Assembly testing device

By designing an assembly and testing device that integrates auxiliary light source, simulated light source and probe, the problems of low efficiency and damage in assembly and testing during the production of non-standard batteries are solved, and efficient and accurate assembly and testing are achieved.

CN224035264UActive Publication Date: 2026-03-24NANJING GUANGXIAN TECH CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-11
Publication Date
2026-03-24

AI Technical Summary

Technical Problem

In the production of non-standard batteries, assembling and testing photovoltaic modules is time-consuming and labor-intensive, and the modules are easily damaged during handling, affecting the test results and efficiency.

Method used

An assembly and testing device was designed, which integrates auxiliary light source, simulated light source and probe, realizing assembly, simulated testing environment and detection function in one, reducing handling steps and improving production and testing efficiency.

Benefits of technology

It improves the quality and efficiency of assembly and testing, reduces external interference, and ensures safe handling and accurate testing of components during the production process.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN224035264U_ABST
    Figure CN224035264U_ABST
Patent Text Reader

Abstract

The utility model discloses an assembly testing device, and belongs to the field of photovoltaic technology. The assembly testing device comprises a mounting seat, an auxiliary light source, a simulation light source and a probe, the mounting seat forms a containing cavity, the mounting seat is provided with a bearing area, and the bearing area is made of a transparent material and is suitable for placing a test piece to be assembled; the auxiliary light source is arranged in the accommodating cavity, and the auxiliary light source is suitable for penetrating through the bearing area to irradiate the to-be-assembled test piece; the simulation light source is arranged in the accommodating cavity, and the simulation light source is suitable for penetrating through the bearing area to irradiate the to-be-assembled test piece; the probe is arranged on the mounting seat and is suitable for being electrically connected with the to-be-assembled test piece to form a test loop. And the respective quality and efficiency of production and detection of the to-be-assembled test piece are improved.
Need to check novelty before this filing date? Find Prior Art

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of photovoltaic technology, and particularly relates to an assembling and testing device. BACKGROUND

[0002] In the production process of non-standard batteries, it is often necessary to first assemble battery pieces, welding strips, EVA adhesive films and glass back plates into photovoltaic modules on an assembling workbench, and then move the photovoltaic modules to a detection platform for electroluminescence detection. This not only consumes time and effort, increases the overall production time of the battery, but also may cause damage to the photovoltaic modules due to vibration or collision during the moving process, thereby affecting the detection results and efficiency. CONTENT OF THE UTILITY MODEL

[0003] The present application aims to at least solve one of the technical problems existing in the prior art. To this end, the present application provides an assembling and testing device, which improves the quality and efficiency of production and detection of the to-be-assembled and tested piece.

[0004] In a first aspect, the present application provides an assembling and testing device, comprising:

[0005] The assembling and testing device is characterized in that it comprises:

[0006] A mounting seat forms a containing cavity, and the mounting seat has a bearing area made of a transparent material and adapted to place a to-be-assembled and tested piece;

[0007] An auxiliary light source is arranged in the containing cavity, and the auxiliary light source is adapted to irradiate the to-be-assembled and tested piece through the bearing area;

[0008] An analog light source is arranged in the containing cavity, and the analog light source is adapted to irradiate the to-be-assembled and tested piece through the bearing area;

[0009] A probe is arranged on the mounting seat and is adapted to electrically connect with the to-be-assembled and tested piece to form a test loop.

[0010] According to the assembling and testing device of the present application, the assembling and testing device integrates the auxiliary assembly, the simulation testing environment and the detection function, reduces the moving of the to-be-assembled and tested piece in the production process, and improves the production quality, efficiency and detection accuracy. In addition, the auxiliary light source and the analog light source are both located in the containing cavity, which can make the assembling and testing device compact in structure, reduce the possibility of external interference, and improve the efficiency of assembly and detection of the to-be-assembled and tested piece.

[0011] According to one embodiment of the present application, the bearing area extends along a first direction, and the length of the auxiliary light source extends along the first direction; and / or

[0012] The side of the auxiliary light source facing the bearing area comprises a first arc surface, and the center of curvature of the first arc surface is away from the bearing area; and / or

[0013] The outer wall of the simulated light source comprises a second arc surface, and the center of curvature of the second arc surface is away from the bearing area.

[0014] According to one embodiment of the present application, the side of the simulated light source facing the bearing area is recessed to form a groove in a direction away from the bearing area.

[0015] According to one embodiment of the present application, the auxiliary light source is an LED lamp; and / or

[0016] The simulated light source is a halogen lamp.

[0017] According to one embodiment of the present application, a plurality of auxiliary light sources and a plurality of simulated light sources are provided, and the auxiliary light sources and the simulated light sources are staggered in a second direction.

[0018] According to one embodiment of the present application, the test assembly to be assembled comprises at least one of a pre-assembly and a pre-test assembly, and the pre-test assembly is prepared from a plurality of pre-assemblies; wherein,

[0019] The auxiliary light source is adapted to irradiate the pre-assembly through the bearing area;

[0020] The simulated light source is adapted to irradiate the pre-test assembly through the bearing area.

[0021] According to one embodiment of the present application, the length of the probe is adjustable; and / or

[0022] The probe mounting position is adjustably arranged on the mounting seat.

[0023] According to one embodiment of the present application, further comprising:

[0024] A mounting member is arranged in the accommodating cavity and extends in a first direction, the auxiliary light source is arranged on one side of the mounting member facing the bearing area, the simulated light source is arranged on one side of the mounting member in a second direction, and the first direction and the second direction intersect.

[0025] According to one embodiment of the present application, the mounting seat comprises:

[0026] A box is formed with an accommodating groove;

[0027] An assembly detection plate is arranged on the groove opening of the accommodating groove, the bearing area is arranged on the assembly detection plate, and the accommodating groove and the assembly detection plate form the accommodating cavity.

[0028] According to one embodiment of the present application, further comprising:

[0029] a universal wheel arranged at the bottom of the mounting seat; and / or

[0030] a display screen arranged at the mounting seat and electrically connected with the probe; and / or

[0031] a camera arranged in the accommodating cavity and adapted to take a photo of the test piece to be assembled through the bearing area

[0032] Additional aspects and advantages of the present application will be in part apparent and in part pointed out hereinafter. BRIEF DESCRIPTION OF DRAWINGS

[0033] The above and / or additional aspects and advantages of the present application will become apparent and be readily appreciated from the following description, including the accompanying drawings, wherein:

[0034] Figure 1 is a structural schematic diagram of an assembly test device provided by an embodiment of the present application;

[0035] Figure 2 is a structural schematic diagram of an assembly test device provided by an embodiment of the present application, in which an assembly detection plate is hidden;

[0036] Figure 3 is a structural schematic diagram of cooperation of a mounting piece, an auxiliary light source and a simulation light source provided by an embodiment of the present application;

[0037] Figure 4 is a structural schematic diagram of a probe provided by an embodiment of the present application.

[0038] Reference Signs:

[0039] 100, mounting seat; 110, box body; 111, accommodating groove; 120, assembly detection plate;

[0040] 200, auxiliary light source; 201, first arc surface;

[0041] 300, simulation light source; 301, second arc surface; 310, groove;

[0042] 400, probe; 500, mounting piece;

[0043] 610, supporting piece; 620, first connecting piece; 630, second connecting piece;

[0044] 700, universal wheel; 800, display screen; 900, camera. DETAILED DESCRIPTION

[0045] Embodiments of the present application are described below in detail with reference to the accompanying drawings, wherein the same or similar elements or elements having the same or similar functions are denoted by the same or similar reference signs throughout. The embodiments described below by reference to the accompanying drawings are exemplary only, and are intended to explain the present application, but cannot be understood as limiting the present application.

[0046] Reference is made below to Figures 1-4 The assembly testing device provided by the embodiments of the present application is described below. The assembly testing device comprises a mounting seat 100, an auxiliary light source 200, a simulation light source 300 and a probe 400.

[0047] The mounting seat 100 forms a containing cavity. The mounting seat 100 has a bearing area made of transparent material, which is suitable for placing a test piece to be assembled. The transparent material includes but is not limited to glass or acrylic lamp. The test piece to be assembled includes but is not limited to a battery piece, a solder strip, an EVA adhesive film, a glass backboard or a photovoltaic module, etc. It should be noted that the size and shape of the containing cavity and the bearing area can be designed according to actual needs, and the embodiments do not make specific limitations thereon.

[0048] The auxiliary light source 200 is arranged in the containing cavity, and is suitable for irradiating the test piece to be assembled through the bearing area. The simulation light source 300 is arranged in the containing cavity, and is suitable for irradiating the test piece to be assembled through the bearing area. The probe 400 is arranged in the mounting seat 100, and is suitable for electrically connecting with the test piece to be assembled to form a test loop. The probe 400 can be located in the bearing area or outside the bearing area, and the embodiments do not make specific limitations thereon.

[0049] In actual execution, the test piece to be assembled is first placed in the bearing area, and then the bearing area is irradiated by the auxiliary light source 200, so as to improve the assembly efficiency and quality of the test piece to be assembled. Subsequently, the bearing area is irradiated by the simulation light source 300, so as to simulate the light irradiation conditions (including light intensity and spectral distribution, etc.) of the test piece to be assembled in the actual working environment. Finally, the probe 400 is electrically connected with the test piece to be assembled, so as to monitor the output current and voltage parameters of the test piece to be assembled through the formed test loop, evaluate the power generation efficiency, power output stability and whether there is local shielding of the test piece to be assembled, and realize electroluminescent detection to evaluate the performance and quality of the test piece to be assembled.

[0050] It can be understood that the assembly testing device integrates the auxiliary assembly, the simulation test environment and the detection function in one, reduces the handling of the test piece to be assembled in the production process, and improves the production quality, efficiency and detection accuracy. In addition, the auxiliary light source 200 and the simulation light source 300 are both located in the containing cavity, which can make the assembly testing device compact in structure, reduce the possibility of external interference, and improve the efficiency of assembly and detection of the test piece to be assembled.

[0051] According to the assembling and testing device provided in the embodiments of the present application, the quality and efficiency of production and detection of the to-be-assembled and tested piece are improved.

[0052] In some embodiments, as shown in Figure 1 and Figure 2 , the to-be-assembled and tested piece comprises at least one of a pre-assembled piece and a pre-tested piece, and the pre-tested piece is prepared from a plurality of pre-assembled pieces; wherein,

[0053] The auxiliary light source 200 is adapted to irradiate the pre-assembled piece through the bearing area at least;

[0054] The simulation light source 300 is adapted to irradiate the pre-tested piece through the bearing area at least.

[0055] It should be noted that the pre-assembled piece includes but is not limited to a battery piece, a solder strip, an EVA adhesive film or a glass back plate, etc.; the pre-tested piece includes but is not limited to a photovoltaic module. The plurality of pre-assembled pieces includes two or more than two.

[0056] It can be understood that in actual execution, the plurality of pre-assembled pieces are first placed in the bearing area, and the auxiliary light source 200 is used to irradiate the bearing area to ensure the accurate alignment between the pre-assembled pieces, thereby improving the assembly efficiency and quality. After the pre-tested piece is assembled and prepared, the auxiliary light source 200 is turned off and the simulation light source 300 is used to irradiate the bearing area, so as to simulate the light irradiation conditions (including light intensity and spectral distribution, etc.) of the pre-tested piece in the actual working environment. Finally, the auxiliary light source 200 is turned off and the probe 400 is electrically connected with the pre-tested piece, so as to monitor the output current and voltage parameters of the pre-tested piece through the formed test circuit, evaluate the power generation efficiency, power output stability and whether there is local shielding, etc., and realize electroluminescent detection to evaluate the performance and quality of the pre-tested piece.

[0057] In some embodiments, as shown in Figure 2 and Figure 3 , the bearing area extends along a first direction, and the length of the auxiliary light source 200 extends along the first direction. Exemplarily, the shape of the auxiliary light source 200 includes but is not limited to a long strip. It should be noted that the length of the bearing area can extend along the first direction, or the width of the bearing area can extend along the first direction, and the embodiments do not make specific limitations thereon.

[0058] It can be understood that by making the length of the auxiliary light source 200 extend along the first direction, the entire bearing area is illuminated as uniformly as possible. By using the uniform distribution of light, a clear visual reference is provided for the operator, which facilitates the observation of the alignment between the pre-assembled pieces, helps to improve the assembly precision and reduce the quality problems caused by alignment errors.

[0059] In some embodiments, as shown in Figure 3As shown, the side of the auxiliary light source 200 facing the bearing area includes a first arc surface 201, and the center of curvature of the first arc surface 201 is away from the bearing area. Exemplarily, the cross section of the auxiliary light source 200 is semicircular. It should be noted that the radius of curvature and size of the first arc surface 201 can be designed according to actual needs, and the present embodiment does not make specific limitations thereto.

[0060] It can be understood that the center of curvature of the first arc surface 201 is away from the bearing area, that is, the first arc surface 201 protrudes towards the bearing area, so that the light emitted by the auxiliary light source 200 is scattered and refracted by the first arc surface 201 during propagation, which can uniformly disperse the light to all parts of the accommodation cavity, reduce the possibility of light concentration and shadow formation, realize more light guiding to the effective area of the bearing area, and help to improve the light utilization rate of the auxiliary light source 200 and the visual comfort of the operator.

[0061] In the present embodiment, as shown in Figure 2 and Figure 3 , the auxiliary light source 200 is arranged on the inner bottom surface of the accommodation cavity, that is, the upper surface of the auxiliary light source 200 includes the first arc surface 201. Of course, in other embodiments, the auxiliary light source 200 can also be arranged on the inner side wall of the accommodation cavity, and the present embodiment does not make specific limitations thereto.

[0062] In some embodiments, as shown in Figure 2 and Figure 3 , the outer wall of the simulation light source 300 includes a second arc surface 301, and the center of curvature of the second arc surface 301 is away from the bearing area. Exemplarily, the longitudinal cross section of the simulation light source 300 is semicircular. It should be noted that the radius of curvature and size of the second arc surface 301 can be designed according to actual needs, and the present embodiment does not make specific limitations thereto.

[0063] It can be understood that the center of curvature of the second arc surface 301 is away from the bearing area, so that the light emitted by the simulation light source 300 is scattered and refracted by the second arc surface 301 during propagation, which can uniformly disperse the light to all parts of the accommodation cavity, reduce the possibility of light concentration and shadow formation, realize more light guiding to the effective area of the bearing area, and help to improve the light utilization rate of the simulation light source 300 and the detection efficiency.

[0064] In some embodiments, as shown in Figure 2 and Figure 3 , the side of the simulation light source 300 facing the bearing area is recessed in the direction away from the bearing area to form a groove 310. It should be noted that the number, shape and size of the groove 310 can be designed according to actual needs, and the present embodiment does not make limitations thereto.

[0065] It can be understood that the recess 310 of the simulation light source 300 is designed to form an inwardly recessed structure on the side of the simulation light source 300 facing the bearing area, so as to effectively reflect and focus the light by using optical principles, so that the light is focused towards the bearing area, and the light can be more efficiently concentrated on the pre-test sample, reducing the scattering and waste of light, thereby improving the illumination efficiency.

[0066] In this embodiment, as shown in Figure 2 and Figure 3 , the simulation light source 300 is arranged on the inner bottom surface of the accommodating cavity, that is, the recess 310 is opened in the upper part of the simulation light source 300, and the slot of the recess 310 faces upward. Of course, in other embodiments, the simulation light source 300 can also be arranged on the inner side wall of the accommodating cavity, and this embodiment does not make specific limitations thereto.

[0067] In some embodiments, as shown in Figure 2 and Figure 3 , the auxiliary light source 200 is an LED lamp, so as to fully utilize the high light efficiency, uniform light distribution, high color rendering index, long service life and fast response of the LED lamp, not only improving the precision and efficiency in the process of assembling the pre-assembled component into the pre-test sample, but also reducing the maintenance cost and optimizing the working environment.

[0068] In some embodiments, as shown in Figure 2 and Figure 3 , the simulation light source 300 is a halogen lamp, so as to fully utilize the continuous spectrum, high color rendering, stable light output and color temperature close to sunlight of the halogen lamp, so that the halogen lamp can better simulate the lighting conditions of the pre-test sample in actual use, improve the detection precision and reliability, and at the same time reduce the equipment cost.

[0069] In some embodiments, as shown in Figure 2 and Figure 3 , the auxiliary light source 200 and the simulation light source 300 are both provided with a plurality of auxiliary light sources 200 and simulation light sources 300, and the auxiliary light source 200 and the simulation light source 300 are staggered along the second direction. It should be noted that the number of auxiliary light sources 200 and simulation light sources 300 can be designed according to actual needs,

[0070] It should be noted that the first direction and the second direction intersect with each other.

[0071] It can be understood that the detection and assembly of the to-be-assembled test sample need to achieve uniform illumination in the entire bearing area. By arranging a plurality of auxiliary light sources 200 and a plurality of simulation light sources 300, and staggering along the second horizontal direction, the uniformity of the light can be improved, covering every corner of the bearing area, and meeting the illumination needs in different situations.

[0072] In some embodiments, as shown in Figure 2 and Figure 3As shown, the assembled testing device further comprises a mounting member 500 arranged in the accommodating cavity and extending along a first direction, the auxiliary light source 200 is arranged on a side of the mounting member 500 facing the bearing area, and the simulation light source 300 is arranged on a side of the mounting member 500 along a second direction, the first direction and the second direction intersect. It should be noted that the shape and size of the mounting member 500 can be designed according to actual needs, and the present embodiment does not make specific limitations thereto.

[0073] It can be understood that the mounting member 500 extends along the first direction to provide a stable mounting basis for the auxiliary light source 200 and the simulation light source 300. The auxiliary light source 200 is arranged on a side of the mounting member 500 facing the bearing area, so as to directly provide uniform illumination for the bearing area during assembly. The simulation light source 300 is arranged on a side of the mounting member 500 along the second direction, which not only realizes the staggered arrangement of the auxiliary light source 200 and the simulation light source 300 along the second direction, but also increases the positioning and connection strength of the simulation light source 300, so that the overall structure of the assembled testing device is more compact, and the space occupation is reduced.

[0074] In some embodiments, as shown in Figure 2 , the first mounting member 500, the simulation light source 300 and the auxiliary light source 200 are all arranged with multiple and one-to-one correspondence, which not only reduces the manufacturing and maintenance cost, but also significantly improves the uniformity of illumination and the accuracy of detection, so that it can adapt to different sizes and types of pre-assembled test pieces.

[0075] In some embodiments, as shown in Figure 3 , since the simulation light source 300 is arranged on a side of the mounting member 500 along the second direction, the simulation light source 300 forms a second arc surface 301 at least partially away from the side wall of the mounting member 500. That is, the simulation light source 300 is in a semicircular shape, which not only optimizes the optical performance of the simulation light source 300, but also increases the contact area between the mounting member 500 and the simulation light source 300, thereby improving the connection strength.

[0076] In some embodiments, as shown in Figure 1 , Figure 2 and Figure 4 , the length of the probe 400 is adjustable, which ensures that the probe 400 always maintains optimal contact with the electrodes of the pre-test piece, so as to adapt to the pre-test piece located at different positions on the bearing area or different sizes and types of pre-test pieces, thereby increasing the flexibility of use of the assembled testing device. It should be noted that the probe 400 can adopt a mechanical structure (such as a telescopic rod, an adjustable support) or an electrically driven device (such as a micro motor) to realize the adjustment of the length, and the present embodiment does not make specific limitations thereto.

[0077] In some embodiments, as shown in Figure 1 , Figure 2 and Figure 4As shown, the probe 400 is adjustably arranged on the mounting base 100, so as to be flexibly adjusted according to different detection requirements and the size of the pre-test piece, thereby optimizing the detection process and improving the detection efficiency and accuracy.

[0078] In some embodiments, as shown in Figure 4 As shown, the assembled test device further comprises a support 610, a first connecting member 620 and a second connecting member 630. The support 610 is arranged on the mounting base 100. The first connecting member 620 is adjustably arranged on the support 610 along a third direction. The second connecting member 630 is adjustably arranged on the first connecting member 620 along a second direction. The probe 400 is arranged on the second connecting member 630.

[0079] It should be noted that the first direction, the second direction and the third direction are perpendicular to each other. For example, the first direction is parallel to the front-rear direction, the second direction is parallel to the left-right direction, and the third direction is parallel to the up-down direction.

[0080] It can be understood that the first connecting member 620 and the second connecting member 630 are used to adjust the probe 400 in the vertical direction and the horizontal direction respectively, so that the probe 400 can be quickly moved to the optimal contact position of the electrode of the pre-test piece, thereby improving the accuracy and reliability of the detection.

[0081] In some embodiments, as shown in Figure 4 As shown, the first connecting member 620 and the support 610 are slidingly fitted along the third direction, and are detachably connected with the first connecting member 620 through the first fixing member, so as to realize the position adjustment and locking of the probe 400 in the third direction. Similarly, the second connecting member 630 and the first connecting member 620 are slidingly fitted along the second direction, and are detachably connected with the first connecting member 620 through the second fixing member, so as to realize the position adjustment and locking of the probe 400 in the second direction. Of course, in other embodiments, a rotary joint or a telescopic support can be used to realize the adjustability of the mounting position of the probe 400 along at least one of the first direction, the second direction and the third direction, which is not limited in the present embodiment.

[0082] In some embodiments, as shown in Figure 1 and Figure 2 As shown, two probes 400 are arranged, and the two probes 400 are oppositely arranged on two sides of the mounting base 100 along the second direction. That is, one of the probes 400 is a positive probe 400, and the other probe 400 is a negative probe 400, so as to form a test loop.

[0083] In some embodiments, as shown in Figure 1 and Figure 2As shown, the mounting base 100 comprises a box body 110 and an assembly detection plate 120. The box body 110 forms a containing groove 111 with an opening facing upward. The assembly detection plate 120 is arranged on the opening of the containing groove 111. A bearing area is arranged on the assembly detection plate 120. The containing groove 111 and the assembly detection plate 120 form a containing cavity. It should be noted that the assembly detection plate 120 can be made of transparent material as a whole or only the bearing area can be made of transparent material. The embodiment does not make specific limitation on this.

[0084] It can be understood that the auxiliary light source 200 and the simulation light source 300 are arranged on the bottom of the containing groove 111 through the mounting member 500 and directly arranged on the opening of the containing groove 111 through the assembly detection plate 120. The inner wall of the containing cavity comprises the inner wall of the containing groove 111 and the side of the assembly detection plate 120 facing the opening. Therefore, the auxiliary light source 200 and the simulation light source 300 can be conveniently stored and the functions of auxiliary assembly and detection can be realized. In addition, the maintenance and disassembly are convenient.

[0085] In some embodiments, as shown in Figure 2 The assembly testing device further comprises a camera 900 arranged in the containing cavity and adapted to take a photo of the to-be-assembled testing member through the bearing area. That is, the image of the to-be-assembled testing member is taken so as to identify whether the to-be-assembled testing member has defects such as hidden cracks, false welding or broken grids, thereby improving the sensitivity and accuracy of detection.

[0086] In some embodiments, as shown in Figure 2 The camera 900 is arranged in plurality and spaced apart along the second horizontal direction. The to-be-assembled testing member can be fully covered so that each part of the to-be-assembled testing member can be captured, thereby reducing the blind area of detection and improving the detection efficiency and accuracy. It should be noted that the plurality includes two or more than two.

[0087] In some embodiments, as shown in Figure 1 and Figure 2 The assembly testing device further comprises a display screen 800 arranged on the mounting base 100 and electrically connected with the probe 400. The display screen 800 is adapted to display the data and image in real time during the detection process, thereby improving the detection accuracy and facilitating the parameter adjustment and operation control of the operator, thereby improving the ease of use of the assembly testing device.

[0088] In some embodiments, as shown in Figure 1 and Figure 2As shown, the assembled test device further comprises universal wheels 700, which are arranged at the bottom of the mounting seat 100, i.e. the rotation of the universal wheels 700 drives the overall movement of the assembled test device, thereby improving the flexibility and use range of the assembled test device. Exemplarily, a plurality of universal wheels 700 are arranged, and the plurality of universal wheels 700 are arranged at the four corners of the box body 110 to ensure the stability of the movement.

[0089] The terms "first", "second", etc. in the specification and claims of the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than that illustrated or described herein, and the objects distinguished by "first", "second", etc. are generally of a kind and are not limited in number, for example, the first object can be one or more. In addition, "and / or" in the specification and claims indicates at least one of the connected objects, and the character " / " generally indicates that the front and rear associated objects are in an "or" relationship.

[0090] In the description of the present application, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application.

[0091] In the description of the present application, "first feature" and "second feature" can include one or more features.

[0092] In the description of the present application, "a plurality of" means two or more.

[0093] In the description of the present application, "above" or "below" the first feature in the second feature can include direct contact between the first and second features, or can include indirect contact between the first and second features through another feature therebetween.

[0094] In the description of the present application, "above", "over" and "on" the first feature in the second feature includes the first feature directly above and obliquely above the second feature, or only indicates that the first feature is higher than the second feature in horizontal height.

[0095] In the description of the application, reference has been made to descriptive terms such as "one embodiment", "some embodiments", "an embodiment", "example", "specific example" or "some examples" etc. It is emphasized that each of these terms refers to a specific feature, structure, material or characteristic described in connection with a particular embodiment or example. The descriptive terms are not necessarily referring to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics can be combined in any suitable manner in one or more embodiments or examples.

[0096] While the embodiments of the application have been shown and described, it is to be understood that the embodiments described are only by way of example and that various changes, modifications, substitutions and alterations can be made thereto without departing from the spirit and scope of the application as defined in the claims and their equivalents.

Claims

1. An assembly test device, characterized by, The application relates to a test assembly device, comprising: a mounting base forming a containing cavity, the mounting base having a bearing area made of transparent material and adapted to place a test piece to be assembled; an auxiliary light source arranged in the containing cavity and adapted to irradiate the test piece to be assembled through the bearing area; a simulation light source arranged in the containing cavity and adapted to irradiate the test piece to be assembled through the bearing area; a probe arranged in the mounting base and adapted to electrically connect with the test piece to be assembled to form a test loop.

2. The assembled test device of claim 1, wherein, The bearing area extends along a first direction, and the length of the auxiliary light source extends along the first direction; and / or one side of the auxiliary light source facing the bearing area comprises a first arc surface, and the center of curvature of the first arc surface is away from the bearing area; and / or the outer wall of the simulation light source comprises a second arc surface, and the center of curvature of the second arc surface is away from the bearing area.

3. The assembled test device of claim 1, wherein, One side of the simulation light source facing the bearing area is recessed to form a groove in a direction away from the bearing area.

4. The assembled test device of claim 1, wherein, The auxiliary light source is an LED lamp; and / or the simulation light source is a halogen lamp.

5. The assembled test device of claim 1, wherein, The auxiliary light source and the simulation light source are arranged in multiple numbers and staggered along a second direction.

6. The assembled test device of claim 1, wherein, The test piece to be assembled comprises at least one of a pre-assembled piece and a pre-test piece prepared from a plurality of the pre-assembled pieces; wherein the auxiliary light source is adapted to irradiate at least the pre-assembled piece through the bearing area; the simulation light source is adapted to irradiate at least the pre-test piece through the bearing area.

7. An assembled test device according to any one of claims 1 to 6, wherein, The length of the probe is adjustable; and / or the probe is adjustably arranged at a mounting position of the mounting base.

8. An assembled test device according to any one of claims 1 to 6, wherein, The application further comprises: a mounting piece arranged in the containing cavity and extending along a first direction, the auxiliary light source is arranged on one side of the mounting piece facing the bearing area, and the simulation light source is arranged on one side of the mounting piece along a second direction, and the first direction and the second direction intersect.

9. An assembled test device according to any one of claims 1 to 6, wherein, The mounting base comprises: a box forming a containing groove, and the groove opening faces upward; an assembly detection plate covering the groove opening of the containing groove, the bearing area is located on the assembly detection plate, and the containing groove and the assembly detection plate form the containing cavity.

10. The assembled test device according to any one of claims 1 to 6, wherein, The application further comprises: a universal wheel arranged at the bottom of the mounting base; and / or a display screen arranged in the mounting base and electrically connected with the probe; and / or a camera arranged in the containing cavity and adapted to take a photo of the test piece to be assembled through the bearing area.