Multistage buffer test probe
By designing a multi-level buffered test probe, the problems of insufficient measurement accuracy and high hardware cost of traditional probes are solved, achieving the effect of high-precision measurement and cost reduction.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-21
- Publication Date
- 2026-03-24
AI Technical Summary
Traditional probes suffer from insufficient accuracy in measurement due to contact resistance deviation, and the lack of multi-level buffer structure leads to high precision requirements for robot control, increasing hardware costs.
A multi-stage buffer test probe is designed, comprising a guide post body, a movable sleeve, and first and second elastic buffers. The contact effect is improved through sliding damping and a multi-stage buffer structure, and multi-stage buffer force is provided to stabilize the measurement.
It improves measurement accuracy, reduces hardware costs, reduces the need for high-precision control of the robot, and reduces the risk of damage to the measured workpiece.
Smart Images
Figure CN224035471U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to test probe technical field, especially a multistage buffer test probe. BACKGROUND
[0002] Test probe is the device for testing and evaluating integrated circuit, chip and related components. When testing, the probe is in contact with the test point, and then the electrical performance, electrical characteristics and signal transmission and surface resistance of the component can be measured and monitored.
[0003] In the actual production process, we found that when measuring the surface resistance of copper-clad plate and silicon wafer, the traditional probe is used for testing, and the test result will be offset due to the contact resistance caused by the sliding contact between the needle cylinder and the probe body, resulting in insufficient test result accuracy. Moreover, the probe body inside the traditional probe has a very small measurement stroke, and there is no auxiliary positioning and buffering structure, so the buffering force provided cannot be accurately refined and graded. In order to ensure that the contact force between the probe and the workpiece remains at an appropriate level, the control accuracy of the robot is required to be very high. However, for enterprises, purchasing equipment with higher control accuracy will increase hardware costs and is not conducive to the control of production costs. Therefore, it is necessary to provide a new test probe to meet higher production and processing requirements. UTILITY MODEL CONTENT
[0004] The utility model aims at providing a multistage buffer test probe to solve the problems in the background art.
[0005] To achieve the above-mentioned purpose, the utility model provides the following technical scheme: a multistage buffer test probe, comprising a vertically arranged guide column body, a movable sleeve with damping sliding set at the lower end of the guide column body, a first elastic buffer member arranged above the movable sleeve, a probe body vertically movable through the upper and lower ends of the guide column body, and a second elastic buffer member arranged above the guide column body; the side wall of the guide column body is provided with an upper end first positioning part for positioning the first elastic buffer member; one end of the second elastic buffer member abuts against the upper end of the probe body in a detachable manner and provides downward pressure for the probe body, and the other end of the second elastic buffer member is arranged at the upper end of the guide column body through an insulating mounting member; the side wall of the movable sleeve is provided with a window for exposing the probe body; in the initial state, the lower end of the movable sleeve is lower than the lower end of the probe body.
[0006] The utility model discloses a multistage buffer test probe, wherein the guide post body is of aluminium alloy material, the guide post body is equipped with the avoiding passage of avoiding the probe body, the upper and lower end surfaces of the guide post body are equipped with the insulating plate and the insulating seat respectively, the insulating plate and the insulating seat are equipped with the guide through -hole of adapting with the probe body.
[0007] The utility model discloses a multistage buffer test probe, wherein the lower end surface of the guide post body is equipped with the positioning groove, and the insulating seat is detachably connected to the bottom surface of the positioning groove through the connecting rod.
[0008] The utility model discloses a multistage buffer test probe, wherein the connecting rod is vertically arranged and is threadedly connected with the guide post body, a positioning pin is radially arranged on the side wall of the guide post body, an avoiding hole is arranged on the movable sleeve and avoids the outside end of the positioning pin, the inside end of the positioning pin penetrates the inner wall of the screw hole matched with the connecting rod, and the upper end surface of the connecting rod is an inclined surface inclined away from the direction of the positioning pin.
[0009] The utility model discloses a multistage buffer test probe, wherein one end of the second elastic buffer piece away from the probe body is detachably connected with the insulating mounting piece, and the insulating mounting piece is detachably connected with the guide post body through the connecting piece and the insulating plate.
[0010] The utility model discloses a multistage buffer test probe, wherein the second elastic buffer piece is in the shape of a long strip, and the probe body is provided with a through hole through which the second elastic buffer piece passes.
[0011] The utility model discloses a multistage buffer test probe, wherein the diameter of the through hole is greater than the diameter of the second elastic buffer piece, and when assembled in place, there is a stroke gap between the side wall of the upper and lower ends of the through hole and the second elastic buffer piece.
[0012] The utility model discloses a multistage buffer test probe, wherein the probe body comprises a needle shaft and a needle cylinder coaxially fixed to the outside of the upper end of the needle shaft, the upper end of the needle cylinder has an extension part protruding upwards from the upper end of the needle shaft, the inner cavity of the extension part forms a connecting cavity for fixedly connecting a wire, and the through hole is located on the extension part.
[0013] The utility model discloses a multistage buffer test probe, wherein the lower end of the needle cylinder abuts against the upper end surface of the guide post body through a limiting piece and provides an upward supporting force for the needle shaft.
[0014] In addition, the utility model also provides an assembling method of the multistage buffer test probe, which comprises the following steps:
[0015] The first elastic piece is installed at the middle part of the guide post body;
[0016] The movable sleeve is coaxially sleeved on the lower part of the guide post body at the lower side of the guide post body;
[0017] One end of the second elastic buffer piece is installed on the insulating mounting piece, and the other end is installed on the probe body;
[0018] The lower end of the probe body is inserted into the guide post body, and the insulating mounting piece is installed on the upper end of the guide post body at the same time, and the probe body is inserted into the guide post body in place
[0019] Compared with the prior art, the beneficial effects of the utility model are as follows: during testing, the signal line can be directly connected to the upper end of the probe body, and the contact buffer force is improved through the second elastic buffer piece, the influence of the contact resistance of the traditional probe on the measurement result is directly eliminated on the premise of ensuring soft contact;
[0020] In addition, through the sliding damping of the movable sleeve between the guide post bodies and the first elastic buffer piece, the movable sleeve first abuts on the upper surface of the workpiece to be measured or the top surface of the jig of the installed workpiece during measurement, thereby providing upward supporting buffer force for the probe body, and the supporting buffer force can be captured by the pressure sensing element on the mechanical hand, thereby enabling the mechanical hand to make control feedback in advance under the condition of having a large enough stroke space, and thereby avoiding the increase of hardware procurement cost caused by the requirement of the mechanical hand to meet higher control precision under the smaller stroke of the traditional probe;
[0021] Moreover, the insufficient supporting force interval of the first elastic buffer piece before compression can be compensated by the damping force between the movable sleeve and the guide post body, further improving the sensing sensitivity of the mechanical hand; and in the later measurement stage, when the probe abuts on the surface of the workpiece, the second elastic buffer piece can be used to improve the contact buffer of the probe body, to ensure soft contact with the workpiece, and through the cooperation of the second elastic buffer piece and the sliding damping force of the movable sleeve, the probe body can be provided with three-stage buffer, greatly reducing the risk of damage to the measured workpiece caused by inaccurate division of the buffer force in the measurement process. BRIEF DESCRIPTION OF DRAWINGS
[0022] In order to more clearly illustrate the specific embodiments of the utility model or the technical solutions in the prior art, the following will briefly introduce the drawings needed to be used in the specific embodiments or the prior art description, and obviously, the drawings in the following description are some embodiments of the utility model, and for those skilled in the art, other drawings can also be obtained without creative labor on the basis of these drawings.
[0023] Figure 1The front view of the utility model.
[0024] Figure 2 The Figure 1 A-A sectional view of the utility model.
[0025] Figure 3 The Figure 1 B-B sectional view of the utility model.
[0026] Figure 4 The Figure 3 The local structure enlarged view of the utility model.
[0027] Figure 5 The rear view of the utility model. DETAILED DESCRIPTION
[0028] The terms "first", "second", "third", and "fourth" and the like in the description and claims of the utility model and the accompanying drawings, are used for distinguishing between similar objects, not necessarily described in a particular order. The terms "include" and "have" and any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, product, or device that comprises a list of steps or units are not necessarily limited to the listed steps or units, but can optionally further include additional steps or units not listed, or can optionally further include steps or units inherent to such processes, methods, products, or devices.
[0029] Reference herein to "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment can be included in at least one embodiment of the utility model. The appearance of the phrase in various places in the specification is not necessarily all referring to the same embodiment, nor is it necessarily referring to a particular embodiment that is "preferred" over other embodiments. It will be explicitly understood that the embodiments described herein can be combined with other embodiments in various ways.
[0030] "Multiple" means two or more. "And / or", describes the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which can represent the three cases of A alone, A and B together, and B alone. The character " / " generally represents that the front and rear associated objects are in an "or" relationship.
[0031] Moreover, the terms "up, down, left, right, upper end, lower end, longitudinal" and the like indicating the orientation are all with reference to the attitude position of the device or equipment described in the scheme in normal use.
[0032] In order to make the purpose, technical scheme and advantages of the embodiments of the utility model clearer, the technical scheme in the embodiments of the utility model will be described clearly and completely below. Obviously, the described embodiments are part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by those skilled in the art without creative labor belong to the protection scope of the utility model.
[0033] The embodiment discloses a multi-stage buffer test probe as shown in the drawings, which comprises a guide column body 10 arranged longitudinally, a movable sleeve 20 arranged at the lower end of the guide column body 10, a first elastic buffer 30 arranged above the movable sleeve 20, a probe body 40 longitudinally movably penetrating through the upper and lower ends of the guide column body 10, and a second elastic buffer 50 arranged above the guide column body 10. Figures 1 to 5 The first elastic buffer 30 is specifically a spring, and can also be a structure composed of elastic ribs or two tension springs arranged reversely upwards and downwards. The probe body 40 is provided with a plurality of probe bodies arranged side by side. A first positioning part 101 for positioning the upper end of the first elastic buffer 30 is arranged on the side wall of the guide column body 10. The first positioning part 101 is specifically a protruding structure. When installed in place, the first elastic buffer 30 abuts against the lower end of the first positioning part 101. One end of the second elastic buffer 50 abuts against the upper end of the probe body 40 in a separable manner and provides a downward pressure for the probe body 40. The other end of the second elastic buffer 50 is arranged at the upper end of the guide column body 10 through an insulating mounting part. A window 201 is arranged on the side wall of the movable sleeve 20 for the probe body 40 to expose, so as to facilitate observation of the contact condition of the probe body 40 with a workpiece. In the initial state, the lower end of the movable sleeve 20 is lower than the lower end of the probe body 40, so as to provide protection for the probe body 40 in the non-test state.
[0034] During testing, the signal line can be directly connected to the upper end of the probe body 40, and the contact buffer force is increased through the second elastic buffer 50. On the premise of ensuring soft contact, the influence of the contact resistance of the traditional probe on the measurement result is directly eliminated. In addition, through the sliding damping between the movable sleeve 20 and the guide column body 10 and the first elastic buffer 30, the movable sleeve 20 first abuts against the upper surface of the workpiece to be measured or the top surface of the jig for mounting the workpiece during measurement, and then the upward supporting buffer force is provided for the probe body 40. The supporting buffer force can be captured by the pressure sensing element arranged on the mechanical hand, so that the mechanical hand can make control feedback in advance under the condition of having a large enough stroke space, and the increase of the hardware procurement cost caused by the requirement of the mechanical hand to meet higher control precision under the smaller stroke of the traditional probe is avoided.
[0035] Moreover, the insufficient support force interval of the first elastic buffer 30 in the early compression stage can be compensated by the damping force between the movable sleeve 20 and the guide column body 10, further improving the sensing sensitivity of the mechanical hand; in the late measurement stage, when the probe abuts against the surface of the workpiece, the second elastic buffer 50 can be used to improve the contact buffer of the probe body 40, so as to ensure soft contact with the workpiece, and through the sliding damping force of the second elastic buffer 50 and the movable sleeve 20, the probe body 40 can be provided with three-stage buffer, greatly reducing the risk of damage to the measured workpiece caused by inaccurate division of the buffer force in the measurement process.
[0036] In the embodiment, the guide column body 10 is made of aluminum alloy and is a cylinder, the guide column body 10 is provided with a avoiding channel 102 for avoiding the probe body 40, and in order to reduce the weight, a weight reduction groove 103 is arranged at the front end of the side wall of the guide column body, wherein the probe body 40 passes through the weight reduction groove 103; the upper and lower end faces of the guide column body 10 are respectively provided with an insulating plate 60 and an insulating seat 70, and the insulating plate 60 and the insulating seat 70 are both provided with a guide through hole 80 matched with the probe body 40; wherein the insulating plate 60 and the insulating seat 70 are both made of Teflon material to play the role of insulation and reduce friction, and ensure the service life of the probe body 40.
[0037] In addition, in order to reduce the setting of connecting parts, a boss 90 is arranged on one side of the upper end face of the guide column body 10, the boss 90 is arranged opposite to the probe body 40, an insulating mounting part is arranged on the boss 90, a horizontal groove 91 is arranged on the side wall of the boss 90, and an extension section 61 is arranged on the insulating plate 60 and inserted into the groove 91, when installed in place, the connecting part locks the insulating mounting part on the boss 90 downwardly, and at the same time, the extension section 61 is pressed in the groove 91 to prevent it from moving and causing lateral extrusion to the probe body 40.
[0038] In this embodiment, the lower end surface of the guide pillar body 10 is provided with a positioning groove 104, and the insulating seat 70 is detachably connected to the bottom surface of the positioning groove 104 through a connecting rod 100; wherein the connecting rod 100 is vertically arranged and is threadedly connected with the guide pillar body 10, and the connecting rod 100 specifically adopts a bolt structure to facilitate disassembly and assembly; the side wall of the guide pillar body 10 is radially provided with a positioning pin 110, the movable sleeve 20 is provided with an avoiding hole 120 which avoids the outside end of the positioning pin 110, the inside end of the positioning pin 110 penetrates the inner wall of the screw hole 105 matched with the connecting rod 100, and the upper end surface of the connecting rod 100 is an inclined surface 11 which is inclined away from the direction of the positioning pin 110; when assembled in place, the inside end of the positioning pin 110 abuts against the side wall of the connecting rod 100; since the diameter of the positioning pin 110 is very small, and enough installation space needs to be provided for the connecting rod 100, the positioning pin 110 cannot adopt a bolt, and the inclined surface 11 can well solve the problem of inconvenience in disassembly caused by the positioning pin 110 which cannot adopt a bolt; when disassembling the positioning pin 110, only the connecting rod 100 needs to be loosened and the positioning pin 110 needs to be pushed into the screw hole 105 of the connecting rod 100; at this time, the movable sleeve 20 can be removed, and when the movable sleeve 20 is assembled in place, the connecting rod 100 is tightened upwards, and the positioning pin 110 can be pushed out and re-extended into the avoiding hole 120 to limit the movable sleeve 20, preventing the movable sleeve 20 from falling off
[0039] In this embodiment, one end of the second elastic buffer 50 away from the probe body 40 is detachably connected with the insulating mounting piece 130, and the insulating mounting piece 130 is detachably connected with the guide pillar body 10 through the connecting piece 140, which is specifically a bolt or a screw or a positioning pin 110 assembled with interference, and as a preferred embodiment, a bolt structure is generally adopted; wherein the second elastic buffer 50 is in a strip shape, and the probe body 40 is provided with a through hole 401 through which the second elastic buffer 50 passes, to facilitate installation, synchronous lifting with the probe body 40, and guiding and limiting the probe body 40, and in order to ensure the long-term retention of elasticity, the one end of the second elastic buffer 50 away from the probe body 40 has a spiral section to form a torsion spring structure.
[0040] In this embodiment, the diameter of the through hole 401 is greater than the diameter of the second elastic buffer 50, and when assembled in place, the side walls of the upper and lower ends of the through hole 401 and the second elastic buffer 50 both have a travel gap to avoid over-tightening and relative movement, which in turn causes the probe body 40 to be deviated and inclined by the second elastic buffer 50 when the probe body 40 moves up and down, resulting in changes in coaxiality and a significant reduction in service life.
[0041] In the embodiment, the probe body 40 comprises a needle shaft 41 and a needle cylinder 42 coaxially fixed outside the upper end of the needle shaft 41; the upper end of the needle cylinder 42 has an extension 421 extending upwards beyond the upper end of the needle shaft 41, the inner cavity of the extension 421 forms a connecting cavity 422 for fixedly connecting a wire, and a through hole 401 is provided on the extension 421 to facilitate processing and installation.
[0042] In the embodiment, the lower end of the needle cylinder 42 abuts against the upper end face of the guide column body 10 through a limiting piece and provides an upward supporting force for the needle shaft 41, thereby playing a role of limiting the needle shaft 41, and cooperating with the second elastic buffer 50 to provide a reverse pressure and supporting force for the needle shaft 41; specifically, the limiting piece is an insulating plate 60.
[0043] In addition, the assembly method of the multi-stage buffer test probe according to the present application comprises the following steps:
[0044] The first elastic piece is installed at the middle part of the guide column body 10;
[0045] The movable sleeve 20 is coaxially sleeved on the lower part of the guide column body 10 at the lower side of the guide column body 10;
[0046] One end of the second elastic buffer 50 is installed on the insulating mounting piece 130, and the other end is installed on the probe body 40;
[0047] The lower end of the probe body 40 is inserted into the guide column body 10, and at the same time, the insulating mounting piece 130 is installed on the upper end of the guide column body 10, and the probe body 40 is inserted into the guide column body 10 to the position.
[0048] It should be understood that those skilled in the art can make improvements or changes according to the above description, and all these improvements and changes shall fall within the protection scope of the appended claims of the present application.
Claims
1. A multi-stage buffer test probe, comprising: The probe body is longitudinally movably penetrated through the upper and lower ends of the guide column body, and the second elastic buffer is arranged above the guide column body.
2. The multi-level buffer test probe of claim 1, wherein, The guide column body is made of aluminum alloy, and the guide column body is provided with an avoiding channel for avoiding the probe body.
3. The multi-level buffer test probe of claim 2, wherein, The lower end surface of the guide column body is provided with a positioning groove, and the insulating seat is detachably connected to the bottom surface of the positioning groove through a connecting rod.
4. The multi-level buffer test probe of claim 3, wherein, The connecting rod is vertically arranged and is in threaded connection with the guide column body.
5. The multi-level buffer test probe of claim 2, wherein, The second elastic buffer is detachably connected to the insulating mounting at the end away from the probe body.
6. The multi-level buffer test probe of claim 2, wherein, The second elastic buffer is in the shape of a long strip, and the probe body is provided with a through hole through which the second elastic buffer passes.
7. The multi-level buffer test probe of claim 6, wherein, The diameter of the through hole is greater than the diameter of the second elastic buffer, and when assembled in place, there is a stroke gap between the side walls of the upper and lower ends of the through hole and the second elastic buffer.
8. The multi-level buffer test probe of claim 7, wherein, The probe body comprises a needle shaft and a needle cylinder coaxially fixed outside the upper end of the needle shaft.
9. The multi-level buffer test probe of claim 8, wherein, The lower end of the needle cylinder abuts against the upper end surface of the guide column body through a limiting piece and provides an upward supporting force for the needle shaft.