Universal testing device for digital quantity and analog quantity
By designing a general-purpose testing device that includes a core processing board and cavity structure, the problems of single function and low efficiency in the existing technology are solved, realizing multi-functional testing of digital and analog quantities, and improving testing efficiency and overall equipment performance.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-30
- Publication Date
- 2026-03-10
Smart Images
Figure CN223986169U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of digital quantity testing and analog quantity testing technology, and in particular to a universal testing device that can be used for both digital quantity testing and analog quantity testing. Background Technology
[0002] Every product requires various tests during development to ensure its correctness. For embedded products, this typically includes both software and hardware testing. Software testing usually requires writing corresponding test software on a computer, while hardware testing usually requires many external testing devices, such as multimeters, power supplies, oscilloscopes, and spectrum analyzers.
[0003] Currently, most testing equipment is relatively independent and has a limited function, capable of testing only specific functions. For slightly more complex embedded systems, it is usually necessary to use many peripheral testing devices for joint testing. The more testing devices and cables there are, the lower the testing efficiency and the higher the probability of operation errors. Severe operation errors may directly damage the product itself.
[0004] Currently, individual products are becoming increasingly complex, and the number of testing items for individual products is also increasing. In order to meet the more diverse and complex testing needs, there is an urgent need for a multifunctional testing device to improve testing efficiency. Utility Model Content
[0005] Therefore, the technical problem to be solved by this utility model is to overcome the technical problems of single function and low testing efficiency of the existing testing devices, thereby providing a general-purpose testing device for digital and analog quantities.
[0006] To achieve the above objectives, this utility model provides the following technical solution:
[0007] This utility model provides a general-purpose testing device for digital and analog quantities, including: a core processing board and a cavity structure.
[0008] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the core processing board mainly comprises two parts: a signal processing module and an analog power supply module.
[0009] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the signal processing module includes ARM architecture and FPGA architecture sub-modules.
[0010] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the analog power supply module includes two sub-modules: an input measurement sub-module and an output control sub-module. The input measurement sub-module is used to measure the input voltage, and the output control sub-module is used to output a specified voltage value.
[0011] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the aforementioned ARM architecture submodule and FPGA architecture submodule communicate at high speed through the AXI high-speed protocol.
[0012] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the cavity structure includes multiple external interfaces.
[0013] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the aforementioned multiple external interfaces consist of a power interface, a display interface, a digital quantity testing interface, and an analog quantity testing interface.
[0014] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the digital testing interface consists of an LVDS testing interface, a differential testing interface, and a single-ended testing interface.
[0015] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the digital testing interface comprises multiple LVDS testing interfaces.
[0016] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the analog quantity testing interface consists of an input quantity testing interface and an output quantity testing interface.
[0017] This invention solves the technical problems of limited functionality and low testing efficiency in existing testing devices, and achieves the technical effect of enriching the functions of testing devices and improving testing efficiency. Attached Figure Description
[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other embodiments can be obtained based on these drawings without creative effort.
[0019] Figure 1 A schematic diagram of the core board architecture of a general-purpose testing device for digital and analog quantities provided in this embodiment of the utility model;
[0020] Figure 2 A schematic diagram of the cavity structure of a general-purpose testing device for digital and analog quantities provided in an embodiment of this utility model; Detailed Implementation
[0021] Embodiments of the present invention will now be described in more detail with reference to the accompanying drawings. While some embodiments of the present invention are shown in the drawings, it should be understood that embodiments of the present invention can be implemented in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of the embodiments of the present invention. It should be understood that the accompanying drawings and embodiments of the present invention are for illustrative purposes only and are not intended to limit the scope of protection of the embodiments of the present invention.
[0022] Figure 1 This is a schematic diagram of the core board architecture of a general-purpose testing device for digital and analog quantities provided in an embodiment of the present invention. Figure 2 A schematic diagram of the cavity structure of a general-purpose testing device for digital and analog quantities provided in this embodiment of the present invention is shown below. Figure 1 , Figure 2 As shown, this utility model provides a general-purpose testing device for digital and analog quantities, including: a core processing board and a cavity structure.
[0023] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the core processing board mainly comprises two parts: a signal processing module and an analog power supply module.
[0024] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the signal processing module includes ARM architecture and FPGA architecture sub-modules. The ARM architecture sub-module can run a Linux system, while the FPGA architecture sub-module can develop digital communication interfaces such as UART, SPI, and LVDS. The software running on the Linux system is a terminal that can control the FPGA communication interface type and data transmission and reception, as well as edit transmitted data and parse received data.
[0025] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the analog power supply module includes two sub-modules: an input measurement sub-module and an output control sub-module. The input measurement sub-module is used to measure the input voltage, and the output control sub-module is used to output a specified voltage value.
[0026] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the aforementioned ARM architecture submodule and FPGA architecture submodule communicate at high speed through the AXI high-speed protocol.
[0027] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the cavity structure includes multiple external interfaces.
[0028] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the aforementioned multiple external interfaces consist of a power interface, a display interface, a digital quantity testing interface, and an analog quantity testing interface.
[0029] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the digital testing interface consists of an LVDS testing interface, a differential testing interface, and a single-ended testing interface.
[0030] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the digital testing interface comprises multiple LVDS testing interfaces.
[0031] Furthermore, according to the aforementioned general-purpose testing device for digital and analog quantities, the analog quantity testing interface consists of an input quantity testing interface and an output quantity testing interface.
[0032] This invention solves the technical problems of limited functionality and low testing efficiency in existing testing devices, thereby achieving the technical effect of enriching the functions of testing devices and improving testing efficiency.
[0033] The term "embodiment" in this specification refers to a specific feature, structure, or characteristic described in connection with an embodiment that may be included in at least one embodiment of the present invention. The appearance of this phrase in various places in the specification does not necessarily imply the same embodiment, nor does it imply independence or alternativeity from other embodiments. The various embodiments in this specification are described in a related manner, with reference to each other for similar or identical parts. In particular, for apparatus, device, and system embodiments, since they are substantially similar to method embodiments, the description is relatively simple, and relevant details are referred to in the description of the method embodiments.
[0034] The above embodiments are merely illustrative of several implementations of this utility model, and their descriptions are relatively specific and detailed. However, they should not be construed as limiting the scope of patent protection. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the appended claims.
Claims
1. A general-purpose testing device for digital and analog quantities, characterized by, Comprise: Core processing board, cavity structure; Wherein, The core processing board mainly contains signal processing module and analog power module two parts, the signal processing module contains ARM architecture and FPGA architecture submodule; The cavity structure contains a plurality of external interface, the plurality of external interface is composed of power interface, display interface, digital test interface and analog test interface, the digital test interface is composed of LVDS test interface, differential test interface and single-ended test interface.
2. The universal testing device of claim 1, wherein, The analog power module contains input measurement and output control two submodules, wherein the input measurement submodule is used for measuring the input voltage, and the output control module is used for outputting the specified voltage value.
3. The universal testing device of claim 1, wherein, The ARM architecture submodule and FPGA architecture submodule communicate at high speed through AXI high-speed protocol.
4. The universal testing apparatus of claim 1, wherein , The number of LVDS test interface in the digital test interface is multiple.
5. The universal testing machine of claim 1, wherein , The analog test interface is composed of input test interface and output test interface.