Adaptive joint pin test meter pen

Abstract

The utility model relates to a self-adaptive joint pin test meter pen, which comprises a pen body, a pen point and an adjustable nut, the pen body is sleeved on the pen point and is in an insulation design, the pen point is in a forked design and is provided with at least two sections, the middle of the pen point is hollow, the pen point comprises a measuring end and an adjusting end, the measuring end and the adjusting end are integrally arranged, the adjusting end is positioned above the measuring end, and the adjustable nut is positioned above the adjusting end. The diameter of the adjusting end is larger than that of the measuring end, threads are arranged on the surface of the adjusting end, the adjustable nut moves along the threads at the adjusting end, and vertical-strip-shaped protrusions are arranged on the inner wall of the measuring end. A forked structure and a middle hollow design are adopted, and the clamping degree of the pen body is adjusted through thread movement, so that the meter pen can adapt to joint pins of different specifications and shapes, the contact stability between the meter pen and the pins is enhanced, and measurement errors caused by poor contact are reduced; the vertical strip-shaped protrusions can destroy an oxide layer formed on the surface of the contact pin in the insertion process, so that good electrical contact is ensured, and the test accuracy is improved.

Description

Technical Field

[0001] This utility model relates to the field of testing tool technology, specifically to an adaptive connector pin test probe. Background Technology

[0002] Connector pins, as key components for power, data, or signal transmission between various devices, are widely used in medical instruments, industrial automation, and aerospace. Ensuring the reliability and safety of connector pins is fundamental to guaranteeing the normal operation of equipment. However, traditional solid-tipped test pens have many limitations in practical applications, especially when handling connector pins of different specifications and shapes, making it difficult to guarantee good contact and stable measurement results. During testing, technicians typically need one hand to hold the pen to test the pin while the other hand adjusts the instrument and observes the data. This multitasking is not only complex but also makes it difficult to fix the test pen, further increasing the difficulty of testing and the risk of errors. In addition, the oxide layer that may form on the surface of the connector pins also seriously affects the accuracy of the test. Utility Model Content

[0003] To address the aforementioned problems, this utility model provides an adaptive connector pin test probe, comprising a probe body, a probe tip, and an adjustable nut. The probe body is fitted over the upper end of the probe tip and is designed for insulation. The probe tip has a forked design with at least two lobes, the middle of which is hollow. The probe tip includes a measuring end and an adjusting end, which are integrally formed. The adjusting end is located above the measuring end, and its diameter is larger than that of the measuring end. The surface of the adjusting end is threaded, and the adjustable nut moves along the thread on the adjusting end. The inner wall of the measuring end is provided with vertical protrusions.

[0004] Based on the above scheme, the front end of the pen tip has a 45-degree chamfer, and the 45-degree chamfered surface is formed with vertical stripes by a rolling process.

[0005] Based on the above scheme, the number of branches of the pen tip can be two, three, or four.

[0006] Compared with the prior art, the beneficial effects of this utility model are as follows: by adopting a forked structure and a hollow design in the middle, and by adjusting the clamping degree of the pen body through threaded movement, it can adapt to connector pins of different specifications and shapes, which not only enhances the contact stability between the probe and the pin, but also reduces measurement errors caused by poor contact; the vertical protrusion can destroy the oxide layer that may form on the surface of the pin during the insertion process, ensuring good electrical contact, thereby improving the accuracy of the test. Attached Figure Description

[0007] Figure 1 This is a schematic diagram of the test pen structure of this utility model;

[0008] Figure 2 This is a schematic diagram of the cross-sectional structure of a pen tip according to an embodiment of the present invention;

[0009] Figure 3 This is a schematic diagram of the cross-sectional structure of the pen tip front end of this utility model; Detailed Implementation

[0010] The present invention will be further described below with reference to the accompanying drawings:

[0011] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in this utility model can be understood according to the specific circumstances.

[0012] In the description of this utility model, it should be understood that the terms "left", "right", "front", "rear", "top", "bottom", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0013] This invention provides an adaptive connector pin test probe, designed to improve the convenience, accuracy, and applicability of connector pin testing. For example... Figure 1 As shown, the adaptive connector pin tester of this application includes a pen body 1, a pen tip 2, and an adjustable nut 3. The pen body is fitted onto the pen tip, and the adjustable nut moves along the thread at the upper end of the pen tip.

[0014] To ensure electrical safety, the pen body is made of insulating material and is fitted onto the top of the pen tip. The pen body has a concave design, which allows you to place your hand on the concave surface during testing for easy operation.

[0015] Furthermore, the pen tip is hollow, so when measuring, the pen is inserted into the measuring component. The tester can separate their hand from the pen after inserting it, avoiding the need to hold the pen while performing other operations. The operation buttons and data recording can be completed independently, thus improving efficiency.

[0016] To accommodate testing of connector pins of different specifications, the pen tip in this application features a forked design with at least two lobes. The fork extends almost the entire length of the pen tip 2, passing through the threads until it connects to the pen body 1 and the pen tip 2. When the connector pin is thicker, the forked portion of the pen tip can automatically open, allowing the connector pin to connect to the internal electrical system and ensuring good contact.

[0017] Preferably, to increase design flexibility and accommodate more types of connector pins, the pen tip can have two, three, or four branches, such as... Figure 2 As shown, the number of branches can be four; further, the pen tip includes a measuring end 201 and an adjusting end 202, which are integrally set. The surface of the adjusting end is provided with threads. Since the measuring end is relatively thin, it is difficult to make threads. Therefore, a diameter change operation is performed to expand the upper diameter to form the adjusting end. The adjustable nut moves along the thread of the adjusting end to adjust the clamping force.

[0018] When the adjustable nut is at the top of the adjustment end, the distance between the nut and the forked portion of the probe tip is at its maximum. At this point, the forked portion is in its most relaxed state, allowing it to open freely and facilitating easy insertion and removal of the probe from the pin. By rotating the adjustable nut, it moves downwards along the thread of the adjustment end. This downward movement gradually compresses the forked portion, causing it to retract inwards and clamp the inserted pin. This ensures the probe is securely fixed to the pin, preventing loosening during testing.

[0019] Furthermore, the inner wall of the measuring end of the pen tip is provided with vertical protrusions 203. These protrusions can not only break the oxide layer formed on the surface of the pin during insertion and maintain good electrical contact with it, but also increase the friction between the pin and the pen tip, further enhancing the clamping effect.

[0020] Preferred, such as Figure 3 As shown, in order to facilitate insertion during testing and to prevent collisions and damage to components, a 45-degree chamfer 204 is provided at the contact point between the tip of the pen and the connector pin (the outermost edge of the measuring end), and the 45-degree chamfer surface is formed with vertical stripes by a rolling process.

[0021] As the pen tip approaches the pin, the chamfered surface automatically guides it into the pin hole, reducing alignment difficulties. This is especially beneficial in confined spaces or situations with poor visibility, making insertion smoother and improving operational efficiency. Furthermore, the vertical stripes created by the rolling process on the chamfered surface further enhance this guiding effect.

[0022] The test probes of this invention not only improve testing efficiency and ease of operation, but also ensure testing accuracy and safety, making them suitable for connector and pin testing in multiple fields such as medical instruments, industrial automation, and aerospace.

[0023] The foregoing has shown and described the basic principles and main features of this utility model. It is obvious to those skilled in the art that this utility model is not limited to the details of the above exemplary embodiments. Therefore, the embodiments should be regarded as exemplary and non-limiting. The scope of this utility model is defined by the appended claims rather than the foregoing description. Therefore, it is intended to include all changes that fall within the meaning and scope of the equivalents of the claims within this utility model.

[0024] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. An adaptive contact pin test probe stylus, characterized by, It includes a pen body (1), a pen head (2) and an adjustable nut (3), the pen body (1) is sleeved on the upper end of the pen head (2) and is designed as insulation, the pen head (2) is designed as bifurcation and has at least two petals, the middle of which is hollow, the pen head (2) includes a measuring end (201) and an adjusting end (202), which are integrally arranged, the adjusting end (202) is located above the measuring end (201), the diameter of the adjusting end (202) is larger than that of the measuring end (201), the surface of the adjusting end (202) is provided with threads, the adjustable nut (3) moves along the threads on the adjusting end (202), and the inner wall of the measuring end (201) is provided with vertical strip type protrusions (203).

2. The self-adapting contact pin test probe stylus of claim 1, wherein, The front end of the pen head is provided with a 45-degree chamfer (204), and the surface of the 45-degree chamfer is formed with vertical stripes through a rolling process.

3. The self-adapting contact pin test probe stylus of claim 1, wherein, The bifurcation number of the pen head (2) is two, three or four.

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