Integrated circuit test carrier plate

By designing a limiting frame and clamping components for an integrated circuit test board, the problem of component compression during circuit board testing was solved, enabling flexible adjustment and stable clamping of the circuit board, and ensuring connection stability and circuit board safety during testing.

CN224152529UActive Publication Date: 2026-04-21SICHUAN JIEHENG TECH CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SICHUAN JIEHENG TECH CO LTD
Filing Date
2025-01-13
Publication Date
2026-04-21

AI Technical Summary

Technical Problem

When inspecting integrated circuit boards for cold solder joints and missing solder joints, the component connection points on the front of the circuit board are easily compressed, affecting the stability of the solder joints and damaging the components.

Method used

Design an integrated circuit test carrier board, including a test carrier board, with rotating seats fixedly connected to both sides of the top of the test carrier board, rotating support arms rotatably mounted on the rotating seats, and a limiting frame fixedly mounted between the rotating support arms. A clamping assembly is slidably connected to one side of the limiting frame, the clamping assembly including a main compartment and a telescopic rod slidably mounted on the limiting frame, a telescopic rod and a spring fixedly mounted inside the main compartment, a clamping plate fixedly connected to the bottom end of the telescopic rod and one side of the main compartment, a groove opened on one side of the frame seal, through grooves provided on the inner walls of both sides of the limiting frame, and a support column passing through a through hole and fitted with a heightening sleeve.

Benefits of technology

The design of the limiting frame and clamping components enables flexible adjustment and stable clamping of the circuit board, avoiding pressure on the front components when the circuit board is flipped, and ensuring connection stability and circuit board safety during the testing process.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN224152529U_ABST
    Figure CN224152529U_ABST
Patent Text Reader

Abstract

The utility model relates to the technical field of circuit testing, in particular to an integrated circuit testing carrier plate. Comprising a test carrier plate, rotating seats are fixedly connected to the two sides of the top end of the test carrier plate, rotating supporting arms are rotationally arranged on the rotating seats, a limiting frame is fixedly arranged between the two rotating supporting arms, the limiting frame is a semi-wrapped rectangular frame, and two clamping assemblies are slidably connected to one side of the limiting frame; a frame sealing strip is clamped to the side, away from the clamping assembly, of the limiting frame. The technical problem to be solved by the utility model is that when the circuit board is overturned to carry out pseudo soldering and solder skips detection, the connection part of the front component is easily pressed.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This utility model relates to the field of circuit testing technology, and in particular to an integrated circuit test carrier board. Background Technology

[0002] Integrated circuit boards are made by integrating electronic components such as processors, resistors, capacitors, and wiring onto a carrier according to specific processes to form a complete circuit before packaging. During the production process, integrated circuit boards should also be tested to ensure their safe operation.

[0003] When inspecting integrated circuit boards for cold solder joints and missing solder joints, it is usually necessary to flip the board over and inspect each solder joint on the back. However, if the integrated circuit board is laid flat on a table for inspection, the connection points of the components on the front of the board may be compressed, affecting the stability and quality of the solder joints, causing damage to the components, and consequently affecting the overall function and lifespan of the board. Utility Model Content

[0004] The technical problem this invention aims to solve is that when flipping a circuit board to detect poor soldering and missing solder joints, the connection points of components on the front side are easily subjected to pressure.

[0005] To solve the above-mentioned technical problems, the technical solution adopted by this utility model is as follows: an integrated circuit test carrier board, including a test carrier board, with rotating seats fixedly connected to both sides of the top of the test carrier board, rotating support arms rotatably provided on the rotating seats, and a limiting frame fixedly provided between the two rotating support arms, and the limiting frame is a semi-enclosed rectangular frame, with two clamping components slidably connected to one side of the limiting frame, and a border seal being snapped onto the side of the limiting frame away from the clamping components.

[0006] As a further improvement of this utility model, the clamping assembly includes a main body compartment that is slidably disposed on the limiting frame. A telescopic rod is fixedly disposed inside the main body compartment, and a spring is sleeved on the telescopic rod. A clamping plate is fixedly connected to the bottom end of the telescopic rod and one side of the main body compartment.

[0007] As a further improvement of this utility model, a sliding plate is fixedly connected to the side of the main compartment away from the clamping plate, and the limiting frame is provided with a sliding groove for sliding connection between the sliding plate and the clamping plate.

[0008] As a further improvement of this utility model, a groove is provided on one side of the frame seal for the circuit board to be embedded and snapped in.

[0009] As a further improvement of this utility model, the two ends of the frame seal are fixedly connected with snap-fit ​​protrusions, and the inner walls on both sides of the limiting frame are provided with through grooves that match the snap-fit ​​protrusions.

[0010] As a further improvement of this utility model, support columns are fixedly connected to the four corners of the bottom end of the test plate, and the support columns are provided with multiple through holes. The support columns are slidably fitted with heightening sleeves, and the heightening sleeves are inserted with limit bolts that pass through the through holes.

[0011] The beneficial effects of this invention are as follows: Rotary seats are fixed on both sides of the top of the test carrier. The rotating seats are connected to the limiting frame via rotating arms. Because the limiting frame is rotatably connected to the rotating seats, the test angle can be flexibly adjusted, while avoiding the risk of damage to some circuit components due to the circuit board flipping and pressing. Through the clamping components and the frame seal, a reliable connection effect can be provided for the circuit board to be tested, ensuring connection stability during multi-angle adjustment. Attached Figure Description

[0012] Figure 1 This is an overall schematic diagram of an integrated circuit test carrier board according to the present invention;

[0013] Figure 2 This is a partial view of an integrated circuit test carrier board according to the present invention;

[0014] Figure 3 This is a partial cross-sectional view of an integrated circuit test substrate according to this utility model. Figure 1 ;

[0015] Figure 4 This is a partial cross-sectional view of an integrated circuit test substrate according to this utility model. Figure 2 .

[0016] As shown in the figure: 1. Test carrier plate; 2. Rotating seat; 3. Rotating support arm; 4. Limiting frame; 5. Clamping assembly; 501. Main compartment; 502. Telescopic rod; 503. Clamping plate; 6. Frame seal; 7. Sliding plate; 8. Groove; 9. Through groove; 10. Support column; 11. Heightening sleeve. Detailed Implementation

[0017] The directional terms such as up, down, left, right, front, back, front, back, top, and bottom mentioned or possibly mentioned in this specification are defined relative to their structure and are relative concepts. Therefore, they may vary depending on their location and usage; thus, these or other directional terms should not be interpreted as restrictive terms.

[0018] The singular forms “a,” “the,” and “the” used in this specification are intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used herein refers to and includes one or more of the associated listed items, any or all possible combinations thereof.

[0019] To make the technical problems, technical solutions, and beneficial effects to be solved by this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0020] This utility model provides the following: Figure 1-4 As shown, an integrated circuit test substrate includes a test substrate 1. Rotary seats 2 are fixedly connected to both sides of the top of the test substrate 1. Rotary support arms 3 are rotatably mounted on the rotating seats 2. A rotating handle is fixedly mounted at one end of each rotating support arm 3. A limiting frame 4 is fixedly mounted between the two rotating support arms 3. The limiting frame 4 is a semi-enclosed rectangular frame. Two clamping components 5 are slidably connected to one side of the limiting frame 4. A border seal 6 is snapped onto the side of the limiting frame 4 away from the clamping components. Support columns 10 are fixedly connected to the four corners of the bottom of the test substrate 1. Multiple through holes are formed in each support column 10. An increasing sleeve 11 is slidably fitted onto each support column 10. Limiting bolts through the through holes are inserted into the increasing sleeve 11. The support columns 10, increasing sleeves 11, and limiting bolts provide an extended height for the test substrate 1, which can be adjusted according to the operator's operating height.

[0021] like Figure 4 As shown, the clamping assembly 5 includes a main body compartment 501 slidably disposed on the limiting frame. A telescopic rod 502 is fixedly disposed inside the main body compartment 501, and a spring is sleeved on the telescopic rod 502. One end of the spring is fixedly connected to the main body compartment 501, and the other end is fixedly connected to the bottom of the telescopic rod 502. Clamping plates 503 are fixedly connected to the bottom end of the telescopic rod 502 and one side of the main body compartment 501. The two clamping assemblies 5 are used to provide limiting clamping for the circuit board. A sliding plate 7 is fixedly connected to the side of the main body compartment 501 away from the clamping plate 503. The limiting frame 4 has a sliding groove for sliding connection of the sliding plate 7 and the clamping plate 503. The sliding plate 7 and the sliding groove provide good guidance for the movement of the clamping assembly 5.

[0022] like Figure 2 As shown, a groove 8 is provided on one side of the frame seal 6 for the circuit board to be embedded and snapped in; this provides a fitting and fixing effect for the circuit board and ensures the reliability of the connection. Snap-in protrusions are fixedly connected to both ends of the frame seal 6, and through grooves 9 matching the snap-in protrusions are provided on the inner walls of both sides of the limiting frame 4; the frame seal 6 is slid inwards through the snap-in protrusions into the through grooves 9, so that the other side of the circuit board held by the clamping component 5 is snapped in by the frame seal 6.

[0023] Working Principle: In practical implementation, according to the length of the circuit board, the two clamping components 5 on the limiting frame 4 are slid to the corresponding sides of the circuit board to ensure stable clamping. The clamping plates 503 located at the bottom of the telescopic rod 502 are pulled downwards, causing the telescopic rod 502 to move downwards. The spring deforms accordingly, placing the circuit board between the two clamping plates 503. Then, the clamping plates 503 are released, allowing the spring to return to its original state, and the telescopic rod 502 springs back and retracts. Based on the above principle, the two sets of clamping plates 503 clamp and limit the circuit board. Next, the frame seal 6 is slid into the through grooves 9 on the inner walls of both sides of the limiting frame 4 according to the snap-fit ​​protrusions on both sides, until the groove 8 on the inner side of the frame seal 6 snaps into the edge of the circuit board, finally making the circuit board tightly connected to the limiting frame 4. Then, by rotating the handle at one end of the rotating support arm 3, the test angle of the circuit board can be changed, facilitating testing operations.

[0024] The above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. An integrated circuit test board, characterized by: The test carrier plate (1) is fixedly connected to two rotating seats (2) on both sides of the top of the test carrier plate (1). The rotating seats (2) are rotatably provided with rotating arms (3). A limiting frame (4) is fixedly provided between the two rotating arms (3). The limiting frame (4) is a semi-enclosed rectangular frame. Two clamping components (5) are slidably connected to one side of the limiting frame (4). A border seal (6) is snapped onto the side of the limiting frame (4) away from the clamping components.

2. The integrated circuit test board of claim 1, wherein: The clamping assembly (5) includes a main body compartment (501) that is slidably disposed on the limiting frame. A telescopic rod (502) is fixedly disposed inside the main body compartment (501), and a spring is sleeved on the telescopic rod (502). A clamping plate (503) is fixedly connected to the bottom end of the telescopic rod (502) and one side of the main body compartment (501).

3. An integrated circuit test board as claimed in claim 2, characterized in that: A sliding plate (7) is fixedly connected to the side of the main compartment (501) away from the clamping plate (503), and the limiting frame (4) is provided with a sliding groove for sliding connection of the sliding plate (7) and the clamping plate (503).

4. The integrated circuit test board of claim 1, wherein: The edge seal (6) has a groove (8) on one side for the circuit board to be embedded and snapped in.

5. The integrated circuit test board of claim 1, wherein: The two ends of the frame seal (6) are fixedly connected with snap-fit ​​protrusions, and the inner walls on both sides of the limiting frame (4) are provided with through grooves (9) that match the snap-fit ​​protrusions.

6. The integrated circuit test board of claim 1, wherein: The test plate (1) is fixedly connected to the four corners of the bottom end of the test plate (1), and the support column (10) has multiple through holes. The support column (10) is slidably fitted with a heightening sleeve (11), and the heightening sleeve (11) is inserted with a limit bolt through the through hole.