Inspection device and die cutting equipment

Abstract

The utility model provides an inspection device and die cutting equipment, the inspection device comprises a guide assembly and at least two sets of inspection assemblies, and the guide assembly comprises a first guide piece extending in the first direction; the at least two groups of inspection assemblies are arranged at intervals in the first direction, each inspection assembly comprises a locking structure, an inspection structure and a second guide part, the second guide parts extend in the second direction, the locking structures are movably connected with the first guide parts, the locking structures are connected with the second guide parts, and the inspection structures are connected with the second guide parts; the inspection structures in the two adjacent inspection assemblies are arranged in a staggered mode in the second direction, and the first direction is perpendicular to the second direction; the locking structure has an unlocking state and a locking state, in the unlocking state, the locking structure can move relative to the first guiding piece in the first direction, and in the locking state, the locking structure and the first guiding piece are relatively fixed. According to the inspection device and the die cutting equipment, missing inspection can be effectively avoided, and the yield of products is increased.

Description

Technical Field

[0001] This application relates to the field of die-cutting inspection technology, specifically to an inspection device and die-cutting equipment. Background Technology

[0002] In the production of brightness-enhancing products such as brightness-enhancing tapes, die-cutting and perforation are usually required. If residual waste material clogs the holes after die-cutting and perforation, it will cause product defects, which need to be removed during production. Currently, manual inspection of each brightness-enhancing product is typically used to remove defective items. However, prolonged manual inspection can lead to fatigue, resulting in missed inspections and making it difficult to guarantee the yield rate after die-cutting and perforation. Utility Model Content

[0003] This application aims to address at least one of the technical problems existing in the prior art. To this end, this application proposes an inspection device that can effectively avoid missed inspections and improve the product yield.

[0004] This application also proposes a die-cutting device having the above-mentioned inspection apparatus.

[0005] The inspection apparatus according to an embodiment of this application includes a guide assembly and at least two sets of inspection assemblies;

[0006] The guiding assembly includes a first guide member arranged extending along a first direction;

[0007] At least two sets of inspection components are arranged at intervals along a first direction. Each inspection component includes a locking structure, an inspection structure, and a second guide member. The second guide member extends along a second direction. The locking structure is movably connected to the first guide member and is also connected to the second guide member. The inspection structure is connected to the second guide member. The inspection structures in two adjacent sets of inspection components are staggered along the second direction. The first direction is perpendicular to the second direction.

[0008] The locking structure has an unlocked state and a locked state. In the unlocked state, the locking structure can move relative to the first guide member along the first direction. In the locked state, the locking structure is fixed relative to the first guide member.

[0009] The inspection device according to the embodiments of this application has at least the following beneficial effects: Each group of inspection components is arranged at intervals along a first direction, such that each inspection structure is arranged at intervals along the first direction, and the inspection structure is connected to a second guide member, which is connected to a locking structure. When the locking structure is in an unlocked state, the locking structure can move relative to the first guide member along the first direction, thus allowing for further adjustment of the intervals of the inspection structures along the first direction. Furthermore, the inspection structures in adjacent groups of inspection components are staggered along a second direction. Thus, the interval arrangement of each group of inspection structures allows each inspection structure to correspond to the holes in the brightening patch, thereby inspecting whether there are any defects due to missed discharge at the holes. The inspection device of this application enables continuous inspection of brightening products of various sizes, effectively avoiding missed inspections and improving the product yield.

[0010] According to some embodiments of this application, the inspection structure is movably connected to the second guide member along the second direction.

[0011] According to some embodiments of this application, in the unlocked state, the locking structure is movably connected to the second guide member along the second direction, and in the locked state, the locking structure is fixedly connected to the second guide member.

[0012] According to some embodiments of this application, the inspection structure includes a mounting base and an inspection unit. Along a first direction, the mounting base extends in a direction away from the second guide member, and the inspection unit is movably connected to the mounting base.

[0013] According to some embodiments of this application, the mounting base is provided with a guide groove that extends along a first direction, and at least a portion of the inspection unit is located within the guide groove.

[0014] According to some embodiments of this application, the inspection unit includes an inspection probe and a limiting part. Along a third direction, the limiting part is movably connected to the inspection probe. A guide groove passes through the mounting base. The inspection probe enters the guide groove from the first side of the mounting base and exits the guide groove from the second side of the mounting base. The limiting part abuts against the first side of the mounting base. The first direction, the second direction, and the third direction are mutually perpendicular.

[0015] According to some embodiments of this application, along a first direction, the mounting bases in two adjacent sets of inspection components extend in opposite directions.

[0016] According to some embodiments of this application, at least one inspection component is provided with a plurality of inspection structures. Along the second direction, the inspection structures of the same group of inspection components are arranged at intervals, and along the first direction, adjacent two inspection structures extend in opposite directions relative to the second guide member.

[0017] The die-cutting equipment according to the embodiments of this application includes a die-cutting machine and an inspection device as described in any of the above embodiments. The inspection device is arranged on the exit side of the die-cutting machine along a first direction.

[0018] The die-cutting equipment according to the embodiments of this application has at least the following beneficial effects: the die-cutting machine is used to die-cut gloss enhancement products, and the inspection device is used to inspect the hole positions of the gloss enhancement products. Through the coordinated operation of the die-cutting machine and the inspection device, the hole positions of the gloss enhancement products can be inspected in a timely manner, which helps to ensure the yield of gloss enhancement products.

[0019] According to some embodiments of this application, the die-cutting equipment further includes a control module, which is electrically connected to the die-cutting machine and to an inspection device;

[0020] The control module is configured to send a stop signal to the die-cutting machine when the inspection structure detects a defective product.

[0021] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0022] The present application will be further described below with reference to the accompanying drawings and embodiments, wherein:

[0023] Figure 1 This is a top view of the testing apparatus according to an embodiment of this application;

[0024] Figure 2 This is a schematic diagram of the structure of the testing device according to an embodiment of this application;

[0025] Figure 3 for Figure 2 A magnified view of a portion of point A in the middle;

[0026] Figure 4 This is a side view of the testing apparatus according to an embodiment of this application;

[0027] Figure 5 This is a front view of the testing apparatus according to an embodiment of this application;

[0028] Figure 6 This is a schematic diagram of the die-cutting machine according to an embodiment of this application.

[0029] Reference numerals: guide assembly 100, first guide member 110;

[0030] Inspection component 200, locking structure 210, inspection structure 220, inspection base 221, mounting base 222, guide groove 2221, inspection unit 223, inspection probe 2231, limiting part 2232, second guide member 230;

[0031] Die-cutting machine 300, control module 310, gloss-enhancing tape 320. Detailed Implementation

[0032] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0033] In the description of this application, it should be understood that the orientation descriptions, such as up, down, front, back, left, right, etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0034] In the description of this application, "several" means one or more, "multiple" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. The use of "first" and "second" in the description is merely for distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.

[0035] In the description of this application, unless otherwise expressly defined, terms such as "setup," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this application in conjunction with the specific content of the technical solution.

[0036] In the description of this application, the terms "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0037] The embodiments of this application are described below with reference to the accompanying drawings:

[0038] refer to Figure 1The testing device described in this application is used to inspect brightness enhancement products such as brightness enhancement tape 320. Taking brightness enhancement tape 320 as an example, it is generally formed by a multi-layered composite structure, including a substrate layer (such as polyethylene terephthalate) and a microprism layer. The microprisms of brightness enhancement tape 320 are continuously arranged along the length of the material. This structural feature results in the tensile strength and elastic modulus of brightness enhancement tape 320 being higher in the length direction than in the width direction. Based on this structure of brightness enhancement tape 320, when die-cutting it, the length direction of brightness enhancement tape 320 is usually set at a certain angle to the conveying direction (refer to Figure 1). This inclined setting ensures that the cutting path is not perpendicular to the prism direction, which helps to disperse the stress generated during die-cutting, maintain the integrity of the microstructure of brightness enhancement tape 320, and thus ensure the performance of brightness enhancement tape 320.

[0039] It should be noted that, because the length of the brightness enhancement patch 320 is arranged at an angle relative to the conveying direction, when multiple rows of brightness enhancement patches 320 are arranged in a direction perpendicular to the conveying direction, since each brightness enhancement patch 320 will have holes die-cut at the same position, the line connecting the holes of two adjacent rows of brightness enhancement patches 320 will form an angle with the conveying direction, and at the same time, this line will also have an angle with the perpendicular direction of the conveying direction.

[0040] refer to Figures 1 to 3 According to the embodiments of this application, the inspection device is suitable for inspecting the brightening patch 320 conveyed by the above-described conveying method. The inspection device includes a guide assembly 100 and at least two sets of inspection assemblies 200. The guide assembly 100 includes a first guide member 110 extending along a first direction, and the brightening patch 320 is conveyed along the first direction. The at least two sets of inspection assemblies 200 are arranged at intervals along the first direction. Each set of inspection assemblies 200 includes a locking structure 210, an inspection structure 220, and a second guide member 230. The inspection structure 220 is used to inspect the residual waste and debris in the holes of the brightening patch 320. If there is residual waste and debris such as brightening patch 320 in the holes, the brightening patch 320 is a defective product with unresolved waste and needs to be rejected.

[0041] The second guide member 230 extends along a second direction, with the first direction perpendicular to the second direction. The locking structure 210 is movably connected to the first guide member 110 and is also connected to the second guide member 230. The inspection structure 220 is connected to the second guide member 230. The inspection structures 220 in adjacent sets of inspection components 200 are staggered along the second direction. This arrangement allows the two inspection structures 220 to correspond to the holes of two rows of parallel-conveyed brightening adhesive tapes 320. In other words, during inspection, the line connecting the holes of the parallel-conveyed brightening adhesive tapes 320 coincides with the line connecting the two inspection structures 220.

[0042] The locking structure 210 has an unlocked state and a locked state. In the unlocked state, the locking structure 210 can move relative to the first guide member 110 along a first direction to adjust the spacing between adjacent inspection components 200 along the first direction. Since the holes of the two rows of parallel-conveyed brightening tape 320 are spaced apart in the first direction, adjusting the spacing between adjacent inspection components 200 along the first direction ensures that the inspection structure 220 better corresponds to the holes of the two rows of parallel-conveyed brightening tape 320, thereby enabling the inspection of missed discharge at the holes. In the locked state, the locking structure 210 is relatively fixed to the first guide member 110, thus determining the relative position between the first guide member 110 and the second guide member 230. Since the inspection structure 220 is connected to the second guide member 230, each inspection structure 220 has a definite position, which helps to make the inspection operation more stable.

[0043] refer to Figures 1 to 3 Specifically, the locking structure 210 consists of a locking base and a locking bolt. The locking base has a first through hole, the axis of which extends along a first direction, and also has a first locking hole communicating with the first through hole. A portion of the first guide member 110 can be inserted into the first through hole. The wall of the first locking hole has a threaded structure, and the locking bolt is inserted into the first locking hole and forms a threaded connection with the locking base. When the locking bolt is screwed in and extends into the first through hole and abuts against the first guide member 110, relative movement between the locking base and the first guide member 110 is restricted, and the locking structure 210 is in a locked state. Conversely, by rotating the locking bolt, it is withdrawn from the position abutting against the first guide member 110 and separated, allowing the locking base to move relative to the first guide member 110 along the first direction, and the locking structure 210 is in an unlocked state.

[0044] The inspection methods of the inspection structure 220 include, but are not limited to, infrared detection, visual scanning detection, and laser scanning detection. During inspection, the inspection structure 220 is positioned above the brightness enhancement patch 320, with its inspection section facing the direction of the brightness enhancement patch 320. The brightness enhancement patches 320 are conveyed in a step-by-step manner, with each patch 320 conveyed along a first direction and arranged side-by-side in a second direction. In the first direction, the conveying step distance of the brightness enhancement patches 320 is set to the distance between the holes of two adjacent patches 320. In this way, using the hole of any brightness enhancement patch 320 as the starting point for inspection, each step-by-step conveying of the patch 320 ensures that the hole of the patch 320 corresponds to the position of the inspection structure 220 (i.e., the hole of the patch 320 is directly below the inspection structure 220), allowing the inspection structure 220 to inspect the hole of the patch 320.

[0045] Taking infrared inspection as an example, a substrate, which can be made of metal, is provided on the side of the brightness enhancement patch 320 facing away from the inspection structure 220. When the hole is a through hole, infrared light passes through the hole, and the infrared light reflected by the substrate is weak; if there is residual brightness enhancement patch 320 at the hole, the infrared light is reflected on the brightness enhancement patch 320, and the reflected infrared light is strong. Based on the strength of the reflected infrared light, it is possible to screen whether the brightness enhancement patch 320 is defective, which helps to effectively avoid missed detections and thus improve the product yield.

[0046] It should be noted that during the conveying of the brightness enhancement tape 320 along the first direction, multiple rows of brightness enhancement tape 320 can be conveyed simultaneously in parallel along the second direction. The number of inspection components 200 is no less than the number of rows of brightness enhancement tape 320, and the number of inspection structures 220 that can be opened can be adaptively adjusted according to the number of rows of brightness enhancement tape 320 being conveyed. This makes the inspection operation more flexible and also helps to save resources.

[0047] refer to Figures 1 to 3 In other embodiments, the guide assembly 100 includes two first guide members 110 extending along a first direction and spaced apart along a second direction. Two sets of inspection assemblies 200 are spaced apart along the first direction. Along the second direction, one end of each set of inspection assemblies 200 is connected to one of the first guide members 110, and the other end of each set of inspection assemblies 200 is connected to the other first guide member 110. The two first guide members 110 can provide more stable support for the two sets of inspection assemblies 200. The two first guide members 110 can also guide the position adjustment of the two sets of inspection assemblies 200 along the first direction, effectively preventing the inspection assemblies 200 from deviating relative to the second direction.

[0048] Specifically, the inspection component 200 includes two locking structures 210. In the second direction, one end of the second guide 230 is connected to one of the locking structures 210, and the other end is connected to the other locking structure 210. The two locking structures 210 are connected to the two first guides 110 in a one-to-one correspondence. When the locking structures 210 are in the unlocked state, in the first direction, the two locking structures 210 can move relative to the first guides 110 connected to them, thereby adjusting the position of the second guide 230. Furthermore, the two first guides 110 are positioned at opposite ends of the second guide 230, ensuring that the second guide 230 remains perpendicular to the first guides 110 when moving in the first direction. This allows the locking structures 210 to slide more smoothly relative to the first guides 110, and also makes the position of the inspection structure 220 more precise, facilitating accurate alignment of the inspection structure 220 with the holes in the brightening patch 320.

[0049] refer to Figures 1 to 3In some embodiments, the inspection structure 220 is movably connected to the second guide 230 along the second direction. This connection is used to adjust the position of the inspection structure 220 in the second direction, while the second guide 230 guides the movement of the inspection structure 220. Since the brightness enhancement tape 320 comes in different sizes, the distance between the holes of the side-by-side brightness enhancement tape 320 along the second direction also varies. By adjusting the position of the inspection structure 220 in the second direction, the inspection structure 220 can be accurately aligned with the holes of the brightness enhancement tape 320, which helps improve the adaptability of the inspection device to brightness enhancement tapes 320 of different sizes.

[0050] It should be noted that for each of the brightening patches 320 conveyed side-by-side along the first direction, the holes between adjacent brightening patches 320 are spaced apart in both the first and second directions. When the locking structure 210 is in the unlocked state, the locking structure 210 can move along the first guide 110 to adjust the position of each inspection structure 220 in the first direction. Simultaneously, the inspection structures 220 can also move along the second guide 230 to adjust their position in the second direction. In this way, the position adjustment of the inspection structures 220 in both the first and second directions is achieved, facilitating accurate alignment of the inspection structures 220 with the holes.

[0051] Specifically, the inspection structure 220 includes an inspection base 221 and an inspection bolt. The inspection base 221 has a first inspection hole extending in a second direction and a second inspection hole communicating with the first inspection hole. The second inspection hole has an internal thread. A portion of the second guide member 230 is located in the first inspection hole, and the inspection bolt passes through the second inspection hole and is threadedly connected to the inspection base 221. When the inspection bolt is screwed in and extends into the first inspection hole, abutting against the second guide member 230, the inspection structure 220 is fixed relative to the second guide member 230. When the inspection bolt is unscrewed and separates from the second guide member 230, the inspection structure 220 can move relative to the second guide member 230 in the second direction, thereby completing the position adjustment of the inspection structure 220 in the second direction.

[0052] refer to Figures 1 to 3 In other embodiments, the surface of the second guide 230 is provided with a scale, which can serve as a reference for adjusting the position of the inspection structure 220 along the second direction. The scale allows for a direct understanding of the distance the inspection structure 220 has moved, enabling more precise position adjustment. This not only improves the positional accuracy of the inspection structure 220 but also reduces repetitive adjustments due to positional deviations, thereby increasing inspection efficiency. Simultaneously, precise positional adjustment allows the inspection structure 220 to quickly and accurately align with the holes even when dealing with different batches of brightening tapes 320 that are similar in size but have subtle differences, enhancing the versatility of the inspection device for inspecting various types of brightening tapes 320.

[0053] refer to Figures 1 to 3 In other embodiments, the inspection structure 220 and the second guide member 230 are rotatably connected. When the inspection bolt is separated from the second guide member 230, the inspection base 221 can rotate around the connection point with the second guide member 230, thereby adjusting the orientation of the inspection structure 220. When the inspection bolt is screwed in and abuts against the second guide member 230, the inspection base 221 and the second guide member 230 are relatively fixed. By rotating the inspection base 221, the inspection of tilted holes on the brightening patch 320 can be achieved. On the one hand, this improves the applicability of the inspection base 221, enabling it to meet the inspection needs of holes at different angles. On the other hand, it expands the application scenarios of the inspection device. For example, in some brightening patches 320 manufactured with special processes, the holes may be irregularly tilted due to process characteristics. The rotation of the inspection base 221 can ensure the inspection of tilted holes.

[0054] refer to Figures 1 to 3 In some embodiments, in the unlocked state, the locking structure 210 and the second guide 230 are movably connected along the second direction; in the locked state, the locking structure 210 and the second guide 230 are fixedly connected. The relative movement between the second guide 230 and the locking structure 210 can adjust the relative position of the second guide 230 in the second direction. Since the inspection structure 220 is connected to the second guide 230, the position of the inspection structure 220 along the second direction changes as the position of the second guide 230 changes. In this way, the inspection structures 220 in two adjacent sets of inspection components 200 can change their relative positions along the second direction, thereby adapting to the inspection requirements of different sizes of brightening patches 320 and further improving the flexibility of the inspection structure 220's position adjustment.

[0055] Specifically, the locking base has a second through hole extending in a second direction, and a second locking hole communicating with the second through hole. A portion of the second guide member 230 can pass into the second through hole. The wall of the second locking hole has a threaded structure, and the locking bolt passes into the second locking hole, forming a threaded connection with the locking base. When the locking bolt is screwed in and extends into the second through hole, abutting against the second guide member 230, relative movement between the locking base and the second guide member 230 is restricted, and the locking structure 210 is in a locked state. Conversely, by rotating the locking bolt, it is disengaged from the position abutting against the second guide member 230, allowing the second guide member 230 and the locking base to move relative to each other in the second direction, and the locking structure 210 is in an unlocked state.

[0056] refer to Figures 1 to 3In some embodiments, the inspection structure 220 includes a mounting base 222 and an inspection unit 223. Along the first direction, the mounting base 222 extends away from the second guide member 230, and the inspection unit 223 is movably connected to the mounting base 222. The inspection unit 223 may be an infrared unit. By moving the inspection unit 223 relative to the mounting base 222, the position of the inspection unit 223 in the first direction can be finely adjusted. This helps to adjust the position of the inspection unit 223 more accurately, so that the inspection operation can better meet the precise detection requirements of the holes of the light-enhancing tape 320, reduce the inspection error caused by position deviation, and improve the overall reliability of the inspection.

[0057] Specifically, the principle of this application for inspecting the hole positions is as follows: The infrared unit integrates an infrared emitter and an infrared receiver, with the infrared emitter facing the side where the brightness enhancement patch 320 is located. When the brightness enhancement patch 320 is conveyed in a stepping manner, the hole positions of the brightness enhancement patch 320 can correspond to the positions of the infrared emitter. If the hole positions are intact and free of waste residue, infrared light will irradiate the substrate carrying the brightness enhancement patch 320 and be reflected by the substrate; if there is residual brightness enhancement patch 320 or other debris at the hole positions, the infrared light will be blocked by these debris, and in this case, the infrared light will be reflected by the brightness enhancement patch 320 or other debris. Since the intensity of infrared light reflection received by the infrared receiver differs in these two different situations, this can be used to determine whether there is a problem with the missing waste discharge of the brightness enhancement patch 320.

[0058] It should be noted that the difference in infrared reflection intensity under these two conditions can be pre-measured, and the range of infrared reflection intensity corresponding to the detection of residual brightening tape 320 and other impurities within the aperture can be set as a benchmark. Furthermore, the infrared reflection intensity will also change when the color or material of the brightening tape 320 changes. Therefore, the sensitivity of the inspection can be improved by adjusting the receiver sensitivity, the wavelength of the infrared light, and the infrared emission power. This not only ensures the accuracy of the inspection and effectively prevents missed or incorrect detection of the brightening tape 320, but also allows for flexible adjustment of inspection parameters when dealing with brightening tape 320 with different characteristics, expanding the applicability of the inspection device and reducing inspection difficulties caused by product diversity.

[0059] refer to Figures 1 to 3In other embodiments, the inspection structure 220 includes an inspection base 221, a mounting base 222, and an inspection unit 223. The inspection base 221 is connected to the second guide member 230, while the mounting base 222 is detachably connected to the inspection base 221, facilitating position adjustment. Along the first direction, the mounting base 222 extends away from the inspection base 221. The inspection unit 223 is connected to the mounting base 222. The mounting base 222 provides the necessary installation space for position adjustment of the inspection unit 223, ensuring fine-tuning of its position along the first direction. Furthermore, in the event of long-term use, if either the inspection unit 223 or the mounting base 222 is damaged, the detachable connection allows for individual replacement of the component, reducing maintenance costs and extending the overall lifespan of the equipment. It also facilitates flexible replacement of mounting bases 222 and inspection units 223 with different specifications according to different inspection needs.

[0060] refer to Figures 1 to 3 In some embodiments, the mounting base 222 is provided with a guide groove 2221, which extends along a first direction. At least a portion of the inspection unit 223 is located within the guide groove 2221. The guide groove 2221 provides a guiding path for the movement of the inspection unit 223 relative to the mounting base 222. This design effectively prevents the inspection unit 223 from deflecting during position adjustment, thereby making the position adjustment of the inspection unit 223 along the first direction more precise. This helps improve the accuracy of hole detection of the brightness enhancement patch 320 and reduces detection errors caused by positional deviation of the inspection unit 223. It should be noted that the portion of the inspection unit 223 used for inspecting the hole is located outside the guide groove 2221. This layout ensures that the inspection unit 223 can directly act on the hole of the brightness enhancement patch 320, while the guide groove 2221 stably constrains the movement direction of the inspection unit 223.

[0061] refer to Figures 1 to 5In some embodiments, the inspection unit 223 includes an inspection probe 2231 and a limiting part 2232. Along a third direction, the limiting part 2232 is movably connected to the inspection probe 2231. A guide groove 2221 passes through the mounting base 222. The inspection probe 2231 enters the guide groove 2221 from a first side of the mounting base 222 and exits from a second side of the mounting base 222. The limiting part 2232 abuts against the first side of the mounting base 222. The first direction, the second direction, and the third direction are mutually perpendicular. The limiting part 2232 abuts against the mounting base 222 to limit the length of the inspection probe 2231 entering the guide groove 2221, thereby controlling the distance between the inspection probe 2231 and the light-enhancing patch 320. Furthermore, the limiting part 2232 can move relative to the inspection probe 2231, allowing for further adjustment of the length of the inspection probe 2231 inserted into the guide groove 2221. This ensures a suitable distance between the inspection probe 2231 and the brightness enhancement tape 320, which helps improve the accuracy of the inspection. For example, when inspecting brightness enhancement tapes 320 of different thicknesses, this method allows for flexible adjustment of the distance, ensuring that the inspection probe 2231 obtains more accurate test data.

[0062] Specifically, the third direction is vertical, and the inspection probe 2231 extends along this direction. The limiting part 2232 can be a nut. The outer peripheral wall of the inspection probe 2231 is threaded, and the limiting part 2232 is connected to the inspection probe 2231 via the thread. In this way, the limiting part 2232 can be adjusted relative to the inspection probe 2231 along the third direction. The mounting base 222 is provided with a guide groove 2221 that runs vertically along the third direction, and the brightening tape 320 is conveyed on the lower side of the mounting base 222. The inspection probe 2231 enters the guide groove 2221 from the first side (i.e., the upper side) of the mounting base 222 and exits from the second side (i.e., the lower side) of the mounting base 222. The limiting part 2232 abuts against the mounting base 222 on the first side, thereby limiting the exposed length of the inspection probe 2231 on the second side and realizing the adjustment of the distance between the inspection probe 2231 and the brightening tape 320.

[0063] refer to Figures 1 to 5In some embodiments, along a first direction, the mounting seats 222 in adjacent sets of inspection components 200 extend in opposite directions, thereby bringing the two sets of inspection components 200 closer together and making the structure of the inspection device more compact. Specifically, the inspection device includes two sets of inspection components 200, each set of inspection components 200 including a locking structure 210, an inspection structure 220, and a second guide member 230 extending along a second direction. The second guide member 230 is connected to the first guide member 110 via the locking structure 210, and the inspection structure 220 is connected to the second guide member 230. In the first direction, the mounting seats 222 in the inspection structure 220 each extend relative to the second guide member 230 connected to them in a direction away from the second guide member 230 in the adjacent set of inspection components 200. That is, the two mounting seats 222 are located on opposite sides of the two second guide members 230. The inspection unit 223 is mounted on the mounting base 222, thereby ensuring that the inspection unit 223 has sufficient travel along the first direction to meet the inspection requirements of different hole positions of the brightening patch 320, while the two second guide members 230 can be brought closer together, further optimizing the spatial layout of the inspection device and improving the structural compactness.

[0064] refer to Figures 1 to 5 In some embodiments, at least one inspection component 200 is provided with a plurality of inspection structures 220. Along the second direction, the inspection structures 220 in the same group of inspection components 200 are arranged at intervals, and along the first direction, adjacent two inspection structures 220 extend in opposite directions relative to the second guide member 230. Thus, each inspection component 200 includes at least two inspection positions, and the line connecting adjacent two inspection structures 220 has an angle relative to both the first and second directions to correspond to the holes of the brightening patch 320. Therefore, the hole position inspection of the brightening patch 320 can be realized by a single group of inspection components 200. Furthermore, when multiple groups of inspection components 200 work together, the hole position of the brightening patch 320 can be inspected multiple times, which greatly improves the accuracy of the inspection results.

[0065] Specifically, the inspection structure 220 includes a mounting base 222, an inspection base 221, and inspection units 223. The inspection base 221 is connected to the second guide member 230, and the mounting base 222 is connected to the inspection base 221. Along the second direction, within the same set of inspection components 200, two adjacent mounting bases 222 extend in the first direction in the opposite direction to the second guide member 230. This causes the line connecting the inspection units 223 mounted on the two mounting bases 222 to be inclined relative to both the first and second directions. Thus, the two inspection units 223 can respectively correspond to the holes of the parallel-conveyed brightening tape 320, thereby enabling the inspection of whether there is any missed discharge of waste material at the holes. Combined with multiple sets of inspection components 200, multiple re-inspections of the holes can be achieved, further improving the accuracy of the inspection, effectively reducing the product defect rate, improving product quality, reducing subsequent production problems caused by undetected hole defects, and saving production costs.

[0066] refer to Figures 1 to 6 According to the embodiments of this application, the die-cutting equipment includes a die-cutting machine 300 and an inspection device as described in any of the above embodiments. Along a first direction, the inspection device is arranged on the exit side of the die-cutting machine 300. The brightening adhesive 320 is conveyed along the first direction, passing sequentially through the die-cutting machine 300 and the inspection device. The die-cutting machine 300 includes an upper template and a lower template. Along a third direction, the upper template is connected to a cutting die. The upper and lower templates are close to each other to die-cut the brightening adhesive 320. The inspection device is used to inspect the holes in the die-cut brightening adhesive 320. In this way, defective products are screened and removed. A continuous production process is formed from die-cutting to inspection. Defective products are detected and handled promptly during production, effectively reducing resource waste caused by defective products flowing into subsequent processes. For example, in the subsequent assembly stage, the use of brightening adhesive 320 with hole defects can prevent the entire product assembly from failing, thereby improving production efficiency and product quality, and reducing overall production costs.

[0067] refer to Figures 1 to 6 In other embodiments, the die-cutting equipment also includes a control module 310, which is electrically connected to the die-cutting machine 300 and to the inspection device. The control module 310 is configured to send a stop signal to the die-cutting machine 300 when the inspection structure 220 detects a defective product, so that the die-cutting machine 300 stops the die-cutting operation, promptly interrupts the continuous production of defective products, avoids the accumulation of a large number of unqualified gloss-enhancing fabrics 320, and reduces the waste of raw materials.

[0068] It should be noted that, Figure 6 The dashed line indicates that the control module 310 is electrically connected to the die-cutting machine 300 and the inspection device.

[0069] refer to Figures 1 to 6The inspection method according to the embodiments of this application is used to detect the hole positions of brightening products using the inspection device in any of the above embodiments, so as to screen and remove brightening products that have not been discharged, and ensure the yield rate of brightening products. In operation, the length direction of the brightening product is arranged at an angle relative to the conveying direction. When die-cutting the brightening product, the hole positions of the die-cut product are inspected, and the die-cutting operation is stopped when a defective hole position is detected. Therefore, this inspection method achieves simultaneous die-cutting and inspection, greatly improving production efficiency; on the other hand, it can stop the machine immediately upon discovering a hole position defect, effectively avoiding the generation of a large number of defective products and ensuring the yield rate of brightening products.

[0070] Specifically, the brightening product is conveyed along a first direction. During conveying, the length direction of the brightening product forms a certain angle with the first direction, and its width direction also forms an angle relative to the first direction, meaning the brightening product is conveyed in an inclined posture. The brightening product moves one step distance at a time during conveying, and this distance can be precisely controlled by the PLC (Programmable Logic Controller) of the die-cutting machine 300. After conveying such a distance, the brightening product will remain stationary for a period of time, and the distance between the holes of two adjacent brightening products will be equal to this step distance.

[0071] During the pause period for brightening products, die-cutting machine 300 performs die-cutting operations on the brightening products awaiting die-cutting, while the inspection device simultaneously checks the holes in the die-cut brightening products. Because brightening products reflect infrared light well, if any brightening product remains in the holes, it will reflect infrared light, causing the red light on the inspection device to illuminate. This indicates that the inspection device has received strong infrared reflection, and the corresponding brightening product is judged as defective. The die-cutting operation is then stopped, and a stop notification is sent to the operator. Conversely, when there is no brightening product residue in the holes, the infrared reflection is weak, the red light on the inspection device does not illuminate, and the die-cutting and inspection operations can continue.

[0072] The embodiments of this application have been described in detail above with reference to the accompanying drawings. However, this application is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of this application. Furthermore, unless otherwise specified, the embodiments and features described in the embodiments of this application can be combined with each other.

Claims

1. An inspection apparatus characterized by comprising: Comprising: a guide assembly comprising a first guide extending along a first direction; at least two groups of inspection assemblies arranged along the first direction, the inspection assembly comprising a locking structure, an inspection structure and a second guide extending along a second direction, the locking structure being movably connected with the first guide, the locking structure being connected with the second guide, the inspection structure being connected with the second guide, the inspection structures in adjacent two groups of the inspection assemblies being arranged staggered along the second direction, the first direction being perpendicular to the second direction; wherein the locking structure has an unlocked state and a locked state, in the unlocked state, the locking structure is movable relative to the first guide along the first direction, in the locked state, the locking structure is relatively fixed with the first guide.

2. The inspection apparatus of claim 1, wherein Along the second direction, the inspection structure is movably connected with the second guide.

3. The testing device according to claim 1 or 2, characterized in that In the unlocked state, along the second direction, the locking structure is movably connected with the second guide, in the locked state, the locking structure is fixedly connected with the second guide.

4. The inspection apparatus of claim 1, wherein The inspection structure comprises a mounting seat and an inspection unit, along the first direction, the mounting seat extends in a direction away from the second guide, and the inspection unit is movably connected with the mounting seat.

5. The inspection apparatus of claim 4, wherein, The mounting seat is provided with a guide groove extending along the first direction, and at least a part of the inspection unit is located in the guide groove.

6. The inspection apparatus of claim 5, wherein, The inspection unit comprises an inspection probe and a limiting part, along a third direction, the limiting part is movably connected with the inspection probe, the guide groove penetrates through the mounting seat, the inspection probe penetrates into the guide groove from a first side of the mounting seat and penetrates out of the guide groove from a second side of the mounting seat, and the limiting part abuts against the first side of the mounting seat, the first direction, the second direction and the third direction are perpendicular to each other.

7. The inspection apparatus of claim 4, wherein Along the first direction, the mounting seats in adjacent two groups of the inspection assemblies extend in opposite directions.

8. The inspection apparatus of claim 1, wherein, At least one of the inspection assemblies is provided with a plurality of inspection structures, along the second direction, the inspection structures in the same group of the inspection assemblies are arranged spaced apart, and along the first direction, adjacent two of the inspection structures extend in opposite directions relative to the second guide.

9. A die cutting apparatus characterized by, Comprising: a die cutting machine; the inspection device of any one of claims 1 to 8, along the first direction, the inspection device is arranged on an outlet side of the die cutting machine.

10. The die cutting apparatus of claim 9, wherein, The die cutting device further comprises a control module, the control module being electrically connected with the die cutting machine, and the control module being electrically connected with the inspection device; wherein the control module is configured to feed a stop signal to the die cutting machine when the inspection structure inspects a defective product.

Images