Thin film electrostatic performance detection device

Abstract

The utility model relates to the technical field of diaphragm performance detection devices, in particular to a thin film electrostatic performance detection device which comprises a bottom plate, a support is fixedly installed on the bottom plate, an adjusting mechanism is arranged on the support, an induction frame is installed on the support through the adjusting mechanism, and the adjusting mechanism is used for adjusting the position of the induction frame. An induction electrode is fixedly installed in the induction frame, and a protection ring is fixedly installed in the induction frame. Through the arrangement of the induction frame, the induction electrode, the protection ring and the adjusting structure, the distance between the induction electrode and the diaphragm can be rapidly adjusted, the adjusting mode is divided into coarse adjustment and fine adjustment, the adjusting speed is higher, the adjusting precision is higher, and therefore the static performance of a thin film can be conveniently detected in a non-contact mode.

Description

Technical Field

[0001] This utility model relates to the technical field of diaphragm performance testing devices, specifically a thin film electrostatic performance testing device. Background Technology

[0002] Electrostatic property testing of metallized thin film surfaces typically involves assessing their surface resistivity, static charge accumulation, and dissipation capabilities. Surface resistivity testing usually involves connecting the thin film in series with an ammeter, inputting the rated voltage, and then directly reading the current from the ammeter. The resistance is then calculated using the measured current and the rated voltage.

[0003] However, this method of testing can easily lead to excessive current in the circuit when the metallized thin film is short-circuited, causing the film to burn out and posing a safety hazard. Therefore, we propose a thin film electrostatic performance testing device. Utility Model Content

[0004] The purpose of this invention is to provide a thin film electrostatic performance testing device, which solves the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] A thin film electrostatic performance testing device includes a base plate, a bracket fixedly mounted on the base plate, an adjustment mechanism provided on the bracket, a sensing frame mounted on the bracket through the adjustment mechanism, the adjustment mechanism being used to adjust the position of the sensing frame, a sensing electrode fixedly mounted inside the sensing frame, and a protective ring fixedly mounted inside the sensing frame.

[0007] Preferably, the adjustment mechanism includes a coarse adjustment groove, which is located at the top of the bracket. A coarse adjustment rod is slidably installed in the coarse adjustment groove, and multiple slots are provided through the coarse adjustment rod. A locking rod is slidably installed on the bracket.

[0008] Preferably, a fine adjustment frame is fixedly installed at the bottom end of the coarse adjustment rod, a fine adjustment groove is provided in the fine adjustment frame, an adjustment plate is slidably installed in the fine adjustment groove, a fine adjustment screw is rotatably installed at the top end of the adjustment plate, a fine adjustment knob is fixedly installed at the top end of the fine adjustment screw, and the fine adjustment screw and the coarse adjustment rod are threaded together.

[0009] Preferably, the protective ring is sleeved on the surface of the sensing electrode, and the protective ring is made of insulating material.

[0010] Preferably, the fine adjustment groove is slidably connected to the sensing frame, and multiple buffer springs are installed between the sensing frame and the adjustment plate.

[0011] Preferably, the plurality of card slots are arranged in an array, and the card slots are adapted to the card rods.

[0012] Preferably, a scale rod is rotatably mounted at the top of the surface of the fine-adjustment screw, and a scale ring is fixedly mounted at the top of the surface of the coarse-adjustment screw, with the scale rod and the scale ring being slidably connected.

[0013] By employing the above technical solution, this utility model provides a thin film electrostatic performance testing device that has at least the following beneficial effects:

[0014] This invention, by setting up an induction frame, induction electrodes, a protective ring, and an adjustment structure, can quickly adjust the distance between the induction electrodes and the diaphragm. The adjustment method is divided into coarse adjustment and fine adjustment, which makes the adjustment speed faster and more accurate. This facilitates the detection of the electrostatic properties of the film in a non-contact manner, which can avoid the safety hazards caused by short circuits due to contact and also avoid scratching or contaminating the film surface. Attached Figure Description

[0015] The accompanying drawings, which are included to provide a further understanding of the present invention, form part of this application:

[0016] Figure 1 This is a schematic diagram of the structure of this utility model;

[0017] Figure 2 This is a schematic diagram of the induction frame structure of this utility model;

[0018] Figure 3 This is a schematic diagram of the disassembled structure of this utility model;

[0019] Figure 4 This is a partial cross-sectional structural diagram of the present invention.

[0020] In the diagram: 1. Base plate; 2. Support; 3. Induction frame; 4. Induction electrode; 5. Protective ring; 6. Adjustment mechanism; 61. Coarse adjustment slot; 62. Coarse adjustment rod; 63. Slot; 64. Locking rod; 65. Fine adjustment frame; 66. Fine adjustment knob; 67. Fine adjustment screw; 68. Fine adjustment slot; 69. Adjustment plate; 610. Buffer spring; 611. Scale rod; 612. Scale ring. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Please see Figures 1-4 A thin film electrostatic performance testing device includes a base plate 1 for placing the thin film to be tested. A bracket 2 is fixedly installed on the base plate 1. A sensor frame 3 is installed on the bracket 2 through an adjustment mechanism 6. The adjustment mechanism 6 is used to adjust the position of the sensor frame 3 from the thin film and includes two modes: coarse adjustment and fine adjustment, which can quickly and accurately adjust the position of the sensor frame 3.

[0023] Please see Figure 2 A sensing electrode 4 is fixedly installed inside the sensing frame 3. When the sensing electrode 4 maintains a small distance from the film surface, preferably 0.1 mm to 1 mm, a capacitor is formed. When the film is charged, the sensing electrode 4 senses the change in charge through capacitive coupling and converts it into a voltage signal. This allows for the detection of the electrostatic properties of the film without contact with it. A protective ring 5 is fixedly installed inside the sensing frame 3. The protective ring 5 is sleeved around the sensing electrode 4 and is made of insulating material, which can eliminate interference from the electric field at the edge of the sensing electrode 4 and improve the accuracy of the detection.

[0024] Please see Figures 3-4 The adjustment mechanism 6 includes a coarse adjustment groove 61 located at the top of the bracket 2. A coarse adjustment rod 62 is slidably mounted within the groove 61. Multiple slots 63 are located on both sides of the rod 62, arranged in an array. Preferably, the spacing between adjacent slots 63 is 1 mm, allowing for quick and accurate adjustment of the rod 62's position. A locking rod 64 is slidably mounted within each slot 63, and is slidably connected to the bracket 2. The locking rod 64 engages within the slot 63 to quickly and accurately fix the coarse adjustment rod 62.

[0025] A fine adjustment frame 65 is fixedly installed at the bottom of the coarse adjustment rod 62. A fine adjustment groove 68 is opened in the fine adjustment frame 65. The fine adjustment groove 68 is slidably connected to the induction frame 3. An adjustment plate 69 is also slidably installed in the fine adjustment groove 68. The adjustment plate 69 and the induction frame 3 are connected by multiple buffer springs 610. The buffer springs 610 can provide a certain elastic movement space for the induction frame 3, so as to avoid the induction frame 3 from making hard contact with the base plate 1 or the diaphragm when the height of the induction frame 3 is manually adjusted, which would cause damage to the induction electrode 4 inside the induction frame 3 or damage to the membrane.

[0026] A fine-tuning screw 67 is rotatably mounted on the top of the adjusting plate 69. The fine-tuning screw 67 and the coarse-tuning rod 62 are threaded together. A fine-tuning knob 66 ​​is fixedly mounted on the top of the fine-tuning screw 67. A scale rod 611 is rotatably mounted on the surface of the fine-tuning screw 67 near the top. A scale ring 612 is fixedly mounted on the surface of the coarse-tuning rod 62 near the top. The scale rod 611 is slidably mounted inside the scale ring 612.

[0027] By rotating the fine-tuning knob 66, the fine-tuning screw 67 rotates, causing the adjusting plate 69 to shift, which in turn shifts the sensing frame 3. Simultaneously, the shift of the fine-tuning screw 67 causes the scale rod 611 to shift along the scale ring 612. The reading on the scale ring 612 using the scale rod 611 precisely determines the fine-tuning of the sensing frame 3. This allows for accurate control of the distance between the sensing electrode 4 and the thin film on the sensing frame 3.

[0028] A thin film electrostatic performance testing device, the working principle of which is as follows:

[0029] By pulling the lever 64, the lever 64 is disengaged from the slot 63, causing the coarse adjustment lever 62 to disengage from its limit position. This allows the coarse adjustment lever 62 to move up and down along the coarse adjustment groove 61. Since the slots 63 are arranged in an array, the position of the sensor frame 3 can be quickly adjusted. After adjustment, by engaging the lever 64 inside the slot 63, the coarse adjustment lever 62 is re-limited, allowing the position of the sensor frame 3 to be quickly coarsely adjusted.

[0030] After coarse adjustment, rotating the fine adjustment knob 66 ​​causes the fine adjustment screw 67 to rotate, which in turn displaces the adjusting plate 69, thereby displacing the induction frame 3. Simultaneously, the displacement of the fine adjustment screw 67 causes the scale rod 611 to move along the scale ring 612. The reading on the scale ring 612 using the scale rod 611 precisely determines the fine adjustment of the induction frame 3. This allows for accurate control of the distance between the induction electrode 4 and the thin film on the induction frame 3, thus completing the fine adjustment of the induction frame 3.

[0031] Since the distance between the induction frame 3 and the thin film is stably adjusted, the distance between the induction electrode 4 on the induction frame 3 and the diaphragm is stably adjusted. The induction electrode 4 maintains a small distance from the surface of the thin film, preferably 0.1 mm to 1 mm, forming a capacitor. When the thin film is charged, the induction electrode 4 senses the change in charge through capacitive coupling and converts it into a voltage signal, so that the electrostatic properties of the thin film can be detected without contacting the thin film.

[0032] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0033] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A thin film electrostatic performance testing device, comprising a base plate (1), wherein a bracket (2) is fixedly mounted on the base plate (1), characterized in that: An adjustment mechanism (6) is provided on the bracket (2). A sensor frame (3) is installed on the bracket (2) through the adjustment mechanism (6). The adjustment mechanism (6) is used to adjust the position of the sensor frame (3). A sensing electrode (4) is fixedly installed inside the sensor frame (3). A protective ring (5) is fixedly installed inside the sensor frame (3).

2. The thin film electrostatic performance testing device according to claim 1, characterized in that: The adjustment mechanism (6) includes a coarse adjustment groove (61), which is located at the top of the bracket (2). A coarse adjustment rod (62) is slidably installed in the coarse adjustment groove (61). Multiple slots (63) are provided through the coarse adjustment rod (62). A locking rod (64) is slidably installed on the bracket (2).

3. The thin film electrostatic performance testing device according to claim 2, characterized in that: A fine adjustment frame (65) is fixedly installed at the bottom end of the coarse adjustment rod (62). A fine adjustment groove (68) is provided in the fine adjustment frame (65). An adjustment plate (69) is slidably installed in the fine adjustment groove (68). A fine adjustment screw (67) is rotatably installed at the top end of the adjustment plate (69). A fine adjustment knob (66) is fixedly installed at the top end of the fine adjustment screw (67). The fine adjustment screw (67) and the coarse adjustment rod (62) are threaded together.

4. The thin film electrostatic performance testing device according to claim 1, characterized in that: The protective ring (5) is sleeved on the surface of the sensing electrode (4), and the protective ring (5) is made of insulating material.

5. The thin film electrostatic performance testing device according to claim 3, characterized in that: The fine adjustment groove (68) is slidably connected to the sensing frame (3), and multiple buffer springs (610) are installed between the sensing frame (3) and the adjustment plate (69).

6. The thin film electrostatic property testing device according to claim 2, characterized in that: The multiple slots (63) are arranged in an array, and the slots (63) are adapted to the levers (64).

7. The thin film electrostatic performance testing device according to claim 3, characterized in that: A scale rod (611) is rotatably mounted at the top of the surface of the fine adjustment screw (67), and a scale ring (612) is fixedly mounted at the top of the surface of the coarse adjustment rod (62). The scale rod (611) and the scale ring (612) are slidably connected.

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