hole 1701. A fourth locking handle 18 is inserted into the second adjustment hole 1701 and is screwed to the first segment arm 4. The joint adjustment positioning plate 17 and its second adjustment hole 1701 are used for the rotational positioning of the first segment arm 4. By rotating the fourth locking handle 18, the fourth locking handle 18, the joint adjustment positioning plate 17, and the first segment arm 4 abut against each other and are tightly pressed together, thereby fixing the first segment arm 4 relative to the joint adjustment positioning plate 17, that is, locking and fixing the first segment arm 4. The second adjustment hole 1701 is semi-circular arc-shaped to ensure that the fourth locking handle 18 can move within the second adjustment hole 1701 as the first segment arm 4 rotates.

[0029] In the next embodiment of this application, the column 2 is provided with two vertically arranged body guide rods 19. A slider 20 connects the guide rail connecting plate 3 to the body guide rods 19. The column 2 is provided with two vertically driven rubber chains 21, which are connected to the guide rail connecting plate 3 and a drive motor. The height of the guide rail connecting plate 3 can be easily adjusted via the body guide rods 19. The slider 20 moves up and down along the body guide rods 19 to adjust the height of the guide rail connecting plate 3, ultimately achieving height adjustment of the first arm 4, the second arm 5, the third arm 6, the test head fixing arm 8, and the connected test head. The drive motor drives the rubber chains 21 to rotate up and down, thereby pulling the guide rail connecting plate 3 up and down along the body guide rods 19.

[0030] Based on the above scheme, the slider 20 is connected to a second locking member 22. The second locking member 22 includes a second locking block 2201 fixed to the slider 20. The second locking block 2201 is sleeved on the body guide rod 19, and a fifth locking handle 2202 is screwed onto the second locking block 2201. In this scheme, the second locking member 22 has the same structure as the first locking member 15, both used for locking. By rotating the fifth locking handle 2202, the hole on the second locking block 2201 through which the body guide rod 19 passes can be squeezed and deformed, so that the hole wall on the second locking block 2201 presses against the body guide rod 19, fixing the second locking block 2201 to the body guide rod 19, thereby fixing the guide rail connecting plate 3, and realizing the positioning and fixation of the guide rail connecting plate 3 after height adjustment.

[0031] In the solution of this application, the test head fixing plate 9 is provided with a plurality of positioning rods 901 for the installation and positioning of the test head of the chip tester.

[0032] In this application, the side of the column 2 is provided with a vertically arranged connecting rod 23. The connecting rod 23 is a smooth rod, on which a monitor stand 24 and a keyboard stand 25 are rotatably connected. A chassis base 26 is provided on the base plate 1, and casters 27 and feet 28 are provided below the base plate 1. The connecting rod 23 facilitates the installation of the monitor stand 24 and the keyboard stand 25, and both the monitor stand 24 and the keyboard stand 25 can be raised and lowered along the connecting rod 23 and rotated around the connecting rod 23 to adjust their height and position. The chassis base 26 is used to place the computer chassis, the monitor stand 24 is used to install the computer monitor, and the keyboard stand 25 is used to place the computer keyboard. By configuring the computer, data input and test parameter settings can be realized. The casters 27 are used to move the base plate 1, allowing the test head connected to the test arm to be moved to the corresponding position. By adjusting the height of the feet 28, the casters 27 can touch the ground or provide support to the base plate 1, thus fixing the position of the test arm after adjustment.

[0033] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the scope of protection of this utility model.

Claims

1. A robotic arm for chip testing, comprising a base plate (1), a column (2) on the base plate (1), a guide rail connecting plate (3) connected to the column (2), a first arm segment (4) rotatably connected to the guide rail connecting plate (3), a second arm segment (5) rotatably connected to the first arm segment (4), a third arm segment (6) rotatably connected to the second arm segment (5), and an indexing plate (7) rotatably connected to the third arm segment (6), characterized in that: The indexing plate (7) is connected to a test head fixing arm (8). The test head fixing arm (8) is U-shaped. A test head fixing plate (9) is rotatably connected to the ends of the two side arms away from the third arm (6). A first adjustment hole (801) is provided on each of the two side walls of the test head fixing arm (8). The first adjustment hole (801) is semi-circular. A first locking handle (10) is inserted into each of the two first adjustment holes (801). The two first locking handles (10) are screwed to the two test head fixing plates (9) respectively.

2. The robotic arm for chip testing according to claim 1, characterized in that: The third arm (6) is provided with a rotating shaft (11) inserted inside. The rotating shaft (11) is inserted into the center of the indexing plate (7) and is fixedly connected to the indexing plate (7). The third arm (6) is provided with a second locking handle (13) for locking the rotating shaft (11).

3. The robotic arm for chip testing according to claim 1, characterized in that: The third arm (6) is provided with a positioning component (12), which includes a fixing block (1201) and a positioning pin (1202). The fixing block (1201) is fixed on the third arm (6), and the positioning pin (1202) is rotatably mounted on the fixing block (1201). The indexing plate (7) is provided with a plurality of positioning holes (701) arranged in a circle, and the positioning pin (1202) is configured to cooperate with the positioning holes (701).

4. The robotic arm for chip testing according to claim 1, characterized in that: A connecting shaft (14) is connected between the guide rail connecting plate (3) and the first segment arm (4), the first segment arm (4) and the second segment arm (5), and the second segment arm (5) and the third segment arm (6). A first locking member (15) is provided at the end of the first segment arm (4) near the second segment arm (5) and the end of the second segment arm (5) near the third segment arm (6). A connecting seat (16) connected to the connecting shaft (14) is provided on the guide rail connecting plate (3).

5. The robotic arm for chip testing according to claim 4, characterized in that: The first locking member (15) includes a first locking block (1501) and a third locking handle (1502). The first locking block (1501) is sleeved on the end of the corresponding connecting shaft (14), and the third locking handle (1502) is screwed onto the first locking block (1501).

6. The robotic arm for chip testing according to claim 4, characterized in that: The connecting seats (16) are two in number and are located at both ends of the corresponding connecting shafts (14). One of the two connecting seats (16) has a joint adjustment positioning plate (17) on the side of the first arm (4). The joint adjustment positioning plate (17) has a semi-circular second adjustment hole (1701). A fourth locking handle (18) is inserted into the second adjustment hole (1701). The fourth locking handle (18) is screwed to the first arm (4).

7. The robotic arm for chip testing according to claim 1, characterized in that: The column (2) is provided with two vertically arranged body guide rods (19). A slider (20) is connected between the guide rail connecting plate (3) and the body guide rods (19). The column (2) is provided with two vertically driven rubber chains (21). The two rubber chains (21) are connected to the guide rail connecting plate (3). The two rubber chains (21) are connected to a drive motor.

8. The robotic arm for chip testing according to claim 7, characterized in that: The slider (20) is connected to a second locking member (22), which includes a second locking block (2201) fixed on the slider (20). The second locking block (2201) is sleeved on the body guide rod (19), and a fifth locking handle (2202) is screwed onto the second locking block (2201).

9. The robotic arm for chip testing according to claim 1, characterized in that: The test head fixing plate (9) is provided with several positioning rods (901).

10. A robotic arm for chip testing according to claim 1, characterized in that: The column (2) has a connecting rod (23) arranged vertically on its side. The connecting rod (23) is a bare rod, on which a monitor base (24) and a keyboard base (25) are rotatably connected. The base plate (1) has a chassis base (26), and the bottom of the base plate (1) has casters (27) and feet (28).

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