Chip test fixture

Abstract

The utility model relates to the field of chip test production equipment, and discloses a chip test fixture, which comprises a plurality of test seats for limiting chips, a plurality of test circuit boards which are respectively butted with the test seats and are used for testing the chips, a first substrate and a second substrate, the plurality of test bases are arranged on the first substrate, a test window communicated to one side of the second substrate is arranged at the corresponding position of the first substrate, and circuit board limiting structures for limiting the test circuit board are arranged at the positions, corresponding to the plurality of test bases, of the second substrate. The corresponding positions of the first substrate and the second substrate are provided with lock catch structures which are locked in a matched mode. A plurality of test circuit boards can be tested and verified at a time, installation, taking and placing are convenient, only the lock catch structure needs to be opened and closed, repeated disassembly and assembly through components such as bolts are not needed, the structure is stable, and efficiency is high.

Description

Technical Field

[0001] This utility model relates to the field of chip testing and production equipment, and in particular to a chip testing fixture. Background Technology

[0002] Chip testing equipment is widely used in semiconductor manufacturing, quality control, electronics, information technology, and automotive industries. In semiconductor manufacturing, it is used for wafer-level testing and post-packaging testing to analyze chip performance and ensure chip quality.

[0003] Existing chip test fixtures generally consist of a test socket for holding the chip, a test circuit board electrically connected to the test socket for testing the chip, and a substrate for fixing the test socket and the test circuit board. The test circuit board is the core component of the chip test fixture, and different test circuit boards can be customized and developed according to different needs.

[0004] In large-scale automated testing, batches of test circuit boards are used. Because these test circuit boards are valuable and directly impact chip testing accuracy, newly manufactured test circuit boards are typically validated and accepted using manual chip testing fixtures. Existing manual chip testing fixtures usually have test mounts secured to the substrate with multiple bolts, with the test circuit board fixed between the test mount and the substrate. During batch verification of test circuit boards, the bolts between the substrate and the test mount need to be repeatedly removed and installed. This frequent bolt handling is cumbersome, slow, inefficient, and can affect installation stability, thus impacting the verification results of the test circuit boards. Utility Model Content

[0005] This utility model provides a chip testing fixture that solves the technical problem that existing manual chip testing fixtures require repeated disassembly and removal of bolts between the mounting substrate and the test socket during the batch verification and testing of circuit boards. This frequent bolt handling is cumbersome, slow, inefficient, and affects the stability of the installation, thus impacting the verification results of the test circuit board.

[0006] The technical solution adopted by this utility model to solve its technical problem is: a chip testing fixture, including multiple test sockets for limiting chips and multiple test circuit boards for testing chips respectively docking with the test sockets, and a first substrate and a second substrate. The multiple test sockets are all disposed on the first substrate, and the first substrate has test windows at corresponding positions that connect to one side of the second substrate. The second substrate has circuit board limiting structures at corresponding positions of the multiple test sockets to limit the test circuit boards. The first substrate and the second substrate have locking structures at corresponding positions for locking. Multiple test circuit boards can be tested and verified at once. Installation and removal are convenient; only the locking structures need to be opened and closed, eliminating the need for repeated disassembly and assembly using bolts and other components. The structure is stable and highly efficient.

[0007] Furthermore, the first substrate is provided with a plurality of first limiting guide holes, and the second substrate is provided with first limiting guide posts at corresponding positions to the first limiting guide holes, each matching the first limiting guide holes. The end of each first limiting guide post corresponding to a first limiting guide hole has a smooth guide surface. This improves the alignment and fixing accuracy of the first and second substrates and reduces the difficulty of high-precision alignment and installation.

[0008] Furthermore, a smooth guide surface is provided at one end of the first limiting guide hole and the corresponding end of the first limiting guide post. This further reduces the difficulty of high-precision alignment and installation of the first substrate and the second substrate.

[0009] Furthermore, the test circuit board is provided with fixing holes for fixation. The circuit board limiting structure includes a limiting recess on the second substrate and a test circuit board limiting post on the limiting recess that corresponds to and matches the fixing holes of the test circuit board. The end of the test circuit board limiting post corresponding to the first substrate is provided with a smooth guide surface. This reduces the precision requirements of the limiting recess, lowers the precision requirements of the alignment action when aligning the test circuit board, and makes the operation easier.

[0010] Furthermore, the second substrate has first pick-and-place recesses on both sides of the upper limit recess, and second pick-and-place recesses extending to the upper limit recess are provided at positions corresponding to the first pick-and-place recesses. This facilitates the pick-and-place operation of the test circuit board.

[0011] Furthermore, the bottom of the limiting recess is provided with a clearance recess to avoid components on the test circuit board, and both ends of the clearance recess extend through to both sides of the second substrate. This avoids damage to the test circuit board and also serves a heat dissipation function.

[0012] Furthermore, an elastic membrane pad is provided on the second substrate on the side corresponding to the first substrate. The sum of the natural thickness of the elastic membrane pad and the height of the limiting recess is greater than the thickness of the test circuit board, while the sum of the effective elastic thickness of the elastic membrane pad and the height of the limiting recess is less than the thickness of the test circuit board. This provides effective buffering protection for the test circuit board, preventing damage during testing and verification.

[0013] Furthermore, one end of the test circuit board is provided with a test connector for connecting to external testing instruments, and it is located outside the first and second substrates. This facilitates debugging and assembly during testing and improves overall efficiency.

[0014] Furthermore, a third pick-and-place recess is provided on the section of the limiting recess away from the test connector. This avoids damage to the test circuit board and makes the pick-and-place operation more convenient.

[0015] Furthermore, the first and second substrates have multiple corresponding threaded fixing structures at corresponding positions. This results in good chip testing stability. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of this utility model after some of its mechanisms have been separated;

[0017] Figure 2 This is a schematic diagram of the structure of the test circuit board and the second substrate.

[0018] The components are labeled as follows: test base 100, test circuit board 200, fixing hole 210, first substrate 300, first limiting guide hole 310, second substrate 400, first limiting guide post 410, circuit board limiting structure 420, limiting recess 421, test circuit board limiting post 422, first pick-up and put-down recess 423, second pick-up and put-down recess 424, clearance recess 425, third pick-up and put-down recess 426, and locking structure 500. Detailed Implementation

[0019] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0020] like Figure 1 The chip testing fixture shown includes multiple test sockets 100 for limiting chips and multiple test circuit boards 200 for testing chips that are respectively docked with the test sockets 100. It also includes a first substrate 300 and a second substrate 400. The multiple test sockets 100 are all disposed on the first substrate 300, and the first substrate 300 has a test window at a corresponding position that communicates with one side of the second substrate 400. The second substrate 400 has circuit board limiting structures 420 for limiting the test circuit boards 200 at positions corresponding to the multiple test sockets 100. The first substrate 300 and the second substrate 400 have locking structures 500 at corresponding positions for locking.

[0021] In this specific implementation, the locking structure 500 includes fasteners located on both sides of the first substrate 300. The two ends of the fasteners are located on the upper and lower sides of the end of the first substrate 300, and the middle part is fixed to the first substrate 300 through a pivot. Multiple springs are provided between the end of the first substrate 300 and the fasteners. When no external force is applied, the multiple springs apply a force away from the end of the first substrate 300 to the upper part of the fastener located on the pivot. By pressing, the springs can be compressed to rotate the lower end of the fastener outward and open. After the pressing force is removed, the fastener is pressed inward by the spring. The end of the second substrate 400 is provided with a recessed locking recess at the position corresponding to the fastener. When the fastener is pressed inward by the spring, the protrusion at the lower end of the fastener engages with the locking recess, so that the first substrate 300 and the second substrate 400 are elastically locked together.

[0022] The first substrate 300 has four test sockets 100 fixed positions. After the four test sockets 100 are fixed to the corresponding positions on the first substrate 300 with bolts, the standard chip to be verified is then fixed into the test sockets 100. The second substrate 400 has four circuit board limiting structures 420 for limiting the test circuit boards 200 at the corresponding positions of the four test sockets 100 on the first substrate 300. After the test circuit board 200 to be accepted and verified is placed on the circuit board limiting structure 420, the first substrate 300 and the second substrate 400 are locked by the locking structure 500. At this time, the four test circuit boards 200 are electrically connected to the chips in the four test sockets 100 on the first substrate 300. Then, the test circuit boards 200 can be connected to the test equipment to test and verify the test circuit boards 200 between the first substrate 300 and the second substrate 400, obtain the relevant performance of the test circuit boards 200, and thus obtain the acceptance result. Multiple test circuit boards 200 can be tested and verified at the same time. Installation and removal are convenient. Only the locking structure 500 needs to be opened and closed. There is no need to repeatedly disassemble and reassemble through bolts and other parts. The structure is stable and efficient.

[0023] Based on the above, such as Figure 1 and Figure 2 As shown, the first substrate 300 is provided with a plurality of first limiting guide holes 310, and the second substrate 400 is provided with first limiting guide posts 410 at positions corresponding to the first limiting guide holes 310. Each first limiting guide post 410 has a smooth guide surface at one end corresponding to the first limiting guide hole 310. In specific implementations, the cooperation of the first limiting guide holes 310 improves the alignment and fixing accuracy of the first substrate 300 and the second substrate 400, and the smooth guide surface reduces the difficulty of high-precision alignment and installation.

[0024] Based on the above, such as Figure 1 and Figure 2 As shown, the first limiting guide hole 310 and the first limiting guide post 410 are respectively provided with a smooth guide surface at one end. In specific implementations, this further reduces the difficulty of high-precision alignment and installation of the first substrate 300 and the second substrate 400.

[0025] Based on the above, such as Figure 1 and Figure 2As shown, the test circuit board 200 is provided with fixing holes 210 for fixing. The circuit board limiting structure 420 includes a limiting recess 421 provided on the second substrate 400 and a test circuit board limiting post 422 provided on the limiting recess 421 that corresponds to and matches the fixing holes 210 of the test circuit board 200. The end of the test circuit board limiting post 422 corresponding to the first substrate 300 is provided with a smooth guide surface. In specific implementation, since the connection between the electrical connection module on the test base 100 and the test circuit board 200 needs to be very precise, the test circuit board 200 needs to be positioned with high precision in the limiting recess 421. The setting of the test circuit board limiting post 422 reduces the precision requirement of the limiting recess 421, and the setting of the smooth guide surface on the test circuit board limiting post 422 reduces the precision requirement of the alignment action when the test circuit board 200 is aligned, making the operation easier.

[0026] Based on the above, such as Figure 2 As shown, the second substrate 400 has first pick-and-place recesses 423 on both sides of the upper limit recess 421, and second pick-and-place recesses 424 extending onto the upper limit recess 421 at corresponding positions of the first pick-and-place recesses 423. This facilitates the pick-and-place operation of the test circuit board 200.

[0027] Based on the above, such as Figure 2 As shown, the bottom of the limiting recess 421 is provided with a clearance recess 425 to avoid components on the test circuit board 200. The two ends of the clearance recess 425 extend through to both sides of the second substrate 400. In specific implementation, the clearance recess 425 can not only avoid damage to the test circuit board 200, but also play a role in heat dissipation.

[0028] Based on the above, such as Figure 1 and Figure 2 As shown, an elastic film pad is provided on the second substrate 400 on the side corresponding to the first substrate 300. The sum of the natural thickness of the elastic film pad and the height of the limiting recess 421 is greater than the thickness of the test circuit board 200, while the sum of the effective elastic thickness of the elastic film pad and the height of the limiting recess 421 is less than the thickness of the test circuit board 200. In this specific embodiment, the elastic film pad is an elastic pad made of insulating elastic rubber material; it effectively buffers and protects the test circuit board 200, preventing damage to the test circuit board 200 during testing and verification.

[0029] Based on the above, such as Figure 1 and Figure 2 As shown, one end of the test circuit board 200 is provided with a test connector for connecting to external test instruments and is located outside the first substrate 300 and the second substrate 400. This facilitates debugging and assembly during testing and improves overall efficiency.

[0030] Based on the above, such as Figure 1 and Figure 2 As shown, a third pick-and-place recess 426 is provided on the section of the limiting recess 421 away from the test plug-in part. It can assist in picking up and placing from both ends and sides of the test circuit board 200. When the test circuit board 200 is jammed, it can be operated from multiple directions to avoid damage to the test circuit board 200, and the pick-and-place operation is more convenient.

[0031] Based on the above, such as Figure 1 and Figure 2 As shown, the first substrate 300 and the second substrate 400 are provided with multiple corresponding threaded fixing structures at corresponding positions. In a specific implementation, after a batch of test circuit boards 200 have completed calibration and acceptance, the test circuit boards 200 can be installed between the first substrate 300 and the second substrate 400 and locked with bolts for chip testing, resulting in good chip testing stability.

[0032] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of this utility model. It should be understood that the above descriptions are merely specific embodiments of this utility model and are not intended to limit this utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A chip testing fixture, comprising a plurality of test sockets (100) for positioning chips and a plurality of test circuit boards (200) for testing the chips, respectively, and being connected to the test sockets (100), characterized in that: It also includes a first substrate (300) and a second substrate (400). A plurality of test seats (100) are disposed on the first substrate (300), and a test window communicating with one side of the second substrate (400) is provided on the first substrate (300) at a corresponding position. A circuit board limiting structure (420) for limiting test circuit boards (200) is provided on the second substrate (400) at a corresponding position to the plurality of test seats (100). A locking structure (500) for locking is provided at a corresponding position to the first substrate (300) and the second substrate (400).

2. The chip testing fixture of claim 1, wherein: The first substrate (300) is provided with a plurality of first limiting guide holes (310), and the second substrate (400) is provided with first limiting guide posts (410) at positions corresponding to the first limiting guide holes (310), and the first limiting guide posts (410) are provided with a smooth guide surface at one end corresponding to the first limiting guide holes (310).

3. The chip testing fixture of claim 2, wherein: The first limiting guide hole (310) and the first limiting guide post (410) are provided with a smooth guide surface at one end.

4. The chip testing fixture of claim 1, wherein: The test circuit board (200) is provided with fixing holes (210) for fixing. The circuit board limiting structure (420) includes a limiting recess (421) provided on the second substrate (400) and a test circuit board limiting post (422) provided on the limiting recess (421) that corresponds to and matches the fixing holes (210) of the test circuit board (200). The test circuit board limiting post (422) has a smooth guide surface at one end corresponding to the first substrate (300).

5. A chip testing fixture according to claim 4, characterized in that: The second substrate (400) has a first pick-up and put-down recess (423) on both sides of the upper limit recess (421), and a second pick-up and put-down recess (424) extending to the upper limit recess (421) is provided at the corresponding position of the first pick-up and put-down recess (423).

6. The chip testing fixture of claim 4, wherein: The bottom of the limiting recess (421) is provided with a clearance recess (425) to avoid the devices on the test circuit board (200), and the two ends of the clearance recess (425) extend through to both sides of the second substrate (400).

7. The chip testing fixture of claim 4, wherein: An elastic membrane pad is provided on the side of the second substrate (400) corresponding to the first substrate (300). The sum of the natural thickness of the elastic membrane pad and the height of the limiting recess (421) is greater than the thickness of the test circuit board (200). The sum of the effective elastic thickness of the elastic membrane pad and the height of the limiting recess (421) is less than the thickness of the test circuit board (200).

8. The chip testing fixture of claim 4, wherein: One end of the test circuit board (200) is provided with a test connector for connecting to an external test instrument and is located outside the first substrate (300) and the second substrate (400).

9. The chip testing fixture of claim 8, wherein: A third pick-and-place recess (426) is provided on the section of the limiting recess (421) away from the test connector.

10. The chip testing fixture of claim 8, wherein: The first substrate (300) and the second substrate (400) are provided with a plurality of corresponding threaded fixing structures at corresponding positions.

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