Electronic device test fixture and electronic device test system
By designing test fixtures for electronic devices with pins of different sizes, the problem of low testing efficiency in existing technologies has been solved, stable electrical connections and electrical safety have been achieved, and testing efficiency has been improved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-13
- Publication Date
- 2026-03-10
AI Technical Summary
In the existing technology, a single test base is usually only suitable for electronic device pins of a fixed size, which makes it difficult to meet the testing needs of pins of different sizes, resulting in low testing efficiency.
An electronic device test fixture has been designed, including a sleeve, a pressure-applying component, and a conductive spring. Through the connection of multiple components of the sleeve and the setting of the insulating shell, it can accommodate pins of different sizes and ensure a stable electrical connection between the pins and the test power supply.
This fixture can be used to fix pins of different sizes, improving testing efficiency, eliminating the need to change fixtures, reducing the risk of accidental electric shock, and enhancing electrical safety.
Smart Images
Figure CN223986152U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of electronic device testing technology, and in particular to electronic device testing fixtures and electronic device testing systems. Background Technology
[0002] When testing electronic devices (such as relays), it is necessary to energize the device's pins. Currently, this is typically achieved by using metal springs on a test socket to hold the pins in place and connecting the test socket to a test power supply. However, a single test socket is usually only suitable for fixing pins of a specific size, making it difficult to meet the needs of fixing pins of different sizes and thus the testing requirements of electronic devices with different pin sizes. Testing electronic devices with different pin sizes requires using different models of test sockets, reducing testing efficiency. Utility Model Content
[0003] Therefore, it is necessary to provide an electronic device test fixture and an electronic device test system to address the above problems.
[0004] To address the above problems, this application provides the following technical solution:
[0005] An electronic device test fixture, the electronic device test fixture comprising:
[0006] A sleeve having a first part, a second part, and a third part that are fixedly connected in sequence, with the first part and the third part being arranged opposite to each other;
[0007] The pressure-applying component is threadedly connected to the first part; and
[0008] A conductive spring, one end of which extends into the sleeve to form an accommodating space between the conductive spring and the third part; the other end of the conductive spring is used to connect to a test power supply.
[0009] The second part has a first notch aligned with the accommodating space.
[0010] This electronic device test fixture has at least the following beneficial effects:
[0011] When using this electronic device test fixture, the conductive spring is always electrically connected to the test power supply. The pins of the electronic device under test are inserted into the receiving space, and then the pressure-applying component is gradually tightened. The distance between the conductive spring and the third part gradually decreases. After tightening the pressure-applying component until it can no longer be tightened, the conductive spring and the third part together clamp the pin, thus fixing the pin and stably connecting it to the test power supply through the spring. If the pin size of the electronic device under test is small, the pin can be placed within the receiving space; if the pin size is large, part of the pin can be placed within the receiving space, and the other part within the first notch. In other words, this electronic device test fixture is suitable for fixing pins of different sizes, meeting the needs of fixing pins of different sizes. When testing electronic devices with different pin sizes, it is not necessary to change the electronic device test fixture, thus improving testing efficiency.
[0012] In one embodiment, the sleeve further includes a fourth part, wherein the first part, the second part, the third part, and the fourth part are connected end to end in sequence.
[0013] This design makes the sleeve less prone to deformation, thus improving its strength and stability.
[0014] In one embodiment, the fourth part has a second notch, and the second notch, the accommodating space and the first notch are aligned in sequence.
[0015] With this configuration, if the pin size is large, the various parts of the pin can be placed separately within the accommodating space, the first notch, and the second notch. In other words, this makes the electronic device test fixture suitable for fixing larger pin sizes, thereby expanding the applicability of the electronic device test fixture.
[0016] In one embodiment, the electronic device test fixture further includes an insulating shell, which is fitted onto the sleeve, and the conductive spring is fixedly connected to the insulating shell.
[0017] With this design, the insulating shell can provide electrical isolation, reducing the possibility of accidental electric shock to test personnel and preventing the electronic device test fixture from being accidentally grounded, which could lower the test results.
[0018] In one embodiment, the sleeve is fixedly connected to the insulating housing, and the pressure-applying member passes through the insulating housing.
[0019] With this setup, as the pressure-applying component is gradually tightened, the conductive spring gradually deforms toward the third part and moves closer to it. The distance between the conductive spring and the third part gradually decreases. After the pressure-applying component is tightened until it can no longer be tightened, the conductive spring and the third part together clamp the pin.
[0020] In one embodiment, the pressure-applying member includes a head and a threaded portion. The head is embedded in the insulating housing and is rotatable relative to the insulating housing. The threaded portion is fixed to the side of the head that is relatively close to the first portion. The pressure-applying member is threadedly connected to the first portion through the threaded portion. The sleeve is slidably connected to the insulating housing along the rotation axis of the head relative to the insulating housing.
[0021] With this setup, as the pressure-applying component is gradually tightened, the head and threaded part rotate in place, the sleeve slides relative to the insulating shell, the third part gradually approaches the conductive spring, and the distance between the conductive spring and the third part gradually decreases. After the pressure-applying component is tightened until it can no longer be tightened, the conductive spring and the third part together clamp the pin.
[0022] In one embodiment, the insulating housing is spaced apart from the second part.
[0023] This configuration leaves space between the insulating housing and the second part, which can also be used to accommodate pins. This makes the electronic device test fixture suitable for fixing larger pins, thereby expanding the applicability of the electronic device test fixture.
[0024] In one embodiment, the sleeve further includes a fourth part, wherein the first part, the second part, the third part and the fourth part are connected end to end in sequence; the fourth part has a second notch, and the second notch, the accommodating space and the first notch are aligned in sequence; the insulating shell is spaced apart from the fourth part.
[0025] This configuration leaves space between the insulating housing and the fourth part, which can also be used to accommodate pins. This makes the electronic device test fixture suitable for fixing larger pins, thereby expanding the applicability of the electronic device test fixture.
[0026] In one embodiment, the insulating housing is spaced apart from the first part; and / or, the insulating housing is spaced apart from the third part.
[0027] This design, by leaving an air gap, improves the insulation performance of the electronic device test fixture and helps ensure its electrical safety.
[0028] This application also provides an electronic device testing system, which includes a test power supply and the aforementioned electronic device test fixture, wherein the conductive spring is electrically connected to the test power supply.
[0029] This electronic device testing system has at least the following beneficial effects:
[0030] In this electronic device testing system, the pins of the electronic device under test are inserted into the receiving space. Then, the pressure-applying component is gradually tightened, gradually reducing the distance between the conductive spring and the third part. Once the pressure-applying component can no longer be tightened, the conductive spring and the third part together clamp the pin, thus fixing it in place. The pin is then stably connected to the test power supply via the spring. If the pin size of the electronic device under test is small, the pin can be placed within the receiving space; if the pin size is large, part of the pin can be placed within the receiving space, and the other part within the first notch. In other words, this electronic device testing fixture is suitable for fixing pins of different sizes, meeting the needs of fixing pins of various sizes. When testing electronic devices with different pin sizes, it is not necessary to change the electronic device testing fixture, thus improving testing efficiency. Attached Figure Description
[0031] Figure 1 This is a three-dimensional structural schematic diagram of an electronic device test fixture according to an embodiment of this application;
[0032] Figure 2 for Figure 1 The front view of the electronic device test fixture shown;
[0033] Figure 3 for Figure 2 The electronic device test fixture shown is a cross-sectional view along section line AA.
[0034] Figure label:
[0035] 1. Sleeve; 11. First part; 12. Second part; 121. First notch; 13. Third part; 14. Fourth part; 141. Second notch; 2. Pressure-applying component; 21. Head; 22. Threaded part; 3. Conductive spring; 4. Accommodating space; 5. Insulating shell; 6. Lead wire. Detailed Implementation
[0036] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0037] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0038] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0039] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0040] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0041] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.
[0042] See Figures 1 to 3 This application first provides an electronic device test fixture, which includes a sleeve 1, a pressure-applying member 2, and a conductive spring 3. The sleeve 1 has a first part 11, a second part 12, and a third part 13 that are fixedly connected in sequence, with the first part 11 and the third part 13 arranged opposite to each other. The pressure-applying member 2 is threadedly connected to the first part 11. One end of the conductive spring 3 extends into the sleeve 1 to form an accommodating space 4 between the conductive spring 3 and the third part 13; the other end of the conductive spring 3 is used to connect to a test power supply. The second part 12 has a first notch 121 aligned with the accommodating space 4.
[0043] When using this electronic device test fixture, the conductive spring 3 is always electrically connected to the test power supply. The pins of the electronic device to be tested are inserted into the receiving space 4, and then the pressure member 2 is gradually tightened. The distance between the conductive spring 3 and the third part 13 gradually decreases. After tightening the pressure member 2 until it can no longer be tightened, the conductive spring 3 and the third part 13 together clamp the pin, thus fixing the pin and stably connecting it to the test power supply through the spring. If the pin size of the electronic device to be tested is small, the pin can be placed inside the receiving space 4; if the pin size is large, part of the pin can be placed inside the receiving space 4, and the other part inside the first notch 121. In other words, this electronic device test fixture is suitable for fixing pins of different sizes, meeting the needs of fixing pins of different sizes. When testing electronic devices with different pin sizes, it is not necessary to change the electronic device test fixture, thus improving testing efficiency.
[0044] See Figure 1 and Figure 2 The sleeve 1 also includes a fourth part 14, with the first part 11, the second part 12, the third part 13, and the fourth part 14 connected end to end in sequence. In this way, the sleeve 1 is not easily deformed, which can improve the strength and stability of the sleeve 1.
[0045] See Figure 1 and Figure 2The fourth part 14 has a second notch 141, and the second notch 141, the accommodating space 4, and the first notch 121 are aligned in sequence. If the pin size is large, the various parts of the pin can be placed in the accommodating space 4, the first notch 121, and the second notch 141 respectively. In other words, this makes the electronic device test fixture suitable for fixing larger pin sizes, thereby expanding the applicability of the electronic device test fixture.
[0046] See Figures 1 to 3 The electronic device test fixture also includes an insulating shell 5, which is fitted onto the sleeve 1, and the conductive spring 3 is fixedly connected to the insulating shell 5. The insulating shell 5 provides electrical isolation, reducing the possibility of accidental electric shock to test personnel and preventing accidental grounding of the electronic device test fixture, which could lower the test results.
[0047] For example, the material of the insulating shell 5 is selected from, but is not limited to, polycarbonate, polyvinyl chloride, polyethylene terephthalate, and epoxy resin.
[0048] See Figures 1 to 3 The sleeve 1 is fixedly connected to the insulating shell 5, and the pressure-applying component 2 passes through the insulating shell 5. Thus, as the pressure-applying component 2 is gradually tightened, the conductive spring 3 gradually deforms towards the third part 13 and gradually approaches the third part 13, gradually reducing the distance between the conductive spring 3 and the third part 13. After tightening the pressure-applying component 2 until it can no longer be tightened, the conductive spring 3 and the third part 13 together clamp the pin. Preferably, when the pressure-applying component 2 is tightened to the point where it can no longer be tightened, the pressure-applying component 2 is located within the space enclosed by the outer surface of the insulating shell 5. In other words, at this time, the pressure-applying component 2 does not protrude from the outer surface of the insulating shell 5, but is only visible from the outside of the insulating shell 5. This reduces the possibility of accidental electric shock to the tester and helps prevent the electronic device test fixture from accidentally grounding and reducing the possibility of lower test results.
[0049] See Figures 1 to 3 The pressure-applying component 2 includes a head 21 and a threaded portion 22. The head 21 has a slotted / cross-head / hex socket and is visible from the outside of the insulating housing 5. The user can apply force to the head 21 with a screwdriver to tighten the pressure-applying component 2. For example, the pressure-applying component 2 is a bolt or screw.
[0050] In some embodiments, the head 21 is embedded in the insulating housing 5 and can rotate relative to the insulating housing 5. The threaded portion 22 is fixed to the side of the head 21 that is relatively close to the first part 11. The pressure member 2 is threadedly connected to the first part 11 through the threaded portion 22. The sleeve 1 is slidably connected to the insulating housing 5 and slides relative to the insulating housing 5 along the rotation axis of the head 21 relative to the insulating housing 5. Thus, during the gradual tightening of the pressure member 2, the head 21 and the threaded portion 22 rotate in place, the sleeve 1 slides relative to the insulating housing 5, and the third part 13 gradually approaches the conductive spring 3. The distance between the conductive spring 3 and the third part 13 gradually decreases. After tightening the pressure member 2 until it can no longer be tightened, the conductive spring 3 and the third part 13 together clamp the pin. It is worth mentioning that the head 21 is embedded in the insulating housing 5, which can reduce the possibility of accidental electric shock to the test personnel and help prevent the electronic device test fixture from being accidentally grounded, thus reducing the possibility of reduced test results. For example, the insulating shell 5 is provided with an annular groove, the head 21 is adapted to the annular groove and located in the annular groove to form a rotatable connection with the annular groove; a protrusion is provided between the second part 12 and the insulating shell 5, and a protrusion is also provided between the fourth part 14 and the insulating shell 5. Each protrusion is fixed to one of the insulating shell 5 and the sleeve 1 and abuts against the other, so that the sleeve 1 and the insulating shell 5 form a sliding connection.
[0051] See Figure 1 and Figure 2 The insulating housing 5 and the second part 12 are spaced apart. In this way, a space is left between the insulating housing 5 and the second part 12, which can also be used to accommodate pins. This makes the electronic device test fixture suitable for fixing larger pins, thereby expanding the applicability of the electronic device test fixture.
[0052] See Figure 1 and Figure 2 In some embodiments where the sleeve 1 includes a fourth portion 14 and the fourth portion 14 has a second notch 141, the insulating housing 5 is spaced apart from the fourth portion 14. This creates a space between the insulating housing 5 and the fourth portion 14, which can also be used to accommodate pins. This makes the electronic device test fixture suitable for fixing larger pins, thereby expanding the applicability of the electronic device test fixture.
[0053] See Figure 1 and Figure 2 The insulating outer shell 5 is spaced apart from the first part 11. This creates an air gap between the insulating outer shell 5 and the first part 11, which improves the insulation performance of the electronic device test fixture and helps ensure its electrical safety.
[0054] See Figure 1 and Figure 2 The insulating shell 5 and the third part 13 are spaced apart. In this way, an air gap is left between the insulating shell 5 and the first part 11, which can improve the insulation performance of the electronic device test fixture and help ensure the electrical safety of the electronic device test fixture.
[0055] For example, both the conductive spring 3 and the sleeve 1 are made of copper. This reduces the contact resistance between the pins and the electronic device test fixture, which helps improve the reliability of the test results.
[0056] In other embodiments, the conductive spring 3 and the sleeve 1 may also be made of a copper-zinc alloy.
[0057] For example, the pressure-applying component 2 is made of carbon steel or a copper-zinc alloy.
[0058] In some embodiments, the sleeve 1 is made of insulating material. In these embodiments, the sleeve 1 serves as insulation, and the aforementioned insulating outer shell 5 may not be provided in the electronic device test fixture, with the conductive spring 3 fixed to the sleeve 1.
[0059] See Figure 1 and Figure 3 The electronic device test fixture also includes lead wires 6, which are soldered to conductive springs 3, and the conductive springs 3 are electrically connected to the test power supply through the lead wires 6.
[0060] This application further provides an electronic device testing system, which includes a test power supply and the aforementioned electronic device testing fixture, with a conductive spring 3 electrically connected to the test power supply. In this electronic device testing system, the pins of the electronic device to be tested are inserted into the receiving space 4, and then the pressure-applying component 2 is gradually tightened. The distance between the conductive spring 3 and the third part 13 gradually decreases. After tightening the pressure-applying component 2 until it can no longer be tightened, the conductive spring 3 and the third part 13 together clamp the pin, thus fixing the pin and stably connecting it to the test power supply via the spring. If the pin size of the electronic device to be tested is small, the pin can be placed within the receiving space 4; if the pin size is large, part of the pin can be placed within the receiving space 4, and the other part within the first notch 121. In other words, this electronic device testing fixture is suitable for fixing pins of different sizes, meeting the needs of fixing pins of different sizes. When testing electronic devices with different pin sizes, it is not necessary to change the electronic device testing fixture, thus improving testing efficiency.
[0061] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0062] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of protection of this application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these modifications and improvements all fall within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the appended claims.
Claims
1. An electronic device test fixture, characterized by, The electronic device test fixture comprises: a sleeve (1) having a first part (11), a second part (12) and a third part (13) fixedly connected in sequence, the first part (11) and the third part (13) being oppositely arranged; a pressing member (2) threadedly connected to the first part (11); and a conductive spring plate (3), one end of the conductive spring plate (3) extending into the sleeve (1) to form a containing space (4) between the conductive spring plate (3) and the third part (13), the other end of the conductive spring plate (3) being used for connecting a test power supply; the second part (12) being provided with a first notch (121) aligned with the containing space (4).
2. The electronic device test fixture of claim 1, wherein, The sleeve (1) further comprises a fourth part (14), and the first part (11), the second part (12), the third part (13) and the fourth part (14) are sequentially and fixedly connected end to end.
3. The electronic device test fixture of claim 2, wherein, The fourth part (14) is provided with a second notch (141), and the second notch (141), the containing space (4) and the first notch (121) are sequentially aligned.
4. The electronic device test fixture of claim 1, wherein, The electronic device test fixture further comprises an insulating shell (5), and the insulating shell (5) is sleeved on the sleeve (1), and the conductive spring plate (3) is fixedly connected to the insulating shell (5).
5. The electronic device test fixture of claim 4, wherein, The sleeve (1) is fixedly connected to the insulating shell (5), and the pressing member (2) penetrates through the insulating shell (5).
6. The electronic device test fixture of claim 4, wherein, The pressing member (2) comprises a head part (21) and a threaded part (22), the head part (21) is embedded in the insulating shell (5) and can rotate relative to the insulating shell (5), the threaded part (22) is fixedly arranged on one side of the head part (21) close to the first part (11), and the pressing member (2) is threadedly connected to the first part (11) through the threaded part (22); the sleeve (1) is slidingly connected to the insulating shell (5) along the rotation axis of the head part (21) relative to the insulating shell (5).
7. The electronic device test fixture of claim 5 or claim 6, wherein, The insulating shell (5) is spaced apart from the second part (12).
8. The electronic device test fixture of claim 7, wherein, The sleeve (1) further comprises a fourth part (14), and the first part (11), the second part (12), the third part (13) and the fourth part (14) are sequentially and fixedly connected end to end; the fourth part (14) is provided with a second notch (141), and the second notch (141), the containing space (4) and the first notch (121) are sequentially aligned; and the insulating shell (5) is spaced apart from the fourth part (14).
9. The electronic device test fixture of claim 8, wherein, The insulating shell (5) is spaced apart from the first part (11); and / or, the insulating shell (5) is spaced apart from the third part (13).
10. An electronic device testing system, characterized by, The electronic device test fixture comprises a test power supply and the electronic device test fixture according to any one of claims 1 to 9, and the conductive spring plate (3) is electrically connected to the test power supply.