Detector adjusting device, X-ray fluorescence spectrometer and sorting machine

Abstract

The utility model relates to the field of spectral analysis, in particular to a detector adjusting device, an X-ray fluorescence spectrophotometer and a sorter, the detector adjusting device is applied to the X-ray fluorescence spectrophotometer with a detector and a light machine, and the detector adjusting device comprises a horizontal part used for installing the detector; the vertical parts are arranged at the two ends of the horizontal parts, and the horizontal parts can be installed at multiple positions of the vertical parts in the vertical direction; the n-shaped plate is arranged above the horizontal part, can be mounted at a plurality of positions of the horizontal part along the horizontal direction and is used for adjusting the horizontal position of the detector relative to the optical machine; and the supporting side plate is vertically arranged above the n-shaped plate and is used for mounting the detector. The detector adjusting device is convenient to adjust and high in adjusting precision, can meet multi-dimensional data acquisition of the detector in the test process, and can obtain the fixed position of the detector through data analysis.

Description

A detector adjustment device, an X-ray fluorescence spectrometer, and a sorting machine Technical Field

[0001] This disclosure relates to the field of spectral analysis, specifically to a detector adjustment device, an X-ray fluorescence spectrometer, and a sorting machine. Background Technology

[0002] X-ray fluorescence spectroscopy (XRF) technology can simultaneously detect multiple elements in various fields such as mining, medicine, industry, geology, and environment. It possesses non-destructive testing characteristics, is suitable for various sample morphologies, and offers rapid, efficient, and real-time online detection. In experiments, it is often necessary to adjust the relative distance between the detector and the optomechanical target to obtain an appropriate position for acquiring better experimental data. In actual material sorting, the detector needs to be adjusted to a suitable position with the optomechanical system for spectral analysis. However, poor detector adjustment precision leads to inaccurate information acquired by the detector, resulting in unreliable spectral analysis results, reduced accuracy of experimental data, and decreased material sorting efficiency. Summary of the Invention

[0003] To overcome the problems existing in the related art, an exemplary embodiment of this disclosure provides a detector adjustment device for use in an X-ray fluorescence spectrometer with a detector and an optical engine. The detector adjustment device includes: a horizontal section for mounting the optical engine; a vertical section disposed at both ends of the horizontal section, the horizontal section being mountable at multiple positions along the vertical direction of the vertical section; a U-shaped plate disposed above the horizontal section, mountable at multiple positions along the horizontal direction of the horizontal section, for adjusting the horizontal position of the detector relative to the optical engine; and a support side plate vertically disposed above the U-shaped plate for mounting the detector.

[0004] In some embodiments, the vertical portion is provided with a first elongated hole, and a first bolt passes through the first elongated hole to fix the horizontal portion to the vertical portion.

[0005] In some embodiments, the detector adjustment device further includes: a base plate, fixedly disposed above the horizontal portion and correspondingly disposed below the U-shaped plate, the base plate having a row of first holes, and the plurality of first holes being equidistantly arranged; the U-shaped plate having a row of second holes corresponding to the first holes, and the plurality of second holes being equidistantly arranged, wherein the distance between two adjacent first holes is greater than or less than the distance between two adjacent second holes; and a second bolt, the second bolt passing through one of the first holes and one of the second holes to fix the U-shaped plate to the base plate.

[0006] In some embodiments, the detector adjustment device further includes: a first lead screw, fixedly disposed above the horizontal portion and arranged horizontally; and a first nut sleeve, sleeved on the first lead screw, the outer side of the first nut sleeve abutting against the vertical edge of the U-shaped plate, for adjusting the horizontal position of the detector relative to the optical engine; or, a second lead screw, fixedly disposed above the U-shaped plate and arranged vertically; and a second nut sleeve, sleeved on the second lead screw, the outer side of the second nut sleeve connected to the support side plate, for adjusting the vertical position of the detector relative to the optical engine.

[0007] In some embodiments, the support side plate is provided with an arc-shaped hole; the detector adjustment device further includes: a detector support base, installed in the arc-shaped hole, for installing the detector, and capable of adjusting the angle of the detector along the arc-shaped hole.

[0008] Secondly, this disclosure also provides an X-ray fluorescence spectrometer for spectral detection of materials, wherein the X-ray fluorescence spectrometer includes: a detector adjustment device as described in the first aspect; an optomechanism fixed to the horizontal part for emitting X-rays toward the material; and a detector disposed on the detector adjustment device for receiving X-rays reflected by the material.

[0009] In some embodiments, the X-ray fluorescence spectrometer further includes an optomechanical protective cover disposed on the outside of the optomechanical system to prevent X-ray leakage.

[0010] Thirdly, this disclosure also provides a sorting machine for material sorting, comprising: a frame; a belt conveyor fixedly connected to the frame for conveying the material; an X-ray fluorescence spectrometer as described in the second aspect, wherein the vertical part is fixedly connected to the frame for performing spectral analysis on the material conveyed by the belt conveyor; and a sorting device for sorting the material according to the analysis results of the X-ray fluorescence spectrometer.

[0011] In some embodiments, the sorting machine further includes a lead curtain disposed around the X-ray fluorescence spectrometer to prevent X-ray leakage.

[0012] In some embodiments, the belt conveyor includes: a belt for conveying materials; a plurality of side plates disposed above the belt and clearance-fitted with the upper surface of the belt, with a channel for the materials to pass through formed between two adjacent side plates; and a plurality of horizontal beams fixedly connected to the frame and extending horizontally in a direction perpendicular to the material conveying direction, and provided with a plurality of second elongated holes, wherein the side plates are fixedly disposed on the horizontal beams through the second elongated holes.

[0013] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure.

[0014] This disclosure provides a detector adjustment device, an X-ray fluorescence spectrometer, and a sorting machine. The detector adjustment device, with its vertical section, allows for simultaneous vertical adjustment of the detector and the optomechanism. A U-shaped plate allows for horizontal adjustment of the detector relative to the optomechanism. Supporting side plates allow for detector mounting, enabling multi-dimensional adjustment of the relative position between the detector and the optomechanism target. This detector adjustment device is convenient and highly accurate, meeting the requirements for multi-dimensional data acquisition during experiments. Data analysis allows for the determination of the appropriate fixed position for the detector. Similarly, in material sorting, the detector adjustment device's multi-dimensional adjustment of the detector improves the accuracy of the detector's spectral analysis of the material, facilitating material sorting and increasing sorting output. Attached Figure Description

[0015] This disclosure can be better understood by describing exemplary embodiments of the present disclosure in conjunction with the accompanying drawings, in which:

[0016] Figure 1 is a schematic diagram of a detector adjustment device according to a disclosed exemplary embodiment;

[0017] Figure 2 is a schematic diagram of a detector adjustment device according to another exemplary embodiment disclosed;

[0018] Figure 3 is a schematic diagram of a detector adjustment device according to another exemplary embodiment disclosed;

[0019] Figure 4 is a schematic diagram of a belt conveyor according to a disclosed exemplary embodiment;

[0020] Figure 5 is a schematic diagram of a detector adjustment device according to another exemplary embodiment disclosed;

[0021] Figure 6 is a schematic diagram of a detector adjustment device according to another exemplary embodiment disclosed;

[0022] Figure 7 is a schematic diagram of a detector adjustment device according to another exemplary embodiment disclosed;

[0023] Figure 8 is a schematic diagram of a detector adjustment device according to another disclosed exemplary embodiment. Detailed Implementation

[0024] The following describes specific embodiments of this disclosure. It should be noted that, in order to provide a concise description, this specification cannot exhaustively describe all features of the actual embodiments. It should be understood that, in the actual implementation of any embodiment, just as in any engineering or design project, various specific decisions are often made to achieve the developer's specific goals and to meet system-related or business-related constraints, and this can change from one embodiment to another. Furthermore, it is understood that although the efforts made in this development process may be complex and lengthy, for those skilled in the art related to the content of this disclosure, some design, manufacturing, or production modifications based on the technical content disclosed in this disclosure are merely conventional technical means and should not be construed as insufficient content of this disclosure.

[0025] Unless otherwise defined, the technical or scientific terms used in the claims and description shall have the ordinary meaning understood by one of ordinary skill in the art to which this utility model pertains. The terms "first," "second," and similar words used in the specification and claims of this utility model patent application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. The terms "an" or "a" and similar words do not indicate a quantity limitation, but rather indicate the presence of at least one. The terms "comprising" or "including" and similar words mean that the element or object preceding "comprising" or "including" encompasses the element or object listed following "comprising" or "including" and its equivalents, and do not exclude other elements or objects. The terms "connected" or "linked" and similar words are not limited to physical or mechanical connections, nor are they limited to direct or indirect connections.

[0026] In some scenarios, such as material sorting, sorting machines can be used to separate materials. A sorting machine can include: a frame, a belt conveyor, an X-ray fluorescence spectrometer, and a sorting device. The frame can be positioned on one or both sides of the belt conveyor. The belt conveyor can be fixedly connected to the frame for transporting materials (ore, coal). The X-ray fluorescence spectrometer can be used for spectral analysis of the materials (ore, coal). The sorting device can separate the materials (ore, coal, etc.) based on the analysis results of the X-ray fluorescence spectrometer. The X-ray fluorescence spectrometer can include: a detector and an optomechanical system. The optomechanical system can generate X-rays for non-destructive testing of the materials to be sorted. The detector can be used to detect the signal generated after X-rays penetrate the material, thereby analyzing the internal structure, composition, and density information of the material to be sorted. The detector and optomechanical system can be located on the same side, both above the material to be tested, to receive the X-rays reflected by the material for fluorescence detection. In X-ray fluorescence spectroscopy-based experimental setups, the relative distance between the detector and the optomechanical target often needs frequent adjustment to obtain a suitable position for the detector and optomechanical system, thus yielding better experimental data. However, the poor precision of detector adjustment leads to inaccurate information collected by the detector during the experiment, resulting in unreliable spectral analysis results and reduced material sorting efficiency.

[0027] To overcome the problems existing in the related art, an exemplary embodiment of the present disclosure provides a detector adjustment device 100, as shown in FIG1, FIG2 and FIG5, applied to an X-ray fluorescence spectrometer with a detector 200 and an optomechanical unit 300, wherein the detector adjustment device 100 may include: a horizontal part 110, a vertical part 120, a U-shaped plate 130 and a support side plate 140.

[0028] The horizontal section 110, as shown in Figures 1, 2, 5, 6, 7, and 8, can be used to mount the optomechanical unit 300. The horizontal section 110 can be a plate-like structure, made of high-strength metal materials such as stainless steel to ensure sufficient strength and rigidity to support the detector 200. The surface of the horizontal section 110 can be provided with mounting holes, slots, or bolt connection points that match the detector 200 and the optomechanical unit 300, allowing them to mate with the mounting parts of the detector 200 and the optomechanical unit 300, ensuring the stability and accuracy of the detector 200 and the optomechanical unit 300 after installation. A nylon base can be provided at the mating point between the horizontal section and the detector 200 to prevent damage to the detector 200 and detector head during installation. The horizontal section 110 may be equipped with adjustment components such as lead screws, sliders, and guide rails, or some holes, which can ensure that the detector 200 can be adjusted in the horizontal direction and that the relative positional relationship between the detector 200 and the optomechanical unit 300 can be guaranteed to meet the working requirements of the X-ray fluorescence spectrometer, so as to obtain appropriate experimental data and thus achieve accurate detection and analysis of materials.

[0029] As shown in Figure 5, the vertical part 120 can be disposed at both ends of the horizontal part 110, and the horizontal part 110 can be installed at multiple positions along the vertical direction of the vertical part 120. The vertical part 120 can be a long strip-shaped plate structure, and multiple vertical parts can be disposed evenly at both ends of the horizontal part 110. The vertical part 120 can have a certain height to meet the installation and adjustment of the horizontal part 110 in the vertical direction. The surface of the vertical part 120 can be provided with mounting holes or slots in the vertical direction, allowing the horizontal part 110 to be adjusted and fixed at different height positions. When the horizontal part 110 is adjusted in height, the vertical part 120 plays a positioning and guiding role, ensuring that the horizontal part 110 can only move in the vertical direction and maintains horizontality during movement, thus ensuring the positional accuracy of the detector 200. The top or bottom of the vertical part 120 may be provided with connection structures to other components (such as the frame 170 of the sorting machine), such as welding points or bolt holes, to ensure a firm connection between the vertical part 120 and other components (such as the frame 170 of the sorting machine).

[0030] The U-shaped plate 130, as shown in Figures 1, 2, 6, 7, and 8, can be positioned above the horizontal section 110 and can be installed at multiple locations along the horizontal direction of the horizontal section 110. It can be used to adjust the horizontal position of the detector 200 relative to the optomechanical system 300. The U-shaped plate 130 is generally U-shaped and can be made of a bent metal plate. The U-shaped plate 130 can include two side plates parallel to the horizontal section 110 and an arc-shaped or zigzag-shaped top plate connecting the two side plates. The U-shaped plate 130 can be fixedly positioned above the horizontal section 110. A series of mounting holes or guide rails can be provided on the two side plates of the U-shaped plate 130 along the horizontal direction. The mounting holes can be used to fix the U-shaped plate 130 to different positions on the horizontal part 110 using bolts or other connecting parts, thereby adjusting the detector 200 in the horizontal direction. The guide rail can cooperate with the horizontal part 110 to allow the U-shaped plate 130 to slide smoothly in the horizontal direction, facilitating precise adjustment of the horizontal position of the detector 200 relative to the optomechanical 300. As shown in Figure 8, a screw adjustment structure for fixing the support side plate 140 can be provided on the top plate of the U-shaped plate 130. This can be configured as a second screw 132 and a second nut sleeve 133. The second screw 132 can cooperate with the support side plate 140 to adjust and fix the support side plate 140. When the second nut sleeve 133 rotates, the support side plate 140 can move vertically. This allows the support side plate 140 to move vertically as needed. When adjusted to a suitable position, the support side plate 140 can be fixed to adjust the vertical position of the detector 200 relative to the optomechanical 300, adapting to different working scenarios and installation requirements. On the top plate of the U-shaped plate 130, a structure for mounting the support side plate 140 can be provided, such as a mounting bracket, a slot, or a screw hole, which can fix the support side plate 140 and ensure that the support side plate 140 does not shake or shift during adjustment. Two U-shaped plates 130 can be provided, respectively set on both sides of the detector 200, which can further realize the horizontal adjustment of the detector 200.

[0031] As shown in Figures 1 and 8, the support side plate 140 can be vertically mounted above the U-shaped plate 130 and is used to mount the detector 200. The support side plate 140 is a rectangular plate structure with a certain thickness, and is mounted vertically above the U-shaped plate 130. Multiple mounting holes can be provided on the support side plate 140 for fixing it to the U-shaped plate 130 using bolts, nuts, or other connectors, ensuring a stable connection. The surface of the support side plate 140 can have special fixing structures, such as slots, protrusions, or holes, to precisely fit and fix the detector 200, and also to adjust the tilt angle of the detector 200 relative to the optomechanical unit 300. Through the fixing structures on the surface of the support side plate 140, the detector 200 can be securely mounted on the support side plate 140, placing the detector 200 in a suitable working position. The support side plate 140 can cooperate with the U-shaped plate 130 to position the detector 200. Since the support side plate 140 is mounted on the U-shaped plate 130, and the U-shaped plate 130 can be adjusted horizontally on the horizontal part 110, which can also move vertically, the support side plate 140 can assist in determining the position of the detector 200 in both the horizontal and vertical directions. This enables precise installation and positioning of the detector 200, ensuring accurate relative positional relationship between the detector 200 and the optomechanical unit 300, thus obtaining better experimental data. Two support side plates 140 can be provided, corresponding to two U-shaped plates 130, further ensuring the adjustable angle of the detector 200.

[0032] In this embodiment, the detector adjustment device 100, by providing a vertical section 120, enables the joint vertical adjustment of the detector 200 and the optomechanism 300. The U-shaped plate 130 allows adjustment of the horizontal position of the detector 200 relative to the optomechanism 300. The supporting side plate 140 allows for mounting the detector 200 and adjusting its tilt angle relative to the optomechanism 300. This ensures the detector 200 maintains a stable posture during operation, preventing the detection results from being affected by shaking or vibration, thus improving the reliability and repeatability of the detection data. It allows for multi-dimensional adjustment of the relative position of the detector 200 and the target point of the optomechanism 300. This detector 200 adjustment device is convenient to adjust and has high adjustment accuracy, meeting the requirements for multi-dimensional data acquisition by the detector 200 during experiments. Data analysis can determine a suitable fixed position for the detector 200, reducing measurement errors. Furthermore, the flexible installation positions of the various components of the adjustment device allow for customized configuration and adjustment of the entire detector adjustment device 100 according to the size, shape, and specific installation requirements of different models of optomechanical instruments 300 and detectors 200. This enhances the versatility and compatibility of the X-ray fluorescence spectrometer system, facilitates replacement, and reduces equipment upgrade and maintenance costs. Similarly, during material sorting, the detector adjustment device performs multi-dimensional adjustments to the detector, improving the accuracy of the detector's spectral analysis of materials, which is beneficial for material sorting and can increase the output of material sorting.

[0033] In some embodiments, as shown in FIG5, the vertical portion 120 may be provided with a first elongated oval hole 121, through which a first bolt 122 can pass to fix the horizontal portion 110 to the vertical portion 120. The first elongated oval hole 121 is an elongated oval hole formed on the vertical portion 120, the length of which is generally along the vertical direction. The size and shape of the elongated oval hole need to be set according to the actual bolt size used and the installation requirements of the horizontal portion 110. It can be slightly larger than the diameter of the first bolt 122 to ensure that the bolt can pass through smoothly, while limiting the range of movement of the bolt in the hole. The first elongated oval hole 121 allows the position of the horizontal portion 110 in the vertical direction to be adjusted by the movement of the first bolt 122 in the elongated oval hole. After loosening the nut, the horizontal portion 110 can move up and down along the direction of the elongated oval hole. After adjusting to a suitable position, the nut is tightened to fix it, thereby realizing the joint vertical height adjustment of the detector 200 and the optomechanical system 300. In this embodiment, through the cooperation of the first elongated hole 121 and the first bolt 122, the detector adjustment device 100 can easily adjust the position of the horizontal part 110 on the vertical part 120, thereby enabling the detector 200 to reach a suitable working height in the vertical direction, optimizing the detector 200's reception effect of X-ray fluorescence signals, improving the detection accuracy and precision of the X-ray fluorescence spectrometer, facilitating adjustment, reducing the design and manufacturing costs of the device, making maintenance easier, and improving the accuracy of material analysis, thereby increasing the efficiency of material sorting, improving the accuracy of material sorting and increasing the output.

[0034] In some embodiments, as shown in Figures 1, 2, 6, 7 and 8, the detector adjustment device 100 may further include: a base plate 150 and a second bolt 152.

[0035] As shown in Figures 1, 2, 6, 7, and 8, the base plate 150 can be fixedly installed above the horizontal section 110 and below the U-shaped plate 130. The base plate 150 can have a row of first holes 151, and these first holes 151 can be equidistantly arranged. The U-shaped plate 130 can have a row of second holes 131 corresponding to the first holes 151, and these second holes 131 can be equidistantly arranged. The distance between two adjacent first holes 151 can be greater than or less than the distance between two adjacent second holes 131. A second bolt 152 passes through one of the first holes 151 and one of the second holes 131, fixing the U-shaped plate 130 to the base plate 150. The base plate 150 can be a rectangular plate structure, fixedly installed above the horizontal section 110 and below the U-shaped plate 130. A row of equidistant first holes 151 is provided on the base plate 150. The size and shape of the first holes 151 are designed according to the size of the second bolts 152, and are usually circular, but can be slightly larger than the diameter of the second bolts 152 so that the second bolts 152 can pass through smoothly. A row of equidistant second holes 131, corresponding to the first holes 151, can be provided on the surface of the Z-shaped plate 130 opposite to the base plate 150. The size and shape of the second holes 131 also match the second bolts 152. The spacing between two adjacent first holes 151 can be different from the spacing between two adjacent second holes 131, and can be greater or less than the spacing between two adjacent second holes 131, which can increase the flexibility of adjustment. The second bolts 152 are used to connect the base plate 150 and the Z-shaped plate 130. Their length must be sufficient to pass through the first holes 151 and the second holes 131, and a fixed connection is achieved by tightening with nuts. Because the first hole 151 and the second hole 131 are equidistant and the spacing between adjacent holes differs, after loosening the second bolt 152, the Z-shaped plate 130 can move horizontally relative to the base plate 150. By selecting different hole positions for fixing, the position of the Z-shaped plate 130 can be precisely adjusted, thereby adjusting the horizontal position of the detector relative to the optomechanical system to meet different detection requirements. The holes on the base plate 150 and the Z-shaped plate 130 are arranged at equal intervals, which facilitates manufacturing and installation positioning, and also provides a standardized position reference for precise adjustment, making the adjustment process more standardized and accurate. The different spacing between adjacent first holes 151 and second holes 131 increases the fineness and flexibility of adjustment. The position of the Z-shaped plate 130 can be adjusted with different spacing accuracies according to actual needs, thereby more accurately controlling the horizontal position of the detector.

[0036] In some embodiments, as shown in Figures 1, 2, 6, 7, and 8, two sets of first holes 151 can be respectively provided at the positions where the bottom plate 150 connects to the Z-shaped plate 130. Scales can be marked on both sides of the first holes 151 for easy adjustment. The first holes 151 at the left end are numbered n1, n2, n3 to n10 from left to right, and the first holes 151 at the right end are numbered n1, n2, n3 to n10 from left to right. The spacing between the first holes 151 is equal and can be a1. Second holes 131 are also correspondingly provided on the two side plates of the Z-shaped plate 130. Scales can be marked on both sides of the second holes 131 for easy adjustment. The second holes 131 at the left end are numbered m1, m2 to m5 from left to right; the second holes 131 at the right end are numbered m1, m2 to m5 from left to right. The spacing between the second holes 131 is equal and can be a2. The base plate 150 can have 10 first holes 151, and the zig-shaped plate 130 can have 5 second holes 131, where a1 > a2, and the difference between a1 and a2 can be 2mm. When higher assembly precision is required, the difference between a1 and a2 can be smaller. If the assembly precision is changed, the number of holes on the base plate 150 and the zig-shaped plate 130 can be adjusted accordingly. Since there is a difference in the distance between a1 and a2, and the first hole 151 and the second hole 131 are "misaligned," when the first hole 151 and the second hole 131 on the base plate 150 and the zig-shaped plate 130 are aligned, when adjusting the zig-shaped plate 130, the next hole position can be aligned by adjusting the multiple of the difference in the distance between a1 and a2. In this way, the distance between the center point of the detector 200 and the target point of the optomechanical 300 will also change, and the changed distance will be a multiple of 2mm. When the m4 hole at the left end of the Z-shaped plate 130 is aligned with the n9 hole at the left end of the base plate 150, the opening is designed to align the m9 hole at the right end of the Z-shaped plate 130 with the n9 hole at the right end of the base plate 150. At this time, the distance between the detector 200 and the target point of the optomechanical 300 is H. If, during the experiment, it is necessary to make the distance between the telescopic device at the center point of the detector 200 and the target point of the optomechanical 300 H+2mm, loosen the second bolt 152 and move the detector 200 2mm to the left. At this time, the m3 hole at the left end of the Z-shaped plate 130 is aligned with the n8 hole at the left end of the base plate 150, and the right end m... Align the detector 200 with the n8 hole; tighten the second bolt 152 to secure it; similarly, if it is necessary to extend the distance between the center point telescopic device of the detector 200 and the target point of the optomechanical 300 by H+4mm, loosen the second bolt 152, move the detector 2mm to the left, at which point the m2 hole at the left end of the Z-shaped plate 130 is aligned with the n7 hole at the left end of the base plate 150, and the m2 hole at the right end is aligned with the n7 hole; if it is necessary to make the distance between the center point telescopic device of the detector 200 and the target point of the optomechanical 300 H-2mm, the detector 200 needs to be moved 2mm to the right, and so on.For different materials, the distance H between the detector 200 and the target point of the optomechanical system 300 can be adjusted in multiple dimensions, including angle, vertical, and horizontal, to conduct experiments. A suitable test position can be obtained for each material, providing an effective reference for subsequent design.

[0037] In this embodiment, the detector 200 can be precisely adjusted horizontally by the holes in the base plate 150 and the U-shaped plate 130, and by the connection of the second bolt 152. This allows the detector 200 to be accurately aligned with the rays emitted by the optomechanical system 300. For different materials, the distance between the detector 200 and the target plane of the optomechanical system 300 can be adjusted in multiple dimensions for testing. Each material can be tested at a suitable location, providing a valuable reference for subsequent design and improving the detection sensitivity and accuracy of the X-ray fluorescence spectrometer. The ease of adjustment reduces the design and manufacturing costs of the device, facilitates maintenance, and improves the accuracy of material analysis, thereby increasing material sorting efficiency, accuracy, and yield.

[0038] In some embodiments, the detector adjustment device 100 may further include: a first lead screw (not shown in the figure) and a first nut sleeve (not shown in the figure); a second lead screw 132 and a second nut sleeve 133.

[0039] A first lead screw can be fixedly mounted above the horizontal section 110, positioned horizontally. A first nut sleeve can be fitted onto the first lead screw, with its outer side abutting against the vertical edge of the Z-shaped plate 130, used to adjust the horizontal position of the detector 200 relative to the optomechanical system. The first lead screw can be a cylindrical, slender rod-like structure with helical threads on its surface. The first lead screw can be fixedly mounted above the horizontal section 110 in a horizontal direction. The first nut sleeve can be sleeve-shaped, with threads on its inner surface matching the threads of the first lead screw, and can be fitted onto the first lead screw. By rotating the first nut sleeve, the Z-shaped plate 130 can be moved horizontally, thereby enabling precise horizontal position adjustment of the detector 200, achieving fine-tuning of the horizontal position of the detector 200 relative to the optomechanical system 300 to meet the positional accuracy requirements of the X-ray fluorescence spectrometer for the detector 200. In this embodiment, the threaded engagement of the first lead screw and the first nut sleeve enables high-precision linear motion transmission. Compared to other adjustment methods, such as relying solely on orifice position adjustment, the first lead screw drive can achieve more precise and continuous position adjustment, enabling the detector position to be accurate to a smaller unit of size. This is beneficial for improving the detection accuracy of the spectrometer, facilitating adjustment, reducing the design and manufacturing costs of the device, simplifying maintenance, and improving the accuracy of material analysis. It can also improve the efficiency of material sorting, thereby increasing the accuracy and output of material sorting.

[0040] As shown in Figure 8, the second lead screw 132 can be fixedly installed above the U-shaped plate 130 and can be vertically installed; and the second nut sleeve 133 can be sleeved on the second lead screw 132, and the outer side of the second nut sleeve 133 can be connected to the support side plate 140 for adjusting the vertical position of the detector 200 relative to the optomechanical 300. The top plate of the U-shaped plate 130 can be provided with a lead screw adjustment structure for fixing the support side plate 140, which can consist of two second lead screws 132 and two second nut sleeves 133, with the second lead screws 132 and the second nut sleeves 133 being correspondingly arranged. The second lead screw 132 can cooperate with the support side plate 140 to achieve adjustment and fixation of the support side plate 140. The second lead screw 132 can be vertically installed on the top plate of the U-shaped plate 130 and can be connected to the support side plate 140. When the second nut sleeve 133 is rotated, the support side plate 140 can move vertically up and down. The support side plate 140 can be moved vertically as needed. Once adjusted to a suitable position, the support side plate 140 can be fixed to achieve the vertical position of the detector 200 relative to the optomechanical system 300, adapting to different working scenarios and installation requirements. In this embodiment, by setting the second lead screw 132 and the second nut sleeve 133, the detector 200 can be moved up and down to adjust its vertical position relative to the optomechanical system 300. This allows for finer and more continuous position adjustments, enabling the detector's position to be accurate to a smaller unit, which improves the spectrometer's detection accuracy, facilitates adjustment, reduces the design and manufacturing costs of the device, facilitates maintenance, and enhances the accuracy of material analysis, thereby increasing material sorting efficiency, accuracy, and output.

[0041] In some embodiments, as shown in Figures 1 and 8, an arc-shaped hole 141 may be provided on the support side plate 140; the detector adjustment device 100 further includes a detector support base 160, installed in the arc-shaped hole 141, which can be used to install the detector 200 and can adjust the angle of the detector 200 along the arc-shaped hole 141. The support side plate 140 can be a vertically arranged plate structure for installing the detector 200. An arc-shaped hole 141 may be provided on the support side plate 140. There may be one or more arc-shaped holes 141, which are concentrically arranged. The center and radius of the arc-shaped hole 141 can be set according to the adjustable angle range of the detector 200. The detector support 160 is adapted to the detector 200 for fixing the detector. It can mate with the arc-shaped hole 141, and the angle of the detector 200 can be adjusted by moving within the arc-shaped hole 141. It may be connected to the arc-shaped hole 141 via bolts, nuts, or other connecting parts, allowing the detector 200 to be stably mounted on the support side plate 140. The detector support 160 is mounted on the arc-shaped hole 141 and can move along the arc-shaped hole 141, thereby changing the angle of the detector 200. The relative angles between the detector 200, the optomechanical unit 300, and the object being measured can be flexibly adjusted according to actual detection needs to obtain suitable detection results. For example, when detecting objects of different shapes or materials, adjusting the angle of the detector 200 can allow the detector 200 to better receive X-ray fluorescence signals, improving detection accuracy.

[0042] In some embodiments, as shown in Figures 7 and 8, the test requires the plane of the detector 200 to have an angle between 30 and 60 degrees, the distance between the center point telescopic device of the detector 200 and the plane of the target point of the optomechanical 300 to be 50-100 mm, and the left-right movement accuracy of the detector 200 to be 2 mm. The test steps can be as follows: First, 10 first holes 151 are opened on each end of the base plate 150. The distance between the first holes 151 is 10 mm. The first holes 151 are marked with scales. There are 10 scales evenly marked between two first holes 151, and the distance between each scale is 1 mm. Numbers are marked next to the scales. The first hole 151 on the left end is marked from left to right as 130, 120, ... The first hole 151 on the right end is marked from left to right as 130, 120, 110 to 50, 40; The second step involves five second holes 131 at each end of the Z-shaped plate 130, with an 8mm distance between them. Graduations are marked between the second holes 131, with ten evenly spaced graduations between each pair of holes, each 0.8mm apart. Numbers are marked next to the graduations. The second holes 131 on the left end are marked from left to right as 24, 16, 8, 0, 8, and the second holes 131 on the right end are also marked from left to right as 24, 16, 8, 0, 8; The third step involves two sets of arc-shaped holes 141 on the supporting side plate 140, with angle markings next to each arc-shaped hole 141. The degrees are marked from bottom left to top right as 25, 30, 35 to 60, 65 respectively; Fourth step, if the angle of detector 200 needs to be adjusted during use, loosen the bolts fixing detector 200, adjust detector 200 to the appropriate angle, and then tighten the bolts to fix detector 200; Fifth step, if the distance between the center point of detector 200 and the plane where the target point of optomechanical 300 is located needs to be adjusted during use, the relative distance between the Z-shaped plate 130 and the base plate 150 can be adjusted. For example, when the angle between detector 200 and the vertical plane is 60°, in order for the detector to receive signals normally, the distance between the center point of detector 200 and the plane where the target point of optomechanical 300 is located needs to be relatively small, such as 50. At this point, the 0 mark on the Z-shaped plate 130 is aligned with the 50 mark on the base plate 150. As the angle between the detector 200 and the vertical plane gradually decreases, the distance between the center point of the detector 200 and the target point of the optomechanical 300 needs to be increased. For example, if the detector 200 is adjusted to a certain angle, the distance between the center point of the detector 200 and the target point of the optomechanical 300 needs to be adjusted to 60mm (because the adjustment accuracy is 2mm, the adjustment distance must be an even number such as 50, 52, 54, 58, etc.). At this time, it is only necessary to adjust the 0 mark on the Z-shaped plate 130 to align with the 60 mark on the base plate 150. Based on the hole misalignment principle, the Z-shaped plate 130 and the base plate 150 automatically align the hole positions. When the distance between the center point of the detector 200 and the target point of the optomechanical 300 decreases, the Z-shaped plate 130 can be adjusted in the opposite direction.

[0043] In this embodiment, by providing an arc-shaped hole 141 on the support side plate 140, the tilt angle of the detector 200 relative to the optomechanical system 300 can be adjusted. This allows the detector 200 to be better aligned with the X-rays emitted by the optomechanical system 300 and the fluorescence signal emitted by the object under test, reducing signal loss and interference, thereby improving the sensitivity and accuracy of detection. For example, when detecting samples with complex shapes or special structures, adjusting the angle of the detector 200 allows the detector to receive more effective signals, improving the accuracy of sample composition and structure analysis. This also facilitates subsequent material sorting, improving sorting efficiency, accuracy, and yield.

[0044] Based on the same inventive concept, an exemplary embodiment of this disclosure also provides an X-ray fluorescence spectrometer for spectral detection of materials, wherein, as shown in Figures 1, 2, 3, 6, 7 and 8, the X-ray fluorescence spectrometer may include: a detector adjustment device 100, an optomechanical unit 300 and a detector 200 as in any of the foregoing embodiments.

[0045] The detector adjustment device 100, as shown in Figures 1, 2, 3, 6, 7 and 8, can be used to fix the detector 200 and adjust the position of the detector 200 relative to the optomechanical 300.

[0046] The optomechanical unit 300, as shown in Figures 1, 2, 3, 6, 7, and 8, can generate X-rays for non-destructive testing of the materials to be sorted. The detector 200 can be used to detect the signal generated after the X-rays penetrate the material, thereby analyzing the internal structure, composition, and density information of the material to be sorted.

[0047] Detector 200, as shown in Figures 1, 2, 3, 6, 7, and 8, can be mounted on detector adjustment device 100 and can be used to receive X-rays reflected from materials. Detector 200 can be mounted on the same side as optomechanical unit 300, which simplifies the optical path, reduces reflection and scattering, and reduces interference from sorted materials or the surrounding environment on X-rays and detection signals, thereby improving detection efficiency and accuracy. Furthermore, mounting detector 200 and optomechanical unit 300 on the same side reduces space occupancy and helps improve space utilization.

[0048] In this embodiment, the detector adjustment device 100 can adjust the detector 200 vertically by providing a vertical part 120, adjust the horizontal position of the detector 200 relative to the optomechanical system 300 by providing a U-shaped plate 130, and install the detector 200 and adjust its tilt angle relative to the optomechanical system 300 by providing a supporting side plate 140. This ensures that the detector 200 maintains a stable posture during operation, avoiding the influence of shaking, vibration, and other factors on the detection results, thus improving the reliability and repeatability of the detection data. It allows for multi-dimensional adjustment of the relative position of the detector 200 and the target point of the optomechanical system 300. This detector 200 adjustment device is convenient to adjust and has high adjustment accuracy, which can meet the multi-dimensional data acquisition requirements of the detector 200 during the experiment. Through data analysis, a suitable fixed position for the detector 200 can be determined, reducing measurement errors. Furthermore, the flexible installation positions of the various components of the adjustment device allow for customized configuration and adjustment of the entire detector adjustment device 100 according to the size, shape, and specific installation requirements of different models of optomechanical instruments 300 and detectors 200. This enhances the versatility and compatibility of the X-ray fluorescence spectrometer system, facilitates replacement, and reduces equipment upgrade and maintenance costs. Similarly, during material sorting, the detector adjustment device performs multi-dimensional adjustments to the detector, improving the accuracy of the detector's spectral analysis of materials, which is beneficial for material sorting and can increase the output of material sorting.

[0049] In some embodiments, as shown in Figures 1 and 8, the X-ray fluorescence spectrometer may further include an optomechanical protective cover 310, which can be disposed outside the optomechanical unit 300 to prevent X-ray leakage. The optomechanical protective cover 310 can be a dome-shaped structure disposed outside the optomechanical unit 300. Its shape and size are adapted to the optomechanical unit 300, completely covering it and providing protection and isolation. A lead layer can be disposed at the fixed bottom of the optomechanical unit 300 and inside the optomechanical protective cover 310, providing good X-ray blocking capability. In this embodiment, by providing an optomechanical protective cover 310 outside the optomechanical unit 300, X-ray leakage can be effectively prevented, protecting the safety and health of operators and surrounding personnel.

[0050] Based on the same inventive concept, an exemplary embodiment of this disclosure also provides a sorting machine for material sorting, as shown in Figures 3, 4, and 5, which may include: a frame 170, a belt conveyor 400, an X-ray fluorescence spectrometer and a sorting device as implemented in any of the foregoing embodiments.

[0051] The frame 170, as shown in Figure 5, can be fixedly connected to the X-ray fluorescence spectrometer or to the belt conveyor 400, providing a certain supporting function.

[0052] As shown in Figure 4, the belt conveyor 400 can be used to transport materials. The belt conveyor 400 can be a conveyor belt, etc., and materials can be placed on it and transported to the X-ray fluorescence spectrometer. The feed inlet 410 of the belt conveyor 400 can be a tubular structure, and a fixed support frame 420 can be provided at the lower end of the feed inlet 410. The fixed support frame 420 can be fixedly connected to the frame 170 or integrally formed. When an experiment is required, the conveyor belt can be started, and materials can be put into the feed inlet 410. The materials move smoothly on the belt towards the X-ray fluorescence spectrometer, and then the experimental data can be obtained.

[0053] An X-ray fluorescence spectrometer, with its vertical section 120 fixedly connected to the frame 170, can be used to perform spectral analysis on materials conveyed by the belt conveyor 400. The detector adjustment device 100 in the X-ray fluorescence spectrometer can be installed on the vertical section 120, which can be fixedly connected to the frame 170. The X-ray fluorescence spectrometer may include: an optomechanical unit 300, which generates X-rays for non-destructive testing of the material to be sorted; and a detector 200, which detects the signal generated after X-rays penetrate the material, thereby analyzing the internal structure, composition, and density information of the material to be sorted. The detector 200 can be mounted on the detector adjustment device 100 and can receive X-rays reflected from the material. The detector 200 can be positioned on the same side as the optomechanical unit 300, which simplifies the optical path, reduces reflection and scattering, and reduces interference from the material to be sorted or the surrounding environment on the X-rays and detection signal, thereby improving the efficiency and accuracy of the detection. Furthermore, placing the detector 200 and the optomechanical unit 300 on the same side can reduce space occupation and help improve space utilization.

[0054] The sorting device is used to sort materials based on the analysis results of an X-ray fluorescence spectrometer. The sorting device can be installed downstream of the belt conveyor 400. It can separate materials according to their category, thus separating different types of materials.

[0055] In this embodiment, the detector adjustment device 100 in the X-ray fluorescence spectrometer can achieve vertical adjustment of the detector 200 by setting a vertical part 120, adjust the horizontal position of the detector 200 relative to the optomechanical unit 300 by setting a U-shaped plate 130, and install the detector 200 and adjust the tilt angle of the detector 200 relative to the optomechanical unit 300 by setting a supporting side plate 140. This ensures that the detector 200 maintains a stable posture during operation, avoiding the influence of shaking, vibration, and other factors on the detection results, thus improving the reliability and repeatability of the detection data. It allows for multi-dimensional adjustment of the relative position of the detector 200 and the target point of the optomechanical unit 300. This detector 200 adjustment device is convenient to adjust and has high adjustment accuracy, which can meet the multi-dimensional data acquisition requirements of the detector 200 during the experiment. Through data analysis, a suitable fixed position for the detector 200 can be determined, reducing measurement errors. Furthermore, the flexible installation positions of the various components of the adjustment device allow for customized configuration and adjustment of the entire detector adjustment device 100 according to the size, shape, and specific installation requirements of different models of optomechanical instruments 300 and detectors 200. This enhances the versatility and compatibility of the X-ray fluorescence spectrometer system, facilitates replacement, and reduces equipment upgrade and maintenance costs. Similarly, during material sorting, the detector adjustment device performs multi-dimensional adjustments to the detector, improving the accuracy of the detector's spectral analysis of materials, which is beneficial for material sorting and can increase the output of material sorting.

[0056] In some embodiments, as shown in FIG8, the sorting machine may further include a lead curtain 180, which can be disposed around the X-ray fluorescence spectrometer to prevent X-ray leakage. The lead curtain 180 may be a soft curtain-like structure made of multiple layers of lead plates or lead-containing composite materials. It has a certain width and length and can be disposed around the periphery of the X-ray fluorescence spectrometer, possibly by means of suspension, fixing, etc., to form a relatively closed protective area. It can prevent X-rays from leaking from the periphery of the X-ray fluorescence spectrometer. When the optomechanic generates X-rays, the lead curtain can block the X-rays from scattering into the surrounding environment, reduce the radiation of rays into the surrounding space, and protect the operators and surrounding personnel from unnecessary X-ray exposure. In this embodiment of the present disclosure, by disposing of the lead curtain 180 around the X-ray fluorescence spectrometer, it can cooperate with other protective structures such as the optomechanic protective cover 310 to further enhance the blocking effect of X-rays, reduce the possibility of radiation leakage, and provide more comprehensive radiation safety protection for operators and the surrounding environment.

[0057] In some embodiments, as shown in FIG4, the belt conveyor 400 may include: a belt 430, a plurality of side plates 440 and a plurality of horizontal beams 450.

[0058] As shown in Figure 4, belt 430 can be used to convey materials. Belt 430 can be a ring-shaped belt structure, which can be made of rubber, plastic or other materials with certain flexibility and wear resistance. It can be fitted on drive drum and idler drum, and the material is conveyed by the rotation of the drum.

[0059] Multiple side plates 440, as shown in Figure 4, can be disposed above the belt 430 and can be clearance-fitted with the upper surface of the belt 430. A channel for material passage can be formed between two adjacent side plates 440. The multiple side plates 440 can be long strip plate-like structures, which can be located above the belt 430, form a clearance fit with the upper surface of the belt 430, and are arranged parallel to each other. A material channel can be formed between adjacent side plates 440.

[0060] As shown in Figure 4, multiple horizontal beams 450 can be fixedly connected to the frame 170 and extend horizontally in a direction perpendicular to the material conveying direction. Multiple second elongated holes 451 can be provided on each beam, and side plates 440 can be fixedly mounted to the horizontal beams 450 through these holes. The horizontal beams 450 can be transverse strip structures, fixedly connected to the frame 170, or integrally formed with the frame 170, extending horizontally in a direction perpendicular to the material conveying direction. Multiple second elongated holes 451 can be provided on the horizontal beams 450 for fixing the side plates 440. The side plates 440 can be connected to the horizontal beams 450 through the second elongated holes 451. The width of the material passage is adjustable, allowing the position of the side plates 440 to be adjusted according to the shape, size, and conveying requirements of the material, increasing the flexibility and adaptability of the device.

[0061] In this embodiment of the present disclosure, by providing multiple second elongated holes 451 on the horizontal beam 450, the side plate 440 can adjust the width of the material channel according to the shape and size of the material, thereby increasing the flexibility of material transportation. This facilitates subsequent analysis and detection of the material by the X-ray fluorescence spectrometer, improves the accuracy of the material spectral analysis by the detector 200, and is beneficial for material sorting, thereby increasing the output of material sorting.

[0062] This application uses specific terms to describe embodiments of the application. Terms such as "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic associated with at least one embodiment of the application. Therefore, it should be emphasized and noted that references to "an embodiment," "one embodiment," or "an alternative embodiment" in different locations throughout this specification do not necessarily refer to the same embodiment. Furthermore, certain features, structures, or characteristics in one or more embodiments of the application can be appropriately combined.

[0063] In the context of this application, unless the context clearly indicates otherwise, the words "a," "an," "an," and / or "the" do not specifically refer to the singular and may also include the plural. Generally speaking, the terms "comprising" and "including" only indicate the inclusion of explicitly identified steps and elements, which do not constitute an exclusive list, and the method or apparatus may also include other steps or elements.

[0064] Similarly, it should be noted that, in order to simplify the description of the present application and thus aid in the understanding of one or more embodiments, the foregoing description of the embodiments of the present application sometimes combines multiple features into a single embodiment, drawing, or description thereof. However, this disclosure method does not imply that the subject matter of the present application requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of the single embodiments disclosed above.

[0065] The basic concepts have been described above. Obviously, for those skilled in the art, the above disclosure is merely illustrative and does not constitute a limitation of this application. Although not explicitly stated herein, those skilled in the art may make various modifications, improvements, and corrections to this application. Such modifications, improvements, and corrections are suggested in this application, and therefore remain within the spirit and scope of the embodiments of this application.

Claims

1. A detector adjustment device, applied to an X-ray fluorescence spectrometer equipped with a detector and an optomechanic, wherein, The detector adjustment device includes: a horizontal section for mounting the optomechanic; a vertical section disposed at both ends of the horizontal section, the horizontal section being able to be mounted at multiple positions along the vertical direction of the vertical section; a U-shaped plate disposed above the horizontal section, which can be mounted at multiple positions along the horizontal direction of the horizontal section for adjusting the horizontal position of the detector relative to the optomechanic; and a support side plate vertically disposed above the U-shaped plate for mounting the detector.

2. The detector adjustment device according to claim 1, wherein, The vertical part is provided with a first elongated hole, and a first bolt passes through the first elongated hole to fix the horizontal part to the vertical part.

3. The detector adjustment device according to claim 1, wherein, The detector adjustment device further includes: a base plate, fixedly disposed above the horizontal part and correspondingly disposed below the U-shaped plate; the base plate has a row of first holes, and the plurality of first holes are equidistantly arranged; the U-shaped plate has a row of second holes corresponding to the first holes, and the plurality of second holes are equidistantly arranged, wherein the distance between two adjacent first holes is greater than or less than the distance between two adjacent second holes; and a second bolt, which passes through one of the first holes and one of the second holes to fix the U-shaped plate to the base plate.

4. The detector adjustment device according to claim 1, wherein, The detector adjustment device further includes: a first lead screw, fixedly disposed above the horizontal part and arranged horizontally; and a first nut sleeve, sleeved on the first lead screw, the outer side of the first nut sleeve abutting against the vertical edge of the U-shaped plate, for adjusting the horizontal position of the detector relative to the optical engine; or, a second lead screw, fixedly disposed above the U-shaped plate and arranged vertically; and a second nut sleeve, sleeved on the second lead screw, the outer side of the second nut sleeve connected to the support side plate, for adjusting the vertical position of the detector relative to the optical engine.

5. The detector adjustment device according to claim 1, wherein, The support side plate is provided with an arc-shaped hole; The detector adjustment device further includes: a detector support base, installed in the arc-shaped hole, for mounting the detector, and capable of adjusting the angle of the detector along the arc-shaped hole.

6. An X-ray fluorescence spectrometer for spectral detection of materials, wherein, The X-ray fluorescence spectrometer includes: a detector adjustment device as described in any one of claims 1-5; an optomechanism fixed to the horizontal part for emitting X-rays toward the material; and a detector disposed on the detector adjustment device for receiving X-rays reflected by the material.

7. The X-ray fluorescence spectrometer according to claim 6, wherein, The X-ray fluorescence spectrometer also includes an optomechanical protective cover, which is located on the outside of the optomechanical system to prevent X-ray leakage.

8. A sorting machine for sorting materials, comprising: frame; A belt conveyor, fixedly connected to the frame, is used to transport the material; The X-ray fluorescence spectrometer as described in claim 6 or 7, wherein the vertical part is fixedly connected to the frame and is used to perform spectral analysis on the material conveyed by the belt conveyor; and the sorting device is used to sort the material according to the analysis results of the X-ray fluorescence spectrometer.

9. The sorting machine according to claim 8, wherein, The sorting machine also includes a lead curtain, which is placed around the X-ray fluorescence spectrometer to prevent X-ray leakage.

10. The sorting machine according to claim 8, wherein, The belt conveyor includes: a belt for conveying materials; multiple side plates disposed above the belt and clearance-fitted with the upper surface of the belt, with a channel for the material to pass through formed between two adjacent side plates; and multiple horizontal beams fixedly connected to the frame and extending horizontally in a direction perpendicular to the material conveying direction, each beam having multiple second elongated holes, the side plates being fixedly disposed on the horizontal beams through the second elongated holes.

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