Test fixture for power semiconductor

By designing a test fixture with a U-shaped plate and clamping plate structure, the problem of device wobbling and tipping on the turntable was solved, achieving stable clamping and efficient testing of the device.

CN224052243UActive Publication Date: 2026-03-27XIAN HUAXIN INTELLIGENT MANUFACTURING TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-11
Publication Date
2026-03-27

AI Technical Summary

Technical Problem

The lack of a positioning structure on the top of existing power semiconductor device carriers causes the devices to sway or tip over when the turntable rotates, resulting in low stability and increasing the probability of collision between the test plug and the device, thus leading to poor performance.

Method used

A test fixture comprising a U-shaped plate, a fixed clamping plate, and a movable clamping plate was designed. The fixture achieves stable clamping and positioning of the device through an adjustment mechanism and a limiting mechanism, and uses a servo motor to drive rotation and an electric telescopic rod to achieve insertion and removal.

Benefits of technology

It improves the stability of semiconductor devices, reduces the risk of collision between devices and test plugs, and enhances the stability and efficiency of testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a power semiconductor test fixture, which comprises a workbench, a fixing frame, an electric telescopic rod, a lifting plate, a plug and a rotating mechanism, a U-shaped plate is fixedly connected to the top of a rotating disc, a fixed clamping plate is fixedly connected to the top of the U-shaped plate, a movable clamping plate is movably connected to the top of the U-shaped plate, and the movable clamping plate is fixedly connected to the top of the rotating disc. And a supporting plate is arranged at the top of the U-shaped plate. According to the semiconductor device carrier, the U-shaped plate, the fixed clamping plate and the movable clamping plate are arranged, the U-shaped plate can support the fixed clamping plate and the movable clamping plate, and semiconductor devices located on the inner sides of the fixed clamping plate and the movable clamping plate can be clamped and positioned by moving the movable clamping plate, so that the problem that the top of the semiconductor device carrier is not provided with a positioning structure is solved; therefore, the semiconductor device is easy to shake or topple due to the rotation of the turntable after being placed, the stability is not high, the probability of collision between the test plug and the semiconductor device is improved, the use effect is not good, and the effect of auxiliary positioning is achieved.
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Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of semiconductor device test, specifically to a test fixture of power semiconductor. BACKGROUND

[0002] Power semiconductor devices (such as IGBT, MOSFET, SiC devices, etc.) as the core components of modern power electronic systems are widely used in new energy vehicles, industrial motor drives, renewable energy power generation and other fields, and their performance and reliability are directly related to the efficiency and stability of the entire system. Therefore, it is crucial to comprehensively test power semiconductor devices during production and use.

[0003] For example, the authorized announcement number CN219224994U discloses a semiconductor device non-destructive testing device, which includes a turntable, a turntable drive device, a semiconductor device carrier, a test plug, a pressure touch switch and a guide sleeve. The turntable is horizontally arranged on the turntable drive device, the semiconductor device carrier is arranged in an annular array on the turntable, the guide sleeve is symmetrically arranged on the semiconductor device carrier, the lifting drive mechanism is provided with a lifting plate at the bottom, the test plug is arranged at the bottom of the lifting plate, the lifting plate is provided with a plug rod on both sides of the test plug and corresponding to the guide sleeve, and the pressure touch switch is arranged on the bottom of the synchronous plate and above the top of the plug rod. The semiconductor device non-destructive testing device utilizes the descent of the test plug for plug-in and testing of the semiconductor device, has high automation level, and utilizes the cooperation of the guide sleeve and the plug rod for guidance during the descent process to avoid the impact damage problem of the test plug and the semiconductor device.

[0004] Based on the search of the patent number and the deficiencies in the prior art, it is found that:

[0005] Although this semiconductor device non-destructive testing device utilizes the descent of the test plug for plug-in and testing of the semiconductor device, has high automation level, and utilizes the cooperation of the guide sleeve and the plug rod for guidance during the descent process to avoid the impact damage problem of the test plug and the semiconductor device, but during use, since the top of the semiconductor device carrier is not provided with a positioning structure, the semiconductor device is prone to shaking or toppling after being placed due to the rotation of the turntable, has low stability, simultaneously increases the probability of collision between the test plug and the semiconductor device, and has poor use effect. UTILITY MODEL CONTENTS

[0006] To solve the problems presented in the background art, the utility model discloses a test fixture of power semiconductor has the advantages of auxiliary positioning, solves the top of the semiconductor device carrier and has not set the positioning structure, therefore, the semiconductor device is easy to shake or dump after placing because of the rotation of the rotating disc, and the stability is not high, and the probability of collision between the test plug and the semiconductor device is improved, and the use effect is poor.

[0007] To achieve the above object, the utility model provides the following technical scheme: a test fixture of power semiconductor, including workbench, fixed frame, electric telescopic link, lifting plate, plug and rotating mechanism, the bottom of fixed frame is fixedly connected with the left side of workbench top, electric telescopic link fixed mounting in the top of fixed frame inner wall, the output of electric telescopic link is fixedly installed lifting plate, the bottom of lifting plate is fixedly installed plug, the rotating mechanism includes servo motor, and the bottom of workbench is fixedly installed servo motor, the top of workbench is movably connected with movable seat, the top of movable seat is fixedly connected with rotating disc, the bottom of movable seat is fixedly connected with the output of servo motor, the top of rotating disc is fixedly connected with U type board, the top of U type board is fixedly connected with fixed clamping plate, the top of U type board is movably connected with movable clamping plate, the top of U type board is provided with support plate, the bottom of movable clamping plate is fixedly connected with two adjusting mechanisms, and the side, away from support plate, of fixed clamping plate and movable clamping plate is all set up with limit mechanism.

[0008] As the utility model prefers, the adjusting mechanism includes a sliding plate, the top of the U-shaped plate is provided with two sliding grooves, the surface of the sliding plate is slidably connected with the inner wall of the sliding groove, and the side, away from the fixed clamping plate, of the movable clamping plate is fixedly connected with a handle.

[0009] As the utility model prefers, the limit mechanism includes an adjusting groove, the side, close to the fixed clamping plate, of the support plate is fixedly connected with a first fixed plate, the side, away from the fixed clamping plate, of the support plate is fixedly connected with a second fixed plate, and the two sides of the first fixed plate and the second fixed plate are movably connected with the two sides of the inner wall of the adjusting groove.

[0010] As the utility model prefers, the side, away from the fixed clamping plate, of the sliding plate is fixedly connected with a spring, and the other end of the spring is fixedly connected with the side, away from the fixed clamping plate, of the inner wall of the sliding groove.

[0011] As the utility model prefers, the bottom of the support plate is fixedly connected with a connecting frame, the front side and the rear side of the right side of the top of the workbench are both fixedly installed with an electric push rod, the output of the electric push rod is fixedly connected with a connecting plate, and the top of the connecting plate is fixedly connected with a top rod.

[0012] As the utility model discloses, preferably, the surfaces of the first fixed plate and the second fixed plate are fixedly connected with a limiting sleeve, and a through hole is formed in the top of the inner wall of the U-shaped plate.

[0013] As the utility model discloses, preferably, the outer side of the servo motor is provided with a protective shell, the top of the protective shell is fixedly connected with the bottom of the workbench, and the side, close to the supporting plate, of the fixed clamping plate and the movable clamping plate is fixedly connected with a rubber pad.

[0014] Compared with the prior art, the utility model has the beneficial effects as follows.

[0015] 1、The utility model discloses a U-shaped plate, a fixed clamping plate and a movable clamping plate are arranged, the U-shaped plate can support the fixed clamping plate and the movable clamping plate, the semiconductor device inside the fixed clamping plate and the movable clamping plate can be clamped and positioned by moving the movable clamping plate, the top of the semiconductor device carrier is not provided with a positioning structure, therefore the semiconductor device is easy to shake or fall after being placed due to the rotation of the rotary table, the stability is not high, the probability of collision between the test plug and the semiconductor device is improved, and the use effect is not good, and the auxiliary positioning effect is achieved.

[0016] 2、The utility model discloses an adjusting mechanism, the handle can drive the movable clamping plate to move, the movable clamping plate moves and can drive the sliding plate to slide in the inside of the sliding groove, and the sliding groove can movably position the sliding plate and the movable clamping plate, thereby improving the stability of the movable clamping plate movement.

[0017] 3、The utility model discloses a limiting mechanism, the supporting plate moves up and down and can drive the first fixed plate and the second fixed plate to slide up and down in the inside of the adjusting groove, thereby facilitating the semiconductor device to be taken out by the user, and the length of the second fixed plate is longer than that of the first fixed plate, facilitating the movable clamping plate to move. DRAWINGS

[0018] Figure 1 It is a three-dimensional structure schematic view of the utility model;

[0019] Figure 2 It is a three-dimensional explosion structure schematic view of the fixed clamping plate and the U-shaped plate of the utility model;

[0020] Figure 3 It is a three-dimensional sectional structure schematic view of the workbench and the rotary table of the utility model;

[0021] Figure 4 It is a three-dimensional structure schematic view of the utility model top rod and U-shaped plate.

[0022] In the diagram: 1. Workbench; 2. Fixed frame; 3. Electric telescopic rod; 4. Lifting plate; 5. Plug; 6. Rotating mechanism; 61. Servo motor; 62. Movable seat; 63. Turntable; 7. U-shaped plate; 8. Fixed clamping plate; 9. Movable clamping plate; 10. Support plate; 11. Adjustment mechanism; 111. Slide plate; 112. Slide groove; 113. Handle; 12. Limiting mechanism; 121. Adjusting groove; 122. First fixed plate; 123. Second fixed plate; 13. Spring; 14. Connecting frame; 15. Electric push rod; 16. Connecting plate; 17. Top rod; 18. Limiting sleeve; 19. Through hole; 20. Protective shell; 21. Rubber pad. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] like Figures 1 to 4 As shown, this utility model provides a power semiconductor test fixture, including a workbench 1, a fixed frame 2, an electric telescopic rod 3, a lifting plate 4, a plug 5, and a rotating mechanism 6. The bottom of the fixed frame 2 is fixedly connected to the left side of the top of the workbench 1. The electric telescopic rod 3 is fixedly installed on the top of the inner wall of the fixed frame 2. The lifting plate 4 is fixedly installed on the output end of the electric telescopic rod 3. The plug 5 is fixedly installed on the bottom of the lifting plate 4. The rotating mechanism 6 includes a servo motor 61, which is fixedly installed on the bottom of the workbench 1. The unit is movably connected to a movable seat 62. A turntable 63 is fixedly connected to the top of the movable seat 62. The output end of the servo motor 61 is fixedly connected to the bottom of the movable seat 62. A U-shaped plate 7 is fixedly connected to the top of the turntable 63. A fixed clamping plate 8 is fixedly connected to the top of the U-shaped plate 7. A movable clamping plate 9 is movably connected to the top of the U-shaped plate 7. A support plate 10 is provided on the top of the U-shaped plate 7. Two adjustment mechanisms 11 are fixedly connected to the bottom of the movable clamping plate 9. Limiting mechanisms 12 are provided on the side of the fixed clamping plate 8 and the movable clamping plate 9 away from the support plate 10.

[0025] refer to Figure 2 The adjustment mechanism 11 includes a slide plate 111, and two grooves 112 are opened on the top of the U-shaped plate 7. The surface of the slide plate 111 is slidably connected to the inner wall of the groove 112. A handle 113 is fixedly connected to the side of the movable clamping plate 9 away from the fixed clamping plate 8.

[0026] As a technical optimization scheme of the utility model, through setting adjusting mechanism 11, pull handle 113 can drive movable clamping plate 9 to move, movable clamping plate 9 moves and can drive sliding plate 111 to slide in the inside of sliding slot 112, and sliding slot 112 can move and limit sliding plate 111 and movable clamping plate 9, thereby improve the stability of movable clamping plate 9 movement.

[0027] Reference Figure 2 Limiting mechanism 12 includes adjusting groove 121, first fixed plate 122 is fixedly connected to the side of support plate 10 close to fixed clamping plate 8, second fixed plate 123 is fixedly connected to the side of support plate 10 away from fixed clamping plate 8, and the two sides of first fixed plate 122 and second fixed plate 123 are movably connected with the two sides of the inner wall of adjusting groove 121.

[0028] As a technical optimization scheme of the utility model, through setting limiting mechanism 12, the up and down movement of support plate 10 can drive first fixed plate 122 and second fixed plate 123 to slide up and down in the inside of adjusting groove 121, thereby facilitating the user to take out the semiconductor device, and the length of second fixed plate 123 is longer than that of first fixed plate 122, facilitating the movement of movable clamping plate 9.

[0029] Reference Figure 2 Sliding plate 111 is fixedly connected with spring 13 on the side away from fixed clamping plate 8, and the other end of spring 13 is fixedly connected with the inner wall of sliding slot 112 away from fixed clamping plate 8.

[0030] As a technical optimization scheme of the utility model, through setting spring 13, when movable clamping plate 9 moves away from fixed clamping plate 8, sliding plate 111 can compress spring 13, after the placement of semiconductor device is finished, the handle 113 is loosened, and the restoration of spring 13 can push sliding plate 111 and movable clamping plate 9 back to the original position.

[0031] Reference Figure 1 、 Figure 2 And Figure 4 The bottom of support plate 10 is fixedly connected with connecting frame 14, the front side and the rear side of the top right side of workbench 1 are both fixedly installed with electric push rod 15, the output end of electric push rod 15 is fixedly connected with connecting plate 16, and the top of connecting plate 16 is fixedly connected with top rod 17.

[0032] As a technical optimization scheme of the utility model, through setting connecting frame 14, electric push rod 15, connecting plate 16 and top rod 17, by starting electric push rod 15, the output end of electric push rod 15 can drive connecting plate 16 and top rod 17 to move upwards, and the upward movement of top rod 17 can lift connecting frame 14 and support plate 10 through through hole 19, facilitating the user to take out the semiconductor device.

[0033] The surfaces of the first fixing plate 122 and the second fixing plate 123 are fixedly connected with a limiting sleeve 18, and a through hole 19 is arranged at the top of the inner wall of the U-shaped plate 7.

[0034] As a technical optimization scheme of the utility model, the limiting sleeve 18 and the through hole 19 are arranged, the first fixing plate 122 and the second fixing plate 123 are prevented from being separated from the adjusting groove 121 by the limiting sleeve 18, and the through hole 19 facilitates the up-down movement of the jacking rod 17.

[0035] Reference Figure 2 The outer side of the servo motor 61 is provided with a protective shell 20, the top of the protective shell 20 is fixedly connected with the bottom of the workbench 1, and the fixed clamping plate 8 and the movable clamping plate 9 are fixedly connected with rubber pads 21 on the side close to the supporting plate 10.

[0036] As a technical optimization scheme of the utility model, the protective shell 20 and the rubber pads 21 are arranged, the servo motor 61 is protected by the protective shell 20, and the stability of clamping the semiconductor device by the fixed clamping plate 8 and the movable clamping plate 9 is improved by the rubber pads 21.

[0037] The working principle and use process of the utility model are as follows: when the semiconductor device needs to be tested, the handle 113 is pulled to drive the movable clamping plate 9 to move away from the fixed clamping plate 8, the slide plate 111 is pressed against the spring 13, the semiconductor device is placed on the top of the supporting plate 10, then the handle 113 is loosened to restore the spring 13 and push the slide plate 111 and the movable clamping plate 9 back to the original position, so that the semiconductor device can be stably clamped, the servo motor 61 is started to drive the movable seat 62 to rotate, the rotation of the movable seat 62 drives the rotating disc 63 and the U-shaped plate 7 to rotate, so that the clamped semiconductor device is rotated, when the semiconductor device moves to the bottom of the plug 5, the electric telescopic rod 3 is started to drive the output end of the electric telescopic rod 3 to move the lifting plate 4 and the plug 5 downward, the semiconductor device is inserted and tested, when the semiconductor device is tested, the electric push rod 15 is started to drive the output end of the electric push rod 15 to move the connecting plate 16 and the jacking rod 17 upward, the upward movement of the jacking rod 17 can lift the connecting frame 14 and the supporting plate 10 through the through hole 19, so that the user can take out the semiconductor device.

[0038] In summary: the power semiconductor test fixture, by setting U-shaped plate 7, fixed clamping plate 8 and movable clamping plate 9, U-shaped plate 7 can support fixed clamping plate 8 and movable clamping plate 9, by moving movable clamping plate 9 can be clamped and positioned the semiconductor device inside fixed clamping plate 8 and movable clamping plate 9, solve the top of the semiconductor device carrier is not set positioning structure, therefore the semiconductor device is placed after easy because the rotation of the turntable produces the wobble or dump, stability is not high, at the same time improves the probability of the test plug and semiconductor device collision, use effect is not good problem.

[0039] It should be noted that in this paper, such as first and second relationship terms are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between the entities or operations. Moreover, the term "include", "contain" or any other variant thereof is intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or includes elements inherent in such process, method, article or equipment.

[0040] Although the embodiments of the present application have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and modifications can be made to the embodiments without departing from the principles and spirits of the present application, and the scope of the present application is defined by the appended claims and their equivalents.

Claims

1. A test fixture for power semiconductors, comprising a workbench (1), a holder (2), an electric telescopic rod (3), a lifting plate (4), a plug (5) and a rotating mechanism (6), characterized in that: The bottom of the fixing frame (2) is fixedly connected with the left side of the top of the workbench (1), the electric telescopic rod (3) is fixedly installed on the top of the inner wall of the fixing frame (2), the lifting plate (4) is fixedly installed on the output end of the electric telescopic rod (3), the plug (5) is fixedly installed on the bottom of the lifting plate (4), the rotating mechanism (6) comprises a servo motor (61), the servo motor (61) is fixedly installed on the bottom of the workbench (1), the top of the workbench (1) is movably connected with a movable seat (62), the top of the movable seat (62) is fixedly connected with a rotating disc (63), the output end of the servo motor (61) is fixedly connected with the bottom of the movable seat (62), the top of the rotating disc (63) is fixedly connected with a U-shaped plate (7), the top of the U-shaped plate (7) is fixedly connected with a fixed clamping plate (8), the top of the U-shaped plate (7) is movably connected with a movable clamping plate (9), the top of the U-shaped plate (7) is provided with a supporting plate (10), the bottom of the movable clamping plate (9) is fixedly connected with two adjusting mechanisms (11), and the side, away from the supporting plate (10), of the fixed clamping plate (8) and the movable clamping plate (9) is provided with a limiting mechanism (12).

2. The test fixture of claim 1, wherein: The adjusting mechanism (11) comprises a sliding plate (111), two sliding grooves (112) are formed in the top of the U-shaped plate (7), and the surface of the sliding plate (111) is slidably connected with the inner wall of the sliding groove (112).

3. The test fixture of claim 1, wherein: The limiting mechanism (12) comprises an adjusting groove (121), a first fixed plate (122) is fixedly connected to the side, close to the fixed clamping plate (8), of the supporting plate (10), a second fixed plate (123) is fixedly connected to the side, away from the fixed clamping plate (8), of the supporting plate (10), and the two sides of the first fixed plate (122) and the second fixed plate (123) are movably connected with the two sides of the inner wall of the adjusting groove (121).

4. The test fixture of claim 2, wherein: The side, away from the fixed clamping plate (8), of the sliding plate (111) is fixedly connected with a spring (13), and the other end of the spring (13) is fixedly connected with the inner wall, away from the fixed clamping plate (8), of the sliding groove (112).

5. The test fixture of claim 1, wherein: The bottom of the supporting plate (10) is fixedly connected with a connecting frame (14), the front side and the rear side of the right side of the top of the workbench (1) are fixedly installed with electric push rods (15), the output end of the electric push rod (15) is fixedly connected with a connecting plate (16), and the top of the connecting plate (16) is fixedly connected with a top rod (17).

6. The test fixture of claim 3, wherein: The surface of the first fixed plate (122) and the second fixed plate (123) is fixedly connected with a limiting sleeve (18), and the top of the inner wall of the U-shaped plate (7) is provided with a through hole (19).

7. The test fixture of claim 5, wherein: The outer side of the servo motor (61) is provided with a protective shell (20), the top of the protective shell (20) is fixedly connected with the bottom of the workbench (1), and the side, close to the supporting plate (10), of the fixed clamping plate (8) and the movable clamping plate (9) is fixedly connected with a rubber pad (21).

Citation Information

Patent Citations

  • Nondestructive testing device for semiconductor device

    CN219224994U