SMT element testing device

Abstract

The utility model provides an SMT element testing device. The SMT element testing device comprises a base, a supporting frame arranged on the base, a collision piece and a detector, wherein the collision piece and the detector are arranged on the supporting frame. The base is provided with a bearing position used for installing and fixing a to-be-tested component. The collision piece is located right above the bearing position at an interval, and the collision piece can freely fall relative to the supporting frame so as to collide a target element on the to-be-tested component. And the detector is positioned right above the collision piece at an interval. The detector is used for detecting a speed signal and a displacement signal of the collision piece in real time and can obtain the collision initial speed and the collision end speed of the collision piece according to the speed signal and the displacement signal. According to the method, the target element is collided through free falling of the colliding piece, energy lost by the colliding piece is obtained according to the energy conservation law, the measured collision initial speed V0, the collision ending speed V1 and the known weight m of the colliding piece, and the collision energy borne by the target element is obtained.

Description

Technical Field

[0001] This utility model relates to the field of testing equipment technology, and in particular to an SMT component testing device. Background Technology

[0002] The amount of impact force a product can withstand in actual use is an important indicator of its quality. For example, in the actual use of a display screen, there may be operations such as disassembling and assembling the display module in certain special usage scenarios. This can easily lead to the components of the display module being bumped and falling off, thus affecting the display effect of the screen.

[0003] Therefore, in current display manufacturing processes, thrust testers are often used to test the soldering strength of components. However, currently available collision testing instruments are mainly used for testing large-volume or large-surface raw materials (such as pendulum impact energy testers). These instruments can only sense and identify relatively large energies; that is, they are relatively macroscopic measuring instruments. For small components soldered onto PCBs (printed circuit boards), the energy generated during a collision is minimal and cannot be sensed or identified by the aforementioned collision testing instruments. Therefore, they cannot be applied to the collision energy testing of small components. Utility Model Content

[0004] The purpose of this invention is to provide an SMT component testing device that can perform impact energy testing on the solder strength of micro-components.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] According to one aspect of this application, an SMT component testing apparatus is provided, comprising:

[0007] The base has a support position for mounting and fixing the component to be tested.

[0008] A support frame is mounted on the base;

[0009] The collision element is arranged on the support frame and spaced apart directly above the bearing position. The collision element can fall freely relative to the support frame to collide with the target element on the part to be tested.

[0010] The detectors are mounted on the support frame and are spaced apart directly above the colliding element. The detectors are used to detect the velocity and displacement signals of the colliding element in real time, and to obtain the initial collision velocity and the final collision velocity of the colliding element based on the velocity and displacement signals.

[0011] In some embodiments, the SMT component testing apparatus further includes a controller, which is communicatively connected to the detector. The controller is used to receive velocity and displacement signals acquired by the detector, and to process and analyze the velocity and displacement signals to obtain the energy lost by the colliding component during the collision; and / or,

[0012] The SMT component testing device also includes a data acquisition unit, which is communicatively connected to the detector and is used to acquire the speed signal and displacement signal detected by the detector. The data acquisition unit is also communicatively connected to the controller to transmit the speed signal and displacement signal acquired by the data acquisition unit to the controller.

[0013] In some embodiments, the support frame includes a support member fixed to a base and a mounting member connected to one side of the support member. The mounting member is spaced apart above the bearing position and has through holes. The through holes are arranged collinearly with the detector and the target element located at the bearing position.

[0014] The collision component includes a collision rod and a collision block fixed to one end of the collision rod. The collision rod passes through the through hole and can fall freely relative to the mounting component, so that the end of the collision rod away from the collision block collides with the target element on the component to be tested.

[0015] The outer diameter of the collision block is larger than the inner diameter of the through hole, and the surface of the mounting component can support the collision block.

[0016] In some embodiments, the support member includes a support arm and a free arm. The support arm is erected on the base, and the free arm is movably disposed on the support arm. The mounting member is disposed on one side of the free arm. The free arm moves relative to the support arm along the extension direction of the support arm, so that the height position of the mounting member relative to the base is adjustable.

[0017] In some embodiments, the top opening of the support arm is formed with a receiving groove, and the free arm is at least partially received within the receiving groove;

[0018] The SMT component testing device includes a lifting assembly, which includes a rotating shaft, a driving wheel, and a driven wheel. The rotating shaft passes through the support arm and is rotatably connected to the support arm. The driving wheel is sleeved on the rotating shaft and fixedly connected to the rotating shaft, and the driving wheel is located in the receiving groove. The driven wheel is sleeved on the free arm and threadedly connected to the free arm. The axis of the driven wheel is perpendicular to that of the driving wheel, and the driven wheel is meshed with the driving wheel.

[0019] In some embodiments, the support frame includes a connector, and the mounting member is connected to the support member via the connector;

[0020] The connector includes a connecting rod and a telescopic rod. The connecting rod is fixedly connected to the support member, and the telescopic rod is movably connected to the connecting rod. The telescopic rod is used to connect the mounting member, and the telescopic rod can move relative to the connecting rod in a direction perpendicular to the extension direction of the support member, so that the mounting member is relatively closer to or farther away from the support member.

[0021] In some embodiments, a guide member is provided in the through hole, and a guide hole is provided on the guide member. The collision rod passes through the guide hole and is slidably connected to the guide member.

[0022] Multiple balls are arranged circumferentially on the inner peripheral wall of the guide member. Each ball is rotatably connected to the guide member. When the collision member moves relative to the guide member, each ball rolls relative to the collision rod.

[0023] In some embodiments, the SMT component testing apparatus further includes a buffer member disposed on top of the mounting member, wherein when the collision member moves relative to the mounting member, the end of the buffer member can elastically abut against the end face of the collision block.

[0024] In some embodiments, the number of collision elements is multiple, and each collision element may be alternatively arranged on the support frame;

[0025] The weights of the various collision components are different.

[0026] In some embodiments, the base includes a chassis and two fixing blocks spaced apart on the chassis, with the two fixing blocks spaced apart to form the bearing position, which is used to support the component to be tested.

[0027] At least one of the fixed blocks is movably connected to the chassis, and the two fixed blocks can move closer or further apart.

[0028] As can be seen from the above technical solution, this utility model has at least the following advantages and positive effects:

[0029] In this application, a collider is used to freely fall and collide with a target component fixed to a base on the test component. A detector located above the collider monitors the velocity and displacement signals of the collider during its descent in real time. This allows for the determination of the initial collision velocity V0 when the collider contacts the target component on the test component and the final collision velocity V1 when the target component is detached from the test component. During the free-fall collision, the collider decelerates, resulting in energy loss. According to the law of conservation of energy, this energy loss is the collision energy experienced by the target component on the test component. Therefore, based on the measurable velocity and known weight of the collider during the collision, and according to the law of conservation of energy, regardless of whether the target component is a micro-component or other type, the collision energy experienced by the target component can be calculated by examining the energy lost by the collider during the collision. This improves the versatility of the SMT component testing device.

[0030] Furthermore, since the detectors are spaced directly above the impactors, and the impactors are spaced directly above the target elements on the test component located at the bearing position, that is, the detectors, impactors, and target elements on the test component located at the bearing position are located on the same straight line extending vertically. This facilitates the detection of the velocity and displacement signals of the impactors during their falling motion and improves the accuracy of the detected velocity and displacement signals. At the same time, this ensures that the impactors can accurately collide with the target elements on the test component during their falling process and ensures that the end of the impactors can make almost complete contact with the top surface of the element on the test component, increasing the force-bearing area of ​​the target element on the test component, thereby ensuring the accuracy of the collision test. Attached Figure Description

[0031] Figure 1 This is a schematic diagram of the SMT component testing device in this embodiment.

[0032] The annotations in the attached figures are explained as follows:

[0033] 1. Base; 11. Chassis; 12. Fixing block; 2. Support frame; 21. Support component; 211. Support arm; 212. Free arm; 22. Connector; 221. Connecting rod; 222. Telescopic rod; 23. Mounting component; 24. Lifting assembly; 25. Translation assembly; 26. Buffer component; 27. Fixing component; 3. Collision component; 31. Collision rod; 32. Collision block; 4. Detector; 5. Controller; 6. Data acquisition unit; 100. Component to be tested; 110. Substrate; 120. Target element. Detailed Implementation

[0034] Typical embodiments embodying the features and advantages of this utility model will be described in detail in the following description. It should be understood that this utility model can have various variations in different embodiments, all of which do not depart from the scope of this utility model, and the descriptions and illustrations therein are for illustrative purposes only and not intended to limit this utility model.

[0035] In the description of this application, it should be understood that, in the embodiments shown in the accompanying drawings, the indications of direction or positional relationships (such as up, down, left, right, front, and back) are merely for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. These descriptions are appropriate when these elements are in the positions shown in the accompanying drawings. If the description of the positions of these elements changes, these directional indications also change accordingly.

[0036] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

[0037] This application provides an SMT component testing device for testing the soldering strength of components on the component to be tested.

[0038] The component to be tested includes a substrate and components fixed on the substrate. The component to be tested can be a display module, in which case the substrate is a PCB board, and the components can be LED beads, driver chips, or other arbitrary devices.

[0039] The following detailed description, in conjunction with the accompanying drawings, provides a specific embodiment of the SMT component testing apparatus of this application.

[0040] Figure 1 This is a schematic diagram of the SMT component testing device in this embodiment.

[0041] refer to Figure 1The SMT component testing device includes a base 1, a support frame 2, collision elements 3, and detectors 4. The base 1 has a support position for mounting and fixing the component 100 to be tested. The support frame 2 is mounted on the base 1. The collision elements 3 are arranged on the support frame 2, spaced apart directly above the support position. The collision elements 3 can fall freely relative to the support frame 2 to collide with the target component 120 on the component 100 to be tested. The detectors 4 are mounted on the support frame 2, spaced apart directly above the collision elements 3. The detectors 4 are used to detect the velocity and displacement signals of the collision elements 3 in real time, and to obtain the initial and final collision velocities of the collision elements 3 based on the velocity and displacement signals.

[0042] In this application, the free fall of the impactor 3 is used to collide with the target element 120 fixed on the test component 100 on the base 1. A detector located above the impactor 3 monitors the velocity and displacement signals of the impactor 3 during its fall in real time. This allows the determination of the initial collision velocity V0 of the impactor 3 when it contacts the target element 120 on the test component 100 and the final collision velocity V1 when the impact causes the target element 120 to detach from the test component 100. During the free fall of the impactor 3, the impactor 3 decelerates due to the collision, resulting in energy loss. According to the law of conservation of energy, the energy lost by the impactor 3 is the collision energy received by the target element 120 on the test component 100. Therefore, based on the premise that the speed of the collision component 3 is measurable and its weight is known during the collision process, according to the law of conservation of energy, regardless of whether the target component 120 is a micro component or other components, the collision energy received by the target component 120 can be obtained by calculating the energy lost by the collision component 3 during the collision process, thus improving the versatility of the SMT component testing device.

[0043] Furthermore, since the detector 4 is located directly above the impactor 3, and the impactor 3 is positioned directly above the target element 120 on the test component 100 located at the bearing position, that is, the detector 4, the impactor 3, and the target element 120 on the test component 100 located at the bearing position are on the same straight line extending vertically. This facilitates the detection of the velocity and displacement signals of the impactor 3 when it is falling, and can improve the accuracy of the detected velocity and displacement signals. At the same time, this allows the impactor 3 to accurately collide with the target element 120 on the test component 100 during the falling process, and ensures that the end of the impactor 3 can make almost complete contact with the top surface of the element on the test component 100, increasing the force-bearing area of ​​the target element 120 on the test component 100, thereby ensuring the accuracy of the collision test.

[0044] refer to Figure 1The base 1 includes a chassis 11 and two fixing blocks 12. The top of the chassis 11 extends horizontally. The two fixing blocks 12 are spaced apart on the chassis 11, and the gap between the two fixing blocks 12 forms a bearing position for mounting and fixing the component 100 to be tested. That is, the two fixing blocks 12 are used to clamp and fix the component 100 to be tested. The component 100 to be tested is placed on the bearing position with its substrate 110 and components distributed in a horizontal direction, and the component to be tested is located on the upper part of the substrate 110.

[0045] In this embodiment, at least one fixing block 12 is movably connected to the chassis 11, allowing the two fixing blocks 12 to move closer or further apart to adjust the spacing between them. This enables the device to accommodate test components 100 of different thicknesses, giving the SMT component testing apparatus high versatility. In this embodiment, both fixing blocks 12 are movably connected to the chassis 11.

[0046] For example, the chassis 11 is provided with a sliding groove, and the fixing block 12 is slidably engaged with the sliding groove. Optionally, the fixing block 12 is provided with a pin, which passes through the fixing block 12 and is vertically connected to the fixing block 12. When the fixing block 12 moves to adapt the bearing position to the thickness of the component 100 to be tested, the pin moves downward relative to the fixing block 12 and abuts against the chassis 11.

[0047] In other embodiments, the fixing block 12 is provided with an elastic element on one side of its moving direction. The elastic element is connected to the chassis 11, and the extension and contraction direction of the elastic element is consistent with the moving direction of the fixing block 12. The elastic element extends and contracts as the fixing block 12 moves, so that the elastic element accumulates elastic potential energy due to deformation, which can elastically support the fixing block 12, so that the fixing block 12 can press the test component 100 tightly and improve the stability of the test component 100. Alternatively, the fixing block 12 can be positioned in any other way, without limitation.

[0048] In this embodiment, the fixing block 12 includes a fixing part and a clamping part. The fixing part is movably connected to the chassis 11, and the clamping part is fixed to the end of the fixing part. The clamping parts of the two fixing blocks 12 are arranged adjacent to each other at intervals, and the two clamping parts are used to clamp the component 100 to be tested.

[0049] The support frame 2 is mounted on the base 1. The support frame 2 includes a support member 21, a connector 22, and a mounting member 23.

[0050] The support member 21 stands upright on the base 1 and is located outside the bearing position. In this embodiment, the support member 21 includes a support arm 211 and a free arm 212. The support arm 211 stands upright on the chassis 11, and the free arm 212 is movably disposed on the support arm 211. The free arm 212 moves relative to the support arm 211 along the extending direction of the support arm 211, thereby making the height of the support member 21 adjustable. Specifically, the top opening of the support arm 211 forms a receiving groove, and the free arm 212 is at least partially received in the receiving groove, and the free arm 212 can move up and down relative to the support arm 211.

[0051] For example, the SMT component testing device includes a lifting assembly 24, through which the free arm 212 is raised and lowered. Specifically, the lifting assembly 24 includes a rotating shaft, a driving wheel, and a driven wheel. The rotating shaft passes through and is rotatably connected to the support arm 211. The driving wheel is sleeved on the rotating shaft and fixedly connected to it, and is located within a receiving groove. The driven wheel is sleeved on the free arm 212 and threadedly connected to it. The driven wheel is perpendicular to the axis of the driving wheel, and the driven wheel is meshed with the driving wheel. The rotating shaft can be rotatably connected to the support arm 211 via a bearing. In practical applications, rotating the rotating shaft drives the driving wheel to rotate. Because the driven wheel is meshed with the driving wheel, it rotates with the driving wheel. Furthermore, under the action of the thread between the driven wheel and the free arm 212, the rotation of the driven wheel enables the free arm 212 to move up and down. Furthermore, since the driven wheel is meshed with the driving wheel and the driven wheel sleeve is threadedly connected to the free arm 212, the above design can also lock and fix the position of the free arm 212 when the shaft is not rotated, so as to prevent the free arm 212 from moving downward relative to the support arm 211 due to gravity during operation, thus affecting the test results.

[0052] In other embodiments, the free arm 212 can be directly slidably connected to the support arm 211. Alternatively, a bolt can be threaded through the support arm 211 and located outside the free arm 212. Rotating the bolt allows it to move relative to the support arm 211 to approach and press against the free arm 212, thus positioning the free arm 212. Conversely, moving the bolt away from the free arm 212 releases its pressure, unlocking the free arm 212. Of course, the lifting connection and positioning methods between the free arm 212 and the support arm 211 in this application are not limited to these; the specific configuration depends on the needs.

[0053] In this embodiment, the connector 22 is connected to the support 21. Specifically, the connector 22 is fixed to the free arm 212, and the connector 22 can move as the free arm 212 moves relative to the support arm 211, thus achieving height adjustment of the connector 22 relative to the base 1. In other embodiments, the support 21 can be an integral structure. In this case, the connector 22 can be directly slidably connected to the support 21 to achieve height adjustment of the connector 22.

[0054] In this embodiment, the connector 22 includes a connecting rod 221 and a telescopic rod 222. The connecting rod 221 is fixedly connected to the support member 21, and the telescopic rod 222 is movably connected to the connecting rod 221, thus allowing the length of the connector 22 to be adjusted.

[0055] The connecting rod 221 has a connecting groove at its end opposite to the support member 21, into which the telescopic rod 222 extends. Optionally, the telescopic rod can be moved via a translation assembly 25. The structure of the translation assembly 25 can be referenced from the structure of the lifting assembly 24 described above.

[0056] In other embodiments, the telescopic rod 222 can be directly slidably engaged with the connecting rod 221. Optionally, a locking member is provided on the connecting rod 221, and the locking member is located outside the telescopic rod 222. The locking member is movably connected to the connecting rod 221, and the locking member can move relative to the connecting rod 221 to approach and press against the telescopic rod 222 to position and lock the telescopic rod 222, or the locking member can move away from the telescopic rod 222 to release the telescopic rod 222 and thus release the locking of the telescopic rod 222.

[0057] In this embodiment, the mounting component 23 is connected to one side of the support component 21 and is arranged at intervals above the bearing position. Specifically, the mounting component 23 is connected to the support component 21 through the connector 22. The height of the mounting component 23 relative to the base 1 can be adjusted by raising and lowering the connector 22. The mounting component 23 can be moved closer to or further away from the support component 21 by moving the telescopic rod 222 relative to the connecting rod 221.

[0058] The mounting component 23 has a through hole, which is arranged collinearly with the target element 120 located at the bearing position. Specifically, the axis of the through hole extends vertically.

[0059] The collision element 3 is arranged on the support frame 2, and the collision element 3 is spaced directly above the bearing position. The collision element 3 can fall freely relative to the support frame 2 to collide with the target element 120 on the test component 100.

[0060] Specifically, the collision component 3 includes a collision rod 31 and a collision block 32 fixed to one end of the collision rod 31. The collision rod 31 passes through a through hole in the mounting component 23 and can fall freely relative to the mounting component 23, allowing the end of the collision rod 31 facing away from the collision block 32 to collide with the target element 120 on the test component 100. Since the through hole and the target element 120 located at the bearing position are arranged collinearly, this can position the collision rod 31, ensuring that the end of the collision rod 31 passing through the through hole is aligned directly above the target element 120 located at the bearing position, thus accurately colliding with the target element 120 during its descent and guaranteeing collision accuracy.

[0061] The collision block 32 is located at the top of the collision rod 31. The outer diameter of the collision block 32 is larger than the inner diameter of the through hole. That is, during the falling process of the collision member 3, the surface of the mounting member 23 can support the collision block 32 to limit the downward movement range of the collision block 32. It should be noted that after the collision action of the collision rod 31 on the target element 120 on the test component 100 is completed, the surface of the mounting member 23 supports the collision block 32. This can prevent the collision rod 31 from continuing to fall and colliding with other elements on the test component 100.

[0062] Optionally, in this embodiment, a buffer 26 may also be provided on the top of the mounting member 23, and the buffer 26 is located outside the through hole. When the collision member 3 moves relative to the mounting member 23, the end of the buffer 26 can elastically abut against the end face of the collision block 32, thus providing a buffering effect for the collision member 3. It should be noted that after the collision action of the end of the collision rod 31 on the target element 120 on the test component 100 is completed, the end of the buffer 26 elastically abuts against the collision block 32.

[0063] In this embodiment, the buffer 26 can be a spring, but it is not limited thereto. In other embodiments, the buffer 26 can also be a rubber pad or a silicone pad, etc.

[0064] Optionally, a guide member can also be provided in the through hole of the mounting member 23. The guide member has a guide hole. In this case, the collision rod 31 passes through the guide hole and is slidably connected to the guide member. This can guide the falling of the collision rod 31, so that the collision rod 31 falls along a predetermined path, ensuring that the end of the collision rod 31 can be aligned with and successfully collide with the target element 120 on the test component 100, thus ensuring the accuracy of the collision test.

[0065] Optionally, the inner peripheral wall of the guide is provided with a plurality of balls spaced apart in the circumferential direction. Each ball is rotatably connected to the guide. When the collision member 3 moves relative to the guide, each ball rolls relative to the collision rod 31, thereby guiding the downward movement of the collision rod 31.

[0066] In this embodiment, there can be multiple collision elements 3, each with a different weight. Each collision element 3 can be selectively arranged on the support frame 2. In practical applications, this design allows for the selection of a collision element 3 to perform a collision test on the target component 120 on the test component 100 as needed. Furthermore, it allows for the replacement of another collision element 3 of different weight to perform multiple collision tests on the target component 120 on the test component 100 until the collision element 3 collides with the target component 120 and causes the target component 120 to detach from the substrate 110 of the test component 100. This design also allows the SMT component testing device to be applied to collision tests on components on the test component 100 with different solder strengths, improving the versatility of the SMT component testing device.

[0067] Specifically, the collision blocks 32 of each collision member 3 have different weights, and / or the collision rods 31 have different weights. It should be noted that when the collision rods 31 of each collision block 32 have different weights, the weight of the collision rods 31 can be controlled by increasing or decreasing the length of the collision rods 31, while ensuring the outer diameter of each collision rod 31.

[0068] In this embodiment, detector 4 is mounted on support frame 2, and is positioned directly above collision member 3 at intervals. Specifically, detector 4 is connected to free arm 212 via a fixing member 27. The fixing member 27 can be a rod or have the same structure as connecting member 22.

[0069] Detector 4 is used to detect the velocity and displacement signals of the colliding component 3 in real time, and to obtain the initial collision velocity V0 and the final collision velocity V1 of the colliding component 3 based on the velocity and displacement signals. Specifically, based on the displacement signal detected by detector 4, the first position information of the colliding component 3 when it contacts the target element 120 on the test component 100 can be obtained. Correspondingly, the velocity of the colliding component 3 detected by detector 4 at this time is the initial collision velocity V0. Based on the displacement signal detected by detector 4, the second position information of the colliding component 3 when it collides with the target element 120 on the test component 100 and causes the target element 120 to fall off the substrate 110 can be obtained. Correspondingly, the velocity of the colliding component 3 detected by detector 4 at this time is the final collision velocity V1. It should be noted that in practical applications, the time required for the colliding component 3 to collide with the target element 120 can be preset to t. In this case, the second position information is calculated from the moment the colliding component 3 contacts the target element 120 on the test component 100 until time t is reached. The position information of the colliding component 3 detected by detector 4 at this time is the second position information.

[0070] The detector 4, the collision element 3, and the target element 120 on the test component 100 are on the same straight line. Since the collision element 3 is in a falling motion, the above design facilitates the detector 4 to detect the speed and position information of the collision element 3, and at the same time, it makes the collision element 3 aligned with the element on the test component 100. This allows the collision element 3 to successfully collide with the element on the test component 100 during the falling process, and ensures that the end of the collision element 3 can make almost complete contact with the top surface of the element on the test component 100, increasing the force-bearing area of ​​the element on the test component 100, thereby ensuring the accuracy of the collision test.

[0071] The SMT component testing device also includes a controller 5, which is connected to the detector 4. The controller 5 is used to receive the speed signal and displacement signal acquired by the detector, and process and analyze the speed signal and displacement signal to obtain the energy lost by the colliding component 3 during the collision.

[0072] The SMT component testing device may also include a data acquisition unit 6, which is communicatively connected to the detector 4. The data acquisition unit 6 is used to acquire the speed and displacement signals detected by the detector 4. The data acquisition unit 6 is also communicatively connected to the controller 5 to act as a data relay, that is, the data acquisition unit 6 can transmit the acquired speed and displacement signals detected by the detector 4 to the controller 5, thereby indirectly realizing the communication connection between the controller 5 and the detector 4.

[0073] An example of the operation process of the above-mentioned SMT component testing device is as follows:

[0074] An external force is applied to the fixing block 12 to move the fixing block 12 relative to the chassis 11, thereby widening the gap between the two fixing blocks 12 and moving them further apart. The component to be tested 100 is placed in the gap between the two fixing blocks 12 with its substrate 110 and target element 120 distributed in the horizontal direction. The target element 120 on the component to be tested 100 is aligned with the detector 4, so that the target element 120 on the component to be tested 100 and the detector 4 are on the same straight line extending vertically. Then, the fixing blocks 12 are moved and the two fixing blocks 12 clamp the component to be tested 100 to lock the position of the component to be tested 100.

[0075] Select a collision component 3 with a weight of m (the type, size, and welding strength requirements of the target component can be chosen) and place it on the mounting component 23. Rotate the pivot of the lifting assembly 24 to move the free arm 212 up or down relative to the support arm 211 until the mounting component 23 is at a suitable height. The suitable standard here is determined by the lowest point of the collision rod 31 of the collision component 3, ensuring that the collision component 3 does not collide with other components located below the target component 120.

[0076] Move the telescopic rod 222 relative to the connecting rod 221 so that the mounting member 23 moves closer to or further away from the support member 21 until the end of the collision rod 31 of the collision member 3 is aligned directly above the target element 120.

[0077] Turn on detector 4, data acquisition unit 6, and controller 5. Pull the collision component 3 to a suitable height (the suitable height standard is selected according to the type of target component 120 and determined by detector 4). Release the collision component 3, allowing it to fall relative to mounting component 23 and collide with target component 120. During this process, detector 4 detects the velocity and displacement signals of the collision component 3 in real time. Data acquisition unit 6 receives and transmits the velocity and displacement signals to controller 5. Controller 5 processes and analyzes the velocity and displacement signals to obtain the energy E lost by the collision component 3 during the collision, thus obtaining the collision energy borne by target component 120, i.e., E = 1 / 2 (mV0). 2 -mV1 2 ).

[0078] As can be seen from the above technical solution, this utility model has at least the following advantages and positive effects:

[0079] In this application, a collider is used to freely fall and collide with a target component fixed to a base on the test component. A detector located above the collider monitors the velocity and displacement signals of the collider during its descent in real time. This allows for the determination of the initial collision velocity V0 when the collider contacts the target component on the test component and the final collision velocity V1 when the target component is detached from the test component. During the free-fall collision, the collider decelerates, resulting in energy loss. According to the law of conservation of energy, this energy loss is the collision energy experienced by the target component on the test component. Therefore, based on the measurable velocity and known weight of the collider during the collision, and according to the law of conservation of energy, regardless of whether the target component is a micro-component or other type, the collision energy experienced by the target component can be calculated by examining the energy lost by the collider during the collision. This improves the versatility of the SMT component testing device.

[0080] Furthermore, since the detectors are spaced directly above the impactors, and the impactors are spaced directly above the target elements on the test component located at the bearing position, that is, the detectors, impactors, and target elements on the test component located at the bearing position are located on the same straight line extending vertically. This facilitates the detection of the velocity and displacement signals of the impactors when they fall, and improves the accuracy of the detected velocity and displacement signals. At the same time, this ensures that the impactors can accurately collide with the target elements on the test component during the fall, and ensures that the end of the impactors can make almost complete contact with the top surface of the element on the test component, increasing the force-bearing area of ​​the target element on the test component, thereby ensuring the accuracy of the impact test.

[0081] Although the present invention has been described with reference to several typical embodiments, it should be understood that the terminology used is descriptive and exemplary, and not restrictive. Since the present invention can be embodied in many forms without departing from the spirit or essence of the invention, it should be understood that the above embodiments are not limited to any of the foregoing details, but should be interpreted broadly within the spirit and scope defined by the appended claims. Therefore, all variations and modifications falling within the scope of the claims or their equivalents should be covered by the appended claims.

Claims

1. An SMT component testing device, characterized in that, include: The base has a support position for mounting and fixing the component to be tested. A support frame is provided on the base; The collision element is arranged on the support frame and spaced apart directly above the bearing position. The collision element can fall freely relative to the support frame to collide with the target element on the part to be tested. The detector is mounted on the support frame and is arranged at intervals directly above the collision element; The detector is used to detect the velocity signal and displacement signal of the colliding component in real time, and to obtain the initial collision velocity and the final collision velocity of the colliding component based on the velocity signal and the displacement signal.

2. The SMT component testing apparatus according to claim 1, characterized in that, The SMT component testing device further includes a controller, which is communicatively connected to the detector. The controller receives velocity and displacement signals acquired by the detector and processes and analyzes the velocity and displacement signals to obtain the energy lost by the colliding component during the collision; and / or, The SMT component testing device also includes a data acquisition unit, which is communicatively connected to the detector and is used to acquire the speed signal and displacement signal detected by the detector. The data acquisition unit is also communicatively connected to the controller to transmit the speed signal and displacement signal acquired by the data acquisition unit to the controller.

3. The SMT component testing apparatus according to claim 1, characterized in that, The support frame includes a support member fixed on the base and a mounting member connected to one side of the support member. The mounting members are spaced apart above the bearing position. The mounting members are provided with through holes, which are arranged collinearly with the detector and the target element located at the bearing position. The collision component includes a collision rod and a collision block fixed to one end of the collision rod. The collision rod passes through the through hole and can fall freely relative to the mounting component, so that the end of the collision rod away from the collision block collides with the target element on the component to be tested. The outer diameter of the collision block is larger than the inner diameter of the through hole, and the surface of the mounting component can support the collision block.

4. The SMT component testing apparatus according to claim 3, characterized in that, The support includes a support arm and a free arm. The support arm is erected on the base, and the free arm is movably mounted on the support arm. The mounting member is disposed on one side of the free arm. The free arm moves relative to the support arm along the extension direction of the support arm, so that the height position of the mounting member relative to the base is adjustable.

5. The SMT component testing apparatus according to claim 4, characterized in that, The top opening of the support arm is formed with a receiving groove, and the free arm is at least partially received in the receiving groove; The SMT component testing device includes a lifting assembly, which includes a rotating shaft, a driving wheel, and a driven wheel. The rotating shaft passes through the support arm and is rotatably connected to the support arm. The driving wheel is sleeved on the rotating shaft and fixedly connected to the rotating shaft, and the driving wheel is located in the receiving groove. The driven wheel is sleeved on the free arm and threadedly connected to the free arm. The axis of the driven wheel is perpendicular to that of the driving wheel, and the driven wheel is meshed with the driving wheel.

6. The SMT component testing apparatus according to claim 4, characterized in that, The support frame includes a connector, and the mounting component is connected to the support frame via the connector; The connector includes a connecting rod and a telescopic rod. The connecting rod is fixedly connected to the support member, and the telescopic rod is movably connected to the connecting rod. The telescopic rod is used to connect the mounting member, and the telescopic rod can move relative to the connecting rod in a direction perpendicular to the extension direction of the support member, so that the mounting member is relatively closer to or farther away from the support member.

7. The SMT component testing apparatus according to claim 3, characterized in that, A guide member is provided inside the through hole, and a guide hole is provided on the guide member. The collision rod passes through the guide hole and is slidably connected to the guide member. Multiple balls are arranged circumferentially on the inner peripheral wall of the guide member. Each ball is rotatably connected to the guide member. When the collision member moves relative to the guide member, each ball rolls relative to the collision rod.

8. The SMT component testing apparatus according to claim 3, characterized in that, The SMT component testing device also includes a buffer, which is located on top of the mounting component. When the collision component moves relative to the mounting component, the end of the buffer can elastically abut against the end face of the collision block.

9. The SMT component testing apparatus according to claim 1, characterized in that, The number of collision components is multiple, and each collision component can be selectively arranged on the support frame; The weights of the various collision components are different.

10. The SMT component testing apparatus according to claim 1, characterized in that, The base includes a chassis and two fixed blocks spaced apart on the chassis, with a bearing position formed between the two fixed blocks, which is used to support the component to be tested. At least one of the fixed blocks is movably connected to the chassis, and the two fixed blocks can move closer or further apart.

Images