Crystal oscillator detection device
By incorporating a temperature sensor and heating lamp into the crystal oscillator testing device, the impact of air-conditioned workshop temperature on crystal oscillator testing was resolved, achieving stable oscillation frequency and high-precision testing, shortening the crystal oscillator startup time, and improving testing accuracy and precision.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- ZHONGSHAN BOWEN ELECTRONIC TECH CO LTD
- Filing Date
- 2025-05-26
- Publication Date
- 2026-04-21
AI Technical Summary
The temperature in the air-conditioning production workshop affects the accuracy of crystal oscillators, especially in low-temperature environments where the start-up time is longer and the frequency fluctuates greatly, thus affecting the accuracy of the test.
A temperature sensor and a heating lamp are installed in the crystal oscillator testing device. The sensor detects the temperature of the crystal oscillator and controls the heating lamp to preheat it so that the crystal oscillator reaches a stable temperature before testing.
To ensure that the crystal oscillator reaches a stable working state during testing, reduce the impact of temperature changes on the frequency, improve testing accuracy and speed, and simulate the actual working environment to improve the accuracy of testing results.
Smart Images
Figure CN224152586U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of crystal oscillator processing technology, specifically to a crystal oscillator testing device. Background Technology
[0002] A crystal oscillator is an electronic component that uses the piezoelectric effect of quartz crystals to generate a precise oscillation frequency. It is widely used in communications, computers, automotive electronics, and other fields. Crystal oscillator production, processing, and testing are generally carried out in air-conditioned workshops. Before testing, the crystal oscillators are affected by the cold air in the workshop, resulting in a lower temperature. Since the frequency of a crystal oscillator changes with temperature, the lower temperature affects the accuracy of crystal testing. Utility Model Content
[0003] To address the issue of temperature fluctuations in existing air-conditioned production workshops affecting crystal oscillator testing, this application provides a crystal oscillator testing device. The specific technical solution of this application is as follows:
[0004] A crystal oscillator testing device includes: a machine base and a conveying mechanism, a placement mechanism, and a testing mechanism sequentially arranged on the machine base. The conveying mechanism is used to convey the crystal oscillator to the placement mechanism, the placement mechanism is used to place the crystal oscillator and convey it to the testing mechanism, and the testing mechanism is used to test the crystal oscillator. The crystal oscillator testing device also includes a first protective shell, a temperature detection sensor, and a heating lamp. The first protective shell is fixedly arranged on the machine base, the placement mechanism is located in the first protective shell, and the temperature detection sensor and the heating lamp are arranged on the first protective shell. The temperature detection sensor is used to detect the temperature of the crystal oscillator on the placement mechanism, and the heating lamp is used to preheat the crystal oscillator on the placement mechanism.
[0005] Furthermore, a circular hole is provided on the side of the first protective shell, and the temperature detection sensor is disposed in the circular hole.
[0006] Furthermore, the temperature detection sensor is an infrared wireless temperature sensor.
[0007] Furthermore, the top of the first protective shell is provided with a through hole, which is located directly above the placement mechanism, and the heating lamp is vertically disposed on the top of the first protective shell and above the through hole.
[0008] Furthermore, the through hole is rectangular.
[0009] Furthermore, the top of the first protective shell is provided with a screw hole, and the heating lamp is fixedly connected to the first protective shell by screws.
[0010] Furthermore, the crystal oscillator testing device also includes a second protective shell, the side of which is fitted to the top side of the first protective shell, and the testing mechanism is disposed in the second protective shell.
[0011] Furthermore, the crystal oscillator detection device also includes a controller, which is connected to the temperature detection sensor and the heating lamp respectively, and is used to control the operation of the heating lamp according to the detection value of the temperature detection sensor.
[0012] Compared with existing technologies, the advantages of this application are as follows: The crystal oscillator testing device described in this application is equipped with a temperature detection sensor and a heating lamp on the first protective shell. First, the temperature of the crystal oscillator on the placement mechanism is detected by the temperature detection sensor. Then, the crystal oscillator is preheated by the heating lamp, ensuring that it enters the testing mechanism at an appropriate temperature for testing. This ensures that the crystal oscillator can reach a stable working state during testing, resulting in the following effects:
[0013] 1. Ensure a stable oscillation frequency. After startup, a crystal oscillator needs some time to stabilize its oscillation frequency. Preheating allows for a more uniform temperature distribution inside the crystal, reducing the impact of temperature changes on the frequency. For example, some high-precision crystal oscillators may experience slight frequency drift during the initial startup phase; after preheating, the frequency will gradually stabilize near the nominal value.
[0014] 2. Reduce the impact of startup characteristics. In low-temperature environments, the startup time of a crystal oscillator may be prolonged, and the frequency fluctuations may be significant during the initial startup phase. Preheating can accelerate the startup process of the crystal oscillator, allowing it to reach a stable operating state more quickly. For example, at extremely low temperatures, some crystal oscillators may require several seconds or even tens of seconds to stabilize, while after preheating, it may only take a few milliseconds.
[0015] 3. Improve detection accuracy. The detection equipment itself also needs time to stabilize its internal electronic components. Preheating allows components such as the oscillator and amplifier to reach a stable operating state, thereby improving detection accuracy. For example, the frequency of the internal oscillator of the detection equipment may drift due to temperature changes; preheating can reduce the impact of this drift on measurement accuracy.
[0016] 4. Simulate actual working environment. In practical applications, crystal oscillators typically take some time to reach a stable operating state after the device is started. Preheating can simulate this actual working environment, ensuring that the test results are closer to the performance of the crystal oscillator in actual use. As one embodiment, a circular hole is provided on the side of the first protective shell, and the temperature detection sensor is disposed in the circular hole. Attached Figure Description
[0017] Figure 1 This is a schematic diagram of the crystal oscillator detection device in one embodiment of this application;
[0018] Figure 2 This is an exploded view of a crystal oscillator detection device in one embodiment of this application;
[0019] Figure 3 This is a side view of a crystal oscillator detection device in one embodiment of this application;
[0020] Figure 4 This is a cross-sectional schematic diagram of a crystal oscillator detection device in one embodiment of this application;
[0021] Figure 5 This is a schematic diagram of the internal structure of a crystal oscillator detection device in one embodiment of this application. Detailed Implementation
[0022] The embodiments of this application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout.
[0023] In the description of this application, it should be noted that the directional terms such as "center", "lateral", "longitudinal", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", and "counterclockwise" indicate the orientation and positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. They should not be construed as limiting the specific protection scope of this application.
[0024] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features. Thus, the use of "first" or "second" to define a feature may explicitly or implicitly include one or more of that feature, and in the description of this application, "at least" means one or more, unless otherwise explicitly specified.
[0025] In this application, unless otherwise expressly specified and limited, the terms "assembly," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can also refer to a mechanical connection; they can refer to a direct connection or a connection through an intermediate medium; or they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0026] In the application, unless otherwise specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "below," and "over" the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Above," "below," and "below" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0027] The following description, in conjunction with the accompanying drawings, further illustrates specific embodiments of this application, making the technical solution and its beneficial effects clearer and more explicit. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, but should not be construed as limiting it.
[0028] like Figure 1 and Figure 5 As shown, a crystal oscillator testing device includes: a machine base 1 and a conveying mechanism 2, a placement mechanism 3, and a testing mechanism 4 arranged sequentially on the machine base 1. The conveying mechanism 2 is used to convey the crystal oscillator to the placement mechanism 3. The placement mechanism 3 is used to place the crystal oscillator and convey it to the testing mechanism 4. The testing mechanism 4 is used to test the crystal oscillator. The crystal oscillator testing device also includes a first protective shell 5, a temperature detection sensor 6, and a heating lamp 7. The first protective shell 5 is fixedly installed on the machine base 1. The placement mechanism 3 is located in the first protective shell 5. The temperature detection sensor 6 and the heating lamp 7 are installed on the first protective shell 5. The temperature detection sensor 6 is used to detect the temperature of the crystal oscillator on the placement mechanism 3. The heating lamp 7 is used to preheat the crystal oscillator on the placement mechanism 3. Crystal oscillators are typically composed of multiple crystal oscillators arranged together to form a crystal oscillator module. This module then enters the testing device for testing. After the crystal oscillator module is placed onto the conveyor mechanism 2 by hand or mechanical equipment, the conveyor mechanism 2 transports the crystal oscillator module to the side of the placement mechanism 3. If the crystal oscillator module on the placement mechanism 3 is picked up by a suction nozzle and transferred to the testing mechanism 4, the suction nozzle will then pick up the crystal oscillator module from the conveyor mechanism 2 and transfer it to the placement mechanism 3. At this time, the temperature detection sensor 6 located on the first protective shell 5 detects the temperature of the crystal oscillator module on the placement mechanism 3. If the temperature of the crystal oscillator module is lower than the set temperature, the heating lamp 7 will be controlled to preheat the crystal oscillator module, maintaining it at a suitable temperature, thereby improving the accuracy and reliability of the test results.
[0029] In one embodiment, the first protective shell 5 has a circular hole 8 on its side, and the temperature detection sensor 6 is disposed in the circular hole 8.
[0030] In one embodiment, the temperature sensor 6 is an infrared wireless temperature sensor. The temperature sensor 6 obtains the temperature of the crystal oscillator wirelessly, preventing displacement of the crystal oscillator and thus avoiding the detection mechanism 4's inability to identify the crystal oscillator or damage to its surface.
[0031] In one embodiment, the top of the first protective shell 5 is provided with a through hole 9, which is located directly above the placement mechanism 3. The heating lamp 7 is vertically disposed on the top of the first protective shell 5 and above the through hole 9. The heating lamp 7 is disposed on the top of the first protective shell 5 and provides heat to the crystal oscillator through the through hole 9, which not only facilitates the installation of the heating lamp 7 but also helps the heating lamp 7 to dissipate heat.
[0032] In one embodiment, the through hole 9 is rectangular.
[0033] In one embodiment, the top of the first protective shell 5 is provided with a screw hole 10, and the heating lamp 7 is fixedly connected to the first protective shell 5 by screws. The heating lamp 7 is fixed with screws, making the installation more stable.
[0034] In one embodiment, the crystal oscillator testing device further includes a second protective shell 11, the side of which is fitted against the top side of the first protective shell 5, and the testing mechanism 4 is disposed within the second protective shell 11. The first protective shell 5 and the second protective shell 11 are used to prevent environmental factors from affecting the testing of the crystal oscillator.
[0035] In one embodiment, the crystal oscillator detection device further includes a controller 12, which is connected to the temperature detection sensor 6 and the heating lamp 7 respectively, and is used to control the operation of the heating lamp 7 according to the detection value of the temperature detection sensor 6.
[0036] The crystal oscillator testing device described in this application is equipped with a temperature sensor 6 and a heating lamp 7 on the first protective housing 5. First, the temperature of the crystal oscillator on the placement mechanism 3 is detected by the temperature sensor 6. Then, the crystal oscillator is preheated by the heating lamp 7, ensuring that it enters the testing mechanism 4 at an appropriate temperature for testing. This ensures that the crystal oscillator can achieve a stable working state during testing, resulting in the following effects:
[0037] 1. Ensure a stable oscillation frequency. After startup, a crystal oscillator needs some time to stabilize its oscillation frequency. Preheating allows for a more uniform temperature distribution inside the crystal, reducing the impact of temperature changes on the frequency. For example, some high-precision crystal oscillators may experience slight frequency drift during the initial startup phase; after preheating, the frequency will gradually stabilize near the nominal value.
[0038] 2. Reduce the impact of startup characteristics. In low-temperature environments, the startup time of a crystal oscillator may be prolonged, and the frequency fluctuations may be significant during the initial startup phase. Preheating can accelerate the startup process of the crystal oscillator, allowing it to reach a stable operating state more quickly. For example, at extremely low temperatures, some crystal oscillators may require several seconds or even tens of seconds to stabilize, while after preheating, it may only take a few milliseconds.
[0039] 3. Improve detection accuracy. The detection equipment itself also needs time to stabilize its internal electronic components. Preheating allows components such as the oscillator and amplifier to reach a stable operating state, thereby improving detection accuracy. For example, the frequency of the internal oscillator of the detection equipment may drift due to temperature changes; preheating can reduce the impact of this drift on measurement accuracy.
[0040] 4. Simulate the actual working environment. In practical applications, crystal oscillators typically take some time to reach a stable working state after the device is started. Preheating can simulate this actual working environment, ensuring that the test results are closer to the performance of the crystal oscillator in actual use. As one embodiment, the side of the first protective shell 5 is provided with a circular hole 8, and the temperature detection sensor 6 is disposed in the circular hole 8.
[0041] In the description of this specification, the terms "in one embodiment," "preferred," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this application. The illustrative expressions of the above terms in this specification do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described can be combined in any suitable manner in one or more embodiments or examples. The connection methods linked in the description of this specification have significant effects and practical utility.
[0042] Based on the above description of the structure and principles, those skilled in the art should understand that this application is not limited to the specific embodiments described above. Any improvements and substitutions made using techniques known in the art based on this application fall within the protection scope of this application and should be defined by the claims. 。
Claims
1. A crystal oscillator testing device, comprising: a machine base and a conveying mechanism, a placement mechanism, and a testing mechanism sequentially arranged on the machine base, wherein the conveying mechanism is used to convey the crystal oscillator to the placement mechanism, the placement mechanism is used to place the crystal oscillator and convey it to the testing mechanism, and the testing mechanism is used to test the crystal oscillator, characterized in that, The crystal oscillator testing device further includes a first protective shell, a temperature detection sensor, and a heating lamp. The first protective shell is fixedly mounted on the machine base, and the placement mechanism is located in the first protective shell. The temperature detection sensor and the heating lamp are mounted on the first protective shell. The temperature detection sensor is used to detect the temperature of the crystal oscillator on the placement mechanism, and the heating lamp is used to preheat the crystal oscillator on the placement mechanism.
2. The crystal oscillator detection apparatus according to claim 1, wherein The first protective shell has a circular hole on its side, and the temperature detection sensor is disposed in the circular hole.
3. The crystal oscillator detection apparatus according to claim 2, wherein The temperature detection sensor is an infrared wireless temperature sensor.
4. The crystal unit detection device according to claim 2, wherein The top of the first protective shell is provided with a through hole, which is located directly above the placement mechanism. The heating lamp is vertically positioned on the top of the first protective shell and above the through hole.
5. The crystal unit detection device according to claim 4, wherein The through hole is rectangular.
6. The crystal unit detection device according to claim 5, wherein The top of the first protective shell is provided with a screw hole, and the heating lamp is fixedly connected to the first protective shell by screws.
7. The crystal unit detection device according to claim 4, wherein The crystal oscillator testing device also includes a second protective shell, the side of which is fitted to the side of the top of the first protective shell, and the testing mechanism is disposed in the second protective shell.
8. The crystal unit detection device according to claim 1, wherein The crystal oscillator detection device also includes a controller, which is connected to a temperature sensor and a heating lamp respectively, and is used to control the operation of the heating lamp according to the detection value of the temperature sensor.