Device for testing high-temperature stability of PTC chip insulating material

Abstract

The utility model discloses a PTC chip insulating material high temperature stability testing device, and relates to the PTC chip insulating material testing technology field, the PTC chip insulating material high temperature stability testing device comprises a machine body, the upper end of the machine body is provided with a detection box, the detection box is internally and rotatably provided with a chip storage mechanism, and the periphery of the detection box is fixedly provided with guide rods; a movable plate is slidably connected to the guide rod, a sealing cover is fixedly arranged at the lower end of the movable plate, a rotary positioning mechanism is rotatably mounted at the lower end of the sealing cover, and when the rotary positioning mechanism is in plug-in fit with the chip storage mechanism, the rotary positioning mechanism is driven by a motor to rotate and be heated with the chip. According to the utility model, the chip can be uniformly heated through a rotation mechanism, the temperature distribution uniformity in the detection process is improved, the accuracy and reliability of the test result are effectively improved, and the test error caused by local overheating or insufficient heating is also reduced.

Description

TECHNICAL FIELD

[0001] The utility model relates to PTC chip insulating material test technical field especially a kind of PTC chip insulating material high-temperature stability test device. BACKGROUND

[0002] With the rapid development of electronic technology, the performance requirements of electronic components, especially PTC chip insulating materials, are increasing. In practical applications, PTC chips need to maintain stable working conditions under various environmental conditions, especially in high-temperature environments, and the stability of their performance is particularly important. Therefore, accurately assessing the stability of PTC chip insulating materials under high-temperature conditions is a key step to ensure product quality and reliability. Traditional high-temperature stability testing methods usually involve placing samples in a heating chamber and controlling the heating process through simple mechanical structures or manual methods. However, this method has some significant limitations:

[0003] Traditional equipment cannot guarantee uniform temperature distribution inside the detection box, which can easily cause local overheating or insufficient heating, affecting the accuracy of test results. The detection box has a certain depth, making the process of putting and taking out samples complex and time-consuming, increasing the risk of manual operation. SUMMARY

[0004] The utility model aims at providing a kind of PTC chip insulating material high-temperature stability test device, which can avoid the problem of traditional equipment that cannot guarantee uniform temperature distribution inside the detection box, which can easily cause local overheating or insufficient heating, thereby affecting the accuracy of test results.

[0005] The utility model provides a kind of PTC chip insulating material high-temperature stability test device, including body, the upper end of body is provided with detection box, and chip storage mechanism is rotatably arranged in detection box. A guide rod is fixedly arranged around the detection box. A moving plate is slidably connected to the guide rod. A sealing cover is fixedly arranged at the lower end of the moving plate. A rotary positioning mechanism is rotatably installed at the lower end of the sealing cover. When the rotary positioning mechanism is inserted and matched with the chip storage mechanism, the rotary positioning mechanism is driven by the motor, and the chip is rotated and heated by the rotary positioning mechanism.

[0006] Preferably, the upper end of the guide rod is fixedly provided with a top plate, and a gas cylinder is installed on the top plate. The piston end of the gas cylinder penetrates through the top plate and is fixedly connected with the moving plate.

[0007] Preferably, heating pipes are embedded in the four walls of the detection box. A temperature controller is installed on one side of the detection box.

[0008] Preferably, the chip storage mechanism comprises a rotating column rotationally connected with the inside of the detection box, the upper end of the rotating column is slidably provided with a sliding sleeve, the upper end of the sliding sleeve is fixedly provided with a discharging plate, and the rotating column is connected with the sliding sleeve through a spring two.

[0009] Preferably, limit grooves are formed in the two sides of the sliding sleeve, and limit blocks are arranged on the two sides of the rotating column and slidably matched with the limit grooves.

[0010] Preferably, discharging grooves are symmetrically formed in the upper side of the discharging plate.

[0011] Preferably, a rotating groove is formed in the center of the discharging plate, and recesses are symmetrically formed in the rotating groove.

[0012] Preferably, the rotating positioning mechanism comprises a rotating plate rotationally arranged with the sealing cover, a rotating rod is arranged in the center of the rotating plate, side strips are arranged on the two sides of the rotating rod, and the side strips are insertedly matched with the recesses.

[0013] Preferably, hollow sleeves are fixedly arranged on the two sides of the rotating plate, a sliding rod is slidably arranged in the hollow sleeve, and a rubber head is fixedly connected to one end of the sliding rod.

[0014] Preferably, a spring one is connected between the sliding rod and the hollow sleeve.

[0015] Compared with the prior art, the PTC chip insulating material high-temperature stability testing device provided by the embodiment of the utility model has the advantages that:

[0016] 1. The utility model discloses a sealing cover is driven to descend through the pneumatic cylinder, and its side strip is accurately inserted into the recess on the detection box. With the continuous push of the pneumatic cylinder, the sealing cover is tightly attached to the detection box, ensuring the sealing property of the internal environment. Then, by the rotating mechanism of the rotating plate, the rotating rod drives the discharging plate, the sliding sleeve and the rotating column to rotate synchronously, so that the chip placed on the discharging plate can rotate 360 degrees in the detection box. This rotating mechanism ensures that the chip can be uniformly heated, improves the temperature distribution uniformity in the detection process, and effectively improves the accuracy and reliability of the test results. This design not only optimizes the heat transfer efficiency, but also reduces the test errors caused by local overheating or insufficient heating.

[0017] 2. When the rotating rod is separated from the rotating groove, the spring two restores its elastic deformation, generates a pushing force to make the sliding sleeve move upward, and then drives the discharging plate to rise. This action enables the discharging plate to smoothly pass through the upper end opening of the detection box, and the tested chip is sent out of the detection box, which is convenient for the detection personnel to easily take the chip. This design simplifies the chip taking-out process through the automatic reset mechanism of the spring, improves the operation convenience and work efficiency, and also reduces the pollution or damage risk caused by manual operation. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical scheme of the embodiments of the present application, the drawings required to be used in the embodiments will be briefly introduced as follows, and it should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation to the scope, and for those skilled in the art, other related drawings can also be obtained without creative labor on the premise that there is no conflict.

[0019] Figure 1 It is an overall structure schematic view of the embodiment of the present application.

[0020] Figure 2 It is an overall structure sectional view schematic view of the embodiment of the present application.

[0021] Figure 3 It is a detection box structure schematic view of the embodiment of the present application.

[0022] Figure 4 It is a guide rod structure schematic view of the embodiment of the present application.

[0023] Figure 5 It is a sealing cover structure schematic view of the embodiment of the present application.

[0024] Figure 6 It is a rotating positioning mechanism structure schematic view of the embodiment of the present application.

[0025] Figure 7 It is a heating pipe structure schematic view of the embodiment of the present application.

[0026] Figure 8 It is a chip storage mechanism structure schematic view of the embodiment of the present application.

[0027] Reference signs:

[0028] 1, machine body; 2, detection box; 3, guide rod; 4, top plate; 5, air cylinder; 6, moving plate; 7, sealing cover; 8, rotating plate; 9, rotating rod; 10, side strip; 11, hollow sleeve; 12, spring one; 13, sliding rod; 14, rubber head; 15, heating pipe; 16, temperature controller; 17, rotating column; 18, sliding sleeve; 19, limiting groove; 20, spring two; 21, limiting block; 22, discharging plate; 23, discharging groove; 24, rotating groove; 25, groove. DETAILED DESCRIPTION

[0029] Some embodiments of the present application will be described in detail below with reference to the drawings. In the case of no conflict, the following embodiments and features in the embodiments can be combined with each other.

[0030] Please refer to Figures 1-8The utility model discloses a kind of PTC chip insulating material high-temperature stability testing devices, including body 1, the upper end of body 1 is provided with detection box 2, heating pipe 15 is embedded in the four walls of detection box 2, heating pipe 15 generates high temperature after electrification, for the high-temperature stability test of chip insulating material, temperature controller 16 is installed on one side of detection box 2, temperature controller 16 is used to control the temperature when detecting, when chip is placed in detection box 2, start to rise to first set temperature, and keep for a period of time. During this period, record the various performance indicators of chip, to evaluate its stability under high temperature, complete the test of a temperature point, gradually increase temperature according to predetermined step, repeat the above test process. Every time temperature is increased, corresponding data needs to be recorded, after all tests are completed, analyze the collected data, evaluate the performance change of PTC chip insulating material under different temperatures, determine its high-temperature stability and failure temperature.

[0031] In order to store the chip to be detected, a chip storage mechanism is rotatably arranged in the detection box 2. The chip storage mechanism includes a rotating column 17 rotatably connected to the inside of the detection box 2. The upper end of the rotating column 17 is slidably provided with a sliding sleeve 18. Limiting grooves 19 are formed on both sides of the sliding sleeve 18. Limiting blocks 21 are arranged on both sides of the rotating column 17. The limiting blocks 21 are in sliding cooperation with the limiting grooves 19. Therefore, when the rotating column 17 rotates, the sliding sleeve 18 is driven to rotate by the limiting blocks 21. The upper end of the sliding sleeve 18 is fixedly provided with a discharging plate 22. A spring 20 is connected between the rotating column 17 and the sliding sleeve 18. The chip can be placed on the upper side of the discharging plate 22. When the spring 20 is not compressed, the discharging plate 22 is higher than the opening of the detection box 2, so that the detection personnel can easily take the chip. In addition, during the detection process, the rotating column 17 can rotate with the sliding sleeve 18, so as to drive the chip to rotate and ensure that the chip is evenly heated, thereby improving the detection efficiency.

[0032] A discharging groove 23 is symmetrically formed on the upper side of the discharging plate 22 for placing the chip.

[0033] A guide rod 3 is fixedly arranged around the detection box 2. A moving plate 6 is slidably connected to the guide rod 3. A sealing cover 7 is fixedly arranged at the lower end of the moving plate 6. A rotating positioning mechanism is rotatably installed at the lower end of the sealing cover 7. When the rotating positioning mechanism is insertedly connected with the chip storage mechanism, the rotating positioning mechanism is driven by the motor, so that the rotating positioning mechanism rotates with the chip.

[0034] A top plate 4 is fixedly arranged at the upper end of the guide rod 3. A gas cylinder 5 is installed on the top plate 4. The piston end of the gas cylinder 5 is fixedly connected with the moving plate 6 through the top plate 4. After the chip is placed, the moving plate 6 is lowered by the gas cylinder 5, so that the sealing cover 7 seals the detection box 2, and the chip can be subjected to high-temperature detection.

[0035] In order to make the rotating column 17 automatically rotate, the specific structure of the rotating positioning mechanism is disclosed, wherein the rotating positioning mechanism comprises a rotating plate 8 rotatably arranged with the sealing cover 7, a rotating rod 9 is arranged at the center of the rotating plate 8, the rotating rod 9 is driven by a motor, side strips 10 are arranged on both sides of the rotating rod 9, a rotating groove 24 is formed at the center of the discharging plate 22, and recesses 25 are symmetrically formed in the rotating groove 24; when the sealing cover 7 descends with the rotating rod 9, the rotating rod 9 can be inserted in the rotating groove 24, and the side strips 10 are inserted and matched with the recesses 25; by driving the motor, the rotating rod 9 drives the discharging plate 22 to rotate, and the chip rotation heating is realized.

[0036] Meanwhile, the hollow sleeves 11 are fixedly arranged on both sides of the rotating plate 8, the sliding rods 13 are slidably arranged in the hollow sleeves 11, the rubber heads 14 are fixedly connected to one end of the sliding rods 13, and the springs one 12 are connected between the sliding rods 13 and the hollow sleeves 11; when the sealing cover 7 seals the detection box 2, the rubber heads 14 are in contact with the chip insulating material, the sliding rods 13 extrude the springs one 12 to buffer and protect the chip, the stability of the chip insulating material is improved, and the material is not damaged.

[0037] In summary, the working principle of the PTC chip insulating material high-temperature stability testing device is that: first, the to-be-tested chip is placed in the discharging groove 23 of the discharging plate 22. The cylinder 5 is started to drive the sealing cover 7 to descend and seal the detection box 2, and the rotating rod 9 is inserted into the rotating groove 24 through the insertion and matching of the rotating positioning mechanism and the chip storage mechanism. The motor drives the rotating rod 9 to rotate, drives the discharging plate 22 and the chip to rotate synchronously, and ensures that the chip is uniformly heated. The heating pipe 15 is powered to heat, the temperature controller 16 controls the set temperature and keeps for a period of time, and the chip performance data is recorded. After completing the test of one temperature point, the temperature is gradually increased to repeat the test. After the test is completed, the rotating rod 9 is separated from the rotating groove 24, the spring two 20 pushes the sliding sleeve 18 to rise, the discharging plate 22 is higher than the opening of the detection box 2, and the chip is convenient to take.

[0038] The above is only a preferred embodiment of the utility model, and is not used for limiting the utility model. For those skilled in the art, the utility model can have various changes and changes. Any modification, equivalent replacement, improvement, etc. within the spirit and principle of the utility model should be included in the protection scope of the utility model.

Claims

1. A device for testing high temperature stability of PTC chip insulating material, comprising a machine body (1), characterized in that: The upper end of the machine body (1) is provided with a detection box (2), a chip storage mechanism is rotatably arranged in the detection box (2), guide rods (3) are fixedly arranged around the detection box (2), a moving plate (6) is slidably connected to the guide rods (3), a sealing cover (7) is fixedly arranged at the lower end of the moving plate (6), a rotary positioning mechanism is rotatably arranged at the lower end of the sealing cover (7), when the rotary positioning mechanism is inserted into the chip storage mechanism, the rotary positioning mechanism is driven by the motor to rotate and heat the chip.

2. The PTC chip insulation material high temperature stability testing device according to claim 1, characterized in that: The upper end of the guide rod (3) is fixedly provided with a top plate (4), the top plate (4) is provided with a cylinder (5), and the piston end of the cylinder (5) penetrates through the top plate (4) and is fixedly connected with the moving plate (6).

3. The PTC chip insulation material high temperature stability testing device according to claim 2, characterized in that: The four walls of the detection box (2) are embedded with heating pipes (15), and a temperature controller (16) is arranged on one side of the detection box (2).

4. The PTC chip insulation material high temperature stability testing device according to claim 1, characterized in that: The chip storage mechanism comprises a rotating column (17) rotatably connected with the inside of the detection box (2), a sliding sleeve (18) slidably arranged at the upper end of the rotating column (17), a discharging plate (22) fixedly arranged at the upper end of the sliding sleeve (18), and a spring (20) connected between the rotating column (17) and the sliding sleeve (18).

5. The PTC chip insulation material high temperature stability testing device according to claim 4, characterized in that: Limiting grooves (19) are formed in the two sides of the sliding sleeve (18), limiting blocks (21) are arranged on the two sides of the rotating column (17), and the limiting blocks (21) and the limiting grooves (19) are in sliding fit.

6. The PTC chip insulation material high temperature stability testing device according to claim 5, characterized in that: A discharging groove (23) is symmetrically formed in the upper side of the discharging plate (22).

7. The PTC chip insulation material high temperature stability testing device according to claim 6, characterized in that: A rotating groove (24) is formed in the center of the discharging plate (22), and recesses (25) are symmetrically formed in the rotating groove (24).

8. The PTC chip insulation material high temperature stability testing device according to claim 1, characterized in that: The rotary positioning mechanism comprises a rotating plate (8) rotatably arranged with the sealing cover (7), a rotating rod (9) arranged at the center of the rotating plate (8), side strips (10) arranged on the two sides of the rotating rod (9), and the side strips (10) and the recesses (25) are in plug-in fit.

9. The PTC chip insulation material high temperature stability testing device according to claim 8, characterized in that: The rotating plate (8) is fixedly provided with a hollow sleeve (11) on the two sides, a sliding rod (13) is slidably arranged in the hollow sleeve (11), and a rubber head (14) is fixedly connected to one end of the sliding rod (13).

10. The PTC chip insulation material high temperature stability testing device according to claim 9, characterized in that: The sliding rod (13) and the hollow sleeve (11) are connected with a spring (12).

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