Substrate detection device
The design of the substrate testing device has improved the efficiency and accuracy of electrical performance testing of the electronic ink screen driving substrate, solving the problems of insufficient positioning accuracy and low efficiency in manual operation.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- NINGBO YUANXIN ELECTRONICS CO LTD
- Filing Date
- 2026-02-13
- Publication Date
- 2026-04-28
AI Technical Summary
In the existing technology, the electrical performance testing of the electronic ink screen driving substrate relies on manual operation, which has problems such as insufficient positioning accuracy, low efficiency and easy misjudgment.
A substrate testing device is designed, including a placement part, a conductive part, and a probe module. Through the coordinated action of the conductive part and the probe module, the synchronous electrical performance testing of the electrode area and the ribbon cable port of the test piece is completed in a single operation. Combined with a limiting part and a flexible protective layer, the accuracy and efficiency of the testing are ensured.
It significantly improves detection efficiency and accuracy, avoids probe misalignment and poor contact, reduces misjudgment, and allows for flexible adjustment to different substrate models.
Smart Images
Figure CN224176688U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of testing technology, and in particular relates to a substrate testing device. Background Technology
[0002] E-ink displays are widely used in e-book readers, smart tags, industrial instruments, and wearable devices. As one of their core components, the e-ink display driver board performs crucial functions of signal transmission and pixel driving; its electrical performance directly determines the final display effect. Therefore, each driver board must undergo rigorous testing after production.
[0003] Currently, the electrical performance testing of e-ink screen driver substrates in the industry generally relies on manual operation: operators hold multimeter probes or simple clamps and align them one by one with the common electrode area and edge ribbon cable ports on the back of the substrate to complete resistance measurement and short circuit detection. However, this method has significant drawbacks: manual positioning accuracy is insufficient. Under the condition of micro-pitch ribbon cables, visual alignment is prone to misalignment, and the probe is prone to accidentally touching adjacent pins, causing test data distortion and even leading to misjudgment and scrapping; the testing efficiency is low, as resistance and short circuit detection usually need to be performed in steps, and repositioning is required each time switching, resulting in long testing time per unit. Utility Model Content
[0004] The purpose of this invention is to address the aforementioned problems in existing technologies by proposing a testing device that can complete the electrical performance testing of the electrode area and cable port of the test piece in a single operation.
[0005] The objective of this utility model can be achieved through the following technical solution: A substrate testing device, comprising:
[0006] The placement section includes a placement plane for supporting the item to be tested;
[0007] A conductive part is disposed on the placement part, the conductive part having a first position that is in contact with the object to be tested and a second position that is separated from the object to be tested, and the conductive part is electrically connected to a data acquisition module.
[0008] A probe module is disposed on the placement part, and the probe module has a third position that is in contact with the ribbon cable port pin of the device under test, and a fourth position that is separated from the ribbon cable port pin of the device under test. The probe module is electrically connected to the data acquisition module, and the probe module can move synchronously or asynchronously with the conductive part.
[0009] In the aforementioned substrate inspection device, along the length extension direction of the placement plane, limiting portions for positioning the workpiece to be inspected are provided on opposite sides of the placement plane.
[0010] In the aforementioned substrate testing device, a positioning hole is provided on the test piece, and the limiting part includes a plurality of limiting posts spaced apart on the placement plane. The limiting posts are inserted into the positioning hole, and the position of the limiting posts can be adjusted along the width direction of the placement plane.
[0011] In the aforementioned substrate testing device, the conductive part includes a conductive layer, and a conductive protective layer is disposed on the conductive layer, the conductive protective layer being capable of contacting and connecting with the component to be tested.
[0012] In the aforementioned substrate testing device, a flexible protective layer is provided on the placement plane, and the side of the flexible protective layer facing the conductive part protrudes from the placement plane.
[0013] In the aforementioned substrate inspection device, the flexible protective layer is located between the limiting portions on both sides along the width direction of the placement plane.
[0014] In the aforementioned substrate testing device, a conductive driving unit is provided on the placement part. The conductive driving unit is driven to the conductive part, causing the conductive part to move linearly, so that it can switch between a first position and a second position.
[0015] In the aforementioned substrate testing device, the probe module is connected to the conductive part, and the two can move synchronously, simultaneously contacting or separating from the object to be tested.
[0016] In the aforementioned substrate testing device, a guide rail is fixedly mounted on the placement part, a first slider is slidably mounted on the guide rail, and a second slider is slidably mounted on the first slider. The sliding direction of the first slider is perpendicular to the sliding direction of the second slider. The probe module is mounted on the second slider and is capable of linear adjustment relative to the second slider. The linear adjustment direction of the probe module is perpendicular to the sliding direction of the first slider and the sliding direction of the second slider.
[0017] In the aforementioned substrate inspection device, the probe module is provided with a probe driving unit, which is driven to move the probe module linearly, enabling it to switch between a third position and a fourth position.
[0018] Compared with the prior art, the beneficial effects of this utility model are as follows:
[0019] (1) During the testing process, after the test piece is placed on the placement plane, the conductive part descends to the first position and the probe module moves to the third position to establish an electrical connection with the test piece respectively; through the coordinated action of the conductive part and the probe module, the synchronous electrical performance test of the electrode area and the ribbon cable port of the test piece can be completed in a single operation, which significantly improves the testing efficiency and accuracy.
[0020] (2) Along the width of the placement plane, multiple first adjustment holes are provided on both sides of the placement plane at intervals. The limiting post is inserted and fixed in the first adjustment hole. The lateral spacing between the limiting posts can be flexibly adjusted according to the positioning hole distance of different models of test pieces (the limiting post is inserted into the corresponding first adjustment hole).
[0021] (3) Along the width direction of the placement plane, the lateral dimension of the flexible protective layer is smaller than the width of the part to be tested, and its entirety is located in the area between the two limiting parts. When the conductive part is pressed down, it only acts on the electrode area above the flexible protective layer (in the horizontal direction, the shape and area of the flexible protective layer and the conductive layer are the same). The edge of the part to be tested falls directly on the rigid area of the placement plane, and will not deform, causing probe displacement, poor contact or scratches on the ribbon cable. Attached Figure Description
[0022] Figure 1 This is a three-dimensional structural schematic diagram of Embodiment 1;
[0023] Figure 2 yes Figure 1 Enlarged structural diagram at point A;
[0024] Figure 3 yes Figure 1 A three-dimensional structural diagram of the probe module;
[0025] Figure 4 yes Figure 1 A schematic diagram of the planar structure;
[0026] Figure 5 yes Figure 1 Schematic diagram of the placement section equipped with a flexible protective layer;
[0027] Figure 6 yes Figure 1 A three-dimensional structural diagram of the central placement section;
[0028] Figure 7 This is a schematic diagram of a structure equipped with multiple conductive drive units;
[0029] Figure 8 This is a three-dimensional structural diagram of Embodiment 2.
[0030] In the figure, 100 is the placement part; 101 is the placement plane; 102 is the limiting post; 103 is the first adjustment hole; 104 is the flexible protective layer; 105 is the placement recess; 200 is the conductive part; 201 is the conductive layer; 202 is the conductive protective layer; 203 is the conductive driving part; 204 is the guide rail; 205 is the first slider; 206 is the second slider; 207 is the second adjustment hole; 300 is the probe module; 301 is the probe; 302 is the probe holder; 303 is the probe driving part; 400 is the base; 401 is the connecting plate; 402 is the support post; and 403 is the connecting screw. Detailed Implementation
[0031] The following are specific embodiments of the present invention, which are described in conjunction with the accompanying drawings. However, the present invention is not limited to these embodiments.
[0032] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in this utility model embodiment are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.
[0033] Example 1: As Figures 1-7 As shown, a substrate inspection device is provided, including a placement part 100, a conductive part 200 and a probe module 300.
[0034] The placement section 100 is provided with a placement plane 101 for supporting the test piece, and the test piece is placed stably on the placement plane 101.
[0035] A conductive part 200 is disposed on the placement part 100, specifically above the placement plane 101. The conductive part 200 can be moved to a first position, contacting and connecting with the object under test, under external driving force, and can also retract to a second position, separating from the object under test. In the first position, the conductive part 200 forms electrical contact with the electrode area of the object under test; in the second position, the two are disconnected. The conductive part 200 is electrically connected to the data acquisition module via a wire, and is used to transmit the acquired electrical signals to the data acquisition module for analysis and processing.
[0036] The probe module 300 is also disposed on the placement section 100, and is also arranged above the placement plane 101. The probe module 300 includes a plurality of probes 301, and has a third position that is in contact with the pins of the ribbon cable port of the device under test, and a fourth position that is retracted and separated from the pins of the ribbon cable port of the device under test. In the third position, each probe 301 establishes an electrical connection with its corresponding pin; in the fourth position, the probe 301 is disengaged from the pin. The probe module 300 is also electrically connected to the data acquisition module mentioned above via wires to achieve synchronous signal acquisition.
[0037] During the testing process, after the test piece is placed on the placement plane 101, the conductive part 200 descends to the first position, and the probe module 300 moves to the third position, establishing electrical connections with the test piece respectively. Through the coordinated action of the conductive part 200 and the probe module 300, the synchronous electrical performance testing of the electrode area and the ribbon cable port of the test piece can be completed in a single operation, significantly improving testing efficiency and accuracy.
[0038] Along the length of the placement plane 101, two opposing limiting portions for positioning the workpiece to be inspected are provided on both sides of the placement plane 101. Positioning holes (generally located at the edge) are provided on the workpiece to be inspected. Specifically, the limiting portions include a plurality of limiting posts 102 spaced apart along the length of the placement plane 101, such as... Figure 5 As shown, in one specific embodiment, two limiting posts 102 are provided on each side, corresponding one-to-one with the positioning holes on the workpiece to be tested. During clamping, the positioning holes on the workpiece to be tested are aligned and the limiting posts 102 are inserted to effectively prevent the workpiece to be tested from shifting or rotating during the test.
[0039] In addition, along the width direction of the placement plane 101, a plurality of first adjustment holes 103 are provided on both sides of the placement plane 101 at intervals. The limiting post 102 is inserted and fixed in the first adjustment hole 103. The lateral spacing between the limiting posts 102 can be flexibly adjusted according to the positioning hole distance of different models of test pieces (the limiting post 102 is inserted into the corresponding first adjustment hole 103).
[0040] Furthermore, the conductive part 200 includes a conductive layer 201, on which a conductive protective layer 202 is disposed, the conductive protective layer 202 being capable of contacting and connecting with the component under test. In this embodiment, the conductive protective layer 202 is made of aluminum foil, which has good conductivity, flexibility, and surface flatness. When the conductive part 200 moves to the first position, the aluminum foil directly contacts the electrode area of the component under test, preventing scratches on the coating on the surface of the component under test.
[0041] Furthermore, a flexible protective layer 104 is provided on the placement plane 101, with the side of the flexible protective layer 104 facing the conductive part 200 protruding from the placement plane 101. In this embodiment, the flexible protective layer 104 is a silicone pad, which has good elasticity and surface adhesion.
[0042] Specifically, a placement recess 105 is provided in the central region of the placement plane 101, and a flexible protective layer 104 is disposed in the placement recess 105, with its upper surface slightly higher than the rest of the placement plane 101, so that when the object to be tested is placed on the placement portion 100, it is supported by the flexible protective layer 104. During the process of the conductive portion 200 descending to the first position and contacting the object to be tested, the flexible protective layer 104 undergoes elastic deformation under pressure, buffering the downward pressure and preventing the object to be tested from warping or stress concentration due to rigid support.
[0043] Specifically, along the width direction of the placement plane 101, the lateral dimension of the flexible protective layer 104 is smaller than the width of the device under test, and its entirety is located within the area between the two limiting portions. When the conductive portion 200 is pressed down, it only acts on the electrode area above the flexible protective layer 104 (in the horizontal direction, the flexible protective layer 104 and the conductive layer 201 have the same shape and area). The edge of the device under test falls directly on the rigid area of the placement plane 101, and will not deform, causing the probe 301 to shift, make poor contact, or scratch the ribbon cable.
[0044] A conductive driving unit 203 is provided on the placement part 100. The conductive driving unit 203 is drivenly connected to the conductive part 200 and is used to drive the conductive part 200 to move linearly in a direction perpendicular to the placement plane 101, thereby switching it between a first position in contact with the test piece and a second position separated from the test piece. In this embodiment, a base 400 is also included. The conductive driving unit 203 is a cylinder, the cylinder body of which is fixed on the base 400, and the output end is fixedly connected to the conductive part 200. When the cylinder extends, it pushes the conductive part 200 down to the first position, contacting the electrode area of the test piece; when the cylinder retracts, the conductive part 200 rises to the second position, disengaging from contact.
[0045] It is worth mentioning that when there is only one conductive drive unit 203, its projection in the vertical direction is located in the central region of the placement plane 101. When there are multiple conductive drive units 203, they are distributed at intervals along the length of the placement plane 101 and symmetrically arranged in the central region of the placement plane 101. By pressing down synchronously at multiple points, the central part collapses or the edges are suspended.
[0046] Specifically, a horizontal connecting plate 401 is provided on the base 400. The connecting plate 401 is connected to the placement part 100 by several support columns 402, which elevate the placement part 100 so that the entire placement part 100 is located above the connecting plate 401, forming an operating space between them. Within the operating space, at least one connecting screw 403 (with a handle at its end) is provided. The connecting screw 403 passes through the connecting plate 401 and is screwed onto the base 400. By tightening or loosening the connecting screw 403, the placement part 100 can be securely fixed to the base 400, or it can be completely removed from the base 400. It should be noted that both the placement part 100 and the connecting plate 401 are made of insulating material, and the conductive part 200 and the output end of the conductive drive part 203 are fixedly connected by an insulating part.
[0047] Furthermore, the probe module 300 is connected to the conductive part 200, and the two can move synchronously, simultaneously contacting or separating from the device under test. Therefore, when the conductive drive part 203 is activated, the conductive part 200 and the probe module 300, as a whole, are simultaneously pressed down or retracted: when pressed down, the conductive part 200 contacts the electrode area of the device under test, and the probe 301 of the probe module 300 also simultaneously contacts the pin of the ribbon cable port; when retracted, the two are simultaneously separated.
[0048] Specifically, a guide rail 204 is fixedly mounted on the conductive part 200, extending along the length of the placement plane 101. A first slider 205 is slidably mounted on the guide rail 204, and can be fixed at any position by a locking screw. A second slider 206 is slidably mounted on the first slider 205, with its sliding direction perpendicular to the sliding direction of the first slider 205, i.e., moving along the thickness direction of the placement plane 101. The second slider 206 is also equipped with a position locking mechanism. The probe module 300 is mounted on the second slider 206, and the probe base 302 of the probe module 300 has multiple second adjustment holes 207 distributed along the width direction of the placement plane 101. A set screw passes through the corresponding second adjustment hole 207 and is screwed into the second slider 206, allowing the probe module 300 to be adjusted along the width direction of the placement plane 101.
[0049] Before batch testing, for the part to be tested, the operator first places the part on the placement plane 101 (positioned by the limiting part), then manually adjusts the position of the first slider 205 and the second slider 206, and uses the set screw to screw into the corresponding second adjustment hole 207, so that the probe module 300 is aligned with the ribbon cable port, ensuring that each probe 301 can accurately abut the pin. After the first piece is debugged, all sliders and adjustment mechanisms are locked. Subsequent products in the same batch only need to be placed in position, and the probe module 300 is controlled to move linearly downward to automatically achieve accurate contact, without repeated adjustments.
[0050] Example 2, as Figure 8 As shown, the remaining structure is the same as in Embodiment 1, i.e., the conductive driving part 203 is driven to connect with the conductive part 200, and is used to drive the conductive part 200 to move linearly in a direction perpendicular to the placement plane 101. The only difference is that the probe module 300 can move asynchronously relative to the conductive part 200. This is achieved through the following structure: the guide rail 204 is fixed on the base 400 and no longer moves with the conductive part 200. Each probe module 300 is provided with a probe driving part 303, which is driven to connect with the probe module 300, and is used to drive the probe module 300 to move linearly in a direction perpendicular to the placement plane 101, thereby switching it between a third position in contact with the test piece and a fourth position separated from the test piece. Specifically, the probe driving part 303 is a cylinder, the cylinder body of which is fixed on the second slider 206. The set screw passes through the corresponding second adjustment hole 207 and is screwed to the output end of the probe driving part 303, so that the probe module 300 can be adjusted along the width direction of the placement plane 101. When the probe drive unit 303 actuates, it pushes the entire probe module 300 downwards precisely in a vertical direction (i.e., perpendicular to the placement plane 101), so that the tips of each probe 301 contact the ribbon cable pins. After the test is completed, the probe drive unit 303 retracts, driving the probe module 300 back to the fourth position, disengaging from contact. For devices under test with multiple ribbon cable ports, only the probe drive unit 303 of the corresponding area can be activated to drive the specific probe module 300, while the other modules remain in a separated state, enabling on-demand testing and reducing unnecessary mechanical wear and signal interference.
[0051] It should be noted that in this utility model, the use of terms such as "first," "second," and "a" is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of those features. In the description of this utility model, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly defined. The terms "connection," "fixed," etc., should be interpreted broadly. For example, "fixed" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two elements or the interaction between two elements, unless otherwise explicitly defined. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.
[0052] Furthermore, the technical solutions of the various embodiments of this utility model can be combined with each other, but only if they are based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.
[0053] The specific embodiments described herein are merely illustrative examples illustrating the spirit of this utility model. Those skilled in the art to which this utility model pertains may make various modifications or additions to the described specific embodiments or use similar methods to substitute them, without departing from the spirit of this utility model or exceeding the scope defined by the appended claims.
Claims
1. A substrate testing device, characterized in that, include: The placement section includes a placement plane for supporting the item to be tested; A conductive part is disposed on the placement part, the conductive part having a first position that is in contact with the object to be tested and a second position that is separated from the object to be tested, and the conductive part is electrically connected to a data acquisition module. A probe module is disposed on the placement part, and the probe module has a third position that is in contact with the ribbon cable port pin of the device under test, and a fourth position that is separated from the ribbon cable port pin of the device under test. The probe module is electrically connected to the data acquisition module, and the probe module can move synchronously or asynchronously with the conductive part.
2. The substrate inspection device according to claim 1, characterized in that, Along the length of the placement plane, limiting portions for positioning the workpiece to be tested are provided on both sides of the placement plane.
3. The substrate inspection device according to claim 2, characterized in that, The part to be tested has a positioning hole. The limiting part includes a plurality of limiting posts spaced apart on the placement plane. The limiting posts are inserted into the positioning hole and can be adjusted in position along the width direction of the placement plane.
4. The substrate inspection device according to claim 1, characterized in that, The conductive part includes a conductive layer, and a conductive protective layer is disposed on the conductive layer. The conductive protective layer can be in contact with the object to be tested.
5. The substrate inspection device according to claim 2, characterized in that, A flexible protective layer is provided on the placement plane, and the side of the flexible protective layer facing the conductive part protrudes from the placement plane.
6. The substrate inspection device according to claim 5, characterized in that, Along the width direction of the placement plane, the flexible protective layer is located between the limiting portions on both sides.
7. The substrate inspection device according to claim 1, characterized in that, The placement part is provided with a conductive driving part, which is driven to the conductive part, causing the conductive part to move linearly, so that it can switch between a first position and a second position.
8. The substrate inspection device according to claim 7, characterized in that, The probe module is connected to the conductive part, and the two can move synchronously, while simultaneously contacting or separating from the object to be tested.
9. The substrate testing device according to claim 1, characterized in that, A guide rail is fixedly mounted on the placement part, and a first slider is slidably mounted on the guide rail. A second slider is slidably mounted on the first slider. The sliding direction of the first slider is perpendicular to the sliding direction of the second slider. The probe module is mounted on the second slider and can be linearly adjusted relative to the second slider. The linear adjustment direction of the probe module is perpendicular to the sliding direction of the first slider and the sliding direction of the second slider.
10. A substrate inspection device according to claim 1, characterized in that, The probe module is provided with a probe driving unit, which is connected to the probe module and drives the probe module to move linearly, so that it can switch between the third position and the fourth position.