Solar cell test probe row device and equipment

Abstract

The utility model provides a solar cell test probe row device and equipment, and relates to the technical field of photovoltaic cells, and the device comprises a first pre-positioning mechanism which is provided with a plurality of first pre-positioning grooves; the second pre-positioning mechanism is arranged opposite to the first pre-positioning mechanism and is provided with a plurality of second pre-positioning grooves which are distributed at intervals; and the plurality of probe rows are detachably bridged between the first pre-positioning grooves and the corresponding second pre-positioning grooves. When the probe row is installed, the two ends of the probe row are installed in the first pre-positioning groove and the second pre-positioning groove respectively, the probe row and the pre-positioning groove are installed in a clamping mode, compared with a bolt fixing mode, the installation process of the probe row can be accelerated through installation of the pre-positioning groove, displacement cannot occur in the installation process, the adjustment time is shortened, and the installation efficiency is improved. When a plurality of probe rows are installed, the two ends of each probe row can be installed in the pre-positioning grooves in the two sides, each probe row does not need to be installed in an aligned mode independently, and the time for installing and debugging the probe rows is greatly shortened.

Description

Technical Field

[0001] This application belongs to the field of photovoltaic cell technology, and in particular relates to a solar cell test probe array device and equipment. Background Technology

[0002] In the photovoltaic cell production process, probe arrays are needed to test and evaluate the electrical performance of the cells. Probe arrays can provide researchers and engineers with key performance data by accurately measuring the current-voltage (IV) characteristics of photovoltaic cells under different conditions, thereby helping to optimize cell design and manufacturing processes.

[0003] However, the installation of probe arrays requires precise alignment with the test points on the photovoltaic cells, which demands a high level of skill from the operators. Inaccurate installation can lead to deviations in test results. Conventional probe array installation devices use bolts for fixing, but when tightening the bolts, the bolts can rotate, causing the probe arrays to shift. This results in the probe arrays not being fully aligned with the grid lines on the solar cell, requiring individual alignment and installation of each probe array. However, this requires extremely high installation precision and significantly increases the time required for installing and debugging the probe arrays.

[0004] It should be noted that the above content is not necessarily prior art, nor is it intended to limit the scope of patent protection of this application. Utility Model Content

[0005] This application provides a solar cell test probe array device and equipment to solve or alleviate one or more technical problems in the prior art.

[0006] The first aspect of this application provides a solar cell test probe array device, comprising:

[0007] A first pre-positioning mechanism is provided with a plurality of spaced-apart first pre-positioning slots;

[0008] The second pre-positioning mechanism is disposed opposite to the first pre-positioning mechanism, and the second pre-positioning mechanism has a plurality of spaced second pre-positioning slots on the side facing the first pre-positioning mechanism.

[0009] Multiple probe rows are provided, each probe row being detachably connected between a first prepositioning slot and a corresponding second prepositioning slot. The multiple probe rows are arranged at intervals, and each probe row is provided with probes for electrical contact with the battery cell.

[0010] Optionally, the probe array includes:

[0011] The probe holder is equipped with probes for electrical contact with the battery cells;

[0012] The first positioning component is fixed to the first end of the probe holder and is used for detachable connection with the first prepositioning slot;

[0013] The second positioning component is fixed to the second end of the probe holder and is used for detachable connection with the second prepositioning slot.

[0014] Optionally, the first positioning component includes:

[0015] A first fixing block is fixed to the first end of the probe holder, and the first fixing block is provided with a first through hole facing the first prepositioning slot;

[0016] The first locating pin passes through the first through hole;

[0017] The first positioning pin can move along the axial direction of the first through hole to insert or disengage from the first pre-positioning groove.

[0018] Optionally, the first positioning pin includes a protruding end that protrudes from the first through hole, the protruding end being close to the first pre-positioning mechanism;

[0019] The first positioning component further includes:

[0020] The first limiting member is sleeved on the protruding end of the first positioning pin;

[0021] The first limiting member is used to follow the movement of the first positioning pin to insert into or disengage from the first pre-positioning slot.

[0022] Optionally, the inner wall of the first prepositioning groove facing the first positioning pin is further provided with a first positioning hole, which is used to accommodate the corresponding first positioning pin.

[0023] Optionally, the inner wall of the first through hole is provided with a first stop portion, and the first stop portion is located at the end of the first through hole away from the first prepositioning mechanism;

[0024] The first positioning pin is provided with a second stop portion, and the second stop portion is provided corresponding to the first stop portion;

[0025] The probe array also includes an elastic element that spans between the first stop portion and the second stop portion.

[0026] Optionally, there are two first through holes, which are spaced apart.

[0027] There are two first positioning pins, each of which is slidably inserted into one of the first through holes.

[0028] Optionally, the first pre-positioning mechanism includes:

[0029] A prepositioning plate is provided on a first side with a plurality of spaced first prepositioning grooves, and on a second side with an extension plate extending toward a side away from the first side of the prepositioning plate. The extension plate is also provided with a matching hole.

[0030] An adjusting rod is provided with a strip-shaped hole extending along the length direction, and the adjusting rod is attached to the extension plate;

[0031] An adjusting member is inserted through the strip hole and detachably connected to the matching hole on the extension plate.

[0032] Optionally, the solar cell test probe array further includes:

[0033] The base frame has a hollowed-out area, which includes a first side and a second side opposite to each other, and the hollowed-out area is used to expose the plurality of probe rows;

[0034] The adjusting rod of the first prepositioning mechanism is fixed to the first side of the hollowed-out area.

[0035] A second aspect of this application provides a solar cell performance testing device, including a solar cell test probe array as described in any of the preceding embodiments.

[0036] The embodiments of this application employing the above-described technical solution may have the following advantages:

[0037] The first and second pre-positioning mechanisms are located at opposite ends of the probe array, providing dual positioning for the probe array. When installing the probe array, one end is installed in the first pre-positioning slot of the first pre-positioning mechanism, and the other end is installed in the second pre-positioning slot of the second pre-positioning mechanism. Since the probe array and the pre-positioning slots are interlocked, compared to bolt fixing, installation via pre-positioning slots speeds up the installation process and prevents displacement, reducing the time spent on repeated adjustments. When installing multiple probe arrays, both ends of each probe array can be installed in the pre-positioning slots on either side. The first and second pre-positioning slots are sufficient for positioning the probe array, eliminating the need for individual alignment of each probe array and significantly reducing the time required for installation and debugging.

[0038] The above overview is for illustrative purposes only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features of this application will become readily apparent from the accompanying drawings and the following detailed description. Attached Figure Description

[0039] In the accompanying drawings, unless otherwise specified, the same reference numerals throughout the various drawings denote the same or similar parts or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings depict only some embodiments disclosed in this application and should not be construed as limiting the scope of this application.

[0040] Figure 1 A schematic diagram of the structure of the solar cell test probe array device provided in the embodiments of this application;

[0041] Figure 2 This is an exploded structural diagram of the solar cell test probe array device provided in the embodiments of this application;

[0042] Figure 3 for Figure 2 A magnified view of a portion of point A in the middle;

[0043] Figure 4 This is another structural schematic diagram of the solar cell test probe array device provided in the embodiments of this application;

[0044] Figure 5 for Figure 4 A cross-sectional view along the BB direction;

[0045] Figure 6 for Figure 5 A magnified view of a portion of point C in the middle;

[0046] Figure 7 This is another cross-sectional schematic diagram of the solar cell test probe array device provided in the embodiments of this application.

[0047] Explanation of reference numerals in the attached figures:

[0048] Pre-positioning plate 111; first pre-positioning groove 113; first positioning hole 115; extension plate 112; adjusting rod 116; strip hole 117; adjusting component 118; probe row 13; probe holder 135; first fixing block 1311; first positioning pin 1315; first limiting component 1317; first stop part 1314; second stop part 1316; elastic component 133; base frame 15; hollow area 151. Detailed Implementation

[0049] The embodiments of this application are described in detail below, examples of which are illustrated in the accompanying drawings. In the drawings, for clarity, the dimensions of layers, regions, elements, and their relative dimensions may be exaggerated. The same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0050] It should be understood that when an element or layer is referred to as "on," "adjacent to," "connected to," or "coupled to" other elements or layers, it may be directly on, adjacent to, connected to, or coupled to other elements or layers, or there may be intervening elements or layers. Conversely, when an element is referred to as "directly on," "directly adjacent to," "directly connected to," or "directly coupled to" other elements or layers, there are no intervening elements or layers. It should be understood that although the terms first, second, third, etc., may be used to describe various elements, components, areas, layers, and / or portions, these elements, components, areas, layers, and / or portions should not be limited by these terms. These terms are only used to distinguish one element, component, area, layer, or portion from another element, component, area, layer, or portion. Therefore, without departing from the teachings of this application, the first element, component, area, layer, or portion discussed below may be referred to as a second element, component, area, layer, or portion. And the discussion of a second element, component, area, layer, or portion does not imply that the first element, component, area, layer, or portion necessarily exists in this application.

[0051] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0052] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such terms can be used interchangeably where appropriate so that the embodiments of this application described herein can be implemented, for example, in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0053] In this application, when numerical intervals (i.e., numerical ranges) are involved, unless otherwise specified, the distribution of selectable numerical values ​​within the numerical interval is considered continuous, and includes the two endpoints of the numerical interval (i.e., the minimum and maximum values), as well as every numerical value between these two endpoints. Unless otherwise specified, when a numerical interval refers only to integers within that numerical interval, it includes the two endpoint integers of the numerical range, as well as every integer between the two endpoints, which is equivalent to directly listing every integer. When multiple numerical ranges are provided to describe features or characteristics, these numerical ranges can be merged. In other words, unless otherwise specified, the numerical ranges disclosed in this application should be understood to include any and all subranges included therein. The "numerical value" in the numerical interval can be any quantitative value, such as a number, percentage, ratio, etc. The term "numerical interval" can be broadly included to include percentage intervals, ratio intervals, proportion intervals, etc.

[0054] This application provides a technical solution for a solar cell test probe array device and equipment. Based on this, it alleviates the problems of probe array displacement during installation and the increased installation and debugging time caused by the need for individual alignment of each probe array. See below for details.

[0055] Exemplary embodiments according to this application will now be described in more detail with reference to the accompanying drawings. It should be understood that these exemplary embodiments may be implemented in many different forms and should not be construed as being limited to the embodiments set forth herein.

[0056] Please see Figures 1 to 7 This application provides a solar cell test probe array device, which includes a first pre-positioning mechanism, a second pre-positioning mechanism, and a plurality of probe arrays 13. The following is a detailed description:

[0057] The first pre-positioning mechanism is provided with a plurality of pre-positioning slots 113 spaced apart.

[0058] The second pre-positioning mechanism is disposed opposite to the first pre-positioning mechanism, and the second pre-positioning mechanism has a plurality of spaced second pre-positioning slots (not shown in the figure) on the side facing the first pre-positioning mechanism.

[0059] Each of the probe rows 13 is detachably connected between a first pre-positioning slot 113 and a corresponding second pre-positioning slot. Multiple probe rows 13 are arranged at intervals between each other, and each probe row 13 is provided with probes for electrical contact with the battery cell. The detachable installation of the probe rows 13 facilitates maintenance and quick replacement.

[0060] The first and second pre-positioning mechanisms are located at both ends of the probe array 13, providing dual positioning for the probe array 13. When installing the probe array 13, one end of the probe array 13 is installed in the first pre-positioning slot 113 on the first pre-positioning mechanism, and the other end is installed in the second pre-positioning slot on the second pre-positioning mechanism. Since the probe array 13 and the pre-positioning slot are snap-fit ​​installed, compared with the bolt fixing method, the installation process of the probe array 13 can be accelerated by installing through the pre-positioning slot, and there will be no displacement during installation, reducing the time of repeated adjustments. When installing multiple probe arrays 13, both ends of each probe array 13 can be installed in the pre-positioning slots on both sides. The probe array 13 can be positioned by the first pre-positioning slot 113 and the second pre-positioning slot, without the need to align and install each probe array 13 individually, which greatly reduces the time for installing and debugging the probe array 13.

[0061] In addition, when it is necessary to test battery cells with different screen printing patterns, the corresponding first pre-positioning mechanism and second pre-positioning mechanism can be prepared in advance according to the battery cells with different screen printing patterns. The spacing between the multiple first pre-positioning slots 113 on the first pre-positioning mechanism can be adjusted and set according to the screen printing pattern on the battery cell.

[0062] In this embodiment, the probe array 13 includes a probe holder 135, a first positioning component, and a second positioning component. The probe holder 135 is equipped with probes for electrical contact with the solar cell. The probe holder 135 serves as the basic framework of the entire probe array 13, ensuring that the probes can stably contact the test points on the surface of the photovoltaic cell. The probes are responsible for making electrical contact with the test points of the photovoltaic cell to obtain current-voltage (IV) characteristics, thereby evaluating the performance of the solar cell.

[0063] The first positioning component is fixed to the first end of the probe holder 135 and is detachably connected to the first prepositioning slot 113. The second positioning component is fixed to the second end of the probe holder 135 and is detachably connected to the second prepositioning slot.

[0064] The first positioning component and the second positioning component together form a dual positioning mechanism, which ensures the overall stability and accuracy of the probe holder 135 installed between the first pre-positioning mechanism and the second pre-positioning mechanism, and ensures that the probe row 13 can be aligned at both ends at the same time during installation, avoiding the problem of one end being aligned while the other end is offset.

[0065] Furthermore, in this embodiment, the first positioning component includes a first fixing block 1311 and a first positioning pin 1315. The first fixing block 1311 is fixed to the first end of the probe holder 135, and the first fixing block 1311 is provided with a first through hole facing the first pre-positioning groove 113.

[0066] Specifically, the first fixing block 1311 is provided with a stepped groove, and the end portion of the probe holder 135 is inserted into the stepped groove so that the end portion of the probe holder 135 and the first fixing block 1311 partially overlap, and the first fixing block 1311 and the end portion of the probe holder 135 are fixedly connected by a fastener passing through the overlapping area.

[0067] Depending on the pattern of the battery cell screen, the width of the first pre-positioning slot 113 on the first pre-positioning mechanism may be different. In this case, the width of the first pre-positioning slot 113 can be matched by disassembling and replacing the first fixing block 1311, without having to replace the entire probe row 13, thus improving the utilization rate of the probe row 13.

[0068] The first positioning pin 1315 passes through the first through hole and can move axially along the first through hole so that the first positioning pin 1315 can be inserted into or removed from the first pre-positioning groove 113.

[0069] When the first positioning pin 1315 is inserted into the first pre-positioning groove 113, the end of the first positioning pin 1315 can abut against the bottom wall of the first positioning groove to fix the probe holder 135 in the predetermined position and prevent displacement or loosening during the test. When it is necessary to disassemble the probe holder 135, the first positioning pin 1315 can be moved axially to disengage from the first pre-positioning groove 113 without disassembling other components. The overall operation is convenient and quick.

[0070] Correspondingly, the second positioning component includes a second fixing block and a second positioning pin. The second fixing block is fixed to the second end of the probe holder 135, and the second fixing block has a second through hole facing the second pre-positioning slot. The second positioning pin passes through the second through hole and can move axially along the second through hole to insert or disengage from the second pre-positioning slot.

[0071] The function and effect of the second positioning component are similar to those of the first positioning component, and will not be elaborated here.

[0072] Furthermore, in this embodiment, the first positioning pin 1315 includes a protruding end extending from the first through hole, the protruding end being close to the first pre-positioning mechanism. The first positioning component also includes a first limiting member 1317, sleeved on the protruding end of the first positioning pin 1315, the first limiting member 1317 being used to move with the first positioning pin 1315 to insert into or disengage from the first pre-positioning groove 113.

[0073] The shape of the first limiting member 1317 matches the shape of the first pre-positioning groove 113, which avoids the first limiting member 1317 from becoming loose or misaligned due to shape mismatch. This allows the first limiting member 1317 to better prevent the first positioning pin 1315 and the probe holder 135 from making slight offsets when inserted into the first pre-positioning groove 113.

[0074] Correspondingly, the second positioning component includes a second fixing block and a second positioning pin. The second positioning pin includes a protruding end extending out of the second through hole, the protruding end being close to the second pre-positioning mechanism. The second positioning component also includes a second limiting member sleeved on the protruding end of the second positioning pin. The second limiting member is used to follow the movement of the second positioning pin to insert into or disengage from the second pre-positioning groove.

[0075] The structure and function of the second positioning component are similar to those of the first positioning component, and will not be described in detail here.

[0076] In an optional embodiment, the inner wall of the first prepositioning groove 113 facing the first positioning pin 1315 is further provided with a first positioning hole 115. The first positioning hole 115 is used to accommodate the corresponding first positioning pin 1315. The first positioning pin 1315 can be more embedded in the first positioning hole 115, which improves the fixing accuracy of the probe holder 135 and prevents the first positioning pin 1315 from being displaced in the first prepositioning groove 113.

[0077] With the first positioning hole 115 in place, the first positioning pin 1315 will automatically be guided to the correct position, avoiding installation errors or instability caused by improper operation. Furthermore, when the first positioning pin 1315 is inserted into the first positioning hole 115, the operator can perceive successful insertion through changes in physical resistance or a slight feeling of locking. This physical feedback allows the operator to know that the component is locked in the predetermined position, avoiding uncertainty caused by not being able to see the internal structure.

[0078] Correspondingly, the inner wall of the second prepositioning groove facing the second positioning pin is also provided with a second positioning hole. The second positioning hole is used to accommodate the corresponding second positioning pin. Its structure and function are similar to the first positioning hole 115, and will not be described in detail here.

[0079] In an optional embodiment, the inner wall of the first through hole is provided with a first stop portion 1314, which is located at the end of the first through hole away from the first pre-positioning mechanism. The first positioning pin 1315 is provided with a second stop portion 1316, which is correspondingly provided with the first stop portion 1314.

[0080] The probe array 13 further includes an elastic element 133, which spans between the first stop portion 1314 and the second stop portion 1316. Specifically, the elastic element 133 may be a spring.

[0081] The elastic element 133 provides an outward thrust to the first positioning pin 1315, ensuring that the first positioning pin 1315 remains engaged in the first pre-positioning groove 113. This prevents the first positioning pin 1315 from accidentally dislodging due to vibration or external force during use of the probe array 13.

[0082] The elastic element 133 can also provide an automatic reset function for the first positioning pin 1315. The second stop 1316 moves with the first positioning pin 1315. When the first positioning pin 1315 moves away from the first pre-positioning groove 113, the distance between the second stop 1316 and the first stop 1314 decreases, thereby compressing the elastic element 133 to provide a reset thrust for the first positioning pin 1315.

[0083] Correspondingly, a corresponding stop portion can also be provided on the inner wall of the second through hole and the second positioning pin, and a corresponding elastic element 133 can also be provided between the stop portions to achieve a similar function, which will not be elaborated here.

[0084] In an optional embodiment, there are two first through holes, which are spaced apart, and there are two first positioning pins 1315, each of which is slidably inserted into one of the first through holes.

[0085] If supported by only one locating pin, the probe holder 135 may twist or wobble slightly during use. The two first locating pins 1315, corresponding to the two first locating holes 115, effectively distribute the force on the probe holder 135, providing dual-point support and greatly enhancing the lateral stability of the probe array 13. This prevents the probe holder 135 from tilting or shifting during use due to instability caused by a single locating pin, thus ensuring that the probe array 13 remains balanced and stable during precise alignment.

[0086] In an optional embodiment, the first pre-positioning mechanism includes a pre-positioning plate 111, an adjusting rod 116, and an adjusting member 118. The first side of the pre-positioning plate 111 has a plurality of spaced-apart first pre-positioning grooves 113, and the second side of the pre-positioning plate 111 has an extension plate 112 extending away from the first side of the pre-positioning plate 111. The extension plate 112 also has a matching hole.

[0087] The adjusting rod 116 is provided with a strip-shaped hole 117 extending along the length direction. The adjusting rod 116 is attached to the extension plate 112, and the adjusting member 118 passes through the strip-shaped hole 117 and is detachably connected to the matching hole on the extension plate 112.

[0088] When the adjusting member 118 is not fixed, the extension plate 112 and the adjusting rod 116 are not fixedly connected. At this time, the prepositioning plate 111 can move along the length direction of the strip hole 117 of the adjusting plate to adjust the horizontal position of the first prepositioning groove 113 on the prepositioning plate 111, so as to make it easy to accurately align with the test points on the battery cells of different specifications. It can adapt to various battery cell types and improve the versatility and adaptability of the probe array 13.

[0089] Specifically, the spacing between multiple probe rows 13 can be matched by the spacing between the first prepositioning slots 113 on the first prepositioning mechanism, and the lateral position of multiple probe rows 13 can be adjusted by moving the prepositioning plate 111. The adjusting rod 116 and the prepositioning plate 111 can be fixed by tightening the adjusting component 118, so that the two are relatively fixed, thereby quickly adjusting the position of the probe rows 13 in batches without having to adjust each probe row 13 individually, saving installation and debugging time.

[0090] Correspondingly, the second pre-positioning mechanism can also be equipped with the pre-positioning plate 111, adjusting rod 116 and adjusting member 118 in the above embodiment, and cooperate with the first pre-positioning mechanism to synchronously adjust the lateral position of the probe row 13, which will not be described in detail here.

[0091] Furthermore, in this embodiment, the solar cell test probe array device also includes a base frame 15, which has a hollow area 151. The hollow area 151 includes a first side and a second side opposite to each other. The hollow area 151 is used to expose the plurality of probe arrays 13, making it easier to adjust and inspect the probe arrays 13 and the probes on their structure. It also facilitates the precise alignment, cleaning and maintenance of the probe arrays 13. At the same time, it is more convenient to troubleshoot or replace components, reducing the steps of disassembling and assembling complex structures and improving the operational efficiency of adjusting the probe arrays 13.

[0092] The adjusting rod 116 of the first pre-positioning mechanism is fixed to the first side of the hollow area 151, and the adjusting rod 116 of the second pre-positioning mechanism can be fixed to the second side of the hollow area 151 so that multiple probe rows 13 are mounted above the hollow area 151.

[0093] Specifically, the two ends of the adjusting rod 116 can be connected to the base frame 15 by bolts. A sliding groove can be opened on the adjusting rod 116 to accommodate the extension plate 112 on the prepositioning plate 111. The extension plate 112 can slide laterally in the sliding groove to drive the probe row 13 to move and adjust its position.

[0094] The base frame 15 can be connected to a vertical moving mechanism to move the base frame 15 in the direction of gravity to move it closer to or away from the solar cell.

[0095] This application also provides a solar cell performance testing device, which includes a solar cell test probe array as described in any of the above claims.

[0096] In this embodiment, the solar cell test probe array device may include a first solar cell test probe array device and a second solar cell test probe array device. The first and second solar cell test probe array devices are arranged at intervals, and are located above and below the solar cell to be tested, respectively. When testing the solar cell, the first and second solar cell test probe array devices move closer to each other until the probes on the probe arrays contact the electrodes on the solar cell, that is, the solar cell to be tested is clamped between the first and second solar cell test probe array devices for testing.

[0097] For some single-sided electrode solar cells, the performance of the solar cell can be tested using only a solar cell test probe array device.

[0098] It should be noted that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential," etc., are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. The directional terms "inner" and "outer" refer to the inside or outside relative to the outline of the component itself. For example, if a device in the drawings is inverted, a device described as "above" or "on top of" other devices or structures will subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein are interpreted accordingly.

[0099] It should also be noted that the terms "one embodiment," "another embodiment," and "embodiment" used in this application refer to specific features, structures, or characteristics described in connection with that embodiment, which are included in at least one embodiment described in the general description of this application. The appearance of the same expression in multiple places in the specification does not necessarily refer to the same embodiment. Furthermore, when a specific feature, structure, or characteristic is described in connection with any embodiment, the intention is to suggest that implementing such a feature, structure, or characteristic in conjunction with other embodiments also falls within the scope of this application.

[0100] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0101] It should also be noted that the above are merely preferred embodiments of this application and do not limit the scope of patent protection of this application. Any equivalent structural or procedural changes made using the content of this application’s specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of this application.

Claims

1. A solar cell test probe array device, characterized in that, include: A first pre-positioning mechanism is provided with a plurality of spaced-apart first pre-positioning slots; The second pre-positioning mechanism is disposed opposite to the first pre-positioning mechanism, and the second pre-positioning mechanism has a plurality of spaced second pre-positioning slots on the side facing the first pre-positioning mechanism. Multiple probe rows are provided, each probe row being detachably connected between a first prepositioning slot and a corresponding second prepositioning slot. The multiple probe rows are arranged at intervals, and each probe row is provided with probes for electrical contact with the battery cell.

2. The solar cell test probe array device according to claim 1, characterized in that, The probe array includes: The probe holder is equipped with probes for electrical contact with the battery cells; The first positioning component is fixed to the first end of the probe holder and is used for detachable connection with the first prepositioning slot; The second positioning component is fixed to the second end of the probe holder and is used for detachable connection with the second prepositioning slot.

3. The solar cell test probe array device according to claim 2, characterized in that, The first positioning component includes: A first fixing block is fixed to the first end of the probe holder, and the first fixing block is provided with a first through hole facing the first prepositioning slot; The first locating pin passes through the first through hole; The first positioning pin can move along the axial direction of the first through hole to insert or disengage from the first pre-positioning groove.

4. The solar cell test probe array device according to claim 3, characterized in that, The first positioning pin includes a protruding end that protrudes from the first through hole, the protruding end being close to the first pre-positioning mechanism; The first positioning component further includes: The first limiting member is sleeved on the protruding end of the first positioning pin; The first limiting member is used to follow the movement of the first positioning pin to insert into or disengage from the first pre-positioning slot.

5. The solar cell test probe array device according to claim 3, characterized in that, The inner wall of the first prepositioning groove facing the first positioning pin is also provided with a first positioning hole, which is used to accommodate the corresponding first positioning pin.

6. The solar cell test probe array device according to claim 3, characterized in that, The inner wall of the first through hole is provided with a first stop portion, which is located at the end of the first through hole away from the first prepositioning mechanism; The first positioning pin is provided with a second stop portion, and the second stop portion is provided corresponding to the first stop portion; The probe array also includes an elastic element that spans between the first stop portion and the second stop portion.

7. The solar cell test probe array device according to claim 3, characterized in that, There are two first through holes, which are spaced apart; There are two first positioning pins, each of which is slidably inserted into one of the first through holes.

8. The solar cell test probe array device according to any one of claims 1 to 7, characterized in that, The first pre-positioning mechanism includes: A prepositioning plate is provided on a first side with a plurality of spaced first prepositioning grooves, and on a second side with an extension plate extending toward a side away from the first side of the prepositioning plate. The extension plate is also provided with a matching hole. An adjusting rod is provided with a strip-shaped hole extending along the length direction, and the adjusting rod is attached to the extension plate; An adjusting member is inserted through the strip hole and detachably connected to the matching hole on the extension plate.

9. The solar cell test probe array device according to claim 8, characterized in that, The solar cell test probe array device also includes: The base frame has a hollowed-out area, which includes a first side and a second side opposite to each other, and the hollowed-out area is used to expose the plurality of probe rows; The adjusting rod of the first prepositioning mechanism is fixed to the first side of the hollowed-out area.

10. A solar cell performance testing device, characterized in that, Includes the solar cell test probe array as described in any one of claims 1 to 9.

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