PCB flying probe impedance test tool

Abstract

The utility model discloses a PCB flying probe impedance test tool, which comprises a workbench, a camera assembly located above the workbench and a test arm arranged on the workbench, and an alignment platform located on the workbench and used for placing a PCB is arranged below the camera assembly; the test arm is connected with the workbench through an electric linear displacement table, the test arm comprises a test support fixed on the electric linear displacement table, a Z-axis translation sliding table for fixing the test support and an R-axis rotation sliding table connected to the Z-axis translation sliding table, and the bottom of the R-axis rotation sliding table is connected with a probe assembly; the position of the probe assembly relative to the PCB placed on the alignment platform is adjusted through the electric linear displacement table, the Z-axis translation sliding table and the R-axis rotation sliding table, so that impedance testing of the PCB is completed, the tool can meet the testing requirement of the complex or high-density PCB, and a specific clamp is not needed.

Description

TECHNICAL FIELD

[0001] The utility model relates to PCB board test technical field, concretely relates to a kind of PCB board flying probe impedance test tooling. BACKGROUND

[0002] With the development of electronic equipment to high frequency, high speed, high density, the signal integrity (SI) and electromagnetic compatibility (EMC) design of printed circuit board (PCB) is increasingly critical. Among them, characteristic impedance control is one of the core indicators to ensure high-speed signal transmission quality. In the PCB manufacturing process, small deviations in wire width, dielectric layer thickness, material dielectric constant and other parameters can cause impedance mismatch, causing signal reflection, attenuation and other problems. Therefore, high-precision impedance testing of PCB has become a necessary step in the production process.

[0003] Traditional impedance testing methods mainly rely on network analyzers with special test fixtures or vector network analysis (VNA) technology, but they are complex to operate, low in testing efficiency, and require customized fixtures for different test points, making it difficult to adapt to flexible production needs of multiple varieties and small batches. In addition, traditional contact probes are prone to measurement deviations when testing high-density PCBs due to positioning errors or uneven contact pressure, especially when testing blind holes, micro-holes or fine-pitch lines. SUMMARY

[0004] To solve the above technical problems, the utility model provides a kind of PCB board flying probe impedance test tooling, the tooling can adapt to the testing needs of complex or high-density PCB, without specific fixture.

[0005] The technical scheme of the utility model is: a kind of PCB board flying probe impedance test tooling, including workbench, camera assembly located above the workbench and test arm arranged in the workbench, the lower portion of the camera assembly is provided with the alignment platform located on the workbench and placing PCB board;

[0006] The test arm is connected with the workbench by electric linear displacement table, the test arm includes test support fixed to the electric linear displacement table, Z-axis translation slide table fixed to the test support and R-axis rotation slide table connected to the Z-axis translation slide table, the bottom of the R-axis rotation slide table is connected with probe assembly;

[0007] The position of probe assembly relative to PCB board placed on the alignment platform is adjusted by electric linear displacement table, Z-axis translation slide table and R-axis rotation slide table, to complete impedance test of PCB board.

[0008] Further, the electric linear displacement table is provided with two and includes an X-axis electric linear displacement table and a Y-axis electric linear displacement table, the X-axis electric linear displacement table is arranged above the Y-axis electric linear displacement table, and the test support is fixed above the X-axis electric linear displacement table.

[0009] Further, the Y-axis electric linear displacement table is arranged on the workbench through a base, and one side of the base is provided with a micrometer head.

[0010] Further, the R-axis rotary sliding table is provided with a camera support, and a pen electronic microscope is connected through the camera support.

[0011] Further, the camera support includes a connecting plate fixed with the R-axis rotary sliding table, a first sliding support mounted on the connecting plate through a first supporting column, and a second sliding support connected to the first sliding support through a second supporting column, and the pen electronic microscope is fixed with the second sliding support.

[0012] Further, the Z-axis translation sliding table includes a fixed sliding block fixed on the test support, a driving motor fixed on the fixed sliding block through a supporting frame, and a moving sliding block matched with the fixed sliding block;

[0013] The output end of the driving motor is provided with a screw rod, the moving sliding block is provided with a screw sleeve matched with the screw rod, and the screw rod and the screw sleeve are matched for use to drive the moving sliding block to move up and down relative to the fixed sliding block.

[0014] Further, one side of the moving sliding block is provided with a plurality of baffle plates from top to bottom, and one side of the fixed sliding block is provided with a sensor matched with the baffle plates.

[0015] Further, the upper end surface of the R-axis rotary sliding table is fixed to the outer side of the moving sliding block through a rotary support, and the lower end surface of the R-axis rotary sliding table is matched with the probe assembly.

[0016] Further, the alignment platform is an electric displacement table, and the upper end surface of the electric displacement table is provided with a placing groove for placing a PCB board, the placing groove is provided with a vacuum adsorption hole, and the vacuum adsorption hole is connected with an air path pipeline arranged in the electric displacement table.

[0017] Further, a PIPO all-in-one machine is arranged on one side of the camera assembly.

[0018] The beneficial technical effects of the utility model are:

[0019] Compared with traditional tooling or other tooling, the tooling does not need to customize a jig, reduces cost and period; the electric linear displacement table and the micrometer head device cooperate, realizes the probe sub-micron pressure control, avoids scratching the PCB surface. The cooperation of the electric linear displacement table, the R-axis rotary sliding table and the Z-axis translation sliding table supports the impedance test of complex structures such as high-density interconnection boards and rigid-flex boards.

[0020] The above description is only a summary of the technical scheme of the utility model, in order to more clearly understand the technical means of the utility model, and can be implemented according to the content of the specification, the following preferred embodiments of the utility model are described in detail below with the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0021] Figure 1 It is the whole structure schematic diagram of the utility model;

[0022] Figure 2 It is the structure schematic diagram of the electric linear displacement table and the test arm connection of the utility model;

[0023] Figure 3 It is the structure schematic diagram of the Z-axis translation sliding table of the utility model;

[0024] Figure 4 It is the structure schematic diagram of the driving motor and the moving slider connection of the utility model;

[0025] Figure 5 It is the structure schematic diagram of the camera support of the utility model;

[0026] Figure 6 It is the structure schematic diagram of the electric displacement table of the utility model;

[0027] Figure 7 It is the structure schematic diagram of the vacuum adsorption hole located in the electric displacement table of the utility model;

[0028] Figure 8 It is the structure schematic diagram of the air path pipeline located in the electric displacement table of the utility model.

[0029] The figure mark is:

[0030] 100, workbench; 200, electric linear displacement table; 210, Y-axis electric linear displacement table; 211, base; 220, X-axis electric linear displacement table; 300, test arm; 310, test support; 320, Z-axis translation slide; 321, driving motor; 3211, screw rod; 322, fixed sliding block; 3221, sensor; 323, moving sliding block; 3231, baffle; 3232, screw sleeve; 330, R-axis rotary slide; 340, probe assembly; 350, camera support; 351, connecting plate; 352, first support column; 353, first sliding support; 354, second support column; 355, second sliding support; 360, pen type electron microscope; 400, electric displacement table; 410, vacuum adsorption hole; 420, gas path pipeline; 500, camera assembly; 600, POPO all-in-one machine; 700, micrometer head. DETAILED DESCRIPTION

[0031] In order to enable the technical means of the utility model to be more clearly understood, and to be implemented in accordance with the contents of the specification, the specific embodiments of the utility model are described in further detail below in combination with the drawings and examples, and the following examples are used to illustrate the utility model, but are not used to limit the scope of the utility model.

[0032] It should be noted that the terms "first", "second", and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not have to be used to describe a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein.

[0033] In the description of the utility model, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the embodiment and the drawings, or the orientation or positional relationship commonly used when the utility model product is used, and are only for the convenience of describing the utility model and simplifying the description, and do not indicate or imply that the indicated device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the utility model.

[0034] As shown in Figures 1-8 The utility model is particularly related to a PCB flying probe impedance test tool, which comprises a workbench 100, a camera assembly 500 located above the workbench 100, and a test arm 300 arranged on the workbench 100, wherein a positioning platform for placing a PCB is arranged below the camera assembly 500 and on the workbench 100.

[0035] The test arm 300 is connected with the workbench 100 through the electric linear displacement table 200, the test arm 300 comprises a test support 310 fixed to the electric linear displacement table 200, a Z-axis translation slide 320 for fixing the test support 310 and an R-axis rotation slide 330 connected to the Z-axis translation slide 320, and the bottom of the R-axis rotation slide 330 is connected with a probe assembly 340.

[0036] The position of the probe assembly 340 relative to the PCB board placed on the alignment platform is adjusted through the electric linear displacement table 200, the Z-axis translation slide 320 and the R-axis rotation slide 330, so as to complete the impedance test of the PCB board.

[0037] It should be noted that the personnel place the PCB board on the alignment platform, the test point coordinates on the PCB board are confirmed through the camera assembly 500, when the coordinate confirmation is completed, the test arm 300 is driven to move to the upper side of the PCB board through the electric linear displacement table 200, and the impedance test is completed.

[0038] The detailed steps are as follows: the test support 310 is driven to move by the electric linear displacement table 200, since the Z-axis translation slide 320 and the R-axis rotation slide 330 are arranged on the test support 310, when the test support 310 moves, the Z-axis translation slide 320 and the R-axis rotation slide 330 move synchronously.

[0039] When the test support 310 moves to the specified position, the height of the probe assembly 340 relative to the PCB board is adjusted through the Z-axis translation slide 320, and the angle of the probe assembly 340 relative to the test point of the PCB board is adjusted through the R-axis rotation slide 330.

[0040] Further, the impedance detection of the test point on the PCB board by the probe assembly 340 is realized through the cooperation of the electric linear displacement table 200, the Z-axis translation slide 320 and the R-axis rotation slide 330.

[0041] The electric linear displacement table 200 comprises two X-axis electric linear displacement tables 220 and Y-axis electric linear displacement tables 210, the X-axis electric linear displacement table 220 is arranged above the Y-axis electric linear displacement table 210, and the test support 310 is fixed above the X-axis electric linear displacement table 220.

[0042] The stroke of the X-axis electric linear displacement table 220 is 100 mm, the stroke of the Y-axis electric linear displacement table 210 is 200 mm, and the probe assembly 340 is controlled to move in the X-axis direction and the Y-axis direction respectively through the X-axis electric linear displacement table 220 and the Y-axis electric linear displacement table 210.

[0043] The Y-axis electric linear displacement table 210 is arranged on the workbench 100 through a base 211, and one side of the base 211 is provided with a micrometer head 700.

[0044] The micrometer head 700 is a standard part in the prior art, and the position of the electric linear displacement table 200 can be finely adjusted through the micrometer head 700, so that the probe can be controlled in the sub-micron level, and the PCB surface is prevented from being scratched. In this way, the accuracy is further improved.

[0045] The R-axis rotary sliding table 330 is provided with a camera support 350, and a pen electronic microscope 360 is connected to the camera support 350.

[0046] The pen electronic microscope 360 is also a standard part in the prior art, and the pen electronic microscope 360 is used for microscopic inspection of key test points to confirm that the surface is free of oxidation, scratches or residual contaminants. In this way, the line edge flatness is observed through the high-power lens of the pen electronic microscope 360, and it is ensured that the etching process meets the impedance design requirements. The camera assembly 500 is started to adjust the focal length and light source, and the microscopic image of the pen electronic microscope 360 is combined to double confirm the coordinate accuracy of the test points.

[0047] The camera support 350 includes a connecting plate 351 fixed with the R-axis rotary sliding table 330, a first sliding support 353 installed on the connecting plate 351 through a first support column 352, and a second sliding support 355 connected to the first sliding support 353 through a second support column 354, and the pen electronic microscope 360 is fixed with the second sliding support 355.

[0048] The first sliding support 353 and the second sliding support 355 can cooperate to adjust the angle of the pen electronic microscope 360 and the position relative to the PCB, so that the probe assembly 340 can accurately cooperate with the test points on the PCB.

[0049] The Z-axis translation sliding table 320 includes a fixed sliding block 322 fixed to the test support 310, a driving motor 321 fixed to the fixed sliding block 322 through a support frame, and a moving sliding block 323 used in cooperation with the fixed sliding block 322.

[0050] The output end of the driving motor 321 is provided with a screw rod 3211, the moving sliding block 323 is provided with a screw sleeve 3232 used in cooperation with the screw rod 3211, and the screw rod 3211 and the screw sleeve 3232 are used in cooperation to drive the moving sliding block 323 to move up and down relative to the fixed sliding block 322.

[0051] The fixed sliding block 322 is fixed on the test support 310 and supports the driving motor 321, and the movable sliding block 323 can be used in cooperation with the fixed sliding block 322 and can move relative to the fixed sliding block 322.

[0052] Since the screw rod 3211 is connected with the fixed sliding block 322 through the screw sleeve 3232, when the driving motor 321 drives the screw rod 3211 to rotate, the movable sliding block 323 can be driven to move up and down relative to the fixed sliding block 322; in this process, the position of the fixed sliding block 322 does not change, only the position of the movable sliding block 323 changes.

[0053] A plurality of baffle plates 3231 are arranged on one side of the movable sliding block 323 from top to bottom, and a sensor 3221 is arranged on one side of the fixed sliding block 322 to cooperate with the baffle plate 3231, so as to ensure the stroke and precision of the movable sliding block 323.

[0054] The upper end surface of the R-axis rotating sliding table 330 is fixed to the outer side of the movable sliding block 323 through a rotating support, and the lower end surface of the R-axis rotating sliding table 330 is connected with the probe assembly 340.

[0055] The moving principle of the movable sliding block 323 has been described above, when the movable sliding block 323 moves, it can drive the R-axis rotating sliding table 330 to move up and down, and synchronously drive the probe assembly 340 located at the lower end surface of the R-axis rotating sliding block to move up and down, so as to adjust the height of the probe assembly 340 relative to the test points on the PCB board.

[0056] In addition, the R-axis rotating sliding table 330 is connected with the pen-type electron microscope 360 through a camera support 350, so that when the R-axis rotating sliding table 330 rotates, the pen-type electron microscope 360 and the probe assembly 340 move synchronously to ensure the precision of the test process.

[0057] The alignment platform is an electric displacement table 400, and the upper end surface of the electric displacement table 400 is provided with a placing groove for placing a PCB board, and a vacuum suction hole 410 is arranged in the placing groove, and the vacuum suction hole 410 is connected with an air path pipeline 420 arranged in the electric displacement table 400.

[0058] It should be noted that the electric displacement table 400 is a standard part in the prior art, and the specific principle can be seen in the prior art, with the publication number CN217256157U and the patent name A new electric displacement table 400, utility model patent, which describes the principle of the electric displacement table 400 in detail, so it will not be described in detail.

[0059] The vacuum adsorption hole 410 and the air path pipeline 420 are added to the electric displacement table 400 to vacuum adsorb and fix the PCB, so that displacement of the PCB or failure of the PCB to keep flat during testing is avoided.

[0060] The PIPO all-in-one machine 600 is arranged on one side of the camera assembly 500, all signals in the whole tooling are controlled through the PIPO all-in-one machine 600, and the final impedance test is completed.

[0061] The above embodiments are only specific embodiments of the present application, which are used to illustrate the technical solutions of the present application, rather than limit the same. The protection scope of the present application is not limited to this. Although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that any person skilled in the art can modify or easily think of changes to the technical solutions recorded in the foregoing embodiments, or make equivalent replacement to some technical features, within the technical range disclosed by the present application. The modifications, changes or replacement do not make the corresponding technical solutions deviate from the spirit and range of the technical solutions of the embodiments of the present application, and should be covered in the protection scope of the present application.

Claims

1. A PCB board flying probe impedance test tool, characterized in that, The utility model provides a kind of test device for PCB, including workbench (100), camera assembly (500) above the workbench (100) and test arm (300) in the workbench (100), the lower of camera assembly (500) is equipped with alignment platform on workbench (100) and places PCB board; The test arm (300) is connected with the workbench (100) by the electric linear displacement table (200), and the test arm (300) includes a test support (310) fixed to the electric linear displacement table (200), a Z-axis translation slide (320) fixed to the test support (310), and an R-axis rotary slide (330) connected to the Z-axis translation slide (320), and the bottom of the R-axis rotary slide (330) is connected with a probe assembly (340); The position of the probe assembly (340) relative to the PCB board placed on the alignment platform is adjusted by the electric linear displacement table (200), the Z-axis translation slide (320) and the R-axis rotary slide (330) to complete the impedance test of the PCB board.

2. The PCB flying probe impedance test fixture of claim 1, wherein, The electric linear displacement table (200) is provided with two X-axis electric linear displacement tables (220) and Y-axis electric linear displacement tables (210), the X-axis electric linear displacement table (220) is arranged above the Y-axis electric linear displacement table (210), and the test support (310) is fixed above the X-axis electric linear displacement table (220).

3. The PCB flying probe impedance test fixture of claim 2, wherein, The Y-axis electric linear displacement table (210) is arranged on the workbench (100) through a base (211), and one side of the base (211) is provided with a micrometer head (700).

4. The PCB flying probe impedance test fixture of claim 1, wherein, The R-axis rotary slide (330) is provided with a camera support (350), and a pen electronic microscope (360) is connected through the camera support (350).

5. The PCB flying probe impedance test fixture of claim 4, wherein, The camera support (350) includes a connecting plate (351) fixed with the R-axis rotary slide (330), a first sliding support (353) mounted on the connecting plate (351) through a first support column (352), and a second sliding support (355) connected to the first sliding support (353) through a second support column (354), and the pen electronic microscope (360) is fixed with the second sliding support (355).

6. The PCB flying probe impedance test fixture of claim 1, wherein, The Z-axis translation slide (320) includes a fixed sliding block (322) fixed to the test support (310), a driving motor (321) fixed to the fixed sliding block (322) through a support frame, and a moving sliding block (323) matched with the fixed sliding block (322); The output end of the driving motor (321) is provided with a screw rod (3211), and the moving sliding block (323) is provided with a screw sleeve (3232) matched with the screw rod (3211), and the screw rod (3211) and the screw sleeve (3232) are matched to drive the moving sliding block (323) to move up and down relative to the fixed sliding block (322).

7. The PCB flying probe impedance test fixture of claim 6, wherein, One side of the mobile slider (323) is provided with a plurality of baffle plates (3231) from top to bottom, and one side of the fixed slider (322) is provided with a sensor (3221) matched with the baffle plates (3231).

8. The PCB board flying probe impedance test tool of claim 7, wherein, The upper end surface of the R-axis rotating slide table (330) is fixed to the outer side of the mobile slider (323) through a rotating support, and the lower end surface of the R-axis rotating slide table (330) is connected with the probe assembly (340).

9. The PCB flying probe impedance test fixture of claim 1, wherein, The alignment platform is an electric displacement table (400), and the upper end surface of the electric displacement table (400) is provided with a placing groove for placing a PCB board, and the placing groove is provided with a vacuum adsorption hole (410), and the vacuum adsorption hole (410) is connected with an air path pipeline (420) arranged in the electric displacement table (400).

10. The PCB flying probe impedance test fixture of claim 1, wherein, A PIPO all-in-one machine (600) is arranged on one side of the camera assembly (500).

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