Chip testing equipment

Abstract

The utility model relates to the technical field of automation equipment, and discloses chip testing equipment, which is characterized in that a rotatable clamping hook piece is arranged at the position, corresponding to each testing board card, of an opening of a testing box, and the clamping hook piece can rotate between a locking position and an unlocking position, so that the testing board cards can be quickly locked and fixed or unlocked and disassembled. According to the design, the replacement convenience of the test board card is remarkably improved, an operator can complete the replacement of the board card without complex operation, and the labor intensity is effectively reduced. And meanwhile, the replacement time is greatly shortened by the quick response capability of the clamping hook piece, and the test efficiency is improved. Besides, the stable locking function ensures that the test board card is not loosened due to vibration or interference in the working process, the test accuracy is guaranteed, the overall level and quality of chip testing are further improved, and efficient development of the chip testing link in intelligent production is promoted.

Description

Technical Field

[0001] This utility model relates to the field of automation equipment technology, and in particular to a chip testing device. Background Technology

[0002] With the continuous progress and development of the times, intelligent manufacturing has gradually become the mainstream trend of current production methods. In the process of intelligent manufacturing, various intelligent devices and equipment play a crucial role, and the normal operation of these devices is inseparable from the support of various chips with different functions and excellent performance. In order to ensure that the chips can perform at their best in the production environment, they must undergo a series of rigorous and comprehensive tests to verify the integrity of their functions and the reliability of their operation.

[0003] Test chambers, as specialized equipment for verifying chip performance and stability, play a crucial role in the chip testing process. Due to the numerous and complex tests involved in chip testing, test chambers require the replacement of corresponding test boards to accurately and comprehensively evaluate various performance indicators. However, current test board replacement structures have many design shortcomings; their complex structure and cumbersome disassembly and assembly processes not only increase the workload of operators but also seriously affect the efficiency and accuracy of testing work.

[0004] Therefore, in response to the problems and shortcomings in the existing technology, there is an urgent need to improve and optimize the relevant technologies to increase the efficiency of test board replacement, reduce the difficulty of operation, and thus further improve the overall level and quality of chip testing.

[0005] The above information is provided as background information only to aid in understanding this disclosure and does not constitute an assertion or admission that any of the above content can be used as prior art relative to this disclosure. Utility Model Content

[0006] This invention provides a chip testing device to solve the problems existing in the prior art.

[0007] To achieve the above objectives, this utility model provides the following technical solution:

[0008] A chip testing device includes a test chamber, the test chamber comprising a housing, the housing being hollow and having an opening communicating with the interior of the housing;

[0009] Several test boards are pluggably installed inside the enclosure;

[0010] Each of the test boards is rotatably provided with a hook at the opening corresponding to the position of each test board. The hook can rotate between a locked position and an unlocked position to lock the test board inside the housing or to unlock and remove the test board from the housing.

[0011] Furthermore, the chip testing equipment also includes a heat dissipation module;

[0012] The heat dissipation module is located inside the enclosure.

[0013] Furthermore, in the chip testing equipment, several of the test boards are divided into two spaced rows;

[0014] The heat dissipation module is located between the two rows of test boards.

[0015] Furthermore, in the chip testing equipment, the heat dissipation module includes two sets of fan assemblies;

[0016] The airflow direction of one group of the fan assemblies is directed toward one row of the test boards;

[0017] The airflow direction of the other set of fan assemblies is directed toward the other row of test boards.

[0018] Furthermore, the chip testing equipment also includes a stop component;

[0019] The stop is movably disposed between the hook and the housing to stop the hook in the locked position, thereby limiting its rotation and keeping the test board locked and fixed inside the housing.

[0020] Furthermore, the chip testing equipment also includes a rotating support base;

[0021] Rotation shafts are provided on both sides of the box body;

[0022] The rotating shaft is rotatably mounted on the rotating support.

[0023] Furthermore, the chip testing equipment also includes a rotation drive module;

[0024] The rotary drive module is disposed on the rotary support base, and the drive rod of the rotary drive module is connected to one of the rotary shafts via a transmission connection.

[0025] Furthermore, in the chip testing equipment, the rotary drive module includes a motor, a reducer, an electric slip ring, and an angle encoder;

[0026] The motor is connected to the reducer, and the reducer is connected to one of the rotating shafts via a transmission connection;

[0027] The slip ring and the angle encoder are mounted on another of the rotating shafts;

[0028] The motor is used to output rotational driving force;

[0029] The speed reducer is used to reduce the output of the motor and increase the output torque;

[0030] The slip ring is used to achieve stable power and signal transmission from the stationary part to the rotating part during the rotation of the rotating shaft;

[0031] The angle encoder is used to measure the angular position and rotational speed of the rotating shaft.

[0032] Compared with the prior art, the present invention has the following beneficial effects:

[0033] This utility model provides a chip testing device that features rotatable hooks at the opening of the test chamber corresponding to the position of each test board. These hooks can rotate between a locked and unlocked position, enabling quick locking and unlocking / removal of the test boards. This design significantly improves the ease of test board replacement, allowing operators to complete board changes without complex procedures, effectively reducing labor intensity. Simultaneously, the rapid response capability of the hooks greatly shortens replacement time, improving testing efficiency. Furthermore, its stable locking function ensures that the test boards will not loosen due to vibration or interference during operation, guaranteeing testing accuracy and thus improving the overall level and quality of chip testing, promoting the efficient development of chip testing in intelligent manufacturing.

[0034] This invention has other features and advantages that will be apparent from or will be set forth in detail in the accompanying drawings and the following detailed description, which together serve to explain the particular principles of this invention. Attached Figure Description

[0035] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0036] Figure 1 This is one of the three-dimensional structural schematic diagrams of the test box provided in this embodiment of the utility model;

[0037] Figure 2This is the second (three-dimensional) structural schematic diagram of the test box provided in this embodiment of the utility model;

[0038] Figure 3 This is a partial three-dimensional structural diagram of the test box provided in this embodiment of the utility model;

[0039] Figure 4 This is one of the (partial side view) structural schematic diagrams of the test box provided in this embodiment of the utility model;

[0040] Figure 5 This is the second (partial side view) structural schematic diagram of the test box provided in this embodiment of the utility model;

[0041] Figure 6 This is the third (partial side view) structural schematic diagram of the test box provided in this embodiment of the utility model;

[0042] Figure 7 This is a three-dimensional structural diagram of a chip testing device provided in an embodiment of the present invention;

[0043] Figure 8 This is one of the (partial three-dimensional) structural schematic diagrams of a chip testing device provided in this embodiment of the present invention;

[0044] Figure 9 This is a second (partial three-dimensional) structural schematic diagram of a chip testing device provided in this embodiment of the present invention.

[0045] Figure label:

[0046] Test box 1, rotating support base 2, rotating drive module 3;

[0047] 101. Housing 101, test board 102, hook 103, heat dissipation module 104, stop 105, rotating shaft 106.

[0048] Motor 301, reducer 302, slip ring 303, angle encoder 304. Detailed Implementation

[0049] To illustrate the possible application scenarios, technical principles, implementable specific solutions, and achievable objectives and effects of this application in detail, the following description, in conjunction with the listed specific embodiments and accompanying drawings, provides a detailed explanation. The embodiments described herein are merely illustrative of the technical solutions of this application and are therefore intended to limit the scope of protection of this application.

[0050] In this document, the term "embodiment" means that a specific feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The term "embodiment" appearing in various places throughout the specification does not necessarily refer to the same embodiment, nor does it specifically limit its independence or connection with other embodiments. In principle, in this application, as long as there are no technical contradictions or conflicts, the technical features mentioned in each embodiment can be combined in any way to form corresponding implementable technical solutions.

[0051] Unless otherwise defined, the technical terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the use of related terms herein is merely for the purpose of describing particular embodiments and is not intended to limit this application.

[0052] In the description of this application, the term "and / or" is used to describe the logical relationship between objects, indicating that three relationships can exist. For example, A and / or B means: A exists, B exists, and A and B exist simultaneously. Additionally, the character " / " in this document generally indicates that the preceding and following objects have an "or" logical relationship.

[0053] In this application, terms such as “first” and “second” are used only to distinguish one entity or operation from another, and do not necessarily require or imply any actual quantity, hierarchy or order relationship between these entities or operations.

[0054] Unless otherwise specified, the use of terms such as “comprising,” “including,” “having,” or other similar expressions in this application is intended to cover non-exclusive inclusion, which does not exclude the presence of additional elements in a process, method, or product that includes the stated elements, such that a process, method, or product that includes a list of elements may include not only those defined elements but also other elements not expressly listed, or elements inherent to such a process, method, or product.

[0055] In this application, expressions such as "greater than", "less than", and "exceeding" are understood to exclude the stated number; expressions such as "above", "below", and "within" are understood to include the stated number. Furthermore, in the description of the embodiments of this application, "multiple" means two or more (including two), and similar expressions related to "multiple" are also understood in this way, such as "multiple groups" and "multiple times", unless otherwise explicitly specified.

[0056] In the description of the embodiments of this application, the space-related expressions used, such as "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "vertical," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," indicate the orientation or positional relationship based on the orientation or positional relationship shown in the specific embodiments or drawings. They are only for the purpose of describing the specific embodiments of this application or for the reader's understanding, and do not indicate or imply that the device or component referred to must have a specific position, a specific orientation, or be constructed or operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.

[0057] Unless otherwise expressly specified or limited, the terms "installation," "connection," "linking," "fixing," and "setting," as used in the description of the embodiments of this application, should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral setting; it can be a mechanical connection, an electrical connection, or a communication connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal connection of two components or the interaction between two components. For those skilled in the art to which this application pertains, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0058] In view of the deficiencies of the existing technology, the applicant, based on years of practical experience and professional knowledge in the design and manufacturing of this field, and in conjunction with the application of theoretical principles, has actively conducted research and innovation in order to create a technology that can solve the deficiencies of the existing technology. After continuous research, design, and repeated prototype production and improvement, this utility model with practical value has finally been created.

[0059] Please refer to Figure 1-5 This utility model provides a chip testing device with unique features and an ingenious structural design. Specifically, it includes a test box 1 as its core component. The main structure of the test box 1 is a box body 101, which is cleverly designed with an internal hollow structure and a specially provided opening. This opening communicates with the internal space of the box body 101, greatly facilitating the subsequent installation and removal of test boards.

[0060] Inside the enclosure 101, there are several test boards 102. These test boards 102 are installed in the enclosure 101 in a pluggable manner, which realizes the flexible connection between the boards and the enclosure, and facilitates quick replacement or adjustment according to test requirements.

[0061] Of particular note is the thoughtful design of a rotatable hook 103 at the opening of the housing 101, positioned for each test board 102. This hook 103 is ingeniously designed, allowing for flexible rotation between a locked and unlocked position. When the hook 103 is in the locked position, it securely locks the test board 102 inside the housing 101, ensuring stability during testing. When it's necessary to replace or remove the test board 102, simply rotating the hook 103 to the unlocked position easily unlocks and removes the board.

[0062] The advantage of this design lies in the fact that by incorporating a rotatable hook 103 at the opening of the test chamber 1, the ease of replacing the test board 102 is greatly improved. Operators can quickly complete the board replacement without complex procedures, effectively reducing labor intensity and increasing work efficiency. Simultaneously, the rapid response capability of the hook 103 significantly shortens the board replacement time, further enhancing testing efficiency.

[0063] Furthermore, the stable locking function of the hook 103 is a major highlight of this invention. It ensures that the test board 102 will not loosen or fall off during operation, even under vibration or external interference, thus guaranteeing the accuracy of the test. This design not only improves the overall level and quality of chip testing but also provides an efficient and reliable solution for chip testing in intelligent manufacturing, promoting the efficient development of this field.

[0064] Please refer to this again. Figure 3-5 In one specific embodiment of this utility model, the chip testing equipment has been further optimized and designed, and an important component, heat dissipation module 104, has been introduced.

[0065] The heat dissipation module 104 is cleverly located inside the housing 101, closely adjacent to core components such as the test board 102. This design takes into account the heat that may be generated during chip testing, as the test board 102 and other electronic components inevitably generate heat during high-intensity testing.

[0066] The main function of the heat dissipation module 104 is to effectively absorb and dissipate the generated heat, ensuring that the temperature inside the enclosure 101 remains within a reasonable range. This not only protects electronic components such as the test board 102 from overheating damage and extends their service life, but also improves the stability and reliability of the test equipment, ensuring the accuracy of the test results.

[0067] Meanwhile, the design of the heat dissipation module 104 also fully considers its compatibility with the internal structure of the enclosure 101, ensuring that it can achieve the best heat dissipation effect without interfering with the normal operation of other components.

[0068] In summary, by introducing the heat dissipation module 104, the chip testing equipment in this embodiment has been further improved in performance, which not only ensures the stability and accuracy of the testing process, but also provides a more reliable and efficient solution for the chip testing stage in intelligent manufacturing.

[0069] Please refer to this again. Figure 3-5 In a specific and ingenious embodiment of this utility model, the layout of the test board 102 and the heat dissipation module 104 has been carefully designed and optimized to further improve the overall performance of the device.

[0070] Specifically, the test boards 102 are arranged in two alternating rows. This layout not only makes more efficient use of the space inside the enclosure 101, but also facilitates subsequent heat dissipation design. The space between the two rows of test boards 102 provides ample room for the installation of the heat dissipation module 104.

[0071] The heat dissipation module 104 is precisely installed between the two rows of test boards 102, a placement that demonstrates meticulous craftsmanship. The heat dissipation module 104 directly dissipates heat from the two rows of test boards 102, effectively absorbing and dissipating the heat generated during operation. This close-range heat dissipation design significantly improves heat dissipation efficiency, ensuring that the test boards 102 and other electronic components maintain stable performance even under prolonged high-intensity operation, preventing performance degradation or damage due to overheating.

[0072] In addition, placing the heat dissipation module 104 between the two rows of test boards 102 can also play a certain role in isolation, preventing mutual interference between the test boards 102 due to heat transfer, and further improving the stability and reliability of the equipment.

[0073] In summary, this embodiment cleverly divides the test board 102 into two spaced rows and installs a heat dissipation module 104 between them, which not only achieves efficient utilization of the internal space of the enclosure 101, but also greatly improves the heat dissipation performance of the device.

[0074] Please refer to this again. Figure 5 In a specially designed embodiment of this utility model, the heat dissipation module 104 has been conceived and optimized in detail to ensure the stable performance of the chip testing equipment under high-intensity operation.

[0075] The heat dissipation module 104 thoughtfully incorporates two sets of fan assemblies, the layout and function of which have been carefully considered. One set of fan assemblies is configured to direct its airflow directly towards one row of test boards 102. This ensures that when the fan assemblies operate, the strong airflow generated directly hits this row of test boards 102, effectively dissipating the heat generated during operation and ensuring that the temperature of the test boards 102 remains within a safe range.

[0076] The other fan assembly is also cleverly designed so that its airflow is directed towards the other row of test boards 102. In this way, the two fan assemblies are responsible for cooling the two rows of test boards 102 respectively, forming a dual-pipe cooling system. This design not only improves cooling efficiency but also ensures uniform heat dissipation, avoiding localized overheating caused by uneven heat dissipation.

[0077] The coordinated operation of the two fan assemblies provides a comprehensive and efficient heat dissipation solution for the chip testing equipment. They can continuously and stably provide cooling airflow to the test board 102, ensuring that the equipment maintains stable performance even under prolonged high-intensity operation.

[0078] In summary, this embodiment achieves efficient and uniform heat dissipation for the chip testing equipment by employing a heat dissipation design with two sets of fan assemblies facing the two rows of test boards 102 respectively.

[0079] Please refer to Figure 6 In an innovative embodiment of this utility model, the chip testing equipment has been further improved and optimized, and a key component, the stop 105, has been introduced to enhance the functionality and stability of the equipment.

[0080] The stop 105 is cleverly designed to be movably disposed between the latch 103 and the housing 101. This position fully considers the functional requirements of the stop 105, namely, it needs to effectively stop and restrict the rotation of the latch 103 when it is in the locked position.

[0081] When the latch 103 rotates to the locked position, firmly locking the test board 102 inside the housing 101, the stop 105 plays its important role. It can prevent further rotation of the latch 103 through its position or structural characteristics, thus ensuring that the latch 103 remains stably in the locked position and will not easily loosen or rotate due to external force or vibration.

[0082] This design not only improves the stability of the test board 102 inside the housing 101, but also enhances the overall reliability and durability of the equipment. The introduction of the stop 105 effectively prevents the test board 102 from loosening or falling off due to accidental rotation of the hook 103 during equipment operation, ensuring the smooth progress of the testing process and the accuracy of the test results.

[0083] In summary, this embodiment achieves effective blocking and restriction of rotation of the hook 103 in the locking position by cleverly setting the stop 105 between the hook 103 and the housing 101.

[0084] Please refer to Figure 7 In another innovative embodiment of this utility model, I further optimized the structure of the chip testing equipment, and specifically introduced the key component of the rotating support base 2, so as to achieve a more flexible and convenient user experience.

[0085] The chip testing equipment has carefully designed rotating shafts 106 on both sides of the housing 101. These two rotating shafts 106 not only serve as the connecting link between the housing 101 and the rotating support 2, but also play an important role in enabling the housing 101 to rotate relative to the rotating support 2.

[0086] The rotating shaft 106 is rotatably mounted on the rotating support 2. This design allows the housing 101 to rotate smoothly and stably around the rotating shaft 106 with the support of the rotating support 2. This rotation mechanism provides great convenience for operators, allowing them to easily adjust the angle and position of the housing 101 according to actual needs, so as to better carry out chip testing.

[0087] The introduction of the rotating support base 2 not only improves the flexibility and operability of the chip testing equipment, but also enhances its adaptability. Whether in a limited workspace or in a testing environment that requires frequent adjustments to the equipment angle, the rotating support base 2 can leverage its unique advantages to make chip testing more efficient and smoother.

[0088] In summary, this embodiment achieves flexible rotation of the housing 101 by cleverly setting the rotating support 2 and the rotating shaft 106, further improving the convenience and adaptability of the chip testing equipment.

[0089] Please refer to Figure 8-9 In another improved embodiment of this utility model, the power system of the chip testing equipment has been upgraded, and a core component, a rotary drive module 3, has been introduced to realize the automated rotation of the housing 101, further enhancing the intelligence and convenience of the equipment.

[0090] The chip testing equipment cleverly incorporates a rotary drive module 3 on the rotary support 2. This rotary drive module 3 serves as a power source, providing stable and controllable power for the rotation of the housing 101.

[0091] The drive rod of the rotary drive module 3 is connected to one of the rotating shafts 106. This transmission connection ensures that the power of the rotary drive module 3 can be efficiently transmitted to the rotating shaft 106, thereby driving the housing 101 to rotate. Through the precise control of the rotary drive module 3, the housing 101 can achieve smooth and accurate rotation, meeting the requirements of various testing angles.

[0092] The introduction of the rotary drive module 3 not only improves the automation level of the chip testing equipment but also enhances its controllability and accuracy. Operators can easily rotate the housing 101 with simple control commands, eliminating the need for manual operation and greatly saving time and effort.

[0093] Furthermore, the rotary drive module 3 can also realize various rotation modes such as timed rotation and fixed-angle rotation of the housing 101 according to actual needs, meeting the requirements of different testing scenarios. This flexible and diverse rotation method further enhances the adaptability and practicality of the chip testing equipment.

[0094] In summary, this embodiment cleverly sets up the rotation drive module 3 and connects it to the rotation shaft 106 to achieve automated rotation of the housing 101, further improving the intelligence, convenience and adaptability of the chip testing equipment, and providing a more efficient and flexible solution for the chip testing process in intelligent manufacturing.

[0095] Please refer to this again. Figure 8-9 In a detailed and complete embodiment of this utility model, the rotary drive module 3 was comprehensively designed and constructed to ensure that the housing 101 of the chip testing equipment can achieve precise and stable automated rotation.

[0096] The rotary drive module 3 carefully includes four key components: motor 301, reducer 302, slip ring 303, and angle encoder 304. Each of them performs an important function and works together to achieve the rotation control of the housing 101.

[0097] Motor 301 serves as the power source for the rotary drive module 3, responsible for outputting rotary driving force. Its performance directly affects the rotational speed and stability of the housing 101. Therefore, we selected the high-performance and highly reliable motor 301 to ensure that the rotary drive module 3 can operate continuously and stably.

[0098] The reducer 302 is closely connected to the motor 301. Its main function is to reduce the output speed of the motor 301 and increase the output torque. Through the transmission of the reducer, the high-speed rotation of the motor 301 is converted into a low-speed, high-torque output suitable for the rotation of the housing 101, thereby ensuring that the housing 101 can rotate smoothly and accurately.

[0099] An electric slip ring 303 is cleverly positioned on another rotating shaft 106. Its function is to ensure stable power and signal transmission from the stationary part to the rotating part during the rotation of the rotating shaft 106. In this way, even when the housing 101 is rotating, it can maintain power and signal connection with other parts of the equipment, ensuring the normal operation of the equipment.

[0100] An angle encoder 304 is also mounted on the rotating shaft 106. Its main function is to measure the angular position and rotational speed of the rotating shaft 106. Through the precise measurement of the angle encoder, we can obtain the rotation angle and speed information of the housing 101 in real time, providing accurate data support for the control and debugging of the equipment.

[0101] In summary, this embodiment cleverly combines four key components—motor 301, reducer 302, slip ring 303, and angle encoder 304—to construct a high-performance and fully functional rotary drive module 3. This module not only provides stable and controllable rotary drive force to the housing 101, but also enables stable power and signal transmission during rotation, as well as precise measurement of rotation angle and speed.

[0102] Although this application uses terms such as test box and hook piece frequently, the possibility of using other terms is not excluded. These terms are used merely for the convenience of describing and explaining the essence of this utility model; interpreting them as any additional limitation would contradict the spirit of this utility model.

[0103] This utility model provides a chip testing device that features rotatable hooks at the opening of the test chamber corresponding to each test board. These hooks can rotate between a locked and unlocked position, enabling rapid locking and unlocking / removal of the test boards. This design significantly improves the ease of test board replacement, allowing operators to change boards without complex procedures, effectively reducing labor intensity. Simultaneously, the rapid response of the hooks greatly shortens replacement time, improving testing efficiency. Furthermore, its stable locking function ensures that the test boards will not loosen due to vibration or interference during operation, guaranteeing testing accuracy and thus improving the overall level and quality of chip testing, promoting the efficient development of chip testing in intelligent manufacturing.

[0104] Finally, it should be noted that although the above embodiments have been described in the text and drawings of this application, this should not limit the scope of patent protection of this application. Any technical solutions that are based on the essential concept of this application and utilize the content described in the text and drawings of this application, resulting in equivalent structural or procedural substitutions or modifications, as well as the direct or indirect application of the technical solutions of the above embodiments to other related technical fields, are all included within the scope of patent protection of this application.

Claims

1. A chip testing device, characterized in that, Includes a test box (1), the test box (1) includes a box body (101), the box body (101) is hollow inside and has an opening, the opening is connected to the inside of the box body (101); Several test boards (102) are pluggably installed inside the housing (101). Each of the test boards (102) is rotatably provided with a hook (103) at the opening. The hook (103) can rotate between the locked position and the unlocked position to lock the test board (102) inside the housing (101) or to unlock and remove the test board (102) from the inside of the housing (101).

2. The chip testing equipment according to claim 1, characterized in that, It also includes a heat dissipation module (104); The heat dissipation module (104) is disposed inside the housing (101).

3. The chip testing equipment according to claim 2, characterized in that, Several of the aforementioned test boards (102) are divided into two rows with intervals; The heat dissipation module (104) is located between the two rows of test boards (102).

4. The chip testing equipment according to claim 3, characterized in that, The heat dissipation module (104) includes two sets of fan assemblies; The airflow direction of one of the fan assemblies is directed toward one of the rows of test boards (102). The airflow direction of the other set of fan assemblies is directed toward the other row of test boards (102).

5. The chip testing equipment according to claim 1, characterized in that, It also includes a stop (105); The stop (105) is movably disposed between the hook (103) and the housing (101) to stop the hook (103) in the locked position, thereby restricting its rotation and keeping the test board (102) locked and fixed inside the housing (101).

6. The chip testing equipment according to claim 1, characterized in that, It also includes a rotating support (2); Rotating shafts (106) are provided on both sides of the housing (101). The rotating shaft (106) is rotatably mounted on the rotating support (2).

7. The chip testing equipment according to claim 6, characterized in that, It also includes a rotary drive module (3); The rotary drive module (3) is disposed on the rotary support base (2), and the drive rod of the rotary drive module (3) is connected to one of the rotary shafts (106) in a transmission connection.

8. The chip testing equipment according to claim 7, characterized in that, The rotary drive module (3) includes a motor (301), a reducer (302), an electric slip ring (303), and an angle encoder (304). The motor (301) is connected to the reducer (302), and the reducer (302) is connected to one of the rotating shafts (106) in a transmission connection; The slip ring (303) and the angle encoder (304) are disposed on another of the rotating shafts (106). The motor (301) is used to output rotational driving force; The speed reducer (302) is used to reduce the output of the motor (301) and increase the output torque; The slip ring (303) is used to achieve stable power and signal transmission from the stationary part to the rotating part during the rotation of the rotating shaft (106); The angle encoder (304) is used to measure the angular position and rotational speed of the rotating shaft (106).

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