Automatic test equipment for electronic components

Abstract

The utility model discloses automatic test equipment for electronic components. The automatic test equipment comprises a base; the visual detection assembly is arranged on the base and is used for carrying out visual detection on the electronic components; the feeding assembly is mounted on the base and used for conveying electronic components to be tested; the material transferring assembly is used for transferring the electronic components from the feeding assembly to the testing assembly; the testing assembly is arranged below the material moving assembly and used for testing the electrical performance of the electronic component; wherein the visual detection assembly comprises a camera, the feeding assembly comprises a sliding rail and sliding block piece and a vibration piece installed on the sliding rail and sliding block piece, the top of the vibration piece is provided with a flexible discharging box, the material moving assembly comprises a first material moving mechanism, a first grabbing mechanism and a second grabbing mechanism, and the testing assembly comprises a testing table. And a third clamping piece and a testing piece are arranged on the testing table. According to the utility model, the problems of multi-specification, multi-batch, small-batch and frequent remodeling of electronic components in the quality inspection sampling process can be solved, and automatic test of samples is realized.

Description

Technical Field

[0001] This utility model relates to the field of electronic product testing technology, specifically to an automatic testing device for electronic components. Background Technology

[0002] During the production of electronic components, their electrical properties need to be tested. For large-scale testing, high-speed testing machines are typically available. However, for later-stage quality sampling applications involving multiple specifications, batches, small quantities, and frequent model changes, high-speed testing machines are no longer suitable, and manual testing is necessary. Especially when multiple electrical properties need to be tested, samples must be manually mounted onto different test fixtures, and each test must be performed by a different instrument. This results in low measurement efficiency and a high risk of human error. Utility Model Content

[0003] To overcome the above-mentioned shortcomings, the purpose of this utility model is to provide an automatic testing device for electronic components that is accurate in material handling and has high testing efficiency.

[0004] This utility model discloses an automatic testing device for electronic components, including...

[0005] Base;

[0006] A visual inspection component, mounted on the base, includes a camera;

[0007] A feeding assembly is mounted on a base. The feeding assembly includes a slide rail slider arranged along the width direction of the base and a vibrating component mounted on the slide rail slider. The top of the vibrating component is provided with a flexible feeding box for placing electronic components.

[0008] A material transfer assembly is disposed on one side of the feeding assembly. The material transfer assembly includes a first material transfer mechanism and a first gripping mechanism and a second gripping mechanism disposed at the end of the first material transfer mechanism along the length direction of the base.

[0009] A testing assembly for testing the electrical performance of electronic components includes a test bench, on which a third clamping member for holding the electronic components and a test piece for testing the electronic components are provided.

[0010] In one or more embodiments of the present invention, the visual inspection component includes a first base and a column disposed on the first base along the height direction of the base. A first connecting block and a second connecting block are disposed on the column along the length direction of the base. A visual guide plate is disposed at the end of the first connecting block, and a camera is disposed at the end of the second connecting block. The visual guide plate has a through hole at the lower part of the camera for reducing the field of view of the camera.

[0011] In one or more embodiments of the present invention, the feeding assembly further includes a base plate mounted on the slide rail slider, a vibrating element mounted on the base plate, a top plate provided on the top of the vibrating element, and the flexible feeding box mounted on the top plate.

[0012] In one or more embodiments of this utility model, the top plate has a first clamping member and a second clamping member sequentially arranged along the width direction of the base for clamping the flexible feeding box.

[0013] In one or more embodiments of the present invention, the material transfer assembly includes a first material transfer plate disposed on a first material transfer mechanism. The first material transfer plate is provided with two sets, and the first gripping mechanism and the second gripping mechanism are disposed at the end of the first material transfer plate along the height direction of the base.

[0014] In one or more embodiments of this utility model, a plurality of first gripping mechanisms or second gripping mechanisms are provided on the first transfer plate along the height direction of the base.

[0015] In one or more embodiments of this utility model, the test component is provided with a number of groups the same as the number of the first gripping mechanism and / or the second gripping mechanism, and the number of test components are arranged along the length direction of the base at the lower part of the transfer component.

[0016] In one or more embodiments of the present invention, the test assembly further includes a second base and a third connecting block disposed on the second base, and the test platform is mounted on top of the third connecting block.

[0017] In one or more embodiments of the present invention, a placement component is further included. The placement component is disposed on one side of the test component. The placement component includes a placement platform and a placement block mounted on the placement platform. The placement block is used to place the tested electronic components.

[0018] The beneficial effects of this utility model are as follows: This utility model discloses an automatic testing device for electronic components, comprising: a base; a vision inspection component disposed on the base for visual inspection of electronic components; a feeding component mounted on the base for conveying the electronic components to be tested; a transfer component disposed on one side of the feeding component for transferring the electronic components from the feeding component to the testing component; and a testing component disposed below the transfer component for testing the electrical performance of the electronic components. The vision inspection component includes a camera; the feeding component includes a slide rail and a vibrating component mounted on the slide rail; the top of the vibrating component is provided with a flexible feeding box; the transfer component includes a first transfer mechanism, a first gripping mechanism, and a second gripping mechanism; and the testing component includes a testing table with a third clamping component and a test component on the testing table. The solution of this utility model can solve the problem of avoiding material accumulation during the feeding process of surface-mount electronic components, ensuring accurate material handling and improving testing efficiency.

[0019] This invention effectively solves the stacking problem during the feeding of sheet components through the synergistic design of vibration feeding and flexible containers, ensuring orderly separation and precise positioning of materials. The vision inspection system, combined with an adaptive gripping mechanism, calibrates the component position in real time, significantly improving material handling accuracy and inspection reliability, forming a fully automated closed loop from vibration feeding to electrical testing.

[0020] This invention adopts a modular layout and multi-station linkage design, supporting parallel operation of multiple testing units and significantly improving testing efficiency. The material transfer assembly achieves rapid positioning through multi-axis coordinated motion, the clamping mechanism of the testing stage can flexibly adapt to components of different specifications, and the compact linear layout optimizes the space utilization of the equipment, balancing high efficiency and stability.

[0021] This invention, through its flexible buffering, intelligent clamping, and anti-interference structural design, maintains stable operation in key processes such as vibration feeding and high-speed transfer. Modular components facilitate maintenance and upgrades, while the sorting and storage mechanism enables automatic classification and management of materials after testing, significantly reducing the need for manual intervention and providing a reliable solution for the batch testing of precision electronic components. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the structure of an automatic testing device for electronic components in one embodiment of the present invention;

[0023] Figure 2 A partial view (a) of an automatic testing device for electronic components according to an embodiment of this utility model;

[0024] Figure 3 This is a side view of an automatic testing device for electronic components according to an embodiment of the present invention;

[0025] Figure 4 This is a partial view (II) of an automatic testing device for electronic components according to an embodiment of the present invention.

[0026] Figure 5 This is an automatic testing device for electronic components in another embodiment of the present invention.

[0027] In the picture:

[0028] Base 100

[0029] Visual inspection component 200, first base 21, column 22, first connecting block 23, second connecting block 24, visual guide plate 25, through hole 251, camera 26.

[0030] Feeding assembly 300, slide rail slider 31, base plate 32, first clamping member 321, second clamping member 322, flexible feeding box 33, vibrating member 34, top plate 35.

[0031] Material transfer assembly 400, first material transfer mechanism 41, first material transfer plate 42, first gripping mechanism 43, second material transfer plate 44, second gripping mechanism 45

[0032] Test component 500, second base 51, third connecting block 52, test table 53, third clamping component 531, test component 532.

[0033] Unloading assembly 600, unloading bin assembly 61, and feed detection sensor 62. Detailed Implementation

[0034] To enable those skilled in the art to better understand the technical solutions of this utility model, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of this utility model.

[0035] In the description of this utility model, it should be understood that the terms "vertical", "horizontal", "top", "bottom", "upper", "lower", "front", "rear", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0036] It should be noted that, unless otherwise defined, all technical and scientific terms used in this invention have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.

[0037] like Figure 1 As shown, an automatic testing device for electronic components according to this application includes a base 100, a vision inspection component 200, a feeding component 300, a transfer component 400, a testing component 500, and an unloading component 600. These components work together to efficiently complete the visual inspection and electrical performance testing of electronic components. The following is a detailed description of the specific content and technical implementation of each component.

[0038] The base 100 is the fundamental structure of the entire automated testing equipment, upon which all other components are mounted. Its structure can be made of high-strength metal plates or high-rigidity marble, and its flatness and stability are ensured through precision machining. For example, the base 100 can be fixed to the ground or a dedicated workbench using multiple bolts to ensure the overall stability of the device and provide a support platform for the installation of other components.

[0039] like Figure 2 As shown, the vision inspection component 200 is positioned above the base 100 and is primarily used to determine the position of electronic components on the feeding component 300. This component mainly consists of a high-resolution camera 26 and a corresponding optical lens, which, in conjunction with a light source (such as a square LED light), provides sufficient illumination and contrast to capture clear image data. From a technical implementation perspective, the camera 26 can transmit the acquired data to a computing unit (such as a computer) via a network cable or a high-speed industrial camera interface, using image processing software to analyze the characteristics of the target object.

[0040] like Figure 3 As shown, the feeding assembly 300 is mounted on the base 100 and is used to transport electronic components to be tested to subsequent stages. This assembly includes a slide rail slider 31, which achieves smooth movement via guide rails and sliding modules, and utilizes a vibrating element 34 to generate minute vibrations to align the components. A flexible feeding box 33 is mounted on top of the vibrating element 34 to load surface-mount electronic components and achieve automatic separation and orderly arrangement during vibration.

[0041] The transfer assembly 400 is located beside the feeding assembly 300 and is responsible for transferring electronic components from the feeding assembly 300 to the testing assembly 500. This assembly includes a first transfer mechanism 41 and two independently operating gripping mechanisms: a first gripping mechanism 43 and a second gripping mechanism 45. The first transfer mechanism 41 can be driven by a stepper motor to move a linear module or pneumatic rod along a predetermined trajectory to achieve position switching; while the first and second gripping mechanisms can be integrated into vacuum suction cups or multi-degree-of-freedom robotic arms, flexibly positioned and gripping target components under the drive of control algorithms. This design facilitates continuous operation and improves operational efficiency.

[0042] like Figure 4 As shown, the test assembly 500 is located below the transfer assembly 400 and mainly consists of a test platform 53 and auxiliary tools on it, including a third clamping member 531 for fixing and a test piece 532 for performing electrical measurements. The test platform 53 needs to have a stable mechanical structure to support components of different sizes and weights; the third clamping member 531 can reliably clamp the test object without slipping but without excessive pressure causing damage; the test piece 532 is a component connector such as a probe or contact point, which connects to the circuit under test to form a complete circuit, and then reads parameters such as voltage, resistance, current, and other relevant results for output and display.

[0043] By incorporating a vibrating element 34 with minute vibrational energy and a flexible placement container, the previously stacked state is transformed into a loose, individual arrangement, allowing each part to be individually moved from its initial location to the next process step. This ensures precise material handling by the gripping equipment, eliminating the need for repeated adjustments and reconfirmation before continuing the production cycle, thus optimizing time costs and improving the overall efficiency of the entire inspection workflow. This mechanism directly addresses the critical obstacle of incorrectly selecting individual parts for the next inspection step due to random stacking.

[0044] In one embodiment, the vision inspection component 200 of an automatic testing device for electronic components according to this application includes multiple components for support and installation, which together form a position adjustment and fixing structure for the camera 26. Specifically, a first base 21 is located at the bottom of the vision inspection component 200, serving as the main support structure of the entire component and connected to a base 100. A column 22 is provided along the height direction of the base 100, which is vertically connected to the first base 21 and extends further upward to provide an installation interface. In addition, two cooperating connecting blocks are provided along the length direction of the base 100: a first connecting block 23 is fixed to the column 22 and serves a transmission function; a second connecting block 24 continues to extend outward to the end, providing a precise position and stable foundation for the installation of the camera 26.

[0045] An adjustable mechanical interface is used to securely connect the first base 21 to the surface of the base 100. Simultaneously, a precision-machined column 22 is firmly fixed to the first base 21 using bolts or other standard fasteners. Subsequently, the first connecting block 23 is integrated with the column 22 via a sliding groove or guide rail structure, while the second connecting block 24 is horizontally mounted at a designated end of the first connecting block 23, thus completing the assembly of the overall structure. Next, a high-resolution camera 26 is embedded and fixed to the end portion of the second connecting block 24, ensuring effective coverage of the underlying electronic components and image acquisition capabilities.

[0046] In one embodiment, the feeding assembly 300 of an automatic testing device for electronic components according to this application includes a base plate 32, which serves as a mounting carrier for the vibrating element 34 and its related components. The base plate 32 is connected to the entire feeding system via a slide rail slider 31, enabling it to move smoothly on a preset track. Simultaneously, because the base plate 32 drives the flexible feeding box 33 to move on the feeding assembly 300, the entire feeding area of ​​the feeding box 33 can be divided into multiple camera shooting areas, reducing the camera's field of view, increasing resolution, and improving positioning accuracy. The vibrating element 34 is fixed above the base plate 32, primarily responsible for vibration screening and orienting electronic components, promoting orderly arrangement of components through vibration at a specific frequency. The top of the vibrating element 34 supports the flexible feeding box 33 via a top plate 35. This structural design not only achieves flexible placement but also facilitates the connection of subsequent processing stages. Furthermore, the flexible feeding box 33 can be easily removed for convenient loading, unloading, and cleaning.

[0047] In terms of technical implementation, a high-precision metal material can be selected to make the base plate 32, and a rigid fastener can be used to tightly connect the base plate 32 with the slide rail slider 31 to ensure stability during operation. Specifically, a voice coil motor can be used as the core component of the vibrating element 34, while an elastic material is used to make the top plate 35 and it is firmly assembled with the vibrating element 34 to effectively support the flexible feeding box 33, so that the components are subjected to appropriate force and displacement adjustment during transportation.

[0048] In one embodiment, the top plate 35 of an automatic testing device for electronic components according to this application is provided with a first clamping member 321 and a second clamping member 322 for clamping a flexible feeding box 33. The first clamping member 321 and the second clamping member 322 are respectively located on both sides of the flexible feeding box 33 to securely clamp the flexible feeding box 33 and ensure that it will not shift or fall off under vibration. The flexible feeding box 33 can be released and removed by pulling either the first clamping member 321 or the second clamping member 322. The flexible feeding box 33 is used to store electronic components to be tested and works with the vibrating member 34 of the feeding assembly 300 to achieve orderly feeding of components. The first clamping member 321 and the second clamping member 322 are installed on the top plate 35 by mechanical connection, specifically by threaded connection or snap-fit ​​connection.

[0049] In practical implementation, the first clamping member 321 and the second clamping member 322 can fix the edge area of ​​the flexible feeding box 33 through an elastic clamping structure, while both are mounted on the surface of the top plate 35 via brackets or fixing seats. Meanwhile, to accommodate flexible feeding boxes 33 of different sizes, the first clamping member 321 or the second clamping member 322 can be designed with an adjustable position, for example, by using a guide rail sliding mechanism with a locking element to achieve lateral adjustment. Furthermore, sufficient space must be reserved between the clamping mechanism and the top plate 35 to avoid interfering with the normal operation of the vibrating element 34.

[0050] In one embodiment, the transfer assembly 400 of an automatic testing device for electronic components according to this application further includes two sets of first transfer plates 42 disposed on a first transfer mechanism 41. The first gripping mechanism 43 and the second gripping mechanism 45 are respectively located at the ends of the first transfer plates 42 and arranged along the height direction of the base 100. Specifically, the arrangement of the first gripping mechanism 43 and the second gripping mechanism 45 in the height direction enables the device to form a clear spatial hierarchy during operation, which helps to improve the coordination of gripping and transferring electronic components.

[0051] In one embodiment, the transfer assembly 400 of an automatic testing device for electronic components according to this application achieves precise transfer of electronic components through a first transfer plate 42. Specifically, the first transfer plate 42 is equipped with a plurality of first gripping mechanisms 43 or second gripping mechanisms 45 for clamping electronic components along the height direction of the base 100. These two gripping mechanisms can be reasonably selected and arranged according to different component types, so that the same device is suitable for the operation needs of multiple types of components. Among them, the first transfer plate 42 serves as a mounting base, and its position is fixed on the critical path of the transfer assembly 400, ensuring effective docking with the feeding assembly 300 and the testing assembly 500.

[0052] like Figure 5As shown, the first gripping mechanism 43 or the second gripping mechanism 45 can be composed of pneumatic grippers, vacuum suction cups, and their driving components, and is fixed to the preset holes on the first transfer plate 42 by a mounting bracket. The layout of these components along the height direction can be precisely set by adjusting the mechanism or positioning pins to adapt to the requirements of component testing stations of different heights, while ensuring the height consistency with the test stage 53 and the feeding assembly 300, thereby meeting the operation requirements of the automated production line. In this embodiment, three sets of the first gripping mechanism 43, the second gripping mechanism 45, and the test assembly 500 can be set to realize the gripping and testing of three sets of electronic components, thereby improving the testing efficiency.

[0053] In one embodiment, the test component 500 of an automatic testing device for electronic components according to this application includes several sets of test units, the number of which matches the number of the first gripping mechanism 43 or the second gripping mechanism 45. The sets of test units are arranged along the length of the base 100, which facilitates the orderly transfer and efficient testing of electronic components. Through this layout design, each test unit can correspond to the working area of ​​the gripping mechanism, thus forming a one-to-one or many-to-many collaborative structure, thereby ensuring the smooth and stable operation of the entire testing process.

[0054] To further clarify the aforementioned structural features, the specific components of the test unit may include clamping components for fixing electronic components and probe components for performing electrical performance tests. For example, the clamping components in each test unit are mounted on the test stage 53 and located directly below the working range of the transfer assembly 400. The probe components are connected to the base 100 via a bracket and act accurately on the electronic components fixed by the clamping components. Specifically, if the transfer assembly 400 is equipped with two sets of gripping mechanisms, two or more test units arranged at intervals can be set accordingly to meet the need to process multiple electronic components simultaneously.

[0055] In one embodiment, the test assembly 500 of an automatic testing device for electronic components according to this application further enhances its assembly reliability through optimized mounting structure. The test assembly 500 includes a newly added base and a connecting block connected to it, both of which together support the clamps and test pieces 532 required on the test bench 53, ensuring the positional accuracy and stability requirements during testing.

[0056] In one embodiment, the unloading assembly 600 of an automatic testing device for electronic components of this application is disposed on one side of the testing assembly 500. It mainly includes an unloading bin assembly 61 and an infeed detection sensor 62 fixed on the unloading bin assembly 61. It is used to accommodate electronic components that have completed testing. The positional relationship between the unloading bin assembly 61 and the testing assembly 500 is carefully designed to ensure that components that have completed testing can be quickly moved from the testing platform 53 to the unloading bin assembly 61 area. Through a reasonable layout and a stable connection method, the unloading bin assembly 61 is installed on a stable base plane to avoid deviations caused by vibration or external disturbances. The infeed detection sensor 62 is firmly connected to the unloading bin assembly 61 and is used to detect the tested samples, place them into the appropriate bin (good or defective) based on the measurement results from the previous station, and record the measured quantity.

[0057] In actual operation, when this device is used, the feeding component 300 transports the electronic components to be tested to the designated position. The vibration generated by the vibrating component 34 arranges the components in an orderly manner and places them in the flexible feeding box 33. Then, the first feeding mechanism 41 in the transfer component 400 is activated, driving the first gripping mechanism 43 and the second gripping mechanism 45 to work together to accurately grip the electronic components in the flexible feeding box 33 and transfer them above the testing component 500. The visual inspection component 200 takes real-time pictures of the electronic components through the camera 26 and completes the visual inspection of the surface quality. After confirming that there are no errors, the transfer component 400 accurately places the components on the third clamping component 531 of the testing table 53 to achieve stable fixation. Then, the testing component 532 begins to conduct a comprehensive test on the electrical performance of the electronic components. Finally, the data feedback can provide specific test results for subsequent analysis and processing. After the test is completed, the second gripping mechanism 45 grabs the tested parts on the test table 53 and moves them to the good or bad product bin of the corresponding unloading component 600, releasing the products into the corresponding bins, thus realizing the entire process of product picking, testing, and binning.

[0058] The above embodiments are only for illustrating the technical concept and features of this utility model. Their purpose is to enable those skilled in the art to understand the content of this utility model and implement it. They cannot be used to limit the protection scope of this utility model. All equivalent changes or modifications made in accordance with the spirit and essence of this utility model should be covered within the protection scope of this utility model.

Claims

1. An automatic testing device for electronic components, characterized in that, include Base (100); A visual inspection component (200) is mounted on a base (100), and the visual inspection component (200) includes a camera (26). A feeding assembly (300) is mounted on a base (100). The feeding assembly (300) includes a slide rail slider (31) arranged along the width direction of the base (100) and a vibrating element (34) mounted on the slide rail slider (31). The top of the vibrating element (34) is provided with a flexible feeding box (33) for placing electronic components. The material transfer assembly (400) is disposed on one side of the feeding assembly (300). The material transfer assembly (400) includes a first material transfer mechanism (41) and a first gripping mechanism (43) and a second gripping mechanism (45) disposed at the end of the first material transfer mechanism (41) along the length direction of the base (100). The test assembly (500) is used to test the electrical performance of electronic components, including a test stand (53), on which a third clamping member (531) for clamping electronic components and a test piece (532) for testing electronic components are provided.

2. The automatic testing equipment for electronic components according to claim 1, characterized in that, The visual inspection component (200) includes a first base (21) and a column (22) disposed on the first base (21) along the height direction of the base (100). A first connecting block (23) and a second connecting block (24) are disposed on the column (22) along the length direction of the base (100). A visual guide plate (25) is disposed at the end of the first connecting block (23). The camera (26) is disposed at the end of the second connecting block (24). The visual guide plate (25) has a through hole (251) at the lower part of the camera (26) for reducing the field of view of the camera.

3. The automatic testing equipment for electronic components according to claim 1, characterized in that, The feeding assembly (300) also includes a base plate (32) mounted on the slide rail slider (31), a vibrating element (34) mounted on the base plate (32), a top plate (35) provided on the top of the vibrating element (34), and the flexible feeding box (33) mounted on the top plate (35).

4. The automatic testing equipment for electronic components according to claim 3, characterized in that, The top plate (35) has a first clamping member (321) and a second clamping member (322) for clamping the flexible feeding box (33) in sequence along the width direction of the base (100).

5. The automatic testing equipment for electronic components according to claim 1, characterized in that, The material transfer assembly (400) includes a first material transfer plate (42) disposed on a first material transfer mechanism (41). The first material transfer plate (42) is provided with two sets. The first gripping mechanism (43) and the second gripping mechanism (45) are disposed at the end of the first material transfer plate (42) along the height direction of the base (100).

6. The automatic testing equipment for electronic components according to claim 5, characterized in that, The first transfer plate (42) is provided with a plurality of first gripping mechanisms (43) or second gripping mechanisms (45) along the height direction of the base (100).

7. An automatic testing device for electronic components according to claim 6, characterized in that, The test component (500) has several groups, the same number as the first gripping mechanism (43) and / or the second gripping mechanism (45), and the several groups of test components (500) are arranged along the length of the base (100) at the lower part of the transfer component (400).

8. An automatic testing device for electronic components according to claim 7, characterized in that, The test assembly (500) also includes a second base (51) and a third connecting block (52) disposed on the second base (51), and the test bench (53) is mounted on top of the third connecting block (52).

9. An automatic testing device for electronic components according to claim 8, characterized in that, It also includes a placement component (600) disposed on one side of the test component (500), the placement component (600) including a placement platform (61) and a placement block (62) mounted on the placement platform (61), the placement block (62) being used to place the tested electronic components.

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