Flexible test fixture for solid plastic package capacitor

Abstract

The utility model discloses a flexible test fixture for a solid plastic package capacitor, which comprises a base, a needle bed assembly and a flexible clamping plate assembly, the needle bed assembly comprises a printed circuit board and a spring probe group, and the flexible clamping plate assembly comprises a group of flexible clamping plates and a group of spring probes which are bilaterally symmetrical. A plurality of spring probes in the spring probe group are uniformly distributed on the flexible clamping plate in a surface form, and an arc-shaped opening is formed in the surface, close to the base, of the flexible clamping plate so that the needle bed assembly can penetrate through the arc-shaped opening. According to the test fixture, flexible clamping of the capacitor is realized by means of the elastic characteristic of the spring probe, reliable electrical connection with the capacitor pin is ensured, the accuracy and the stability of a test result are effectively improved, the clamping distance of the capacitor can be flexibly adjusted, and the test fixture is suitable for testing solid plastic package capacitors with different sizes.

Description

Technical Field

[0001] This utility model relates to the technical field of capacitor testing equipment, specifically to a flexible testing fixture for solid plastic-encapsulated capacitors. Background Technology

[0002] In the production process of solid-state encapsulated capacitors, comprehensive and accurate performance testing is a crucial step in ensuring product quality. Traditional test fixtures are prone to poor contact when connecting to capacitor leads. For example, due to insufficient elasticity or poor material of the fixture probes, a tight and stable electrical connection with the capacitor leads cannot be maintained throughout the test. This leads to unstable test signal transmission, resulting in inaccurate test results that fail to accurately reflect the actual performance of the capacitor. Therefore, developing a new type of test fixture that overcomes these shortcomings is of significant practical importance. Utility Model Content

[0003] Purpose of the utility model: The core purpose of this utility model is to provide a flexible test fixture for solid plastic-encapsulated capacitors. This fixture can effectively solve the problems of poor adaptability and unreliable electrical connection of traditional fixtures. Through unique structural design and material selection, it can achieve stable clamping of solid plastic-encapsulated capacitors of different sizes and ensure a reliable electrical connection with the capacitor pins during the test, thereby significantly improving the accuracy and stability of the test results.

[0004] Technical Solution: This technical solution relates to a flexible test fixture for solid-state encapsulated capacitors, aiming to provide an efficient, reliable testing tool that can adapt to capacitors of different sizes for testing solid-state encapsulated capacitors. The test fixture includes a base, a bed of needles assembly, and a flexible clamping plate assembly. The flexible clamping plate assembly includes a set of symmetrically arranged flexible clamping plates and a spring probe group. The spring probe group includes multiple spring probes II, which are evenly distributed on opposite surfaces of the flexible clamping plates. The flexible clamping plates have symmetrically distributed flexible clamping plate mounting holes. The bed of needles assembly includes a printed circuit board and two or more spring probes I distributed on the printed circuit board. A set of symmetrically arranged printed circuit board mounting holes is provided on the printed circuit board. An arc-shaped opening is provided on the surface of the flexible clamping plate close to the base for the bed of needles assembly to pass through. The base has multiple sets of screw holes I and one set of screw holes II. The flexible clamping plate assembly is fixedly connected to the base through the flexible clamping plate mounting holes and screw holes I. The printed circuit board is fixedly connected to the base through the printed circuit board mounting holes and screw holes II.

[0005] Specifically, the spring probes I are arranged in a row on the printed circuit board.

[0006] Specifically, the tip of spring probe I is made of beryllium copper alloy, which has high hardness and high conductivity.

[0007] Specifically, the base is made of engineering plastic material, which has high strength and good insulation properties.

[0008] Specifically, by fixing the symmetrical flexible clamps to screw holes I at different positions, the distance between the flexible clamps can be flexibly adjusted according to the size of the solid plastic-encapsulated capacitor to be tested. This adjustable design makes the fixture suitable for testing solid plastic-encapsulated capacitors of various sizes and specifications, improving the versatility of the fixture and reducing the time and cost waste caused by changing different fixtures.

[0009] Beneficial effects: The clamp of this utility model relies on the elastic properties of the spring probe itself. When clamping a capacitor, the spring probe can automatically adjust the contact position and pressure according to the shape and size of the capacitor, realizing flexible clamping of the capacitor. This flexible clamping method can not only effectively avoid damage to the capacitor caused by rigid clamping, but also ensure a reliable electrical connection between the spring probe and the capacitor pin. Whether in the vibration environment during the test or for capacitor pins with different flatness, the spring probe can always maintain close contact, which greatly improves the accuracy and stability of the test results. Attached Figure Description

[0010] Figure 1 This is a front structural diagram of the present invention;

[0011] Figure 2 This is a top view of the present invention;

[0012] Figure 3 This is the left view of the present invention;

[0013] Figure 4 This is a schematic diagram of the printed circuit board of this utility model;

[0014] Figure 5 This is a schematic diagram of the base of this utility model;

[0015] The following are the labels in the diagram: 1-Base; 11-Screw hole I; 12-Screw hole II; 2-Bed of needles assembly; 21-Printed circuit board; 22-Spring probe I; 23-Printed circuit board mounting hole; 3-Flexible clamp assembly; 31-Flexible clamp; 32-Spring probe group; 321-Spring probe II; 33-Flexible clamp mounting hole. Detailed Implementation

[0016] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0017] Reference Figures 1-5The present invention discloses a flexible test fixture for a solid-state encapsulated capacitor, comprising a base 1, a bed of needles assembly 2, and a flexible clamping plate assembly 3. The flexible clamping plate assembly 3 includes a set of symmetrically arranged flexible clamping plates 31 and a spring probe group 32. The spring probe group 32 includes multiple spring probes II, which are evenly distributed on opposite surfaces of the flexible clamping plates 31. Through the structural design of the flexible clamping plate assembly 3, the capacitor body is flexibly clamped. The flexible clamping plates 31 are symmetrically distributed with flexible clamping plate mounting holes 33, which match the screw holes I11 distributed on the base 1. The flexible clamping plates 31 are fixed to the base 1 by screws. The bed of needles assembly 2 includes a printed circuit board 21 and two or more spring probes I22 distributed on the printed circuit board 21. The spring probes I22 can achieve flexible connection of the capacitor electrode pins. The printed circuit board 21 is symmetrically distributed with a set of printed circuit board mounting holes 23, which match the screw holes II12 distributed on the base 1. The printed circuit board 21 is fixed to the base 1 by screws. The flexible clamping plate 31 has an arc-shaped opening on its surface close to the base for the bed of needles assembly 2 to pass through.

[0018] Furthermore, the spring probes I22 are arranged in a row on the printed circuit board 21, suitable for contacting capacitor electrode pins of different sizes.

[0019] Furthermore, the tip of the spring probe I is made of beryllium copper alloy, which has high hardness and high conductivity. When connected to the capacitor pin, the high hardness ensures stable and reliable contact and is not easily deformed under frequent insertion and removal. The high conductivity ensures a reliable electrical connection with the capacitor pin, improving the accuracy and stability of the test results.

[0020] Furthermore, the base is made of engineering plastic material, which has high strength and good insulation properties.

[0021] Furthermore, by fixing the symmetrical flexible clamps to screw holes I at different positions, the distance between the flexible clamps can be flexibly adjusted according to the size of the solid plastic-encapsulated capacitor to be tested. This adjustable design makes the fixture suitable for testing solid plastic-encapsulated capacitors of various sizes and specifications, improving the versatility of the fixture and reducing the time and cost waste caused by changing different fixtures.

[0022] During testing, the solid-state encapsulated capacitor is placed on the needle bed assembly 2, ensuring precise alignment of the capacitor's electrodes with spring probe I. Spring probe II of the flexible clamp assembly 3 makes full contact with the capacitor surface and clamps the capacitor. At this point, various performance tests, such as capacitance and withstand voltage tests, can be performed on the solid-state encapsulated capacitor by connecting to the test circuitry on the printed circuit board 21. During testing, the excellent electrical connection performance of the spring probes and the overall stable structure of the clamp ensure the accuracy and reliability of the test results.

[0023] When dealing with solid-state encapsulated capacitors of different sizes, first observe the capacitor's dimensions. Based on its width, reselect the screw holes 11 on the base 1 that are distributed front and back for fixing the flexible clamping plate assembly 3. Loosen the screws that have already fixed the flexible clamping plate 31, move the flexible clamping plate 31 to the newly selected screw hole 11 position, and then fix it with the screws again. In this way, the distance between the flexible clamping plates 31 can be flexibly adjusted to accommodate the width of non-standard sized capacitors.

[0024] Through the detailed implementation methods described above, the flexible test fixture for solid-state encapsulated capacitors of this invention can efficiently and accurately complete the testing of solid-state encapsulated capacitors of different sizes, providing a reliable guarantee for the production quality control of capacitors.

[0025] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A flexible test fixture for a solid-state encapsulated capacitor, comprising a base (1), a bed of needles assembly (2), and a flexible clamping plate assembly (3), wherein the flexible clamping plate assembly (3) comprises a set of left-right symmetrical flexible clamping plates (31) and a spring probe group (32), wherein the spring probe group (32) comprises a plurality of spring probes II (321), the spring probes II (321) being uniformly distributed in the form of a surface on opposite surfaces of the flexible clamping plates (31), and the flexible clamping plates (31) having symmetrically distributed flexible clamping plate mounting holes (33), characterized in that, The needle bed assembly (2) includes a printed circuit board (21) and two or more spring probes I (22) distributed on the printed circuit board (21). A set of printed circuit board mounting holes (23) are symmetrically distributed on the left and right sides of the printed circuit board (21). The flexible clamp (31) has an arc-shaped opening on its surface close to the base (1) for the needle bed assembly (2) to pass through. The base (1) has multiple sets of screw holes I (11) and a set of screw holes II (12). The flexible clamp assembly (3) is fixedly connected to the base (1) through the flexible clamp mounting holes (33) and the screw holes I (11). The printed circuit board (21) is fixedly connected to the base (1) through the printed circuit board mounting holes (23) and the screw holes II (12).

2. The flexible test fixture for a solid-state encapsulated capacitor according to claim 1, characterized in that, The spring probes I (22) are arranged in a line on the printed circuit board (21).

3. The flexible test fixture for a solid-state encapsulated capacitor according to claim 1, characterized in that, The tip of the spring probe I (22) is made of beryllium copper alloy.

4. The flexible test fixture for a solid-state encapsulated capacitor according to claim 1, characterized in that, The base (1) is made of engineering plastic.

5. The flexible test fixture for a solid-state encapsulated capacitor according to claim 1, characterized in that, By fixing the left and right symmetrical flexible clamps (31) to the screw holes I (11) at different positions, it is suitable for testing solid-state encapsulated capacitors of different sizes.

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