Detection table of microsystem integrated chip

Abstract

The utility model discloses a detection bench for a microsystem integrated chip, comprising a pedestal, the upper surface of the pedestal is provided with a lifting mechanism, the lifting mechanism is connected with an operation bench surface, one side of the upper surface of the operation bench surface is provided with a support frame, the support frame is connected with a transverse plate, the transverse plate is provided with a displacement mechanism, and the displacement mechanism is connected with the operation bench surface. A control box is installed at one end of the upper surface of the operation table top, a baffle is arranged on one side of the supporting frame, a first limiting seat is arranged on one side of the control box, and a limiting mechanism is arranged on one side of the first limiting seat. According to the detection table of the microsystem integrated chip, stable rotation of the threaded rod is achieved through accurate control of the driving motor, then the displacement block is driven to accurately slide on the guide rod, the detector is driven to detect a plurality of chips, the detector at the bottom end of the displacement block can accurately detect the chips, and the detection efficiency is improved. And the accuracy of the detection result is further ensured.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit chip technology, and in particular to a testing station for microsystem integrated chips. Background Technology

[0002] An integrated circuit (IC) is a miniature electronic component that integrates multiple electronic components onto a substrate to perform a specific circuit or system function. It employs specific processes to fabricate the transistors, resistors, capacitors, inductors, and interconnecting wiring required for a circuit onto one or several small pieces of semiconductor wafer or dielectric substrate, and then encapsulates them in a package to form a miniature structure with the desired circuit function. ICs offer advantages such as small size, light weight, fewer leads and solder joints, long lifespan, high reliability, and good performance, while also being low-cost and easy to mass-produce. They can be directly used in communications, data processing, small electronic devices, weaponry, etc. ICs require integrated chips, which need to be tested after production.

[0003] Chinese patent application CN202322614849.5 discloses an operating table for testing integrated circuit chips. It uses a suction cup to pick up the integrated circuit chip, and employs pulleys and a slide rail to stabilize the scissor-type telescopic frame during its extension and retraction. A frame serves as the carrier. After the suction cup picks up the integrated circuit chip, the frame is rotated, and the telescopic rod is retracted and placed on a pressure plate to complete the chip removal process. A pressure plate is used to hold the integrated circuit chip, and a rotating block and a rotating plate press the chip on the pressure plate. An anti-slip layer prevents the chip from sliding out. An IC socket is used for power-on testing of the integrated circuit chip on the pressure plate. The rotating plate and pressure plate are fastened together with a snap fastener, and the integrated circuit chip is moved to the IC socket via a slide rail and a slider for insertion and power-on testing.

[0004] However, existing testing stations still have some shortcomings. They can only test one chip at a time, and the testing method is time-consuming and inefficient. Utility Model Content

[0005] To address the aforementioned shortcomings in the existing technology, this utility model provides a testing station for microsystem integrated chips, which aims to solve the problems of being able to test only one chip at a time, long testing time, and low work efficiency.

[0006] To achieve the above-mentioned utility model objectives, the technical solution adopted by this utility model is as follows: a testing platform for a microsystem integrated chip, including a base, a lifting mechanism installed on the upper surface of the base, an operating table connected to the lifting mechanism, a support frame installed on one side of the upper surface of the operating table, a horizontal plate connected to the support frame, a displacement mechanism installed on the horizontal plate, a control box installed at one end of the upper surface of the operating table, a baffle provided on one side of the support frame, a limiting seat provided on one side of the control box, and a limiting mechanism provided on one side of the limiting seat.

[0007] The displacement mechanism includes a mounting bracket fixedly installed at the bottom of the horizontal plate. A drive motor is installed at one end of the mounting bracket. A threaded rod is driven to the output end of the drive motor. A displacement block is threadedly connected to the threaded rod. A guide rod is connected to the mounting bracket. The displacement block slides on the guide rod. A detector is fixedly installed at the bottom end of the displacement block.

[0008] Furthermore, the limiting mechanism includes a sliding groove formed on the upper surface of the operating table, a sliding rod connected between the sliding grooves, a slider slidably connected to the sliding rod, a telescopic spring connected to one side of the slider, a limiting seat two connected to the top of the slider, and a pull ring installed on one side of the limiting seat two.

[0009] Furthermore, the lifting mechanism includes an electric push rod fixedly installed on the upper surface of the base, a telescopic rod connecting the base and the operating table, and guide grooves provided on the upper surface of the base and the lower surface of the operating table, with movable rods slidably connected to the guide grooves.

[0010] Furthermore, a display screen is installed on the front side of the control box, and a switch button is provided below the display screen, with a connection hole below the switch button.

[0011] Furthermore, the first limiting seat, the baffle, and the second limiting seat are all coated with anti-slip pads.

[0012] Furthermore, a foot is fixedly connected to the bottom end of the base.

[0013] The beneficial effects of this utility model are as follows:

[0014] This invention relates to a testing stage for microsystem integrated chips. Through precise control of a drive motor, the threaded rod rotates smoothly, thereby driving a displacement block to slide precisely on a guide rod. This, in turn, drives a detector to test multiple chips. The detector at the bottom of the displacement block can accurately test the chips, further ensuring the accuracy of the test results.

[0015] This utility model discloses a testing platform for a microsystem integrated chip. Through the combined use of an electric push rod and a telescopic rod, the operating platform can be smoothly raised and lowered as needed, adjustable to the height of the testing personnel, and can also adapt to testing requirements at different heights. Simultaneously, the sliding cooperation of the guide groove and the movable rod enhances the stability of the testing platform during raising and lowering, avoiding testing errors caused by shaking or tilting. Attached Figure Description

[0016] Figure 1 This is a front view of a testing station for a microsystem integrated chip according to the present invention.

[0017] Figure 2 This is a right view of a testing station for a microsystem integrated chip according to the present invention.

[0018] Figure 3 This is an enlarged view of the lifting mechanism of the testing stage for a microsystem integrated chip according to this utility model;

[0019] Figure 4 This is a cross-sectional view of the operating table surface of a testing station for a microsystem integrated chip according to the present invention.

[0020] Figure 5 This is an enlarged view of the displacement mechanism of the detection stage of a microsystem integrated chip according to this utility model.

[0021] Appendix Label Reference Table:

[0022] 1. Base; 2. Lifting mechanism; 201. Electric push rod; 202. Telescopic rod; 203. Guide groove; 204. Movable rod; 3. Operating table; 4. Support frame; 5. Horizontal plate; 6. Displacement mechanism; 601. Mounting bracket; 602. Drive motor; 603. Threaded rod; 604. Guide rod; 605. Displacement block; 606. Detector; 7. Limit seat one; 8. Baffle; 9. Limiting mechanism; 901. Slide groove; 902. Slide rod; 903. Slider; 904. Telescopic spring; 905. Limit seat two; 906. Pull ring; 10. Control box; 1001. Display screen; 1002. Switch button; 1003. Connection hole; 11. Foot. Detailed Implementation

[0023] The specific embodiments of this utility model will be further described below with reference to the accompanying drawings. Identical components are indicated by the same reference numerals.

[0024] It should be noted that the terms “front,” “back,” “left,” “right,” “up,” and “down” used in the following description refer to the directions shown in the attached diagram, while the terms “inside” and “outside” refer to the directions toward or away from the geometric center of a specific component, respectively.

[0025] To make the content of this utility model easier to understand, the technical solutions in the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings.

[0026] like Figures 1 to 5 As shown, a testing station for a microsystem integrated chip includes a base 1, a lifting mechanism 2 mounted on the upper surface of the base 1, an operating table 3 connected to the lifting mechanism 2, a support frame 4 mounted on one side of the upper surface of the operating table 3, a horizontal plate 5 connected to the support frame 4, a displacement mechanism 6 mounted on the horizontal plate 5, a control box 10 mounted at one end of the upper surface of the operating table 3, a baffle 8 provided on one side of the support frame 4, a limit seat 7 provided on one side of the control box 10, and a limit mechanism 9 provided on one side of the limit seat 7.

[0027] The displacement mechanism 6 includes a mounting bracket 601 fixedly installed at the bottom of the horizontal plate 5. A drive motor 602 is installed at one end of the mounting bracket 601. A threaded rod 603 is connected to the output end of the drive motor 602. A displacement block 605 is threadedly connected to the threaded rod 603. A guide rod 604 is connected to the mounting bracket 601. The displacement block 605 slides on the guide rod 604. A detector 606 is fixedly installed at the bottom end of the displacement block 605.

[0028] The above scheme starts the drive motor 602, drives the threaded rod 603 to rotate, and drives the displacement block 605 to slide precisely on the guide rod 604, thereby driving the detector 606 to detect multiple chips, resulting in high detection efficiency.

[0029] The limiting mechanism 9 includes a slide groove 901 formed on the upper surface of the operating table 3, a slide rod 902 connected between the slide grooves 901, a slider 903 slidably connected on the slide rod 902, a telescopic spring 904 connected to one side of the slider 903, a limiting seat 905 connected to the top of the slider 903, and a pull ring 906 installed on one side of the limiting seat 905.

[0030] Through the above scheme, the chip disk is placed on the upper surface of the operating table 3 by the cooperation of the slide groove 901, slide rod 902, slider 903, telescopic spring 904, limit seat 2 905 and pull ring 906. The telescopic spring 904 pushes the limit seat 2 905 to fix the chip disk, effectively preventing the chip from slipping or being damaged, and ensuring the safety of the testing process.

[0031] The lifting mechanism 2 includes an electric push rod 201 fixedly installed on the upper surface of the base 1. A telescopic rod 202 is connected between the base 1 and the operating table 3. Guide grooves 203 are provided on the upper surface of the base 1 and the lower surface of the operating table 3. A movable rod 204 is slidably connected to the guide groove 203.

[0032] With the above scheme, the electric push rod 201 is activated, so that the operating table 3 can be raised and lowered smoothly as needed to adapt to the detection requirements of different heights. At the same time, the sliding cooperation between the guide groove 203 and the movable rod 204 enhances the stability of the detection table during the raising and lowering process, avoiding detection errors caused by shaking or tilting.

[0033] A display screen 1001 is installed on the front side of the control box 10. A switch button 1002 is located below the display screen 1001. A connection hole 1003 is located below the switch button 1002.

[0034] Through the above solution, the display screen 1001 can display the detection status and data in real time, allowing operators to intuitively understand the detection progress and results. The switch button 1002 provides a convenient operation method, enabling operators to easily control the various functions of the detection station. The connection hole 1003 facilitates the access of external devices, realizes the real-time transmission and processing of detection data, and further enhances the user experience.

[0035] Anti-slip pads are applied to the limit seat 7, baffle 8, and limit seat 905.

[0036] The bottom of the base 1 is fixedly connected to the foot 11.

[0037] The working principle of this utility model patent is as follows: First, observe the status of the equipment through the display screen 1001 to ensure that all parts are operating normally. Pull the pull ring 906 to place the microsystem integrated chip disk to be tested on the operating table 3. The chip disk is fixed by the limit seat 905 pushed by the telescopic spring 904. The displacement mechanism 6 and the detector 606 are started by the command of the control box 10 to test the chip. The test results on the display screen 1001 are observed, and the data is recorded and analyzed.

[0038] The above description is only a preferred embodiment of this utility model patent and is not intended to limit this utility model patent. Any modifications, equivalent substitutions and improvements made within the spirit and principles of this utility model patent should be included within the protection scope of this utility model patent.

Claims

1. A testing station for a microsystem integrated chip, characterized in that, Includes a base (1), a lifting mechanism (2) is installed on the upper surface of the base (1), an operating table (3) is connected to the lifting mechanism (2), a support frame (4) is installed on one side of the upper surface of the operating table (3), a horizontal plate (5) is connected to the support frame (4), a displacement mechanism (6) is installed on the horizontal plate (5), a control box (10) is installed at one end of the upper surface of the operating table (3), a baffle (8) is provided on one side of the support frame (4), a limiting seat (7) is provided on one side of the control box (10), and a limiting mechanism (9) is provided on one side of the limiting seat (7). The displacement mechanism (6) includes a mounting bracket (601) fixedly installed at the bottom of the horizontal plate (5). A drive motor (602) is installed at one end of the mounting bracket (601). A threaded rod (603) is connected to the output end of the drive motor (602). A displacement block (605) is threadedly connected to the threaded rod (603). A guide rod (604) is connected to the mounting bracket (601). The displacement block (605) slides on the guide rod (604). A detector (606) is fixedly installed at the bottom end of the displacement block (605).

2. The testing station for a microsystem integrated chip according to claim 1, characterized in that: The limiting mechanism (9) includes a slide groove (901) formed on the upper surface of the operating table (3), a slide rod (902) connected between the slide grooves (901), a slider (903) slidably connected on the slide rod (902), a telescopic spring (904) connected to one side of the slider (903), a limiting seat (905) connected to the top of the slider (903), and a pull ring (906) installed on one side of the limiting seat (905).

3. The testing station for a microsystem integrated chip according to claim 1, characterized in that: The lifting mechanism (2) includes an electric push rod (201) fixedly installed on the upper surface of the base (1). A telescopic rod (202) is connected between the base (1) and the operating table (3). The upper surface of the base (1) and the lower surface of the operating table (3) are both provided with guide grooves (203). A movable rod (204) is slidably connected to the guide groove (203).

4. The testing station for a microsystem integrated chip according to claim 1, characterized in that: The control box (10) has a display screen (1001) mounted on its front side. Below the display screen (1001) is a switch button (1002), and below the switch button (1002) is a connection hole (1003).

5. The testing station for a microsystem integrated chip according to claim 2, characterized in that: The limiting seat one (7), the baffle (8) and the limiting seat two (905) are all coated with anti-slip pads.

6. The testing station for a microsystem integrated chip according to claim 1, characterized in that: The bottom end of the base (1) is fixedly connected to a foot (11).

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