Mainboard testing equipment

Abstract

The utility model relates to the technical field of mainboard testing equipment, in particular to mainboard testing equipment, and aims to solve the problem that an existing mainboard detection process is tedious. In order to achieve the purpose, the mainboard testing equipment comprises a base, a testing device and a testing device, the overturning cover is hinged to the upper side of the base; the supporting plate is arranged on the upper side of the base and provided with a containing groove. The movable plug group is connected with the base and located on one side of the interface close to the side face of the mainboard to be tested, and the movable plug group is arranged to be capable of being inserted into the interface; the movable plate is connected with the overturning cover, a contact assembly is arranged on the movable plate, and the contact assembly is arranged to be connected with pins on the front face of the mainboard to be tested when the overturning cover is buckled on the base. According to the testing equipment, through the innovative design of the overturning cover and the movable plug set, synchronous detection of interfaces on the front face and the side face of the mainboard is achieved, and the efficiency bottleneck caused by step-by-step operation of traditional equipment is solved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of mainboard testing equipment, and specifically provides a mainboard testing equipment. BACKGROUND

[0002] A mainboard is a core component in a computer, and mainboard testing is an essential process before the mainboard is shipped. The components tested by the mainboard testing include interfaces on the front of the mainboard, specifically including: a CPU socket, a memory slot, a PCL slot, a mainboard power supply slot, various pins, and interfaces on the side of the mainboard, specifically including: a USB interface, an audio interface, a network interface, and the like.

[0003] At present, general detection equipment can only detect the pins on the front of the mainboard or the structure on the side of the mainboard, and cannot detect the pins on the front of the mainboard and the interfaces on the side of the mainboard at the same time, thereby affecting the detection efficiency.

[0004] Correspondingly, there is a need in the art for a new technical solution to solve the above problems. SUMMARY

[0005] The present application aims to solve the above technical problems and solve the problem of complicated existing mainboard detection processes.

[0006] The present application provides a mainboard testing equipment, which comprises: a base; a turnover cover hinged to the upper side of the base; a support plate arranged on the upper side of the base and provided with a placing groove; a movable plug set connected with the base and located on the side close to the interfaces on the side of the mainboard to be tested, the movable plug set being arranged to be capable of being inserted into the interfaces on the side of the mainboard to be tested; and a movable plate connected with the turnover cover, the movable plate being provided with a contact assembly, the contact assembly being arranged to be connected with the pins on the front of the mainboard to be tested when the turnover cover is fastened to the base.

[0007] In the case of adopting the above technical solution, the testing equipment realizes the synchronous detection of the interfaces on the front and the side of the mainboard through the innovative design of the turnover cover and the movable plug set, and solves the efficiency bottleneck caused by the step-by-step operation of the traditional equipment. When the turnover cover is fastened, the contact assembly on the movable plate is connected with the pins on the front of the mainboard to be tested, and at the same time, the movable plug set can be moved to the position of the interfaces on the side to complete the plug-in, thereby shortening the detection time of 5-8 minutes of the traditional equipment to within 3 minutes.

[0008] In the specific embodiment of the above mainboard testing equipment, the movable plate is provided with a resilient ejector pin, one end of the resilient ejector pin being arranged to be capable of pressing the mainboard to be tested in the placing groove.

[0009] In the technical scheme, the elastic top pin is introduced to optimize the fixing effect of the mainboard, and the end pressure of the top pin is self-adaptively adjusted by the spring or elastic material, so that the mainboard is not damaged and the contact stability is ensured.

[0010] In the embodiment of the mainboard testing device, the limiting rod is arranged on the movable plate, and the limiting slot is arranged on the supporting plate, and the limiting rod is arranged to be located in the limiting slot when the turnover cover is buckled on the base.

[0011] In the technical scheme, the limiting rod and the limiting slot are designed, and the top pin moves along the Z-axis direction during the pressing process, so that the pin is not bent or the interface is not damaged due to lateral deviation.

[0012] In the embodiment of the mainboard testing device, the number of the elastic top pins is multiple, and the multiple elastic top pins are arranged along the circumferential direction of the mainboard to be tested.

[0013] In the technical scheme, the circumferentially distributed elastic top pins further enhance the comprehensiveness and reliability of the test. The top pins are arranged equidistantly along the circumferential edge of the mainboard, so that the stress is uniformly transmitted during the pressing process, and the solder joint is not cracked due to local stress concentration.

[0014] In the embodiment of the mainboard testing device, the mainboard testing device further comprises a plug moving assembly, the plug moving assembly is fixedly connected with the base, the driving end of the plug moving assembly is connected with the movable plug group, and the plug moving assembly is arranged to drive the movable plug group to move.

[0015] In the technical scheme, the plug moving assembly is introduced to realize the automatic control of the test process, so that the movement of the movable plug group is more convenient.

[0016] In the embodiment of the mainboard testing device, the movable plug group comprises a plug fixing plate and a connecting head, the plug fixing plate is connected with the driving end of the plug moving assembly, the connecting head is fixedly connected with the plug fixing plate, one end of the connecting head is arranged to be inserted into the interface on the side of the mainboard to be tested, and the other end of the connecting head is electrically connected with the signal transmission line.

[0017] In the technical scheme, the signal transmission line and the mainboard to be tested are connected through the connecting head, when different models of mainboards need to be replaced, the position of the connecting head on the plug fixing plate is adjusted, and the use is more convenient.

[0018] In the specific embodiment of the mainboard testing device, the fixing plate is provided with a through hole, the connecting head is provided with a fixing protrusion, the connecting head passes through the through hole, and the fixing protrusion is connected with the fixing plate by a bolt.

[0019] In the specific embodiment of the mainboard testing device, the fixing plate is provided with a through hole, the connecting head is provided with a fixing protrusion, the connecting head passes through the through hole, and the fixing protrusion is connected with the fixing plate by a bolt.

[0020] In the specific embodiment of the mainboard testing device, the base is provided with a first hook, the flip cover is movably provided with a second hook, and the first hook and the second hook are hooked with each other when the flip cover is buckled on the base.

[0021] In the specific embodiment of the mainboard testing device, the contact assembly comprises a probe fixing block and a probe, the probe passes through the probe fixing block, one end of the probe is arranged to be connected with the pins on the front surface of the mainboard to be tested when the flip cover is buckled on the base, and the other end of the probe is electrically connected with the signal transmission line.

[0022] In the specific embodiment of the mainboard testing device, the contact assembly comprises a probe fixing block and a probe, the probe passes through the probe fixing block, one end of the probe is arranged to be connected with the pins on the front surface of the mainboard to be tested when the flip cover is buckled on the base, and the other end of the probe is electrically connected with the signal transmission line.

[0023] In the specific embodiment of the mainboard testing device, the contact assembly comprises a probe fixing block and a probe, the probe passes through the probe fixing block, one end of the probe is arranged to be connected with the pins on the front surface of the mainboard to be tested when the flip cover is buckled on the base, and the other end of the probe is electrically connected with the signal transmission line.

[0024] In the specific embodiment of the mainboard testing device, the contact assembly comprises a probe fixing block and a probe, the probe passes through the probe fixing block, one end of the probe is arranged to be connected with the pins on the front surface of the mainboard to be tested when the flip cover is buckled on the base, and the other end of the probe is electrically connected with the signal transmission line. BRIEF DESCRIPTION OF DRAWINGS

[0025] The preferred embodiments of the present application will be described below with reference to the accompanying drawings, in which:

[0026] Figure 1 is a schematic view of the overall structure of an embodiment of the mainboard testing device;

[0027] Figure 2 is a schematic view of the overall structure of an embodiment of the mainboard testing device from another angle;

[0028] Figure 3 is a schematic view of the overall structure of an embodiment of the base of the mainboard testing device;

[0029] Figure 4 is a schematic view of the connection relationship of an embodiment of the movable plate of the mainboard testing device.

[0030] List of reference signs: 1 - base; 11 - first hook; 12 - first hinged block; 2 - flip cover; 21 - second hook; 22 - second hinged block; 23 - hook connecting block; 24 - handrail; 3 - gas spring; 4 - support plate; 41 - limiting groove; 5 - mainboard to be tested; 51 - pin; 52 - interface; 62 - movable plug group; 621 - fixed plate; 71 - air cylinder; 8 - signal transmission line; 9 - movable plate; 91 - elastic ejector pin; 92 - probe; 93 - limiting rod. DETAILED DESCRIPTION

[0031] The preferred embodiments of the present application will be described below with reference to the accompanying drawings. Those skilled in the art will understand that these embodiments are only used to explain the technical principles of the present application, and are not used to limit the protection scope of the present application. Those skilled in the art can make adjustments as needed to adapt to specific application occasions.

[0032] It should be noted that in the description of the present application, unless otherwise explicitly specified and limited, the terms "set", "connected" and the like should be understood broadly, for example, "connected" can be fixedly connected, or detachably connected or integrally connected; can be mechanically connected, or other connected; can be directly connected, or indirectly connected through an intermediate medium. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances. In addition, the terms "first", "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance.

[0033] It should be further understood that the terms "upper", "left", "right" and the like indicate the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. In addition, "multiple" in the present application means at least two.

[0034] As Figures 1 to 4As shown, in order to solve the problem of complicated existing mainboard detection process, the present application provides a kind of mainboard test equipment, comprising: base 1;Flip cover 2, which is hinged with the upper side of base 1;Supporting plate 4, which is arranged on the upper side of base 1, and is provided with a placing groove;Movable plug group 62, which is connected with base 1 and located on the side close to the interface 52 of the side of the mainboard to be tested 5, movable plug group 62 is arranged to be inserted into the interface 52 of the side of the mainboard to be tested 5;Movable plate 9, movable plate 9 is connected with flip cover 2, and contact assembly is arranged on movable plate 9, contact assembly is arranged to be connected with the pin 51 of the front of the mainboard to be tested 5 when flip cover 2 is buckled on base 1.Such, the test equipment realizes the synchronous detection of the front and side interface 52 of the mainboard through the innovative design of flip cover 2 and movable plug group 62, solves the efficiency bottleneck caused by the step-by-step operation of traditional equipment.When flip cover 2 is buckled, the contact assembly on movable plate 9 is connected with the pin 51 of the front of the mainboard to be tested 5, and movable plug group 62 can be moved to the position of side interface 52 to complete the plug-in, which shortens the detection time of traditional 5-8 minutes to within 3 minutes.

[0035] As shown in Figure 1 and Figure 2 , a kind of mainboard test equipment includes base 1 and flip cover 2 and air spring 3 for supporting base 1 and flip cover 2.As shown in Figure 1 , in one or more embodiments, first hinged block 12 is arranged on the left side of the upper side of base 1, the number of first hinged block 12 is three, three first hinged block 12 is evenly spaced along the right side of base 1.It is not necessary to replace the setting of first hinged block 12, and those skilled in the art can choose whether to set first hinged block 12 and the number of first hinged block 12 based on specific application scenarios.For example, first hinged block 12 is one, two or four, etc., of course, first hinged block 12 can not be set.A first hook 11 is arranged on the right side of the upper side of base 1, and the opening of first hook 11 faces the right side.Alternatively, first hook 11 can not be set.

[0036] As shown in Figure 1 and Figure 2 , in one or more embodiments, the lower side of flip cover 2 Figure 2 Left side is provided with second hinged block 22.The number of second hinged block 22 is three, and three second hinged block 22 and three first hinged block 12 are arranged one by one.Meanwhile, three hinged shafts are also arranged, so that first hinged block 12 and second hinged block 22 can rotate relative to hinged shaft.In one or more embodiments, two hook connecting blocks 23 are arranged on the right side of the lower side of flip cover 2 Figure 2 Each second hook 21 is rotatably connected to each hook connecting block 23.As shown in Figure 2As shown, the second hooks 21 are hooked with the first hooks 11. The separation from the first hooks 11 can be achieved by counterclockwise rotation of the second hooks 21. The two second hooks 21 are both arranged in L shape, and the ends away from the hook heads of the two second hooks 21 are respectively connected to the two ends of the handrails 24. The movement of the handrails 24 can change the positions of the second hooks 21.

[0037] As shown in the drawings, Figure 1 In one or more embodiments, the mainboard testing device further comprises two air springs 3. The two air springs 3 are located on the two sides of the base 1, one end of the air spring 3 is connected with the base 1, and the other end of the air spring 3 is connected with the flip cover 2.

[0038] As shown in the drawings, Figure 3 In one or more embodiments, the support plate 4 is arranged on the upper side of the base 1, and is provided with a placing groove for placing the mainboard 5 to be tested. The support plate 4 is provided with a limiting groove 41, which is convenient for cooperation with the components on the flip cover 2.

[0039] It should be noted that, in order to clearly understand the device involved in the present application, the mainboard 5 to be tested used in the embodiments is simply described. The mainboard 5 to be tested is a computer mainboard, the front surface of the mainboard 5 to be tested is the surface shown in Figure 3 , and the side surface of the mainboard 5 to be tested is the surface roughly facing the right side in Figure 3 . The front surface of the mainboard 5 to be tested is provided with pins 51, and the side surface is provided with interfaces 52.

[0040] As shown in the drawings, Figure 3 In one or more embodiments, the mainboard testing device further comprises a plug moving assembly, the plug moving assembly is fixedly connected with the base 1, the driving end of the plug moving assembly is connected with the movable plug group 62, and the plug moving assembly is arranged to drive the movable plug group 62 to move. The introduction of the plug moving assembly realizes the automatic control of the testing process, so that the movement of the movable plug group 62 is more convenient. The plug moving assembly can be selected as a pneumatic cylinder 71, of course, it can also be selected based on specific application scenarios, of course, the plug moving assembly can also not be arranged.

[0041] As shown in the drawings, Figure 3As shown in one or more embodiments, the mainboard testing device further comprises a movable plug set 62. The movable plug set 62 comprises a plug fixing plate 621 connected with the driving end of the plug moving assembly and a connecting head. The plug fixing plate 621 is provided with a through hole, and the connecting head is provided with a fixing protrusion. The connecting head passes through the through hole, and the fixing protrusion is connected with the plug fixing plate 621 by a bolt. The connecting head is connected with the plug fixing plate 621 through the fixing protrusion. One end of the connecting head is arranged to be inserted into the interface 52 on the side of the mainboard 5 to be tested, and the other end of the connecting head is electrically connected with the signal transmission line 8. When testing is needed, the connecting head is inserted into the interface 52 on the side of the mainboard 5 to be tested, and when testing is not needed, the connecting head can be controlled to be pulled out of the interface 52 on the side. It should be noted that different connecting heads need to be adapted due to different types of interfaces 52 on the side. The specific structure of the connecting head can be selected by a person skilled in the art based on the specific application scenario. It should be further noted that the plug fixing plate 621 can also be connected with the plug moving assembly, and the movable plug set 62 can be moved manually.

[0042] As shown in one or more embodiments, Figure 4 As shown in one or more embodiments, the movable plate 9 is connected with the flip cover 2, and a contact assembly is arranged on the movable plate 9. The contact assembly is arranged to be connected with the pins 51 on the front of the mainboard 5 to be tested when the flip cover 2 is buckled on the base 1. When the flip cover 2 is buckled, the contact assembly on the movable plate 9 is connected with the pins 51 on the front of the mainboard 5 to be tested. In one or more embodiments, the contact assembly comprises a probe fixing block and a probe 92. The probe 92 passes through the probe fixing block. One end of the probe 92 is arranged to be connected with the pins 51 on the front of the mainboard 5 to be tested when the flip cover 2 is buckled on the base 1. The other end of the probe 92 is electrically connected with the signal transmission line 8, and the signal transmission line 8 can transmit the collected signals to a designated position. By arranging the probes 92 at different positions on the fixing block, the contact assembly can meet the plugging requirements of different plugging positions. The number of contact assemblies is multiple. By using multiple contact assemblies, the signals of different plugging positions on the computer mainboard can be tested, and multiple positions can be tested at one time, which is more efficient. It should be noted that the specific structure of the probe 92 is a prior art, which will not be described here.

[0043] As shown in one or more embodiments, Figure 4 As shown in one or more embodiments, a limiting rod 93 is arranged on the movable plate 9. The limiting rod 93 is arranged to be located in the limiting groove 41 when the flip cover 2 is buckled on the base 1. The limiting rod 93 and the limiting groove 41 are designed to move along the Z-axis direction during the pressing process, avoiding the bending of the pins 51 or the damage of the interface caused by lateral deviation.

[0044] As shown in one or more embodiments, Figure 4As shown, in one or more embodiments, the movable plate 9 is provided with elastic pins 91, one end of which is arranged to be able to press the to-be-tested mainboard 5 placed in the slot. The end pressure of the pins is self-adaptively adjusted by springs or elastic materials, which can not only avoid damage to the mainboard by hard pressure, but also ensure stable contact. It should be noted that the elastic pins 91 are composed of a top head, a spring, a push cylinder and other components, and the continuous pressure is provided by the elastic deformation of the spring. The elastic pins 91 are prior art and will not be described here. The number of the elastic pins 91 is multiple, and the multiple elastic pins 91 are arranged along the circumferential direction of the to-be-tested mainboard 5. The circumferentially distributed elastic pins 91 further enhance the comprehensiveness and reliability of the test.

[0045] Those skilled in the art will appreciate that a combination of features of different embodiments implies within the scope of the application and forms different embodiments, although some embodiments described herein include certain features rather than others included in other embodiments. For example, in the claims of the present application, any one of the claimed embodiments can be used in any combination.

[0046] So far, the technical solutions of the present application have been described in combination with the preferred embodiments shown in the drawings, but those skilled in the art can easily understand that the protection scope of the present application is obviously not limited to these specific embodiments. Those skilled in the art can make equivalent changes or replacements to the related technical features without departing from the principles of the present application, and the technical solutions after the changes or replacements will fall within the protection scope of the present application.

Claims

1. A motherboard testing device, characterized in that, include: Base (1); A flip cover (2) is hinged to the upper side of the base (1); A support plate (4) is disposed on the upper side of the base (1) and has a placement groove. A movable plug assembly (62) is connected to the base (1) and located on the side of the interface (52) near the side of the motherboard (5) under test. The movable plug assembly (62) is configured to be able to be inserted into the interface (52) on the side of the motherboard (5) under test. An active plate (9) is connected to the flip cover (2). A contact component is provided on the active plate (9). The contact component is configured to connect with the pins (51) on the front of the motherboard (5) under test when the flip cover (2) is fastened to the base (1).

2. The motherboard testing equipment according to claim 1, characterized in that, The movable plate (9) is provided with an elastic pin (91), one end of which is configured to press the main board (5) to be tested in the placement slot.

3. The motherboard testing equipment according to claim 2, characterized in that, The movable plate (9) is provided with a limiting rod (93), and the support plate (4) is provided with a limiting groove (41). The limiting rod (93) is configured such that when the flip cover (2) is fastened to the base (1), the limiting rod (93) is located in the limiting groove (41).

4. The motherboard testing device according to claim 2, characterized in that, The number of elastic pins (91) is multiple, and the multiple elastic pins (91) are arranged along the circumferential direction of the motherboard (5) to be tested.

5. The motherboard testing device according to claim 1, characterized in that, The motherboard testing equipment also includes a plug moving component, which is fixedly connected to the base (1). The driving end of the plug moving component is connected to the movable plug group (62), and the plug moving component is configured to drive the movable plug group (62) to move.

6. The motherboard testing equipment according to claim 5, characterized in that, The movable plug assembly (62) includes a plug fixing plate (621) and a connector. The plug fixing plate (621) is connected to the drive end of the plug moving assembly. The connector is fixedly connected to the plug fixing plate (621). One end of the connector is configured to be inserted into the interface (52) on the side of the motherboard under test (5). The other end of the connector is electrically connected to the signal transmission line (8).

7. The motherboard testing device according to claim 6, characterized in that, The fixing plate (621) is provided with a through hole, and the connector is provided with a fixing flange. The connector passes through the through hole, and the fixing flange is connected to the fixing plate (621) by bolts.

8. The motherboard testing device according to claim 1, characterized in that, The base (1) is provided with a first hook (11), and the flip cover (2) is movably provided with a second hook (21). When the flip cover (2) is fastened to the base (1), the first hook (11) and the second hook (21) hook each other.

9. The motherboard testing equipment according to claim 1, characterized in that, The contact assembly includes a probe fixing block and a probe (92). The probe (92) passes through the probe fixing block. One end of the probe (92) is configured to connect with the pin (51) on the front of the motherboard when the flip cover (2) is fastened to the base (1). The other end of the probe (92) is electrically connected to the signal transmission line (8).

10. The motherboard testing device according to claim 1, characterized in that, The number of contact components is multiple.

Images